Electrical performance optimization method and system for stable high-density integrated inductor anode module

Abstract

The present invention relates to the technical field of electrical performance optimization, and discloses an electrical performance optimization method and system for a stable high-density integrated inductor electric module, including: calculating the coil resistance of an integrated inductor under coil parameters, calculating the core resistance of an integrated inductor under core parameters; calculating the quality factor of the integrated inductor in the resistance energy consumption, analyzing the current density distribution and magnetic field intensity distribution of the integrated inductor under the coil resistance and the core resistance, determining the initial electrical performance of the integrated inductor, and determining the parameter optimization trend of the coil parameters and the core parameters; constructing a test circuit structure of the parameter-optimized inductor, and identifying the temperature distribution and magnetic field distribution of the parameter-optimized inductor in the test circuit structure respectively; analyzing the resistance electrical performance of the parameter-optimized inductor under the test circuit structure, temperature distribution and magnetic field distribution, distinguishing negative factors from positive factors; and generating the circuit optimization direction in the test circuit structure. The present invention can analyze the influence of the circuit structure on the electrical performance of the inductor.

Description

Technical Field

[0001] The invention relates to an electrical performance optimization method and system for a stable high-density integrated inductor module, belonging to the technical field of electrical performance optimization. Background Art

[0002] With the development of communication technology, such as 5G and even future 6G communications, as well as the increase in high-frequency application scenarios such as radio frequency circuits, strict requirements are placed on the high-frequency performance of inductors and resistors. In high-frequency environments, factors such as the parasitic capacitance of the inductor and the parasitic inductance of the resistor will have a significant impact on the circuit performance. Therefore, it is necessary to optimize the electrical properties of the inductor and resistor to reduce losses and improve signal transmission quality. The inductor is composed of a winding coil and a magnetic core, and the inductor resistance refers to the coil resistance and the core resistance generated when current flows through the inductor. Changes in the coil resistance and the core resistance will affect the electrical properties of the inductor. Therefore, it is necessary to optimize the electrical performance of the inductor when the resistance changes.

[0003] At present, the solution for optimizing the electrical performance of inductors by using resistors is to adjust the parameters of the winding coil and the core parameters of the inductor, thereby optimizing the coil resistance and the core resistance in the inductor, and finally optimizing the electrical performance of the inductor. The parameters of the winding coil include the number of turns and diameter of the winding coil, and the core parameters include the magnetic permeability and height of the core. However, when the inductor after parameter optimization is put into actual scenarios, the problem of insufficient electrical performance still occurs. This is because in different circuit structure scenarios, there is compatibility between the inductor and the surrounding electronic devices, and the compatibility between different inductors and surrounding electronic devices will also affect whether the electrical performance of the inductor is good.

[0004] Therefore, the prior art is insufficient in analyzing the influence of the circuit structure on the electrical performance of the inductor. Summary of the invention

[0005] The present invention provides a method and system for optimizing the electrical performance of a stable high-density integrated inductor anode module, the main purpose of which is to analyze the influence of the circuit structure on the electrical performance of the inductor.

[0006] To achieve the above object, the present invention provides a method for optimizing the electrical performance of a stable high-density integrated inductor module, comprising:

[0007] Setting constant parameters of the integrated inductor, obtaining coil parameters and magnetic core parameters of the integrated inductor under the constant parameters, calculating the coil resistance of the integrated inductor under the coil parameters, calculating the magnetic core resistance of the integrated inductor under the magnetic core parameters, and analyzing the resistance energy consumption of the integrated inductor by using the coil resistance and the magnetic core resistance;

[0008] Calculating the quality factor of the one-piece molded inductor under the resistance energy consumption, analyzing the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the magnetic core resistance respectively, determining the initial electrical properties of the one-piece molded inductor by using the current density distribution and the magnetic field strength distribution, and determining the parameter optimization trend of the coil parameters and the magnetic core parameters based on the initial electrical properties;

[0009] Obtaining a parameter-optimized inductor under the parameter optimization trend, selecting a test scenario for the parameter-optimized inductor, constructing a test circuit structure for the parameter-optimized inductor in the test scenario, extracting an input current of the test circuit structure from the test scenario, and identifying a temperature distribution and a magnetic field distribution of the parameter-optimized inductor in the test circuit structure according to the input current;

[0010] Analyzing the resistance electrical properties of the parameter-optimized inductor under the test circuit structure, the temperature distribution, and the magnetic field distribution, and distinguishing negative factors from positive factors in the test circuit structure, the temperature distribution, and the magnetic field distribution based on the resistance electrical properties;

[0011] According to the negative factors and the positive factors, a circuit optimization direction in the test circuit structure is generated, and the electrical performance of the one-piece molded inductor is optimized using the parameter optimization trend and the circuit optimization direction to obtain an electrical performance optimization result of the one-piece molded inductor.

[0012] Optionally, calculating the coil resistance of the integrally formed inductor under the coil parameters includes:

[0013] Obtaining constant parameters corresponding to the coil parameters;

[0014] According to the AC signal and the inductance value in the invariant parameters, the coil resistance of the one-piece molded inductor is calculated using the following formula:

[0015] ,

[0016] in, represents the coil resistance, Indicates the frequency of the AC signal. Indicates the inductance value of the integrally molded inductor.

[0017] Optionally, calculating the core resistance of the one-piece molded inductor under the core parameters includes:

[0018] Querying the diameter and height of the magnetic core of the one-piece molded inductor from the magnetic core parameters;

[0019] According to the diameter and the height, the core resistance of the one-piece molded inductor under the core parameters is calculated using the following formula:

[0020] ,

[0021] in, represents the core resistance, Indicates the relative magnetic permeability of the magnetic core of the integrally molded inductor. represents the vacuum permeability, Represents the diameter of the bottom circle of the cylinder formed by the magnetic core, Indicates the height of the cylinder formed by the magnetic core.

[0022] Optionally, the respectively analyzing the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the core resistance includes:

[0023] The magnetic field strength model of the one-piece molded inductor is established using the following formula:

[0024] ,

[0025] in, represents the magnetic field strength model, represents the magnetic field strength, represents the vacuum permeability, Represents the diameter of the bottom circle of the cylinder formed by the magnetic core, It represents the distance between the point on the central axis of the cylinder formed by the magnetic core and the center of the cylinder. Indicates the number of turns of the coil of the integrated inductor. represents the current through the constant parameter, Indicates the magnetic permeability of the core of the integrally molded inductor. Indicates the magnetic induction intensity of the one-piece molded inductor;

[0026] Based on the magnetic field strength model, a preset finite element method is used to analyze the magnetic field strength distribution of the one-piece molded inductor;

[0027] Constructing a current density model of the one-piece molded inductor using the magnetic field strength model;

[0028] Based on the current density model, a preset finite element method is used to analyze the current density distribution of the one-piece molded inductor.

[0029] Optionally, determining the parameter optimization trend of the coil parameters and the magnetic core parameters based on the initial electrical performance includes:

[0030] Arrange parameters of the same coils and the same magnetic cores belonging to different integrally formed inductors to obtain a sequence of the same parameters;

[0031] Based on the same parameter sequence, the initial electrical properties of different integrally formed inductors are arranged to obtain an electrical property sequence;

[0032] Performing correlation analysis on the same parameter sequence and the electrical performance sequence to obtain a parameter-electrical performance correlation between the same parameter sequence and the electrical performance sequence;

[0033] When the parameter-electrical performance correlation is greater than a preset correlation threshold, identifying a parameter-electrical performance relationship between the same parameter sequence and the electrical performance sequence;

[0034] The parameter-electrical performance relationship is used to determine the parameter optimization trend of the coil parameters and the magnetic core parameters.

[0035] Optionally, constructing a test circuit structure of the parameter-optimized inductor in the test scenario includes:

[0036] Obtaining an electronic device that matches the parameter-optimized inductor in the test scenario;

[0037] Based on the electronic device, the initial circuit structure of the parameter-optimized inductor is constructed using the following set:

[0038] ,

[0039] in, represents the initial circuit structure, represents the parameter optimized inductor, Indicates the input terminal of the parameter optimized inductor The inductor is connected in series with the parameter optimization No. Electronic devices, Indicates the output end of the parameter optimized inductor The inductor is connected in series with the parameter optimization No. Electronic devices, Indicates the upper end of the parameter optimized inductor Connect in parallel with the parameter optimized inductor No. Electronic devices, Indicates the lower end of the parameter optimized inductor Connect in parallel with the parameter optimized inductor No. Electronic devices, , A collection of serial numbers representing electronic devices;

[0040] Collecting input current in the test scenario; analyzing current flowing through the electronic components and the parameter-optimized inductor in the initial circuit structure under the input current;

[0041] Determining whether the flowing current exceeds the current upper limit of the electronic device and the parameter optimized inductor;

[0042] When the flowing current does not exceed the current upper limit of the electronic device and the parameter-optimized inductor, the initial circuit structure is used as a test circuit structure of the parameter-optimized inductor.

[0043] Optionally, the step of respectively identifying the temperature distribution and the magnetic field distribution of the parameter-optimized inductor in the test circuit structure according to the input current includes:

[0044] Obtaining the initial resistance and the termination resistance of the parameter-optimized inductor in the test circuit structure under the input current;

[0045] Based on the initial resistance and the termination resistance, the temperature model of the parameter-optimized inductor in the test circuit structure is constructed using the following formula:

[0046] ,

[0047] in, represents the temperature model, represents the coil resistance in the initial resistance, represents the core resistance in the initial resistance, represents the coil resistance in the terminating resistor, represents the core resistance in the termination resistor, It represents the average value of the core temperature coefficient and the coil temperature coefficient of the parameter-optimized inductor. represents the initial temperature, Indicates the termination temperature;

[0048] Based on the temperature model, using a preset finite element method to analyze the temperature distribution of the one-piece molded inductor;

[0049] According to the input current, the magnetic field distribution of the parameter-optimized inductor in the test circuit structure is identified.

[0050] Optionally, distinguishing negative factors from positive factors in the test circuit structure, the temperature distribution, and the magnetic field distribution based on the electrical properties of the resistor includes:

[0051] Setting an electrical performance threshold of the electrical performance of the resistor;

[0052] Querying a first electrical property of the resistor that is lower than the electrical property threshold;

[0053] Querying a second electrical property of the resistor that is not lower than the electrical property threshold;

[0054] Taking the test circuit structure, temperature distribution and magnetic field distribution corresponding to the first electrical property as negative factors;

[0055] The test circuit structure, temperature distribution and magnetic field distribution corresponding to the second electrical performance are taken as positive factors.

[0056] Optionally, generating a circuit optimization direction in the test circuit structure according to the negative factors and the positive factors includes:

[0057] Identify positive temperature distribution and negative temperature distribution in temperature distribution;

[0058] Identify positive magnetic field distribution and negative magnetic field distribution in magnetic field distribution;

[0059] Selecting a positive circuit structure from the positive factors by using the positive temperature distribution and the positive magnetic field distribution;

[0060] Selecting a negative circuit structure from the negative factors using the negative temperature distribution and the negative magnetic field distribution;

[0061] generating a first sequence of relative positions between each electronic device in the front side circuit structure;

[0062] generating a second sequence of relative positions between each electronic device in the negative circuit structure;

[0063] The first correlation position sequence and the second correlation position sequence are used to determine a circuit optimization direction in the test circuit structure.

[0064] In order to solve the above problems, the present invention also provides an electrical performance optimization system for a stable high-density integrated inductor module, the system comprising:

[0065] an energy consumption analysis module, used to set the constant parameters of the integrated inductor, obtain the coil parameters and the magnetic core parameters of the integrated inductor under the constant parameters, calculate the coil resistance of the integrated inductor under the coil parameters, calculate the magnetic core resistance of the integrated inductor under the magnetic core parameters, and analyze the resistance energy consumption of the integrated inductor by using the coil resistance and the magnetic core resistance;

[0066] a trend determination module, used to calculate the quality factor of the one-piece molded inductor under the resistance energy consumption, analyze the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the magnetic core resistance respectively, determine the initial electrical properties of the one-piece molded inductor by using the current density distribution and the magnetic field strength distribution, and determine the parameter optimization trend of the coil parameters and the magnetic core parameters based on the initial electrical properties;

[0067] a distribution identification module, used for obtaining a parameter-optimized inductor under the parameter optimization trend, selecting a test scenario for the parameter-optimized inductor, constructing a test circuit structure for the parameter-optimized inductor in the test scenario, extracting an input current of the test circuit structure from the test scenario, and identifying a temperature distribution and a magnetic field distribution of the parameter-optimized inductor in the test circuit structure according to the input current;

[0068] A factor distinguishing module, used for analyzing the resistance electrical properties of the parameter-optimized inductor under the test circuit structure, the temperature distribution and the magnetic field distribution, and distinguishing negative factors and positive factors in the test circuit structure, the temperature distribution and the magnetic field distribution based on the resistance electrical properties;

[0069] The electrical performance optimization module is used to generate a circuit optimization direction in the test circuit structure according to the negative factors and the positive factors, and optimize the electrical performance of the one-piece molded inductor by using the parameter optimization trend and the circuit optimization direction to obtain the electrical performance optimization result of the one-piece molded inductor.

[0070] Compared with the problems described in the background technology, the embodiment of the present invention calculates the coil resistance of the one-piece molded inductor under the coil parameters to analyze the coil impedance of the inductor under the input current size. Furthermore, the embodiment of the present invention respectively analyzes the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the core resistance to determine that the electrical performance of the inductor is poor when the magnetic field distribution or the current density distribution in the inductor is uneven. Furthermore, the embodiment of the present invention determines the parameter optimization trend of the coil parameters and the core parameters based on the initial electrical performance to optimize the parameters of the inductor by utilizing the initial electrical performance. Furthermore, the embodiment of the present invention constructs a test circuit structure of the parameter-optimized inductor in the test scenario to construct samples of different circuit structures of different electronic devices, so as to analyze these circuit structure samples one by one in the subsequent analysis. The electrical properties of the inductor are finally determined to determine whether the electrical properties of the inductor are still good under the influence of other electronic devices. Further, the embodiment of the present invention identifies the temperature distribution and magnetic field distribution of the parameter-optimized inductor in the test circuit structure according to the input current, so as to detect the changes in temperature and magnetic field in the circuit, so as to subsequently analyze the changes in the electrical properties of the inductor under the influence of different temperature and magnetic field environments. Further, the embodiment of the present invention distinguishes the negative factors and positive factors in the test circuit structure, the temperature distribution and the magnetic field distribution based on the electrical properties of the resistor, so as to select the parameter-optimized inductor with good performance. The embodiment of the present invention generates the circuit optimization direction in the test circuit structure according to the negative factors and the positive factors, so as to optimize the circuit structure where the inductor is located by using the negative factors and the positive factors, thereby optimizing the ability of the inductor to perform its electrical properties in the circuit scenario. Therefore, the electrical performance optimization method of the stable high-density integrated inductor electric positive module proposed in the present invention can analyze the influence of the circuit structure on the electrical properties of the inductor. BRIEF DESCRIPTION OF THE DRAWINGS

[0071] Figure 1 A schematic diagram of a flow chart of a method for optimizing the electrical performance of a stable high-density integrated inductor module according to an embodiment of the present invention;

[0072] Figure 2 A schematic diagram of a module for realizing an electrical performance optimization method of the stable high-density integrated inductor module provided by an embodiment of the present invention.

[0073] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings in conjunction with the embodiments. DETAILED DESCRIPTION

[0074] It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not used to limit the present invention.

[0075] The embodiment of the present application provides a method for optimizing the electrical performance of a stable high-density integrated inductor electric module. The execution subject of the method for optimizing the electrical performance of the stable high-density integrated inductor electric module includes but is not limited to at least one of the electronic devices such as a server and a terminal that can be configured to execute the method provided by the embodiment of the present application. In other words, the method for optimizing the electrical performance of the stable high-density integrated inductor electric module can be executed by software or hardware installed in a terminal device or a server device. The server includes but is not limited to: a single server, a server cluster, a cloud server or a cloud server cluster, etc.

[0076] Embodiment 1:

[0077] Reference Figure 1 FIG. 1 is a flow chart of a method for optimizing the electrical performance of a stable high-density integrated inductor module according to an embodiment of the present invention. In this embodiment, the method for optimizing the electrical performance of a stable high-density integrated inductor module includes:

[0078] S1. Set constant parameters of the integrated molded inductor, obtain coil parameters and core parameters of the integrated molded inductor under the constant parameters, calculate the coil resistance of the integrated molded inductor under the coil parameters, calculate the core resistance of the integrated molded inductor under the core parameters, and use the coil resistance and the core resistance to analyze the resistance energy consumption of the integrated molded inductor.

[0079] In an embodiment of the present invention, the one-piece molded inductor refers to an electronic component, which is composed of metal powder, electrodes and coils. The invariant parameters refer to parameters with fixed values ​​other than dynamically changing coil parameters and magnetic core parameters, such as the current value and the inductance of the selected inductor sample.

[0080] Furthermore, the coil parameters are parameters of the coil specifications, such as the number of coil turns and the coil diameter, wherein the coil diameter refers to the diameter of the bottom circle of the cylindrical shape formed when the coil is wrapped around the magnetic core, and the core parameters are parameters of the specifications of the magnetic core, such as the magnetic permeability of the magnetic core and the height of the magnetic core. It should be noted that the coil parameters and core parameters under constant parameters refer to the constant parameters that remain unchanged, while the coil parameters and core parameters will change, that is, coil parameters and core parameters of various different sizes.

[0081] Furthermore, the embodiment of the present invention calculates the coil resistance of the one-piece molded inductor under the coil parameters to analyze the coil impedance of the inductor under the input current.

[0082] In one embodiment of the present invention, the calculating the coil resistance of the integrally formed inductor under the coil parameters includes: obtaining a constant parameter corresponding to the coil parameter; and calculating the coil resistance of the integrally formed inductor using the following formula according to the alternating current signal and the inductance value in the constant parameter:

[0083] ,

[0084] in, represents the coil resistance, Indicates the frequency of the AC signal. Indicates the inductance value of the integrally molded inductor.

[0085] In one embodiment of the present invention, the calculating the core resistance of the integrally molded inductor under the core parameters includes: querying the diameter and height of the core of the integrally molded inductor from the core parameters; and calculating the core resistance of the integrally molded inductor under the core parameters using the following formula according to the diameter and the height:

[0086] ,

[0087] in, represents the core resistance, Indicates the relative magnetic permeability of the magnetic core of the integrally molded inductor. represents the vacuum permeability, Represents the diameter of the bottom circle of the cylinder formed by the magnetic core, Indicates the height of the cylinder formed by the magnetic core.

[0088] Optionally, the process of analyzing the resistance energy consumption of the one-piece molded inductor by using the coil resistance and the core resistance refers to the process of calculating the power loss flowing through the resistance by using the resistance size.

[0089] S2. Calculate the quality factor of the one-piece molded inductor under the resistance energy consumption, analyze the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the core resistance respectively, determine the initial electrical properties of the one-piece molded inductor using the current density distribution and the magnetic field strength distribution, and determine the parameter optimization trend of the coil parameters and the core parameters based on the initial electrical properties.

[0090] Optionally, the process of calculating the quality factor of the one-piece molded inductor under the resistance energy consumption refers to the process of calculating the ratio between the energy storage of the inductor and the resistance energy consumption.

[0091] Furthermore, the embodiment of the present invention analyzes the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the core resistance respectively, so as to determine that the electrical performance of the inductor is poor when the magnetic field distribution or the current density distribution in the inductor is uneven.

[0092] In one embodiment of the present invention, respectively analyzing the current density distribution and the magnetic field strength distribution of the integrally molded inductor under the coil resistance and the magnetic core resistance includes: establishing a magnetic field strength model of the integrally molded inductor using the following formula:

[0093] ,

[0094] in, represents the magnetic field strength model, represents the magnetic field strength, represents the vacuum permeability, Represents the diameter of the bottom circle of the cylinder formed by the magnetic core, It represents the distance between the point on the central axis of the cylinder formed by the magnetic core and the center of the cylinder. Indicates the number of turns of the coil of the integrated inductor. represents the current through the constant parameter, Indicates the core permeability of the integrally molded inductor. Indicates the magnetic induction intensity of the one-piece molded inductor;

[0095] Based on the magnetic field strength model, the magnetic field strength distribution of the one-piece molded inductor is analyzed using a preset finite element method; the current density model of the one-piece molded inductor is constructed using the magnetic field strength model; based on the current density model, the current density distribution of the one-piece molded inductor is analyzed using a preset finite element method.

[0096] Among them, the finite element method refers to a method of simulating the magnetic field and the current density of the magnetic field intensity model and the current density model through finite element software. It should be noted that according to the displacement current term in the Maxwell equations, the relationship between the displacement current density and the magnetic field intensity can be obtained, that is, the current density is determined according to the magnitude of the magnetic field intensity in the magnetic field intensity model.

[0097] Optionally, the process of determining the initial electrical properties of the one-piece molded inductor using the current density distribution and the magnetic field intensity distribution refers to the process of calculating the distribution uniformity of the current density distribution and the magnetic field intensity distribution, that is, calculating the uniformity of the current distribution and the uniformity of the magnetic field intensity distribution at different coordinate points; and calculating the mean of the uniformity of the current distribution and the uniformity of the magnetic field intensity distribution to obtain the initial electrical properties. The algorithm for calculating the distribution uniformity can be the nearest neighbor distance method.

[0098] Furthermore, the embodiment of the present invention determines the parameter optimization trend of the coil parameters and the magnetic core parameters based on the initial electrical performance, so as to optimize the parameters of the inductor by utilizing the initial electrical performance.

[0099] In one embodiment of the present invention, the method of determining the parameter optimization trend of the coil parameters and the magnetic core parameters based on the initial electrical properties includes: performing parameter arrangement on the same coil parameters and the same magnetic core parameters belonging to different integrally molded inductors to obtain an identical parameter sequence; performing electrical performance arrangement on the initial electrical properties belonging to different integrally molded inductors based on the identical parameter sequence to obtain an electrical performance sequence; performing correlation analysis on the identical parameter sequence and the electrical performance sequence to obtain a parameter-electrical performance correlation between the identical parameter sequence and the electrical performance sequence; identifying a parameter-electrical performance relationship between the identical parameter sequence and the electrical performance sequence when the parameter-electrical performance correlation is greater than a preset correlation threshold; and determining the parameter optimization trend of the coil parameters and the magnetic core parameters using the parameter-electrical performance relationship.

[0100] Among them, the same coil parameters refer to coil parameters of the same type, such as the number of coil turns of different integrated inductors. The number of coil turns (9, 6, 3, 10, 12) of the integrated inductors numbered 1, 2, 3, 4, and 5 are sorted to obtain 3, 6, 9, 10, and 12, that is, the same parameter sequence, and the initial electrical properties of 1, 2, 3, 4, and 5 are a, b, c, d, and e, respectively, and the corresponding electrical performance sequence is c, b, a, d, and e. The parameter-electrical performance relationship includes a positive correlation and a negative correlation between the same parameter sequence and the electrical performance sequence.

[0101] Optionally, the process of performing correlation analysis on the same parameter sequence and the electrical performance sequence can be achieved by a grey correlation analysis method. The correlation threshold is used to screen correlations with larger values. The setting standard needs to be combined with the needs of data samples in actual scenarios. For example, if the total sample size is 10 and the required sample size is 3, then the maximum correlation among the remaining 7 samples except the largest three in the total sample size of 10 is used as the correlation threshold. Furthermore, the process of determining the parameter optimization trend of the coil parameters and the core parameters using the parameter-electrical performance relationship is, for example: under the positive correlation relationship that as the electrical performance increases, the coil parameters also increase, and the gradual increase of the coil parameters is used as the parameter optimization trend, that is, the parameter optimization trend has two directions of increase and decrease.

[0102] S3. Obtain a parameter-optimized inductor under the parameter optimization trend, select a test scenario for the parameter-optimized inductor, construct a test circuit structure for the parameter-optimized inductor in the test scenario, extract an input current of the test circuit structure from the test scenario, and identify the temperature distribution and magnetic field distribution of the parameter-optimized inductor in the test circuit structure according to the input current.

[0103] In an embodiment of the present invention, the parameter-optimized inductor refers to a group of inductors with good initial electrical performance selected after parameter optimization, and can also be selected from a plurality of one-piece molded inductors with different parameters. The test scenario refers to the user's demand for electronic components that should be included in the current and circuit structure, such as an input current of 1A and a circuit scenario that only includes inductors, capacitors and resistors.

[0104] Furthermore, the embodiment of the present invention constructs a test circuit structure of the parameter-optimized inductor in the test scenario to construct samples of different circuit structures of different electronic devices, so as to analyze the electrical performance of these circuit structure samples one by one in the subsequent process, and finally determine whether the electrical performance of the inductor is still good under the influence of other electronic devices.

[0105] In one embodiment of the present invention, constructing the test circuit structure of the parameter-optimized inductor in the test scenario includes: obtaining an electronic device that matches the parameter-optimized inductor in the test scenario; and constructing the initial circuit structure of the parameter-optimized inductor based on the electronic device using the following set:

[0106] ,

[0107] in, represents the initial circuit structure, represents the parameter optimized inductor, Indicates the input terminal of the parameter optimized inductor The inductor is connected in series with the parameter optimization No. Electronic devices, Indicates the output end of the parameter optimized inductor The inductor is connected in series with the parameter optimization No. Electronic devices, Indicates the upper end of the parameter optimized inductor Connect in parallel with the parameter optimized inductor No. Electronic devices, Indicates the lower end of the parameter optimized inductor Connect in parallel with the parameter optimized inductor No. Electronic devices, , A collection of serial numbers representing electronic devices;

[0108] Collect the input current in the test scenario; analyze the current flowing through the electronic device and the parameter-optimized inductor in the initial circuit structure under the input current; determine whether the current flows through the electronic device and the parameter-optimized inductor and whether the current flows through the electronic device and the parameter-optimized inductor exceeds the upper current limit of the electronic device and the parameter-optimized inductor; when the current flows through the electronic device and the parameter-optimized inductor does not exceed the upper current limit of the electronic device and the parameter-optimized inductor, use the initial circuit structure as the test circuit structure of the parameter-optimized inductor.

[0109] Among them, the current flowing through refers to the current flowing through the electronic device and the parameter-optimized inductor. For example, when the electronic device is a resistor, and the resistor and the inductor are connected in parallel, the total input current will flow through the resistor and the inductor with different currents when passing through the parallel circuit of the resistor and the inductor, depending on the size of the resistor and the resistance value of the inductor. The current upper limit refers to the maximum current that the electronic device and the parameter-optimized inductor can withstand, including the current upper limit of the electronic device and the current upper limit of the inductor.

[0110] Furthermore, the embodiment of the present invention identifies the temperature distribution and magnetic field distribution of the parameter-optimized inductor in the test circuit structure according to the input current, so as to detect the changes in temperature and magnetic field in the circuit, thereby subsequently analyzing the changes in the electrical properties of the inductor under the influence of different temperature and magnetic field environments.

[0111] In one embodiment of the present invention, the temperature distribution and magnetic field distribution of the parameter-optimized inductor in the test circuit structure are respectively identified according to the input current, including: obtaining the initial resistance and the termination resistance of the parameter-optimized inductor in the test circuit structure under the input current; based on the initial resistance and the termination resistance, constructing a temperature model of the parameter-optimized inductor in the test circuit structure using the following formula:

[0112] ,

[0113] in, represents the temperature model, represents the coil resistance in the initial resistance, represents the core resistance in the initial resistance, represents the coil resistance in the terminating resistor, represents the core resistance in the termination resistor, It represents the average value of the core temperature coefficient and the coil temperature coefficient of the parameter-optimized inductor. represents the initial temperature, Indicates the termination temperature;

[0114] Based on the temperature model, a preset finite element method is used to analyze the temperature distribution of the one-piece molded inductor; and according to the input current, a magnetic field distribution of the parameter-optimized inductor in the test circuit structure is identified.

[0115] Among them, the initial resistance and the termination resistance refer to the resistance that changes with time. As time changes, the alternating current received by the inductor will have different values, and the resistance at this time is different. Therefore, the initial resistance and the termination resistance refer to the resistance at the starting moment and the resistance at the end moment within a certain time interval. It should be noted that since the magnetic permeability of the magnetic core is the change ratio of the magnetic flux density with the change of the magnetic field strength, therefore, when the magnetic field strength changes, the magnetic core resistance will also change, and The temperature change at subsequent moments can be calculated based on the temperature value at the initial time of the test scene measured in advance.

[0116] Optionally, the principle of identifying the magnetic field distribution of the parameter-optimized inductor in the test circuit structure based on the input current is similar to the principle of analyzing the magnetic field strength distribution of the one-piece molded inductor based on the magnetic field strength model using a preset finite element method, and is not further elaborated here.

[0117] S4. Analyze the resistance electrical properties of the parameter-optimized inductor under the test circuit structure, the temperature distribution and the magnetic field distribution, and distinguish the negative factors and positive factors in the test circuit structure, the temperature distribution and the magnetic field distribution based on the resistance electrical properties.

[0118] Optionally, the process of analyzing the parameter optimization of the resistance electrical performance of the inductor under the test circuit structure, the temperature distribution and the magnetic field distribution refers to the process of calculating the uniformity of the temperature distribution and the uniformity of the magnetic field distribution.

[0119] Furthermore, the embodiment of the present invention distinguishes the negative factors and positive factors in the test circuit structure, the temperature distribution and the magnetic field distribution based on the electrical properties of the resistor, so as to select parameters with good performance to optimize the inductance.

[0120] In one embodiment of the present invention, the negative factors and positive factors in the test circuit structure, the temperature distribution and the magnetic field distribution are distinguished based on the electrical properties of the resistor, including: setting an electrical property threshold of the electrical properties of the resistor; querying the first electrical property of the resistor that is lower than the electrical property threshold; querying the second electrical property of the resistor that is not lower than the electrical property threshold; taking the test circuit structure, temperature distribution and magnetic field distribution corresponding to the first electrical property as negative factors; and taking the test circuit structure, temperature distribution and magnetic field distribution corresponding to the second electrical property as positive factors.

[0121] S5. Generate a circuit optimization direction in the test circuit structure according to the negative factors and the positive factors, optimize the electrical performance of the one-piece molded inductor by using the parameter optimization trend and the circuit optimization direction, and obtain an electrical performance optimization result of the one-piece molded inductor.

[0122] The embodiment of the present invention generates a circuit optimization direction in the test circuit structure according to the negative factors and the positive factors, so as to optimize the circuit structure where the inductor is located by utilizing the negative factors and the positive factors, thereby optimizing the ability of the inductor to exert its electrical performance in the circuit scenario.

[0123] In one embodiment of the present invention, generating the circuit optimization direction in the test circuit structure based on the negative factors and the positive factors includes: identifying the positive temperature distribution and the negative temperature distribution in the temperature distribution; identifying the positive magnetic field distribution and the negative magnetic field distribution in the magnetic field distribution; selecting the positive circuit structure in the positive factors using the positive temperature distribution and the positive magnetic field distribution; selecting the negative circuit structure in the negative factors using the negative temperature distribution and the negative magnetic field distribution; generating a first related position sequence between each electronic device in the positive circuit structure; generating a second related position sequence between each electronic device in the negative circuit structure; and determining the circuit optimization direction in the test circuit structure using the first related position sequence and the second related position sequence.

[0124] Optionally, the process of identifying the positive temperature distribution and the negative temperature distribution in the temperature distribution; the process of identifying the positive magnetic field distribution and the negative magnetic field distribution in the magnetic field distribution are both processes of dividing samples with good performance and samples with poor performance according to the required sample volume, the process of selecting the positive circuit structure in the positive factor by using the positive temperature distribution and the positive magnetic field distribution refers to selecting a circuit structure whose temperature distribution and magnetic field distribution are both positive from the positive factor, and the process of generating the first related position sequence between each electronic device in the positive circuit structure is, for example: combining the electronic devices at the input end, output end, upper end and lower end of the inductor into the first related position sequence. Sequence, for example, the first relevant position sequence is: input end A electronic device, output end B electronic device, upper end C electronic device and lower end D electronic device, the second relevant position sequence is the same as the first relevant position sequence, the process of using the first relevant position sequence and the second relevant position sequence to determine the circuit optimization direction in the test circuit structure refers to: using the first relevant position sequence to determine which relevant positions are positions with good performance, and using the second relevant position sequence to determine which positions are positions with poor performance, thereby adopting the position relationship corresponding to the first relevant position sequence and avoiding the position relationship corresponding to the second relevant position sequence to obtain the circuit optimization direction.

[0125] Compared with the problems described in the background technology, the embodiment of the present invention calculates the coil resistance of the one-piece molded inductor under the coil parameters to analyze the coil impedance of the inductor under the input current size. Furthermore, the embodiment of the present invention respectively analyzes the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the core resistance to determine that the electrical performance of the inductor is poor when the magnetic field distribution or the current density distribution in the inductor is uneven. Furthermore, the embodiment of the present invention determines the parameter optimization trend of the coil parameters and the core parameters based on the initial electrical performance to optimize the parameters of the inductor by utilizing the initial electrical performance. Furthermore, the embodiment of the present invention constructs a test circuit structure of the parameter-optimized inductor in the test scenario to construct samples of different circuit structures of different electronic devices, so as to analyze these circuit structure samples one by one in the subsequent analysis. The electrical properties of the inductor are finally determined to determine whether the electrical properties of the inductor are still good under the influence of other electronic devices. Further, the embodiment of the present invention identifies the temperature distribution and magnetic field distribution of the parameter-optimized inductor in the test circuit structure according to the input current, so as to detect the changes in temperature and magnetic field in the circuit, so as to subsequently analyze the changes in the electrical properties of the inductor under the influence of different temperature and magnetic field environments. Further, the embodiment of the present invention distinguishes the negative factors and positive factors in the test circuit structure, the temperature distribution and the magnetic field distribution based on the electrical properties of the resistor, so as to select the parameter-optimized inductor with good performance. The embodiment of the present invention generates the circuit optimization direction in the test circuit structure according to the negative factors and the positive factors, so as to optimize the circuit structure where the inductor is located by using the negative factors and the positive factors, thereby optimizing the ability of the inductor to perform its electrical properties in the circuit scenario. Therefore, the electrical performance optimization method of the stable high-density integrated inductor electric positive module proposed in the present invention can analyze the influence of the circuit structure on the electrical properties of the inductor.

[0126] Embodiment 2:

[0127] like Figure 2 , is a functional module diagram of an electrical performance optimization system of a stable high-density integrated inductor anode module of the present invention.

[0128] The electrical performance optimization system 200 of a stable high-density integrated inductor module of the present invention can be installed in an electronic device. According to the functions to be implemented, the electrical performance optimization system of the stable high-density integrated inductor module can include an energy consumption analysis module 201, a trend determination module 202, a distribution identification module 203, a factor differentiation module 204, and an electrical performance optimization module 205. The module of the present invention can also be called a unit, which refers to a series of computer program segments that can be executed by an electronic device processor and can complete fixed functions, which are stored in the memory of the electronic device.

[0129] In the embodiment of the present invention, the functions of each module / unit are as follows:

[0130] The energy consumption analysis module 201 is used to set the constant parameters of the integrated molded inductor, obtain the coil parameters and the magnetic core parameters of the integrated molded inductor under the constant parameters, calculate the coil resistance of the integrated molded inductor under the coil parameters, calculate the magnetic core resistance of the integrated molded inductor under the magnetic core parameters, and analyze the resistance energy consumption of the integrated molded inductor by using the coil resistance and the magnetic core resistance;

[0131] The trend determination module 202 is used to calculate the quality factor of the one-piece molded inductor under the resistance energy consumption, analyze the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the magnetic core resistance respectively, determine the initial electrical properties of the one-piece molded inductor by using the current density distribution and the magnetic field strength distribution, and determine the parameter optimization trend of the coil parameters and the magnetic core parameters based on the initial electrical properties;

[0132] The distribution identification module 203 is used to obtain the parameter optimized inductor under the parameter optimization trend, select the test scenario of the parameter optimized inductor, construct the test circuit structure of the parameter optimized inductor in the test scenario, extract the input current of the test circuit structure from the test scenario, and identify the temperature distribution and magnetic field distribution of the parameter optimized inductor in the test circuit structure according to the input current;

[0133] The factor distinguishing module 204 is used to analyze the resistance electrical properties of the parameter-optimized inductor under the test circuit structure, the temperature distribution and the magnetic field distribution, and distinguish the negative factors and positive factors in the test circuit structure, the temperature distribution and the magnetic field distribution based on the resistance electrical properties;

[0134] The electrical performance optimization module 205 is used to generate a circuit optimization direction in the test circuit structure according to the negative factors and the positive factors, and optimize the electrical performance of the one-piece molded inductor using the parameter optimization trend and the circuit optimization direction to obtain an electrical performance optimization result of the one-piece molded inductor.

[0135] In detail, each module in the electrical performance optimization system 200 of the stable high-density integrated inductor module in the embodiment of the present invention is used in the same manner as described above. Figure 1 The same technical means are used as the method for optimizing the electrical performance of the stable high-density integrated inductor anode module described in the specification and can produce the same technical effects, which will not be repeated here.

[0136] It is obvious to those skilled in the art that the present invention is not limited to the details of the above exemplary embodiments, and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention.

[0137] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solution of the present invention can be modified or replaced by equivalents without departing from the spirit and scope of the technical solution of the present invention.

Claims

1. A method for optimizing the electrical performance of a stable high-density integrated inductor module, characterized in that: The method comprises: Setting constant parameters of the integrated inductor, obtaining coil parameters and magnetic core parameters of the integrated inductor under the constant parameters, calculating the coil resistance of the integrated inductor under the coil parameters, calculating the magnetic core resistance of the integrated inductor under the magnetic core parameters, and analyzing the resistance energy consumption of the integrated inductor by using the coil resistance and the magnetic core resistance; Calculating the quality factor of the one-piece molded inductor under the resistance energy consumption, analyzing the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the magnetic core resistance respectively, determining the initial electrical properties of the one-piece molded inductor by using the current density distribution and the magnetic field strength distribution, and determining the parameter optimization trend of the coil parameters and the magnetic core parameters based on the initial electrical properties; Obtaining a parameter-optimized inductor under the parameter optimization trend, selecting a test scenario for the parameter-optimized inductor, constructing a test circuit structure for the parameter-optimized inductor in the test scenario, extracting an input current of the test circuit structure from the test scenario, and identifying a temperature distribution and a magnetic field distribution of the parameter-optimized inductor in the test circuit structure according to the input current; Analyzing the resistance electrical properties of the parameter-optimized inductor under the test circuit structure, the temperature distribution, and the magnetic field distribution, and distinguishing negative factors from positive factors in the test circuit structure, the temperature distribution, and the magnetic field distribution based on the resistance electrical properties; According to the negative factors and the positive factors, a circuit optimization direction in the test circuit structure is generated, and the electrical performance of the one-piece molded inductor is optimized using the parameter optimization trend and the circuit optimization direction to obtain an electrical performance optimization result of the one-piece molded inductor.

2. The method for optimizing the electrical performance of a stable high-density integrated inductor module according to claim 1, characterized in that: The calculating the coil resistance of the integrally formed inductor under the coil parameters includes: Obtaining constant parameters corresponding to the coil parameters; According to the AC signal and the inductance value in the invariant parameters, the coil resistance of the one-piece molded inductor is calculated using the following formula: ， in, represents the coil resistance, Indicates the frequency of the AC signal. Indicates the inductance value of the integrally molded inductor.

3. The method for optimizing the electrical performance of a stable high-density integrated inductor module according to claim 1, characterized in that: The calculating the core resistance of the integrally formed inductor under the core parameters includes: Querying the diameter and height of the magnetic core of the one-piece molded inductor from the magnetic core parameters; According to the diameter and the height, the core resistance of the one-piece molded inductor under the core parameters is calculated using the following formula: ， in, represents the core resistance, Indicates the relative magnetic permeability of the magnetic core of the integrally molded inductor. represents the vacuum permeability, Represents the diameter of the bottom circle of the cylinder formed by the magnetic core, Indicates the height of the cylinder formed by the magnetic core.

4. The method for optimizing the electrical performance of a stable high-density integrated inductor module according to claim 1, characterized in that: The respectively analyzing the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the magnetic core resistance includes: The magnetic field strength model of the one-piece molded inductor is established using the following formula: ， in, represents the magnetic field strength model, represents the magnetic field strength, represents the vacuum permeability, Represents the diameter of the bottom circle of the cylinder formed by the magnetic core, It represents the distance between the point on the central axis of the cylinder formed by the magnetic core and the center of the cylinder. Indicates the number of turns of the coil of the integrated inductor. represents the current through the constant parameter, Indicates the core permeability of the integrally molded inductor. Indicates the magnetic induction intensity of the one-piece molded inductor; Based on the magnetic field strength model, a preset finite element method is used to analyze the magnetic field strength distribution of the one-piece molded inductor; Constructing a current density model of the one-piece molded inductor using the magnetic field strength model; Based on the current density model, a preset finite element method is used to analyze the current density distribution of the one-piece molded inductor.

5. The method for optimizing the electrical performance of a stable high-density integrated inductor module according to claim 1, characterized in that: The step of determining the parameter optimization trend of the coil parameters and the magnetic core parameters based on the initial electrical performance includes: Arrange parameters of the same coils and the same magnetic cores belonging to different integrally formed inductors to obtain a sequence of the same parameters; Based on the same parameter sequence, the initial electrical properties of different integrally formed inductors are arranged to obtain an electrical property sequence; Performing correlation analysis on the same parameter sequence and the electrical performance sequence to obtain a parameter-electrical performance correlation between the same parameter sequence and the electrical performance sequence; When the parameter-electrical performance correlation is greater than a preset correlation threshold, identifying a parameter-electrical performance relationship between the same parameter sequence and the electrical performance sequence; The parameter-electrical performance relationship is used to determine the parameter optimization trend of the coil parameters and the magnetic core parameters.

6. The method for optimizing the electrical performance of a stable high-density integrated inductor module according to claim 1, characterized in that: The test circuit structure for constructing the parameter-optimized inductor in the test scenario includes: Obtaining an electronic device that matches the parameter-optimized inductor in the test scenario; Based on the electronic device, the initial circuit structure of the parameter-optimized inductor is constructed using the following set: ， in, represents the initial circuit structure, represents the parameter optimized inductor, Indicates the input terminal of the parameter optimized inductor The inductor is connected in series with the parameter optimization No. Electronic devices, Indicates the output end of the parameter optimized inductor The inductor is connected in series with the parameter optimization No. Electronic devices, Indicates the upper end of the parameter optimized inductor Connect in parallel with the parameter optimized inductor No. Electronic devices, Indicates the lower end of the parameter optimized inductor Connect in parallel with the parameter optimized inductor No. Electronic devices, , A collection of serial numbers representing electronic devices; Collecting input current in the test scenario; analyzing current flowing through the electronic components and the parameter-optimized inductor in the initial circuit structure under the input current; Determining whether the flowing current exceeds the current upper limit of the electronic device and the parameter optimized inductor; When the flowing current does not exceed the current upper limit of the electronic device and the parameter-optimized inductor, the initial circuit structure is used as a test circuit structure of the parameter-optimized inductor.

7. The method for optimizing the electrical performance of a stable high-density integrated inductor module according to claim 1, characterized in that: The step of respectively identifying the temperature distribution and the magnetic field distribution of the parameter-optimized inductor in the test circuit structure according to the input current comprises: Obtaining the initial resistance and the termination resistance of the parameter-optimized inductor in the test circuit structure under the input current; Based on the initial resistance and the termination resistance, the temperature model of the parameter-optimized inductor in the test circuit structure is constructed using the following formula: ， in, represents the temperature model, represents the coil resistance in the initial resistance, represents the core resistance in the initial resistance, represents the coil resistance in the terminating resistor, represents the core resistance in the termination resistor, It represents the average value of the core temperature coefficient and the coil temperature coefficient of the parameter-optimized inductor. represents the initial temperature, Indicates the termination temperature; Based on the temperature model, using a preset finite element method to analyze the temperature distribution of the one-piece molded inductor; According to the input current, the magnetic field distribution of the parameter-optimized inductor in the test circuit structure is identified.

8. The method for optimizing the electrical performance of a stable high-density integrated inductor module according to claim 1, characterized in that: The method of distinguishing negative factors from positive factors in the test circuit structure, the temperature distribution, and the magnetic field distribution based on the resistance electrical properties includes: Setting an electrical performance threshold of the electrical performance of the resistor; Querying a first electrical property of the resistor that is lower than the electrical property threshold; Querying a second electrical property of the resistor that is not lower than the electrical property threshold; Taking the test circuit structure, temperature distribution and magnetic field distribution corresponding to the first electrical property as negative factors; The test circuit structure, temperature distribution and magnetic field distribution corresponding to the second electrical performance are taken as positive factors.

9. The method for optimizing the electrical performance of a stable high-density integrated inductor module according to claim 1, characterized in that: The step of generating a circuit optimization direction in the test circuit structure according to the negative factors and the positive factors includes: Identify positive temperature distribution and negative temperature distribution in temperature distribution; Identify positive magnetic field distribution and negative magnetic field distribution in magnetic field distribution; Selecting a positive circuit structure from the positive factors by using the positive temperature distribution and the positive magnetic field distribution; Selecting a negative circuit structure from the negative factors using the negative temperature distribution and the negative magnetic field distribution; generating a first sequence of relative positions between each electronic device in the front side circuit structure; generating a second sequence of relative positions between each electronic device in the negative circuit structure; The first correlation position sequence and the second correlation position sequence are used to determine a circuit optimization direction in the test circuit structure.

10. A system for optimizing the electrical performance of a stable high-density integrated inductor module, characterized in that: The system comprises: an energy consumption analysis module, used to set the constant parameters of the integrated inductor, obtain the coil parameters and the magnetic core parameters of the integrated inductor under the constant parameters, calculate the coil resistance of the integrated inductor under the coil parameters, calculate the magnetic core resistance of the integrated inductor under the magnetic core parameters, and analyze the resistance energy consumption of the integrated inductor by using the coil resistance and the magnetic core resistance; a trend determination module, used to calculate the quality factor of the one-piece molded inductor under the resistance energy consumption, analyze the current density distribution and the magnetic field strength distribution of the one-piece molded inductor under the coil resistance and the magnetic core resistance respectively, determine the initial electrical properties of the one-piece molded inductor by using the current density distribution and the magnetic field strength distribution, and determine the parameter optimization trend of the coil parameters and the magnetic core parameters based on the initial electrical properties; a distribution identification module, used for obtaining a parameter-optimized inductor under the parameter optimization trend, selecting a test scenario for the parameter-optimized inductor, constructing a test circuit structure for the parameter-optimized inductor in the test scenario, extracting an input current of the test circuit structure from the test scenario, and identifying a temperature distribution and a magnetic field distribution of the parameter-optimized inductor in the test circuit structure according to the input current; A factor distinguishing module, used for analyzing the resistance electrical properties of the parameter-optimized inductor under the test circuit structure, the temperature distribution and the magnetic field distribution, and distinguishing negative factors and positive factors in the test circuit structure, the temperature distribution and the magnetic field distribution based on the resistance electrical properties; The electrical performance optimization module is used to generate a circuit optimization direction in the test circuit structure according to the negative factors and the positive factors, and optimize the electrical performance of the one-piece molded inductor by using the parameter optimization trend and the circuit optimization direction to obtain the electrical performance optimization result of the one-piece molded inductor.

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