Fault detection device and method for display circuit, display and electronic equipment

Abstract

The invention discloses a fault detection device and method for a display circuit, a display and electronic equipment, and relates to the field of display detection, and the fault detection device for the display circuit comprises a monitoring circuit which comprises a second transistor and a plurality of first transistors; the grounding end of each functional module is connected with the first end of the corresponding first transistor and is also connected with a power supply voltage pin of the MCU; the second end of the first transistor is connected with a power supply voltage pin of the MCU; the third end of the last first transistor is grounded; the third end of the last first transistor is also connected with the first end of the second transistor; in the adjacent first transistors, the third end of one of the adjacent first transistors is connected with the second end of the other adjacent first transistor; the second end of the second transistor is grounded, and the third end of the second transistor is connected with the power supply voltage pin and the level signal reading pin. According to the invention, the working state of each functional module of the display circuit can be monitored simultaneously.

Description

Technical Field

[0001] The present application relates to the field of display detection, and in particular to a display circuit fault detection device, method, display and electronic equipment. Background Art

[0002] A monitor is an output device used to display images, video or text information generated by devices such as computers, television signals, game consoles, etc.

[0003] The display circuit is generally composed of multiple functional modules, including power module, display control module and panel driver module. Failure of each functional module of the display circuit will affect the normal output of the display. The traditional monitoring technology is to access the GND pin of the display through the I / O port of the system host, build a 3.3V pull-up circuit in the I / O port, and connect the I / O port in series to the MCU. The MCU reads the level of the I / O port to monitor circuit failures.

[0004] However, this method can only monitor the circuit fault of one functional module and cannot monitor the fault conditions of other functional modules. Summary of the invention

[0005] The purpose of the present application is to provide a display circuit fault detection device, method, display and electronic equipment, which can simultaneously monitor the faults of various functional modules of the display circuit.

[0006] To achieve the above objectives, this application provides the following solutions:

[0007] In a first aspect, the present application provides a display circuit fault detection device, comprising: an MCU and a monitoring circuit;

[0008] The monitoring circuit includes a second transistor and a plurality of first transistors, and the first transistors correspond one-to-one to the functional modules in the display circuit;

[0009] The ground terminal of each of the functional modules is respectively connected to the first terminal of the corresponding first transistor;

[0010] The first end of each of the first transistors is also connected to a power supply voltage pin of the MCU;

[0011] A second end of the first transistor is connected to a power supply voltage pin of the MCU;

[0012] A third terminal of the last of the first transistors is grounded;

[0013] The third terminal of the last one of the first transistors is also connected to the first terminal of the second transistor;

[0014] Among adjacent first transistors, a third terminal of one adjacent first transistor is connected to a second terminal of another adjacent first transistor;

[0015] The second end of the second transistor is grounded, and the third end of the second transistor is respectively connected to a power supply voltage pin of the MCU and a level signal reading pin of the MCU;

[0016] Among them, when the functional module is working normally, the corresponding first transistor is turned on; when all the first transistors are turned on, the second transistor is turned on and outputs a low level to the MCU; when not all of the first transistors are turned on, the second transistor is turned off and outputs a high level to the MCU; the MCU is used to determine that all the functional modules are working normally when receiving the low level, and determine that there is a faulty functional module when receiving the high level.

[0017] In a second aspect, the present application provides a method for detecting a fault in a display circuit, the method being applied to the MCU in the first aspect, the method comprising:

[0018] Acquiring a level signal of the second transistor;

[0019] Detecting whether the level signal of the second transistor is at a low level;

[0020] When it is detected that the level signal of the second transistor is at a low level, determining that all functional modules operate normally;

[0021] When it is detected that the level signal of the second transistor is at a high level, determining that there is a faulty functional module;

[0022] Execute corresponding processing according to the preset processing strategy.

[0023] In a third aspect, the present application provides a display, comprising the fault detection device for the display circuit in the first aspect.

[0024] In a fourth aspect, the present application provides an electronic device, comprising the display in the third aspect.

[0025] According to the specific embodiments provided in this application, this application discloses the following technical effects:

[0026] The present application provides a display circuit fault detection device, method, display and electronic device, the display circuit fault detection device comprising: an MCU and a monitoring circuit; the monitoring circuit comprising a second transistor and a plurality of first transistors, and the first transistors correspond to the functional modules in the display circuit one by one; the grounding end of each functional module is respectively connected to the first end of the corresponding first transistor; the first end of each first transistor is also connected to the power supply voltage pin of the MCU; the second end of the first first transistor is connected to the power supply voltage pin of the MCU; the third end of the last first transistor is grounded; the third end of the last first transistor is also connected to the first end of the second transistor; in the adjacent first transistors In the body tube, the third end of one of the adjacent first transistors is connected to the second end of another adjacent first transistor; the second end of the second transistor is grounded, and the third end of the second transistor is respectively connected to the power supply voltage pin of the MCU and the level signal reading pin of the MCU; wherein, when the functional module is working normally, the corresponding first transistor is turned on; when all the first transistors are turned on, the second transistor is turned on and outputs a low level to the MCU, and when not all the first transistors are turned on, the second transistor is turned off and outputs a high level to the MCU, and the MCU is used to determine that all the functional modules are working normally when receiving the low level, and to determine that there is a functional module with a fault when receiving the high level. In the present disclosure, the first transistor and the second transistor are used to monitor whether there is a functional module with a fault in the functional module in the display circuit connected to the first transistor, the circuit design is simple, and the first transistor set corresponds to the functional module in the display circuit one by one, so that no matter how many functional modules are added to the display circuit, only the first transistor needs to be added, thereby achieving the purpose of simultaneously monitoring the circuit fault conditions of multiple functional modules in the display circuit, and improving the reliability of monitoring. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0028] Figure 1 Schematic diagram of the connection between a display and a printed circuit board in the related art Figure 1 ;

[0029] Figure 2 Schematic diagram of the connection between a display and a printed circuit board in the related art Figure 2 ;

[0030] Figure 3is a functional module diagram of a fault detection device for a display circuit according to an exemplary embodiment;

[0031] Figure 4 is a circuit structure diagram of a fault detection device for a display circuit according to an exemplary embodiment;

[0032] Figure 5 is a functional module diagram of a fault detection device for a display circuit according to an exemplary embodiment;

[0033] Figure 6 is a functional module diagram of a fault detection device for a display circuit according to an exemplary embodiment;

[0034] Figure 7 The figure is a flow chart of a method for detecting a fault in a display circuit according to an exemplary embodiment.

[0035] Description of reference numerals:

[0036] 1-MCU; 2-monitoring circuit; 21-first transistor; 22-second transistor; 221-second sub-transistor. DETAILED DESCRIPTION

[0037] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0038] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0039] As the size of displays increases, more and more integrated circuits (ICs) are needed on a display, such as Figure 1 As shown, the traditional method is to connect the flexible printed circuit board (FPC) of the display (Panel) with the printed circuit board (PCB) with circuit design by binding, and the external power and signal are provided through the connector (Connector) on the PCB to drive the display to work.

[0040] However, this approach has a big disadvantage. When one or more ICs have problems with binding, or one or more ICs are abnormal, it will cause abnormal display or even stop working. Moreover, because of concerns about quality issues, many customers require that rework is not allowed, which will increase the scrap cost. Figure 2 As shown, a solution of using Connector connection to replace traditional binding came into being.

[0041] for Figure 2 The circuit shown can solve the problem of poor binding. If it is just a plug-in problem, you only need to re-plug the Connector. If there is a problem with the IC on the monitor, you only need to scrap the monitor and the PCB can still be retained and used, thus saving costs.

[0042] However, the display circuit is generally composed of multiple functional modules, including power supply functional module, display control functional module and panel drive functional module. The traditional monitoring technology is to access the GND pin of the display screen through the I / O port of the system host, build a 3.3V pull-up circuit in the I / O port, and connect the I / O port in series to the MCU. The MCU reads the level of the I / O to monitor the circuit fault. In this way, only the circuit fault of one functional module can be monitored, and the fault conditions of other functional modules cannot be monitored.

[0043] In order to solve the above technical problems, the present disclosure provides a display circuit fault detection device, method, display and electronic equipment.

[0044] Figure 3 is a schematic structural diagram of a fault detection device for a display circuit according to an exemplary embodiment. Figure 3 As shown, the fault detection device of the display circuit includes:

[0045] MCU1 and monitoring circuit 2;

[0046] The monitoring circuit 2 includes a second transistor 22 and a plurality of first transistors 21, and the first transistors 21 correspond one-to-one to the functional modules in the display circuit;

[0047] The ground terminal of each functional module is respectively connected to the first terminal of the corresponding first transistor 21;

[0048] The first end of each first transistor 21 is also connected to the power supply voltage pin of MCU1;

[0049] The second end of the first transistor 21 is connected to the power supply voltage pin of the MCU1;

[0050] The third terminal of the last first transistor 21 is grounded;

[0051] The third terminal of the last first transistor 21 is also connected to the first terminal of the second transistor;

[0052] Among the adjacent first transistors 21, the third terminal of one adjacent first transistor 21 is connected to the second terminal of another adjacent first transistor 21;

[0053] The second end of the second transistor is grounded, and the third end of the second transistor is respectively connected to the power supply voltage pin of the MCU1 and the level signal reading pin of the MCU1;

[0054] Among them, when the functional module is working normally, the corresponding first transistor 21 is turned on; when all the first transistors 21 are turned on, the second transistor is turned on and outputs a low level to MCU1. When not all the first transistors 21 are turned on, the second transistor is turned off and outputs a high level to MCU1. MCU1 is used to determine that all functional modules are working normally when receiving a low level, and determine that there is a faulty functional module when receiving a high level.

[0055] The second transistor is turned on only when all the first transistors 21 are turned on.

[0056] In the present disclosure, when the display circuit has multiple functional modules, correspondingly, there will also be multiple first transistors 21. One of the multiple first transistors 21 is selected as the first first transistor 21, and another one of the remaining first transistors 21 is selected as the second first transistor 21. Then, the third end of the first first transistor 21 is connected to the second end of the second first transistor 21, and then one of the remaining first transistors 21 is selected as the third first transistor 21. Then, the third end of the second first transistor 21 is connected to the second end of the third first transistor 21, and so on. Finally, there will be one first transistor 21 left, and the remaining first transistor 21 is the last first transistor 21.

[0057] Among them, when the grounding terminal of functional module 1, the grounding terminal of functional module 2, ... the grounding terminal of functional module N-1 and the grounding terminal of functional module N are all low-level inputs, all the corresponding first transistors 21 are in the on state, so that the second transistor on the right is turned on. Since one end of the second transistor is grounded, a low level is output to MCU1; but when the level input to the grounding terminal of functional module 1, the grounding terminal of functional module 2, ... the grounding terminal of functional module N-1 and the grounding terminal of functional module N, one or more of which are high levels, the corresponding first transistor 21 will not be turned on, thereby making the second transistor not turned on. At this time, the second transistor outputs a high level to MCU1, and the working state of each functional module of the display circuit is judged by judging the type of level output by the second transistor to MCU1.

[0058] In the present disclosure, the first transistor 21 cooperates with the second transistor to monitor whether there is a faulty functional module in the display circuit connected to the first transistor 21. The circuit design is simple, and the first transistor 21 is set to correspond one-to-one with the functional module in the display circuit. In this way, no matter how many functional modules are added to the display circuit, the circuit fault conditions of the functional modules in the display circuit can be monitored, thereby achieving the purpose of simultaneously monitoring the circuit fault conditions of multiple functional modules in the display circuit and improving the reliability of monitoring.

[0059] In one embodiment, the first end of each first transistor 21 is connected to the power supply voltage pin of MCU1 through the first resistor R1; the third end of the last first transistor 21 is grounded through the second resistor R2; the third end of the second transistor is connected to the power supply voltage pin of MCU1 through the third resistor R3, and the third end of the second transistor is connected to the level signal reading pin of MCU1 through the fourth resistor R4.

[0060] By setting the resistor, a current limiting effect can be achieved to prevent damage to the MCU. At the same time, the MCU can read the output level. When the second transistor is turned on, the output level pin is directly connected to the ground, so the output level is low; when the second transistor is not turned on, the output pin is connected to the power supply voltage through the fourth resistor, so the output is high.

[0061] In one embodiment, the ground pin of the display is connected to the ground terminal of each functional module.

[0062] A GND pin of the display can be used, and then a GND pin is selected from each functional module included in the display and connected to the selected GND pin of the display, thereby achieving the purpose of grounding the GND pins of each functional module.

[0063] In one embodiment, Figure 4 As shown, the first transistor 21 includes a PMOS tube. At this time, the first end of the first transistor 21 is the gate G, the second end of the first transistor 21 is the source S; and the third end of the first transistor 21 is the drain D.

[0064] In one embodiment, Figure 4 As shown, the second transistor includes an NMOS tube. At this time, the first end of the second transistor is the gate G, the second end of the second transistor is the source S; and the third end of the second transistor is the drain D.

[0065] exist Figure 4In the figure, three functional modules are taken as an example for explanation, where MODULE1_GND is the ground terminal of functional module 1, MODULE2_GND is the ground terminal of functional module 2, MODULE3_GND is the ground terminal of functional module 3, and JIG_DET is the level signal reading pin of MCU1. As shown in Table 1, the I / O port output truth table shows that when MODULE1_GND, MODULE2_GND, and MODULE3_GND are all low-level inputs, according to the working principle of the PMOS tube, the corresponding three PMOS tubes are all in the on state, so that pin 1 of the NMOS tube on the right is in the high-level state. According to the working principle of NMOS, pin 1 is at a high level, the NMOS tube is turned on, and pin 2 is grounded, so that JIG_DET outputs a low level; but the input levels of MODULE1_GND, MODULE2_GND, and MODULE3_GND, if one or more of them are high levels, will cause the corresponding PMOS tube to be off, so that pin 1 of the NMOS is low, the NMOS is not turned on, and the JIG_DET output is high. By judging the level of JIG_DET, the working state of each functional module of the display circuit is judged, that is, the on-off of the circuit of each functional module of the display circuit is judged.

[0066] Table 1

[0067]

[0068] Design similar to the display PCB Figure 4 The circuit uses the on-off principle of NPN and PNP to build a circuit to detect circuit faults. When all functional modules are turned on and the grounded feet of all functional modules are at a low level, all PNP tubes are turned on, and the NPN tubes are turned on at the same time, and the I / O port outputs a low level; when one or more functional modules output a high level, the corresponding PNP tube is not turned on, which causes the NPN tube to be turned off and the I / O outputs a high level.

[0069] MCU1 reads the level of the I / O through the script instructions in Appendix 1. As shown in Table 1, when the level of the I / O port is high, at least one functional module in the display fails, that is, the circuit of at least one functional module in the display is open. When the I / O level is low, the circuits of all functional modules of the display are connected.

[0070] The present disclosure can timely and accurately detect possible faults in the display circuit, including but not limited to power failure, panel failure, interface failure, etc.

[0071] like Figure 5As shown, in one embodiment, an I / O port of the system host can also be used. In this case, the above-mentioned JIG_DET is the I / O port on the system host, and the working status of each functional module of the display circuit is judged through the I / O port of the system host. At this time, MCU1 also needs to be connected to the I / O port of the system host, and MCU1 reads the level signal output by the monitoring circuit 2 through the I / O port.

[0072] Specifically, each functional module included in the display selects a GND pin, which is electrically connected to the I / O port of the system host end through the monitoring circuit 2. The MCU1 (micro control unit) is also electrically connected to the I / O port of the system host end to read the level signal output by the monitoring circuit 2 and feedback the real-time status of the display and the corresponding modules. When the read level values ​​are all low level values, each functional module works normally. When the read level values ​​are high level values, it is determined that a functional module has a fault.

[0073] Furthermore, a GND pin of the display is electrically connected to an I / O port of the system host end through the monitoring circuit 2, and the functional modules included in the display each select a GND pin and are electrically connected to the same I / O port of the system host end through the GND pin selected by the display and the monitoring circuit 2. The MCU1 (micro control unit) is also electrically connected to the I / O port of the system host end, and is used to read the level signal output by the monitoring circuit 2 and to feedback the real-time status of the display and the corresponding modules. When the read level values ​​are all low level values, all functional modules are connected. When the read level values ​​are high level values, it is determined that a functional module has a fault.

[0074] The present disclosure may also have other alternatives, such as: Circuit monitoring: In addition to monitoring the level of the I / O port, circuit monitoring technology can also be used to detect the connection status of the device. For example, a capacitor or resistor network can be used to detect the connection between devices. This method may require more complex hardware design and the development of software to support it, but it can provide more reliable connection status information and may also directly identify which specific circuit has an abnormality. Network monitoring: If the device is connected via a network, network monitoring technology can be used to detect the connection status of the device. For example, the Ping command or SNMP protocol can be used to detect the reachability and status of the device. This method can provide more comprehensive connection status information and can monitor a wider range of connection problems. These alternatives may be more complex or more expensive, but can provide more functions and more reliable connection status monitoring. Which solution to choose depends on the specific application scenario, cost constraints, and system requirements.

[0075] In another possible implementation, Figure 6As shown, the second transistor 21 includes a plurality of second sub-transistors 211 , each first transistor 21 corresponds to a second sub-transistor 211 , and each second sub-transistor 211 corresponds to a level signal reading pin of the MCU1 .

[0076] For each first transistor 21, the corresponding circuit is:

[0077] The first end of the first transistor 21 is connected to the ground end of the corresponding functional module, the first end of the first transistor 21 is connected to the power supply voltage pin of MCU1 through the first resistor, the second end of the first transistor 21 is connected to the power supply voltage pin of MCU1, the third end of the first transistor 21 is grounded through the second resistor, the third end of the first transistor 21 is connected to the first end of the corresponding second sub-transistor 211, the second end of the second sub-transistor 211 is grounded, the third end of the second sub-transistor 211 is connected to the power supply voltage pin of MCU1 through the third resistor, and the third end of the second sub-transistor 211 is also connected to the corresponding level signal reading pin in MCU1 through the fourth resistor.

[0078] During detection, MCU1 can determine which functional module has a fault based on the level signal read by each level signal reading pin.

[0079] For example: taking the power function module as an example, if the output level signal of the second sub-transistor corresponding to the power function module read by the level signal reading pin of MCU1 is high level, then it is considered that the power function module has a fault; if the output level signal of the second sub-transistor corresponding to the power function module read by the level signal reading pin of MCU1 is low level, then it is considered that the power function module is working normally.

[0080] Figure 7 is a flow chart of a method for detecting a fault in a display circuit according to an exemplary embodiment. Figure 7 As shown, the method is applied to the MCU in the above embodiment, and the method includes the following steps S101-S105:

[0081] S101, obtaining a level signal of a second transistor.

[0082] S102, detecting whether the level signal of the second transistor is at a low level.

[0083] S103: When it is detected that the level signal of the second transistor is at a low level, it is determined that all functional modules operate normally.

[0084] S104: When it is detected that the level signal of the second transistor is at a high level, it is determined that there is a faulty functional module.

[0085] S105: Execute corresponding processing according to a preset processing strategy.

[0086] For example, an alarm may be sounded, or the power supply may be cut off to prevent the product from burning out, or the signal may be cut off to avoid irreversible damage to the product.

[0087] Among them, the MCU can determine the circuit fault status of the functional module by detecting the level signal of the second transistor. When the MCU detects that the level signal of the second transistor is at a low level, it determines that all functional modules are working normally. When the MCU detects that the level signal of the second transistor is at a high level, it determines that there is a faulty functional module. At this time, the corresponding processing can be performed according to the preset processing strategy.

[0088] The present disclosure can predict potential faults (for example, the on / off of a circuit of a functional module, or a short circuit between circuits of a functional module) by real-time monitoring of multiple functional modules of a display circuit, and take timely measures to quickly repair an existing fault or avoid a fault, thereby reducing maintenance costs, scrap costs, and downtime; ensuring the stability and reliability of the display, can enhance the user experience, and reduce the troubles caused by display failures or performance issues.

[0089] Further, the present disclosure determines the connection status of each functional module of the display by real-time monitoring of the level state of the I / O port. This real-time monitoring mechanism can make the system more flexible and responsive, and can immediately make corresponding processing when the level state changes. Through the level signal of the second transistor and the circuit design, the connection status of each functional module of the display circuit can be quickly fed back. Once a change in the connection state occurs, such as the display is disconnected, it can be immediately monitored, so that corresponding processing can be made, such as issuing an alarm or taking automated repair measures. Through monitoring and judgment at the software level, the hardware connection status is reflected in real time. This combination of hardware and software makes the system have a higher level of intelligence and automation. The level signal is used as an instruction to determine whether the functional module in the display circuit is faulty. The semantics of the instruction are clear and clear, and its function is expressed at a glance. The circuit is simple and practical. In technological innovation, sometimes concise and clear expressions are often easier to accept and apply than complex technologies. The instruction is based on simple I / O port level monitoring, but can be used as part of a more complex system; the circuit can arbitrarily add and delete modules that need to be detected. For example, it can be integrated into a larger-scale monitoring system to monitor more device states and achieve more complex automatic control.

[0090] When the functional modules of the display include: a power module, a display control module and a panel drive module, the MCU can timely and accurately detect possible faults in the display circuit, including power failure, panel failure and interface failure.

[0091] The present disclosure can also implement stability evaluation. The MCU evaluates the stability of the display circuit and detects whether there are frequent failures or abnormal conditions to improve the reliability and stability of the display.

[0092] The present disclosure helps to improve the performance, stability and reliability of the display, while reducing scrapping and repair costs, and improving the user experience.

[0093] The present disclosure also provides a display, comprising the fault detection device for the display circuit as described in any one of the above embodiments.

[0094] The present disclosure also provides an electronic device, comprising the display as described above.

[0095] The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. The non-relational database may include a distributed database based on blockchain, etc., but is not limited thereto. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but is not limited thereto.

[0096] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0097] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. At the same time, for those skilled in the art, according to the ideas of this application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.

Claims

1. A fault detection device for a display circuit, characterized in that: The fault detection device of the display circuit comprises: MCU and monitoring circuit; The monitoring circuit includes a second transistor and a plurality of first transistors, and the first transistors correspond one-to-one to the functional modules in the display circuit; The ground terminal of each of the functional modules is respectively connected to the first terminal of the corresponding first transistor; The first end of each of the first transistors is also connected to a power supply voltage pin of the MCU; A second end of the first transistor is connected to a power supply voltage pin of the MCU; A third terminal of the last of the first transistors is grounded; The third terminal of the last one of the first transistors is also connected to the first terminal of the second transistor; In any two adjacent first transistors, the third terminal of one of the first transistors is connected to the second terminal of the other first transistor; The second end of the second transistor is grounded, and the third end of the second transistor is respectively connected to a power supply voltage pin of the MCU and a level signal reading pin of the MCU; Among them, when the functional module is working normally, the corresponding first transistor is turned on; when all the first transistors are turned on, the second transistor is turned on and outputs a low level to the MCU; when not all of the first transistors are turned on, the second transistor is turned off and outputs a high level to the MCU; the MCU is used to determine that all the functional modules are working normally when receiving the low level, and determine that there is a faulty functional module when receiving the high level.

2. The display circuit fault detection device according to claim 1, characterized in that: The ground pin of the display is connected to the ground terminal of each of the functional modules.

3. The display circuit fault detection device according to claim 1, characterized in that: The first transistor includes a PMOS transistor.

4. The display circuit fault detection device according to claim 3, characterized in that: The first end of the first transistor is a gate, the second end of the first transistor is a source, and the third end of the first transistor is a drain.

5. The display circuit fault detection device according to claim 1, characterized in that: The second transistor includes an NMOS transistor.

6. The display circuit fault detection device according to claim 5, characterized in that: The first end of the second transistor is a gate, the second end of the second transistor is a source, and the third end of the second transistor is a drain.

7. The display circuit fault detection device according to claim 1, characterized in that: The first end of each of the first transistors is connected to the power supply voltage pin of the MCU through a first resistor; the third end of the last one of the first transistors is grounded through a second resistor; the third end of the second transistor is connected to the power supply voltage pin of the MCU through a third resistor, and the third end of the second transistor is connected to the level signal reading pin of the MCU through a fourth resistor.

8. A method for detecting a fault in a display circuit, characterized in that: The method is applied to the MCU according to any one of claims 1 to 7, and the method includes: Acquiring a level signal of the second transistor; Detecting whether the level signal of the second transistor is at a low level; When it is detected that the level signal of the second transistor is at a low level, determining that all functional modules operate normally; When it is detected that the level signal of the second transistor is at a high level, determining that there is a faulty functional module; Execute corresponding processing according to the preset processing strategy.

9. A display, characterized in that: A fault detection device for a display circuit comprising the device described in any one of claims 1-7.

10. An electronic device, characterized in that: Comprising a display as claimed in claim 9.

Images