Device for adjusting linearly polarized illumination of comprehensive physical property test system
By designing a device for PPMS system, the direction of linear polarization light is adjusted by using rotating hollow cylindrical tubes and circular polarization plates, the problem of lack of equipment for adjusting linear polarization light in the prior art is solved, and the material under low temperature and strong magnetic field is realized Performance research provides efficient and uniform light distribution.
Patent Information
- Application Number
- CN202411138466.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-19
- Publication Date
- 2024-12-13
AI Technical Summary
The prior art lacks specialized equipment to regulate linearly polarized light, making it difficult to study the interaction between polarized light and samples in PPMS systems in an in-depth manner, and material performance can only be evaluated by changing the light wavelength.
A device including a hollow cylindrical tube, a circular polarizer and a translucent cylindrical cover is designed. It is introduced into the optical fiber connector through the optical fiber, and the optical fiber passes through the translucent cylindrical cover and enters the hollow cylindrical tube. The circular polarizer is fixed by a slot. At the bottom of the hollow cylindrical tube, the device can be rotated to change the direction of light vibration, suitable for use in PPMS systems.
The direction of linearly polarized light is adjusted to be irradiated, and the performance research of the sample under the low temperature and strong magnetic field is embedded in the PPMS system. The structure is simple, the cost is low, and the light distribution is even, making up for the shortcomings of the existing technology.
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Abstract
Description
Technical Field
[0001] The invention relates to the technical field of material property measurement, and in particular to a device for adjusting linear polarized light in a comprehensive physical property testing system. Background Art
[0002] The Physical Property Measurement System (PPMS) is an instrument developed by Quantum Design in the United States for basic research on various physical properties of samples. The design concept of the PPMS system is to integrate fully automatic magnetic, electrical, thermal and morphological, and even ferroelectric and dielectric properties measurement methods on a perfectly controlled ultra-low temperature (50mK) and strong magnetic field (±16T) platform. This design makes full use of the low temperature and strong magnetic field environment of the entire system, greatly reducing the cost of customers to purchase instruments, avoiding the tediousness and errors of setting up experiments by themselves, and can quickly realize the precious research ideas of researchers. The PPMS system has fast and precise temperature control capabilities, and its magnetic field is obtained through superconducting magnet excitation and has high uniformity. The PPMS system also supports electrical property measurements, and a variety of measurement options can be used for the study of different electrical properties. In addition to the basic system, PPMS also supports various measurement options and extended function options, such as specific heat, thermoelectricity, super magnetic field, sample rotation rod, etc.
[0003] In the direction of light propagation, the light vector vibrates only in a fixed direction. This kind of light is called plane polarized light. Since the trajectory of the light vector endpoint is a straight line, it is also called linear polarized light. Polarized light has a wide range of applications in the field of optics and has an important impact on materials and optical systems. When a material is exposed to polarized light, its performance may change in many ways, depending on the type of material, the characteristics of the polarized light, and the exposure conditions.
[0004] Materials may absorb light of different polarizations to different degrees. Some materials are more sensitive to light of a certain polarization direction and absorb less light of other directions. The transmittance of polarized light may also be affected. The transparency and transmittance of a material may change depending on the angle of incidence and the polarization direction of the polarized light. Some materials undergo a phenomenon called birefringence when irradiated with polarized light. This means that the light is split into two beams with different polarization states as it propagates through the material. Some materials also induce polarization rotation, in which the polarization plane of the light is rotated. This has important applications in optical devices and communications. The optical anisotropy of a material may change when irradiated with polarized light. This affects the refractive index, reflectivity, and transmittance of the material. For example, some two-dimensional materials (such as black phosphorus and graphene) have anisotropic responses to light of different polarizations. In summary, the response of a material depends on its specific optical and electrical properties, as well as the characteristics of the polarized light. Studying the mechanism of the interaction between polarized light and materials is crucial for the development of optical devices, sensors, and communication technologies.
[0005] At present, the test of PPMS low-temperature magnetic field plus light can only evaluate the material performance by changing the wavelength of light. The mechanism of interaction between polarized light and samples has not been deeply studied, and there is a lack of equipment specifically for adjusting linear polarized light. Summary of the invention
[0006] The object of the present invention is to avoid the shortcomings of the prior art and provide a device for adjusting linear polarized light in a comprehensive physical property testing system.
[0007] To achieve the above-mentioned purpose, the technical solution adopted by the present invention is: the device for adjusting linear polarized light in a comprehensive physical property testing system is characterized in that it includes a body installed in the PPMS system, a hollow cylindrical tube is arranged on the body, a circular polarizer is arranged at the lower end of the hollow cylindrical tube, a sample table for placing a sample to be tested is arranged below the hollow cylindrical tube, a light-transmitting cylindrical cover is arranged above the hollow cylindrical tube, and the optical fiber passes through the light-transmitting cylindrical cover and extends into the hollow cylindrical tube.
[0008] The optical fiber is fixed on the light-transmitting cylindrical cover through an optical fiber connector, the circular polarizer is fixedly installed on the bottom of the hollow cylindrical tube through a slot, the hollow cylindrical tube is installed on the body and can rotate, light enters the hollow cylindrical tube through the optical fiber to irradiate the sample to be tested below the circular polarizer, and the vibration direction of the light irradiated on the sample material to be tested is changed by rotating the hollow cylindrical tube.
[0009] The hollow cylindrical tube is made of oxygen-free copper.
[0010] The machine body is vertically arranged in the PPMS system and is installed in the PPMS low-temperature magnetic field system like a traditional electrical rod. The machine body and the vent of the PPMS system are arranged in coordination to ensure the air tightness of the PPMS system during the test.
[0011] The circular polarizer is positioned at the bottom of the hollow cylindrical tube through a slot. The circular polarizer is provided with a mark for indicating the polarization direction and the installation direction to ensure that the polarizer is correctly installed to avoid errors in optical experiments. During use, the circular polarizer is placed at the bottom of the hollow cylinder to ensure that it does not move or fail during the experiment.
[0012] A positioning groove for installing an optical fiber connector is arranged inside the light-transmitting cylindrical cover.
[0013] The sample stage is fixed in the machine body, and the sample is fixed on the sample stage by using vacuum low-temperature glue. The distance between the upper surface of the sample to be tested on the sample stage and the lower bottom surface of the circular polarizer is less than or equal to 10 mm.
[0014] The beneficial effects of the present invention are: a device for adjusting linear polarized light illumination in a comprehensive physical property testing system, which realizes the illumination of linear polarized light with adjustable direction through correspondingly arranged optical fibers, polarizers and rotating tables, and can be embedded in a PPMS system to realize the study of the performance of samples under low temperature and strong magnetic fields. It has a simple structure, low cost and uniform light distribution. It makes up for the shortcomings of the prior art and provides a linear polarized light adjustment device suitable for a PPMS low temperature magnetic field system for the first time. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 It is a structural schematic diagram of the present invention;
[0016] Figure 2 For the present invention Figure 1 Schematic diagram of the internal structure;
[0017] Figure 3 For the present invention Figure 1 A schematic diagram of a top view structure;
[0018] Figure 4 For the present invention Figure 1 Schematic diagram of the left view structure;
[0019] Figure 5 For the present invention Figure 1 Schematic diagram of the hollow cylindrical tube structure in FIG.
[0020] Figure 6 For the present invention Figure 5 An enlarged schematic diagram of the light-transmitting cylindrical cover structure.
[0021] In the figure: 1. Transparent cylindrical cover; 2. Hollow cylindrical tube; 3. Sample stage; 4. PPMS system; 5. Optical fiber; 6. Circular polarizer; 7. Sample to be tested; 8. Machine body; 9. Card slot; 10. Optical fiber connector. DETAILED DESCRIPTION
[0022] The principles and features of the present invention are described below in conjunction with the accompanying drawings. The examples given are only used to explain the present invention and are not used to limit the scope of the present invention.
[0023] In order to achieve the above-mentioned purpose, the present invention provides the following specific implementation method: the device for adjusting linearly polarized light in a comprehensive physical property testing system is characterized in that it includes a body 8 installed in a PPMS system 4, a hollow cylindrical tube 2 is provided on the body 8, a circular polarizer 6 is provided at the lower end of the hollow cylindrical tube 2, a sample table 3 for placing a sample 7 to be tested is provided below the hollow cylindrical tube 2, a light-transmitting cylindrical cover 1 is provided above the hollow cylindrical tube 2, and an optical fiber 5 passes through the light-transmitting cylindrical cover 1 and extends into the hollow cylindrical tube 2.
[0024] The optical fiber 5 is fixed on the light-transmitting cylindrical cover 1 through the optical fiber connector 10, and the circular polarizer 6 is fixedly installed in the hollow cylindrical tube 2 through the card slot 9. The hollow cylindrical tube 2 is installed on the body 8 and can rotate. Light enters the hollow cylindrical tube 2 through the optical fiber 5 to irradiate the sample 7 to be tested under the circular polarizer 6, and the vibration direction of the light irradiated on the material of the sample 7 to be tested is changed by rotating the hollow cylindrical tube 2.
[0025] The hollow cylindrical tube 2 is made of oxygen-free copper.
[0026] The body 8 is vertically arranged in the PPMS system 4 and is installed in the PPMS low-temperature magnetic field system like a traditional electrical rod. The body is matched with the vent of the PPMS system 4 to ensure the airtightness of the PPMS system 4 during the test.
[0027] The circular polarizer 6 is positioned at the bottom of the hollow cylindrical tube 2 through the card slot 9. The circular polarizer 6 is provided with a mark for indicating the polarization direction and the installation direction to ensure that the polarizer is correctly installed to avoid errors in optical experiments. During use, the circular polarizer is placed at the bottom of the hollow cylinder to ensure that it does not move or fail during the experiment.
[0028] The light-transmitting cylindrical cover 1 is provided with a positioning groove for installing the optical fiber connector 10 .
[0029] The sample stage 3 is fixed in the machine body 8, and the sample is fixed on the sample stage 3 by using vacuum low-temperature glue. The distance between the upper surface of the sample 7 to be tested on the sample stage 3 and the lower bottom surface of the circular polarizer 6 is less than or equal to 10 mm.
[0030] In the experiment, light sources of different wavelengths are selected according to requirements, and the sample to be tested 7 is fixed on the sample stage. After the laser is turned on, the laser is introduced through the optical fiber 5, and the hollow cylindrical tube 2 is rotated to change the polarization direction of the linear polarized light, so that the polarized light is irradiated onto the sample to be tested 7, and then the influence of linear polarized light in different directions on the sample is studied.
[0031] When in use, it is perfectly embedded with the PPMS system 4 to ensure the airtightness of the sample inside the PPMS system 4. The PPMS system 4 can control the temperature of the internal magnet by adjusting the amount of helium, so that the sample 7 to be tested is stably in the required magnetic field during the experiment. If the sample needs to be tested in a low-temperature environment, the internal temperature of the PPMS system 4 is reduced to the required temperature by controlling the internal circulating helium, and then the laser is turned on, the outer hollow cylinder is rotated, and the polarization direction of the linear polarized light is changed, so that the laser of the required wavelength and direction is transmitted to the sample to be tested through the internal optical fiber, and then the sample is tested under the required temperature, magnetic field, and laser. The temperature, magnetic field, and laser irradiation conditions of the sample are precisely controlled in the experiment.
[0032] Through these steps, we can conduct tests in a strictly controlled experimental environment to ensure accurate and reliable data. This comprehensive experimental configuration not only meets the needs of scientific research, but also provides important technical support and experimental platform for future material research and physics exploration.
[0033] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims
1. A device for adjusting linear polarized light in a comprehensive physical property testing system, characterized in that: The invention comprises a body (8) installed in a PPMS system (4), wherein a hollow cylindrical tube (2) is arranged on the body (8), a circular polarizing plate (6) is arranged at the lower end of the hollow cylindrical tube (2), a sample table (3) for placing a sample to be tested (7) is arranged below the hollow cylindrical tube (2), a light-transmitting cylindrical cover (1) is arranged above the hollow cylindrical tube (2), and an optical fiber (5) passes through the light-transmitting cylindrical cover (1) and extends into the hollow cylindrical tube (2).
2. A device for adjusting linear polarized light in a comprehensive physical property testing system according to claim 1, characterized in that: The optical fiber (5) is fixed on the light-transmitting cylindrical cover (1) via an optical fiber connector (10); the circular polarizer (6) is fixedly mounted on the bottom of the hollow cylindrical tube (2) via a slot (9); the hollow cylindrical tube (2) is mounted on a body (8) and is rotatable; light enters the hollow cylindrical tube (2) through the optical fiber (5) to illuminate the sample (7) to be tested below the circular polarizer (6); and the vibration direction of the light irradiated onto the material of the sample (7) to be tested is changed by rotating the hollow cylindrical tube (2).
3. A device for adjusting linear polarized light in a comprehensive physical property testing system according to claim 1 or 2, characterized in that: The hollow cylindrical tube (2) is made of oxygen-free copper.
4. A device for adjusting linear polarized light in a comprehensive physical property testing system according to claim 1 or 2, characterized in that: The machine body (8) is vertically arranged in the PPMS system (4), and the machine body (8) is arranged in coordination with the vent of the PPMS system (4) to ensure the air tightness of the PPMS system (4) during the test.
5. A device for adjusting linear polarized light in a comprehensive physical property testing system as claimed in claim 1 or 2, characterized in that: The circular polarizer (6) is positioned at the bottom of the hollow cylindrical tube (2) through a clamping groove (9), and a mark for indicating a polarization direction and an installation direction is provided on the circular polarizer (6).
6. A device for adjusting linear polarized light in a comprehensive physical property testing system as claimed in claim 1 or 2, characterized in that: A positioning groove for installing an optical fiber connector (10) is arranged in the light-transmitting cylindrical cover (1).
7. The device for adjusting linear polarized light in a comprehensive physical property testing system according to claim 1, characterized in that: The sample stage (3) is fixed in the machine body (8), and the distance between the upper surface of the sample to be tested (7) on the sample stage (3) and the lower bottom surface of the circular polarizer (6) is less than or equal to 10 mm.
