Adjusting mechanism for chip testing machine
By designing the adjustment mechanism in the chip test machine, and using the motor to drive the threaded rod and sliding components to adjust the height and angle of the clamping plate, the problem of difficult fixing of different chips in the existing technology is solved, and the testing efficiency is improved and adaptability.
Patent Information
- Application Number
- CN202411445514.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-16
- Publication Date
- 2024-12-17
AI Technical Summary
When existing chip test machines fix and clamp different chip types, they are not easy to adapt and adjust, which will affect the test progress. Angle conversion requires manual adjustment by the operator, which is time-consuming and labor-intensive and delays testing.
An adjustment mechanism for chip testing machine is designed, including a base plate, column sleeve, motor, one-way threaded rod, bidirectional threaded rod, auxiliary sliding assembly, telescopic rod and adsorption plate. The clamping plate is realized by driving the threaded rod and sliding assembly by motor. The height and angle adjustment are adapted to the clamping of chips of different specifications.
The comprehensive adjustment of the chip test machine has been achieved, the adaptability and adjustment smoothness of the clamping plate have been improved, the labor intensity of the operator has been reduced, and the testing efficiency has been improved.
Smart Images
Figure CN119147939A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of chip testers, and in particular to an adjustment mechanism for a chip tester. Background Art
[0002] A chip tester is a device specifically designed to test the performance and functionality of integrated circuits (ICs). These machines are typically used in production lines to ensure that each chip meets specific performance standards before leaving the factory. Chip testers can perform a variety of tests.
[0003] When performing chip testing, the chip tester is generally placed on a rack. Before testing, the chip tester needs to be connected to the probe card and aligned with the test wafer. For different types of test wafers, the chip tester on the rack needs to be turned to different directions and adjusted to different angles for alignment.
[0004] Existing chip testers are not easy to adapt and adjust when fixing and clamping chips of different models, which affects the progress of chip testing. In addition, angle conversion requires adjustments by operators, which is not only time-consuming and labor-intensive, but also delays the test.
[0005] For this purpose, we propose an adjustment mechanism for a chip testing machine. Summary of the invention
[0006] In view of the above problems, the present invention provides an adjustment mechanism for a chip tester, which has the advantage of comprehensive adjustment angles.
[0007] The technical solution of the present invention is: it includes a base plate, a column sleeve is fixedly connected to the top of the base plate, a first motor is fixedly connected to the top of the column sleeve, a one-way threaded rod is connected to the output end of the first motor, the one-way threaded rod and the column sleeve are rotatably matched, the one-way threaded rod side wall is transmission matched with a moving block, the end of the moving block is rotatably matched with a rotating table, the side wall of the rotating table is fixedly connected with a mounting frame, the outer side wall of the mounting frame is fixedly connected to a second motor, the output end of the second motor is connected to a bidirectional threaded rod, the bidirectional threaded rod and the mounting frame are rotatably matched, the side wall of the bidirectional threaded rod is transmission matched with an adjustment plate, two adjustment plates are provided on the side wall of the bidirectional threaded rod, each of the adjustment plate side walls is sleeved with a clamping plate, the clamping plate side walls are fixedly connected with an adaptation component, and the side wall of the column sleeve is rotatably matched with an auxiliary sliding component.
[0008] The height of the clamping plate can be adjusted by setting the first motor and the one-way threaded rod, the position adjustment of the moving block can be assisted by the auxiliary sliding component, the angle of the mounting frame can be adjusted by the rotating table, the position of the clamping plate can be adjusted by the two-way threaded rod through the setting of the second motor, and the chips of different specifications can be adaptively clamped by the setting of the adaptation component, thereby enhancing the overall adjustment effect of the adjustment mechanism of the chip testing machine.
[0009] In a further technical solution, the adaptation component includes a fixed block, the top and bottom of the clamping plate are fixedly connected to fixed blocks, the fixed blocks are evenly distributed on the top and bottom of the clamping plate, the bottom of the fixed block is fixedly connected to a fixed plate, the side wall of the fixed plate is fixedly connected to a telescopic rod, the output end of the telescopic rod is in sliding fit with the fixed plate and the clamping plate, and the telescopic rod is evenly distributed on the side wall of the fixed plate.
[0010] Each group of telescopic rod side walls is sleeved with a first spring. The telescopic rod can be installed and fixed by the setting of the fixing block and the fixing plate. The chip clamped by the clamping plate can be adaptively clamped by the setting of the telescopic rod and the first spring, further enhancing the adaptive clamping effect of the adjustment mechanism of the chip testing machine.
[0011] In a further technical solution, the auxiliary sliding assembly includes a pulley, the side wall of the column sleeve is rotatably matched with a pulley, the pulley is evenly distributed on the side wall of the column sleeve, the side wall of the moving block is provided with a sliding groove, the sliding groove is evenly distributed on the side wall of the moving block, and the sliding groove and the pulley are slidably matched.
[0012] The height adjustment of the moving block can be made smoother by setting the slide groove and the pulley, further enhancing the smooth adjustment effect of the adjustment mechanism for the chip testing machine.
[0013] In a further technical solution, an adsorption disk is installed at the output end of the telescopic rod, and an adsorption hole is opened on the inner wall of the adsorption disk.
[0014] By setting the adsorption plate, the chip that is clamped by the telescopic rod can be adsorbed and fixed, further enhancing the adsorption effect of the adjustment mechanism of the chip testing machine.
[0015] In a further technical solution, a damper is installed in the middle of the base plate, the dampers are evenly distributed in the middle of the base plate, the bottom end of the damper is rotatably matched with a universal wheel, and each group of damper side walls is sleeved with a damping spring.
[0016] The entire mechanism can be moved by the setting of the universal wheel, and the setting of the damper and the damping spring can provide shock absorption and buffering when encountering bumps during movement, further enhancing the mobile buffering effect of the adjustment mechanism for the chip testing machine.
[0017] In a further technical solution, a protective block is fixedly connected to the inner side wall of the mounting frame, and the protective block is rotationally matched with the bidirectional threaded rod.
[0018] By setting the protection block, the adjustment plate can be protected when the distance is adjusted, reducing the impact of excessive adjustment on the adjustment plate and the clamping plate, and further strengthening the protection effect of the adjustment mechanism of the chip tester.
[0019] In a further technical solution, the inner wall of the adsorption disk is covered with a dustproof film.
[0020] The provision of a dustproof film on the inner wall of the adsorption tray can reduce dust accumulation inside the adsorption tray, further reducing the effect of dust on the clamping of the chip tester's adjustment mechanism.
[0021] The beneficial effects of the present invention are: The height of the clamping plate can be adjusted by setting the first motor and the one-way threaded rod, the position adjustment of the moving block can be assisted by the auxiliary sliding component, the angle of the mounting frame can be adjusted by the rotating table, the position of the clamping plate can be adjusted by the two-way threaded rod by setting the second motor, and the chips of different specifications can be adaptively clamped by setting the adaptation component, thereby enhancing the overall adjustment effect of the adjustment mechanism of the chip tester. Each group of telescopic rod side walls is sleeved with a first spring. The telescopic rod can be installed and fixed by the setting of the fixing block and the fixing plate. The chip clamped by the clamping plate can be adaptively clamped by the setting of the telescopic rod and the first spring, further enhancing the adaptive clamping effect of the adjustment mechanism of the chip testing machine. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] Figure 1 It is a schematic diagram of the overall structure of a chip testing machine according to an embodiment of the present invention; Figure 2 It is a schematic diagram of the structure of the moving block of the chip tester according to an embodiment of the present invention; Figure 3 is a schematic diagram of a first spring structure of a chip testing machine according to an embodiment of the present invention; Figure 4 It is a schematic diagram of the damping spring structure of the chip testing machine according to an embodiment of the present invention.
[0023] Description of reference numerals: 1. Base plate; 11. Column sleeve; 12. First motor; 13. One-way threaded rod; 14. Moving block; 15. Turntable; 16. Mounting frame; 17. Second motor; 18. Adjustment plate; 19. Clamping plate; 101. Two-way threaded rod; 2. Fixed block; 21. Fixed plate; 22. Telescopic rod; 23. First spring; 3. Slide groove; 31. Pulley; 4. Adsorption plate; 5. Damper; 51. Universal wheel; 52. Damping spring; 6. Protective block. DETAILED DESCRIPTION
[0024] The embodiments of the present invention will be further described below in conjunction with the accompanying drawings. Example
[0025] like Figure 1-Figure 4As shown, it includes a bottom plate 1, a column sleeve 11 is fixedly connected to the top of the bottom plate 1, a first motor 12 is fixedly connected to the top of the column sleeve 11, a one-way threaded rod 13 is connected to the output end of the first motor 12, the one-way threaded rod 13 and the column sleeve 11 are rotationally matched, a moving block 14 is transmission-matched with the side wall of the one-way threaded rod 13, a rotating table 15 is rotationally matched with the end of the moving block 14, a mounting frame 16 is fixedly connected to the side wall of the rotating table 15, and a second motor 17 is fixedly connected to the outer side wall of the mounting frame 16. The output end is connected with a bidirectional threaded rod 101, which is rotatably matched with the mounting frame 16. The side wall of the bidirectional threaded rod 101 is driven and matched with an adjustment plate 18. Two adjustment plates 18 are arranged on the side wall of the bidirectional threaded rod 101. Each side wall of the adjustment plate 18 is sleeved with a clamping plate 19. The side wall of the clamping plate 19 is fixedly connected with an adaptation component. The side wall of the column sleeve 11 is rotatably matched with an auxiliary sliding component. When working, the unidirectional threaded rod 13 can be rotated by the first motor 12 to move the moving block 14 The height movement can be adjusted to the position. The height adjustment of the moving block 14 can be made smoother through the auxiliary sliding component. The angle of the mounting frame 16 can be adjusted through the rotating table 15. The distance between the two adjustment plates 18 can be adjusted by rotating the bidirectional threaded rod 101 through the second motor 17. The clamping plate 19 is used to clamp the chip to be tested. The adaptive component can be used to adaptively clamp chips of different specifications. The height of the clamping plate 19 can be adjusted by setting the first motor 12 and the unidirectional threaded rod 13. The position adjustment of the moving block 14 can be assisted by the auxiliary sliding component. The angle of the mounting frame 16 can be adjusted through the rotating table 15. The position of the clamping plate 19 can be adjusted by using the bidirectional threaded rod 101 through the setting of the second motor 17. The chips of different specifications can be adaptively clamped by the setting of the adaptive component, thereby enhancing the overall adjustment effect of the adjustment mechanism of the chip testing machine.
[0026] like Figure 1-Figure 3 As shown, the adaptation component includes a fixed block 2, the top and bottom of the clamping plate 19 are fixedly connected to the fixed block 2, the fixed blocks 2 are evenly distributed on the top and bottom of the clamping plate 19, the bottom of the fixed block 2 is fixedly connected to a fixed plate 21, the side wall of the fixed plate 21 is fixedly connected to a telescopic rod 22, the output end of the telescopic rod 22 is in sliding cooperation with the fixed plate 21 and the clamping plate 19, the telescopic rod 22 is evenly distributed on the side wall of the fixed plate 21, and the side wall of each group of telescopic rods 22 is sleeved with a first spring 23. When working, the telescopic rod 22 can be fixed by the fixed block 2 and the fixed plate 21, and the chip clamped by the clamping plate 19 can be adapted to changes by the telescopic rod 22 and the first spring 23. The telescopic rod 22 can be installed and fixed by the setting of the fixed block 2 and the fixed plate 21, and the chip clamped by the clamping plate 19 can be adaptively clamped by the setting of the telescopic rod 22 and the first spring 23, which further enhances the adaptive clamping effect of the adjustment mechanism of the chip testing machine.
[0027] like Figure 1-Figure 2 As shown, the auxiliary sliding assembly includes a pulley 31, and the side wall of the column sleeve 11 is rotatably matched with the pulley 31. The pulleys 31 are evenly distributed on the side wall of the column sleeve 11. A slide groove 3 is opened on the side wall of the moving block 14, and the slide groove 3 is evenly distributed on the side wall of the moving block 14. The slide groove 3 and the pulley 31 are in sliding cooperation. When working, the height adjustment of the moving block 14 can be smoother through the slide groove 3 and the pulley 31, and there will be no blockage due to contact with the inner wall of the column sleeve 11. The setting of the slide groove 3 and the pulley 31 can make the height adjustment of the moving block 14 smoother, further enhancing the smooth adjustment effect of the adjustment mechanism of the chip testing machine.
[0028] like Figure 3 As shown, an adsorption plate 4 is installed at the output end of the telescopic rod 22, and an adsorption hole is opened on the inner wall of the adsorption plate 4. When working, the adsorption plate 4 can adsorb and fix the chip when the telescopic rod 22 contacts the clamped chip. Through the setting of the adsorption plate 4, the chip that is clamped by the telescopic rod 22 can be adsorbed and fixed, which further enhances the adsorption effect of the adjustment mechanism of the chip testing machine.
[0029] like Figure 1-Figure 4 As shown, a damper 5 is installed in the middle of the base plate 1, and the damper 5 is evenly distributed in the middle of the base plate 1. The bottom end of the damper 5 is rotatably matched with a universal wheel 51, and the side wall of each group of dampers 5 is sleeved with a damping spring 52. When working, the entire mechanism can be moved by the universal wheel 51, and the damper 5 and the damping spring 52 can be used to dampen and buffer the vibration encountered when the mechanism moves. The setting of the universal wheel 51 can make the entire mechanism move, and the setting of the damper 5 and the damping spring 52 can be used to dampen and buffer when encountering bumps during movement, thereby further enhancing the movement buffering effect of the adjustment mechanism of the chip tester.
[0030] like Figure 1-Figure 3 As shown, a protective block 6 is fixedly connected to the inner wall of the mounting frame 16, and the protective block 6 is rotatably matched with the bidirectional threaded rod 101. When working, the bidirectional threaded rod 101 can be used to protect the adjustment plate 18 for adjusting the distance. The setting of the protective block 6 can protect the adjustment plate 18 when the distance is adjusted, reducing the impact of excessive adjustment on the adjustment plate 18 and the clamping plate 19, and further enhancing the protection effect of the adjustment mechanism of the chip tester.
[0031] like Figure 3 As shown, the inner wall of the adsorption disk 4 is covered with a dustproof film. When working, the dust accumulation inside the adsorption disk 4 is reduced by the dustproof film covering the inner wall of the adsorption disk 4. The setting of the dustproof film on the inner wall of the adsorption disk 4 can reduce the dust accumulation inside the adsorption disk 4, and further reduce the influence of dust on the clamping of the adjustment mechanism of the chip testing machine.
[0032] The working principle of the above technical solution is as follows: Working principle: During operation, the one-way threaded rod 13 can be rotated by the first motor 12 to adjust the height of the moving block 14. The height adjustment of the moving block 14 can be made smoother by the auxiliary sliding assembly. The angle of the mounting frame 16 can be adjusted by the rotating table 15. The two-way threaded rod 101 can be rotated by the second motor 17 to adjust the distance between the two adjustment plates 18. The clamping plate 19 is used to clamp the chip to be tested. The adaptive assembly can be used to adaptively clamp chips of different specifications. The telescopic rod 22 can be fixed by the fixed block 2 and the fixed plate 21. The telescopic rod 22 and the first A spring 23 can adapt to the changes of the chip clamped by the clamping plate 19. The slide groove 3 and the pulley 31 can make the height adjustment of the movable block 14 smoother without being blocked by the contact with the inner wall of the column sleeve 11. The adsorption plate 4 can adsorb and fix the chip when the telescopic rod 22 contacts the clamped chip. The universal wheel 51 can make the whole mechanism move. The damper 5 and the damping spring 52 can dampen the vibration encountered when the mechanism moves. The bidirectional threaded rod 101 can protect the adjustment plate 18 for adjusting the distance. The dust-proof film covering the inner wall of the adsorption plate 4 can reduce the accumulation of dust inside the adsorption plate 4.
[0033] The above embodiments only express the specific implementation of the present invention, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the scope of the present invention. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention.
Claims
1. An adjustment mechanism for a chip testing machine, comprising a base plate (1), characterized in that: A column sleeve (11) is fixedly connected to the top of the bottom plate (1), a first motor (12) is fixedly connected to the top of the column sleeve (11), a one-way threaded rod (13) is connected to the output end of the first motor (12), the one-way threaded rod (13) and the column sleeve (11) are rotationally matched, a moving block (14) is transmission-matched on the side wall of the one-way threaded rod (13), an end of the moving block (14) is rotationally matched with a rotating table (15), a mounting frame (16) is fixedly connected to the side wall of the rotating table (15), and an outer side wall of the mounting frame (16) is fixedly connected to A second motor (17), wherein an output end of the second motor (17) is connected to a bidirectional threaded rod (101), the bidirectional threaded rod (101) and the mounting frame (16) are rotationally matched, the side wall of the bidirectional threaded rod (101) is transmission-matched with an adjustment plate (18), two adjustment plates (18) are provided on the side wall of the bidirectional threaded rod (101), each of the adjustment plates (18) is sleeved with a clamping plate (19) on the side wall, an adaption component is fixedly connected to the side wall of the clamping plate (19), and the side wall of the column sleeve (11) is rotationally matched with an auxiliary sliding component.
2. The chip tester adjustment mechanism according to claim 1, characterized in that: The adaptable component comprises a fixed block (2), the top and bottom of the clamping plate (19) are fixedly connected to the fixed blocks (2), the fixed blocks (2) are evenly distributed on the top and bottom of the clamping plate (19), the bottom of the fixed block (2) is fixedly connected to a fixed plate (21), the side wall of the fixed plate (21) is fixedly connected to a telescopic rod (22), the output end of the telescopic rod (22) is slidably matched with the fixed plate (21) and the clamping plate (19), the telescopic rod (22) is evenly distributed on the side wall of the fixed plate (21), and each group of the side walls of the telescopic rods (22) is sleeved with a first spring (23).
3. The chip tester adjustment mechanism according to claim 1, characterized in that: The auxiliary sliding assembly comprises a pulley (31), the side wall of the column sleeve (11) is rotatably matched with the pulley (31), the pulley (31) is evenly distributed on the side wall of the column sleeve (11), the side wall of the moving block (14) is provided with a sliding groove (3), the sliding groove (3) is evenly distributed on the side wall of the moving block (14), and the sliding groove (3) and the pulley (31) are slidably matched.
4. The chip tester adjustment mechanism according to claim 2, characterized in that: An adsorption disk (4) is installed at the output end of the telescopic rod (22), and an adsorption hole is provided on the inner side wall of the adsorption disk (4).
5. The chip tester adjustment mechanism according to claim 1, characterized in that: A damper (5) is installed in the middle of the base plate (1). The dampers (5) are evenly distributed in the middle of the base plate (1). The bottom ends of the dampers (5) are rotatably matched with universal wheels (51). The side walls of each group of dampers (5) are sleeved with damping springs (52).
6. The chip tester adjustment mechanism according to claim 1, characterized in that: A protective block (6) is fixedly connected to the inner side wall of the mounting frame (16), and the protective block (6) is rotationally matched with the bidirectional threaded rod (101).
7. The chip tester adjustment mechanism according to claim 4, characterized in that: The inner wall of the adsorption disk (4) is covered with a dustproof film.