Electrical method data acquisition array test device and system and use method thereof

Abstract

The invention belongs to the technical field of geophysics, and provides an electrical method data acquisition array test device and system and a use method thereof.The electrical method data acquisition array test device comprises a device body, and a calibration black box, a first multi-pin socket, a second multi-pin socket, a third multi-pin socket, an electrode binding post and an aviation plug are arranged in the device body; an equivalent stratum simulation module is packaged in the calibration black box, the equivalent stratum simulation module is filled with conductive liquid with set resistivity, two groups of conductive electrodes are arranged in the black box, and the electrodes are inserted into the conductive liquid; the first group of electrodes in the two groups of electrodes is connected to the first multi-pin socket and the third multi-pin socket, and the second group of electrodes is connected to the second multi-pin socket; one end of the electrode binding post can be connected with an electrode plate with information to be acquired, the other end of the electrode binding post is connected with an aviation plug, and the aviation plug can be directly connected to a data acquisition instrument. By using the electrical method data acquisition and array test system, the time and material resource cost can be well saved, and the experiment efficiency is improved.

Description

Technical Field

[0001] The invention belongs to the technical field of data acquisition, and in particular relates to an electrical data acquisition array test device, a system and a use method thereof. Background Art

[0002] The statements in this section merely provide background information related to the present invention and do not necessarily constitute prior art.

[0003] There are many exploration techniques in geophysics, including electrical exploration. The methods of electrical exploration can be divided into airborne electrical method, ground electrical method and underground electrical method according to the observation space; according to the time characteristics of the electromagnetic field, it can be divided into direct current electrical method and alternating current electrical method (frequency domain electrical method). In the field of hydrogeophysics, because electrical parameters are closely related to hydrogeological parameters, electrical methods are often used in research work such as groundwater pollution detection, hydrogeological parameter identification, and hydrological process monitoring. Commonly used electrical exploration methods include resistivity method, charging method, induced polarization method, and natural electric field method.

[0004] In electrical prospecting technology, since large-scale experiments in the field are difficult to study, small-scale laboratory experiments are generally required to understand the electrical properties of the site. However, under existing technical conditions, indoor small-scale experiments require one end of a homemade wire to be connected to an electrode and the other end to an aviation plug used by the measuring equipment, which leads to wiring problems and difficulty in data collection. Summary of the invention

[0005] In order to solve at least one technical problem in the above background technology, the present invention provides an electrical data acquisition array test device, system and use method thereof, which can not only perform small-scale laboratory experiments, but also facilitate rapid indoor simulation and equipment calibration, and the device supports serial expansion. Therefore, the device has the advantages of saving time cost and human resources.

[0006] In order to achieve the above object, the present invention adopts the following technical solution:

[0007] The first aspect of the present invention provides an electrical method data acquisition array test device, comprising a device body, wherein a calibration black box, a first multi-pin socket, a second multi-pin socket and a third multi-pin socket are arranged in the device body;

[0008] The calibration black box contains an equivalent formation simulation module, which is filled with a conductive liquid with a set resistivity. The black box body contains two sets of conductive electrodes, both of which are inserted into the conductive liquid.

[0009] wherein the first group of conductive electrodes is connected to the first multi-pin socket and the third multi-pin socket, and the second group is conductively connected to the second multi-pin socket;

[0010] The first and last conductive electrodes are used as power supply electrodes, the middle conductive electrode is used as a measuring electrode, the formation to be measured is simulated by a conductive liquid, and the preliminary electrical information of the formation to be measured is obtained by repeated tests by changing the distance between the middle conductive electrodes.

[0011] Furthermore, a panel is provided on the device body, and a plurality of electrode terminal aviation plugs and an aviation plug storage area are provided on the panel. One end of the plurality of electrode terminals is connected to the electrode sheet whose information is to be collected through a wire, and the other end is connected to the aviation plug through a wire, and then connected to the data acquisition instrument through the aviation plug.

[0012] Furthermore, the size of the calibration black box is determined according to the number of combined electrodes and the proportionality coefficient, and the calculation formula is:

[0013]

[0014] Where x, y, z are the length, width, and height of the calibration black box, respectively, in cm; n is the number of electrodes on the top of the box; and k is the proportional coefficient.

[0015] Furthermore, the size of the panel is set according to the spacing between the electrode terminals, the positions of the electrode terminals and the size of the aviation plug storage area.

[0016] Furthermore, the calculation formula for the size of the panel is:

[0017]

[0018] Wherein, L1, L2, L3 are the length, width and height of the device panel respectively; d is the diameter of the electrode terminal; l is the distance between the electrode terminals; t1 is the distance between the right edge and the lower edge of the electrode terminal area and the right edge and the lower edge of the device panel, which is also the distance between the left edge of the electrode terminal and the right edge of the aviation plug storage area; t2 is the distance between the upper edge electrode terminal and the upper edge of the device panel; t3 is the width of the aviation plug storage area.

[0019] The second aspect of the present invention provides an electrical data acquisition array test system, comprising a plurality of electrical data acquisition array test devices as described in the first aspect, a plurality of second multi-pin sockets and a third multi-pin socket are connected in series in sequence, the first multi-pin socket is connected to a test instrument, and an electrode is set as E i Each array test device has n electrodes. After M devices are combined and connected in series through a multi-pin socket, there are nM electrodes in total, namely E1 to E nM , based on E1 to E nM The electrodes were used for electrical measurement.

[0020] Furthermore, the first and last conductive electrodes are used as power supply electrodes, the middle conductive electrode is used as a measuring electrode, the formation to be measured is simulated by a conductive liquid, and preliminary electrical information of the formation to be measured is obtained by repeated tests by changing the distance between the middle conductive electrodes.

[0021] The present invention provides a third aspect to provide a method for using an electrical data acquisition array test device, using the electrical data acquisition array test device described in the first aspect, the method comprising the following steps:

[0022] Step 1: Use the first and last electrodes as power supply electrodes and the middle electrode as measurement electrode;

[0023] Step 2: Repeat the test by adjusting the distance between the middle electrodes to obtain preliminary electrical information of the cross section of the object to be tested;

[0024] Step 3: Based on the preliminary telecommunication information, determine the initial position of the abnormal body in the array;

[0025] Step 4: According to the initial position of the abnormal body in the array, the position of the power supply electrode is adjusted to be closer to the position of the abnormal body. After the adjustment, step 2 is repeated to obtain the precise position of the abnormal body in the array.

[0026] Furthermore, in step 2, the step of repeatedly adjusting the distance between the intermediate electrodes to obtain preliminary electrical information of the cross section of the object to be tested includes:

[0027] Setting the test interval threshold between measuring electrodes;

[0028] Continuously increase the test interval between the measuring electrodes until the interval increases to the test interval threshold;

[0029] After each increase, measurement is performed according to the adjusted sorting combination to obtain preliminary electrical information of the cross section of the object to be measured.

[0030] Furthermore, in step 4, according to the approximate position of the abnormal body in the array, the position of the power supply electrode in the array is adjusted to be closer to the position of the abnormal body, including:

[0031] The initial position of the anomaly in the array is Compare;

[0032] If the initial position is greater than Then the power supply electrode:

[0033] P=E 1+a , Q=E nM ;

[0034] If the initial position result is less than Then the power supply electrode:

[0035] P=E1,Q=E nM-a ;

[0036] Where a is the step length of the power supply electrode; let E i is the electrode, i is the serial number of the electrode, n is the number of electrodes, and M is the number of array test devices.

[0037] Compared with the prior art, the present invention has the following beneficial effects:

[0038] 1. The present invention designs an electrical data acquisition array test device, which can integrate the use of small-scale laboratories, simulation and equipment calibration functions in the same device, which is not only convenient for the use of small-scale laboratories, but also can quickly perform simulation and equipment calibration on the same device indoors. Not only does it save time costs, but the device is also small in size, which solves the problems of troublesome wiring and lack of transfer in small-scale laboratories, and greatly improves the efficiency of experiments.

[0039] 2. Two electrical data acquisition and array test systems can be connected in series through a multi-pin plug to achieve the function of series expansion. This function saves the manpower and time costs of series wiring in actual operation and also improves work efficiency.

[0040] Advantages of additional aspects of the present invention will be given in part in the following description, and in part will become obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] The accompanying drawings in the specification, which constitute a part of the present invention, are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute improper limitations on the present invention.

[0042] Figure 1 This is a schematic diagram of an electrical data acquisition array test device according to an embodiment of the present invention;

[0043] Figure 2 This is a schematic diagram of the series expansion wiring according to an embodiment of the present invention. DETAILED DESCRIPTION

[0044] It should be noted that the following detailed descriptions are all illustrative and intended to provide further explanation of the present invention. Unless otherwise specified, all technical and scientific terms used herein have the same meanings as those commonly understood by those skilled in the art to which the present invention belongs.

[0045] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit exemplary embodiments according to the present invention. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprising" and / or "including" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0046] In the present invention, the directions or positional relationships indicated by terms such as "upper", "lower", "top", etc. are based on the directions or positional relationships shown in the accompanying drawings. They are relational words determined only for the convenience of describing the structural relationships of the various parts or elements of the present invention. They do not specifically refer to any part or element in the present invention and should not be understood as limitations on the present invention.

[0047] In the present invention, terms such as "connected" and "connection" should be understood in a broad sense, indicating that the connection can be fixed, integral or detachable; it can be directly connected or indirectly connected through an intermediate medium. Relevant scientific research or technical personnel in this field can determine the specific meaning of the above terms in the present invention according to specific circumstances, and they should not be understood as limiting the present invention.

[0048] like Figure 1-Figure 2 As shown, this embodiment provides an electrical data acquisition array test device, including a device body, the device body is provided with a panel 8, the device panel 8 is provided with a plurality of electrode terminals 6 distributed in an array, a first multi-pin socket 3, a second multi-pin socket 4 and a third multi-pin socket 9, a calibration black box 1 is provided in the device body, the calibration black box 1 is encapsulated with an equivalent formation simulation module, the equivalent formation simulation module is filled with a conductive liquid with a set resistivity for simulating the formation, two groups of metal conductive electrodes are inserted on the top and side surfaces of the black box 1, and the electrodes are all inserted into the conductive liquid; wherein, the first group of electrodes is connected to the first multi-pin socket 3 and the third multi-pin socket 9, and the second group of electrodes is connected to the second multi-pin socket 4.

[0049] The first and last conductive electrodes are used as power supply electrodes, the middle conductive electrode is used as a measuring electrode, the formation to be measured is simulated by a conductive liquid, and the preliminary electrical information of the formation to be measured is obtained by repeated tests by changing the distance between the middle conductive electrodes.

[0050] In this embodiment, each group of conductive electrodes includes 32 electrodes, which can also be selected according to actual conditions.

[0051] In this embodiment, the device body is in the shape of a rectangular box. The first multi-pin socket 3, the second multi-pin socket 4 and the third multi-pin socket 9 are fixed on the device panel and are located above the electrode terminals.

[0052] In this embodiment, the size of the calibration black box 1 is determined according to the number of electrodes and the proportionality coefficient, and the calculation formula is:

[0053]

[0054] Wherein, x, y, z are the length, width, and height of the calibration black box, in cm, n is the number of electrodes, and k is the proportionality coefficient. In this embodiment, n is 32, x is 20 cm, y is 5 cm, z is 7 cm, and k is 0.5.

[0055] The size of the panel 8 can be determined by the following formula:

[0056]

[0057] Wherein, L1, L2, L3 are the length, width and height of the device panel, in cm; d is the diameter of the electrode terminal, in cm; l is the distance between the electrode terminals; t1 is the distance between the right edge and the lower edge of the electrode terminal area and the right edge and the lower edge of the device panel, which is also the distance between the left edge of the electrode terminal and the right edge of the aviation plug storage area, in cm; t2 is the distance between the upper edge electrode terminal and the upper edge of the device panel, in cm; t3 is the width of the aviation plug storage area, in cm;

[0058] In this embodiment, L1 is 43 cm, L2 is 26.5 cm, L3 is 10 cm, d is 1 cm, l is 3 cm, t1 is 2 cm, t2 is 11.5 cm, and t3 is 10 cm.

[0059] A panel is arranged on the device body, and a plurality of electrode terminals, an aviation plug, and an aviation plug storage area are arranged on the panel. One end of the plurality of electrode terminals is connected to the electrode sheet to be collected information through a wire, and the other end is connected to the aviation plug through a wire, and then connected to the test instrument through the aviation plug.

[0060] The electrode terminals on the device panel can be connected to the electrode sheets that need to collect information in experiments conducted in small-scale laboratories, and connected to the instrument through the aviation plug 2 in the device. The electrode terminals, electrode sheets, aviation plugs and instruments together constitute a system used in small-scale laboratories.

[0061] The equivalent formation simulation module on the calibration black box can be connected to the simulation and test instruments through the first multi-pin socket 3, thereby forming a simulation and equipment calibration system.

[0062] The second multi-pin socket 4 can be connected to another electrical test device through a connecting line with multi-pin plugs at both ends, so that the number of wiring for simulation and equipment calibration can be expanded by connecting multiple equivalent formation simulation modules in series through this wiring method to achieve extended functions.

[0063] If you need to use an electrical data acquisition and array test system to conduct small-scale laboratory experiments, the method of use is taken as an example of a sand box experiment, as shown in the following steps:

[0064] Step 1: Connect the electrode wire laid out from the sand box to the electrode terminal.

[0065] Step 2: After the electrode terminals are connected, connect the aviation plug to the corresponding aviation socket of the instrument.

[0066] Step 3: Collect data from small-scale laboratory experiments.

[0067] If you need to use an electrical data acquisition array test system for simulation and equipment calibration, the method of use is taken as an example of high-density electrical data acquisition array testing, as shown in the following steps:

[0068] Step 1: Import the existing electrode array into the electrical instrument.

[0069] Step 2: Connect the test instrument to the multi-pin socket A of the electrical data acquisition and array test system of the present invention, and then perform high-density electrical measurement, and after obtaining the result, perform inversion to obtain the resistivity.

[0070] As another embodiment, this embodiment provides an array test system based on electrical data acquisition, comprising a plurality of electrical data acquisition array test devices, a plurality of second multi-pin sockets 4 and third multi-pin sockets 9 are connected in series in sequence, the first multi-pin socket 3 is connected to the test instrument, and the electrode is set to E i Each array test device has n electrodes. After M devices are connected in series through a multi-pin socket, there are nM electrodes in total, namely E1 to E nM , based on E1 to E nM The electrodes are calibrated.

[0071] The first and last conductive electrodes are used as power supply electrodes, and the middle conductive electrode is used as a measuring electrode. The conductive liquid in the black box simulates the formation to be tested. By repeatedly changing the distance between the middle conductive electrodes, preliminary electrical information of the formation to be tested is obtained.

[0072] In this embodiment, each array test system has 32 electrodes. After two combination circuits of the device are connected in series, there are 64 electrodes from left to right, namely E1 to E2. 64 .

[0073] like Figure 2 As shown, the method of using the serial expansion function takes the high-density electrical method data acquisition array test as an example, as shown in the following steps:

[0074] Step 1: Import the existing electrode array into the electrical instrument.

[0075] Step 2: Insert one end of the connecting wire with multi-pin plugs at both ends into the second multi-pin socket 4 in the electrical method data acquisition and array test system, and insert the other end into the third multi-pin socket 9 in another electrical method data acquisition and array test system to complete the function of series expansion.

[0076] Step 3: Connect the test instrument to the first multi-pin sockets 3 of the two electrical data acquisition and array test systems. Then perform high-density electrical measurement, and perform inversion after obtaining the results to obtain the resistivity.

[0077] The advantage of the above technical solution is that it can not only be used in small-scale laboratories, but also can be used for simulation and equipment calibration. When in use, wiring is performed according to the required functions to achieve the above two experimental functions, and when used for simulation and equipment calibration, the two electrical data acquisition and array test systems can be connected in series through a multi-pin plug, thereby meeting the needs of series expansion. The use of the electrical data acquisition and array test system can save time and material costs and improve the efficiency of experiments.

[0078] As another embodiment, this embodiment provides a method for determining an abnormal body, comprising the following steps:

[0079] Step 1: Use the first and last electrodes as power supply electrodes and the middle electrode as measurement electrode;

[0080] Step 2: Repeat the test by adjusting the distance between the middle electrodes to obtain preliminary electrical information of the cross section of the object to be tested;

[0081] Step 3: Based on the preliminary telecommunication information, determine the initial position of the abnormal body in the array;

[0082] Step 4: According to the initial position of the abnormal body in the array, the position of the power supply electrode is adjusted to be closer to the position of the abnormal body. After the adjustment, step 2 is repeated to obtain the precise position of the abnormal body in the array.

[0083] Among them, in step 2, the repeated test by adjusting the distance between the intermediate electrodes to obtain preliminary electrical information of the cross section of the object to be measured includes:

[0084] Setting the test interval threshold between measuring electrodes;

[0085] Continuously increase the test interval between the measuring electrodes until the interval increases to the test interval threshold;

[0086] After each increase, measurement is performed according to the adjusted sorting combination to obtain preliminary electrical information of the cross section of the object to be measured.

[0087] Let the electrode be E iIn this embodiment, each electrical data acquisition and array test system has 32 electrodes. After two devices are connected in series, there are 64 electrodes in total, namely E1 to E 64 The present invention provides an electrical data acquisition and array test system, whose array test function can support two modes, short-time fast mode and long-time high-precision mode, according to the needs. The method of using the short-time fast mode is shown in the following steps:

[0088] The array test function can support two modes: short-time fast and long-time high-precision according to the needs. The usage of the short-time fast mode is shown in the following steps:

[0089] Step 1: P and Q represent array power supply electrodes, and S and T represent array measurement electrodes.

[0090] First, let:

[0091] P=E1,Q=E 64

[0092] Step 2: Order in sequence:

[0093] S=E2,T=E 2+x

[0094] S=E3,T=E 3+x

[0095] S=E4,T=E 4+x

[0096] …

[0097] S=E 64-x-1 , T=Q 64-1

[0098] In the formula, x is the distance between two test electrodes, and first set x=1.

[0099] Based on the above combination sequence, the P and Q array electrodes are powered, and the S and T array electrodes are measured in turn, and the results are obtained respectively.

[0100] Step 3: Continue to increase the interval x between the two test electrodes until the interval x increases to x=10.

[0101] After each increase, continue to test according to steps 1 and 2 to obtain preliminary electrical information of the cross section.

[0102] In this embodiment, there are:

[0103] Group 1: P1 = Q1, Q1 = E 64 ; S1 = E2, T1 = E3;

[0104] Group 2: P2 = E1, Q2 = E 64; S2 = E3, T2 = E4;

[0105] …

[0106] Group 61: P 61 =E1,P 61 =E 64 ; S 61 =E 62 , T 61 =E 63 ;

[0107] Group 62: P 62 =E1,Q 62 =E 64 ; S 62 =E3,T 62 =E5;

[0108] Group 63: P 63 =E1,Q 63 =E 64 ; S 63 =E4,T 63 =E6;

[0109] …

[0110] Group 565: P 565 =E1,Q 565 =E 64 ; S 565 =E 53 , T 565 =E 63 ;

[0111] The parameters of this embodiment are recorded, and after all processes are completed, the entire system is recycled.

[0112] The method of using the long-term high-precision mode is as follows:

[0113] Step 1: P and Q represent the array power supply electrodes, and S and T represent the array measurement electrodes. First, let:

[0114] P=E1,Q=E 64

[0115] Step 2: Order in sequence:

[0116] S=E2,T=E 2+x

[0117] S=E3,T=E 3+x

[0118] S=E4,T=E 4+x

[0119] …

[0120] S=E 64-x-1 , T=E 64-1

[0121] In the formula, x is the interval between two test electrodes, and first x = 1. Based on the above combination order, the P and Q array electrodes are powered, and the S and T array electrodes are measured in turn, and the results are obtained respectively.

[0122] Step 3: Continue to increase the interval x between the two test electrodes until the interval x increases to x = 10. After each increase, continue to test in the manner of steps 1 and 2 to obtain preliminary electrical information.

[0123] Step 4: Based on the information from step 3, roughly determine the position of the abnormal body in the array, and compare the serial number of the position of the abnormal body in the array with In comparison, in this embodiment

[0124] If the sequence number result is greater than Then the array power supply electrode:

[0125] P=E 1+a , Q=E 64

[0126] Where a is the step length of the power supply electrode. In this example, a=1, that is:

[0127] P=E2,Q=E 64

[0128] Repeat steps 2 and 3 until the exact location of the abnormal body is determined.

[0129] If the sequence number result is less than Then the array power supply electrode:

[0130] P=E1,Q=E 64-a

[0131] Where a is the step length of the power supply electrode. In this example, a=1, that is:

[0132] P=E2,Q=E 63

[0133] Repeat steps 2 and 3 until the exact location of the abnormal body is determined.

[0134] In this embodiment, the result obtained corresponds to an electrode less than 32, and there are:

[0135] Group 1: P1=E1,Q1=E 64 ; S1 = E2, T1 = E3;

[0136] Group 2: P2 = E1, Q2 = E 64; S2 = E3, T2 = E4;

[0137] …

[0138] Group 61: P 61 =E1,Q 61 =E 64 ; S 61 =E 62 , T 61 =E 63 ;

[0139] Group 62: P 62 =E1,P 62 =E 64 ; S 62 =E3,T 62 =E5;

[0140] Group 63: P 63 =E1,Q 63 =E 64 ; S 63 =E4,T 63 =E6;

[0141] …

[0142] Group 565: P 565 =E1,Q 565 =E 64 ; S 565 =E 53 , T 565 =E 63 ;

[0143] Group 566: P 566 =E1,Q 566 =E 63 ; S 566 =E2,T 566 =E3;

[0144] Group 567: P 567 =E1,Q 567 =E 63 ; S 567 =E3,T 567 =E4;

[0145] …

[0146] Group 1120: P 1120 =E1,Q 1120 =E 63 ; S 1120 =E 52 , T 1120 =E 62 ;

[0147] The parameters of this embodiment are recorded, and after all processes are completed, the entire system is recycled.

[0148] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. An electrical data acquisition array test device, characterized in that: The device comprises a device body, wherein a calibration black box, a first multi-pin socket, a second multi-pin socket and a third multi-pin socket are arranged in the device body; The calibration black box contains an equivalent formation simulation module, which is filled with a conductive liquid with a set resistivity. The black box body contains two sets of conductive electrodes, both of which are inserted into the conductive liquid. wherein the first group of conductive electrodes is connected to the first multi-pin socket and the third multi-pin socket, and the second group is conductively connected to the second multi-pin socket; The first and last conductive electrodes are used as power supply electrodes, the middle conductive electrode is used as a measuring electrode, the formation to be measured is simulated by a conductive liquid, and the preliminary electrical information of the formation to be measured is obtained by repeated tests by changing the distance between the middle conductive electrodes.

2. The electrical data acquisition array test device according to claim 1, characterized in that: A panel is arranged on the device body, and a plurality of electrode terminals, an aviation plug, and an aviation plug storage area are arranged on the panel. One end of the plurality of electrode terminals is connected to the electrode sheet to be collected information through a wire, and the other end is connected to the aviation plug through a wire, and then connected to the data acquisition instrument through the aviation plug.

3. The electrical data acquisition array test device according to claim 1, characterized in that: The size of the calibration black box is determined according to the number of combined electrodes and the proportional coefficient, and the calculation formula is: Where x, y, z are the length, width, and height of the calibration black box, respectively, in cm; n is the number of electrodes on the top of the box; and k is the proportional coefficient.

4. The electrical data acquisition array test device according to claim 2, characterized in that: The size of the panel is set according to the spacing between the electrode terminals, the positions of the electrode terminals and the size of the aviation plug storage area.

5. The electrical data acquisition array test device according to claim 2, characterized in that: The calculation formula for the size of the panel is: Wherein, L1, L2, L3 are the length, width and height of the device panel respectively; d is the diameter of the electrode terminal; l is the distance between the electrode terminals; t1 is the distance between the right edge and the lower edge of the electrode terminal area and the right edge and the lower edge of the device panel, which is also the distance between the left edge of the electrode terminal and the right edge of the aviation plug storage area; t2 is the distance between the upper edge electrode terminal and the upper edge of the device panel; t3 is the width of the aviation plug storage area.

6. An electrical data acquisition array test system, characterized in that: The apparatus comprises a plurality of electrical data acquisition array test devices as described in any one of claims 1 to 5, a plurality of second multi-pin sockets and a third multi-pin socket are connected in series in sequence, the first multi-pin socket is connected to the test instrument, and the electrode is E i Each array test device has n electrodes. After M devices are combined and connected in series through a multi-pin socket, there are nM electrodes in total, namely E1 to E nM , based on E1 to E nM The electrodes were used for electrical measurement.

7. An electrical data acquisition array test system as described in claim 6, wherein the first and last conductive electrodes are used as power supply electrodes, the middle conductive electrode is used as a measuring electrode, a conductive liquid is used to simulate the formation to be tested, and preliminary electrical information of the formation to be tested is obtained by repeatedly testing by changing the distance between the middle conductive electrodes.

8. A method for using an electrical data acquisition array test device as claimed in any one of claims 1 to 5, characterized in that: The method of use comprises the following steps: Step 1: Use the first and last electrodes as power supply electrodes and the middle electrode as measurement electrode; Step 2: Repeat the test by adjusting the distance between the middle electrodes to obtain preliminary electrical information of the cross section of the object to be tested; Step 3: Based on the preliminary electrical information, determine the initial position of the abnormal body in the array; Step 4: According to the initial position of the abnormal body in the array, the position of the power supply electrode is adjusted to be closer to the position of the abnormal body. After the adjustment, step 2 is repeated to obtain the precise position of the abnormal body in the array.

9. The method for using the electrical data acquisition array test device according to claim 8, characterized in that: In step 2, the step of repeatedly testing by adjusting the distance between the intermediate electrodes to obtain preliminary electrical information of the cross section of the object to be tested includes: Setting the test interval threshold between measuring electrodes; Continuously increase the test interval between the measuring electrodes until the interval increases to the test interval threshold; After each increase, measurement is performed according to the adjusted sorting combination to obtain preliminary electrical information of the cross section of the object to be measured.

10. The method for using the electrical data acquisition array test device according to claim 8, characterized in that: In step 4, according to the approximate position of the abnormal body in the array, the position of the power supply electrode in the array is adjusted to be closer to the position of the abnormal body, including: The initial position of the abnormal body in the array is compared with Compare; If the sequence number of the initial position is greater than Then the power supply electrode: P=E 1+a ,Q=E nM If the sequence number of the initial position is less than Then the power supply electrode: P=E1, Q=E nM-a Where a is the step length of the power supply electrode; let E i is the electrode, i is the serial number of the electrode, n is the number of electrodes, and M is the number of array test devices.

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