A semiconductor insulation withstand voltage automatic test device

Abstract

The present invention discloses an automatic semiconductor insulation withstand voltage test device, which relates to the technical field of semiconductor withstand voltage test. The present invention includes a detection box and a plurality of crystal diodes, and also includes a positioning and placing unit, a conveying and loading unit and a detection unit; the positioning and placing unit is arranged in the detection box, and includes a placing component and a locking component; the conveying and loading unit is arranged in the positioning and placing unit, and includes a loading storage component and a conveying component; the detection unit is arranged on the conveying and loading unit, and includes a detection component and an adjustment component; the control console is arranged on the detection box. The advantage is that the present invention can automatically complete the loading, conveying and insulation withstand voltage test of multiple crystal diodes by using a single set of test components, and the automation and intelligence are higher. The entire test process is carried out in a closed environment, and no operator assistance is required. The test results will not be affected by external environmental factors, and the test safety and test accuracy are higher.

Description

Technical Field

[0001] The invention relates to the technical field of semiconductor withstand voltage testing, and in particular to a semiconductor insulation withstand voltage automatic testing device. Background Art

[0002] Semiconductor devices refer to electronic components made of semiconductor materials with conductivity between good conductors and insulators, mainly including crystal diodes, optoelectronic devices, integrated circuits, sensors, etc. After the preparation of crystal diodes, they usually need to be subjected to insulation withstand voltage tests using test equipment to determine whether the insulation performance of the crystal diodes is qualified;

[0003] Existing test devices use a variety of methods to implement semiconductor insulation withstand voltage tests, such as a semiconductor insulation withstand voltage automatic test device with publication number CN118259122A, which includes a workbench and an insulating tray, the workbench is provided with a lifting mechanism for pushing the insulating tray, and a plurality of detection units are arranged above the lifting mechanism, the detection units include an anode conductive plate and a cathode probe, the anode conductive plate is fixedly connected with an anode wire, the anode wire is connected to the AC positive pole of the insulation tester, the anode conductive plate is slidably connected with a plurality of densely arranged anode probes, and a limit block is arranged at one end of the anode probe extending from the top surface of the anode conductive plate;

[0004] When the existing test device tests the semiconductor, it is necessary to connect the positive and negative electrodes of the semiconductor to the positive and negative test clamps of the test device respectively before testing. This test method is inefficient and the semiconductor needs to be touched manually during the test, which poses a safety hazard of electric shock. For example, the above-mentioned prior art uses multiple sets of test probes to test multiple semiconductors. Although this method can test multiple sets of semiconductors at the same time, it requires manual placement of the semiconductors before testing, and the semiconductors need to be taken out one by one after the test, which is troublesome to operate. The overall cost of the multiple sets of test probes is also relatively high. In addition, the entire test process is carried out outside, and the test results are easily affected by external dust, air temperature and humidity, etc.

[0005] Therefore, it is urgent to design a semiconductor insulation withstand voltage automatic testing device to solve the above problems. Summary of the invention

[0006] In view of the deficiencies in the prior art, the present invention provides a semiconductor insulation withstand voltage automatic testing device, which solves the problems raised in the above-mentioned background technology.

[0007] To achieve the above objectives, the present invention is implemented through the following technical solutions: a semiconductor insulation withstand voltage automatic test device, including a detection box and a plurality of crystal diodes, and also including a positioning and placement unit, a conveying and loading unit and a detection unit;

[0008] The positioning and placing unit is arranged in the detection box body, and is used to realize the support and position adjustment of the conveying and loading unit, and includes a placing component and a locking component;

[0009] The conveying and loading unit is arranged in the positioning and placing unit, and is used to realize the continuous and uninterrupted loading and transportation of multiple crystal diodes, which includes a loading storage component and a conveying component, wherein the conveying component is used to transport the crystal diodes in the loading storage component to the detection unit for insulation withstand voltage test;

[0010] The detection unit is arranged on the conveying and loading unit, and is used to implement the insulation withstand voltage test of the crystal diode, and includes a detection component and an adjustment component, wherein the adjustment component is used to adjust the position of the detection component to ensure the accuracy of the detection position;

[0011] The control console is arranged on the detection box body and is used to control the opening and closing and operation status of the positioning and placement unit, the conveying and loading unit and the detection unit.

[0012] Preferably, the placement component comprises an inner detection groove provided in the detection box body, a detection box is installed in the inner detection groove through a sliding mechanism, a sealing cover is fixedly installed on the detection box, and the sealing cover cooperates with the inner detection groove, the detection box and the sealing cover are both provided with a connected discharge opening for discharging the crystal diode, and a discharge rotating plate cooperating with the discharge opening is rotatably installed on the sealing cover;

[0013] The lower part of the detection box is provided with an inclined guide plate and a buffer rubber pad, the buffer rubber pad is used for buffering and protecting the crystal diode, and the inclined guide plate cooperates with the discharge opening to promote the discharge of the crystal diode.

[0014] Preferably, the sliding mechanism comprises two limiting slide bars arranged at the bottom of the detection inner groove, the lower part of the detection box is provided with two limiting slide grooves, and the two limiting slide bars are respectively engaged and installed in the two limiting slide grooves.

[0015] Preferably, the locking assembly comprises two ejection springs fixedly mounted between the detection box and the detection inner groove, the detection box is provided with two power sockets, and the detection inner groove is provided with two power supply sockets for power supply matching with the corresponding power sockets;

[0016] A positioning locking rod is fixedly installed on the detection box, an electric telescopic rod 1 is arranged on the top of the detection inner groove, and a positioning rod matching the positioning locking rod is fixedly installed on the driving end of the electric telescopic rod 1.

[0017] Preferably, the loading and storage assembly includes a storage loading box arranged on the detection box for storing multiple crystal diodes, and a placement opening is opened on the upper part of the storage loading box. The storage loading box is fixedly connected to a unloading box, and an electric opening and closing door is arranged in the unloading box.

[0018] Preferably, the conveying assembly comprises a servo motor fixedly installed in the detection box, an active roller is rotatably installed between the driving end of the servo motor and the detection box, a driven roller is rotatably installed in the detection box, and a conveyor belt is sleeved between the active roller and the driven roller, a plurality of placement racks for placing crystal diodes are arranged on the conveyor belt, and a trigger mechanism is installed between the placement rack and the unloading box;

[0019] A circulation mechanism is installed in the detection box.

[0020] Preferably, the trigger mechanism comprises an elastic rotating shaft arranged on the placement rack, a trigger rod is rotatably mounted on the elastic rotating shaft, a trigger button cooperating with the trigger rod is arranged on the unloading box, and the trigger button cooperates with the electric opening and closing door;

[0021] The trigger rod moves and contacts the trigger button once, and the trigger button controls the electric door to open and close once, and during the opening and closing process, a crystal diode in the storage loading box automatically falls off.

[0022] Preferably, the adjustment component includes a mounting plate arranged on the storage loading box, on which two electric telescopic rods 2 are arranged, and a lifting plate is commonly installed at the lower ends of the two electric telescopic rods 2. The electric telescopic rods 2 drive the lifting plate to rise and fall, thereby realizing the height position adjustment of the detection component.

[0023] Preferably, the detection assembly includes two connecting plates fixedly mounted on the lower part of the lifting plate, a reset shaft is arranged between the two connecting plates, a plurality of test clamps are rotatably mounted on the reset shaft, and two test clamps in symmetrical positions cooperate with each other to automatically clamp and perform insulation withstand voltage tests on the positive and negative terminals of the crystal diode, respectively.

[0024] Preferably, the circulation mechanism includes an induced draft baffle fixedly installed in the detection box, and a plurality of induced draft holes are provided on the induced draft baffle and the detection box, the active roller and the driven roller are both provided with induced draft wheels, and the two induced draft wheels are both located in the induced draft baffle, and two blowing pipes are provided on the induced draft baffle, and the rotation of the active roller and the driven roller drives the two induced draft wheels to rotate, and the rotation of the induced draft wheels promotes the flow and circulation of gas in the detection box through the cooperation of the induced draft holes and the blowing pipes.

[0025] The present invention provides a semiconductor insulation withstand voltage automatic testing device. It has the following beneficial effects:

[0026] 1. When the test device performs insulation withstand voltage test on the crystal diode, the test box and the inner test slot are matched to perform the entire insulation withstand voltage test process of the crystal diode inside the test box. The entire test process will not be affected by external interference factors, and the test result is more accurate.

[0027] 2. When the test device performs insulation withstand voltage test on the crystal diode, multiple crystal diodes to be tested can be placed in the storage loading box for storage at the same time through the setting of the storage loading box, and the unloading and conveying test of the crystal diode can be automatically performed according to the test process during the test, so that the test efficiency is higher.

[0028] 3. When the test device performs insulation withstand voltage test on crystal diodes, the conveyor belt and the trigger mechanism can automatically convey and conduct insulation withstand voltage test on multiple groups of crystal diodes. The whole test process does not require the participation of staff, thus avoiding injuries caused by staff accidentally touching the test device.

[0029] 4. When the test device performs insulation withstand voltage test on the crystal diode, a single set of test components can be used to test multiple crystal diodes, and the positive and negative poles of the crystal diode can be automatically clamped, and the insulation withstand voltage test can be performed simultaneously after clamping, which has higher test efficiency.

[0030] In summary, the present invention can automatically complete the loading, conveying and insulation withstand voltage testing of multiple crystal diodes using a single set of test components, with a higher degree of automation and intelligence. The entire test process is carried out in a closed environment and does not require operator assistance. The test results will not be affected by external environmental factors, and the test safety and test accuracy are higher. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] The specific embodiments of the present invention are further described in detail below in conjunction with the accompanying drawings, wherein:

[0032] Figure 1 A schematic diagram of the structure of a semiconductor insulation withstand voltage automatic test device proposed by the present invention;

[0033] Figure 2 It is a schematic diagram of the structure when the detection box of the present invention is drawn out;

[0034] Figure 3 for Figure 2 Schematic diagram of the structure after removing the detection box;

[0035] Figure 4 It is a structural schematic diagram of the positioning and placement unit in the present invention;

[0036] Figure 5 for Figure 3 Schematic diagram of the internal structure of the detection box;

[0037] Figure 6 for Figure 5 Schematic diagram of the structure after removing the detection box;

[0038] Figure 7 for Figure 6 A front view of

[0039] Figure 8 for Figure 6 A front view of the internal structure of the storage loading box;

[0040] Fig. 9 It is a structural schematic diagram of the conveying and loading unit and the detection unit in the present invention;

[0041] Fig.10 for Fig. 9 Schematic diagram of the structure of the servo motor and conveyor belt;

[0042] Fig.11 for Fig. 9 Schematic diagram of the structure of the middle and lower material boxes and the placement rack;

[0043] Fig.12 It is a structural schematic diagram of the detection unit in the present invention;

[0044] Fig.13 for Fig.12 Schematic diagram of the structural decomposition.

[0045] In the figure: 1 detection box, 2 control console, 3 sealing cover, 4 discharge rotating plate, 5 detection inner groove, 6 detection box, 7 ejection spring, 8 power socket, 9 electric telescopic rod 1, 10 storage loading box, 11 induced draft baffle, 12 power socket, 13 positioning card locking rod, 14 limit slide bar, 15 conveyor belt, 16 blowing pipe, 17 inclined guide plate, 18 servo motor, 19 induced draft wheel, 20 driven roller, 21 crystal diode, 22 placement rack, 23 mounting plate, 24 buffer rubber pad, 25 electric opening and closing door, 26 trigger button, 27 trigger rod, 28 elastic shaft, 29 discharge opening, 30 electric telescopic rod 2, 31 lifting plate, 32 reset shaft, 33 test clamp, 34 discharge box. DETAILED DESCRIPTION

[0046] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0047] Example 1: Reference Figure 1-Figure 2 A semiconductor insulation withstand voltage automatic test device includes a test box 1 and a plurality of crystal diodes 21. Before testing, the plurality of crystal diodes 21 to be tested are taken out and placed in the same direction with the positive and negative poles to complete the test preparation.

[0048] The testing device also includes a positioning and placing unit, a conveying and feeding unit and a detection unit;

[0049] The positioning and placement unit is arranged in the detection box 1, and is used to realize the support and position adjustment of the conveying and loading unit, so that the entire test process of the crystal diode 21 is located inside the detection box 1, which can not only prevent the test process from being affected by external environmental factors, but also prevent the operator from being electrocuted during the power-on test;

[0050] The conveying and loading unit is arranged in the positioning and placing unit, and is used to realize the continuous and uninterrupted loading and conveying of multiple crystal diodes 21, so that when testing, multiple crystal diodes 21 can be automatically conveyed and loaded without the assistance of operators, which can effectively improve the detection efficiency of the crystal diodes 21, and the mechanical conveying and loading method can avoid the errors caused by manual placement;

[0051] The detection unit is arranged on the conveying and loading unit, and is used to implement the insulation withstand voltage test of the crystal diode 21. The crystal diode 21 conveyed by the conveying and loading unit can be tested in turn, and the height can be adaptively adjusted according to the height position of the crystal diode 21, so that the test stability is higher.

[0052] The control console 2 is arranged on the detection box 1, and is used to control the opening and closing and operation status of the positioning and placement unit, the conveying and loading unit and the detection unit, so as to realize automatic and intelligent testing, and can analyze, detect and record the test results of each crystal diode 21, so as to facilitate subsequent data analysis.

[0053] Example 2: Reference Figure 2-Figure 7 The technical solution of this embodiment is different from that of the first embodiment in that: the positioning and placing unit includes a placing component and a locking component, the placing component includes a detection inner groove 5 provided in the detection box 1, a detection box 6 is installed in the detection inner groove 5 through a sliding mechanism, a sealing cover 3 is fixedly installed on the detection box 6, and the sealing cover 3 cooperates with the detection inner groove 5;

[0054] The sliding mechanism includes two limit slide bars 14 arranged at the bottom of the detection inner groove 5. Two limit slide grooves are provided at the lower part of the detection box 6, and the two limit slide bars 14 are respectively engaged and installed in the two limit slide grooves. The limit slide bars 14 cooperate with the limit slide grooves to enable the detection box 6 to slide stably and horizontally in the detection inner groove 5, so that the detection box 6 can slide out or slide into the detection inner groove 5 flexibly.

[0055] When testing the crystal diode 21, the test box 6 slides into the test inner groove 5 with the cooperation of the sliding mechanism, and the test inner groove 5 is sealed with the sealing cover 3, so that the entire test process is completed in the test inner groove 5, thereby preventing the test process from being affected by external environmental factors.

[0056] In a further embodiment, the latch assembly includes two ejection springs 7 fixedly mounted between the detection box 6 and the detection inner groove 5, two power sockets 12 are provided in the detection box 6, and two power supply sockets 8 for power supply that match the corresponding power sockets 12 are provided in the detection inner groove 5;

[0057] When the detection box 6 is completely slid into the detection inner slot 5, the two power sockets 12 on the detection box 6 will be inserted into the two power supply sockets 8 on the detection inner slot 5. At this time, the two power supply sockets 8 will supply power to the detection box 6 through the two power sockets 12, and the test work can be started at this time;

[0058] If the test box 6 slides out, the power socket 8 is separated from the power socket 12, so that the internal components of the test box 6 are automatically powered off, so that when the test box 6 slides out to take and place the crystal diode 21, the operator will not have the risk of electric shock, further improving the safety of the test.

[0059] A positioning locking rod 13 is fixedly installed on the detection box 6, an electric telescopic rod 9 is arranged on the top of the detection inner groove 5, and a positioning rod matching the positioning locking rod 13 is fixedly installed on the driving end of the electric telescopic rod 9;

[0060] When the power supply socket 8 is engaged with the power connection socket 12, the electric telescopic rod 9 will start to drive the positioning rod thereon to move down and engage into the positioning locking rod 13, so that the detection box 6 can be positioned by the positioning locking rod 13, so that it cannot be pulled out from the detection inner groove 5 during the test, which can not only realize the orderly progress of the detection work, but also improve the stability and safety of the detection process.

[0061] The detection box 6 and the sealing cover 3 are both provided with a discharge opening 29 for discharging the crystal diode 21, and a discharge rotating plate 4 cooperating with the discharge opening 29 is rotatably mounted on the sealing cover 3;

[0062] The lower part of the detection box 6 is provided with an inclined guide plate 17 and a buffer rubber pad 24. The buffer rubber pad 24 is used to provide buffer protection for the crystal diode 21. The inclined guide plate 17 cooperates with the discharge opening 29 to facilitate the discharge of the crystal diode 21.

[0063] After the crystal diode 21 is tested, it will fall onto the buffer rubber pad 24 and roll onto the inclined guide plate 17 for storage. When all the crystal diodes 21 have been tested, the discharge turntable 4 can be opened to allow the multiple crystal diodes 21 on the inclined guide plate 17 to automatically slide out through the discharge opening 29, thereby realizing automatic discharge of the crystal diodes 21.

[0064] Example 3: Reference Figure 5-Figure 11The difference between this embodiment and the second embodiment is that the conveying and loading unit includes a loading and storage component and a conveying component, wherein the conveying component is used to transport the crystal diode 21 in the loading and storage component to the detection unit for insulation withstand voltage test;

[0065] The loading storage assembly includes a storage loading box 10 disposed on the detection box 6 for storing a plurality of crystal diodes 21, and a placement opening is provided on the upper portion of the storage loading box 10, a discharge box 34 is fixedly connected to the storage loading box 10, and an electric opening and closing door 25 is provided in the discharge box 34;

[0066] When testing the crystal diodes 21, multiple crystal diodes 21 can be placed in the storage loading box 10 in the same direction with the positive and negative poles in sequence through the placement opening for storage, thereby completing the loading preparation work.

[0067] In a further embodiment, the conveying assembly includes a servo motor 18 fixedly installed in the detection box 6, an active roller is rotatably installed between the driving end of the servo motor 18 and the detection box 6, a driven roller 20 is rotatably installed in the detection box 6, and a conveyor belt 15 is sleeved between the active roller and the driven roller 20, and a plurality of placement racks 22 for placing crystal diodes 21 are arranged on the conveyor belt 15;

[0068] When the servo motor 18 is started, the active roller will be driven to rotate. The rotation of the active roller will drive the conveyor belt 15 to transmit with the cooperation of the driven roller 20, thereby driving the multiple placement racks 22 on the conveyor belt 15 to move in sequence.

[0069] A trigger mechanism is installed between the placement rack 22 and the material box 34, and the trigger mechanism includes an elastic shaft 28 arranged on the placement rack 22, a trigger rod 27 is rotatably installed on the elastic shaft 28, and a trigger button 26 cooperating with the trigger rod 27 is arranged on the material box 34, and the trigger button 26 cooperates with the electric opening and closing door 25;

[0070] When the placement rack 22 moves close to the material box 34, the trigger rod 27 on the placement rack 22 will move accordingly. When the trigger rod 27 continues to move, it will touch the trigger button 26 on the material box 34. At this time, the trigger button 26 will be automatically triggered to start, thereby controlling the electric opening and closing door 25 to start, and the electric opening and closing door 25 will automatically open and close again;

[0071] When the electric opening and closing door 25 is opened, a crystal diode 21 in the storage loading box 10 that is closest to the unloading box 34 will automatically fall through the unloading box 34 and fall onto the corresponding placement rack 22, thereby completing the automatic unloading of the crystal diode 21;

[0072] During the unloading process of the crystal diode 21, the servo motor 18 will stop starting and the placement rack 22 will stop conveying. When the crystal diode 21 is collected, the servo motor 18 will continue to start, driving the placement rack 22 and the crystal diode 21 thereon to continue conveying. When the next placement rack 22 moves to the unloading box 34, the above steps will be repeated to carry out the loading and conveying work of the next crystal diode 21.

[0073] The elastic rotating shaft 28 has the function of elastic reset, and it can automatically reset to a vertical state after rotation. When the trigger rod 27 on the elastic rotating shaft 28 contacts the trigger button 26, as the conveyor belt 15 continues to move, the placement rack 22 will move and drive the trigger rod 27 to contact, squeeze and deflect with the discharge box 34. When the trigger rod 27 moves to separate from the discharge box 34, the trigger rod 27 will automatically deflect and reset to a vertical state under the action of the elastic rotating shaft 28, so as to facilitate the feeding and conveying again.

[0074] Example 4: Reference Figure 5-Figure 6 , Figure 9-10 as well as Figure 12-13 , the technical solution of this embodiment is different from that of the third embodiment in that: the detection unit includes a detection component and an adjustment component, wherein the adjustment component is used to adjust the position of the detection component to ensure the accuracy of the detection position;

[0075] The adjustment component includes a mounting plate 23 arranged on the storage loading box 10, on which two electric telescopic rods 2 30 are arranged, and a lifting plate 31 is installed at the lower ends of the two electric telescopic rods 2 30, and the electric telescopic rods 2 30 drive the lifting plate 31 to rise and fall, thereby realizing the height position adjustment of the detection component;

[0076] When the placement rack 22 with the crystal diode 21 moves to the bottom of the detection assembly, the two electric telescopic rods 30 will start to drive the lifting plate 31 to move downward, thereby adjusting the height position of the detection assembly under the lifting plate 31, so that the detection assembly moves to the crystal diode 21, completing the test preparation of the crystal diode 21.

[0077] In a further embodiment, the detection assembly includes two connecting plates fixedly mounted at the lower part of the lifting plate 31, a reset shaft 32 is arranged between the two connecting plates, a plurality of test clamps 33 are rotatably mounted on the reset shaft 32, and two test clamps 33 in symmetrical positions cooperate with each other to automatically clamp and perform insulation withstand voltage tests on the positive terminal and the negative terminal of the crystal diode 21 respectively;

[0078] When the lifting plate 31 moves downward, the two test clamps 33 thereon will be driven to move downward, and the two test clamps 33 in symmetrical positions will be lowered. When the two test clamps 33 are lowered and contact and squeeze the positive terminal or negative terminal of the crystal diode 21, the two test clamps 33 will automatically open with the reset shaft 32 as the axis under the squeezing action of the crystal diode 21, and clamp and squeeze the positive terminal or negative terminal of the crystal diode 21 in the process of continuing to descend, forming the attached manual. Fig.12 In the state shown, the multiple test clamps 33 will start to energize the positive terminal of the crystal diode 21, and receive it through the negative terminal, so as to realize the automatic test of the insulation withstand voltage of the crystal diode 21;

[0079] When the test is completed, the adjustment component will start to drive multiple test clamps 33 to move up and separate them from the crystal diode 21. When testing the crystal diode 21, the servo motor 18 will be turned off to stop the conveyor belt 15 and the placement rack 22 thereon to avoid position displacement during the test of the crystal diode 21. After the test is completed and the crystal diode 21 is separated, the servo motor 18 will start to drive the placement rack 22 and the crystal diode 21 thereon to continue conveying. When the placement rack 22 is transported to the end of the conveyor belt 15, the placement rack 22 will automatically deflect downward. At this time, the crystal diode 21 on the placement rack 22 will automatically fall down, completing the unloading and separation of the crystal diode 21.

[0080] In a further embodiment, a circulation mechanism is installed in the detection box 6, and the circulation mechanism includes an air induction baffle 11 fixedly installed in the detection box 6, and a plurality of air induction holes are opened on the air induction baffle 11 and the detection box 6, and air induction wheels 19 are arranged on the active roller and the driven roller 20, and the two air induction wheels 19 are both located in the air induction baffle 11, and two blowing pipes 16 are arranged on the air induction baffle 11;

[0081] The rotation of the active roller and the driven roller 20 drives the two induced draft wheels 19 to rotate. The rotation of the induced draft wheel 19 promotes the flow and circulation of gas in the detection box 6 through the cooperation of the induced draft holes and the blowing pipe 16. The rotation of the induced draft wheel 19 will suck air from the inside and outside of the detection box 6 through the induced draft holes, and suck the air into the induced draft baffle 11, and blow the air in the induced draft baffle 11 into the detection box 6, which can increase the air flow speed in the detection box 6 to a certain extent, realize the air flow circulation inside and outside the detection box 6, and reduce the working temperature inside the detection box 6 to a certain extent. During the test process, the temperature of the detection component and the crystal diode 21 is controlled so that the detection component and the crystal diode 21 operate within the ideal working temperature range, which helps to improve the accuracy and reliability of the test results and extend the service life of the detection component and the crystal diode 21.

[0082] The specific test method of this test device is as follows:

[0083] Loading of crystal diodes 21: When testing the crystal diodes 21, first pull the test box 6 out of the test box 1, then place multiple crystal diodes 21 in the same direction of positive and negative poles, and sequentially place them through the placement openings into the storage loading box 10 for storage, completing the loading preparation work;

[0084] Then push the detection box 6 back into the detection inner groove 5, and use the locking assembly to lock the detection box 6 in place, and power the detection box 6 through the cooperation of the power supply socket 8 and the power connection socket 12, and then start the test work.

[0085] Testing of the crystal diode 21: According to the model and parameters of the crystal diode 21 to be tested, the parameters of the test current are adjusted on the console 2, and then the servo motor 18 is started through the console 2 to drive the conveyor belt 15 to transport, so as to automatically load and test the crystal diode 21;

[0086] When the placement rack 22 moves and contacts the unloading box 34, the automatic unloading of the crystal diode 21 in the storage loading box 10 is realized through the cooperation of the trigger mechanism, so that the crystal diode 21 falls onto the placement rack 22 and continues to be transported with the placement rack 22;

[0087] When the placement rack 22 with the crystal diode 21 is moved to the bottom of the detection assembly, the two electric telescopic rods 30 will start to drive the lifting plate 31 to move downward, thereby adjusting the height position of the detection assembly below the lifting plate 31;

[0088] The downward movement of the lifting plate 31 will drive the two test clamps 33 to descend and contact and squeeze the positive terminal or negative terminal of the crystal diode 21. The two test clamps 33 will clamp and squeeze the positive terminal or negative terminal of the crystal diode 21 during the process of continuing to descend. At this time, multiple test clamps 33 will start to energize the positive terminal of the crystal diode 21 and receive it through the negative terminal, thereby realizing automatic testing of the insulation withstand voltage of the crystal diode 21;

[0089] When the test is completed, the adjustment component will start to drive multiple test clamps 33 to move up and separate them from the crystal diode 21. The crystal diode 21 will continue to be transported with the placement rack 22, and automatically fall onto the buffer rubber pad 24, and roll onto the inclined guide plate 17 for storage. When all the crystal diodes 21 have been tested, the discharge turntable 4 can be opened to allow the multiple crystal diodes 21 on the inclined guide plate 17 to automatically slide out through the discharge opening 29, thereby realizing the automatic discharge of the crystal diode 21.

[0090] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A semiconductor insulation withstand voltage automatic test device, comprising a detection box (1) and a plurality of crystal diodes (21), characterized in that: It also includes a positioning and placing unit, a conveying and loading unit, and a detection unit; The positioning and placing unit is arranged in the detection box (1) and is used to realize the support and position adjustment of the conveying and loading unit, and comprises a placing component and a locking component; The placement component comprises an inner detection groove (5) provided in the detection box (1), a detection box (6) being installed in the inner detection groove (5) via a sliding mechanism, a sealing cover (3) being fixedly installed on the detection box (6), and the sealing cover (3) and the inner detection groove (5) being matched, the detection box (6) and the sealing cover (3) being provided with a discharge opening (29) for discharging the crystal diode (21) and being connected to each other, and a discharge rotating plate (4) matching with the discharge opening (29) being rotatably installed on the sealing cover (3); An inclined guide plate (17) and a buffer rubber pad (24) are provided at the bottom of the detection box (6); the buffer rubber pad (24) is used to provide buffer protection for the crystal diode (21); the inclined guide plate (17) cooperates with the discharge opening (29) to facilitate the discharge of the crystal diode (21); The conveying and loading unit is arranged in the positioning and placing unit, and is used to realize continuous and uninterrupted loading and transportation of a plurality of crystal diodes (21), and comprises a loading and storage component and a conveying component, wherein the conveying component is used to transport the crystal diodes (21) in the loading and storage component to the detection unit for insulation withstand voltage testing; The detection unit is arranged on the conveying and loading unit and is used to implement an insulation withstand voltage test of the crystal diode (21), and comprises a detection component and an adjustment component, wherein the adjustment component is used to adjust the position of the detection component to ensure the accuracy of the detection position; The control console (2) is arranged on the detection box (1) and is used to control the opening and closing and operating status of the positioning and placement unit, the conveying and loading unit and the detection unit.

2. A semiconductor insulation withstand voltage automatic test device according to claim 1, characterized in that: The sliding mechanism comprises two limit sliding bars (14) arranged at the bottom of the detection inner groove (5), the lower part of the detection box (6) is provided with two limit sliding grooves, and the two limit sliding bars (14) are respectively engaged and installed in the two limit sliding grooves.

3. The semiconductor insulation withstand voltage automatic testing device according to claim 1, characterized in that: The locking assembly comprises two ejection springs (7) fixedly mounted between the detection box (6) and the detection inner groove (5); the detection box (6) is provided with two power supply sockets (12), and the detection inner groove (5) is provided with two power supply sockets (8) for supplying power and matching with the corresponding power supply sockets (12); A positioning locking rod (13) is fixedly mounted on the detection box (6), an electric telescopic rod (9) is arranged on the top of the detection inner groove (5), and a positioning rod matching the positioning locking rod (13) is fixedly mounted on the driving end of the electric telescopic rod (9).

4. The semiconductor insulation withstand voltage automatic testing device according to claim 1, characterized in that: The loading storage assembly comprises a storage loading box (10) arranged on a detection box (6) for storing a plurality of crystal diodes (21), wherein an upper portion of the storage loading box (10) is provided with a placement opening, a lowering box (34) is fixedly connected to the storage loading box (10), and an electric opening and closing door (25) is arranged in the lowering box (34).

5. A semiconductor insulation withstand voltage automatic test device according to claim 4, characterized in that: The conveying assembly comprises a servo motor (18) fixedly mounted in the detection box (6), an active roller rotatably mounted between the driving end of the servo motor (18) and the detection box (6), a driven roller (20) rotatably mounted in the detection box (6), a conveyor belt (15) sleeved between the active roller and the driven roller (20), a plurality of placement racks (22) for placing crystal diodes (21) are arranged on the conveyor belt (15), and a trigger mechanism is installed between the placement racks (22) and the unloading box (34); A circulation mechanism is installed in the detection box (6).

6. The semiconductor insulation withstand voltage automatic testing device according to claim 5, characterized in that: The trigger mechanism comprises an elastic rotating shaft (28) arranged on the placement frame (22), a trigger rod (27) is rotatably mounted on the elastic rotating shaft (28), a trigger button (26) cooperating with the trigger rod (27) is arranged on the unloading box (34), and the trigger button (26) cooperates with the electric opening and closing door (25); The trigger rod (27) moves to contact the trigger button (26) once, and the trigger button (26) controls the electric opening and closing door (25) to open and close once, and realizes the automatic falling of a crystal diode (21) in the storage loading box (10) during the opening and closing process.

7. The semiconductor insulation withstand voltage automatic testing device according to claim 5, characterized in that: The adjustment component comprises a mounting plate (23) arranged on the storage loading box (10), two electric telescopic rods (30) being arranged on the mounting plate (23), a lifting plate (31) being commonly mounted at the lower ends of the two electric telescopic rods (30), and the electric telescopic rods (30) driving the lifting plate (31) to move up and down, thereby achieving height position adjustment of the detection component.

8. The semiconductor insulation withstand voltage automatic testing device according to claim 7, characterized in that: The detection assembly comprises two connecting plates fixedly mounted on the lower part of the lifting plate (31), a reset shaft (32) being arranged between the two connecting plates, a plurality of test clamps (33) being rotatably mounted on the reset shaft (32), and two test clamps (33) in symmetrical positions cooperating with each other to respectively automatically clamp and perform insulation withstand voltage tests on the positive terminal and the negative terminal of the crystal diode (21).

9. The semiconductor insulation withstand voltage automatic testing device according to claim 5, characterized in that: The circulation mechanism comprises an air induction baffle (11) fixedly mounted in the detection box (6), and a plurality of air induction holes are provided on the air induction baffle (11) and the detection box (6), the active roller and the driven roller (20) are both provided with air induction wheels (19), and the two air induction wheels (19) are both located in the air induction baffle (11), and two air blowing pipes (16) are provided on the air induction baffle (11), the active roller and the driven roller (20) rotate to drive the two air induction wheels (19) to rotate, and the rotation of the air induction wheels (19) promotes the flow and circulation of gas in the detection box (6) through the cooperation of the air induction holes and the air blowing pipes (16).

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