Method for measuring initial geometric defect of metal component

Abstract

The invention discloses a method for measuring an initial geometric defect of a metal component. The method comprises the following steps: building a combined measuring device comprising a guide rail and a dial indicator; determining a target plane of the metal component by adopting an equal division method, determining a measurement point of the metal component based on the target plane of the metal component, and horizontally fixing the metal component on one side of the guide rail; based on the measuring points of the guide rail and the metal component, moving the dial indicator to obtain initial offset reading data of the measuring points so as to obtain initial offset of the measuring points; and determining an initial defect value of the measurement point according to the initial offset of the measurement point, and determining an initial geometric defect value of the metal component according to the initial defect value of the measurement point. The combined measuring device comprising the guide rail and the dial indicator is simple, convenient and rapid to operate, low in cost, capable of guaranteeing the measuring precision and high in practicability.

Description

Technical Field

[0001] The invention relates to the field of measuring overall initial geometric defects and local initial geometric defects of metal components, and in particular to a method for measuring initial geometric defects of metal components. Background Art

[0002] With the development of manufacturing technology and the demand for lightweight and high-strength buildings, metal materials such as steel and aluminum alloys have a good prospect for use in buildings. Compared with concrete components, metal components are usually smaller in area at the same height and are more susceptible to initial geometric defects. Therefore, it is very necessary to measure the initial geometric defects of metal components. At the same time, the initial geometric defects of components are usually small in amplitude, so there are high requirements for the accuracy of the measurement method.

[0003] The initial geometric defects of metal components are divided into overall initial geometric defects and local initial geometric defects. The existing metal component measurement methods are mainly wire drawing measurement method, level measurement method and three-dimensional scanning method. The wire drawing measurement method mainly relies on straightening a thin wire on one side of the component for measurement, which has low accuracy and there is also the problem of interference between the measuring tool and the thin wire. The level measurement method relies on the level to locate the virtual straight line, avoiding the influence of the thin wire on the measurement, but still cannot avoid the influence of human hand-held measurement on the measurement. The equipment used in the three-dimensional scanning method is complex and expensive, and is not suitable for general laboratory measurements. Therefore, it is very necessary to provide a metal component defect measurement method that is simple and fast to operate, low-cost and can ensure accuracy. Summary of the invention

[0004] In view of the above-mentioned deficiencies in the prior art, the present invention provides a method for measuring initial geometric defects of metal components, which adopts a combined measuring device including a guide rail and a micrometer. The method is simple and fast to operate, low-cost and can ensure measurement accuracy, and has strong practicality.

[0005] In order to achieve the above-mentioned object of the invention, the technical solution adopted by the present invention is:

[0006] A method for measuring initial geometric defects of a metal component comprises the following steps:

[0007] S1. Build a combined measuring device including a guide rail and a micrometer;

[0008] S2. Determine the target plane of the metal component by using an equal division method, determine the measuring point of the metal component based on the target plane of the metal component, and fix the metal component horizontally on one side of the guide rail;

[0009] S3, based on the measuring points of the guide rail and the metal component, move the dial gauge to obtain the initial offset reading data of the measuring point to obtain the initial offset of the measuring point;

[0010] S4. Determine an initial defect value of the measuring point according to an initial offset of the measuring point, and determine an initial geometric defect value of the metal component according to the initial defect value of the measuring point.

[0011] Furthermore, in step S1, a combined measuring device including a guide rail and a micrometer is built. The specific process is: construct a guide rail including a guide rail handle and a rotating stepping screw, set the guide rail horizontally on a standard plane, set the micrometer on the guide rail, and fix the micrometer by a magnetic dial to build a combined measuring device including a guide rail and a micrometer.

[0012] Furthermore, in step S2, the target plane of the metal component is determined by the equal division method, and the measurement points of the metal component are determined based on the target plane of the metal component. The specific process is: the surface of the metal component is equally divided into a set number of planes to determine the target plane of the metal component, and the target plane of the metal component is equally divided by the equal division method to determine the measurement points of the metal component.

[0013] Further, in step S3, based on the measuring points of the guide rail and the metal component, the micrometer is moved to obtain the initial offset reading data of the measuring point to obtain the initial offset of the measuring point. The specific process is: turn the guide rail handle to control the rotating stepping screw to drive the micrometer to move horizontally to the measuring point, obtain the initial offset reading data of the measuring point, and obtain the initial offset of the measuring point by averaging the initial offset reading data of the measuring point.

[0014] Further, step S4 includes the following steps:

[0015] S41, calculating the slope of the initial offset of the target plane according to the initial offset of the measuring point;

[0016] S42, returning the initial defect value of the initial measurement point and the initial defect value of the end measurement point to zero, and determining the initial defect value of the measurement point according to the slope of the initial offset of the target plane;

[0017] S43, determining the maximum value among the initial defect values ​​of the measuring points as the initial defect value of the target plane;

[0018] S44, determining the maximum value among the initial defect values ​​of the target plane as the initial defect value of the surface of the metal component;

[0019] S45. Determine the maximum value among the initial defect values ​​on the surface of the metal component as the initial geometric defect value of the metal component.

[0020] Further, in step S42, the initial defect value of the measuring point is determined, which is expressed as:

[0021]

[0022] in: is the initial defect value of the first measurement point, that is, the initial defect value of the initial measurement point, is the initial defect value of the second measuring point, a2 is the initial offset of the second measuring point, k is the slope of the initial offset of the target plane, L is the length of the metal component surface, n is the total number of measuring points on the target plane, is the initial defect value of the n-1th measurement point, a n-1 is the initial offset of the n-1th measurement point, is the initial defect value of the nth measurement point.

[0023] The beneficial effects of the present invention are:

[0024] (1) The present invention builds a combined measuring device including a guide rail and a micrometer, adopts an equal division method to determine the target plane of the metal component, determines the measuring point of the metal component based on the target plane of the metal component, and fixes the metal component horizontally on one side of the guide rail, then moves the micrometer based on the guide rail and the measuring point of the metal component to obtain the initial offset reading data of the measuring point, so as to obtain the initial offset of the measuring point, and finally determines the initial defect value of the measuring point according to the initial offset of the measuring point, and determines the initial geometric defect value of the metal component according to the initial defect value of the measuring point. The whole process adopts the combined measuring device including the guide rail and the micrometer, which is simple and fast to operate, low-cost and can ensure measurement accuracy, and has strong practicality;

[0025] (2) The present invention constructs a guide rail including a guide rail handle and a rotating stepping screw, sets the guide rail horizontally on a standard plane, sets a micrometer on the guide rail, and fixes the micrometer by a magnetic dial to build a combined measuring device including the guide rail and the micrometer. The combined measuring device has no special requirements for the test site and only requires a standard plane.

[0026] (3) The present invention uses a micrometer to obtain the initial offset reading data of the measuring point, and the error of the micrometer is ±0.001mm. The error of the vernier caliper in the existing method is ±0.01mm, and the error of the wire drawing measurement method in the existing method is ±0.5mm. Therefore, the measurement accuracy is significantly improved compared with the existing method;

[0027] (4) The present invention can control the guide rail to measure repeatedly, avoid errors caused by human operation, and achieve simple, convenient and low-cost effects while accurately measuring, and has strong practicality. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a schematic diagram of a process of measuring initial geometric defects of metal components;

[0029] Figure 2A schematic diagram of a method for measuring initial geometric defects of metal components;

[0030] Figure 3 It is a schematic diagram of the surface of a metal component;

[0031] Among them: 1. Standard plane; 2. Guide rail; 3. Rotary stepping screw; 4. Metal components; 5. Magnetic dial; 6. Micrometer; 7. Measuring point; 8. Guide rail handle. DETAILED DESCRIPTION

[0032] The specific implementation modes of the present invention are described below so that those skilled in the art can understand the present invention. However, it should be clear that the present invention is not limited to the scope of the specific implementation modes. For those of ordinary skill in the art, as long as various changes are within the spirit and scope of the present invention as defined and determined by the attached claims, these changes are obvious, and all inventions and creations utilizing the concept of the present invention are protected.

[0033] like Figure 1 As shown, a method for measuring initial geometric defects of metal components includes steps S1-S4, which are specifically as follows:

[0034] S1. Build a combined measuring device including a guide rail and a micrometer.

[0035] In an optional embodiment of the present invention, the present invention constructs a combined measuring device including a guide rail and a micrometer. The specific process is: construct a guide rail including a guide rail handle and a rotating stepping screw, set the guide rail horizontally on a standard plane, set the micrometer on the guide rail, and fix the micrometer by a magnetic dial to build a combined measuring device including a guide rail and a micrometer.

[0036] Specifically, the guide rail in the present invention is a steel guide rail. The error of the micrometer is ±0.001 mm.

[0037] S2. Use the equal division method to determine the target plane of the metal component, determine the measuring point of the metal component based on the target plane of the metal component, and fix the metal component horizontally on one side of the guide rail.

[0038] In an optional embodiment of the present invention, the present invention adopts an equal division method to determine the target plane of the metal component, and determines the measurement points of the metal component based on the target plane of the metal component. The specific process is: the surface of the metal component is evenly divided into a set number of planes to determine the target plane of the metal component, and the target plane of the metal component is evenly divided by the equal division method to determine the measurement points of the metal component.

[0039] Specifically, the number is set to 3 in the present invention.

[0040] S3. Based on the measuring points of the guide rail and the metal component, the micrometer is moved to obtain the initial offset reading data of the measuring points to obtain the initial offset of the measuring points.

[0041] In an optional embodiment of the present invention, the present invention is based on the measuring points of the guide rail and the metal component, and moves the micrometer to obtain the initial offset reading data of the measuring point to obtain the initial offset of the measuring point. The specific process is: turn the guide rail handle to control the rotating stepping screw to drive the micrometer to move horizontally to the measuring point, obtain the initial offset reading data of the measuring point, and obtain the initial offset of the measuring point by averaging the initial offset reading data of the measuring point.

[0042] like Figure 2 As shown, the present invention constructs a guide rail 2 including a guide rail handle 8 and a rotating stepping screw 3, sets the guide rail 2 horizontally on a standard plane 1, sets a micrometer 6 on the guide rail 2, and fixes the micrometer 6 by a magnetic dial 5, so as to build a combined measuring device including the guide rail 2 and the micrometer 6, and then rotates the guide rail handle 8 to control the rotating stepping screw 3 to drive the micrometer 6 to move horizontally to the measuring point 7, obtains the initial offset reading data of the measuring point 7, and obtains the initial offset of the measuring point 7 by averaging the initial offset reading data of the measuring point 7. In the process of moving the micrometer 6 to obtain the initial offset reading data of the measuring point of the present invention, the micrometer 6 is first moved until its tip contacts the surface of the metal component 4, and it is determined that there is an initial reading, and then the guide rail handle 8 is slowly rotated to allow the micrometer 6 to slowly move to the measuring point 7 with the rotation of the rotating stepping screw 3, and the initial offset reading data of the measuring point 7 is obtained at this time.

[0043] S4. Determine an initial defect value of the measuring point according to an initial offset of the measuring point, and determine an initial geometric defect value of the metal component according to the initial defect value of the measuring point.

[0044] In an optional embodiment of the present invention, the present invention calculates the slope of the initial offset of the target plane based on the initial offset of the measuring point, and determines the initial defect value of the measuring point based on the slope of the initial offset of the target plane, and then determines the initial geometric defect value of the metal component based on the initial defect value of the measuring point.

[0045] Step S4 includes the following steps:

[0046] S41. Calculate the slope of the initial offset of the target plane according to the initial offset of the measuring point, expressed as:

[0047]

[0048] Where: k is the slope of the initial offset of the target plane, a nis the initial offset of the nth measuring point, that is, the initial offset of the end measuring point, n is the total number of measuring points on the target plane, a1 is the initial offset of the first measuring point, that is, the initial offset of the initial measuring point, and L is the length of the metal component surface.

[0049] S42, the initial defect value of the initial measurement point and the initial defect value of the end measurement point are reset to zero, and the initial defect value of the measurement point is determined according to the slope of the initial offset of the target plane, which is expressed as:

[0050]

[0051] in: is the initial defect value of the first measurement point, that is, the initial defect value of the initial measurement point, is the initial defect value of the second measuring point, a2 is the initial offset of the second measuring point, k is the slope of the initial offset of the target plane, L is the length of the metal component surface, n is the total number of measuring points on the target plane, is the initial defect value of the n-1th measurement point, a n-1 is the initial offset of the n-1th measurement point, is the initial defect value of the nth measurement point.

[0052] S43, determining the maximum value among the initial defect values ​​of the measuring points as the initial defect value of the target plane, expressed as:

[0053]

[0054] Where: w Fi is the initial defect value of the i-th target plane, F i is the i-th target plane on the surface of the metal component, i is the target plane number on the surface of the metal component, and max is the maximum value function.

[0055] S44, determining the maximum value among the initial defect values ​​of the target plane as the initial defect value of the metal component surface, expressed as:

[0056]

[0057] Where: w Mj is the initial defect value of the j-th surface of the metal component, Mj is the j-th surface of the metal component, and j is the surface number of the metal component.

[0058] like Figure 3 As shown, the metal component in the present invention includes a surface M1, a surface M2, a surface M3 and a surface M4.

[0059] S45. Determine the maximum value among the initial defect values ​​on the surface of the metal component as the initial geometric defect value of the metal component, expressed as:

[0060] w=max(w M1 ,w M2 ,w M3 ,w M4 )

[0061] Where: w is the initial geometric defect value of the metal component.

[0062] Those skilled in the art will appreciate that the embodiments described herein are intended to help readers understand the principles of the present invention, and should be understood that the protection scope of the present invention is not limited to such specific statements and embodiments. Those skilled in the art can make various other specific variations and combinations that do not deviate from the essence of the present invention based on the technical revelations disclosed by the present invention, and these variations and combinations are still within the protection scope of the present invention.

Claims

1. A method for measuring initial geometric defects of metal components, characterized in that: The following steps are involved: S1. Build a combined measuring device including a guide rail and a micrometer; S2. Determine the target plane of the metal component by using an equal division method, determine the measuring point of the metal component based on the target plane of the metal component, and fix the metal component horizontally on one side of the guide rail; S3, based on the measuring points of the guide rail and the metal component, move the dial gauge to obtain the initial offset reading data of the measuring point to obtain the initial offset of the measuring point; S4. Determine an initial defect value of the measuring point according to an initial offset of the measuring point, and determine an initial geometric defect value of the metal component according to the initial defect value of the measuring point.

2. A method for measuring initial geometric defects of metal components according to claim 1, characterized in that: In step S1, a combined measuring device including a guide rail and a micrometer is built. The specific process is: construct a guide rail including a guide rail handle and a rotating stepping screw, set the guide rail horizontally on a standard plane, set the micrometer on the guide rail, and fix the micrometer with a magnetic dial to build a combined measuring device including a guide rail and a micrometer.

3. A method for measuring initial geometric defects of metal components according to claim 1, characterized in that: In step S2, the target plane of the metal component is determined by the equal division method, and the measurement points of the metal component are determined based on the target plane of the metal component. The specific process is: the surface of the metal component is equally divided into a set number of planes to determine the target plane of the metal component, and the target plane of the metal component is equally divided by the equal division method to determine the measurement points of the metal component.

4. A method for measuring initial geometric defects of metal components according to claim 1, characterized in that: In step S3, based on the measuring points of the guide rail and the metal component, the micrometer is moved to obtain the initial offset reading data of the measuring point to obtain the initial offset of the measuring point. The specific process is: turn the guide rail handle to control the rotating stepping screw to drive the micrometer to move horizontally to the measuring point, obtain the initial offset reading data of the measuring point, and obtain the initial offset of the measuring point by averaging the initial offset reading data of the measuring point.

5. A method for measuring initial geometric defects of metal components according to claim 1, characterized in that: Step S4 includes the following steps: S41, calculating the slope of the initial offset of the target plane according to the initial offset of the measuring point; S42, returning the initial defect value of the initial measurement point and the initial defect value of the end measurement point to zero, and determining the initial defect value of the measurement point according to the slope of the initial offset of the target plane; S43, determining the maximum value among the initial defect values ​​of the measuring points as the initial defect value of the target plane; S44, determining the maximum value among the initial defect values ​​of the target plane as the initial defect value of the surface of the metal component; S45. Determine the maximum value among the initial defect values ​​on the surface of the metal component as the initial geometric defect value of the metal component.

6. A method for measuring initial geometric defects of metal components according to claim 5, characterized in that: In step S42, the initial defect value of the measuring point is determined, which is expressed as: in: is the initial defect value of the first measurement point, that is, the initial defect value of the initial measurement point, is the initial defect value of the second measuring point, a2 is the initial offset of the second measuring point, k is the slope of the initial offset of the target plane, L is the length of the metal component surface, n is the total number of measuring points on the target plane, is the initial defect value of the n-1th measurement point, a n-1 is the initial offset of the n-1th measurement point, is the initial defect value of the nth measurement point.

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