Delay measurement method, system and equipment of electroluminescent device and storage medium

Abstract

The invention provides a time delay measurement method, system and equipment for an electroluminescent device, and a storage medium. The method comprises the following steps: controlling a light-emitting device to irradiate a photoelectric detector with light with a preset wavelength; controlling the signal generator to generate a driving signal; generating a target oscillographic signal by the electroluminescent device to be detected under the input of the driving signal through the photoelectric detector; and determining light-emitting time delay information of the electroluminescent device to be detected based on the difference between the driving signal and the target oscillographic signal. According to the embodiment of the invention, the photoelectric detector generates the background photoelectric signal by controlling the light with a certain wavelength to irradiate the photoelectric detector, so that when the signal generator generates the driving signal to drive the electroluminescent device to be detected to emit light, the driving photoelectric signal can be superposed on the basis of the background photoelectric signal to obtain the oscillographic signal; and the light-emitting time delay information of the electroluminescent device can be accurately calculated subsequently.

Description

Technical Field

[0001] The present application belongs to the field of quantum dot technology, and in particular, relates to a time delay measurement method, system, device and storage medium for an electroluminescent device. Background Art

[0002] Quantum dots (QD) are expected to be used in the next generation of new displays due to their advantages such as adjustable wavelength, wide color gamut, and high color purity. Among them, electroluminescent quantum dots (Active Matrix Quantum dots Light-Emitting Diode, AM-QLED), also known as electroluminescent devices, have better display effects because they inherit the optical properties of quantum dots. Electroluminescent devices are powered by externally injected carriers into the light-emitting unit for radiation recombination and emission. Usually, there is an obvious delay between the signal generated by the external drive and the photoelectric signal generated by the light emission. This is due to the time difference between the carrier injection into the light-emitting unit and the recombination to emit photons. This is related to the injection barrier. The lower the delay, the easier the injection, and vice versa. As a display device in the future, quantum dots will pay more attention to the photoelectric properties at low brightness. Therefore, it is necessary to measure the delay at low brightness.

[0003] In the existing measurement system, in order to avoid the influence of the detector's own capacitance, a detector with a very low effective area is selected for measurement. However, when measuring at low brightness, especially when the electroluminescent device is near the turn-on voltage, the light generated is extremely weak, and the light signal collected by the detector is extremely weak, making it difficult to collect effective photoelectric signals for delay calculation. Summary of the invention

[0004] Based on this, it is necessary to provide a time delay measurement method, system, equipment and storage medium for an electroluminescent device in response to the above technical problems, aiming to solve the problem that the existing time delay measurement method is difficult to measure the time delay of an electroluminescent device to generate low-brightness light when the voltage is turned on.

[0005] In a first aspect, the present application provides a time delay measurement method for an electroluminescent device, comprising:

[0006] Controlling the light emitting device to illuminate the photodetector with light of a preset wavelength;

[0007] The control signal generator generates a driving signal;

[0008] Acquiring, by means of the photoelectric detector, a target oscillometric signal generated by the electroluminescent device to be tested under the input of the driving signal;

[0009] Based on the driving signal and the target oscillometric signal, light emission delay information of the electroluminescent device to be tested is determined.

[0010] As a feasible embodiment of the present application, the controlling the light emitting device to illuminate the photodetector with light of a preset wavelength includes:

[0011] Obtaining the light absorption wavelength of the electroluminescent device to be tested;

[0012] The light emitting device is controlled to illuminate the photodetector with test light having a wavelength not less than the light absorption wavelength.

[0013] As a feasible embodiment of the present application, before the step of controlling the signal generator to generate the driving signal, the method further includes:

[0014] Acquire a test oscillometric signal collected by the photodetector under the irradiation of light of the preset wavelength;

[0015] Based on the magnitude relationship between the baseline voltage corresponding to the test oscillometric signal and the preset voltage threshold, adjusting the illumination parameters of the light-emitting device of the light-emitting device; the illumination parameters include at least one of the light-emitting intensity and the illumination angle;

[0016] Controlling the light emitting device to emit light of a preset wavelength with adjusted illumination parameters to illuminate the photodetector, and acquiring an updated oscillometric signal collected by the photodetector;

[0017] The step of controlling the signal generator to generate a driving signal is performed until the magnitude relationship between the updated baseline voltage corresponding to the updated oscillometric signal and the preset voltage threshold satisfies a preset condition.

[0018] As a feasible embodiment of the present application, the control signal generator generates a driving signal, including:

[0019] Obtaining a current density, voltage, and brightness curve of the electroluminescent device to be tested;

[0020] Based on the target driving current voltage in the current density voltage brightness curve, a signal generator associated with the electroluminescent device to be tested is controlled to generate a target driving signal; a generated signal parameter of the target driving signal corresponds to the target driving current voltage; and the generated signal parameter includes at least one of a signal amplitude and a signal frequency.

[0021] As a feasible embodiment of the present application, the determining of the light emitting delay information of the electroluminescent device to be tested based on the driving signal and the target oscillometric signal includes:

[0022] Acquiring a first fluctuation time in the driving signal;

[0023] Acquiring a second fluctuation time in the target oscillometric signal;

[0024] The light emitting delay information of the electroluminescent device to be tested is calculated based on the difference between the first fluctuation time and the second fluctuation time.

[0025] As a feasible embodiment of the present application, after the step of obtaining, by the photoelectric detector, the target oscillometric signal generated by the electroluminescent device to be tested under the input of the driving signal, the method further includes:

[0026] Acquire a power-off oscillographic signal generated by the electroluminescent device to be tested when the drive signal stops inputting;

[0027] Based on the difference between the fluctuation time in the driving signal and the fluctuation time in the power-off oscillographic signal, the power-off delay information of the electroluminescent device to be tested is determined.

[0028] As a feasible embodiment of the present application, the electroluminescent device to be tested includes at least one of an anode electrode layer, a hole injection layer, a hole transport layer, a quantum dot light-emitting layer, an electron transport layer and a cathode layer.

[0029] In a second aspect, the present application provides a time delay measurement system for an electroluminescent device, comprising a signal generator, an electroluminescent device to be measured electrically connected to the signal generator, a photodetector, an oscilloscope electrically connected to the photodetector, a light-emitting device, and a control device; the signal generator, the oscilloscope, and the light-emitting device are all signal-connected to the control device;

[0030] The control device is used to control the light-emitting device to illuminate the photodetector with light of a preset wavelength; the control device is used to control the signal generator to generate a driving signal; the photodetector is used to detect the light signal generated by the electroluminescent device to be tested under the input of the driving signal, and display a target oscilloscope signal corresponding to the light signal through the oscilloscope; the control device is used to determine the light-emitting delay information of the electroluminescent device to be tested based on the driving signal and the target oscilloscope signal.

[0031] In a third aspect, the present application provides a computer device, the computer device comprising:

[0032] one or more processors;

[0033] Memory; and

[0034] One or more application programs, wherein the one or more application programs are stored in the memory and configured to be executed by the processor to implement any one of the above-mentioned methods for measuring the time delay of an electroluminescent device.

[0035] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program is loaded by a processor to execute any of the above-mentioned methods for measuring the time delay of an electroluminescent device.

[0036] The time delay measurement method of the electroluminescent device provided in the embodiment of the present application controls the light of a preset wavelength to illuminate the photodetector so that the photodetector generates a background photoelectric signal. Therefore, when the signal generator generates a driving signal to drive the electroluminescent device to be tested to emit light, the driving photoelectric signal can be further superimposed on the background photoelectric signal to obtain a more obvious oscilloscope signal, thereby facilitating the subsequent accurate calculation of the light emission delay information of the electroluminescent device to be tested, and more accurate photoelectric characteristics of the electroluminescent device to be tested can be obtained. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0038] Figure 1 A schematic flow chart of the steps of a method for measuring the time delay of an electroluminescent device provided in an embodiment of the present application;

[0039] Figure 2 A schematic diagram of a process flow for configuring the wavelength of test light based on the light absorption wavelength of the light-emitting device to be tested provided in an embodiment of the present application;

[0040] Figure 3 A schematic diagram of a process flow for adjusting test light irradiation parameters provided in an embodiment of the present application;

[0041] Figure 4 A schematic diagram of a process flow for configuring a driving signal provided in an embodiment of the present application;

[0042] Figure 5 A schematic diagram of a step flow for calculating light emitting delay information provided in an embodiment of the present application;

[0043] Figure 6 A schematic diagram of the steps of a method for measuring power-off delay information provided in an embodiment of the present application;

[0044] Figure 7 A schematic diagram of the structure of a delay measurement system provided in an embodiment of the present application;

[0045] FIG8( a ) is a schematic diagram of a signal measured by the delay measurement method provided by an embodiment of the present application;

[0046] FIG8( b ) is a schematic diagram of a signal measured in a conventional delay measurement method;

[0047] FIG8( c ) is a schematic diagram of a signal of an electroluminescent device capable of emitting green light provided by an embodiment of the present application;

[0048] FIG8( d ) is a signal schematic diagram of an electroluminescent device emitting blue light provided in an embodiment of the present application;

[0049] Fig. 9 A schematic diagram of the structure of a control device provided in an embodiment of the present application;

[0050] Fig.10 A schematic diagram of the structure of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0051] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of this application.

[0052] In the description of this application, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, "plurality" means two or more, unless otherwise clearly and specifically defined.

[0053] In the description of the present application, the word "for example" is used to mean "used as an example, illustration or explanation". Any embodiment described as "for example" in the present application is not necessarily to be construed as being more preferred or advantageous than other embodiments. The following description is given to enable any technician in the field to implement and use the present invention. In the following description, details are listed for the purpose of explanation. It should be understood that a person of ordinary skill in the art can recognize that the present invention can be implemented without using these specific details. In other examples, well-known structures and processes will not be elaborated in detail to avoid obscuring the description of the present invention with unnecessary details. Therefore, the present invention is not intended to be limited to the embodiments shown, but is consistent with the widest scope consistent with the principles and features disclosed in the present application.

[0054] To facilitate understanding of the time delay measurement method of the electroluminescent device provided in the embodiment of the present application, the application background of the time delay measurement method provided in the embodiment of the present application is first described. Specifically, the present application is mainly for measuring the light-emission delay of the electroluminescent device such as quantum dots of the electroluminescent type, wherein the electroluminescent device is usually energized by external injection of carriers into the light-emitting unit for radiation recombination and luminescence, and there is a certain time difference from the injection of carriers into the light-emitting unit to the recombination of photons, which can be understood as the light-emission delay of the electroluminescent device. In general, the light-emission delay is associated with the injection barrier of the device. The lower the injection barrier of the device, the easier it is to inject the device, and the lower the light-emission delay. Conversely, the higher the injection barrier of the device, the worse the injection of the device, and the higher the light-emission delay. Therefore, by measuring the delay of the electroluminescent device, it is convenient for technicians to understand the photoelectric characteristics of the device.

[0055] Normally, the light-emission delay of an electroluminescent device is measured by collecting an electro-driven signal using an oscilloscope, and after the photodetector detects the light-emission signal of the electroluminescent device and converts it into an electrical signal, the oscilloscope collects the electrical signal, and by comparing the difference in pulse fluctuation time between the two signals collected by the oscilloscope, the light-emission delay of the electroluminescent device is calculated. In the future, as display devices, electroluminescent quantum dots will pay more attention to their photoelectric characteristics at low brightness, so it is often necessary to measure their delay at low brightness. However, in the aforementioned measurement system, in order to avoid the influence of the capacitance of the photodetector itself on the delay result, technicians usually choose a photodetector with a very low effective area. However, when measuring the delay at low brightness, the light signal generated by the electroluminescent device is extremely weak, and the photodetector at this time cannot collect the effective light signal and convert it into an electrical signal. If the effective area of ​​the photodetector is increased, the capacitance of the photodetector itself will increase, resulting in inaccurate measurement of the delay result.

[0056] In order to solve the above problems, the embodiments of the present application provide a time delay measurement method, system, device and storage medium for an electroluminescent device. The measurement method is usually installed in a control device in the form of a program. The control device is set in a computer device of the time delay measurement system in the form of a processor. The control device in the computer device executes the time delay measurement method provided by the embodiments of the present application by running the computer program corresponding to the time delay measurement method to complete the time delay measurement of the electroluminescent device. Figure 1 As shown, Figure 1 A schematic flow chart of the steps of a time delay measurement method for an electroluminescent device provided in an embodiment of the present application, specifically, comprising steps S110 to S140:

[0057] S110, controlling the light emitting device to illuminate the photodetector with light of a preset wavelength.

[0058] Different from the conventional delay measurement method, the delay measurement method provided in the embodiment of the present application controls the light of the preset wavelength to illuminate the photodetector, so that the photoelectric sensor collects a relatively stable light signal, and generates a relatively stable background electrical signal for the oscilloscope to collect, so that when the electro-driven device to be tested generates a relatively weak light signal under the action of the electro-driven signal, the photodetector superimposes a transient change signal on the generated relatively stable background electrical signal to ensure the signal-to-noise ratio of the electrical signal collected by the oscilloscope. Among them, the oscilloscope is a device that can observe the waveform curve of various signal amplitudes changing with time, and can be used to test various electrical parameters, such as voltage, current, frequency, phase difference, amplitude modulation, etc. The specific oscilloscope type is not limited in the present invention, and any device that can be used to collect the light response of the photodetector to transient electroluminescence can be used. In addition, since the subsequent calculation of the delay considers the changes in the time dimension, which is independent of the nature of the electrical signal itself, the electrical signal collected by the oscilloscope here can be a voltage signal or a current signal.

[0059] In the embodiment of the present application, controlling the light emitting device to illuminate the photodetector with light of a preset wavelength can usually be performed in response to a user's control operation. For example, as a feasible embodiment of the present application, the user's control operation here is usually an operation related to starting the delay measurement, that is, when the user needs to perform a delay measurement on the electroluminescent device to be tested, he can operate the (virtual) switch in the delay measurement system by clicking or other means. At this time, the control device will start the delay measurement and control the light emitting device to illuminate the photodetector with light of a preset wavelength. Further, controlling the light emitting device to illuminate the photodetector with light of a preset wavelength is only to make the photodetector generate a background signal, thereby improving the signal-to-noise ratio of the electrical signal collected by the oscilloscope. For ease of description, the light of the preset wavelength irradiated on the photodetector is referred to as test light in the following. However, in actual application, in order to avoid quantum dots absorbing this test light, thereby interfering with the carrier injection in the electroluminescence process, under normal circumstances, the wavelength of the selected light can be controlled so that the electroluminescent device to be tested does not absorb it. For specific implementation schemes, please refer to the subsequent Figure 2 and its explanatory contents.

[0060] Of course, considering that the absorption and conversion efficiency of photodetectors for light of different wavelengths are different, in order to ensure the intensity of the generated background electrical signal and thus improve the measurement effect of the subsequent luminescence delay, it is usually possible to control some irradiation parameters of the test light, such as the incident angle or light intensity, to ensure that the photodetector generates an electrical signal of sufficient intensity. For specific implementation schemes, please refer to the subsequent Figure 3 and its explanatory contents.

[0061] S120, controlling the signal generator to generate a driving signal.

[0062] In the embodiment of the present application, after completing the aforementioned background light generation operation, in order to realize the time delay measurement of the electroluminescent device, it is also necessary to generate a driving signal through a signal generator to control the electroluminescent device to emit light. Specifically, a signal generator is a device that provides various frequencies, waveforms (such as triangle waves, sawtooth waves, sine waves, rectangular waves, etc.) and output level electrical signals. When measuring the amplitude characteristics, frequency characteristics, transmission characteristics and other electrical parameters of various telecommunication systems or telecommunication equipment, as well as measuring the characteristics and parameters of components, it can be used as a test signal source or excitation source. The embodiment of the present application does not specifically limit the signal generator, and includes commonly used components and equipment with this function on the market.

[0063] Furthermore, considering that the time delay measurement method provided in the embodiment of the present application is mainly used for the time delay measurement of the electroluminescent device under low brightness, the driving signal generated by the signal generator needs to be able to drive the electroluminescent device to generate low brightness light, that is, the generation of the driving signal needs to rely on the photoelectric characteristic parameters of the electroluminescent device, for example, it can be generated based on the JVL (Current density-Voltage-lightness) curve of the electroluminescent device. For specific implementation schemes, please refer to the subsequent Figure 4 and its explanatory contents.

[0064] S130, obtaining, through the photoelectric detector, a target oscillometric signal generated by the electroluminescent device to be tested under the input of the driving signal.

[0065] In the embodiment of the present application, after the driving signal is provided to the electroluminescent device to be tested through the signal generator, the electroluminescent device to be tested will emit light and be detected by the photodetector, thereby superimposing a transient pulse on the background electrical signal of the photodetector to form a target oscilloscope signal that can be collected by an oscilloscope.

[0066] Specifically, the electroluminescent device to be tested provided in the embodiment of the present application can be any of the components mentioned in the aforementioned application scenarios that inject carriers into the light-emitting unit by external power supply for radiative composite light emission. Of course, considering that electroluminescent quantum dots are used for display purposes, more attention will be paid to their photoelectric properties at low brightness. Therefore, the electroluminescent device to be tested provided in the embodiment of the present application is usually an electroluminescent quantum dot (AM-QLED), including but not limited to an anode electrode layer, a hole injection layer, a hole transport layer, a quantum dot light-emitting layer, an electron transport layer, a cathode layer, etc., as follows:

[0067] The anode electrode includes but is not limited to ITO (fluorine-doped tin oxide, indium tin metal oxide, a material that can be used as an anode electrode), FTO (fluorine-doped tin oxide, fluorine-doped tin oxide, a material that can be used as an anode electrode), etc.;

[0068] The hole injection layer includes but is not limited to PEDOT:PSS (an aqueous solution of a high molecular polymer, PEDOT is a polymer of 3,4-ethylenedioxythiophene monomer, and PSS is polystyrene sulfonate), etc.;

[0069] The hole transport layer includes but is not limited to PVK (Poly(9-vinyl carbazole), TFB (Poly[(9,9-dioctylfluorenyl-2,7-diyl)-alt-(4,4'-(N-(4-butylphenyl), poly[(9,9-dioctyl-2,7-diyl)-co-(4,4-(N-(p-butylphenyl))diphenylamine)], a conductive polymer), etc.;

[0070] The quantum dot light-emitting layer includes but is not limited to Cd (cadmium) based core-shell structure and non-Cd based core-shell structure, non-core-shell structure quantum dots;

[0071] Electron transport layers include but are not limited to ZnO (zinc oxide), ZMO (zinc magnesium oxide), SnO 2 (tin dioxide), etc.

[0072] The top electrode includes but is not limited to common metal electrodes such as aluminum, silver, and gold;

[0073] In addition, the device structure of the electroluminescent device includes but is not limited to upright and inverted device structures, the light emission modes include various types such as bottom emission and top emission, and the methods for preparing each layer of the thin film include but are not limited to solution spin coating, solution printing, vacuum thermal evaporation, magnetron sputtering, etc.

[0074] Furthermore, the delay measurement method provided above is explained by taking the measurement of the light emission delay of an electroluminescent device as an example, that is, measuring the time delay between the electroluminescent device being driven on and actually emitting light, and the delay can be used to reflect the difference in carrier injection of the device. Of course, the delay measurement can also include measuring the time delay between the electroluminescent device being driven off and being extinguished, and the delay can be used to illustrate the delay in the recombination of internal excitons in the device after power is cut off. Therefore, as an optional embodiment of the present application, a delay measurement method for measuring the power-off delay of an electroluminescent device is also provided, and the details can be referred to in the subsequent Figure 6 and its explanatory contents.

[0075] S140, determining the light-emitting delay information of the electroluminescent device to be tested based on the driving signal and the target oscillometric signal.

[0076] In the embodiment of the present application, after collecting a background electrical signal with pulses superimposed with transient changes, that is, a target oscillometric signal, by placing the signal and the drive signal in the same coordinate system at the same time scale for comparison, the luminescence delay information of the electroluminescent device to be tested can be determined based on the difference between the drive signal and the target oscillometric signal. Specifically, the drive signal contains a pulse generated when the drive is turned on, and the target oscillometric signal also contains a pulse generated by the electroluminescent device emitting light. Therefore, based on the difference between the two pulses, the luminescence delay information of the electroluminescent device can be accurately obtained. For a specific implementation scheme, please refer to the subsequent Figure 5 and its explanatory contents.

[0077] The time delay measurement method of the electroluminescent device provided in the embodiment of the present application controls the light of a preset wavelength to illuminate the photodetector so that the photodetector generates a background photoelectric signal. Therefore, when the control signal generator generates a driving signal to drive the electroluminescent device to be measured to emit light, the driving photoelectric signal can be further superimposed on the background photoelectric signal to obtain a more obvious oscilloscope signal, thereby facilitating the subsequent accurate calculation of the light emission delay information of the electroluminescent device and obtaining more accurate photoelectric characteristics of the electroluminescent device.

[0078] like Figure 2 As shown, Figure 2 A schematic flow chart of steps for configuring the wavelength of test light based on the light absorption wavelength of the light-emitting device to be tested provided in an embodiment of the present application, specifically, comprising steps S210 to S220:

[0079] S210, obtaining the light absorption wavelength of the electroluminescent device to be tested.

[0080] In the embodiments of the present application, it is considered that the test light irradiating the photodetector may affect the inside of the electroluminescent device to be tested, such as causing the electroluminescent device to produce fluorescence, or causing defects in the device material to absorb light and generate heat, etc., which affects the measured device light emitting delay. Therefore, it is necessary to control the test light to be as little as possible from being absorbed by the electroluminescent device to be tested. Therefore, the light absorption wavelength of the electroluminescent device to be tested can be obtained first. Specifically, the light absorption wavelength of the electroluminescent device to be tested refers to the wavelength of light that can be absorbed by the electroluminescent device to be tested, which can usually be obtained in advance by experimentally measuring the electroluminescent device to be tested.

[0081] S220, controlling the light emitting device to illuminate the photodetector with test light having a wavelength not less than the light absorption wavelength.

[0082] In the embodiment of the present application, after the light absorption wavelength of the electroluminescent device to be tested is obtained, the light emitting device can be used to illuminate the photodetector with a test light having a wavelength not less than the light absorption wavelength to effectively avoid the electroluminescent device to be tested from absorbing background light. Of course, as a preferred embodiment of the present application, the wavelength of the test light can also be made to exceed the light absorption wavelength by more than 30nm.

[0083] Furthermore, the light-emitting device here can be a conventional light-emitting device, but in this application scenario, in order to avoid the absorption of the test light by the electroluminescent device to be tested, the light-emitting device can use a generator that can generate parallel lasers that are not easy to diverge, that is, a laser generator. By irradiating the detector with a grazing incidence (the laser obliquely illuminates the detector at a certain angle between the laser and the detector) by the laser generator, it can be ensured that the background light is optically only absorbed and reflected for the photodetector, and will not be diverged to the electroluminescent device to be tested, thereby avoiding being absorbed by the electroluminescent device to be tested. That is, as an optional embodiment of the present application, the laser generator is controlled to generate test light with a wavelength not less than 30nm of the light absorption wavelength, and irradiates the photodetector with grazing incidence.

[0084] like Figure 3 As shown, Figure 3 A schematic flow chart of a step of adjusting test light irradiation parameters provided in an embodiment of the present application, specifically, comprising steps S310 to S330:

[0085] S310, obtaining a test oscillometric signal collected by the photoelectric detector under the irradiation of light of the preset wavelength.

[0086] Considering the aforementioned step S140, it is mentioned that the delay measurement method provided in the embodiment of the present application is usually needed to measure the delay of different types of light signals generated by electroluminescent devices, and the photodetector has different light absorption and conversion efficiencies in different wavelengths. Therefore, when background light is used to control the photodetector to generate a background light signal, the test light needs to be adjusted accordingly so that the photodetector generates a background light signal with a certain baseline intensity. Specifically, after controlling the light-emitting device to irradiate the photodetector with test light of a preset wavelength, the oscilloscope will collect the electrical signal converted by the photodetector under the irradiation of the test light to form a test oscilloscope signal.

[0087] S320, adjusting the illumination parameters of the light emitting device based on the magnitude relationship between the baseline voltage corresponding to the test oscillometric signal and a preset voltage threshold.

[0088] In the embodiment of the present application, after obtaining the test oscilloscope signal, by extracting the baseline voltage in the test oscilloscope signal and comparing it with the preset voltage threshold, the illumination parameters of the light-emitting device that generates the test light can be adjusted accordingly. Among them, the illumination parameters generally include at least one of the luminous intensity and the illumination angle (i.e., the angle between the light generated by the light-emitting device and the photodetector). Specifically, when the baseline voltage corresponding to the test oscilloscope signal is less than the preset voltage threshold, the luminous intensity or the illumination angle can be increased.

[0089] S330, controlling the light emitting device to emit light of a preset wavelength with the adjusted illumination parameters to illuminate the photodetector, and acquiring an updated oscillometric signal collected by the photodetector.

[0090] In an embodiment of the present application, after adjusting the illumination parameters of the light-emitting device, such as increasing the light intensity or increasing the illumination angle, the light-emitting device continues to be controlled to emit light of a preset wavelength with the adjusted illumination parameters to illuminate the photodetector, and the newly converted electrical signal of the photodetector can be further collected by an oscilloscope, thereby generating an updated oscilloscope signal.

[0091] Specifically, if the updated baseline voltage corresponding to the updated oscillometric signal does not meet the preset conditions, for example, it is less than the preset voltage threshold, then the illumination parameters of the light-emitting device need to be further adjusted. Conversely, if the updated baseline voltage corresponding to the updated oscillometric signal meets the preset conditions, for example, it is greater than or equal to the preset voltage threshold, then the subsequent steps can be continued, that is, generating a driving signal to make the electroluminescent device emit light, thereby superimposing a transient changing signal on the background electrical signal of the photodetector.

[0092] like Figure 4 As shown, Figure 4 A schematic flow chart of a step of configuring a driving signal provided in an embodiment of the present application, specifically, comprising steps S410 to S420:

[0093] S410, obtaining a current density, voltage and brightness curve of the electroluminescent device to be tested.

[0094] In the embodiment of the present application, the current density-voltage-brightness curve of the electroluminescent device to be tested, that is, the JVL curve, describes the relationship between the current density required and the corresponding voltage when the electroluminescent device emits light of different brightness. The curve can usually be measured in advance through a specific equipment experiment, and the embodiment of the present application will not be repeated here.

[0095] S420, based on the target driving current and voltage in the current density voltage brightness curve, controlling a signal generator associated with the electroluminescent device to be tested to generate a target driving signal.

[0096] In the embodiment of the present application, since the JVL curve describes the relationship between the current density and the corresponding voltage required when the electroluminescent device emits light of different brightness, the driving current and voltage required by the electroluminescent device to be tested when emitting low-brightness light can be determined based on the JVL curve. For example, taking 1000nit (nit, a unit of brightness) as an example, the control device can read the driving current and voltage required when the electroluminescent device generates 1000nit of light from the JVL curve, and determine that the driving voltage required at this time is 5.1V. At this time, the control device can further control the signal generator to generate a driving signal corresponding to the driving voltage with a signal parameter, for example, generating a driving signal with a high level of 5.1V, a low level of 0V, and a frequency of 80kHz. Specifically, the signal parameter includes at least one of the signal amplitude and the signal frequency, but usually it is the signal amplitude, that is, the difference between the high and low levels, which is the same as the driving voltage.

[0097] like Figure 5 As shown, Figure 5 A schematic flow chart of a step of calculating light-emission delay information provided in an embodiment of the present application, specifically, comprising steps S510 to S530:

[0098] S510: Acquire a first fluctuation time in the driving signal.

[0099] In the embodiment of the present application, by placing the driving signal in a coordinate system under the time dimension, based on the pulses in the driving signal, the pulse time in the driving signal, that is, the first fluctuation time, can be accurately determined.

[0100] S520: Acquire a second fluctuation time in the target oscillometric signal.

[0101] Similar to the previous steps, by placing the target oscillometric signal in a coordinate system under the time dimension, usually the coordinate system here is the same as the coordinate system corresponding to the previous drive signal, based on the pulse in the target oscillometric signal, the pulse time in the target oscillometric signal, that is, the second determination time, can also be accurately determined.

[0102] S530: Calculate the light-emitting delay information of the electroluminescent device to be tested based on the difference between the first fluctuation time and the second fluctuation time.

[0103] In the embodiment of the present application, based on calculating the time difference between the first fluctuation time and the second fluctuation time, the light emission delay information of the electroluminescent device to be tested can be calculated.

[0104] like Figure 6 As shown, Figure 6A schematic flow chart of a method for measuring power-off delay information provided in an embodiment of the present application, specifically, comprising steps S610 to S620:

[0105] S610, obtaining a power-off oscillographic signal generated by the electroluminescent device to be tested when the drive signal stops inputting.

[0106] In the embodiment of the present application, after the aforementioned driving signal is generated to drive the electroluminescent device to be tested to work, so that the photodetector detects the weak light generated by the electroluminescent device to be tested and forms a target oscillometric signal, the control device can further obtain a power-off oscillometric signal generated by the electroluminescent device to be tested when the driving signal stops being input. Specifically, when the driving signal stops being input, the internal excitons of the electroluminescent device to be tested will delay recombination after power is cut off, and will no longer emit light after the recombination. Therefore, the power-off oscillometric signal will also produce certain fluctuations after a certain delay due to the inability to detect the light emission of the electroluminescent device to be tested.

[0107] S620, determining the power-off delay information of the electroluminescent device to be tested based on the difference between the fluctuation time in the driving signal and the fluctuation time in the power-off oscillographic signal.

[0108] In the embodiment of the present application, the fluctuation time in the driving signal generally refers to the time when the driving signal stops inputting, that is, the time when the high level potential is placed at the level potential, while the fluctuation time in the power-off oscillographic signal refers to the fluctuation time caused by the electroluminescent device to be tested not emitting light after the internal excitons, and thus the luminescence of the electroluminescent device to be tested cannot be detected. Based on the difference in the above fluctuation time, the power-off delay information describing the internal exciton recombination situation can be further obtained.

[0109] In order to more clearly understand the delay measurement method provided in the embodiment of the present application, the embodiment of the present application also provides a delay measurement system, wherein the delay measurement system includes: a signal generator, an electroluminescent device to be tested electrically connected to the signal generator, a photodetector, an oscilloscope electrically connected to the photodetector, a light-emitting device and a control device; the signal generator and the oscilloscope are both signal-connected to the control device; wherein the electrical connection refers to being connected by a wire so that the electrical signal generated by the signal generator can be received by the electroluminescent device to be tested, that is, the electroluminescent device realizes the radiative recombination luminescence of the internal light-emitting unit under the factor of external power supply to inject carriers. Signal connection usually refers to the exchange of information between the signal generator, oscilloscope and control system based on wireless or wired communication. For example, the control system can transmit information to the signal generator, light-emitting device and oscilloscope by issuing information instructions to complete the control of the signal generator, light-emitting device and oscilloscope. The signal generator, light-emitting device and oscilloscope can also feed back corresponding information, such as the driving signal generated by the signal generator and the oscilloscope signal collected by the oscilloscope, to the control device in the form of information transmission, so that the control device can complete the subsequent processing of the information data.

[0110] The light-emitting device is used to control the light-emitting device to illuminate the photodetector with light of a preset wavelength; the control device is used to control the signal generator to generate a driving signal; the photodetector is used to detect the light signal generated by the electroluminescent device under test under the input of the driving signal, and display the target oscilloscope signal corresponding to the light signal through the oscilloscope; the control device is used to determine the light-emitting delay information of the electroluminescent device under test based on the driving signal and the target oscilloscope signal. Specifically, Figure 7 As shown, a specific structural diagram of the delay measurement system is provided, and combined with Figure 1 to Figure 6 The provided embodiment provides a complete schematic diagram of a delay measurement method. Specifically, the delay measurement system generally includes the following components:

[0111] 1: Signal generator, a device that can provide electrical signals of various frequencies, waveforms (triangular wave, sawtooth wave, rectangular wave, sine wave, etc.) and output levels, used as a test signal source or excitation source when measuring the amplitude characteristics, frequency characteristics, transmission characteristics and other electrical parameters of various telecommunication systems or telecommunication equipment, as well as when measuring the characteristics and parameters of components;

[0112] 2: The electroluminescent device to be tested, that is, the quantum dots of the electroluminescent type, includes but is not limited to the anode electrode layer, the hole injection layer, the hole transport layer, the quantum dot light-emitting layer, the electron transport layer, and the cathode layer. The device structure includes but is not limited to the device structure of the upright structure and the inverted structure. The light emission mode includes the bottom emission and the top emission types. The method of preparing each layer of the thin film includes but is not limited to the solution spin coating method, the solution printing method, the vacuum thermal evaporation method, the magnetron sputtering method, etc.;

[0113] 3: Photodetector, a device that can convert the detected optical signal into an electrical signal. Different devices have different performances in response rate and gain. The higher the performance, the higher the cost and the higher the environmental requirements for the application. Otherwise, it will generate greater noise. The embodiment of the present application aims to improve the delay measurement effect through a specific delay measurement method. Therefore, the photodetector can select a relatively common, low-cost, easy-to-maintain silicon-based diode detector;

[0114] 4: Oscilloscope, a common device that converts electrical signals into visible signal images to observe waveform curves of various signal amplitudes changing over time;

[0115] 5: Series resistor 1, considering the effect of series resistor on the overall current, the series resistor 1 is as small as possible to avoid the effect on the photocurrent. However, too small a resistor will also affect the voltage drop measured by the oscilloscope. For example, the photocurrent generated by the light-emitting diode under weak light is at the microampere level, so a resistor of 1000-5000Ω can be selected. At this time, a voltage drop of 0.01-0.05V can be obtained within the above resistance range, making the signal visible on a general oscilloscope.

[0116] 6: Series resistor 2 (protective resistor), mainly used to protect the system to prevent large current from being generated in the circuit and damaging the components;

[0117] 7: Power supply, used to provide power to the entire delay measurement system to maintain the normal operation of the system;

[0118] 8: Bypass capacitor;

[0119] 9: Grounding;

[0120] 10: A laser transmitter, which is used to generate a test light of a specific wavelength and a certain intensity, and irradiate the test light at a certain angle on the photodetector to form a background electrical signal. 12 is the laser emitted by the laser transmitter;

[0121] 11: Light shield, used to prevent external light from entering and causing fluctuations in the detector's optical signal, thereby improving the signal-to-noise ratio.

[0122] In the above delay measurement system, the delay measurement method performed by the control device mainly includes the following steps:

[0123] 1) Determine the JVL curve of the electroluminescent device to be tested, and select a specific voltage corresponding to low brightness according to the JVL curve of the device; for example, taking 1000 nit as an example, the driving voltage at this time is 5.1V;

[0124] 2) Connect the device to be measured to the test circuit, that is, connect the device according to the structure shown in the figure, where the positive and negative electrodes of the device to be measured are respectively connected to the positive and negative electrodes of the signal generator;

[0125] 3) Turn on the signal generator and adjust the parameters according to the driving voltage provided above, including selecting a square wave, setting the high level to 5.1V, the low level to 0V, and the frequency to 80kHz;

[0126] 4) According to the light absorption wavelength of the electroluminescent device to be tested, a specific laser wavelength is selected and irradiated on the photodetector at a specific angle, and the intensity of the laser wavelength is adjusted to control the baseline of the oscilloscope signal generated by the photodetector to meet the requirements. For example, a 785nm laser is used to irradiate the device at an incident angle of 30 degrees, and then the laser output power is adjusted so that the baseline of the oscilloscope is greater than 1V;

[0127] 5) Turn on the power switch to apply a certain reverse bias voltage to the photodetector;

[0128] 6) opening the signal output channel of the signal generator and applying the driving signal to the device to be measured, so that the electroluminescent device to be measured generates transient electroluminescence;

[0129] 7) The transient electroluminescent signal is detected by the photodetector and superimposed on the background electrical signal, which can obtain a higher signal-to-noise ratio. At this time, the oscilloscope can be turned on to collect the voltage signal (current signal) across the series resistor to obtain an oscilloscope signal;

[0130] 8) By comparing the oscilloscope signal and the driving signal, the time delay information of the electroluminescent device to be tested is calculated.

[0131] To facilitate understanding of the solutions provided by the embodiments of the present application, the following will be described in conjunction with specific embodiments, which are described in detail as follows.

[0132] Embodiment 1:

[0133] Using ITO / PEDOT / TFB / R-QD / ZnO / Ag device structure, measure the JVL curve to determine the current and voltage signals under different brightness; open each instrument setting according to the operating steps, place the device, use 785nm laser to irradiate the device, the incident angle is 30 degrees, and adjust the laser output power so that the baseline of the oscilloscope is greater than 1V. According to the JVL curve, the voltage is selected as 5.1V when the brightness is 1000nit, then set the signal generator to square wave, where the high level is 5.1V, the low level is 0V, and the frequency is 80kHz. Turn on the output switch of the signal generator, turn on the oscilloscope to collect the signal, and the schematic diagram of the collected signal is shown in Figure 8(a);

[0134] Embodiment 2:

[0135] The other steps are the same as those in Example 1, except that the infrared laser irradiation is turned off. The schematic diagram of the collected signal is shown in FIG8( b );

[0136] Embodiment 3:

[0137] The other steps are the same as those in Example 1, except that the device adopts an ITO / PEDOT / TFB / G-QD / ZnO / Ag device structure, and the voltage is 4.1V when the brightness is 1000nit determined by the JVL curve. At this time, the signal generator is set to a square wave, wherein the high level is 4.1V, the low level is 0V, and the frequency is 80kHz. The model schematic diagram obtained by the collection is shown in FIG8(c);

[0138] Embodiment 4:

[0139] The other steps are the same as those in Example 1, except that the device adopts an ITO / PEDOT / TFB / B-QD / ZnO / Ag device structure. The JVL curve determines that the voltage is 6.5 V when the brightness is 1000 nit. At this time, the signal generator is set to a square wave with a high level of 6.5 V, a low level of 0 V, and a frequency of 80 kHz. The model schematic diagram obtained by the collection is shown in Figure 8 (d).

[0140] Specifically, as shown in FIG8(a), it can be seen from the drive signal measured by the delay measurement method provided by the embodiment of the present application and the background electrical signal superimposed with transient changes that, due to the generation of the background electrical signal, the overall baseline of the target oscillometric signal is above 1V (here only the voltage signal is used as an example for explanation, and a similar effect also exists for the current signal). Therefore, superimposing a transient change on the baseline can still accurately determine that the delay between the target oscillometric signal and the drive signal is 0.91 microseconds (μs). However, for the infrared laser irradiation turned off shown in FIG8(b), that is, the signal schematic diagram measured by the conventional delay measurement method, it can be seen that due to the extremely weak light generated by the electroluminescent device at low brightness, the baseline of the collected target oscillometric signal is relatively low, which is generally below 0.1V. Therefore, the target oscillometric signal is easily interfered by the noise signal existing in the outside world, thereby generating an oscillometric signal with a low signal-to-noise ratio. It is difficult for technicians to determine the actual moment when the pulse occurs, and thus it is impossible to accurately obtain the delay information of the electroluminescent signal.

[0141] In addition, considering that when used as a display device, the electroluminescent quantum dots need to be able to generate RGB, that is, red, green, and blue light. For example, taking the ITO / PEDOT / TFB / R-QD / ZnO / Ag device structure as an example, the quantum dot light-emitting layer in the device is R-QD, that is, the device can emit red light, and the signal schematic diagram obtained by its delay measurement is shown in the aforementioned Figure 8 (a). For the two device structures of ITO / PEDOT / TFB / G-QD / ZnO / Ag and ITO / PEDOT / TFB / B-QD / ZnO / Ag, the quantum dot light-emitting layers in the device are G-QD and B-QD, respectively, that is, they can emit blue light and green light. Therefore, by measuring the light-emission delays of these three electroluminescent devices, the overall optoelectronic characteristics of the ITO / PEDOT / TFB / ZnO / Ag device structure used for display devices can be obtained. By comparing Figures 8(a), 8(c) and 8(d), it can be seen that the device structure has a time delay of 0.91 microseconds when red light occurs, a time delay of 0.94 microseconds when green light occurs, and a time delay of 1.41 microseconds when blue light occurs, that is, the red carrier injection of the device is the fastest, while the green is basically close to the red, and the blue has a slower carrier injection, which is consistent with the theory. Therefore, the time delay measurement method provided in the embodiment of the present application can accurately measure the time delay information of the electroluminescent device when generating low-brightness light, so as to be used for subsequent verification of changes in the comprehensive carrier injection in the development of new materials, especially the injection under low brightness, which is of substantial significance to the material development of electroluminescent type quantum dots.

[0142] In order to better implement the delay measurement method provided in the embodiment of the present application, on the basis of the delay measurement method provided in the embodiment of the present application, a control device is also provided in the embodiment of the present application, such as Fig. 9 As shown, the control device 900 includes:

[0143] A first control module 910 controls the light emitting device to illuminate the photodetector with light of a preset wavelength;

[0144] A second control module 920 controls the signal generator to generate a driving signal;

[0145] An acquisition module 930 is used to acquire, through the photoelectric detector, a target oscillometric signal generated by the electroluminescent device to be tested under the input of the driving signal;

[0146] The determination module 940 is used to determine the light-emitting delay information of the electroluminescent device to be tested based on the driving signal and the target oscillometric signal.

[0147] In some embodiments of the present application, the first control module 910 is further used to obtain the light absorption wavelength of the electroluminescent device to be tested; and control the preset light-emitting device to irradiate the photodetector with test light of no less than the light absorption wavelength.

[0148] In some embodiments of the present application, the second control module 920 is also used to obtain a test oscillometric signal collected by the photodetector under the irradiation of light of the preset wavelength; based on the size relationship between the baseline voltage corresponding to the test oscillometric signal and the preset voltage threshold, adjust the irradiation parameters of the light-emitting device; the irradiation parameters include at least one of the luminous intensity and the irradiation angle; control the light-emitting device to emit light of a preset wavelength with the adjusted irradiation parameters to illuminate the photodetector, and obtain an updated oscillometric signal collected by the photodetector; until the size relationship between the updated baseline voltage corresponding to the updated oscillometric signal and the preset voltage threshold meets the preset condition, the control signal generator generates a drive signal.

[0149] In some embodiments of the present application, the second control module 920 is also used to obtain a current density voltage brightness curve of the electroluminescent device to be measured; based on the target driving current voltage in the current density voltage brightness curve, control a signal generator associated with the electroluminescent device to be measured to generate a target driving signal; a generated signal parameter of the target driving signal corresponds to the target driving current voltage; and the generated signal parameter includes at least one of a signal amplitude and a signal frequency.

[0150] In some embodiments of the present application, the determination module 940 is also used to obtain a first fluctuation time in the driving signal; obtain a second fluctuation time in the target oscillometric signal; and calculate the light-emitting delay information of the electroluminescent device to be tested based on the difference between the first fluctuation time and the second fluctuation time.

[0151] In some embodiments of the present application, the acquisition module 930 is also used to obtain the power-off oscilloscope signal generated by the electroluminescent device to be tested when the drive signal stops inputting; based on the difference between the fluctuation time in the drive signal and the fluctuation time in the power-off oscilloscope signal, the power-off delay information of the electroluminescent device to be tested is determined.

[0152] For the specific definition of the control device, please refer to the definition of the delay measurement method above, which will not be repeated here. Each module in the above control device can be implemented in whole or in part by software, hardware and a combination thereof. The above modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above modules.

[0153] In some embodiments of the present application, the control device 900 may be implemented in the form of a computer program. The computer program may be implemented in Fig.10 The computer device shown in the figure is run on the computer device. The memory of the computer device can store various program modules constituting the control device 900, for example, Fig. 9 The first control module 910, the second control module 920, the acquisition module 930 and the determination module 940 are shown. The computer program composed of various program modules enables the processor to execute the steps of the delay measurement method of each embodiment of the present application described in this specification.

[0154] For example, Fig.10 The computer device shown can be Fig. 9The first control module 910 in the control device 900 shown executes step S110. The computer device can execute step S120 through the second control module 920. The computer device can execute step S130 through the acquisition module 930. The computer device can execute step S140 through the determination module 940. The computer device includes a processor, a memory and a network interface connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The network interface of the computer device is used to communicate with an external computer device through a network connection. When the computer program is executed by the processor, a delay measurement method is implemented.

[0155] Those skilled in the art will understand that Fig. 9 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0156] In some embodiments of the present application, a computer device is provided, comprising one or more processors; a memory; and one or more applications, wherein the one or more applications are stored in the memory and configured to be executed by the processor to implement the following steps:

[0157] Controlling the light emitting device to illuminate the photodetector with light of a preset wavelength;

[0158] The control signal generator generates a driving signal;

[0159] Acquiring, by means of the photoelectric detector, a target oscillometric signal generated by the electroluminescent device to be tested under the input of the driving signal;

[0160] Based on the driving signal and the target oscillometric signal, light emission delay information of the electroluminescent device to be tested is determined.

[0161] In some embodiments of the present application, a computer-readable storage medium is provided, which stores a computer program. The computer program is loaded by a processor, so that the processor performs the following steps:

[0162] Controlling the light emitting device to illuminate the photodetector with light of a preset wavelength;

[0163] The control signal generator generates a driving signal;

[0164] Acquiring, by means of the photoelectric detector, a target oscillometric signal generated by the electroluminescent device to be tested under the input of the driving signal;

[0165] Based on the driving signal and the target oscillometric signal, light emission delay information of the electroluminescent device to be tested is determined.

[0166] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Any reference to memory, storage, database or other media used in the embodiments provided in this application may include at least one of non-volatile and volatile memory. Non-volatile memory may include read-only memory (ROM), magnetic tape, floppy disk, flash memory or optical memory, etc. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0167] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0168] The above is a detailed introduction to a delay measurement method, device, computer equipment and storage medium provided in an embodiment of the present application. Specific examples are used in this article to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea; at the same time, for technical personnel in this field, according to the idea of ​​the present invention, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present invention.

Claims

1. A method for measuring the time delay of an electroluminescent device, characterized in that: include: Controlling the light emitting device to illuminate the photodetector with light of a preset wavelength; The control signal generator generates a driving signal; Acquiring, by means of the photoelectric detector, a target oscillometric signal generated by the electroluminescent device to be tested under the input of the driving signal; Based on the driving signal and the target oscillometric signal, light emission delay information of the electroluminescent device to be tested is determined.

2. The delay measurement method according to claim 1, characterized in that: The controlling the light emitting device to illuminate the photodetector with light of a preset wavelength comprises: Obtaining the light absorption wavelength of the electroluminescent device to be tested; The light emitting device is controlled to illuminate the photodetector with test light having a wavelength not less than the light absorption wavelength.

3. The delay measurement method according to claim 1, characterized in that: Before the step of controlling the signal generator to generate the driving signal, the method further comprises: Acquire a test oscillometric signal collected by the photodetector under the irradiation of light of the preset wavelength; Based on the magnitude relationship between the baseline voltage corresponding to the test oscillometric signal and the preset voltage threshold, adjusting the illumination parameters of the light emitting device; the illumination parameters include at least one of the light intensity and the illumination angle; Controlling the light emitting device to emit light of a preset wavelength with the adjusted illumination parameters to illuminate the photodetector, and acquiring an updated oscillometric signal collected by the photodetector; The step of controlling the signal generator to generate a driving signal is performed until the magnitude relationship between the updated baseline voltage corresponding to the updated oscillometric signal and the preset voltage threshold satisfies a preset condition.

4. The delay measurement method according to claim 1, characterized in that: The control signal generator generates a driving signal, including: Obtaining a current density, voltage, and brightness curve of the electroluminescent device to be tested; Based on the target driving current voltage in the current density voltage brightness curve, a signal generator associated with the electroluminescent device to be tested is controlled to generate a target driving signal; a generated signal parameter of the target driving signal corresponds to the target driving current voltage; and the generated signal parameter includes at least one of a signal amplitude and a signal frequency.

5. The delay measurement method according to claim 1, characterized in that: The step of determining the light-emitting delay information of the electroluminescent device to be tested based on the driving signal and the target oscillometric signal comprises: Acquiring a first fluctuation time in the driving signal; Acquiring a second fluctuation time in the target oscillometric signal; The light emitting delay information of the electroluminescent device to be tested is calculated based on the difference between the first fluctuation time and the second fluctuation time.

6. The delay measurement method according to claim 1, characterized in that: After the step of obtaining, by the photoelectric detector, the target oscillometric signal generated by the electroluminescent device to be tested under the input of the driving signal, the method further comprises: Acquire a power-off oscillographic signal generated by the electroluminescent device to be tested when the drive signal stops inputting; Based on the difference between the fluctuation time in the driving signal and the fluctuation time in the power-off oscillographic signal, the power-off delay information of the electroluminescent device to be tested is determined.

7. The delay measurement method according to any one of claims 1 to 6, characterized in that: The electroluminescent device to be tested includes at least one of an anode electrode layer, a hole injection layer, a hole transport layer, a quantum dot light-emitting layer, an electron transport layer and a cathode layer.

8. A time delay measurement system for an electroluminescent device, characterized in that: It includes a signal generator, an electroluminescent device to be tested electrically connected to the signal generator, a photodetector, an oscilloscope electrically connected to the photodetector, a light-emitting device and a control device; the signal generator, the oscilloscope and the light-emitting device are all connected to the control system signal; The control device is used to control the light emitting device to illuminate the photodetector with light of a preset wavelength; The control device is used to control the signal generator to generate a driving signal; the photodetector is used to detect the light signal generated by the electroluminescent device to be tested under the input of the driving signal, and to display the target oscilloscope signal corresponding to the light signal through the oscilloscope; the control device is used to determine the light emission delay information of the electroluminescent device to be tested based on the driving signal and the target oscilloscope signal.

9. A computer device, characterized in that: The computer device comprises: one or more processors; Memory; and One or more application programs, wherein the one or more application programs are stored in the memory and are configured to be executed by the processor to implement the time delay measurement method for the electroluminescent device according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and the computer program is loaded by a processor to execute the time delay measurement method of an electroluminescent device according to any one of claims 1 to 7.

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