Abnormal data processing method for high-frequency data acquisition device

Abstract

The invention discloses a high-frequency data acquisition device abnormal data processing method and relates to the technical field of power systems. According to the method, after a working power supply of an AD acquisition device is subjected to voltage reduction, the voltage meeting the input range of an AD acquisition chip is connected to a first AD data input channel of the AD acquisition chip, and sampling data of the first AD data input channel serves as a standard to judge the reasonability of data acquisition of other channels. A data period container is set to store sampling data in the latest sampling period in a rolling mode, the container is updated in real time, and when unreasonable data points appear, the container value is used for replacing a real-time collection value, so that high-frequency data points can be prevented from being lost, and calculation fluctuation of the unreasonable points on the data collection value is reduced.

Description

Technical Field

[0001] The invention relates to the technology of power system, and in particular to the technology of abnormal data processing method of high-frequency data acquisition device. Background Art

[0002] The high-frequency data sampling frequency can reach tens of megahertz, and the number of AD sampling channels is the maximum value of the number of input data of the AD sampling chip.

[0003] When the AD sampling chip of the existing power system collects voltage and current data, if the AD output sampling is abnormal, the current point will be discarded. However, when performing Fourier transform, it will affect the integrity of the data and the calculated amplitude. If other values ​​are used, it will affect the data accuracy and calculation complexity. Summary of the invention

[0004] In view of the defects existing in the above-mentioned prior art, the technical problem to be solved by the present invention is to provide an abnormal data processing method for a high-frequency data acquisition device which can take into account both the integrity and accuracy of the collected data, thereby reducing errors in calculated data, improving the accuracy of power protection calculations, and avoiding false operations of power protection.

[0005] In order to solve the above technical problems, the present invention provides a method for processing abnormal data of a high-frequency data acquisition device, which is characterized by the following specific steps:

[0006] 1) The working power supply of the AD acquisition device is connected to the first AD data input channel of the AD acquisition chip after the voltage is stepped down to meet the input range of the AD acquisition chip, and a data cycle container is set to roll and save the sampling values ​​of all sampling points in the most recent sampling cycle;

[0007] 2) Sampling other data input channels of the AD acquisition chip, and rolling saving the sampling values ​​of all sampling points in the most recent sampling cycle in the data cycle container;

[0008] 3) The sampling points are numbered from earliest to latest according to the sampling order, and the sampling sequence number of the sampling point at the current sampling time is defined as t;

[0009] 4) Calculate the calculated value of the sampling point with serial number t. The specific calculation formula is:

[0010] f(t)=ErrAD+D(1,t)

[0011] If fabs((da(1,t)-Nda(1,t%DN)) / (da(1,t-1)-Nda(1,(t-1)%DN))-1)>0.2, then D(1,t)=1;

[0012] If fabs((da(1,t)-Nda(1,t%DN)) / (da(1,t-1)-Nda(1,(t-1)%DN))-1)<=0.2, then D(1,t)=0;

[0013] Wherein, f(t) is the calculated value of sampling point number t, ErrAD is the abnormal working condition state value output by the AD acquisition chip, if the self-test state of the AD acquisition chip is normal, the value of ErrAD is 0, otherwise the value of ErrAD is 1, D(1,t) is the sampling abnormal state value of the first AD data input channel of the AD acquisition chip at sampling point number t, da(1,t) is the sampling value of the first AD data input channel of the AD acquisition chip at sampling point number t, Nda(1,t%DN) is the rolling storage sampling value of the first AD data input channel of the AD acquisition chip at sampling point number t%DN, da(1,t-1) is the sampling value of the first AD data input channel of the AD acquisition chip at sampling point number t-1, Nda(1,(t-1)%DN) is the rolling storage sampling value of the first AD data input channel of the AD acquisition chip at sampling point number (t-1)%DN, % is the remainder operator, DN is the number of sampling points in 1 sampling cycle, and fab() is the absolute value function;

[0014] 5) If f(t)<1, go to step 8);

[0015] 6) Calculate the calculated value of the t-number sampling point of other AD data input channels of the AD acquisition chip. The specific calculation formula is:

[0016] Cda(j,t)=Nda(j,t%DN)+da(1,t-1)-Nda(1,(t-1)%DN)

[0017] 2≦j≦N

[0018] Wherein, Cda(j, t) is the calculated value of the sampling point with serial number t of the j-th AD data input channel of the AD acquisition chip, Nda(j, t%DN) is the rolling storage sampling value of the j-th AD data input channel of the AD acquisition chip at the sampling point with serial number t%DN, and N is the number of AD data input channels of the AD acquisition chip;

[0019] 7) Let da(j, t) = Cda(j, t), 2≦j≦N, where da(j, t) is the sampling value of the jth AD data input channel of the AD acquisition chip at the sampling point with sequence number t;

[0020] 8) Let Nda(j,t%DN)=da(j,t), 1≦j≦N;

[0021] 9) After waiting for the next sampling time to arrive, set t=t+1 and go to step 4).

[0022] The abnormal data processing method of the high-frequency data acquisition device provided by the present invention connects the AC voltage source that meets the input range of the AD acquisition chip after the working power supply of the AD acquisition device is stepped down to the first AD data input channel of the AD acquisition chip, and uses the sampling data of the first AD data input channel as a standard to judge the rationality of data acquisition of other channels. At the same time, a data cycle container is set, and the container is updated in real time. When an unreasonable data point appears, the real-time acquisition value is replaced by the container value, thereby avoiding the loss of high-frequency data points and reducing the calculation fluctuation of the data acquisition value caused by unreasonable points. It can take into account both the integrity and accuracy of the collected data, thereby reducing the error in the calculated data, improving the accuracy of power protection calculation, and avoiding false operation of power protection. DETAILED DESCRIPTION

[0023] The technical solution of the present invention is further described in detail below in conjunction with specific embodiments, but this embodiment is not intended to limit the present invention. All similar structures and similar variations of the present invention should be included in the protection scope of the present invention. The commas in the present invention represent the relationship of and, and the English letters in the present invention are case-sensitive.

[0024] An abnormal data processing method for a high-frequency data acquisition device provided by an embodiment of the present invention is characterized in that the specific steps are as follows:

[0025] 1) The working power supply of the AD acquisition device is connected to the first AD data input channel of the AD acquisition chip after the voltage is stepped down to meet the input range of the AD acquisition chip, and a data cycle container is set to roll and save the sampling values ​​of all sampling points in the most recent sampling cycle;

[0026] The power frequency data cycle time of China's power grid is 20ms. The sampling interval is determined by the sampling frequency. The sampling interval is usually much smaller than 20ms, with a typical value of 20 / 32ms.

[0027] 2) Sampling other data input channels of the AD acquisition chip, and rolling saving the sampling values ​​of all sampling points in the most recent sampling cycle in the data cycle container;

[0028] 3) The sampling points are numbered from first to last according to the sampling order, and the sampling sequence number of the sampling point at the current sampling moment is defined as t, then the current sampling point is the sampling point with sequence number t, and the sampling point before the current sampling point is the sampling point with sequence number t-1;

[0029] 4) Calculate the calculated value of the sampling point with serial number t. The specific calculation formula is:

[0030] f(t)=ErrAD+D(1,t)

[0031] If fabs((da(1,t)-Nda(1,t%DN)) / (da(1,t-1)-Nda(1,(t-1)%DN))-1)>0.2, then D(1,t)=1;

[0032] If fabs((da(1,t)-Nda(1,t%DN)) / (da(1,t-1)-Nda(1,(t-1)%DN))-1)<=0.2, then D(1,t)=0;

[0033] Wherein, f(t) is the calculated value of sampling point number t, ErrAD is the abnormal working condition state value output by the AD acquisition chip, if the self-test state of the AD acquisition chip is normal, the value of ErrAD is 0, otherwise the value of ErrAD is 1, D(1,t) is the sampling abnormal state value of the first AD data input channel of the AD acquisition chip at sampling point number t, da(1,t) is the sampling value of the first AD data input channel of the AD acquisition chip at sampling point number t, Nda(1,t%DN) is the rolling storage sampling value of the first AD data input channel of the AD acquisition chip at sampling point number t%DN, da(1,t-1) is the sampling value of the first AD data input channel of the AD acquisition chip at sampling point number t-1, Nda(1,(t-1)%DN) is the rolling storage sampling value of the first AD data input channel of the AD acquisition chip at sampling point number (t-1)%DN, % is the remainder operator, DN is the number of sampling points in 1 sampling cycle, and fab() is the absolute value function;

[0034] 5) If f(t)<1, go to step 8);

[0035] 6) Calculate the calculated value of the t-number sampling point of other AD data input channels of the AD acquisition chip. The specific calculation formula is:

[0036] Cda(j,t)=Nda(j,t%DN)+da(1,t-1)-Nda(1,(t-1)%DN)

[0037] 2≦j≦N

[0038] Wherein, Cda(j, t) is the calculated value of the sampling point with serial number t of the j-th AD data input channel of the AD acquisition chip, Nda(j, t%DN) is the rolling storage sampling value of the j-th AD data input channel of the AD acquisition chip at the sampling point with serial number t%DN, and N is the number of AD data input channels of the AD acquisition chip;

[0039] 7) Let da(j, t) = Cda(j, t), 2≦j≦N, where da(j, t) is the sampling value of the jth AD data input channel of the AD acquisition chip at the sampling point with sequence number t;

[0040] 8) Let Nda(j,t%DN)=da(j,t), 1≦j≦N;

[0041] 9) After waiting for the next sampling time to arrive, set t=t+1 and go to step 4).

Claims

1. A method for processing abnormal data of a high-frequency data acquisition device, characterized in that: The specific steps are as follows: 1) The working power supply of the AD acquisition device is connected to the first AD data input channel of the AD acquisition chip after the voltage is stepped down to meet the input range of the AD acquisition chip, and a data cycle container is set to roll and save the sampling values ​​of all sampling points in the most recent sampling cycle; 2) Sampling other data input channels of the AD acquisition chip, and rolling saving the sampling values ​​of all sampling points in the most recent sampling cycle in the data cycle container; 3) The sampling points are numbered from earliest to latest according to the sampling order, and the sampling sequence number of the sampling point at the current sampling time is defined as t; 4) Calculate the calculated value of the sampling point with serial number t. The specific calculation formula is: f(t)=ErrAD+D(1,t) If fabs((da(1,t)-Nda(1,t%DN)) / (da(1,t-1)-Nda(1,(t-1)%DN))-1)>0.2, then D(1,t)=1; If fabs((da(1,t)-Nda(1,t%DN)) / (da(1,t-1)-Nda(1,(t-1)%DN))-1)<=0.2, then D(1,t)=0; Wherein, f(t) is the calculated value of sampling point number t, ErrAD is the abnormal working condition state value output by the AD acquisition chip, if the self-test state of the AD acquisition chip is normal, the value of ErrAD is 0, otherwise the value of ErrAD is 1, D(1,t) is the sampling abnormal state value of the first AD data input channel of the AD acquisition chip at sampling point number t, da(1,t) is the sampling value of the first AD data input channel of the AD acquisition chip at sampling point number t, Nda(1,t%DN) is the rolling storage sampling value of the first AD data input channel of the AD acquisition chip at sampling point number t%DN, da(1,t-1) is the sampling value of the first AD data input channel of the AD acquisition chip at sampling point number t-1, Nda(1,(t-1)%DN) is the rolling storage sampling value of the first AD data input channel of the AD acquisition chip at sampling point number (t-1)%DN, % is the remainder operator, DN is the number of sampling points in 1 sampling cycle, and fab() is the absolute value function; 5) If f(t)<1, go to step 8); 6) Calculate the calculated value of the t-number sampling point of other AD data input channels of the AD acquisition chip. The specific calculation formula is: Cda(j,t)=Nda(j,t%DN)+da(1,t-1)-Nda(1,(t-1)%DN) 2≦j≦N Wherein, Cda(j, t) is the calculated value of the sampling point with serial number t of the j-th AD data input channel of the AD acquisition chip, Nda(j, t%DN) is the rolling storage sampling value of the j-th AD data input channel of the AD acquisition chip at the sampling point with serial number t%DN, and N is the number of AD data input channels of the AD acquisition chip; 7) Let da(j, t) = Cda(j, t), 2≦j≦N, where da(j, t) is the sampling value of the jth AD data input channel of the AD acquisition chip at the sampling point with sequence number t; 8) Let Nda(j,t%DN)=da(j,t), 1≦j≦N; 9) After waiting for the next sampling time to arrive, set t=t+1 and go to step 4).