Welding-free radio frequency connector test system

Abstract

The invention relates to the technical field of welding-free radio frequency connectors, and discloses a welding-free radio frequency connector test system, which comprises a test voltage data acquisition unit and a test result output unit. According to the welding-free radio frequency connector test system, input voltage data, output voltage data, plugging times, reflected signal amplitude data, incident signal amplitude data, plugging force data during connection and pushing-open force data during separation of a welding-free radio frequency connector are acquired; and according to the data, correspondingly calculating an insertion loss variable quantity, a return loss variable quantity and an insertion and extraction force variable value, comparing the numerical values with a corresponding maximum variable value designed by the welding-free radio frequency connector, judging whether the welding-free radio frequency connector is abnormal or not, and correspondingly generating an abnormal signal. A tester can read and record the number according to the data contained in the displayed abnormal signal, manual operation and analysis are not needed, the labor cost is reduced, and meanwhile the phenomenon that the test result deviates due to human errors can be avoided.

Description

Technical Field

[0001] The invention relates to the technical field of solderless radio frequency connectors, and in particular to a solderless radio frequency connector testing system. Background Art

[0002] Against the background of the rapid development of modern electronic technology, the trend of miniaturization, modularization and high frequency of equipment has become increasingly obvious, which has put forward higher requirements on the performance and operational convenience of connectors. Solderless RF connectors have come into being. They not only meet the needs of high-frequency signal transmission, but also show significant advantages in installation convenience and maintenance flexibility. The biggest feature of solderless RF connectors is their "solderless" design, which means that there is no need for complex welding operations during the installation process. The connection can be completed with a simple plug and unplug. The use of solderable RF connectors also greatly simplifies maintenance and repair work. When the equipment fails or needs to be upgraded, the connector can be replaced by a simple plug and unplug operation, avoiding the desoldering problem that may be encountered in traditional welding methods, improving maintenance efficiency and reducing maintenance costs.

[0003] During the production process, solderless RF connector testing is an important part of quality control. Through testing, connectors that do not meet performance standards can be screened out to ensure that each batch of products meets quality standards. At present, the testing of RF connectors involves complex RF technology and high-frequency signal processing, which requires professional technicians to operate and analyze, which not only increases labor costs, but may also lead to inaccurate test results due to human analysis errors. Summary of the invention

[0004] 1. Technical issues to be solved

[0005] In view of the deficiencies in the prior art, the present invention provides a solderless RF connector testing system, which has the advantages of collecting input voltage data, output voltage data, plugging and unplugging times, reflected signal amplitude data, incident signal amplitude data, plugging force data during connection and pulling force data during separation of the solderless RF connector, and calculating the insertion loss change, return loss change and plugging force change values ​​according to these data, and comparing these values ​​with the corresponding maximum change values ​​designed for the solderless RF connector to determine whether the solderless RF connector has an abnormality, and generating an abnormal signal accordingly. The tester can read and record the data contained in the displayed abnormal signal without manual operation and analysis, which reduces labor costs and avoids deviations in test results caused by human errors, thereby solving the above-mentioned problems.

[0006] (II) Technical solution

[0007] To achieve the above-mentioned object, the present invention provides the following technical solutions: a solder-free RF connector test system, comprising a test voltage data acquisition unit, a plugging and unplugging times acquisition unit, a RF power acquisition unit, a plugging force acquisition unit, a test data processing and analysis unit, and a test result output unit;

[0008] The test voltage data acquisition unit is used to collect input voltage data and output voltage data of the solderless RF connector, the plugging and unplugging times acquisition unit is used to collect the plugging and unplugging times of the solderless RF connector, the RF power acquisition unit is used for the reflected signal amplitude data and the incident signal amplitude data of the solderless RF connector, the plugging force acquisition unit is used to collect the plugging force data when the solderless RF connector is connected and the pulling force data when it is separated, and the test voltage data acquisition unit, the plugging and unplugging times acquisition unit, the plugging force acquisition unit and the RF power acquisition unit send the collected data to the test data processing and analysis unit;

[0009] The test data processing and analysis unit calculates the initial insertion loss value and the insertion loss variation according to the input voltage data, the output voltage data and the number of plugging and unplugging times, respectively; the test data processing and analysis unit calculates the initial return loss value and the return loss variation according to the reflected signal amplitude data, the incident signal amplitude data and the number of plugging and unplugging times; the test data processing and analysis unit calculates the plugging and unplugging force variation according to the plugging force data, the prying force data and the number of plugging and unplugging times; the test data analysis unit determines whether the insertion loss variation during the test of the solder-free RF connector is abnormal according to the insertion loss variation; when an abnormality occurs, generates an abnormal signal one; the test data analysis unit determines whether the return loss variation is abnormal according to the return loss variation; when an abnormality occurs, generates an abnormal signal two; the test data processing and analysis unit determines whether the plugging and unplugging force variation is abnormal according to the plugging and unplugging force variation; when an abnormality occurs, generates an abnormal signal three; the test data processing and analysis unit sends the generated abnormal signal one, abnormal signal two or abnormal signal three to the test result output unit;

[0010] The test result output unit displays the received abnormal signal one, abnormal signal two or abnormal signal three.

[0011] Preferably, the initial insertion loss value calculation expression is as follows:

[0012]

[0013] In the formula, Cs represents the initial insertion loss value, sv represents the input voltage data, and cv represents the output voltage data. Indicates voltage contrast value, -20log 10 Converting the voltage comparison value to a logarithmic expression produces the initial insertion loss value.

[0014] Preferably, the insertion loss change calculation expression is as follows:

[0015]

[0016] In the formula, CSh represents the insertion loss change, CSh i Indicates the insertion loss change of the i-th test, sv i Indicates the input voltage data during the i-th test, cv i Represents the output voltage data during the i-th test.

[0017] Preferably, the initial return loss calculation expression is as follows:

[0018]

[0019] In the formula, Chb represents the initial echo energy loss, fs represents the reflected signal amplitude data, rs represents the incident signal amplitude, -20log 10 It means converting the comparison value of the reflected signal amplitude data and the incident signal amplitude into logarithmic expression, and the result is the initial return loss.

[0020] Preferably, the return loss change calculation expression is as follows:

[0021]

[0022] In the formula, Chh represents the change in return loss, Chh i represents the change in return loss during the i-th test, fs i Represents the reflected signal amplitude data at the i-th test, rs i Represents the incident signal amplitude at the i-th test.

[0023] Preferably, the calculation expression of the plugging force change value is as follows:

[0024]

[0025] In the formula, Cbb represents the change value of the plugging and unplugging force, crl represents the plugging force data, bcl represents the pulling force data, and Cbb i Indicates the change in insertion and extraction force during the i-th test, crl i represents the plugging force data of the i-th test, bcl i represents the pulling force data during the i-th test, It indicates the ratio of the insertion force data to the unplugging force data in the first test. It represents the ratio of the plugging force data to the unplugging force data during the i-th test. The difference between the two is the plugging force change value.

[0026] Preferably, the generation process of the abnormal signal 1 is as follows:

[0027] The calculated insertion loss change CSh for the i-th test i Compared with the maximum insertion loss change of the solderless RF connector design, when the insertion loss change CSh of the i-th test i When the insertion loss variation is greater than the maximum insertion loss variation designed for the solderless RF connector, it is determined that the insertion loss variation during the solderless RF connector test is abnormal, and an abnormal signal 1 is generated.

[0028] Preferably, the generation process of the abnormal signal 2 is as follows:

[0029] The return loss change Chh generated during the i-th test is calculated i Compared with the maximum return loss change of the solderless RF connector design, the return loss change Chh during the i-th test i When it is greater than the maximum return loss change designed for the solderless RF connector, it is determined that the return loss change during the solderless RF connector test is abnormal, and abnormal signal 2 is generated.

[0030] Preferably, the generation process of the abnormal signal three is as follows:

[0031] The calculated plug-in force change value Cbb for the i-th test i Compared with the maximum insertion loss change of the solderless RF connector design, the plug-in force change value Cbb during the i-th test i When the plugging and unplugging force variation value is greater than the maximum plugging and unplugging force variation value designed for the solderless RF connector, it is determined that the plugging and unplugging force variation value during the solderless RF connector test is abnormal, and abnormal signal three is generated.

[0032] Preferably, the abnormal signal one includes the specific numerical value of the abnormal insertion loss change and the number of times the abnormality occurs, the abnormal signal two includes the specific numerical value of the abnormal return loss change and the number of times the abnormality occurs, and the abnormal signal three includes the specific numerical value of the abnormal plugging and unplugging force change and the number of times the abnormality occurs.

[0033] Compared with the prior art, the present invention provides a solder-free RF connector testing system, which has the following beneficial effects:

[0034] The present invention collects input voltage data, output voltage data, plugging and unplugging times, reflected signal amplitude data, incident signal amplitude data, plugging force data during connection, and pulling force data during separation of a solderless radio frequency connector, and calculates insertion loss variation, return loss variation, and plugging force variation values ​​according to these data, and compares these values ​​with corresponding maximum variation values ​​designed for the solderless radio frequency connector to determine whether the solderless radio frequency connector has an abnormality, and generates an abnormal signal accordingly. A tester can read and record the data contained in the displayed abnormal signal without manual operation and analysis, thereby reducing labor costs and avoiding deviations in test results caused by human errors. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 It is a schematic diagram of the system flow of the present invention. DETAILED DESCRIPTION

[0036] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0037] In view of the existing solderless RF connector test system, which requires professional technicians to operate and analyze, not only does it increase labor costs, but it may also lead to deviations in test results due to human analysis errors, resulting in inaccurate test results. Therefore, a solderless RF connector test system is proposed. Please refer to Figure 1 ,The system is composed of a test voltage data acquisition unit, a plugging and unplugging number acquisition unit, a radio frequency power acquisition unit, a plugging force acquisition unit, a test data processing and analysis unit and a test result output unit.

[0038] The test voltage data acquisition unit is used to collect the input voltage data and output voltage data of the solderless RF connector, the plugging and unplugging times acquisition unit is used to collect the plugging and unplugging times of the solderless RF connector, the RF power acquisition unit is used for the reflected signal amplitude data and the incident signal amplitude data of the solderless RF connector, and the plugging force acquisition unit is used to collect the plugging force data when the solderless RF connector is connected and the prying force data when it is separated.

[0039] Each of the above data collection units sends the collected data to the test data processing and analysis unit.

[0040] The test data processing and analysis unit calculates the initial insertion loss value and the insertion loss change according to the input voltage data, the output voltage data and the number of plug-in and plug-out times, wherein the initial insertion loss value calculation expression is as follows:

[0041]

[0042] In the formula, Cs represents the initial insertion loss value, sv represents the input voltage data, and cv represents the output voltage data. Indicates voltage contrast value, -20log 10 The voltage comparison value is converted into a logarithmic expression, that is, the result is an initial insertion loss value, and the input voltage data sv and the output voltage data cv at this time are respectively the input voltage data and the output voltage data generated when the solderless RF connector is tested for the first time.

[0043] The calculation expression of insertion loss change is as follows:

[0044]

[0045] In the formula, CSh represents the insertion loss change, CSh i Indicates the insertion loss change of the i-th test, sv i Indicates the input voltage data during the i-th test, cv i Represents the output voltage data during the i-th test.

[0046] The test data processing and analysis unit calculates the initial return loss and the return loss change according to the reflected signal amplitude data, the incident signal amplitude data and the number of plugging and unplugging times, wherein the initial return loss calculation expression is as follows:

[0047]

[0048] In the formula, Chb represents the initial echo energy loss, fs represents the reflected signal amplitude data, rs represents the incident signal amplitude, -20log 10 It means converting the comparison value of the reflected signal amplitude data and the incident signal amplitude into logarithmic expression, and the result is the initial return loss. The reflected signal amplitude data fs and the incident signal amplitude rs at this time are respectively the reflected signal amplitude data fs and the incident signal amplitude rs generated when the solderless RF connector is tested for the first time.

[0049] The expression for calculating the change in return loss is as follows:

[0050]

[0051] In the formula, Chh represents the change in return loss, Chh i represents the change in return loss during the i-th test, fs i Represents the reflected signal amplitude data at the i-th test, rs i Represents the incident signal amplitude at the i-th test.

[0052] The test data processing and analysis unit calculates the plugging force change value according to the plugging force data, the pulling force data and the plugging and unplugging times. The calculation expression is as follows:

[0053]

[0054] In the formula, Cbb represents the change value of the plugging and unplugging force, crl represents the plugging force data, bcl represents the pulling force data, and Cbb i Indicates the change in insertion and extraction force during the i-th test, crl i represents the plugging force data of the i-th test, bcl i represents the pulling force data during the i-th test, It indicates the ratio of the insertion force data to the unplugging force data in the first test. It represents the ratio of the plugging force data to the prying force data during the i-th test. The difference between the two is the plugging force change value. The plugging force data crl and the prying force data bcl at this time are respectively the plugging force data crl and the prying force data bcl generated during the first test of the solderless RF connector.

[0055] The test data analysis unit determines whether the insertion loss change during the solderless RF connector test is abnormal based on the insertion loss change. When an abnormality occurs, an abnormal signal 1 is generated. The judgment process is as follows:

[0056] The calculated insertion loss change CSh for the i-th test i Compared with the maximum insertion loss change of the solderless RF connector design, when the insertion loss change CSh of the i-th test i When the insertion loss variation is greater than the maximum insertion loss variation designed for the solderless RF connector, it is determined that the insertion loss variation during the solderless RF connector test is abnormal, and an abnormal signal 1 is generated.

[0057] The test data analysis unit determines whether the return loss change is abnormal according to the return loss change. When an abnormality occurs, an abnormal signal 2 is generated. The judgment process is as follows:

[0058] The return loss change Chh generated during the i-th test is calculated i Compared with the maximum return loss change of the solderless RF connector design, the return loss change Chh during the i-th test i When it is greater than the maximum return loss change designed for the solderless RF connector, it is determined that the return loss change during the solderless RF connector test is abnormal, and abnormal signal 2 is generated.

[0059] The test data processing and analysis unit determines whether the plugging and pulling force change value is abnormal according to the plugging and pulling force change value. When an abnormality occurs, an abnormal signal 3 is generated. The judgment process is as follows:

[0060] The calculated plug-in force change value Cbb for the i-th test i Compared with the maximum insertion loss change of the solderless RF connector design, the plug-in force change value Cbb during the i-th test i When the plugging and unplugging force variation value is greater than the maximum plugging and unplugging force variation value designed for the solderless RF connector, it is determined that the plugging and unplugging force variation value during the solderless RF connector test is abnormal, and abnormal signal three is generated.

[0061] When the test data processing and analysis unit sends the generated abnormal signal one, abnormal signal two or abnormal signal three to the test result output unit, when the test result output unit receives the corresponding abnormal signal, it displays the corresponding signal it receives. It should be noted that abnormal signal one includes the specific numerical value of the abnormal insertion loss change and the number of times the abnormality occurs, abnormal signal two includes the specific numerical value of the abnormal return loss change and the number of times the abnormality occurs, and abnormal signal three includes the specific numerical value of the abnormal plugging and unplugging force change and the number of times the abnormality occurs.

[0062] The tester can simply read and record the data contained in the displayed abnormal signal without the need for manual operation and analysis. This reduces labor costs and avoids deviations in test results caused by human errors.

[0063] The specific test experiments are as follows:

[0064] For model A solderless RF connector, the input voltage data of the solderless RF connector during the first plugging and unplugging is 10v, the output voltage data is 7v, the reflected signal amplitude data is 1.95v, the incident signal amplitude data is 2v, the plugging force data is 5N, and the pull-out force is 6N. The input voltage data of the solderless RF connector during the 1000th plugging and unplugging is 10v, the output voltage data is 5v, the reflected signal amplitude data is 0.8v, the incident signal amplitude data is 2v, the plugging force data is 2N, and the pull-out force is 2.2N. The maximum insertion loss change of the solderless RF connector is 0.5, the maximum return loss change of the solderless RF connector is ±2, and the maximum plugging and unplugging force change of the solderless RF connector is 0.05.

[0065] The initial insertion loss value is:

[0066]

[0067] The insertion loss change is:

[0068]

[0069] At this time, 2.922>0.5, indicating that the signal loss of the solderless RF connector has increased significantly, indicating that the solderless RF connector has been damaged or aged. An abnormal signal 1 is generated.

[0070] The initial return loss is:

[0071]

[0072] The return loss change is:

[0073]

[0074] At this time, -7.743>0.217-2, indicating that the return loss is large, the reflection is small, and the performance of the solderless RF connector is deteriorating, indicating that the reflection performance of the solderless RF connector is significantly deteriorating. Generate abnormal signal 2

[0075] The plugging and unplugging force changes are:

[0076]

[0077] At this time, 0.09>0.05, indicating that the plug interface of the solderless RF connector is worn, the connection of the solderless RF connector is unstable, the contact of the solderless RF connector is poor, the plug interface is stable, or the plug interface is damaged. Generate abnormal signal three.

[0078] Through the above experiment, the corresponding abnormal signals can be observed intuitively and the test results of the solderless RF connector can be mastered without the need for testers to manually calculate and measure.

[0079] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A solder-free RF connector testing system, characterized in that: It includes a test voltage data acquisition unit, a plug-in and plug-out times acquisition unit, a radio frequency power acquisition unit, a plug-in force acquisition unit, a test data processing and analysis unit, and a test result output unit; The test voltage data acquisition unit is used to collect input voltage data and output voltage data of the solderless RF connector, the plugging and unplugging times acquisition unit is used to collect the plugging and unplugging times of the solderless RF connector, the RF power acquisition unit is used for the reflected signal amplitude data and the incident signal amplitude data of the solderless RF connector, the plugging force acquisition unit is used to collect the plugging force data when the solderless RF connector is connected and the pulling force data when it is separated, and the test voltage data acquisition unit, the plugging and unplugging times acquisition unit, the plugging force acquisition unit and the RF power acquisition unit send the collected data to the test data processing and analysis unit; The test data processing and analysis unit calculates the initial insertion loss value and the insertion loss variation according to the input voltage data, the output voltage data and the number of plugging and unplugging times, respectively; the test data processing and analysis unit calculates the initial return loss value and the return loss variation according to the reflected signal amplitude data, the incident signal amplitude data and the number of plugging and unplugging times; the test data processing and analysis unit calculates the plugging and unplugging force variation according to the plugging force data, the prying force data and the number of plugging and unplugging times; the test data analysis unit determines whether the insertion loss variation during the test of the solder-free RF connector is abnormal according to the insertion loss variation; when an abnormality occurs, generates an abnormal signal one; the test data analysis unit determines whether the return loss variation is abnormal according to the return loss variation; when an abnormality occurs, generates an abnormal signal two; the test data processing and analysis unit determines whether the plugging and unplugging force variation is abnormal according to the plugging and unplugging force variation; when an abnormality occurs, generates an abnormal signal three; the test data processing and analysis unit sends the generated abnormal signal one, abnormal signal two or abnormal signal three to the test result output unit; The test result output unit displays the received abnormal signal one, abnormal signal two or abnormal signal three.

2. A solderless RF connector testing system according to claim 1, characterized in that: The initial insertion loss value calculation expression is as follows: In the formula, Cs represents the initial insertion loss value, sv represents the input voltage data, and cv represents the output voltage data. Indicates voltage contrast value, -20log 10 Converting the voltage comparison value to a logarithmic expression produces the initial insertion loss value.

3. A solderless RF connector testing system according to claim 2, characterized in that: The insertion loss change calculation expression is as follows: In the formula, CSh represents the insertion loss change, CSh i Indicates the insertion loss change of the i-th test, sv i Indicates the input voltage data during the i-th test, cv i Represents the output voltage data during the i-th test.

4. A solderless RF connector testing system according to claim 3, characterized in that: The initial return loss calculation expression is as follows: In the formula, Chb represents the initial echo energy loss, fs represents the reflected signal amplitude data, rs represents the incident signal amplitude, -20log 10 It means converting the comparison value of the reflected signal amplitude data and the incident signal amplitude into logarithmic expression, and the result is the initial return loss.

5. A solderless RF connector testing system according to claim 4, characterized in that: The return loss change calculation expression is as follows: In the formula, Chh represents the change in return loss, Chh i represents the change in return loss during the i-th test, fs i Represents the reflected signal amplitude data at the i-th test, rs i Represents the incident signal amplitude at the i-th test.

6. A solderless RF connector testing system according to claim 5, characterized in that: The calculation expression of the plugging force change value is as follows: In the formula, Cbb represents the change value of the plugging and unplugging force, crl represents the plugging force data, bcl represents the pulling force data, and Cbb i Indicates the change in insertion and extraction force during the i-th test, crl i represents the plugging force data of the i-th test, bcl i represents the pulling force data during the i-th test, It indicates the ratio of the insertion force data to the unplugging force data in the first test. It represents the ratio of the plugging force data to the unplugging force data during the i-th test. The difference between the two is the plugging force change value.

7. A solderless RF connector testing system according to claim 6, characterized in that: The generation process of the abnormal signal 1 is as follows: The calculated insertion loss change CSh for the i-th test i Compared with the maximum insertion loss change of the solderless RF connector design, when the insertion loss change CSh of the i-th test i When the insertion loss variation is greater than the maximum insertion loss variation designed for the solderless RF connector, it is determined that the insertion loss variation during the solderless RF connector test is abnormal, and an abnormal signal 1 is generated.

8. The solderless RF connector testing system according to claim 1, characterized in that: The generation process of the abnormal signal 2 is as follows: The return loss change Chh generated during the i-th test is calculated i Compared with the maximum return loss change of the solderless RF connector design, the return loss change Chh during the i-th test i When it is greater than the maximum return loss change designed for the solderless RF connector, it is determined that the return loss change during the solderless RF connector test is abnormal, and abnormal signal 2 is generated.

9. The solderless RF connector testing system according to claim 1, characterized in that: The generation process of the abnormal signal three is as follows: The calculated plug-in force change value Cbb for the i-th test i Compared with the maximum plug-in force change value of the solderless RF connector design, the plug-in force change value Cbb during the i-th test i When the insertion loss variation is greater than the maximum insertion loss variation designed for the solderless RF connector, it is determined that the plugging and unplugging force variation during the solderless RF connector test is abnormal, and abnormal signal three is generated.

10. The solderless RF connector testing system according to claim 9, characterized in that: The abnormal signal one includes the specific value of the abnormal insertion loss change and the number of times the abnormality occurs, the abnormal signal two includes the specific value of the abnormal return loss change and the number of times the abnormality occurs, and the abnormal signal three includes the specific value of the abnormal plugging and unplugging force change and the number of times the abnormality occurs.

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