Screening machine for wafer resistor

Abstract

The invention discloses a screening machine for wafer resistors. The screening machine comprises a main frame, and the main frame is provided with a screening device used for screening the wafer resistors, a feeding device used for feeding the wafer resistors into the screening device and a vibration device used for generating vibration on the screening device; the screening device is obliquely arranged and comprises a vibration disc frame, an upper-layer screen, a middle-layer screen and a lower-layer screen, the upper-layer screen, the middle-layer screen and the lower-layer screen are vertically arranged on the vibration disc frame in a layered mode, and first mesh holes and second mesh holes are formed in the upper-layer screen and the middle-layer screen correspondingly. A first discharging channel, a second discharging channel and a third discharging channel are arranged at the ends, away from the feeding device, of the upper-layer screen, the middle-layer screen and the lower-layer screen correspondingly, and orthographic projections of the first discharging channel, the second discharging channel and the third discharging channel on the horizontal plane are arranged in a staggered mode. The screening precision and efficiency can be improved, the beneficial effects of being easy to operate and low in maintenance cost are achieved, and more economic benefits can be created for enterprises.

Description

Technical Field

[0001] The invention relates to the technical field of wafer resistor production equipment, in particular to a material screening machine for wafer resistors. Background Art

[0002] With the rapid development of electronic technology, wafer resistors, as an important part of electronic components, have a vital impact on the stability and reliability of electronic products due to their performance and quality. Therefore, efficient and accurate screening and testing of wafer resistors has become a key link in the electronics manufacturing industry. As an automated testing equipment, wafer resistor screening machines can achieve rapid and batch screening of wafer resistors, improve production efficiency, and reduce production costs, and therefore have received extensive attention and research.

[0003] Although wafer resistance screening machines have been widely used in the electronics manufacturing industry, there are still some problems that need to be solved. They mainly include the following aspects: (1) Insufficient screening accuracy and stability: Due to the small size and complex structure of wafer resistors, traditional screening methods often fail to meet the requirements of high accuracy and stability, resulting in inaccurate screening results and affecting product quality.

[0004] (2) Slow test speed: Existing wafer resistance screening machines still have certain limitations in test speed, which makes it difficult to meet the needs of large-scale production and limits the improvement of production efficiency.

[0005] (3) Operational complexity and high maintenance costs: Some wafer resistance screening machines are very complex in operation and maintenance and require professional personnel to operate and maintain them, which increases production costs and labor costs.

[0006] Therefore, seeking a more efficient and accurate screening method has become an urgent need in the industry. Summary of the invention

[0007] The purpose of the present invention is to provide a screening machine for wafer resistors, which can improve screening accuracy and efficiency, and has the advantages of simple operation and low maintenance cost, and can create more economic benefits for enterprises.

[0008] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a screening machine for wafer resistors, comprising a main frame, on which a screening device for screening wafer resistors, a feeding device for feeding wafer resistors into the screening device, and a vibrating device for vibrating the screening device are provided; the screening device is arranged obliquely, and comprises a vibration disk frame and an upper screen, a middle screen and a lower screen arranged in layers vertically on the vibration disk frame, the upper screen and the middle screen are respectively provided with a first mesh hole and a second mesh hole, and the size of the first mesh hole is larger than the size of the second mesh hole, the upper screen, the middle screen and the lower screen are respectively provided with a first discharge channel, a second discharge channel and a third discharge channel at one end away from the feeding device, and the orthographic projections of the first discharge channel, the second discharge channel and the third discharge channel on the horizontal plane are staggered with each other.

[0009] By adopting the above technical solution, the wafer resistors are put into the screening device by the feeding device, and then the wafer resistors are rolled in order in the screening device by the vibration device to separate the wafer resistors. Among them, the screening device adopts a three-layer screen and a double-layer screening design. This design fully considers the different defective and qualified characteristics of wafer resistors, and realizes accurate classification and discharge of resistors by accurately adjusting the aperture and inclination angle of each layer of screen. This classification method ensures that each type of product can be accurately processed, greatly improving the accuracy and efficiency of screening. The screening machine for wafer resistors also has the advantage of low design cost. Compared with the traditional single-layer drum screening machine, the structure of this equipment is simpler and more compact, which not only reduces the manufacturing cost, but also facilitates the installation and maintenance of the equipment. At the same time, due to the characteristics of the vibration screening method, this equipment has low noise and low energy consumption during operation, which further reduces the production cost.

[0010] The present invention is further configured such that a material guide plate is provided at one end of the vibration disk frame close to the feeding device, and an upper enclosure plate, a middle enclosure plate and a lower enclosure plate are respectively provided at the periphery of the upper screen, the middle screen and the lower screen, and a passage for wafer resistors to pass through is opened on one side of the upper enclosure plate close to the material guide plate, and the height of the passage is less than the thickness of the two wafer resistors.

[0011] By adopting the above technical solution and setting a fence around each screen, it can be ensured that the wafer resistors will not fall to the outside during the screening process.

[0012] The present invention is further configured as follows: the vibration device includes a driving motor, a driving pulley, a driven pulley, a transmission belt, a transmission shaft, a crank and a connecting assembly; two bearing seats are installed on the main frame; two ends of the transmission shaft are rotatably connected to the corresponding bearing seats respectively; the driving pulley is installed on the motor shaft of the driving motor in a linkage manner; the driven pulley is installed on the transmission shaft in a linkage manner; the transmission belt is covered on the driving pulley and the driven pulley; the crank is installed on the transmission shaft in a linkage manner; the vibration disk frame is movably arranged on the main frame; a connecting seat is provided on the vibration disk frame; and two ends of the connecting assembly are respectively hinged to the crank and the connecting seat.

[0013] By adopting the above technical solution, the vibration device is the power source of the screening machine, and the belt drive assembly has good transmission stability, which can make the screen vibrate stably, so that the wafer resistors are evenly distributed on the screen and screened smoothly. The vibration device is driven by a motor, and the vibration intensity and frequency of the screen can be controlled by adjusting the speed and amplitude of the motor.

[0014] The present invention is further configured as follows: the connecting assembly includes a crankshaft, a first connecting head and a second connecting head, the first connecting head is rotatably connected to the side of the crank by a first bolt, the second connecting head is rotatably connected to the connecting seat by a second bolt, the crankshaft includes a middle shaft section and a forward threaded section and a reverse threaded section arranged at both ends of the middle shaft section, the first connecting head is provided with a forward screw hole matching with the forward threaded section, and the second connecting head is provided with a reverse screw hole matching with the reverse threaded section.

[0015] By adopting the above technical solution, the two connectors can be moved closer or farther away by rotating the crankshaft, thereby adjusting the position of the screening device, which is very convenient to operate.

[0016] The present invention is further configured such that a flat groove is respectively provided on both sides of the central shaft section.

[0017] By adopting the above technical solution, flat grooves are provided on both sides of the middle shaft section to facilitate tool clamping or finger pinching, so as to rotate the crankshaft to adjust the initial position of the screening device.

[0018] The present invention is further configured such that two parallel inclined rails are provided on the main frame, a bracket is further provided under the vibration disk frame, two parallel transverse rails are provided on the bracket, the transverse rails are provided under the inclined rails, and two sets of pulleys are provided at the bottom of the vibration disk frame, and the two sets of pulleys are respectively rollingly arranged on the inclined rails and the transverse rails.

[0019] By adopting the above technical solution, the bottom of the vibration plate frame is supported by rollers, which ensures stable movement and low friction.

[0020] The present invention is further configured such that the cross sections of the inclined rail and the cross rail are both triangular in shape, and an annular positioning groove with a triangular cross section is circumferentially provided on the pulley.

[0021] By adopting the above technical solution, the positioning of the two can be achieved, preventing the pulley from deviating from the running track when rolling.

[0022] The present invention is further configured as follows: the bracket includes a movable rod and a bottom rod, the movable rod is sleeved on the outer periphery of the bottom rod, and the movable rod can be extended and retracted along the axial direction of the bottom rod, and the cross rail is arranged on the movable rod; the vibration device also includes a mobile hand-cranked lift, the movable rod is provided with an upper limit plate, the bottom end of the bottom rod is provided with a lower limit plate, the upper limit plate is abutted against the top plate of the mobile hand-cranked lift, and the lower limit plate is abutted against the bottom plate of the mobile hand-cranked lift.

[0023] By adopting the above technical solution, by adjusting the mobile hand-cranked lifter, the movable rod can be driven to move up and down, and then the vibration plate frame and three screens can be driven to move up and down, so as to adjust their inclination angle.

[0024] The present invention is further configured such that the feeding device includes a silo for placing wafer resistors and a track groove arranged at the bottom of the silo, and a drop port connected to the track groove is provided at the bottom of the silo, and the track groove extends downwardly obliquely along the direction of the guide plate.

[0025] By adopting the above technical solution, accurate and orderly feeding of wafer resistors can be achieved.

[0026] The present invention is further configured as follows: the feeding device also includes an automatic opening and closing component, which includes a transverse electric slide, an electromagnet, a power supply and an opening and closing door plate, the transverse electric slide is installed on the main frame, a mounting plate is provided on the movable end of the transverse electric slide, the silo and the electromagnet are installed on the mounting plate, the moving iron core of the electromagnet is connected to the opening and closing door plate, the opening and closing door plate passes through the silo and has a first position for closing the blanking port and a second position for opening the blanking port under the drive of the moving iron core of the electromagnet; a static contact is provided on the transverse electric slide, the power supply is electrically connected to the static contact, a moving contact is provided on the mounting plate, the moving contact is electrically connected to the electromagnet, and when the silo moves to above the guide plate, the static contact and the moving contact abut against each other to form electrical conduction.

[0027] By adopting the above technical scheme, when loading, the opening and closing door plate will close the drop-out port, and the wafer resistor can be loaded into the silo, and the horizontal electric slide will be started to drive the silo to move. When the silo moves to above the guide plate, the static contact and the moving contact are electrically conductive, and the power supply is supplied to the electromagnet. The moving iron core of the electromagnet drives the opening and closing door plate to retract, opening the drop-out port, and the wafer resistor in the silo falls into the screening device along the track groove. It is not only easy to use, but also can significantly improve the screening efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a schematic diagram of the first viewing direction of the overall structure of the present invention; Figure 2 It is a second view structural schematic diagram of the present invention as a whole; Figure 3 It is a schematic diagram of the structure of the vibration device of the present invention; Figure 4 It is a schematic diagram of the structure of the support of the present invention; Figure 5 A schematic diagram of the structure of the feeding device of the present invention after an automatic opening and closing component is added; Figure 6 It is a structural schematic diagram of the automatic opening and closing assembly of the present invention; Figure 7 It is a circuit connection schematic diagram of the automatic opening and closing component of the present invention.

[0029] In the figure: 1, main frame; 2, screening device; 3, feeding device; 4, vibrating device; 5, vibrating plate frame; 6, upper screen; 7, middle screen; 8, lower screen; 9, first mesh; 10, second mesh; 11, first discharge channel; 12, second discharge channel; 13, third discharge channel; 14, guide plate; 15, upper enclosure; 16, middle enclosure; 17, lower enclosure; 18, port; 19, driving motor; 20, driving pulley; 21, driven pulley; 22, driving belt; 23, driving shaft; 24, crank; 25, connecting assembly; 26, bearing seat; 27, connecting seat; 28, crankshaft; 29, first connector; 3 0. Second connector; 31. First bolt; 32. Second bolt; 33. Middle axis section; 34. Forward threaded section; 35. Reverse threaded section; 36. Forward screw hole; 37. Reverse screw hole; 38. Flat groove; 39. Inclined rail; 40. Bracket; 41. Cross rail; 42. Pulley; 43. Annular positioning groove; 44. Movable rod; 45. Bottom rod; 46. Mobile hand-cranked lift; 47. Upper limit plate; 48. Lower limit plate; 49. Silo; 50. Track groove; 51. Dropping port; 52. Automatic opening and closing assembly; 53. Horizontal electric slide; 54. Electromagnet; 55. Power supply; 56. Opening and closing door panel; 57. Mounting plate; 58. Static contact; 59. Moving contact. DETAILED DESCRIPTION

[0030] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0031] Embodiment: The present invention provides as shown in the attached Figures 1 to 7 The screening machine for wafer resistors shown includes a main frame 1, on which is provided a screening device 2 for screening wafer resistors, a feeding device 3 for feeding wafer resistors into the screening device 2, and a vibrating device 4 for vibrating the screening device 2; the screening device 2 is arranged obliquely, and includes a vibration disk frame 5 and an upper screen 6, a middle screen 7 and a lower screen 8 arranged vertically in layers on the vibration disk frame 5, the upper screen 6 and the middle screen 7 are respectively provided with a first mesh 9 and a second mesh 10, and the size of the first mesh 9 is larger than the size of the second mesh 10, and the upper screen 6, the middle screen 7 and the lower screen 8 are respectively provided with a first discharge channel 11, a second discharge channel 12 and a third discharge channel 13 at one end away from the feeding device 3, and the orthographic projections of the first discharge channel 11, the second discharge channel 12 and the third discharge channel 13 on the horizontal plane are staggered with each other. The wafer resistors are fed into the screening device 2 by the feeding device 3, and then the wafer resistors are rolled in order in the screening device 2 by the vibration device 4 to separate the wafer resistors. Among them, the screening device 2 adopts a three-layer screen and a double-layer screening design. This design fully considers the different defective and qualified characteristics of the wafer resistors, and realizes the accurate classification and discharge of the resistors by accurately adjusting the aperture and inclination angle of each layer of the screen. This classification method ensures that each type of product can be accurately processed, greatly improving the accuracy and efficiency of screening. The screening machine for wafer resistors also has the advantage of low design cost. Compared with the traditional single-layer drum screening machine, the structure of this equipment is simpler and more compact, which not only reduces the manufacturing cost, but also facilitates the installation and maintenance of the equipment. At the same time, due to the characteristics of the vibration screening method, this equipment has low noise and low energy consumption during operation, which further reduces the production cost.

[0032] Among them, the screen is a tool for screening and separating different sizes of resistors. The size of its mesh controls the resistance passing through. The screen is made of wear-resistant, high-strength carbon steel. To use the screen to screen out larger objects, it is necessary to select a suitable screen according to the size of the object to be screened.

[0033] In this embodiment, for the upper screen 6, the screen is 4.2 mm wide, and the mesh size of the screen should be larger than the maximum size of the items you want to screen out, so as to ensure that these larger items cannot pass through the screen. Place the items to be screened on top of the screen, and ensure that the screen is placed stably on a suitable container or flat surface to collect the screened items. Move the items on the screen by vibrating or shaking the screen. In this way, smaller items will pass through the mesh of the screen and fall into the container below, while larger items will be left above the screen.

[0034] For the middle screen 7, the middle screen 7 is the process of the screen to screen out smaller sizes and retain qualified samples, which mainly depends on the aperture size of the screen. It is necessary to select a suitable screen according to the size range of the resistor to be screened. The screen width is 3.8mm, and the aperture of the screen should be slightly smaller than the minimum size of the qualified sample to ensure that particles smaller than this size can pass through the screen, while particles larger than or equal to this size are retained on the screen. Smaller particles will pass through the screen and fall into the collection container below because their size is smaller than the aperture of the screen; while larger particles will be blocked by the screen

[13] and remain above the screen. Collect qualified samples above the screen and smaller particles below the screen. For qualified samples, further testing or use can be carried out; for smaller particles, further processing or discarding can be carried out as needed.

[0035] As for the lower screen 8, the main purpose of the lower screen design is to effectively intercept and collect unqualified products with smaller sizes produced during the production process. These unqualified products may not meet the standards due to reasons such as size. Through the effective interception of the lower screen, qualified products can be clearly distinguished from unqualified products.

[0036] As attached Figure 1 As shown, a guide plate 14 is provided at one end of the vibration plate frame 5 near the feeding device 3, and an upper enclosure 15, a middle enclosure 16 and a lower enclosure 17 are respectively provided at the peripheries of the upper screen 6, the middle screen 7 and the lower screen 8. A passage 18 for wafer resistors to pass through is provided on one side of the upper enclosure 15 near the guide plate 14, and the height of the passage 18 is less than the thickness of two wafer resistors. Arranging enclosures at the periphery of each screen can ensure that the wafer resistors will not fall to the outside during the screening process.

[0037] As attached Figure 2 and attached Figure 3As shown, the vibration device 4 includes a driving motor 19, a driving pulley 20, a driven pulley 21, a transmission belt 22, a transmission shaft 23, a crank 24 and a connecting assembly 25. Two bearing seats 26 are installed on the main frame 1. The two ends of the transmission shaft 23 are rotatably connected to the corresponding bearing seats 26. The driving pulley 20 is installed on the motor shaft of the driving motor 19 in a linkage manner. The driven pulley 21 is installed on the transmission shaft 23 in a linkage manner. The transmission belt 22 is coated on the driving pulley 20 and the driven pulley 21. The crank 24 is installed on the transmission shaft 23 in a linkage manner. The vibration disk frame 5 is movably arranged on the main frame 1. The vibration disk frame 5 is provided with a connecting seat 27. The two ends of the connecting assembly 25 are respectively hinged to the crank 24 and the connecting seat 27. The vibration device 4 is the power source of the screening machine. The transmission stability of the belt transmission assembly is good, which can make the screen produce stable vibration, so that the wafer resistors are evenly distributed on the screen and screened smoothly. The vibration device 4 is driven by a motor. The vibration intensity and frequency of the screen can be controlled by adjusting the rotation speed and amplitude of the motor.

[0038] As attached Figure 3 As shown, the connecting assembly 25 includes a crankshaft 28, a first connecting head 29 and a second connecting head 30. The first connecting head 29 is rotatably connected to the side of the crank 24 through a first bolt 31, and the second connecting head 30 is rotatably connected to the connecting seat 27 through a second bolt 32. The crankshaft 28 includes a middle shaft section 33 and a forward threaded section 34 and a reverse threaded section 35 arranged at both ends of the middle shaft section 33. The first connecting head 29 is provided with a forward screw hole 36 matched with the forward threaded section 34, and the second connecting head 30 is provided with a reverse screw hole 37 matched with the reverse threaded section 35. By rotating the crankshaft 28, the two connecting heads can be brought closer or farther away, thereby realizing the adjustment of the position of the screening device 2, and the operation is very convenient.

[0039] As attached Figure 3 As shown, a flat groove 38 is respectively provided on both sides of the middle shaft section 33. The flat grooves 38 are provided on both sides of the middle shaft section 33 to facilitate tool clamping or finger pinching, so as to rotate the crankshaft 28 to adjust the initial position of the screening device 2.

[0040] As attached Figure 2 As shown, the main frame 1 is provided with two parallel inclined rails 39, the vibration plate frame 5 is further provided with a bracket 40, the bracket 40 is provided with two parallel transverse rails 41, the transverse rails 41 are provided below the inclined rails 39, and the bottom of the vibration plate frame 5 is provided with two groups of pulleys 42, which are respectively rolled on the inclined rails 39 and the transverse rails 41. The bottom of the vibration plate frame 5 adopts a roller support method, which has stable movement and low friction.

[0041] As attached Figure 2As shown, the cross sections of the inclined rail 39 and the cross rail 41 are both triangular, and an annular positioning groove 43 with a triangular cross section is circumferentially arranged on the pulley 42. This design can realize the positioning of the two and prevent the pulley 42 from deviating from the running track when rolling.

[0042] As attached Figure 2 and attached Figure 4 As shown, the bracket 40 includes a movable rod 44 and a bottom rod 45, wherein the movable rod 44 is sleeved on the outer periphery of the bottom rod 45 and can be axially extended and retracted along the bottom rod 45, and the cross rail 41 is arranged on the movable rod 44; the vibration device 4 also includes a mobile hand-cranked lift 46, wherein an upper limit plate 47 is arranged on the movable rod 44, and a lower limit plate 48 is arranged at the bottom end of the bottom rod 45, wherein the upper limit plate 47 abuts against the top plate of the mobile hand-cranked lift 46, and the lower limit plate 48 abuts against the bottom plate of the mobile hand-cranked lift 46. By adjusting the mobile hand-cranked lift 46, the movable rod 44 can be driven to rise and fall, thereby driving the vibration plate frame 5 and the three screens to rise and fall, thereby adjusting their inclination angles.

[0043] As attached Figure 1 As shown, the feeding device 3 includes a silo 49 for placing wafer resistors and a track groove 50 arranged at the bottom of the silo 49. The bottom of the silo 49 is provided with a drop opening 51 connected to the track groove 50. The track groove 50 extends downwardly along the direction of the guide plate 14. This design can realize accurate and orderly feeding of wafer resistors.

[0044] As attached Figures 5 to 7As shown, the feeding device 3 also includes an automatic opening and closing component 52, which includes a horizontal electric slide 53, an electromagnet 54, a power supply 55 and an opening and closing door plate 56. The horizontal electric slide 53 is installed on the main frame 1, and a mounting plate 57 is provided on the movable end of the horizontal electric slide 53. The silo 49 and the electromagnet 54 are installed on the mounting plate 57. The moving iron core of the electromagnet 54 is connected to the opening and closing door plate 56. The opening and closing door plate 56 passes through the silo 49 and is driven by the moving iron core of the electromagnet 54. The movable lower part has a first position for closing the blanking port 51 and a second position for opening the blanking port 51; a static contact 58 is provided on the horizontal electric slide 53, and the power supply 55 is electrically connected to the static contact 58; a moving contact 59 is provided on the mounting plate 57, and the moving contact 59 is electrically connected to the electromagnet 54. When the material bin 49 moves to above the material guide plate 14, the static contact 58 and the moving contact 59 abut against each other to form electrical conduction, that is, at this time, the power supply 55, the static contact 58, the moving contact 59 and the electromagnet 54 are connected in series. During loading, the opening and closing door plate 56 closes the drop-out port 51, and the wafer resistors can be loaded into the hopper 49. The horizontal electric slide 53 is started to drive the hopper 49 to move. When the hopper 49 moves to above the guide plate 14, the static contact 58 and the moving contact 59 are electrically connected, and the power supply 55 supplies power to the electromagnet 54. The moving iron core of the electromagnet 54 drives the opening and closing door plate 56 to retract, opening the drop-out port 51, and the wafer resistors in the hopper 49 fall into the screening device 2 along the track groove 50. It is not only easy to use, but also can significantly improve the screening efficiency.

Claims

1. Screening machine for wafer resistors, Features: The invention comprises a main frame (1), wherein the main frame (1) is provided with a screening device (2) for screening wafer resistors, a feeding device (3) for feeding the wafer resistors into the screening device (2), and a vibrating device (4) for vibrating the screening device (2); the screening device (2) is arranged in an inclined manner, and the screening device (2) comprises a vibrating plate frame (5) and an upper screen (6), a middle screen (7) and a lower screen (8) which are arranged in layers vertically on the vibrating plate frame (5), wherein the upper screen (6) and the middle screen (7) are arranged on the vibrating plate frame (5). The screen (7) is provided with a first mesh hole (9) and a second mesh hole (10), and the size of the first mesh hole (9) is larger than the size of the second mesh hole (10). The ends of the upper screen (6), the middle screen (7) and the lower screen (8) away from the feeding device (3) are provided with a first discharge channel (11), a second discharge channel (12) and a third discharge channel (13), respectively. The orthographic projections of the first discharge channel (11), the second discharge channel (12) and the third discharge channel (13) on a horizontal plane are staggered with each other.

2. The wafer resistor screening machine according to claim 1, Features: A material guide plate (14) is provided at one end of the vibration disk frame (5) close to the feeding device (3); an upper enclosure plate (15), a middle enclosure plate (16) and a lower enclosure plate (17) are respectively provided at the periphery of the upper screen (6), the middle screen (7) and the lower screen (8); a passage (18) for wafer resistors to pass through is provided on one side of the upper enclosure plate (15) close to the material guide plate (14); and the height of the passage (18) is less than the thickness of two wafer resistors.

3. The wafer resistor screening machine according to claim 1, Features: The vibration device (4) comprises a driving motor (19), a driving pulley (20), a driven pulley (21), a transmission belt (22), a transmission shaft (23), a crank (24) and a connecting assembly (25); two bearing seats (26) are installed on the main frame (1); two ends of the transmission shaft (23) are rotatably connected to the corresponding bearing seats (26); the driving pulley (20) is installed on the motor shaft of the driving motor (19); the driven pulley (21) is installed on the transmission shaft (23); the transmission belt (22) is covered on the driving pulley (20) and the driven pulley (21); the crank (24) is installed on the transmission shaft (23); the vibration disk frame (5) is movably arranged on the main frame (1); a connecting seat (27) is provided on the vibration disk frame (5); and two ends of the connecting assembly (25) are respectively hinged to the crank (24) and the connecting seat (27).

4. The wafer resistor screening machine according to claim 3, Features: The connecting assembly (25) comprises a crankshaft (28), a first connecting head (29) and a second connecting head (30); the first connecting head (29) is rotatably connected to the side of the crank (24) via a first bolt (31); the second connecting head (30) is rotatably connected to the connecting seat (27) via a second bolt (32); the crankshaft (28) comprises a middle shaft section (33) and a forward threaded section (34) and a reverse threaded section (35) arranged at both ends of the middle shaft section (33); the first connecting head (29) is provided with a forward screw hole (36) matching with the forward screw section (34); the second connecting head (30) is provided with a reverse screw hole (37) matching with the reverse thread section (35).

5. The wafer resistor screening machine according to claim 4, Features: A flat groove (38) is respectively arranged on both sides of the middle shaft section (33).

6. The wafer resistor screening machine according to claim 3, Features: The main frame (1) is provided with two parallel inclined rails (39), a bracket (40) is further provided below the vibration plate frame (5), the bracket (40) is provided with two parallel transverse rails (41), the transverse rails (41) are arranged below the inclined rails (39), and two groups of pulleys (42) are provided at the bottom of the vibration plate frame (5), and the two groups of pulleys (42) are respectively rollingly arranged on the inclined rails (39) and the transverse rails (41).

7. The wafer resistor screening machine according to claim 6, Features: The cross sections of the inclined rail (39) and the cross rail (41) are both triangular in shape, and an annular positioning groove (43) with a triangular cross section is provided on the pulley (42) along the circumferential direction.

8. The wafer resistor screening machine according to claim 6, Features: The bracket (40) comprises a movable rod (44) and a bottom rod (45), wherein the movable rod (44) is sleeved on the outer periphery of the bottom rod (45) and can be axially extended and retracted along the bottom rod (45), and the cross rail (41) is arranged on the movable rod (44); the vibration device (4) also comprises a mobile hand-cranked lift (46), wherein an upper limit plate (47) is arranged on the movable rod (44), and a lower limit plate (48) is arranged at the bottom end of the bottom rod (45), wherein the upper limit plate (47) abuts against the top plate of the mobile hand-cranked lift (46), and the lower limit plate (48) abuts against the bottom plate of the mobile hand-cranked lift (46).

9. The wafer resistor screening machine according to claim 2, Features: The feeding device (3) comprises a material bin (49) for placing wafer resistors and a track groove (50) arranged at the bottom of the material bin (49); a material drop opening (51) connected to the track groove (50) is provided at the bottom of the material bin (49); and the track groove (50) extends downwardly at an angle along the direction of the guide plate (14).

10. The wafer resistor screening machine according to claim 9, Features: The feeding device (3) also includes an automatic opening and closing component (52), which includes a transverse electric slide (53), an electromagnet (54), a power supply (55) and an opening and closing door plate (56). The transverse electric slide (53) is installed on the main frame (1), and a mounting plate (57) is provided on the movable end of the transverse electric slide (53). The material bin (49) and the electromagnet (54) are installed on the mounting plate (57). The moving iron core of the electromagnet (54) is connected to the opening and closing door plate (56), and the opening and closing door plate (56) passes through the material bin. The bin (49) has a first position for closing the blanking opening (51) and a second position for opening the blanking opening (51) under the drive of the moving iron core of the electromagnet (54); a static contact (58) is provided on the transverse electric slide (53), the power supply (55) is electrically connected to the static contact (58), and a moving contact (59) is provided on the mounting plate (57), and the moving contact (59) is electrically connected to the electromagnet (54). When the bin (49) moves to above the guide plate (14), the static contact (58) and the moving contact (59) abut against each other to form electrical conduction.

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