Device and method for testing electromagnetic separation of drop-off connector

Abstract

The invention provides an electromagnetic separation testing device and method for a drop-off connector, and belongs to the field of precise instrument testing. The device comprises a bottom plate, two door-shaped supports, a power supply, a resistor, an oscilloscope and a drop connector, the two door-shaped supports are parallelly arranged on the bottom plate at intervals, a mounting plate is arranged between the two door-shaped supports, the power supply and the oscilloscope are arranged on the mounting plate, a first switch is arranged on the power supply, the power supply is electrically connected with the resistor and the drop connector, and the drop connector is electrically connected with the oscilloscope. The oscilloscope is connected with the resistor in parallel, the resistor is connected with the falling-off connector in parallel, the falling-off connector is located below the mounting plate and comprises a first terminal and a second terminal, the first terminal is located below the second terminal, and a second switch is arranged between the second terminal and the power supply. By adopting the electromagnetic separation test device and method for the drop-off connector provided by the embodiment of the invention, the problems of relatively low test efficiency and relatively low accuracy in the prior art can be solved.

Description

Technical Field

[0001] The invention relates to the field of precision instrument testing, and in particular to a device and method for testing electromagnetic separation of a dropped connector. Background Art

[0002] With the continuous development of the detachable connector, manual mechanical separation is gradually replaced by electromagnetic separation. Electromagnetic separation connectors add electromagnetic components on the basis of mechanical separation connectors. During electromagnetic separation, it is necessary to input a specified electrical signal into the electromagnetic component of the connector. The electromagnetic component works and converts electromagnetic energy into mechanical energy, so that the two ends of the detachable connector are separated. In the electromagnetic separation process of different detachable connectors, the separation time is different due to the different structures of each detachable connector. Therefore, the time test of electromagnetic separation of detachable connectors has become an indispensable step.

[0003] In the prior art, the electromagnetic separation test of the disconnected connector is usually performed by placing the disconnected connector horizontally on a test bench and connecting it to a circuit, inputting an electrical signal, and then manually counting the time it takes for the circuit to disconnect.

[0004] The electromagnetic separation test device for detached connectors in the prior art places the detached connector horizontally on the test bench, so that the detached connector can only be separated by electromagnetic means. During the separation process, friction may occur between the connector and the workbench, resulting in insufficient separation, so that the measured separation time data is mostly invalid data. Repeated tests are required to obtain accurate test results, resulting in low test efficiency. In addition, since the time is measured in the form of manual counting, the accuracy is low. Summary of the invention

[0005] The embodiment of the present invention provides a device and method for electromagnetic separation testing of a dropped connector, which can solve the problems of low testing efficiency and low accuracy in the prior art. The technical solution is as follows:

[0006] In a first aspect, a device for testing electromagnetic separation of a dropped connector includes: a bottom plate, a door-shaped bracket, a power supply, a resistor, an oscilloscope, and a dropped connector.

[0007] The two door-shaped brackets are arranged in parallel and at intervals on the bottom plate, a mounting plate is arranged between the two door-shaped brackets, the power supply and the oscilloscope are arranged on the mounting plate, a first switch is arranged on the power supply, the power supply is electrically connected to the resistor and the drop-out connector respectively, the oscilloscope is connected in parallel with the resistor, the resistor is connected in parallel with the drop-out connector, the drop-out connector is located below the mounting plate, the drop-out connector includes a first terminal and a second terminal, the first terminal is located below the second terminal, and a second switch is arranged between the second terminal and the power supply.

[0008] Optionally, a connecting rod is provided between the two door-shaped brackets, and the connecting rod is located at the top end of the door-shaped bracket.

[0009] Optionally, it further includes a wire and a support frame, the power supply, resistor, oscilloscope and detachable connector are connected by the wire, and the support frame is arranged on the connecting rod to provide support for the wire.

[0010] Optionally, a storage box is provided on the bottom plate, and the storage box is provided between the two door-shaped brackets and below the first terminal.

[0011] Optionally, a rubber net is provided in the storage box.

[0012] Optionally, a buffer mechanism is provided at the bottom of the storage box, and the buffer mechanism includes a sliding rod, a sliding sleeve and a spring. The sliding sleeve is provided on the bottom plate, one end of the sliding rod is fixed to the bottom of the storage box, and the other end is slidably provided inside the sliding sleeve. The spring sleeve is provided on the sliding rod and is located between the sliding sleeve and the storage box.

[0013] Optionally, four buffer mechanisms are provided and arranged in a rectangular array at the bottom of the storage box.

[0014] Optionally, a slide groove is provided on one side of the door-shaped brackets close to each other, and a protrusion matching the slide groove is provided on the side of the storage box close to the door-shaped bracket, and the protrusion can be slidably arranged in the slide groove.

[0015] Optionally, anti-skid pads are provided at the bottom of the base plate, and the anti-skid pads are located at the four corners of the base plate.

[0016] In a second aspect, a method for testing electromagnetic separation of a dropped connector includes the aforementioned electromagnetic separation testing device for a dropped connector, and the steps include:

[0017] Step 1: connect the resistor and the drop-out connector in parallel and connect them to the power supply circuit, connect the oscilloscope in parallel to the resistor, and close the first switch;

[0018] Step 2: Observe the waveform on the oscilloscope, close the second switch, and record the first time node t when the waveform starts to change;

[0019] Step three: wait for the first terminal to be separated from the second terminal, observe the waveform on the oscilloscope, and record the second time node T when the waveform changes again, where Tt is the time when the detached connector is separated.

[0020] The beneficial effects brought about by the technical solution provided by the embodiment of the present invention include at least:

[0021] An electromagnetic separation test device and method for a detachable connector provided in an embodiment of the present invention comprises the following steps: a resistor, an oscilloscope and a detachable connector are arranged on a mounting plate; the resistor and the detachable connector are connected in parallel; and the oscilloscope is connected in parallel to both ends of the resistor; when the first switch is closed, the circuit of the resistor is connected, and the voltage of the resistor can be measured by the oscilloscope; when the second switch is closed, the detachable connector is connected in parallel to the circuit, and the voltage of the resistor measured by the oscilloscope changes; after a period of time, the first terminal and the second terminal are separated, and the circuit of the detachable connector is disconnected; and the second terminal is relatively easily separated from the first terminal due to gravity. The voltage of the resistor measured by the oscilloscope will change again. By recording the time difference between the two changes, the separation time of the detached connector can be measured. When it is necessary to measure the separation time of other detached connectors, it is only necessary to replace the detached connector and connect it to the circuit. The separation time of the detached connector measured by this method, since the first terminal and the second terminal are arranged longitudinally, the detached connector will not be disturbed by the external environment or parts and cannot be separated, thereby reducing the test time and improving the test efficiency. The readings through the oscilloscope are more accurate, which can effectively solve the problems of low test efficiency and low accuracy in the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0023] Figure 1 It is a schematic diagram of the overall structure of the device provided by an embodiment of the present invention;

[0024] Figure 2 It is a schematic diagram of the overall structure after removing one side of the door-type bracket provided by an embodiment of the present invention;

[0025] Figure 3 The embodiment of the present invention provides Figure 2 A schematic diagram of the enlarged structure at point A;

[0026] Figure 4 is a schematic diagram of the electronic component connection structure provided by an embodiment of the present invention;

[0027] Figure 5 is a schematic diagram of an electronic component connection structure from another angle provided by an embodiment of the present invention;

[0028] Figure 6 It is a flow chart of the method provided by an embodiment of the present invention.

[0029] In the figure: 1-bottom plate; 11-anti-slip pad; 2-door bracket; 21 mounting plate; 22-connecting rod; 23-support frame; 24-slide groove; 3-power supply; 31-first switch; 4-resistance; 5-oscilloscope; 6-drop connector; 61-first terminal; 62-second terminal; 7-second switch; 8-wire; 9-storage box; 91-rubber net; 92-protrusion; 10-buffer mechanism; 101-sliding rod; 102-sliding sleeve; 103-spring. DETAILED DESCRIPTION

[0030] To make the objectives, technical solutions and advantages of the present invention more clear, the embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

[0031] Figure 1 It is a schematic diagram of the overall structure of the device provided by an embodiment of the present invention; Figure 2 It is a schematic diagram of the overall structure after removing one side of the door-type bracket provided by an embodiment of the present invention; Figure 3 The embodiment of the present invention provides Figure 2 A schematic diagram of the enlarged structure at point A; Figure 4 is a schematic diagram of the electronic component connection structure provided by an embodiment of the present invention; Figure 5 is a schematic diagram of an electronic component connection structure from another angle provided by an embodiment of the present invention; Figure 6 is a flow chart of the method provided by an embodiment of the present invention. Figures 1 to 6 A detachable connector electromagnetic separation test device comprises: a base plate 1, a door-shaped bracket 2, a power supply 3, a resistor 4, an oscilloscope 5 and a detachable connector 6, wherein two door-shaped brackets 2 are provided and are arranged in parallel and spaced apart on the base plate 1, a mounting plate 21 is provided between the two door-shaped brackets 2, the power supply 3 and the oscilloscope 5 are provided on the mounting plate 21, a first switch 31 is provided on the power supply 3, the power supply 3 is electrically connected to the resistor 4 and the detachable connector 6 respectively, the oscilloscope 5 is connected in parallel with the resistor 4, the resistor 4 is connected in parallel with the detachable connector 6, the detachable connector 6 is located below the mounting plate 21, the detachable connector 6 comprises a first terminal 61 and a second terminal 62, the first terminal 61 is located below the second terminal 62, and a second switch 7 is provided between the second terminal 62 and the power supply 3.

[0032] Exemplarily, in the embodiment of the present invention, the power supply 3 , the resistor 4 , the oscilloscope 5 and the drop-out connector 6 are all electronic components of the device, which are all connected by a wire 8 . The power supply 3 is fixedly set on the mounting plate 21, and the resistor 4 and the oscilloscope 5 are fixed on the mounting plate 21 together, and then the drop-out connector 6 is fixed on the bottom of the mounting plate 21, so that the second terminal 62 is fixed on the bottom of the mounting plate 21, the first terminal 61 is located below the second terminal 62, and the power supply 3 and the resistor 4 are connected through the wire 8 to form a circuit, and the oscilloscope 5 is connected in parallel to the circuit at both ends of the resistor 4, and then the positive electrode of the power supply 3 is connected to the first terminal 61 through the wire 8, and the negative electrode of the power supply 3 is connected to the second terminal 62, and the second switch 7 is set between the second terminal 62 and the negative electrode of the power supply 3. First, the first switch 31 is closed, and the power supply 3 is turned on to energize the resistor 4. At this time, the oscilloscope 5 can test the voltage across the resistor 4 to form a waveform. After the second switch 7 is closed, the drop-out connector 6 and the resistor 4 are connected to the circuit in parallel. At this time, the voltage across the resistor 4 measured on the oscilloscope 5 will change, and the waveform formed thereon will also change. After the drop-out connector 6 is energized for a period of time, the first terminal 61 and the second terminal 62 are separated. Since the first terminal 61 and the second terminal 62 are arranged longitudinally, the success rate of the first terminal 61 falling off and separating under the action of gravity is high, and the separation will not fail due to factors such as the external environment or the friction resistance of the equipment. The detaching connector 6 disconnects the circuit connection, and the voltage across the resistor 4 returns to the initial state. The oscilloscope 5 measures that the voltage across the resistor 4 changes again. By recording the time when the waveform on the oscilloscope 5 changes twice, the time difference is the time required for the detaching connector 6 to separate. A connector is provided at the connection between the wire 8 and the first terminal 61 and the second terminal 62, and an interface is provided on the first terminal 61 and the second terminal 62. The interface on each detaching connector to be tested is consistent. By plugging the connector and the interface, different detaching connectors 6 can be quickly replaced for measurement, thereby improving the efficiency of the test.

[0033] An electromagnetic separation test device and method for a detached connector provided in an embodiment of the present invention comprises: a resistor 4, an oscilloscope 5 and a detached connector 6 are arranged on a mounting plate 21, the resistor 4 and the detached connector 6 are connected in parallel, and the oscilloscope 5 is connected in parallel to both ends of the resistor 4. When the first switch 31 is closed, the circuit of the resistor 4 is connected, and the voltage of the resistor 4 can be measured by the oscilloscope 5. When the second switch 7 is closed again, the detached connector 6 is connected in parallel to the circuit, and the voltage of the resistor 4 measured by the oscilloscope 5 changes. After a period of time, the first terminal 61 and the second terminal 62 will be separated, and the circuit of the detached connector 6 will be disconnected. Due to the action of gravity, the second terminal 62 will be more easily separated from the first terminal 61. 61 is separated, at this time, the voltage of the resistor 4 measured by the oscilloscope 5 will change again, and the separation time of the detached connector 6 can be measured by recording the time difference between the two changes. When it is necessary to measure the separation time of other detached connectors 6, it is only necessary to replace the detached connector 6 and connect it to the circuit. The separation time of the detached connector 6 measured by this method, since the first terminal 61 and the second terminal 62 are arranged longitudinally, the detached connector 6 will not be disturbed by the external environment or parts and cannot be separated, thereby reducing the test time and improving the test efficiency. The readings through the oscilloscope 5 are more accurate, which can effectively solve the problems of low test efficiency and low accuracy in the prior art.

[0034] Optionally, a connecting rod 22 is provided between the two door-shaped brackets 2 , and the connecting rod 22 is located at the top end of the door-shaped bracket 2 .

[0035] Exemplarily, in an embodiment of the present invention, by setting a connecting rod 22 between the two door-shaped brackets 2, the connection between the two door-shaped brackets 2 is made more stable, so that the mounting plate 21 can be more stably set on the door-shaped bracket 2, and then the entire circuit structure can be stably set on the door-shaped bracket 2, thereby improving the stability of the device.

[0036] Optionally, it further includes a wire 8 and a support frame 23 , the power supply 3 , the resistor 4 , the oscilloscope 5 and the detachable connector 6 are connected via the wire 8 , and the support frame 23 is arranged on the connecting rod 22 to provide support for the wire 8 .

[0037] Exemplarily, in an embodiment of the present invention, since the first terminal 61 will fall off and separate from the second terminal 62 after being energized for a period of time, the first terminal 61 will fall under the action of gravity, and thus the wire 8 between the first terminal 61 and the positive pole of the power supply is a soft wire 8, which facilitates the free falling of the first terminal 61, while the other parts of the wire 8 use hard wires 8 because they need to maintain the stability of the circuit, and the support frame 23 arranged on the connecting rod 22 provides fixed support for the hard wire 8, thereby ensuring the stability of the entire circuit, thereby further improving the stability of the device.

[0038] Optionally, a storage box 9 is provided on the bottom plate 1 , and the storage box 9 is provided between the two door-shaped brackets 2 and below the first terminal 61 .

[0039] Illustratively, in an embodiment of the present invention, since the first terminal 61 will fall after falling off and separating, in order to prevent the falling first terminal 61 from colliding with other components and to provide protection for the first terminal 61, a storage box 9 is provided underneath it, thereby increasing the service life of the device.

[0040] Optionally, a rubber net 91 is provided in the storage box 9 .

[0041] Illustratively, in the embodiment of the present invention, by providing a rubber net 91 in the storage box 9, the falling first terminal 61 can be prevented from hard collision with the storage box 9. The rubber net 91 has a buffering effect on the falling of the first terminal 61, thereby further improving the service life of the device.

[0042] Optionally, a buffer mechanism 10 is provided at the bottom of the storage box 9, and the buffer mechanism 10 includes a sliding rod 101, a sliding sleeve 102 and a spring 103. The sliding sleeve 102 is arranged on the bottom plate 1, one end of the sliding rod 101 is fixed to the bottom of the storage box 9, and the other end is slidably arranged inside the sliding sleeve 102. The spring 103 is sleeved on the sliding rod 101 and is located between the sliding sleeve 102 and the storage box 9.

[0043] For example, in the embodiment of the present invention, after the first terminal 61 falls into the storage box 9, the buffer mechanism 10 can buffer the falling force of the first terminal 61 to prevent the first terminal 61 from having a hard collision with the storage box 9. After the first terminal 61 falls into the storage box 9, the storage box 9 will carry the sliding rod 101 to move downward, and the other end of the sliding rod 101 also slides in the sliding sleeve 102, so that the spring 103 is compressed to offset the downward movement of the storage box 9, thereby preventing the storage box 9 from being damaged due to excessive force, thereby further improving the service life of the device.

[0044] Optionally, four buffer mechanisms 10 are provided and arranged in a rectangular array at the bottom of the storage box 9 .

[0045] Exemplarily, in an embodiment of the present invention, four buffer mechanisms 10 are provided, and the four buffer mechanisms 10 are arranged in a rectangular array at the bottom of the storage box 9. The storage box 9 can be more stably arranged on the buffer mechanism 10, so that the storage box 9 will not be tilted due to the falling force of the first terminal 61, thereby further improving the stability of the device.

[0046] Optionally, a slide groove 24 is provided on one side of the door-shaped bracket 2 , and a protrusion 92 matching the slide groove 24 is provided on the side of the storage box 9 close to the door-shaped bracket 2 , and the protrusion 92 can be slidably disposed in the slide groove 24 .

[0047] Illustratively, in an embodiment of the present invention, through the cooperation of the slide groove 24 and the protrusion 92, the storage box 9 can be provided with a vertical guide when buffering on the buffer mechanism 10, thereby preventing the storage box 9 from tilting due to uneven force, thereby further improving the stability of the device.

[0048] Optionally, anti-skid pads 11 are provided at the bottom of the base plate 1 , and the anti-skid pads 11 are located at four corners of the base plate 1 .

[0049] For example, in the embodiment of the present invention, by setting an anti-skid pad 11 at the bottom of the bottom plate 1, it is possible to prevent the first terminal 61 from falling too much and causing the entire device to slide. The anti-skid pad 11 can be made of rubber or other materials to increase the friction between the device and the experimental table. By setting the anti-skid pad 11, the stability of the device is further improved.

[0050] A method for testing electromagnetic separation of a dropped connector includes the aforementioned electromagnetic separation testing device for a dropped connector, and the steps include:

[0051] S1: Connect the resistor 4 and the drop-out connector 6 in parallel and connect them to the power supply 3 circuit, connect the oscilloscope 5 in parallel to the resistor 4, and close the first switch 31.

[0052] S2: Observe the waveform on the oscilloscope 5, close the second switch 7, and record the first time node t when the waveform starts to change.

[0053] S3: Wait for the first terminal 61 to be separated from the second terminal 62, observe the waveform on the oscilloscope 5, and record the second time node T when the waveform changes again. Tt is the time when the connector is separated.

[0054] Exemplarily, in an embodiment of the present invention, the power supply 3 is fixedly set on the mounting plate 21, and the resistor 4 and the oscilloscope 5 are fixed on the mounting plate 21 together, and then the detachable connector 6 is fixed to the bottom of the mounting plate 21, so that the second terminal 62 is fixed to the bottom of the mounting plate 21, the first terminal 61 is located below the second terminal 62, and the power supply 3 and the resistor 4 are connected through the wire 8 to form a circuit, and the oscilloscope 5 is connected in parallel to the circuit at both ends of the resistor 4, and then the positive electrode of the power supply 3 is connected to the first terminal 61 and the negative electrode of the power supply 3 is connected to the second terminal 62 through the wire 8, and the second switch 7 is set between the second terminal 62 and the negative electrode of the power supply 3. First, the first switch 31 is closed, and the power supply 3 is turned on to energize the resistor 4. At this time, the oscilloscope 5 can test the voltage across the resistor 4 to form a waveform. After the second switch 7 is closed, the detachable connector 6 and the resistor 4 are connected to the circuit in parallel. At this time, the voltage across the resistor 4 measured on the oscilloscope 5 will change, and the waveform formed thereon will also change. At this time, the first time node t is recorded. After the shedding connector 6 is powered on for a period of time, the first terminal 61 and the second terminal 62 are separated, the shedding connector 6 is disconnected from the circuit, the voltage across the resistor 4 is restored to the initial state, and the oscilloscope 5 measures that the voltage across the resistor 4 changes again, and records the second time node T. By calculating Tt, the time required for the shedding connector 6 to separate can be obtained.

[0055] Unless otherwise defined, the technical terms or scientific terms used herein shall have the usual meanings understood by persons of ordinary skill in the field to which the present invention belongs. The words "first", "second" and similar words used in the patent application specification and claims of the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, words such as "one" or "one" do not indicate a quantity limitation, but indicate the existence of at least one. Words such as "include" or "comprise" and similar words mean that the elements or objects appearing before "include" or "comprise" include the elements or objects listed after "include" or "comprise" and their equivalents, and do not exclude other elements or objects. Words such as "connect" or "connected" and similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0056] The above descriptions are merely optional embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A device for testing electromagnetic separation of a dropped connector, characterized in that: include: Base plate (1), door bracket (2), power supply (3), resistor (4), oscilloscope (5) and drop-out connector (6), Two door-shaped brackets (2) are provided and arranged in parallel and spaced apart on the bottom plate (1); a mounting plate (21) is provided between the two door-shaped brackets (2); the power supply (3) and the oscilloscope (5) are provided on the mounting plate (21); a first switch (31) is provided on the power supply (3); the power supply (3) is electrically connected to the resistor (4) and the drop-out connector (6) respectively; the oscilloscope (5) is connected in parallel with the resistor (4); the resistor (4) is connected in parallel with the drop-out connector (6); the drop-out connector (6) is located below the mounting plate (21); the drop-out connector (6) comprises a first terminal (61) and a second terminal (62); the first terminal (61) is located below the second terminal (62); a second switch (7) is provided between the second terminal (62) and the power supply (3).

2. The electromagnetic separation test device for a dropped connector according to claim 1, characterized in that: A connecting rod (22) is provided between the two door-shaped brackets (2), and the connecting rod (22) is located at the top end of the door-shaped bracket (2).

3. The electromagnetic separation test device for a dropped connector according to claim 1, characterized in that: It also includes a wire (8) and a support frame (23), wherein the power source (3), the resistor (4), the oscilloscope (5) and the drop-out connector (6) are connected via the wire (8), and the support frame (23) is arranged on the connecting rod (22) to provide support for the wire (8).

4. The electromagnetic separation test device for a dropped connector according to claim 1, characterized in that: A storage box (9) is provided on the bottom plate (1); the storage box (9) is provided between the two door-shaped brackets (2) and is located below the first terminal (61).

5. The electromagnetic separation test device for a dropped connector according to claim 4, characterized in that: A rubber net (91) is arranged in the storage box (9).

6. The electromagnetic separation test device for a dropped connector according to claim 4, characterized in that: A buffer mechanism (10) is arranged at the bottom of the storage box (9), and the buffer mechanism (10) comprises a sliding rod (101), a sliding sleeve (102) and a spring (103); the sliding sleeve (102) is arranged on the bottom plate (1); one end of the sliding rod (101) is fixed to the bottom of the storage box (9), and the other end is slidably arranged inside the sliding sleeve (102); the spring (103) is sleeved on the sliding rod (101) and is located between the sliding sleeve (102) and the storage box (9).

7. The electromagnetic separation test device for a dropped connector according to claim 6, characterized in that: Four buffer mechanisms (10) are provided and arranged in a rectangular array at the bottom of the storage box (9).

8. The electromagnetic separation test device for a dropped connector according to claim 6, characterized in that: The door-shaped brackets (2) are provided with a slide groove (24) on one side close to each other, and the storage box (9) is provided with a protrusion (92) matching the slide groove (24) on the side close to the door-shaped bracket (2), and the protrusion (92) can be slidably arranged in the slide groove (24).

9. The electromagnetic separation test device for a dropped connector according to claim 1, characterized in that: The bottom of the base plate (1) is provided with anti-skid pads (11), and the anti-skid pads (11) are located at the four corners of the base plate (1).

10. A method for testing electromagnetic separation of a disconnected connector, comprising the electromagnetic separation testing device for a disconnected connector according to any one of claims 1 to 9, characterized in that the steps include: Step 1: Connect the resistor (4) and the drop-out connector (6) in parallel and connect them to the power supply (3) circuit, connect the oscilloscope (5) in parallel to the resistor (4), and close the first switch (31); Step 2: Observe the waveform on the oscilloscope (5), close the second switch (7), and record the first time node t when the waveform starts to change; Step three: wait for the first terminal (61) to be separated from the second terminal (62), observe the waveform on the oscilloscope (5), and record the second time node T when the waveform changes again, where Tt is the time when the detached connector is separated.

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