Solid state disk testing method and system, storage medium and program product

Abstract

The invention discloses a solid state disk testing method and system, a storage medium and a program product, and relates to the field of computer storage testing, and the method comprises the following steps: dividing a storage space of a solid state disk to be tested into a plurality of physical areas; determining the number of read-write tests of the to-be-tested solid state disk within a preset duration at a preset temperature; performing read-write test operation on the plurality of physical areas in sequence within a preset duration to obtain read-write error rates respectively corresponding to the plurality of physical areas, the number of read-write times of the read-write test operation being the number of read-write test times; if the read-write error rates corresponding to the physical areas exceeding the preset number are higher than a preset error rate threshold value, determining that the to-be-tested solid state disk is unqualified; and if the read-write error rates corresponding to the physical areas lower than the preset number are lower than a preset error rate threshold, determining that the to-be-tested solid state disk is qualified. By implementing the method, the specific problem area in the solid state disk can be positioned and diagnosed more accurately, so that the quality evaluation standard and the maintenance efficiency of the whole solid state disk are improved.

Description

Technical Field

[0001] The present application relates to the field of computer storage testing, and in particular to a solid state hard disk testing method, system, storage medium and program product. Background Art

[0002] With the rapid development of information technology, data storage technology, especially solid-state drives (SSDs), are becoming more and more widely used. Compared with traditional mechanical hard disks, solid-state drives have been widely used due to their faster read and write speeds, lower power consumption, and stronger shock resistance, especially in enterprise-level data centers, personal computing devices, and big data processing scenarios. However, quality control and performance evaluation of solid-state drives during the production process are key steps to ensure their reliability and performance. Therefore, it is particularly important to develop an effective hard disk testing method.

[0003] In existing technologies, testing of solid-state drives usually involves a full scan of the drive to detect the read and write capabilities of the drive and the health of the storage unit. This method relies primarily on sequential read and write and random read and write tests to simulate various real-world application scenarios. During the test, the drive is required to run under different workloads and durations to evaluate its performance and durability. This test can provide comprehensive information about the drive's speed, latency, and error rate, helping manufacturers and users understand the quality of the product.

[0004] Although existing technologies have achieved certain results in testing solid-state drives, they are still insufficient in certain specific application scenarios. For example, traditional testing methods usually fail to fully simulate the performance of hard drives in different physical areas, which may lead to data inconsistency in actual applications. In addition, existing testing methods often ignore the impact of environmental factors such as temperature on hard drive performance. In actual use, solid-state drives may operate in different ambient temperatures, and the performance of the hard drive under these conditions may be significantly different from that under standard test environments. Therefore, a more comprehensive and practical testing method is needed to ensure the stability and reliability of hard drives in various environments and workloads. Summary of the invention

[0005] The present application provides a solid-state drive testing method, system, storage medium, and program product for more accurately locating and diagnosing specific problem areas in a solid-state drive, thereby improving the quality assessment standard and maintenance efficiency of the entire solid-state drive.

[0006] In a first aspect, the present application provides a solid-state hard disk testing method, which is applied to a testing system, the method comprising: dividing the storage space of the solid-state hard disk to be tested into multiple physical areas; determining the number of read and write tests of the solid-state hard disk to be tested within a preset time period at a preset temperature; performing read and write test operations on the multiple physical areas in sequence within the preset time period to obtain read and write error rates corresponding to the multiple physical areas, respectively, and the number of read and write tests of the read and write test operations is the number of read and write tests; if the read and write error rates corresponding to the physical areas exceeding the preset number are higher than the preset error rate threshold, the solid-state hard disk to be tested is determined to be unqualified; if the read and write error rates corresponding to the physical areas less than the preset number are lower than the preset error rate threshold, the solid-state hard disk to be tested is determined to be qualified.

[0007] In the above embodiment, the test system divides the storage space of the solid-state hard disk to be tested into multiple physical areas, and performs read and write test operations on each physical area within a preset temperature and a preset time, and judges whether the solid-state hard disk to be tested is qualified or not according to the read and write error rate corresponding to each physical area. If the read and write error rate corresponding to the physical areas exceeding the preset number is higher than the preset error rate threshold, it means that there are too many physical areas in the solid-state hard disk to be tested whose read and write error rates do not meet the requirements, and then the solid-state hard disk to be tested is unqualified; if the read and write error rate corresponding to the physical areas below the preset number is lower than the preset error rate threshold, it means that although there are physical areas in the solid-state hard disk to be tested whose read and write error rates are higher than the preset error rate threshold, on the whole, the number of these physical areas does not exceed the preset number, which means that the read and write performance of most of the physical areas of the solid-state hard disk to be tested meets the requirements, so it can be judged that the solid-state hard disk to be tested is qualified as a whole. This technical solution can specifically locate the physical areas with higher failure rates in the solid-state hard disk storage, which can shorten the maintenance time and reduce the overall maintenance cost. The quality of the SSD is judged based on the number of physical areas with read and write error rates higher than the preset error rate threshold, avoiding the direct judgment of the entire SSD as unqualified due to partial area failure. At the same time, it ensures that the overall read and write error rate of the SSD is lower than the preset error rate threshold, which can improve the response speed of the SSD and improve the user experience.

[0008] In combination with some embodiments of the first aspect, in some embodiments, the storage space of the solid-state hard disk to be tested is divided into multiple physical areas, specifically including: determining the minimum specification of each physical area based on the minimum write unit of the solid-state hard disk to be tested; determining the number of physical areas based on the storage space of the solid-state hard disk to be tested.

[0009] In the above embodiment, the test system determines the minimum specification of the physical area according to the minimum write unit of the solid-state hard disk, and determines the number of physical areas according to the storage space of the solid-state hard disk. By considering the minimum write unit of the solid-state hard disk, the division of the physical area can be made more consistent with the actual storage structure of the solid-state hard disk. At the same time, the number of physical areas is determined according to the storage space of the solid-state hard disk, which can make the number of physical areas reasonable, which can fully reflect the quality status of different storage areas in the solid-state hard disk, and will not cause the problem of too many physical areas leading to low test efficiency.

[0010] In combination with some embodiments of the first aspect, in some embodiments, the number of read and write tests of the solid-state hard disk to be tested within a preset time at a preset temperature is determined, specifically including: based on a preset model, determining the average failure interval of the solid-state hard disk to be tested at a preset temperature; determining the average number of failures based on the preset time and the average failure interval, and using the average number of failures as the number of read and write tests.

[0011] In the above embodiment, the test system determines the average failure interval of the solid state drive at a preset temperature based on a preset model, determines the average number of failures based on the preset duration and the average failure interval, and converts the average number of failures into the number of read and write tests. By considering the preset temperature and preset duration in the test environment to determine the number of read and write tests, the use state of the solid state drive can be more realistically simulated, thereby making the test results more accurate. By calculating the average number of failures to determine the number of tests, a reasonable number of tests helps to shorten the entire test cycle and improve the efficiency of the test process while ensuring the quality of the test, thereby avoiding the problem of too long a test time or poor results caused by too many or too few tests.

[0012] In combination with some embodiments of the first aspect, in some embodiments, read and write test operations are performed on multiple physical areas in sequence within a preset time length to obtain read and write error rates corresponding to the multiple physical areas, specifically including: performing read and write test operations on the target physical area within a preset time length, and recording the number of read and write operations of the target physical area; determining the number of read and write errors that occur in the target physical area during the read and write test operations; determining the read and write error rate of the target physical area based on the number of read and write operations and the number of read and write errors; and ending the test when the number of read and write operations reaches the number of read and write tests.

[0013] In the above embodiment, the test system can accurately obtain the read and write error rate of each physical area by counting the number of read and write operations and the number of read and write errors in each area, so as to judge the quality of the physical area according to the read and write error rate, and avoid the inaccuracy caused by directly judging by the number of misalignments. At the same time, the read and write error rate of each physical area is calculated after the test is completed, which can make the test process clearer and more intuitive.

[0014] In combination with some embodiments of the first aspect, in some embodiments, after the step of determining the number of read and write tests of the solid-state hard disk to be tested within a preset time period at a preset temperature, the method also includes: monitoring the real-time temperature in the test environment; when the real-time temperature is higher or lower than the preset temperature, sending a control instruction to the temperature control device, so that the temperature control device adjusts the temperature in the test environment after receiving the control instruction to maintain the real-time temperature in the test environment at the preset temperature.

[0015] In the above embodiment, the test system monitors the real-time temperature of the test environment and controls the temperature control device to adjust in real time so that the real-time temperature is maintained at a preset temperature. Since the working environment temperature of the solid-state hard disk directly affects its read and write error rate, increasing temperature monitoring and control can reduce the impact of temperature fluctuations on the test results, making the test conditions more controllable and the test results more accurate and reliable.

[0016] In combination with some embodiments of the first aspect, in some embodiments, before the step of dividing the storage space of the solid-state hard disk to be tested into multiple physical areas, the method also includes: continuously writing preset test data to the solid-state hard disk to be tested until the writing speed of the solid-state hard disk to be tested is within a preset speed threshold range; performing a data erasing operation on the solid-state hard disk to be tested, and resetting all storage units on the solid-state hard disk to be tested to the initial state at the factory.

[0017] In the above embodiment, the test system continuously writes preset test data to the solid-state drive to be tested until the write speed of the solid-state drive to be tested is within the preset speed threshold range, thereby effectively evaluating the performance of the solid-state drive under continuous high load conditions. The solid-state drive to be tested is erased and all storage units on the solid-state drive to be tested are reset to the factory initial state, so that all residual data can be cleared to ensure the accuracy and repeatability of the test. This process helps to eliminate any performance deviations that may be introduced by previous operations, so that the subsequent read and write test operations start in a clean and uniform state. At the same time, it also ensures that the state of the solid-state drive is consistent at the beginning of each test, which is particularly important for comparing the performance of different solid-state drives or the same solid-state drive under different conditions, and improves the repeatability and comparability of the test results.

[0018] In combination with some embodiments of the first aspect, in some embodiments, after the step of determining that the solid-state hard disk to be tested is unqualified if the read / write error rate corresponding to more than a preset number of physical areas is higher than a preset error rate threshold, or determining that the solid-state hard disk to be tested is qualified if the read / write error rate corresponding to less than a preset number of physical areas is lower than a preset error rate threshold, the method further includes: using the address information corresponding to the physical area whose read / write error rate exceeds the preset error rate threshold as identification information of the unqualified physical area; packaging the execution time of the read / write test operation, environmental parameters, device information of the solid-state hard disk to be tested, and identification information of the unqualified physical area into a test report.

[0019] In the above embodiment, the test system marks the address information corresponding to the physical area whose read and write error rate exceeds the preset error rate threshold as unqualified, which can accurately identify and record the specific area of ​​poor performance in the SSD, which is crucial for subsequent failure analysis and quality improvement work. The execution time of the read and write test operation, environmental parameters, device information of the SSD to be tested, and identification information of the unqualified physical area are packaged into a test report, providing a comprehensive view, showing the completeness and depth of the test.

[0020] In a second aspect, an embodiment of the present application provides a test system, which includes: one or more processors and a memory; the memory is coupled to the one or more processors, the memory is used to store computer program code, the computer program code includes computer instructions, and the one or more processors call the computer instructions to enable the test system to execute the method described in the first aspect and any possible implementation method of the first aspect.

[0021] In a third aspect, an embodiment of the present application provides a computer program product comprising instructions, which, when the computer program product is run on a test system, enables the test system to execute the method described in the first aspect and any possible implementation of the first aspect.

[0022] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, comprising instructions, which, when executed on a test system, causes the test system to execute the method described in the first aspect and any possible implementation of the first aspect.

[0023] It is understandable that the test system provided in the second aspect, the computer program product provided in the third aspect, and the computer storage medium provided in the fourth aspect are all used to execute the method provided in the embodiment of the present application. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding method, which will not be repeated here.

[0024] One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages: 1. Due to the method of dividing the storage space of the solid-state hard disk into multiple physical areas and performing statistical reading and writing error rates by area, the physical area with a higher failure rate in the solid-state hard disk can be located, which effectively solves the problem in the prior art that the faulty area cannot be located and the entire solid-state hard disk is directly judged as unqualified, thereby achieving a more accurate judgment of the quality of the solid-state hard disk and avoiding the effect of misjudgment. Compared with the method of uniformly counting errors for the entire solid-state hard disk in the prior art, this measurement method based on physical area division and statistical errors by area can more accurately locate the faulty area and avoid the significant defect of directly judging the entire solid-state hard disk as unqualified due to local failures, which is a significant improvement of the present invention.

[0025] 2. Since the method considers the minimum write unit of the solid-state hard disk and the storage space of the solid-state hard disk to divide the physical area and calculates the number of read and write tests according to the preset model, the physical area division of the test is more in line with the characteristics of the solid-state hard disk, and the number of read and write tests is more reasonable, which effectively solves the problem of inaccurate testing caused by improper physical area division and improper setting of the number of read and write tests in the prior art, thereby achieving more scientific and reasonable test conditions and more accurate and reliable test results. Compared with the empirical setting method in the prior art, this division method and test number determination method can make the test conditions more scientific and reasonable, avoid inaccurate results caused by test blindness, and is a substantial advantage of the present invention.

[0026] 3. By adopting measures such as generating test reports and conducting long-term read and write tests, the test situation can be more comprehensively reflected, and the long-term stability of the solid-state hard disk can be tested, which effectively solves the problems of incomplete test information and insufficient reliability testing in the prior art, thereby achieving the integrity and comprehensiveness of the test. Compared with the prior art solution of only conducting simple read and write tests, these test auxiliary measures can improve the systematicity, integrity and comprehensiveness of the test in many aspects, which is a substantial advantage of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a flow chart of a solid state drive testing method in an embodiment of the present application; Figure 2 is another flowchart of the solid state drive testing method in an embodiment of the present application; Figure 3 It is a schematic diagram of a physical device structure of a test system in an embodiment of the present application. DETAILED DESCRIPTION

[0028] The terms used in the following embodiments of the present application are only for the purpose of describing specific embodiments, and are not intended to be used as limitations to the present application. As used in the specification of the present application, the singular expressions "one", "a kind of", "above", "the" and "this" are intended to also include plural expressions, unless there is a clear indication to the contrary in the context. It should also be understood that the term "and / or" used in the present application refers to any or all possible combinations comprising one or more of the listed items.

[0029] In the following, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as suggesting or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features, and in the description of the embodiments of the present application, unless otherwise specified, "plurality" means two or more.

[0030] The following is a description of the process of the method provided by this implementation. Figure 1 , is a flow chart of a solid state drive testing method in an embodiment of the present application.

[0031] S101, dividing the storage space of the solid state drive to be tested into multiple physical areas; The test system needs to first obtain the relevant parameters of the solid-state drive to be tested, including but not limited to the storage space, minimum write unit and other information of the solid-state drive to be tested. Then the test system calculates and determines the number of physical areas and the size of each physical area according to the relevant parameters of the solid-state drive to be tested and the preset division rules. The preset division rules can be formulated according to actual conditions and are not limited here. For example, if the storage space of the solid-state drive to be tested is 256GB and the minimum write unit is 4KB, the size of each physical area can be preset to 1GB, then the storage space of the solid-state drive to be tested can be divided into 256 physical areas. Of course, the number and size of the physical area division rules are not limited to this, and can also be determined according to actual needs. The test system only needs to obtain the relevant parameters of the solid-state drive and realize block division. It should be noted that each physical area should be a logically continuous storage area to facilitate subsequent read and write tests.

[0032] Optionally, in general, dividing the storage space of the solid-state drive to be tested into multiple physical areas can be achieved in the following ways: determining the minimum specification of each physical area based on the minimum write unit of the solid-state drive to be tested; determining the number of physical areas based on the storage space of the solid-state drive to be tested.

[0033] The smallest write unit of the SSD to be tested is usually a "page". The size of each page can be found in the technical specifications of the SSD to be tested. Common page sizes include 4KB, 8KB, etc.

[0034] The size of the physical area should be an integer multiple of the page size. When setting the physical area size, you need to consider the test requirements and the performance characteristics of the solid-state drive. For example, you can choose to set each physical area to one or more blocks, where each block consists of multiple pages. The block size can also be found in the hard disk specification. Common block sizes are 256KB, 512KB, etc.

[0035] According to the total storage space of the SSD and the size of each physical zone, the number of physical zones that can be divided can be calculated by simple division (number of physical zones = storage space of the SSD / size of physical zones). For example, if a 256GB SSD has each physical zone set to 512KB, then the number of physical zones is 256KB. physical area.

[0036] S102, determining the number of read and write tests of the solid state drive to be tested within a preset time at a preset temperature; The test system needs to determine the number of read and write tests performed on the solid-state drive under a given temperature condition, i.e., a preset temperature (e.g., 25°C), and within a specified test duration, i.e., a preset duration (e.g., 48 hours). The number of read and write tests can be calculated based on the fault distribution model and formula, or can be directly pre-set based on past test experience.

[0037] Optionally, under normal circumstances, determining the number of read and write tests of the solid-state hard disk to be tested within a preset time at a preset temperature can be achieved in the following way: based on a preset model, determining the average failure interval of the solid-state hard disk to be tested at a preset temperature; determining the average number of failures based on the preset time and the average failure interval, and using the average number of failures as the number of read and write tests.

[0038] In the embodiment of the present application, the preset model may be the Arrhenius Model, which is an empirical model that describes the relationship between product reliability and temperature. Its mathematical expression is as follows: MTBF = A*e^(Ea / k*T), where: MTBF is used to represent the mean time between failures; A is used to represent a constant; Ea is used to represent activation energy; K is used to represent the Boltzmann constant; and T is used to represent absolute temperature (Kelvin temperature).

[0039] The Arrhenius model indicates that when the temperature rises by a certain degree, the failure rate of the product will increase at a constant rate, that is, the higher the temperature, the lower the reliability of the product and the more likely it is to fail. The Arrhenius model establishes a quantitative relationship between temperature and the product reliability indicator MTBF. In product reliability design and testing, the Arrhenius model is often used to predict the reliability of products at different operating temperatures, and to plan the time or number of cycles of reliability tests accordingly.

[0040] In SSD testing, the Athanius model can be applied to estimate the mean time between failures of SSDs at different temperatures, so as to arrange the test time or number of test cycles for accelerated life testing.

[0041] For example, if the mean time between failures of the solid state drive at a preset temperature is calculated to be 24 hours according to the Arrhenius model, then the number of read and write tests in a 48-hour test can be estimated to be 48 / 24=2 times. Of course, the method for calculating the number of read and write tests is not limited to this, as long as the test system can obtain the number of read and write tests under given conditions.

[0042] S103, performing read and write test operations on multiple physical areas in sequence within a preset time length, obtaining read and write error rates corresponding to the multiple physical areas respectively, and the number of read and write times of the read and write test operations is the number of read and write tests; Perform read and write test operations on the target physical area within a preset time period, and record the number of read and write operations on the target physical area; determine the number of read and write errors that occur in the read and write test operations on the target physical area; determine the read and write error rate of the target physical area based on the number of read and write operations and the number of read and write errors; end the test when the number of read and write operations reaches the number of read and write tests.

[0043] The test system will perform read and write test operations on each physical area in sequence within a preset time (for example, 48 hours), and the number of read and write test operations is the number of read and write tests (for example, 2 times). During the test, the test system records the number of read and write operations and the number of read and write errors in each physical area in real time, and finally calculates the read and write error rate of each physical area. The calculation formula can be: read and write error rate = number of read and write errors / total number of read and write operations. If the number of read and write operations of physical area 1 is 1000 times and the number of read and write errors is 5 times, then its read and write error rate is 5 / 1000=0.5%. By analogy, the read and write error rate corresponding to each physical area can be obtained. When the number of read and write tests for each physical area reaches 2 times, stop performing read and write test operations on the physical area.

[0044] S104, if the read and write error rates corresponding to the physical areas exceeding the preset number are higher than the preset error rate threshold, it is determined that the solid state drive to be tested is unqualified; The test system needs to preset the rules for judging whether the solid-state hard disk is qualified or not, that is, to determine the number of physical areas with a read / write error rate higher than the preset error rate threshold, when the test system judges the solid-state hard disk to be tested as unqualified. The preset number can be determined based on the number of physical areas with a read / write error rate higher than the preset error rate threshold and the total number of physical areas. For example, if the read / write error rate of 2 / 3 of the physical blocks is higher than the preset error rate threshold, it means that there are too many physical areas in the solid-state hard disk to be tested whose read / write error rates do not meet the requirements, and the solid-state hard disk to be tested is unqualified; if the read / write error rate of only 1 / 3 of the physical blocks is higher than the preset error rate threshold, it means that although there are physical areas with a read / write error rate higher than the preset error rate threshold in the solid-state hard disk to be tested, on the whole, the number of these physical areas does not exceed the preset number, which means that the read / write performance of most of the physical areas of the solid-state hard disk to be tested meets the requirements, so it can be judged that the solid-state hard disk to be tested is qualified overall.

[0045] The "preset number" and "preset error rate threshold" can be set according to the strictness of the test, or can be set with reference to the historical statistical data of the SSD to be tested. When making a judgment, the test system only needs to count how many physical areas have a read and write error rate higher than the preset error rate threshold (such as 1%). If it exceeds the preset number (such as 15), the SSD to be tested can be directly judged as unqualified. Of course, the judgment rules are not limited to this, as long as the pass or fail judgment can be made based on the read and write error rate of the physical area.

[0046] S105: If the read / write error rates corresponding to the physical areas less than the preset number are lower than the preset error rate threshold, it is determined that the solid state hard disk to be tested is qualified.

[0047] If the test system obtains statistics showing that the read and write error rates of 14 or fewer physical zones exceed a preset threshold of 1%, it can be determined to be lower than a preset number of 15, and the test system can determine that the solid state drive to be tested is qualified.

[0048] In the above embodiment, the test system divides the storage space of the solid-state hard disk to be tested into multiple physical areas, and performs read and write test operations on each physical area within a preset time at a preset temperature, and judges whether the solid-state hard disk to be tested is qualified or not according to the read and write error rate corresponding to each physical area. If the read and write error rate corresponding to the physical area exceeding the preset number is higher than the preset error rate threshold, it means that there are too many physical areas in the solid-state hard disk to be tested whose read and write error rates do not meet the requirements, and then the solid-state hard disk to be tested is unqualified; if the read and write error rate corresponding to the physical area less than the preset number is lower than the preset error rate threshold, it means that although there are physical areas with read and write error rates higher than the preset error rate threshold in the solid-state hard disk to be tested, on the whole, the number of these physical areas does not exceed the preset number, which means that the read and write performance of most of the physical areas of the solid-state hard disk to be tested meets the requirements, so it can be judged that the solid-state hard disk to be tested is qualified as a whole. This technical solution can specifically locate the physical areas with higher failure rates in the solid-state hard disk storage, which can shorten the maintenance time and reduce the overall maintenance cost. The quality of the SSD is judged based on the number of physical areas with read and write error rates higher than the preset error rate threshold, avoiding the direct judgment of the entire SSD as unqualified due to partial area failure. At the same time, it ensures that the overall read and write error rate of the SSD is lower than the preset error rate threshold, which can improve the response speed of the SSD and improve the user experience.

[0049] The following is a more detailed description of the process of the method provided by this implementation. Figure 2 , is another flow chart of the solid state drive testing method in the embodiment of the present application.

[0050] S201, continuously writing preset test data to the solid state drive to be tested until the writing speed of the solid state drive to be tested is within a preset speed threshold range; To ensure that the write speed of a solid-state drive (SSD) is within the preset speed threshold range, you first need to identify a suitable performance testing software, such as CrystalDiskMark. The test system then configures the test software to continuously write preset test data to the SSD while monitoring whether its write speed is within the preset speed threshold range. During the test, if the write speed of the SSD is lower than the preset speed threshold, the test settings can be adjusted or the configuration of the SSD can be optimized to ensure that the speed returns to the preset speed threshold range. This process not only evaluates the performance of the SSD, but also ensures that it can provide stable and reliable write speeds in actual use.

[0051] S202, performing a data erasing operation on the solid state drive to be tested, and resetting all storage units on the solid state drive to be tested to the factory initial state; To restore a solid-state drive (SSD) to factory settings, you can use the SSD's built-in secure erase function or third-party software such as DiskGenius, Parted Magic, etc. to completely delete all data and restore it to its original factory state.

[0052] S203, dividing the storage space of the solid state drive to be tested into a plurality of physical areas; For details, please refer to step S101, which will not be described in detail here.

[0053] S204, determining the number of read and write tests of the solid state drive to be tested within a preset time at a preset temperature; For details, please refer to step S102, which will not be described in detail here.

[0054] S205, monitoring the real-time temperature in the test environment; The test system needs to use a temperature sensor to monitor the temperature changes of the test environment in real time and obtain the real-time temperature. The temperature sensor can be set in the test box and directly contact the ambient temperature around the solid-state drive to be tested. The specific monitoring time interval can be set by the test system as needed, for example, the ambient temperature is detected every 5 minutes. The detected temperature data can be displayed on the temperature curve of the test system, or recorded in the temperature log file for later analysis of ambient temperature fluctuations. It should be noted that the temperature sensor must be accurate and reliable to ensure that the real-time temperature in the test environment can be measured.

[0055] S206, when the real-time temperature is higher or lower than the preset temperature, sending a control instruction to the temperature control device, so that the temperature control device adjusts the temperature in the test environment after receiving the control instruction to maintain the real-time temperature in the test environment at the preset temperature; The test system will determine in real time whether the detected real-time temperature is higher or lower than the preset temperature (for example, higher or lower than 25°C). When the real-time temperature is higher or lower than the preset temperature, the test system will immediately send a temperature adjustment control instruction to the connected temperature control device (such as an air conditioner or electric heater). The control instruction will include the target adjustment temperature value (preset temperature) and parameter information such as the temperature adjustment rate. The control instruction can be sent through a cable connection or remotely through the network. The test system only needs to be able to send a control instruction to the temperature control device when the temperature is abnormal.

[0056] The temperature control device (such as an air conditioner) connected to the test system will receive the temperature adjustment control instructions sent from the test system in real time. After receiving the control instruction, the temperature control device will automatically start to adjust the real-time temperature in the test environment according to the target adjustment temperature value, temperature adjustment rate and other parameters in the instruction. For example, if the received control instruction requires the test environment temperature to be adjusted from 40°C to 25°C, the temperature control device will automatically blow out cold air to quickly lower the ambient temperature. The temperature control device in the test environment only needs to be able to receive and adjust the temperature according to the instruction.

[0057] Through the cooperation between the test system and the temperature control device, the real-time temperature in the test environment can be effectively adjusted and maintained around the preset temperature, for example, controlled to fluctuate within 25°C ± 1°C. When the real-time temperature is lower than or higher than the preset temperature again, step S206 will be started again to form a temperature closed-loop control to ensure that the temperature conditions during the test process meet the preset temperature, avoid the influence of temperature on the test results, and ensure that the results are accurate and reliable.

[0058] S207, performing read and write test operations on multiple physical areas in sequence within a preset time length, obtaining read and write error rates corresponding to the multiple physical areas respectively, and the number of read and write times of the read and write test operations is the number of read and write tests; For details, please refer to step S103, which will not be described in detail here.

[0059] S208, if the read and write error rates corresponding to the physical areas exceeding the preset number are higher than the preset error rate threshold, it is determined that the solid state drive to be tested is unqualified; For details, please refer to step S104, which will not be described in detail here.

[0060] S209: If the read / write error rates corresponding to the physical areas less than the preset number are lower than the preset error rate threshold, it is determined that the solid state drive to be tested is qualified.

[0061] For details, please refer to step S105, which will not be described in detail here.

[0062] S210, using address information corresponding to a physical area whose read / write error rate exceeds a preset error rate threshold as identification information of an unqualified physical area; The test system will extract and organize the address information of all physical areas whose read and write error rates exceed the preset error rate threshold during the read and write test operations as identification of unqualified physical areas. The address information can be accurate to which area or sector of the solid-state drive. For example, the address information can be expressed as "sectors 1024 to 2048 in the third partition of drive letter 0". The test system will record this address information in the form of a list or database, and establish an index correspondence with the unqualified physical area to facilitate accurate representation of the address distribution of the unqualified physical area when generating a test report. The identification information can be recorded in text, or a corresponding partition map or mapping map can be generated for a more intuitive representation.

[0063] S211, encapsulating the execution time of the read and write test operations, environmental parameters, device information of the solid state hard disk to be tested, and identification information of the unqualified physical area into a test report.

[0064] The test system will unify and automatically generate a test report for the execution time of the entire read and write test operation (such as the start time and end time), the environmental parameters during the process (such as temperature curves, humidity changes, and other data), the device information of the solid-state drive to be tested (such as brand model, production batch, etc.), and the identification information of the recorded unqualified physical areas. The test report can be in the form of a text document, or it can be integrated with charts, partition maps, and other visual displays of the results. The test report can also include information such as the address of the qualified physical area. The test report generated in this way can comprehensively record the process and result information of the next read and write test operation, which is convenient for the analysis and processing of subsequent processes. The test system only needs to be able to automatically generate a test report with all the required information.

[0065] The following describes the test system in the embodiment of the present invention from the perspective of hardware processing. Figure 3 , is a schematic diagram of a physical device structure of a test system in an embodiment of the present application.

[0066] It should be noted that Figure 3 The structure of the test system shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present invention.

[0067] like Figure 3As shown, the test system includes a central processing unit (CPU) 301, which can perform various appropriate actions and processes according to the program stored in the read-only memory (ROM) 302 or the program loaded from the storage part 308 to the random access memory (RAM) 303, such as executing the method described in the above embodiment. In RAM 303, various programs and data required for system operation are also stored. CPU 301, ROM 302 and RAM 303 are connected to each other through bus 304. Input / output (I / O) interface 305 is also connected to bus 304.

[0068] The following components are connected to the I / O interface 305: an input section 306 including an audio input device, a button switch, etc.; an output section 307 including a liquid crystal display (LCD) and an audio output device, an indicator light, etc.; a storage section 308 including a hard disk, etc.; and a communication section 309 including a network interface card such as a LAN (Local Area Network) card, a modem, etc. The communication section 309 performs communication processing via a network such as the Internet. A drive 310 is also connected to the I / O interface 305 as needed. A removable medium 311, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed on the drive 310 as needed so that a computer program read therefrom is installed into the storage section 308 as needed.

[0069] In particular, according to an embodiment of the present invention, the process described above with reference to the flowchart can be implemented as a computer software program. For example, an embodiment of the present invention includes a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program includes a computer program for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network through a communication section 309, and / or installed from a removable medium 311. When the computer program is executed by a central processing unit (CPU) 301, various functions defined in the present invention are performed.

[0070] It should be noted that specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM), a flash memory, an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present invention, a computer-readable storage medium may be any tangible medium containing or storing a program that may be used by or in conjunction with an instruction execution system, apparatus, or device.

[0071] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architecture, functions and operations of the systems, methods and computer program products according to various embodiments of the present invention. Each box in the flowchart or block diagram may represent a module, a program segment, or a part of a code, and the above-mentioned module, program segment, or a part of a code contains one or more executable instructions for implementing the specified logical functions. It should also be noted that in some alternative implementations, the functions marked in the box may also occur in an order different from that marked in the accompanying drawings.

[0072] Specifically, the test system of this embodiment includes a processor and a memory. The memory stores a computer program. When the computer program is executed by the processor, the solid state drive test method provided in the above embodiment is implemented.

[0073] As another aspect, the present invention further provides a computer-readable storage medium, which may be included in the test system described in the above embodiment; or may exist independently without being assembled into the test system. The above storage medium carries one or more computer programs, and when the above one or more computer programs are executed by a processor of the test system, the test system implements the solid state drive test method provided in the above embodiment.

[0074] As described above, the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

[0075] As used in the above embodiments, the term "when..." may be interpreted to mean "if..." or "after..." or "in response to determining..." or "in response to detecting...", depending on the context. Similarly, the phrases "upon determining..." or "if (the stated condition or event) is detected" may be interpreted to mean "if determining..." or "in response to determining..." or "upon detecting (the stated condition or event)" or "in response to detecting (the stated condition or event)", depending on the context.

[0076] Those skilled in the art can understand that to implement all or part of the processes in the above-mentioned embodiments, the processes can be completed by computer programs to instruct related hardware, and the programs can be stored in computer-readable storage media. When the programs are executed, they can include the processes of the above-mentioned method embodiments. The aforementioned storage media include: ROM or random access memory RAM, magnetic disk or optical disk and other media that can store program codes.

Claims

1. A solid state hard disk testing method, characterized in that: Applied to a test system, the method comprises: Divide the storage space of the solid state drive to be tested into multiple physical areas; Determine the number of read and write tests of the solid state drive to be tested within a preset time at a preset temperature; Performing read and write test operations on the multiple physical areas in sequence within the preset time length to obtain read and write error rates corresponding to the multiple physical areas respectively, the number of read and write times of the read and write test operations being the number of read and write tests; If the read and write error rates corresponding to the physical areas exceeding the preset number are higher than the preset error rate threshold, it is determined that the solid state drive to be tested is unqualified; If the read and write error rates corresponding to the physical areas less than the preset number are lower than the preset error rate threshold, it is determined that the solid state hard disk to be tested is qualified.

2. The method according to claim 1, characterized in that The step of dividing the storage space of the solid state drive to be tested into a plurality of physical areas specifically includes: Determining the minimum specification of each of the physical areas according to the minimum write unit of the solid state drive to be tested; The number of the physical areas is determined according to the storage space of the solid state drive to be tested.

3. The method according to claim 1, characterized in that The determining of the number of read and write tests of the solid state drive to be tested within a preset time at a preset temperature specifically includes: Determine, based on a preset model, a mean time between failures of the solid state drive to be tested at the preset temperature; The average number of failures is determined according to the preset duration and the average failure interval, and the average number of failures is used as the number of read and write tests.

4. The method according to claim 1, characterized in that: The performing read and write test operations on the multiple physical areas in sequence within the preset time length to obtain the read and write error rates corresponding to the multiple physical areas respectively specifically includes: Performing a read and write test operation on the target physical area within a preset time period, and recording the number of read and write operations on the target physical area; Determine the number of read and write errors that occur in the target physical area during the read and write test operation; Determining a read and write error rate of the target physical area according to the number of read and write operations and the number of read and write errors; When the number of read and write operations reaches the number of read and write tests, the test ends.

5. The method according to claim 1, characterized in that After the step of determining the number of read and write tests of the solid state hard disk to be tested within a preset time at a preset temperature, the method further includes: Monitor real-time temperature in the test environment; When the real-time temperature is higher or lower than the preset temperature, a control instruction is sent to the temperature control device, so that after receiving the control instruction, the temperature control device adjusts the temperature in the test environment to maintain the real-time temperature in the test environment at the preset temperature.

6. The method according to claim 1, characterized in that Before the step of dividing the storage space of the solid state drive to be tested into a plurality of physical areas, the method further includes: Continuously writing preset test data to the solid state drive to be tested until the writing speed of the solid state drive to be tested is within a preset speed threshold range; Performing a data erasing operation on the solid state hard disk to be tested, resetting all storage units on the solid state hard disk to be tested to the factory initial state.

7. The method according to claim 1, characterized in that After the step of determining that the solid-state hard disk to be tested is unqualified if the read / write error rate corresponding to the physical areas exceeding the preset number is higher than the preset error rate threshold, or determining that the solid-state hard disk to be tested is qualified if the read / write error rate corresponding to the physical areas less than the preset number is lower than the preset error rate threshold, the method further includes: Using the address information corresponding to the physical area whose read / write error rate exceeds the preset error rate threshold as identification information of the unqualified physical area; The execution time of the read and write test operations, the environmental parameters, the device information of the solid state hard disk to be tested, and the identification information of the unqualified physical area are packaged into a test report.

8. A testing system, characterized in that: The test system comprises: one or more processors and a memory; the memory is coupled to the one or more processors, the memory is used to store computer program code, the computer program code comprises computer instructions, and the one or more processors call the computer instructions so that the test system executes the method as described in any one of claims 1-7.

9. A computer-readable storage medium comprising instructions, characterized in that: When the instructions are executed on a test system, the test system is caused to execute the method according to any one of claims 1 to 7.

10. A computer program product, characterized in that When the computer program product is run on a test system, the test system is caused to execute the method according to any one of claims 1 to 7.

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