Film platinum resistor dynamic total temperature probe for measuring three-dimensional unsteady flow field

Abstract

The invention belongs to the technical field of dynamic temperature testing, and particularly relates to a film platinum resistor dynamic total temperature probe for measuring a three-dimensional unsteady flow field, which comprises a probe head, a probe support rod, a film platinum resistor, a lead hole and a circular pipeline. The probe head is of a wedge-top double-arc prism structure, the leeside of the probe head is a cylindrical rear arc surface, the windward side comprises a wedge-top inclined surface, a cylindrical front plane, a left side plane and a right side plane, the left side plane and the right side plane are symmetrical, the windward side is provided with four lead holes which are not communicated with each other and are respectively communicated with the circular pipeline, and the four film platinum resistors are installed on the lead holes. And the film platinum resistor cable is led out of the tail part of the probe through the corresponding lead hole via the circular pipeline in the probe support rod. Through calibration of a calibration wind tunnel, compared with an existing temperature probe, the three-dimensional unsteady flow field temperature probe can measure changes of the total temperature, the static temperature, the deflection angle, the pitch angle and the Mach number of a three-dimensional unsteady flow field along with time, and a means for efficiently and accurately measuring unsteady flow field parameters is provided for turbine experiments.

Description

Technical Field

[0001] The present invention belongs to the technical field of dynamic temperature testing, and specifically relates to a thin film platinum resistor dynamic total temperature probe for measuring three-dimensional unsteady flow fields. The present invention is suitable for measuring transient information of three-dimensional unsteady flow fields in impeller machines. The core of the probe is to quickly and accurately measure and monitor the changes in transient total temperature, static temperature, deflection angle, pitch angle and Mach number of the three-dimensional unsteady flow field of the impeller machine. Background Art

[0002] The three-dimensional flow field at the inlet, outlet and between stages of the impeller is essentially unsteady due to fluid viscosity, shock waves, rotor rotation, the existence of tip clearance, the staggered arrangement of dynamic and static blade rows, etc. This makes it very difficult to quickly and accurately obtain the changes in the temperature field at the inlet, outlet and between stages of the impeller over time. For the impeller, researchers would like to obtain the dynamic temperature distribution and airflow direction angle between stages and rotor outlets to verify the design and flow field diagnosis in order to improve the performance of the machine. Therefore, in order to quickly and accurately obtain the transient temperature field at the inlet, outlet and between stages of the impeller, more targeted testing methods must be developed.

[0003] At present, dynamic pressure probes are often used to obtain the pitch angle and yaw angle information of the incoming flow. Because the dynamic pressure sensor is affected by the test incoming flow temperature, the maximum test incoming flow temperature does not exceed 200°C under the premise of ensuring accuracy, which greatly limits its scope of use. Thin-film platinum resistance temperature sensors can be used in environments up to 800°C. For the total temperature of the flow field, thermocouple temperature sensors and hot wire temperature probes are often used to obtain the dynamic temperature signal of the flow field. Among them, due to the low response frequency of thermocouple temperature sensors, even the thin-wire thermocouple temperature sensor with the highest frequency response cannot fully meet the test requirements of the transient temperature field of the inlet, outlet and interstage of the impeller under special working conditions. In addition, compared with thin-film platinum resistance temperature sensors, the measurement accuracy of thermocouples is lower. During long-term use, thermocouples may drift due to material aging and hot spot effects, resulting in increased measurement errors and are easily affected by environmental factors. The hot wire temperature probe has an extremely short thermal response time and can quickly capture transient changes in temperature and flow. The hot wire temperature probe is very small and has a high spatial resolution. However, it is usually made of very thin metal wire, which has high manufacturing and maintenance costs and is easy to break and damage. It has poor durability, which increases the test cost and unreliability. In addition, when using thermocouple temperature sensors and hot wire temperature probes, only the total temperature can be measured, and the deflection angle and pitch angle changes of the three-dimensional unsteady flow field of the turbomachinery transonic speed cannot be obtained.

[0004] Therefore, in order to quickly and accurately obtain the transient temperature, pitch angle and deflection angle of the impeller inlet, outlet and between stages, it is urgent to develop a fast, high-precision, airflow-resistant, low-spatial-resolution, and low-interference-to-flow testing technology to achieve accurate measurement of the dynamic temperature, deflection angle and pitch angle of the unsteady flow field under high-temperature environment, and provide reliable measurement means and technical support for the high-performance design and optimization of impeller machinery. Summary of the invention

[0005] The invention discloses a thin film platinum resistor dynamic total temperature probe for measuring a three-dimensional unsteady flow field. The probe comprises a probe head, a probe support rod, a left thin film platinum resistor, a middle thin film platinum resistor, a right thin film platinum resistor, an upper thin film platinum resistor, a circular pipe, a wedge top inclined surface, a cylinder front section, a left plane, a right plane, etc. The probe head is a wedge top prism structure. The windward surface of the probe head during probe measurement comprises the wedge top inclined surface of the wedge top prism, the cylinder front section, symmetrical left planes and right planes, and the leeward surface is a cylinder rear arc surface; the cylinder rear arc surface and the probe support rod are the side surfaces of the same cylinder, and the axis of the circular pipe coincides with the axis of the probe support rod; a lead hole is respectively opened on the wedge top inclined surface, the cylinder front section, the left side surface and the right side surface of the probe head, and thin film platinum resistors are respectively installed on the lead holes, and the four thin film platinum resistors have the same size. The wires of the thin film platinum resistors are led out through the circular pipe through the corresponding lead holes and connected to external collection equipment.

[0006] When in use, as the temperature changes, the resistance value of the thin film platinum resistor will also change accordingly, and the relationship is as follows:

[0007] R t =R0[1+AT+BT 2 ]

[0008] Among them, R0 is the resistance value at 0℃, and A and B are the graduation constants. Place the probe in the measured flow field. When the temperature of the measured flow field changes, the four thin film platinum resistors are statically calibrated before the formal test. To achieve higher precision measurement, it is necessary to use a standard temperature device and a standard resistance meter to calibrate a specific platinum resistor to obtain its characteristic curve, that is, to obtain the coefficients of each item in the characteristic curve, which is used to convert resistance value to temperature during measurement. Static calibration is performed, and the steps are as follows: connect the calibrated thin film platinum resistor sensor to a high-precision resistance meter and place it in the constant temperature bath of the dry-type metrology furnace to ensure that the calibrated thin film platinum resistor sensor is located in the center of the constant temperature bath of the dry-type metrology furnace to avoid contact between the calibrated sensor and the wall of the constant temperature bath. After completing the above installation preparations, turn on the dry-type metrology furnace and adjust it to the calibration point temperature value. After the reading is stable, wait for more than 30 minutes until the calibrated thin film platinum resistor sensor reaches thermal equilibrium (the reading of the thin film platinum resistor sensor remains unchanged). The calibration temperature point selection includes 0℃, and the temperature calibration is performed according to the actual temperature measurement range, and the calibration is performed every 10℃.

[0009] The thin-film platinum resistance sensor is placed at 0°C and two other temperature points within the measurement range to measure the resistance value, which is called the "three-point calibration method". The following equations can be obtained:

[0010]

[0011] The combined solution can be obtained:

[0012]

[0013] Finally, the temperature measurement formula of platinum resistance within the calibration range is obtained:

[0014]

[0015] After the above static calibration, the calibrated graduation constants A and B and the calculation formula for the measured temperature are obtained through data processing methods.

[0016] After the static calibration, a wide range calibration is carried out in a calibration wind tunnel with a calibration speed range of 0.1 Mach to 1.4 Mach, a deflection angle range of -80° to 80°, and a pitch angle range of -40° to 40°; the deflection angle, pitch angle, and total temperature characteristics of a thin film platinum resistance dynamic total temperature probe for measuring three-dimensional unsteady flow fields are determined.

[0017] Define the deflection angle coefficient:

[0018]

[0019] Define the pitch coefficient:

[0020]

[0021] Define the overall temperature coefficient:

[0022]

[0023] Define the static temperature coefficient:

[0024]

[0025] Among them, yaw is the probe rotation deflection angle, pitch is the probe pitch angle, and T1, T2, T3, and T4 are different airflow deflection angles α and pitch angles. Calibration temperature data of the lower middle thin film platinum resistor, left thin film platinum resistor, right thin film platinum resistor, and upper thin film platinum resistor. Tt is the total temperature of the calibration wind tunnel inflow, and Ts is the static temperature of the calibration wind tunnel inflow.

[0026] The present invention provides a thin-film platinum resistance dynamic total temperature probe for measuring three-dimensional unsteady flow fields. The technical problems to be solved are: first, the problem of insufficient accuracy of existing dynamic temperature probes is solved. Second, the problem that existing dynamic temperature probes are limited by the low frequency response of traditional dynamic temperature sensors is solved. Third, the problem that existing dynamic temperature probes cannot measure deflection angles, pitch angles, static temperatures, and Mach numbers is solved.

[0027] The technical solution of the present invention is:

[0028] 1. A thin film platinum resistor dynamic total temperature probe for measuring a three-dimensional unsteady flow field, comprising a probe head (1), a probe support rod (2), a left thin film platinum resistor (3), a middle thin film platinum resistor (4), a right thin film platinum resistor (5), an upper thin film platinum resistor (6), a circular pipe (7), a wedge top inclined surface (8), a cylindrical front section (9), a left side plane (10), and a right side plane (11), characterized in that: the probe head (1) is a wedge top prism structure, and the windward surface of the probe head (1) during probe measurement includes the wedge top inclined surface (8) of the wedge top prism, the cylindrical front section (9), and the symmetrical left side plane (10) and right side plane (11), The leeward side is the rear arc surface of the cylinder; the rear arc surface of the cylinder and the probe support rod (2) are the side surfaces of the same cylinder, and the axis of the circular pipe (7) coincides with the axis of the probe support rod (2); a lead hole is respectively opened on the wedge top inclined surface (8), the front section (9) of the cylinder, the left side (10), and the right side (11) of the probe head (1), and thin film platinum resistors are respectively installed on the lead holes, namely, a left thin film platinum resistor (3), a middle thin film platinum resistor (4), a right thin film platinum resistor (5), and an upper thin film platinum resistor (6); these four thin film platinum resistors have the same size, and the wires of the thin film platinum resistors are led out through the corresponding lead holes through the circular pipe (7) and connected to external collection equipment.

[0029] 2. The probe support rod (2) is a cylinder, and the diameter of the cylinder is d, and the value range of d is 2 mm ≤ d ≤ 10 mm. The probe support rod (2) is provided with a circular pipe (7) along the axial inside, and the diameter of the circular pipe is a, and the value range of a is 1 mm ≤ a ≤ 8 mm. The thin film platinum resistance wire passes through the lead hole and is connected to the external collection equipment through the circular pipe (7).

[0030] 3. The angle between the wedge top inclined surface (8) of the probe head (1) and the axis of the probe support rod (2) is 36° to 54°.

[0031] 4. The center line of the upper thin film platinum resistor (6), the center line of the middle thin film platinum resistor (4) and the axis of the probe support rod (2) are on the same plane, the left plane (10) and the right plane (11) are symmetrically distributed along the plane, and the angle between the left plane (5) and the right plane (6) is 30° to 70°.

[0032] 5. The left thin-film platinum resistor (3) and the right thin-film platinum resistor (5) on the probe head (1) are symmetrically distributed along the plane where the center lines of the middle thin-film platinum resistor (4) and the upper thin-film platinum resistor (6) are located.

[0033] 6. The distance between the center of the upper thin film platinum resistor (6) on the probe head (1) and the lowest point of the wedge top slope (8) is 1 mm to 5 mm.

[0034] 7. The distance between the center of the middle thin film platinum resistor (4) on the probe head (1) and the lowest point of the arc of the wedge top inclined surface (3) is 1 mm to 3 mm.

[0035] 8. The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), the right thin-film platinum resistor (5), and the upper thin-film platinum resistor (6) are respectively installed on the lead holes. The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), the right thin-film platinum resistor (5), and the upper thin-film platinum resistor (6) are made of the same material and size. The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), the right thin-film platinum resistor (5), and the upper thin-film platinum resistor (6) are all miniature four-wire thin-film platinum resistors with a length of 1 mm to 3 mm, a width of 0.5 mm to 1.5 mm, and a thickness of 0.05 mm to 0.2 mm. The four-wire measurement can effectively eliminate the influence of the lead resistance on the measurement result, improve the measurement accuracy, and ensure the stability and accuracy of the data.

[0036] 9. The probe head (1) has an arc diameter of 4 mm to 10 mm on the top of the wedge-shaped prism structure, and a height of 15 mm to 50 mm on the prism structure.

[0037] The present invention provides a thin-film platinum resistance dynamic total temperature probe for measuring a three-dimensional unsteady flow field, which has the following beneficial effects:

[0038] Beneficial effect 1: After being calibrated in a calibration wind tunnel, the present invention can obtain the transient total temperature, static temperature, deflection angle, pitch angle and Mach number information of the incoming flow according to a unique data processing method.

[0039] Beneficial effect 2: After being calibrated in a calibration wind tunnel and a constant temperature furnace calibration box, the present invention can improve the measurement accuracy. The base adopts a heat-insulating material to improve the frequency response of the probe and can accurately capture the rapidly changing temperature field. It provides an efficient and accurate means for the unsteady flow field test of the impeller.

[0040] Beneficial effect three: The probe of the present invention has a self-positioning function, and the vertical section of the head forms a positioning reference. The probe is easy and convenient to install, does not need to be rotated during measurement, has no periodicity requirements for the measured flow field, and has a wide range of applications.

[0041] Beneficial effect four: The probe head of the present invention has a simple and compact structure, is "I"-shaped, and has a small size. The double thin-film platinum resistor is arranged vertically, which improves the spatial resolution of the probe and is suitable for measuring the inlet, outlet and between stages of the impeller.

[0042] Beneficial effect 5: The thin-film platinum resistor of the present invention is small in size and is a four-wire platinum resistor with high measurement accuracy. The sensing part is not affected by the structure of the probe itself and is the first to sense the pulsation of the incoming flow. The flow field information is not distorted and the measurement accuracy is high. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 It is a schematic structural diagram of a thin-film platinum resistance dynamic total temperature probe for measuring a three-dimensional unsteady flow field in an embodiment of the present invention.

[0044] Figure 2 yes Figure 1 Top view of the .

[0045] Figure 3 yes Figure 1 A-section view.

[0046] Figure 4 yes Figure 1 Side view of.

[0047] Figure 5 yes Figure 1 B-direction cross-sectional view.

[0048] Figure 6 yes Figure 5 A partial enlarged view of .

[0049] Wherein: 1-probe head, 2-probe support rod, 3-left thin film platinum resistor, 4-middle thin film platinum resistor, 5-right thin film platinum resistor, 6-upper thin film platinum resistor, 7-circular pipe, 8-wedge top inclined plane, 9-cylinder front section, 10-left plane, 11-right plane. DETAILED DESCRIPTION

[0050] The present invention is described in detail below in conjunction with the accompanying drawings and specific implementation examples so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the protection scope of the present invention.

[0051] like Figures 1 to 6The present invention shows a thin film platinum resistor dynamic total temperature probe for measuring three-dimensional unsteady flow fields, which comprises a probe head (1), a probe support rod (2), a left thin film platinum resistor (3), a middle thin film platinum resistor (4), a right thin film platinum resistor (5), an upper thin film platinum resistor (6), a circular pipe (7), a wedge top inclined surface (8), a cylindrical front section (9), a left side plane (10), and a right side plane (11). The present invention is characterized in that: the probe head (1) is a wedge top prism structure, and the windward surface of the probe head (1) during probe measurement includes the wedge top inclined surface (8) of the wedge top prism, the cylindrical front section (9), the symmetrical left side plane (10) and the right side plane (11). , the leeward side is the rear arc surface of the cylinder; the rear arc surface of the cylinder and the probe support rod (2) are the side surfaces of the same cylinder, and the axis of the circular pipe (7) coincides with the axis of the probe support rod (2); a lead hole is respectively opened on the wedge top inclined surface (8), the front section (9) of the cylinder, the left side (10), and the right side (11) of the probe head (1), and thin film platinum resistors are respectively installed on the lead holes, namely, a left thin film platinum resistor (3), a middle thin film platinum resistor (4), a right thin film platinum resistor (5), and an upper thin film platinum resistor (6), and the four thin film platinum resistors have the same size, and the wires of the thin film platinum resistors are led out through the corresponding lead holes through the circular pipe (7) and connected to the external collection equipment;

[0052] The probe support rod (2) is a cylinder, and the diameter d of the cylinder is 10 mm. A circular pipe (7) is opened inside the probe support rod (2) along the axial direction, and the diameter of the circular pipe is 5 mm. The thin film platinum resistance wire passes through the lead hole and is connected to the external collection equipment through the circular pipe (7).

[0053] The angle between the wedge top inclined surface (8) of the probe head (1) and the axis of the probe support rod (2) is 40°;

[0054] The center lines of the upper thin-film platinum resistor (6), the middle thin-film platinum resistor (4) and the axis of the probe support rod (2) are on the same plane, the left plane (10) and the right plane (11) are symmetrically distributed along the plane, and the angle between the left plane (5) and the right plane (6) is 40°.

[0055] The left thin-film platinum resistor (3) and the right thin-film platinum resistor (5) on the probe head (1) are symmetrically distributed along the plane where the center lines of the middle thin-film platinum resistor (4) and the upper thin-film platinum resistor (6) are located;

[0056] The distance between the center of the upper thin film platinum resistor (6) on the probe head (1) and the lowest point of the wedge top slope (8) is 2 mm;

[0057] The distance between the center of the middle thin film platinum resistor (4) on the probe head (1) and the lowest point of the arc of the wedge top inclined surface (3) is 2 mm;

[0058] The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), the right thin-film platinum resistor (5), and the upper thin-film platinum resistor (6) are respectively installed on the lead holes. The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), the right thin-film platinum resistor (5), and the upper thin-film platinum resistor (6) are made of the same material and size. The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), the right thin-film platinum resistor (5), and the upper thin-film platinum resistor (6) are all miniature four-wire thin-film platinum resistors with a length of 1 mm, a width of 0.5 mm, and a thickness of 0.1 mm. The four-wire measurement can effectively eliminate the influence of the lead resistance on the measurement result, improve the measurement accuracy, and ensure the stability and accuracy of the data.

[0059] The arc diameter of the wedge-top prism structure of the probe head (1) is 10 mm, and the height of the prism structure is 30 mm.

[0060] A four-thin-film platinum resistor dynamic total temperature probe for measuring a high-subsonic three-dimensional unsteady flow field introduced in an embodiment of the present invention is first calibrated. As the temperature changes, the resistance value of the thin-film platinum resistor will also change accordingly. The relationship is as follows:

[0061] R t =R0[1+AT+BT 2 ]

[0062] Among them, R0 is the resistance value at 0℃, and A and B are the graduation constants. Place the probe in the measured flow field. When the temperature of the measured flow field changes, the four thin film platinum resistors are statically calibrated before the formal test. To achieve higher precision measurement, it is necessary to use a standard temperature device and a standard resistance meter to calibrate a specific platinum resistor to obtain its characteristic curve, that is, to obtain the coefficients of each item in the characteristic curve, which is used to convert resistance value to temperature during measurement. Static calibration is performed, and the steps are as follows: connect the calibrated thin film platinum resistor sensor to a high-precision resistance meter and place it in the constant temperature bath of the dry-type metrology furnace to ensure that the calibrated thin film platinum resistor sensor is located in the center of the constant temperature bath of the dry-type metrology furnace to avoid contact between the calibrated sensor and the wall of the constant temperature bath. After completing the above installation preparations, turn on the dry-type metrology furnace and adjust it to the calibration point temperature value. After the reading is stable, wait for more than 30 minutes until the calibrated thin film platinum resistor sensor reaches thermal equilibrium (the reading of the thin film platinum resistor sensor remains unchanged). The calibration temperature point selection includes 0℃, and the temperature calibration is performed according to the actual temperature measurement range, and the calibration is performed every 10℃.

[0063] The thin-film platinum resistance sensor is placed at 0°C and two other temperature points within the measurement range to measure the resistance value, which is called the "three-point calibration method". The following equations can be obtained:

[0064]

[0065] The combined solution can be obtained:

[0066]

[0067] Finally, the temperature measurement formula of platinum resistance within the calibration range is obtained:

[0068]

[0069] After the above static calibration, the calibrated graduation constants A and B and the calculation formula for the measured temperature are obtained through data processing methods.

[0070] After the static calibration, a wide range calibration is carried out in the calibration wind tunnel. The calibration speed range is 0.1 Mach to 1.4 Mach, with an interval of 0.1 Mach; the deflection angle range is -80° to 80°, and the pitch angle range is -40° to 40°, with an interval of 5°, to determine the deflection angle, pitch angle, total temperature and static temperature characteristics of a four-thin film platinum resistor dynamic total temperature probe for measuring high subsonic three-dimensional unsteady flow fields.

[0071] Define the deflection angle coefficient:

[0072]

[0073] Define the pitch coefficient:

[0074]

[0075] Define the overall temperature coefficient:

[0076]

[0077] Define the static temperature coefficient:

[0078]

[0079] Among them, yaw is the probe rotation deflection angle, pitch is the probe pitch angle, and T1, T2, T3, and T4 are different airflow deflection angles α and pitch angles. Calibration temperature data of the lower middle thin film platinum resistor, the left thin film platinum resistor, the right thin film platinum resistor, and the upper thin film platinum resistor, Tt is the total temperature of the calibration wind tunnel inflow, and Ts is the static temperature of the calibration wind tunnel inflow;

[0080] According to the above definition, the calibration curves of deflection angle coefficient-pitch angle coefficient, deflection angle-deflection angle coefficient, pitch angle-pitch angle coefficient, deflection angle-total temperature coefficient, pitch angle-total temperature coefficient, deflection angle-static temperature coefficient and pitch angle-static temperature coefficient at different deflection angles and pitch angles for each incoming flow Mach number are calculated;

[0081] During measurement, four thin-film platinum resistors simultaneously measure the unsteady temperature data felt by each of them to calculate the deflection angle coefficient and pitch angle coefficient. The deflection angle and pitch angle are calculated using the calibration grid. The total temperature coefficient is then interpolated on the deflection angle-total temperature coefficient or pitch angle-total temperature coefficient calibration curve to obtain the total temperature. The static temperature coefficient is then interpolated on the deflection angle-static temperature coefficient or pitch angle-static temperature coefficient calibration curve to obtain the static temperature. Finally, the flow Mach number is deduced from the total temperature and static temperature.

Claims

1. A thin film platinum resistor dynamic total temperature probe for measuring a three-dimensional unsteady flow field, comprising a probe head (1), a probe support rod (2), a left thin film platinum resistor (3), a middle thin film platinum resistor (4), a right thin film platinum resistor (5), an upper thin film platinum resistor (6), a circular pipe (7), a wedge top inclined surface (8), a cylindrical front section (9), a left side plane (10), and a right side plane (11), characterized in that: The probe head (1) is a wedge-top prism structure. The windward surface of the probe head (1) during probe measurement includes the wedge-top inclined surface (8) of the wedge-top prism, the cylindrical front section (9), and the symmetrical left plane (10) and right plane (11), and the leeward surface is the rear arc surface of the cylinder; the rear arc surface of the cylinder and the probe support rod (2) are the side surfaces of the same cylinder, and the axis of the circular pipe (7) coincides with the axis of the probe support rod (2); a lead hole is respectively opened on the wedge-top inclined surface (8), the cylindrical front section (9), the left side (10), and the right side (11) of the probe head (1), and thin-film platinum resistors are respectively installed on the lead holes, namely a left thin-film platinum resistor (3), a middle thin-film platinum resistor (4), a right thin-film platinum resistor (5), and an upper thin-film platinum resistor (6); the four thin-film platinum resistors have the same size, and the wires of the thin-film platinum resistors are led out through the corresponding lead holes through the circular pipe (7) and connected to external data collection equipment; The probe support rod (2) is a cylinder, and the diameter of the cylinder is d, and the value range of d is 2 mm≤d≤10 mm; the probe support rod (2) is provided with a circular pipe (7) along the axial direction, and the diameter of the circular pipe is a, and the value range of a is 1 mm≤a≤8 mm. The thin film platinum resistance wire passes through the lead hole and is connected to the external collection equipment through the circular pipe (7); The angle between the wedge top inclined surface (8) of the probe head (1) and the axis of the probe support rod (2) is 36° to 54°. The probe head is made of heat-insulating material to reduce the heat conduction between the sensing part and the substrate during the measurement of the thin-film platinum resistance, thereby improving the dynamic response of the thin-film platinum resistance total temperature probe. The center lines of the upper thin-film platinum resistor (6), the middle thin-film platinum resistor (4) and the axis of the probe support rod (2) are on the same plane, the left plane (10) and the right plane (11) are symmetrically distributed along the plane, and the angle between the left plane (5) and the right plane (6) is 30° to 70°. The left thin-film platinum resistor (3) and the right thin-film platinum resistor (5) on the probe head (1) are symmetrically distributed along the plane where the center lines of the middle thin-film platinum resistor (4) and the upper thin-film platinum resistor (6) are located; The distance between the center of the upper thin film platinum resistor (6) on the probe head (1) and the lowest point of the wedge top slope (8) is 1 mm to 5 mm; The distance between the center of the middle thin film platinum resistor (4) on the probe head (1) and the lowest point of the arc of the wedge top inclined surface (3) is 1 mm to 3 mm; The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), the right thin-film platinum resistor (5), and the upper thin-film platinum resistor (6) are respectively installed on the lead holes. The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), the right thin-film platinum resistor (5), and the upper thin-film platinum resistor (6) are made of the same material and size. The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), the right thin-film platinum resistor (5), and the upper thin-film platinum resistor (6) are all miniature four-wire thin-film platinum resistors with a length of 0.5 mm to 3 mm, a width of 0.1 mm to 1.5 mm, and a thickness of 0.01 mm to 0.2 mm. The four-wire measurement can effectively eliminate the influence of the lead resistance on the measurement result, improve the measurement accuracy, and ensure the stability and accuracy of the data. The arc diameter of the wedge-top prism structure of the probe head (1) is 4 mm to 10 mm, and the height of the prism structure is 15 mm to 50 mm; The present invention proposes a data processing method based on a thin film platinum resistor dynamic total temperature probe for measuring a three-dimensional unsteady flow field. A wide range calibration is performed on the thin film platinum resistor dynamic total temperature probe for measuring a three-dimensional unsteady flow field in a calibration wind tunnel, wherein the calibration speed range is 0.1 Mach to 1.4 Mach, the deflection angle range is -80° to 80°, and the pitch angle range is -40° to 40°. Through a data processing method for a thin film platinum resistor dynamic total temperature probe for measuring a three-dimensional unsteady flow field, calibration curves of different deflection angle coefficients-pitch angle coefficients, deflection angles-deflection angle coefficients, pitch angles-pitch angle coefficients, deflection angles-total temperature coefficients, pitch angles-total temperature coefficients, deflection angles-static temperature coefficients, and pitch angles-static temperature coefficients are obtained at each Mach number. The data processing method for a thin film platinum resistor dynamic total temperature probe for measuring a three-dimensional unsteady flow field is as follows: Define the deflection angle coefficient: Define the pitch coefficient: Define the overall temperature coefficient: Define the static temperature coefficient: Among them, yaw is the probe rotation deflection angle, pitch is the probe pitch angle, and T1, T2, T3, and T4 are different airflow deflection angles α and pitch angles. Calibration temperature data of the lower middle thin film platinum resistor, the left thin film platinum resistor, the right thin film platinum resistor, and the upper thin film platinum resistor, Tt is the total temperature of the calibration wind tunnel inflow, and Ts is the static temperature of the calibration wind tunnel inflow; According to the above definition, the calibration curves of deflection angle coefficient-pitch angle coefficient, deflection angle-deflection angle coefficient, pitch angle-pitch angle coefficient, deflection angle-total temperature coefficient, pitch angle-total temperature coefficient, deflection angle-static temperature coefficient and pitch angle-static temperature coefficient at different deflection angles and pitch angles for each incoming flow Mach number are calculated; During actual measurement, the deflection angle coefficient and the pitch angle coefficient are calculated from the temperature data measured by each thin film platinum resistor, and the deflection angle and the pitch angle are calculated using the calibration curve obtained from the above calibration experiment; then, the total temperature coefficient is obtained by interpolation on the deflection angle-total temperature coefficient or pitch angle-total temperature coefficient calibration curve, and then the total temperature is calculated by reverse calculation based on the definition of the total temperature coefficient; similarly, the static temperature coefficient is obtained by interpolation on the deflection angle-static temperature coefficient or pitch angle-static temperature coefficient calibration curve, and then the static temperature is calculated by reverse calculation based on the definition of the static temperature coefficient; finally, the incoming flow Mach number is calculated based on the obtained total airflow temperature and static temperature; The present invention is based on a dynamic total temperature probe of a thin film platinum resistor. The temperature resistance of the thin film platinum resistor is better than that of the currently applicable dynamic pressure sensor. Through calibration tests and measurement data processing methods, the total temperature, static temperature, deflection angle, pitch angle and Mach number of the flow in a higher temperature environment can be obtained.

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