Electronic device test system and method

Abstract

The invention discloses an electronic device testing system and method. The system comprises an upper computer, a lower computer board and a to-be-tested device, the upper computer is in hardware connection with the lower computer board, and the lower computer board is in hardware connection with a to-be-tested device; the number of the to-be-tested device is at least one; the upper computer is used for generating a current test command based on a current test demand input by a user and sending the current test command to the lower computer board; the lower computer board is used for receiving the current test command, calling a corresponding target test logic based on the current test command, executing a corresponding test operation on the to-be-tested device based on the target test logic, generating a test result and sending the test result to the upper computer; and the upper computer is used for receiving the test result sent by the lower computer board and visually displaying the test result. Through the technical scheme of the invention, the electronic device can be tested conveniently and quickly, and the test efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of hardware testing, and in particular to an electronic device testing system and method. Background Art

[0002] As the number of electronic devices increases, it becomes more and more important to perform functional testing on electronic devices. The electronic device functional testing system used in the prior art usually consists of testing software carried on a computer and a testing machine that provides electrical signals.

[0003] However, the electronic device functional test system equipment used in the prior art is expensive, bulky, and usually needs to be placed in a fixed position. If an electronic device fails at the client, it usually needs to be sent to the tester for diagnosis, which is time-consuming and labor-intensive, and reduces the test efficiency. Therefore, how to test electronic devices quickly and conveniently and improve test efficiency is a problem that needs to be solved urgently. Summary of the invention

[0004] The present invention provides an electronic device testing system and method, which can solve the problem of low electronic device testing efficiency.

[0005] According to one aspect of the present invention, there is provided an electronic device testing system, the system comprising: a host computer, a slave computer board and a device to be tested; the host computer is connected to the slave computer board by hardware, the slave computer board is connected to the device to be tested by hardware; the number of the device to be tested is at least one;

[0006] The host computer is used to generate a current test command based on the current test requirement input by the user, and send the current test command to the lower computer board;

[0007] The lower computer board is used to receive the current test command, call the corresponding target test logic based on the current test command, and perform the corresponding test operation on the device under test based on the target test logic, generate the test result, and send the test result to the upper computer;

[0008] The host computer is used to receive the test results sent by the lower computer board and perform visual display.

[0009] According to another aspect of the present invention, there is provided an electronic device testing method, the method comprising: a host computer, a slave computer board and a device to be tested; the host computer is connected to the slave computer board by hardware, and the slave computer board is connected to the device to be tested by hardware; the number of the device to be tested is at least one;

[0010] Generate a current test command based on the current test requirement input by the upper computer, and send the current test command to the lower computer board;

[0011] Receive the current test command through the lower computer board, call the corresponding target test logic based on the current test command, perform the corresponding test operation on the device under test based on the target test logic, generate the test result, and send the test result to the upper computer;

[0012] The upper computer receives the test results sent by the lower computer board and displays them visually.

[0013] The technical solution of the embodiment of the present invention is that the upper computer is connected to the lower computer board by hardware, and the lower computer board is connected to the device to be tested by hardware; the number of devices to be tested is at least one; the upper computer is used to generate the current test command based on the current test demand input by the user, and send the current test command to the lower computer board; the lower computer board is used to receive the current test command, call the corresponding target test logic based on the current test command, and perform the corresponding test operation on the device to be tested based on the target test logic, generate the test result, and send the test result to the upper computer; the upper computer is used to receive the test result sent by the lower computer board and display it visually. Since the current test demand input by the user directly matches the corresponding test logic, there is no need for the user to modify the software program, and the lower computer board is used instead of bulky test equipment. Therefore, the problem of low test efficiency of electronic devices is solved, and electronic devices can be tested quickly and conveniently, which improves the test efficiency of electronic devices.

[0014] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0016] Figure 1 It is a structural schematic diagram of an electronic device testing system provided according to the prior art;

[0017] Figure 2 is a structural schematic diagram of an electronic device testing system provided according to Embodiment 1 of the present invention;

[0018] Figure 3 is a schematic structural diagram of an optional electronic device testing system provided according to Embodiment 1 of the present invention;

[0019] Figure 4is a schematic diagram of the structure of a lower computer board provided according to the first embodiment of the present invention;

[0020] Figure 5 is a schematic diagram of the structure of a host computer provided according to Embodiment 1 of the present invention;

[0021] Figure 6 This is a flow chart of an electronic device testing method provided according to the second embodiment of the present invention. DETAILED DESCRIPTION

[0022] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0023] It should be noted that the terms "first", "second", "target", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0024] Figure 1 It is a structural diagram of an electronic device testing system provided according to the prior art. Specifically, in the prior art, the electronic device testing system is usually composed of a desktop computer, testing equipment and a signal line connecting the two. However, since the testing equipment is usually bulky and expensive, it is not suitable and convenient to move. If the client encounters a product failure, the sample needs to be sent to the location of the testing system for troubleshooting, which is time-consuming and labor-intensive, and reduces the testing efficiency of the electronic device. Therefore, in order to improve the testing efficiency of electronic devices, an embodiment of the present invention proposes an electronic device testing system.

[0025] Embodiment 1

[0026] Figure 2 This is a schematic diagram of the structure of an electronic device testing system provided in Embodiment 1 of the present invention. Figure 2As shown, the system includes: a host computer 110, a lower computer board 120 and a device under test 130; the host computer 110 is connected to the lower computer board 120 by hardware, and the lower computer board 120 is connected to the device under test 130 by hardware; the number of the device under test 130 is at least one;

[0027] The host computer 110 is used to generate a current test command based on the current test requirement input by the user, and send the current test command to the lower computer board 120;

[0028] The lower computer board 120 is used to receive the current test command, call the corresponding target test logic based on the current test command, and perform the corresponding test operation on the device under test 130 based on the target test logic, generate the test result, and send the test result to the upper computer 110;

[0029] The upper computer 110 is used to receive the test results sent by the lower computer board 120 and perform visual display.

[0030] In an embodiment of the present invention, the host computer 110 may refer to a computer that issues a control command. Exemplarily, the host computer 110 may be a laptop computer. Test requirements may refer to functional requirements of users for testing electronic devices. Exemplarily, test requirements may be reading device identity documents (ID), single-byte read and write tests, status register read and write tests, single read tests, single write tests, or multiple read and write tests. Usually, users can determine test requirements by keyboard input or configuration item selection according to actual application requirements. Current test requirements may refer to the user's test requirements at the current moment. The current test command may refer to a code command line generated according to the current test requirements. Exemplarily, command parameters may be combined according to the functional requirements in the current test requirements and the preset command template to generate the current test command. The lower computer board 120 may refer to a device that directly controls the device and obtains the device status. Exemplarily, the lower computer board 120 may be a printed circuit board. Test logic may refer to the software running logic corresponding to the test command, which is used to implement the corresponding test operation. Exemplarily, the test logic may be all the code logic required to implement the test function corresponding to the test command. Typically, one test function corresponds to one test logic, and the lower computer board 120 includes a plurality of pre-set test logics. The target test logic may refer to the test logic corresponding to the current test command. The device under test 130 may refer to an electronic device that needs to be functionally tested. Typically, the number of the devices under test 130 is at least one. The test result may refer to the functional test result corresponding to the device under test 130.

[0031] Specifically, after the user inputs the current test requirements, the upper computer 110 can generate the current test command according to the current test requirements and send it to the lower computer board 120. Then, the lower computer board 120 determines the corresponding target test logic in the pre-set test logic set based on the current test command. Further, the lower computer board 120 performs corresponding test operations on the device under test 130 based on the target test logic, generates test results, and sends the test results to the upper computer 110; finally, the upper computer 110 receives the test results sent by the lower computer board 120 and displays them visually, thereby completing the functional test of the electronic device.

[0032] It is worth noting that, in the embodiment of the present invention, the device under test 130 may be a plurality of electronic devices, and the plurality of electronic devices may complete functional tests in parallel, thereby improving the efficiency of the functional tests.

[0033] The technical solution of the embodiment of the present invention is that the upper computer 110 is connected to the lower computer board 120 by hardware, and the lower computer board 120 is connected to the device under test 130 by hardware; the number of the device under test 130 is at least one; the upper computer 110 is used to generate the current test command based on the current test demand input by the user, and send the current test command to the lower computer board 120; the lower computer board 120 is used to receive the current test command, call the corresponding target test logic based on the current test command, and perform the corresponding test operation on the device under test 130 based on the target test logic, generate the test result, and send the test result to the upper computer 110; the upper computer 110 is used to receive the test result sent by the lower computer board 120 and display it visually. Since the current test demand input by the user directly matches the corresponding test logic, there is no need for the user to modify the software program, and the lower computer board is used to replace the bulky test equipment. Therefore, the problem of low test efficiency of electronic devices is solved, and the electronic devices can be tested quickly and conveniently, which improves the test efficiency of electronic devices.

[0034] Optionally, the host computer 110 further includes: a device configuration module;

[0035] The device configuration module is used to perform device configuration operations on the host computer 110 based on the initial configuration information corresponding to the lower computer board 120.

[0036] The initial configuration information may refer to the initial parameter information set for the lower computer board 120 during the production process. For example, the initial configuration information may be serial port information, communication rate, port configuration, etc. Device configuration may refer to the operation of maintaining the consistency of configuration information between the upper computer and the lower computer board.

[0037] Specifically, before testing the electronic device, the initial configuration information corresponding to the lower computer board 120 can be obtained in advance, and then the upper computer 110 is set to the configuration information consistent with the initial configuration information through the device configuration module. In this way, the communication between the upper computer and the lower computer board can be ensured successfully, and the testing efficiency of the electronic device is improved.

[0038] Optionally, the host computer 110 includes: a test command module;

[0039] The test command module is used to determine the corresponding current command parameters and current command structure based on the current test requirements input by the user, and to combine and process the current command parameters based on the current command structure to generate a current test command.

[0040] Among them, the command parameters may refer to functional parameters that match the test function in the test requirements. Exemplarily, the command parameters may be test parameters required to implement the test function. Specifically, if the test function is a single read test, the corresponding command parameters may be the test object, the single read rate, and the single read result, etc. The single read result may be a read success or a read failure. The current command parameters may refer to functional parameters that match the current test requirements. The command structure may refer to a command template that matches the test function in the test requirements. The command structure may include parameter positions corresponding to each command parameter. Usually, one test function corresponds to one test template. The current command structure may refer to a command structure that matches the current test requirements.

[0041] Specifically, after receiving the current test requirements input by the user, the current command parameters and current command structure corresponding to the current test requirements can be determined in the preset command set according to the current test requirements, and then the current command parameters are filled into the current command structure according to the parameter position to generate the current test command. In this way, the corresponding test command can be automatically generated according to the test requirements input by the user, providing an effective basis for subsequent functional testing.

[0042] It is worth noting that in the embodiment of the present invention, the command structure and command parameters can be customized in advance according to user needs to construct a preset command set, thereby achieving the unification of test commands, and the embodiment of the present invention does not specifically limit this.

[0043] Optionally, the lower computer board 120 includes: an application software module and a sample module; the sample module is hardware-connected to the device under test 130; the application software module includes a test logic set;

[0044] The application software module is used to determine the corresponding target test logic in the test logic set based on the current test command, and perform corresponding test operations on the device under test 130 in the sample module based on the target test logic to generate a test result.

[0045] The sample module may refer to a module that carries a device under test. Typically, the sample module includes a ferromagnetic random access memory (FRAM) that supports a serial peripheral interface (SPI) protocol. Each device under test is connected to the sample module via an SPI FRAM interface. A test logic set may refer to a logic set composed of various test logics.

[0046] Specifically, when the device under test 130 is functionally tested, the device under test 130 can be connected to the sample module of the lower computer board 120. Then, when the lower computer board 120 receives the current test command, the target test logic corresponding to the current test command is determined in the test logic set through the application software module in the lower computer board 120, and the corresponding test operation is performed on the device under test 130 in the sample module based on the target test logic to generate a test result. In this way, the functional test of the device under test is achieved.

[0047] Optionally, the host computer 110 includes: an information display module;

[0048] The information display module is used to receive the test results sent by the lower computer board 120 based on the universal asynchronous receiver-transmitter interface and perform visual display.

[0049] The information display module may refer to a module for visually displaying the test information. A Universal Asynchronous Receiver / Transmitter (UART) may refer to a communication protocol defined in a data link layer. Usually, UART can realize bidirectional communication.

[0050] Specifically, the application software module in the lower computer board 120 determines the corresponding target test logic in the test logic set based on the current test command, and performs corresponding test operations on the device under test 130 in the sample module based on the target test logic. After generating the test results, the test results can also be fed back to the information display module in the upper computer 110 through the UART interface and the data connection line. In this way, the test results can be displayed in real time, allowing customers to obtain test information more easily.

[0051] It is worth noting that in the embodiment of the present invention, the application software module in the lower computer board 120 can also feed back the running log containing progress tracking during the test process to the information display module in the upper computer 110 through the UART interface for visual display.

[0052] Optionally, the lower computer board 120 further includes: an input module and an output module;

[0053] The input module is used to receive a key configuration signal input by a user, generate a state response signal according to the key configuration signal and a current response state, and send the state response signal to a corresponding output module;

[0054] The output module is used to receive the status response signal sent by the input module and generate a status display result based on the status response signal.

[0055] Among them, the input module may refer to a module that receives signals and transmits signals. Exemplarily, the input module may be a button. Usually, an input module may include multiple buttons. The button configuration signal may refer to a button trigger signal. Usually, when a user triggers a button, a button configuration signal is generated for the corresponding button. The current response state may refer to the response state of the current button. Exemplarily, the current response state may be a state response or a state non-response. The state response signal may refer to a response signal generated according to the current response state. Exemplarily, if the current response state is a state response, a state response signal indicating that the button has responded may be generated.

[0056] Among them, the output module may refer to a module that displays the status of the input module. Exemplarily, the output module may be a light emitting diode (LED). Usually, an output module may include multiple LEDs, and each LED exists in pairs with a button in the input module. The status display result may refer to the corresponding display result generated by the output module according to the status response signal. Exemplarily, the status display result may be that the LED is on, or that the LED is off. Specifically, if the status response signal is that the button has responded, the corresponding status display result may be that the LED is on; if the status response signal is that the button has not responded, the corresponding status display result may be that the LED is off.

[0057] Specifically, when the user triggers the input module by pressing a key, the input module generates a state response signal according to the key configuration signal input by the user and the current response state, and sends the state response signal to the corresponding output module. After that, the output module can generate a corresponding state display result according to the state response signal. In this way, the state response result of the corresponding position in the input module can be displayed in time, which improves the efficiency of device testing.

[0058] It is worth noting that in the embodiment of the present invention, the input module and the output module are usually used for software updates or temporary pauses, and the output module can display the operating status of the lower computer board, for example, updating software or reading and writing operations.

[0059] Optionally, the lower computer board 120 further includes: a software startup module;

[0060] The software startup module is used to execute a software startup operation based on a key configuration signal input by a user.

[0061] The software startup may refer to a software logic update operation.

[0062] Specifically, when the user triggers a button, a button configuration signal input by the user is obtained. If the button corresponding to the button configuration signal is the button responsible for software update, the software startup module in the lower computer board 120 triggers the software startup operation to execute the software update, thereby realizing the update operation of the test logic set in the application software module, thereby improving the efficiency of subsequent device testing.

[0063] Optionally, the host computer 110 further includes: an information query module;

[0064] The information query module is used to obtain the current query requirement input by the user, determine the corresponding target query result in the historical data storage based on the current query requirement, and visually display the target query result.

[0065] Among them, the query demand may refer to the user's demand for information query on the working status of the lower computer board. Exemplarily, the query demand may include information such as the query object, query time and query index. The current query demand may refer to the user's query demand at the current moment. The historical data storage device may refer to a storage device for storing data of the working status at historical moments. The target query result may refer to the status query result in the historical data storage device corresponding to the current query demand.

[0066] Specifically, when the user needs to query the working status of the lower computer board, the current query requirement can be input through the information query module of the upper computer 110. Then, the information query module determines the corresponding target query result in the historical data storage device based on the current query requirement, and visually displays the target query result to realize the query of the working status of the lower computer board.

[0067] Optionally, the lower computer board 120 further includes: a power module;

[0068] The power module is used to respond to the hardware connection signal between the host computer 110 and the lower computer board 120 , and provide power supply to the lower computer board 120 if there is a hardware connection signal between the host computer 110 and the lower computer board 120 .

[0069] The hardware connection signal may refer to a hardware connection response signal. Usually, after the Universal Serial Bus (USB) interface of the lower computer board is connected to the upper computer, the lower computer board will be started by default and generate a hardware connection signal.

[0070] Specifically, the power module on the lower computer board 120 can supply power to the lower computer board and the device under test, so that the device testing process can proceed smoothly.

[0071] Figure 3 The figure shows a schematic diagram of the structure of an optional electronic device testing system provided by an embodiment of the present invention. Specifically, the electronic device testing system comprises a host computer, a slave computer board and a data line connecting the two.

[0072] The lower computer board includes a power module, an input and output module (i.e., an input module and an output module), a UART serial port, a sample module (i.e., SPI FRAM), an application software module, and a software startup module. Figure 4The figure shows a schematic diagram of the structure of the lower computer board provided by an embodiment of the present invention. Among them, the input module in the input-output module includes buttons 1 to 4, and the output module includes LED1 to LED4, and each button corresponds to each LED one by one. The software startup module is configured with buttons, LEDs and UART serial ports. The buttons are used to control the lower computer board to enter the software startup module; the LEDs are used to indicate the status of the software startup module; the UART serial port is used to output the operation log of the software startup module, and to update the test logic set in the application software module. Specifically, when the user inputs a button configuration signal to the button corresponding to the software startup module, the software startup module updates the test logic set in the application software module through the UART serial port and outputs the operation log. The application software module is configured with buttons, LEDs, UART serial ports, SPI interfaces, real-time operating systems, command-line interfaces (CLI) and FRAM operations. The buttons are used to control the application software module to enter different modes; the LEDs are used to indicate the status of the application software module; the UART serial ports are used to output the operation logs of the application software module and to receive test commands from the host computer; the SPI interface is used to connect to the interface of the sample module; the real-time operating system is responsible for the scheduling of the overall task; the command line interface is used to pre-process the received test commands; and the FRAM operation is used to determine the operation specifications corresponding to the FRAM in the sample module. Specifically, when the user inputs a key configuration signal to the key corresponding to the application software module, the application software module receives the test command of the host computer through the UART serial port, and schedules the key configuration signal through the real-time operating system. For example, if there are multiple key configuration signals, the logic of multiple input modules and output modules working simultaneously is determined. After that, the received test command is pre-processed through the CLI, for example, it is determined whether the test command meets the preset rules. If it meets the rules, no additional operation is performed. If it does not meet the rules, the test command is further parsed and related operations are performed according to the parsed parameters. Finally, the operation specification corresponding to the FRAM is determined through the FRAM operation, and data is read and written to the FRAM through the SPI interface based on the operation specification, so as to realize the test function corresponding to the test command, and output the operation log of the application software module through the UART serial port. In addition, the lower computer board also includes a power supply module for supplying power to the lower computer board and the device under test in the sample module, which is not described in detail in the embodiment of the present invention.

[0073] Among them, the host computer includes a device configuration module, a test command module, an information display module and an information query module. Figure 5The structure diagram of the host computer provided by the embodiment of the present invention is shown. Among them, the device configuration module is used to perform device configuration operations on the host computer based on the initial configuration information corresponding to the lower computer board before the device is tested. The test command module is used to determine the corresponding current command parameters and current command structure based on the current test requirements input by the user, and to process the current command parameters based on the current command structure combination to generate the current test command. The information display module is used to receive the test results sent by the lower computer board based on the universal asynchronous receiver and transmitter interface, and to display them visually. The information query module is used to obtain the current query requirements input by the user, determine the corresponding target query results in the historical data storage device based on the current query requirements, and visually display the target query results.

[0074] In the embodiment of the present invention, the upper computer can be connected to the lower computer board via a data connection line, and communicate with the application software module and the software startup module on the lower computer board via a UART serial port to achieve control of related functions.

[0075] Therefore, by replacing the desktop computer with the host computer, the bulky test equipment with the lower computer board, and the customized signal line with the modern universal data line, the advantages of the portable test system such as low price, convenient movement and low maintenance cost are achieved. The function of the memory can be displayed in a more intuitive way; the relevant parameters of the test verification can be configured in a more systematic way; the problems of small sample capacity of reliability verification and high consumption of the automatic test equipment (ATE) can be solved with lower resources. In addition, the functions of each module in the host computer are simple and easy to understand, and the test information and test commands are displayed separately, making it easier for customers to obtain test information and implement test work. Users only need simple training to get started. It avoids the problem that the test information and test commands in the existing test system software are presented to users in the form of command lines, and users need to have certain professional knowledge to read the test information and operate the software.

[0076] It is worth noting that in the embodiment of the present invention, an interface for connecting to general electronic devices such as ATE or semiconductor parameter analyzers may be reserved on the lower computer board, so as to obtain accurate input signals, or obtain more complete output monitoring signals, thereby improving the compatibility and test accuracy of the lower computer board. The embodiment of the present invention does not specifically limit this.

[0077] Embodiment 2

[0078] Figure 6This is a flowchart of an electronic device testing method provided in the second embodiment of the present invention. This embodiment is applicable to the case of functional testing of electronic devices. The method includes a host computer, a slave computer board and a device to be tested; the host computer is connected to the slave computer board by hardware, and the slave computer board is connected to the device to be tested by hardware; the number of the devices to be tested is at least one; the method can be executed by an electronic device testing system, and the electronic device testing system can be implemented in the form of hardware and / or software. Figure 6 As shown, the method includes:

[0079] S210, generating a current test command through the upper computer based on the current test requirement input by the user, and sending the current test command to the lower computer board.

[0080] In an optional implementation, before the host computer generates the current test command based on the current test requirement input by the user, it may also include: performing a device configuration operation on the host computer based on the initial configuration information corresponding to the lower computer board through the device configuration module.

[0081] In an optional implementation, the generating of the current test command by the host computer based on the current test requirement input by the user may specifically include:

[0082] The test command module determines the corresponding current command parameters and current command structure based on the current test requirements input by the user, and processes the current command parameters based on the current command structure combination to generate the current test command.

[0083] S220, receiving the current test command through the lower computer board, calling the corresponding target test logic based on the current test command, and performing corresponding test operations on the device under test based on the target test logic, generating a test result, and sending the test result to the upper computer.

[0084] In an optional implementation, calling the corresponding target test logic based on the current test command, and performing the corresponding test operation on the device under test based on the target test logic to generate the test result may specifically include:

[0085] The application software module determines the corresponding target test logic in the test logic set based on the current test command, and performs corresponding test operations on the device under test in the sample module based on the target test logic to generate a test result.

[0086] The sample module is connected to the device under test hardware; and the application software module includes a test logic set.

[0087] In an optional embodiment, the method may further include:

[0088] Receive a key configuration signal input by a user through an input module, generate a state response signal according to the key configuration signal and a current response state, and send the state response signal to a corresponding output module;

[0089] The status response signal sent by the input module is received through the output module, and a status display result is generated based on the status response signal.

[0090] In an optional embodiment, the method may further include:

[0091] The software startup module executes the software startup operation based on the key configuration signal input by the user.

[0092] In an optional embodiment, the method may further include:

[0093] The power module responds to the hardware connection signal between the upper computer and the lower computer board. If there is a hardware connection signal between the upper computer and the lower computer board, power supply is provided to the lower computer board.

[0094] S230, receiving the test results sent by the lower computer board through the upper computer, and performing visual display.

[0095] In an optional implementation, the receiving of the test results sent by the lower computer board by the upper computer and displaying them visually may specifically include: receiving the test results sent by the lower computer board based on the universal asynchronous receiver-transmitter interface by the information display module and displaying them visually.

[0096] In an optional embodiment, after the test results sent by the lower computer board are received by the upper computer and displayed visually, it can also include: obtaining the current query requirements input by the user through the information query module, determining the corresponding target query results in the historical data storage device based on the current query requirements, and visually displaying the target query results.

[0097] The technical solution of the embodiment of the present invention is that the upper computer is connected to the lower computer board by hardware, and the lower computer board is connected to the device to be tested by hardware; the number of devices to be tested is at least one; the upper computer is used to generate the current test command based on the current test demand input by the user, and send the current test command to the lower computer board; the lower computer board is used to receive the current test command, call the corresponding target test logic based on the current test command, and perform the corresponding test operation on the device to be tested based on the target test logic, generate the test result, and send the test result to the upper computer; the upper computer is used to receive the test result sent by the lower computer board and display it visually. Since the current test demand input by the user directly matches the corresponding test logic, there is no need for the user to modify the software program, and the lower computer board is used instead of bulky test equipment. Therefore, the problem of low test efficiency of electronic devices is solved, and electronic devices can be tested quickly and conveniently, which improves the test efficiency of electronic devices.

[0098] The electronic device testing system provided by the embodiment of the present invention can execute the electronic device testing method provided by any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method.

[0099] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

[0100] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. An electronic device testing system, characterized in that: The system comprises: a host computer, a slave computer board and a device under test; the host computer is connected to the slave computer board by hardware, and the slave computer board is connected to the device under test by hardware; the number of the device under test is at least one; The host computer is used to generate a current test command based on the current test requirement input by the user, and send the current test command to the lower computer board; The lower computer board is used to receive the current test command, call the corresponding target test logic based on the current test command, and perform the corresponding test operation on the device under test based on the target test logic, generate the test result, and send the test result to the upper computer; The host computer is used to receive the test results sent by the lower computer board and perform visual display.

2. The system according to claim 1, characterized in that The host computer also includes: a device configuration module; The device configuration module is used to perform device configuration operations on the host computer based on the initial configuration information corresponding to the lower computer board.

3. The system according to claim 1, characterized in that The host computer comprises: a test command module; The test command module is used to determine the corresponding current command parameters and current command structure based on the current test requirements input by the user, and to combine and process the current command parameters based on the current command structure to generate a current test command.

4. The system according to claim 1, characterized in that The lower computer board includes: an application software module and a sample module; the sample module is connected to the device under test by hardware; the application software module includes a test logic set; The application software module is used to determine the corresponding target test logic in the test logic set based on the current test command, and perform corresponding test operations on the device under test in the sample module based on the target test logic to generate a test result.

5. The system according to claim 1, characterized in that The host computer includes: an information display module; The information display module is used to receive the test results sent by the lower computer board based on the universal asynchronous receiver-transmitter interface and perform visual display.

6. The system according to claim 1, characterized in that The lower computer board also includes: an input module and an output module; The input module is used to receive a key configuration signal input by a user, generate a state response signal according to the key configuration signal and a current response state, and send the state response signal to a corresponding output module; The output module is used to receive the status response signal sent by the input module and generate a status display result based on the status response signal.

7. The system according to claim 6, characterized in that The lower computer board also includes: a software startup module; The software startup module is used to execute a software startup operation based on a key configuration signal input by a user.

8. The system according to claim 1, characterized in that The host computer further includes: an information query module; The information query module is used to obtain the current query requirements input by the user, determine the corresponding target query results in the historical data storage based on the current query requirements, and visually display the target query results.

9. The system according to claim 1, characterized in that The lower computer board also includes: a power module; The power supply module is used to respond to the hardware connection signal between the upper computer and the lower computer board, and provide power supply to the lower computer board if there is a hardware connection signal between the upper computer and the lower computer board.

10. A method for testing an electronic device, characterized in that: The method comprises: a host computer, a lower computer board and a device to be tested; the host computer is connected to the lower computer board by hardware, and the lower computer board is connected to the device to be tested by hardware; the number of the device to be tested is at least one; Generate a current test command based on the current test requirement input by the user through the upper computer, and send the current test command to the lower computer board; Receive the current test command through the lower computer board, call the corresponding target test logic based on the current test command, perform the corresponding test operation on the device under test based on the target test logic, generate the test result, and send the test result to the upper computer; The upper computer receives the test results sent by the lower computer board and displays them visually.

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