Laser chip aging test equipment

Abstract

A laser chip aging test device disclosed by the present invention comprises a plurality of aging test devices, a transfer assembly and a transmission device, the plurality of aging test devices are arranged up and down into a plurality of rows, each row is provided with a plurality of aging test devices arranged left and right at intervals, and each aging test device comprises an aging base used for arranging laser chips at intervals. The transfer assembly and the aging test device are staggered up and down, and the transfer assembly comprises a horizontal table, an aging carrying table, an aging manipulator and a driving assembly, and the driving assembly is configured to drive the horizontal table to move up and down and drive the aging carrying table and the aging manipulator to move left and right relative to the horizontal table; the aging test device comprises an aging carrier, an aging manipulator and a transmission device, the aging manipulator transfers a laser chip from the aging carrier to the aging base, and the transmission device is configured to transfer the laser chip to the aging carrier and is responsible for discharging after the aging test of the laser chip is completed in the aging test device, so that the automation level of the equipment is remarkably improved, and the production efficiency is improved. The operation process is simplified, the labor cost is effectively reduced, and the testing efficiency and accuracy are greatly improved.

Description

Technical Field

[0001] The invention relates to a chip testing device, in particular to a laser chip aging testing device. Background Art

[0002] The service life of chip products is largely restricted by quality and reliability. To ensure its reliability, chips often need to undergo a critical step of aging testing after manufacturing, which is especially important for laser chips. However, under existing technical conditions, when performing aging tests on multiple laser chips, the test equipment needs to power each chip one by one and record data, which includes cumbersome steps of loading, powering on, powering off, and unloading, significantly reducing the test efficiency. The aging equipment / systems currently on the market are either too complicated in design or cannot support multi-channel parallel testing, which hinders the improvement of test efficiency.

[0003] Therefore, it is necessary to design a new laser chip aging test equipment to solve the above technical problems. Summary of the invention

[0004] The object of the present invention is to provide a laser chip aging test device with high automation and simple operation process.

[0005] To achieve the aforementioned purpose, the present invention adopts the following technical scheme: a laser chip aging test equipment, comprising a plurality of aging test devices, a transfer component and a transmission device, wherein the plurality of aging test devices are arranged in multiple rows up and down, and each row has a plurality of aging test devices arranged at intervals on the left and right, and each aging test device comprises an aging base for arranging laser chips at intervals, the transfer component is staggered up and down from the aging test device, and comprises a horizontal platform, an aging carrier, an aging manipulator and a driving component, the aging carrier and the aging manipulator are directly or indirectly arranged on the horizontal platform, the driving component is configured to drive the horizontal platform to move up and down and the aging carrier and the aging manipulator to move left and right relative to the horizontal platform, the aging manipulator transfers the laser chip from the aging carrier to the aging base, the transmission device is configured to transfer the laser chip to the aging carrier, and is responsible for discharging the laser chip after the aging test is completed in the aging test device.

[0006] The transmission device of the laser chip aging test equipment of the present invention realizes automatic feeding of large quantities of laser chips, and then the transfer component places the large quantities of laser chips one by one in multiple aging devices arranged in multiple rows above and below for automatic aging testing. After the aging test is completed, the laser chips are automatically transferred to the transmission device by the transfer component for functional testing. The laser chips that pass the test are automatically discharged through the discharge conveyor, and the unqualified ones are automatically discharged through the NG conveyor. Such a design not only significantly improves the automation level of the equipment, simplifies the operation process, and effectively reduces labor costs, but also greatly improves the test efficiency and accuracy, and can fully meet the high standards of accuracy and effectiveness of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] Figure 1 It is a front view of the laser chip aging test equipment of the present invention.

[0008] Figure 2 It is a top view of the aging test assembly of the laser chip aging test equipment of the present invention.

[0009] Figure 3 It is a plan view of the aging stage assembly of the laser chip aging test equipment of the present invention.

[0010] Figure 4 It is a three-dimensional schematic diagram of the transmission device of the laser chip aging test equipment of the present invention.

[0011] Figure 5 for Figure 4 Another angle of view.

[0012] Figure 6 It is a three-dimensional diagram of an aging stage, a test transfer stage or a test stage of the laser chip aging test equipment of the present invention.

[0013] Figure 7 A three-dimensional diagram of a chip box placed on a carrier.

[0014] Figure 8 Exploded view of the chip box and carrier separated.

[0015] Fig. 9 It is a three-dimensional diagram of the aging test device of the laser chip aging test equipment of the present invention.

[0016] Fig.10 for Fig. 9 Another angle of view.

[0017] Fig.11 It is a three-dimensional exploded view of the aging test device of the laser chip aging test equipment of the present invention.

[0018] Fig.12 It is a three-dimensional diagram of the deflection block of the laser chip aging test equipment of the present invention.

[0019] Fig.13 It is a three-dimensional diagram of the aging mechanism of the laser chip aging test equipment of the present invention.

[0020] Fig.14 for Fig.13 Another angle of view.

[0021] Fig.15 It is a three-dimensional exploded view of the aging mechanism of the laser chip aging test equipment of the present invention.

[0022] Fig.16 for Fig.15 Another angle of view.

[0023] Fig.17 for Fig.16 The 3D schematic diagram of the aging base and electrode mounting plate cooperating with the laser chip is shown.

[0024] Fig.18 for Fig.17 Enlarged view within the circle.

[0025] Fig.19 It is a cross-sectional view of an aging base of an aging mechanism of a laser chip aging test device of the present invention.

[0026] Fig. 20 It is a cross-sectional view of a light absorbing block of an aging mechanism of a laser chip aging test device of the present invention.

[0027] Fig.21 It is a cross-sectional view of the spectrometer body of the aging mechanism of the laser chip aging test equipment of the present invention. DETAILED DESCRIPTION

[0028] See also Figure 1 to Figure 2 As shown, an embodiment of the present invention discloses a laser chip aging test device 100, which includes aging test devices 10 arranged in multiple rows along the up and down directions, a transfer component 20, and a transmission device 30 arranged side by side with the aging test devices 10, and each row is arranged with multiple aging test devices 10 spaced apart from each other.

[0029] Please combine Figure 3As shown, the transfer component 20 is staggered up and down with the aging test devices 10 arranged in each row, ensuring that the transfer component 20 will not interfere with the operation of the aging test device 10 during the up and down movement. The transfer component 20 includes a horizontal platform 21, an aging carrier 22, an aging manipulator 23 and a driving component (not shown). Under the action of the driving component, the horizontal platform 21 can drive the aging carrier 22 and the aging manipulator 23 to move up and down. The aging carrier 22 and the aging manipulator 23 are directly or indirectly arranged on the horizontal platform 21, and can move left and right on the horizontal platform 21 under the action of the driving component. The driving component can be selected from a cylinder, a motor or a screw transmission mechanism. Further, the aging manipulator 23 is separately configured with a driving member 230, which is used to drive the aging manipulator 23 to move up and down and rotate horizontally, that is, the manipulator 23 can move in the up and down, left and right and front and back directions, and the manipulator 23 is used to absorb the laser chip 303 on the aging carrier 22 to the aging test device 10 for aging test.

[0030] See also Figures 4 to 8 As shown, the transmission device 30 includes a feed conveyor 31, an empty conveyor 32, a test transfer table 33, a test carrier 34, a discharge conveyor 35, an NG conveyor 36 and a chip manipulator 37. The transmission device 30 is arranged in three layers along the up and down direction, including an upper layer, a middle layer and a lower layer, the middle layer is located between the upper layer and the lower layer, the feed conveyor 31 is arranged in the middle layer, the empty conveyor 32 is arranged in the lower layer, the test transfer table 33, the test carrier 34, the discharge conveyor 35 and the NG conveyor 36 are arranged in the upper layer. The aging carrier 22 can be horizontally aligned with the feed conveyor 31, the empty conveyor 32 and the test transfer table 33 at different time periods as needed.

[0031] The aging platform 22, the feeding conveyor 31, the unloaded conveyor 32, the test transfer platform 33, the test platform 34, the discharging conveyor 35 and the NG conveyor 36 each include a motor, a driving wheel, a driven wheel and a synchronous belt connecting the driving wheel and the driven wheel. The motor is connected to the driving wheel to drive the driving wheel to rotate, and the synchronous belt is tensioned on the driving wheel and the driven wheel. When the motor directly drives the driving wheel to rotate, the driving wheel transfers power to the synchronous belt, and the synchronous belt moves at the same linear speed as the driving wheel, and transfers power to the driven wheel, thereby driving the driven wheel to rotate at a predetermined speed and direction. In the process of maintaining a constant linear speed, the synchronous belt pulls the carrier 301 on it to move horizontally, and the chip box 302 on the carrier 301 and the laser chip 303 stored therein move synchronously with the carrier 301. The structures of the aging platform 22, the test transfer platform 33 and the test platform 34 are basically the same, and are interchangeable and universal.

[0032] The feeding conveyor 31 is arranged horizontally, and the feeding direction is from the back to the front. When the feeding conveyor 31 is running, it moves the carrier 301 loaded with the chip box 302 and the laser chip 303 from the rear end to the front end.

[0033] The empty conveyor 32 is vertically parallel to the feed conveyor 31, and the front ends or rear ends of the two are vertically aligned.

[0034] The test turntable 33 , the test carrier 34 and the discharge conveyor 35 are arranged in the same straight line along the front-to-back direction, and each adjacent two are seamlessly connected and aligned to achieve smooth operation. The test carrier 34 is arranged between the test turntable 33 and the discharge conveyor 35 .

[0035] The NG conveyor 36 and the discharge conveyor 35 are arranged at intervals on the left and right, and the front ends and rear ends of the two conveyors are aligned on the left and right.

[0036] The chip manipulator 37 adopts a gantry truss manipulator. The chip manipulator 37 spans the two beams of the X-axis through the Y-axis and the Z-axis to form a gantry structure. The chip manipulator 37 is used to accurately absorb the laser chip 303, and then realize its flexible movement in the horizontal direction (left and right, front and back) and vertical direction (up and down) until the laser chip 303 is placed in the predetermined precise position.

[0037] The working principle of the conveying device 30 is as follows: S1, the carrier 301 loaded with the chip box 302 is placed at the rear end of the feed conveyor 31 manually by an operator or automatically by a robot, and the feed conveyor 31 pulls the carrier 301 to move to the front end of the feed conveyor 31; S2, the aging platform 22 moves up and down until it is aligned with the front end of the feeding conveyor 31, and the feeding conveyor 31 continues to pull the carrier 301 to move onto the aging platform 22; S3, the aging platform 22 carries the carrier 301 and moves upward until it is horizontally aligned with the test transfer platform 33 and then maintains it for a predetermined time; S4, the aging robot 23 of the transfer assembly 20 absorbs the laser chip 303 and moves it to the aging test device 10 until the chip box 302 is empty; S5, the aging stage 22 delays the empty carrier 301 and the empty chip box 302 thereon to move downward until the front end of the empty conveyor 32 is aligned, and then the aging stage 22 pulls the empty carrier 301 to the empty conveyor 32 for temporary storage; S6, when the laser chip 303 is tested by the chemical testing device 10, the empty carrier is pulled to the aging stage 22 by the empty conveyor 32, and then the aging stage 22 carries the empty carrier 301 and moves upward until the test transfer table 33 is horizontally aligned; S7, the aging robot 23 of the aging device 10 absorbs the aged laser chips 303 and places them in the chip box 302 on the empty carrier 301 until the chip box 302 is full of laser chips 303; S8, the aging stage 22 pulls the carrier 301 to drive the chip box 302 full of laser chips to move to the test transfer table 33; S9, the test transfer table 33 pulls the carrier 301 to drive the chip box 302 loaded with laser chips 303 to move to the test carrier 34, and the chip manipulator 37 absorbs the laser chip 303 and moves it to the functional test device (not shown) for testing. The functional test items include at least one of power, spot-divergence angle, spectrum and polarization; S10, the laser chip 303 that has passed the test is sucked by the chip manipulator 37 and moved to the chip box 302 on the carrier 301 on the test stage 34, and the laser chip 303 that has failed the test is sucked by the chip manipulator 37 and moved to the chip box 302 on the carrier 301 on the NG conveyor 36; Finally, the test platform 34 pulls the carrier 301 and the chip box 302 loaded with the tested laser chips 303 to move to the unloading conveyor 35 for unloading backwards, and the NG conveyor 36 simultaneously unloads the tested laser chips 303 NG.

[0038] See also Figures 9 to 12 As shown, each testing device 10 includes an automatic press-fitting mechanism 11 and an aging mechanism 12 . The automatic press-fitting mechanism 11 is used to press-fit the laser chip 303 onto the aging mechanism 12 .

[0039] The automatic press-fitting mechanism 11 includes a main body 111 , an electric push rod 112 , a floating connection mechanism 113 , a deflection mechanism 114 , a plurality of pressing blocks 115 and an auxiliary device 116 .

[0040] The main seat body 111 includes a bottom plate 131, a vertical plate 132, a pair of side plates 133 and a pair of pivot blocks 134. The vertical plate 132 and the side plates 133 are fixed to the front end of the bottom plate 131, and the pivot block 134 is located at the rear end of the bottom plate 131. The bottom plate 131 is horizontally arranged, the vertical plate 132 and the side plates 133 are respectively arranged vertically, and the lower ends are respectively fixed to the upper surface of the bottom plate 131. The front ends of the two side plates 133 are vertically fixedly connected to the left and right ends of the vertical plate 132, and the three form a U shape. The pair of pivot blocks 134 are arranged opposite to each other on the left and right sides, and a part of each pivot block 134 is fixed to the bottom plate 131, and the other part is fixed to the aging mechanism 12. The pivot block 134 is divided into two parts for easy manufacturing. It includes a first pivot block 135 and a second pivot block 136 that are close together. The first pivot block 135 is provided with a circular hole 137 that passes through the first pivot block 135 on the left and right sides. The second pivot block 136 is provided with a movable hole 138 that passes through the second pivot block 136 on the left and right sides. The movable hole 138 extends downward and backward in an inclined manner. The inner wall of the movable hole 138 is provided with an arc surface 1381 and an inclined surface 1382 located in front of the arc surface 1381. The arc surface 1381 is concave backward. In other embodiments, the pivot block 134 is fixed to one of the bottom plate 131 and the aging mechanism 12 separately.

[0041] The electric push rod 112, also known as a linear drive, is an electric drive device that converts the rotational motion of the motor into the linear reciprocating motion of the push rod. The front end of the electric push rod 112 is fixedly connected to the vertical plate 132 of the main seat body 111 through a bracket 1121, and the bracket 1121 is a U-shaped sheet. The bracket 1121 is fixed to the vertical plate 132, and the electric push rod 112 and the bracket 1121 are rotatably connected. The front end of the electric push rod 112 can rotate up and down around the bracket 1121. The front end of the electric push rod 112 is provided with a connecting rod 1122 that can be telescopic forward and backward.

[0042] The floating connection mechanism 113 is connected between the connecting rod 1122 and the deflection mechanism 114. The floating connection mechanism 113 includes a first connection block 141, a second connection block 142 located behind the first connection block 141, and a spring (not shown) connected between the first connection block 141 and the second connection block 142. The first connection block 141 and the connecting rod 1122 are rotationally connected, and the second connection block 142 and the deflection mechanism 114 are rotationally connected.

[0043] The deflection mechanism 114 includes a deflection block 151, an upper fixed block 152, a lower fixed block 153, a front rotation shaft 154, an upper rotation shaft 155 and a lower rotation shaft 156. The deflection block 151 is a long strip structure extending left and right, and includes a main body 1511 and a boss 1512 extending forward from the upper end of the main body 1511. The cross section of the main body 1511 is roughly triangular. The left and right sides of the main body 1511 are convexly provided with a circular shaft 1513, which is inserted into the circular hole 137 of the pivot block 134 and can rotate in the circular hole 137.

[0044] The front rotating shaft 154 is disposed through the front end of the deflection block 151 and the second connecting block 142 , so that the two can rotate relative to each other.

[0045] The upper fixing block 152 and the lower fixing block 153 are fixed together up and down, and a concave-convex structure that fits with each other is provided between the upper fixing block 152 and the boss 1512. The concave-convex structure is connected together by the upper rotating shaft 155, so that the upper fixing block 152 and the lower fixing block 153 can rotate relative to the boss 1512. In other embodiments, the upper fixing block 152 and the lower fixing block 153 are set as one body.

[0046] The lower rotating shaft 156 is fixed to both ends of the lower fixing block 153 , and the outer end thereof extends into the movable hole 138 of the pivot block 134 , and can move along the arc surface 1381 in the movable hole 138 .

[0047] The clamping blocks 115 are installed on the lower fixed block 153 at intervals. Electrodes are arranged on the clamping blocks 115. The clamping blocks 115 are used to vertically press down the laser chip 303 to achieve stable clamping of the laser chip 303 and ensure reliable electrical contact between the electrodes and the laser chip 303.

[0048] The auxiliary device 116 is installed on the aging mechanism 12 and is located below the deflection mechanism 114. It includes an auxiliary block 161, a plurality of springs (not shown) installed on the auxiliary block 161, and a travel detector (not shown) installed on the auxiliary block 161. The spring presses upward on the deflection block 151 to provide the deflection block 151 with a tendency to maintain upward movement. The travel detector is used to monitor the state of the deflection block 151 moving to the final position in real time and to feed back this information to the system in real time.

[0049] The working principle of the automatic pressing mechanism 11 is as follows: the connecting rod 1122 of the electric push rod 112 extends backward, driving the floating connection mechanism 113 to drive the deflection mechanism 114 to rotate. During this process, the rear end of the electric push rod 112 rotates relative to the main seat body 111, and the deflection block 151 rotates around the circular axis 1513. The lower rotating shaft 156 is limited to the movable hole 138 to move downward and backward. The upper fixed block 152 and the lower fixed block 153 follow the deflection block 151 to move downward until the clamping blocks 115 of the lower fixed block 153 press downward on the laser chip 303 on the aging mechanism 12, thereby clamping and powering the laser chip 303, which is convenient for the aging mechanism 12 to test the various performance indicators of the laser chip 303 to ensure that its functions and specifications meet the standards. After the aging test is completed, driven by the electric push rod 112, each component returns to the initial position and waits for the next pressing operation.

[0050] See also Figures 13 to 21As shown, the aging mechanism 12 includes an aging base 121 , a plurality of temperature sensors 123 , a reflective base 124 , a beam splitter base 125 , a plurality of optical fiber heads 126 and a plurality of PD sensors 127 .

[0051] The aging base 121 is made of a metal material with high thermal conductivity. The top surface is provided with a row of grooves 1211 spaced apart from each other on the left and right, and mounting grooves 1212 extending downward from each groove 1211. The grooves 1211 are close to the front end of the aging base 121 and are used to place the laser chip 303. The mounting grooves 1212 are recessed in the front end surface of the aging base 121. Each temperature sensor 123 is installed one by one in the corresponding mounting groove 1212 and close to the groove 1211 for testing the working temperature of the laser chip 303.

[0052] The aging base 121 is also provided with a water flow channel 1213 that runs through the aging base 121 from left to right and a plurality of middle partitions 1214 that are arranged in the water flow channel 1213 at intervals from front to back. The upper and lower ends of the middle partitions 1214 are connected to the inner side wall of the water flow channel 1213. The middle partitions 1214 are provided with a plurality of through holes 1215 that run through the middle partitions 1214 from front to back. The through holes 1215 are arranged in a matrix on the middle partitions 1214. The through holes 1215 on the two middle partitions 1214 that are adjacent to each other from front to back are aligned one by one. Since the through holes 1215 are provided on the middle partitions 1214, the water flow that passes through the water flow channel 1213 of the aging base 121 is guided to form a "turbulent" state. This turbulent effect significantly improves the heat exchange process and greatly enhances the heat dissipation performance.

[0053] The reflective seat 124 is arranged at the front side of the aging base 121. The reflective seat 124 is a long strip extending from left to right. It includes a plurality of light absorbing holes 1241, a plurality of light emitting holes 1242 and a water channel 1243. The light absorbing holes 1241 are arranged at intervals on the reflective seat 124 from left to right, corresponding to the grooves 1211 one by one. The light absorbing holes 1241 extend upward and forward from the rear end surface of the reflective seat 124 to the light emitting holes 1242. Each light emitting hole 1242 is arranged horizontally, extending forward from the upper part of the light absorbing hole 1241 to the front end surface of the reflective seat 124. The water channel 1243 runs through the reflective seat 124 from left to right, providing efficient water cooling for the reflective seat 124. When the laser emitted by the laser chip 303 enters the light absorbing hole 1241 forward, it is emitted from the light emitting hole 1242 to the light splitting seat 125 after being emitted multiple times through the inner wall of the light absorbing hole 1241.

[0054] The beam splitter body 125 is provided with a plurality of through holes 1251 which penetrate the beam splitter body 125 front and back and are arranged at intervals left and right, and a beam splitting hole 1252 which extends downward from each through hole 1251 out of the beam splitter body 125. The through holes 1251 are arranged horizontally, and the beam splitting holes 1252 are arranged vertically. The inner diameter of the beam splitting hole 1252 is smaller than the inner diameter of the through holes 1251. The through holes 1251 are aligned front and back with the light exit holes 1242 one by one.

[0055] A plurality of optical fiber heads 126 are installed on a mounting plate 1260 at intervals on the left and right, and the mounting plate 1260 is installed on the front end of the beam splitter body 125, and the optical fiber heads 126 are aligned with the through holes 1251 one by one, and are used to receive the laser emitted from the through holes 1251. Each optical fiber head 126 is independently connected to the spectrometer through an optical fiber line, and an efficient and accurate optical detection system is constructed, which can capture and analyze the optical properties of the laser emitted from the through hole 1251 in real time, including but not limited to core parameters such as wavelength, intensity, and spectral distribution.

[0056] Several PD sensors 127 are arranged on a circuit board 1270 at intervals, and are inserted into corresponding spectroscopic holes 1252 one by one to collect the power of the laser. These PD sensors absorb the laser beam and instantly output an electrical signal that is strictly proportional to the beam power, thereby achieving accurate measurement of the laser power. The circuit board 1270 is installed at the bottom of the spectroscopic seat 125, ensuring the stability and reliability of the entire measurement system.

[0057] The working principle of the aging mechanism 12 is as follows: first, the temperature sensor is close to the laser chip 303 placed on the aging base 121, and the working temperature of the laser chip 303 is tested in real time and accurately; secondly, the laser is emitted into the reflective seat body 124. Thanks to the inclined setting of the light absorption hole 1241 and the horizontal layout of the light output hole 1242, when the laser passes through the two channels, its energy undergoes multiple reflections and scattering caused by the inner wall, thereby achieving an effective attenuation process; the attenuated laser is guided and tilted into the splitter seat body 125, and multiple emissions and scattering are again caused by the inner wall. One beam is accurately emitted to the optical fiber head 126 and finally transmitted to the spectrometer for detailed detection and analysis; the other beam enters the splitter hole 1252 and is captured by the PD sensor 127 to collect power information.

[0058] The working principle of the laser chip aging test device 100 of the present invention is as follows: First, the feed conveyor 31 of the transmission device 30 transmits the laser chip 303 to be tested to the aging stage 22 of the transfer assembly 20; Secondly, the driving component controls the aging stage 22 to move left and right on the horizontal platform 21. At the same time, the aging manipulator 23 sequentially picks up the laser cores 300 on the aging stage 22 and transfers them to the aging test devices 10 in the same row. After the aging test devices 10 in the same row are fully loaded, the driving component drives the horizontal platform 21 and the aging stage 22 and the aging manipulator 23 thereon to move up and down, so that the aging manipulator 23 can pick up the laser chips 303 one by one and transfer them to the aging test devices 10 in different rows. After the aging test is completed, with the cooperation of the driving component, the aging manipulator 23 transfers the laser chips 303 to the aging stage 22. Next, the aging stage 22 and the test turntable 33 are kept horizontally aligned, and the laser chip 303 is moved to the test turntable 33 by indirect driving. For the subsequent workflow, please refer to the working principle of the transmission device 30.

[0059] The laser chip aging test equipment 100 of the present invention realizes automatic feeding of large quantities of laser chips 303 through an efficient transmission device 30, and then the transfer component 20 places the large quantities of laser chips 303 one by one in a plurality of aging devices 10 arranged in multiple rows above and below for automated aging testing. After the aging test is completed, the laser chips 303 are automatically transferred by the transfer component 20 to the transmission device 30 for functional testing. The laser chips 303 that pass the test are automatically discharged through the discharge conveyor 35, while the unqualified ones are automatically discharged through the NG conveyor 36. Such a design not only significantly improves the automation level of the equipment, simplifies the operation process, and effectively reduces labor costs, but also greatly improves the test efficiency and accuracy, and can fully meet the high standards for accuracy and effectiveness of the test.

[0060] Although the preferred embodiments of the present invention have been disclosed for illustrative purposes, those skilled in the art will appreciate that various modifications, additions and substitutions are possible, without departing from the scope and spirit of the invention as disclosed in the accompanying claims.

Claims

1. A laser chip aging test device, characterized in that: It includes a plurality of aging test devices, a transfer component and a transmission device. The plurality of aging test devices are arranged in multiple rows up and down, and each row has a plurality of aging test devices arranged at intervals on the left and right. Each aging test device includes an aging base for arranging laser chips at intervals. The transfer component is staggered up and down from the aging test device, and includes a horizontal platform, an aging carrier, an aging manipulator and a driving component. The aging carrier and the aging manipulator are directly or indirectly arranged on the horizontal platform. The driving component is configured to drive the horizontal platform to move up and down and the aging carrier and the aging manipulator to move left and right relative to the horizontal platform. The aging manipulator transfers the laser chip from the aging carrier to the aging base. The transmission device is configured to transfer the laser chip to the aging carrier, and is responsible for discharging the laser chip after the aging test is completed in the aging test device.

2. The laser chip aging test equipment according to claim 1, characterized in that: The aging robot is equipped with a driving component for driving the aging robot to move up and down and rotate horizontally.

3. The laser chip aging test equipment according to claim 1, characterized in that: The transmission device includes a feed conveyor, an empty conveyor, a test turntable, a test platform, a discharge conveyor, an NG conveyor and a chip manipulator. The feed conveyor is arranged on the middle layer, the empty conveyor is arranged on the lower layer, the test turntable, the test platform, the discharge conveyor and the NG conveyor are arranged on the upper layer respectively. The aging platform seamlessly connects with one of the feed conveyor, the empty conveyor and the test turntable at different time periods during the up and down movement.

4. The laser chip aging test equipment according to claim 3, characterized in that: The test turntable, the test carrier and the discharge conveyor are arranged in the same straight line along the front-to-back direction, and each adjacent two are seamlessly connected. The test carrier is located between the test turntable and the discharge conveyor, and the NG conveyor and the discharge conveyor are arranged at intervals on the left and right. The chip manipulator is configured to absorb the laser chip and then realize its flexible movement to a predetermined position in the horizontal and vertical directions.

5. The laser chip aging test equipment according to claim 3, characterized in that: The feed conveyor, empty conveyor, aging platform, test transfer platform, test platform, discharging conveyor or NG conveyor includes a motor, a driving wheel, a driven wheel and a synchronous belt connecting the driving wheel and the driven wheel. The motor is connected to the driving wheel to drive the driving wheel to rotate, and the synchronous belt is tensioned on the driving wheel and the driven wheel.

6. The laser chip aging test equipment according to claim 3, characterized in that: The empty conveyor and the feed conveyor are parallel to each other, and the front ends or rear ends of the two are aligned up and down.

7. The laser chip aging test equipment according to claim 1, characterized in that: The aging base is provided with a water flow channel penetrating the aging base from left to right and a plurality of middle partitions arranged in the water flow channel at intervals from front to back. The upper and lower ends of the middle partitions are connected to the inner side walls of the water flow channel. The middle partitions are provided with a plurality of through holes penetrating the middle partitions from front to back. The through holes are arranged in a matrix on the middle partitions, and the through holes on the two middle partitions adjacent to each other are aligned front to back one by one.

8. The laser chip aging test equipment according to claim 1, characterized in that: The aging test device comprises an automatic pressing mechanism and an aging mechanism, wherein the automatic pressing mechanism is used to press-fit the laser chip onto the aging base; the aging mechanism comprises the aging base, a reflective base, a spectroscopic base, a plurality of optical fiber heads and a plurality of PD sensors; the reflective base is located between the aging base and the spectroscopic base, the reflective base is provided with a light absorption hole and a light output hole, the light absorption hole extends upward and forwardly from the rear end surface of the reflective base to the light output hole, and the light output hole extends forward to the front end surface of the reflective base; the spectroscopic base is provided with a through hole that penetrates the spectroscopic base front and back and a spectroscopic hole that extends downward from the through hole out of the spectroscopic base, the through hole is aligned front and back with the light output hole, the optical fiber head is installed at the front end of the spectroscopic base, aligned front and back with the through hole, and the PD sensor extends into the spectroscopic hole.

9. The laser chip aging test equipment according to claim 8, characterized in that: The automatic pressing mechanism includes a main seat body, an electric push rod, a floating connection mechanism, a deflection mechanism and a plurality of clamping blocks. The front end of the electric push rod is rotatably connected to the main seat body, and the rear end is provided with a connecting rod that can be telescoped forward and backward. The floating connection mechanism is connected between the connecting rod and the deflection mechanism. A plurality of the clamping blocks are installed on the deflection mechanism in a spaced arrangement on the left and right sides. The deflection mechanism is rotatably installed on the main seat body. Under the action of the electric push rod, the deflection mechanism can rotate up and down, thereby driving the plurality of the clamping blocks to press downward onto a row of laser chips spaced apart on the test device.

10. The laser chip aging test equipment according to claim 9, characterized in that: The deflection mechanism includes a deflection block, an upper fixed block, a lower fixed block and an upper rotating shaft. The deflection block is rotatably installed on the main seat body, the upper fixed block is rotatably installed on the deflection block, the lower fixed block is fixed to the upper fixed block, and a plurality of clamping blocks are installed on the lower fixed block at intervals on the left and right; the deflection block includes a main body and a boss extending forward from the upper end of the main body, the main body is rotatably installed on the main seat body, and the upper fixed block is rotatably installed on the boss; a concave-convex structure that cooperates with each other is provided between the boss and the upper fixed block, and the upper rotating shaft is passed through the concave-convex structure.

11. The laser chip aging test equipment according to claim 10, characterized in that: The deflection mechanism also includes a lower rotating shaft, the main seat body is provided with a movable hole, one end of the lower rotating shaft is installed on the lower fixed block, and the other end is restricted to move up and down and forward and backward in the movable hole; the movable hole extends downward and backward at an angle, and its inner wall is provided with an arc surface and an inclined surface located in front of the arc surface.

12. The laser chip aging test equipment according to claim 11, characterized in that: The main seat body includes a base plate and a pair of pivot blocks installed on the left and right sides of the base plate, and the movable hole is set on the pivot block; the pivot block is provided with a circular hole, and the left and right sides of the deflection block are protruding with circular shafts, the circular shafts are inserted into the circular holes, and the deflection block is configured to rotate around the circular shaft.

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