Multifunctional automatic test system and test method

Abstract

The invention provides a multifunctional automatic test system and method, and the system comprises an automatic test platform, a network switching device, and a multifunctional test platform, the multifunctional test platform is connected to the automatic test platform through the network switching device, and is connected with a tested device through a test interface; the automatic test platform is used for storing and managing application programs and test cases of the equipment and counting and querying test results; the server is used for querying matched application programs and test cases after receiving an automatic test request sent by the multifunctional test platform, packaging the application programs and the test cases and sending the packaged application programs and the test cases to the multifunctional test platform; the multifunctional test platform is used for acquiring identity information of the tested equipment and uploading the identity information to the automatic test platform; and receiving an application program and a test case issued by the multifunctional test platform, burning the application program into the tested equipment, executing the test case to test the tested equipment, obtaining a test result, and uploading the test result to the automatic test platform.

Description

Technical Field

[0001] The invention relates to the field of electronic testing, and in particular to a multifunctional automatic testing system and a testing method. Background Art

[0002] With the advancement of intelligent coal mine construction, coal mining has increasingly higher requirements for the safety, stability, and reliability of equipment and systems, and mining products need to undergo sufficient reliability testing. Among them, fully mechanized face equipment is a common mining product, including hydraulic supports, coal mining machines, scraper conveyors, transfer machines, crushers, etc. After these equipment are assembled on site at the coal mine, they can be quickly put into use to improve production efficiency. In order to ensure safety, these equipment need to be strictly inspected and tested before on-site assembly to ensure product reliability, reduce rework, and improve efficiency.

[0003] Among them, the support electronic control, coal mining machine electronic control, pump station electronic control, etc. are the core control units of the comprehensive mining working face, and the functions and interfaces of the control boards need to be tested; and since the control boards initially purchased are mostly semi-finished products, the functions of the support electronic control, coal mining machine electronic control, pump station electronic control, etc. are realized by writing the corresponding control programs into these control boards.

[0004] The existing testing technology has the following problems: The internal structure of the control board is complex, with multiple situations such as no CPU, single CPU, and multiple CPUs. The test system needs to meet multiple test scenarios. Single board testing requires power supply, signal lines and other fixtures, frequent disassembly and low testing efficiency; Manual testing and manual judgment result in high product error rate and high overall production cost; The test system cannot be networked and is mostly a single test platform with single functions and insufficient interface type coverage, which cannot meet the different test requirements of different control units.

[0005] In order to solve the above problems, people have been seeking an ideal technical solution. Summary of the invention

[0006] The purpose of the present invention is to provide a multifunctional automatic testing system and a testing method in view of the deficiencies in the prior art.

[0007] In order to achieve the above-mentioned purpose, the technical scheme adopted by the present invention is as follows: In the first aspect, a multifunctional automatic test system is provided, wherein the device under test is a PCB single board of a core control unit of a fully mechanized mining working face, and comprises: an automatic test platform, a network switching device and a multifunctional test platform, wherein the multifunctional test platform comprises different types of test interfaces; the multifunctional test platform is connected to the automatic test platform through the network switching device, and is connected to the device under test through the test interface; The automated testing platform is used to store and manage the application programs and test cases of the device, and to count and query the test results; and after receiving the automated testing request sent by the multifunctional testing platform, it is used to search for the application programs and test cases that match the device identity information in the automated testing request, and package and send them to the multifunctional testing platform; The multifunctional testing platform is used to obtain the identity information of the device under test, and generate an automated testing request based on the identity information of the device under test and upload it to the automated testing platform; receive the application and test cases issued by the multifunctional testing platform, burn the application into the device under test, execute the test cases to test the device under test, obtain the test results and upload them to the automated testing platform.

[0008] Furthermore, when the multifunctional test platform detects the device under test, it obtains the identity information of the device under test by scanning the code, and generates an automated test request according to the identity information of the device under test; the identity information of the device under test includes at least a single board model and an SN code; The automated test platform searches for an application program that matches the board model of the device under test according to the board model in the automated test request and sends the application program to the multifunctional test platform; The multifunctional test platform burns the SN code and the application program into the device under test, and after obtaining the test result, uploads the test result and the SN code to the automated test platform; The automated testing platform generates a test report based on the test results and stores it after associating it with the SN code.

[0009] Further, the test cases include detected trial cases and self-detection trial cases; The tested trial cases include single board test point voltage test cases, single board function signal conversion test cases, communication interface test cases, analog input test cases, digital input test cases, digital output test cases, and analog output test cases; The self-detection trial cases include single board input voltage test cases, single board input current test cases, and self-detection trial cases for on-board external devices; After receiving the automated test request sent by the multifunctional test platform, the automated test platform searches for test cases and test sequences that match the device identity information, and sends the test sequences together with the test cases to the multifunctional test platform; The multifunctional testing platform executes test cases one by one according to the test sequence.

[0010] A second aspect provides a multifunctional automated testing method, which is applicable to the aforementioned multifunctional automated testing system and includes the following steps: Obtain the identity information of the device under test and generate automated test requests; Querying the automated testing platform for applications and test cases that match the device identity information in the automated testing request; Burn the application to the device under test and execute the test script to test the device under test; The test results are obtained and uploaded to the automated testing platform.

[0011] The present invention has outstanding substantive features and significant progress compared to the prior art. Specifically, the present invention integrates functions such as single-board program burning, code writing and burning, circuit function testing, and software upgrading, which can be achieved through one system, can simplify the test steps, meet the needs of automated testing, and improve test efficiency.

[0012] The automated test platform and the multi-function test platform are connected via Ethernet, which facilitates networking and enables distributed deployment. It can also support simultaneous testing of multiple different types of devices under test without interfering with each other. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a schematic diagram of the framework of the automatic testing system of the present invention.

[0014] Figure 2 It is a connection diagram of the automatic test system of the present invention.

[0015] Figure 3 It is a functional schematic diagram of the automated testing platform of the present invention.

[0016] Figure 4 It is a structural schematic diagram of the automatic testing platform of the present invention.

[0017] Figure 5 It is a flow chart of the multifunctional automatic testing method of the present invention.

[0018] Figure 6 It is the test flow chart of analog input test. DETAILED DESCRIPTION

[0019] The technical solution of the present invention is further described in detail below through specific implementation methods.

[0020] Example 1 This embodiment provides a multifunctional automatic testing system, and the tested device is a PCB board of the core control unit of the fully mechanized mining face; Figure 1-4 As shown, the multifunctional automated testing system includes: an automated testing platform, a network switching device and a multifunctional testing platform; wherein the multifunctional testing platform includes different types of test interfaces; the multifunctional testing platform is connected to the automated testing platform via the network switching device, and is connected to the device under test via the test interface.

[0021] Wherein, the network switching device includes a router or a switch, which is used to realize the communication between the automated test platform and the multifunctional test platform through an Ethernet network.

[0022] The automated testing platform is used to store and manage the device's applications and test cases, and to count and query test results; and after receiving an automated testing request sent by the multifunctional testing platform, it is used to search for applications and test cases that match the device identity information in the automated testing request, and package and send them to the multifunctional testing platform.

[0023] Specifically, the test cases include detected trial cases and self-detection trial cases; The tested trial cases include single board test point voltage test cases, single board function signal conversion test cases, communication interface test cases, analog input test cases, digital input test cases, digital output test cases, and analog output test cases; The self-test trial cases include single-board input voltage test cases, single-board input current test cases, and on-board external and internal device self-test trial cases; wherein, the on-board external and internal device self-test cases include at least on-board EEPROM self-test cases, clock RTC self-test cases, temperature and humidity sensor self-test cases, and switch self-test cases.

[0024] The multifunctional testing platform is used to obtain the identity information of the device under test, and generate an automated testing request based on the identity information of the device under test and upload it to the automated testing platform; receive the application and test cases issued by the multifunctional testing platform, burn the application into the device under test, execute the test cases to test the device under test, obtain the test results and upload them to the automated testing platform.

[0025] It is understandable that since the models of the boards to be tested are different, the test items required for each board to be tested are also different. Therefore, the test items required for each model of the board to be tested can be set in advance according to actual needs, and the corresponding association table can be stored in the automated testing platform.

[0026] When the automated testing platform receives the automated testing request sent by the multifunctional testing platform, it searches the association table according to the single board model in the automated testing request, obtains the test items that match the single board model of the device under test, obtains the corresponding test cases according to the test items, and sends the test cases together with the application to the multifunctional testing platform.

[0027] Generally, since there is more than one test item to be performed, the automated testing platform also sets the test order of the test items when setting the test items, and sends the test order and test cases together to the multi-functional testing platform; the multi-functional testing platform executes the test cases one by one according to the test order.

[0028] Alternatively, in some embodiments, when setting the test items, the automated testing platform also synchronously sets the test order of the test items, and obtains test cases in sequence according to the test order, and sends the test cases to the multi-functional testing platform according to the test order; the multi-functional testing platform executes the test cases one by one in sequence.

[0029] In a specific implementation, the multifunctional test platform includes RK3568 and FPGA, RK368 communicates with FPGA via USB protocol and communicates with the automated test platform via Gigabit PHY interface; The RK3568 is the core of the multi-functional test platform and is responsible for scheduling test tasks; the FPGA is used to expand the peripheral interface of RK3568.

[0030] The multifunctional test platform provides a plurality of different test interfaces externally, and the test interfaces include an analog input test interface, a digital input test interface, an analog output test interface, a digital output test interface, a communication test interface, and an internal and external device interface.

[0031] Wherein, the analog input interface is used to collect voltage and circuit; The digital output interface is used to connect to the relay execution unit; The communication interface includes 4 485 interfaces, 1 232 interface, 6 CAN interfaces, 4 Gigabit Ethernet interfaces, an RFID interface, 10 UATR interfaces, a wifi interface, a zigbee interface, and a Bluetooth interface.

[0032] The multifunctional testing platform performs a network interface test on the single board to be tested through an Ethernet interface to test whether the network interface on the single board to be tested is normal and whether it can be stably connected, thereby ensuring high-speed data transmission and reliability; performs a CAN interface test on the single board to be tested through a CAN interface to test whether the CAN bus interface on the single board to be tested is normal and whether communication is normal under multiple nodes, thereby ensuring stability and reliability when using CAN bus communication; performs a USB interface test on the single board to be tested through a USB interface to test whether the USB interface is normal and whether the USB device can communicate normally with the single board to be tested, thereby ensuring a reliable USB interface connection.

[0033] Furthermore, the multifunctional test platform also provides a clock RTC interface and a temperature and humidity sensor interface to execute clock RTC self-test cases and temperature and humidity sensor self-test cases. In addition, the EEPROM self-test case in the board can be executed through the network port, and the switch self-test case can be executed through the IIC interface.

[0034] Taking the clock RTC self-test case as an example, the clock RTC self-test case is used to test whether the clock circuit on the board to be tested is normal and whether the clock frequency is accurate, so as to ensure the control board's time accuracy requirements. The EEPROM self-test case is used to test the read and write speed and stability of the Flash or EEPROM memory to ensure the stability and reliability of the board to be tested when inputting, storing and outputting data.

[0035] It should be noted that each multifunctional test platform can test multiple devices of the same type at the same time, and multiple multifunctional test platforms can perform tests in parallel.

[0036] In specific implementation, when the multifunctional testing platform detects the device under test, it obtains the identity information of the device under test by scanning the code, and generates an automated test request based on the identity information of the device under test; the identity information of the device under test includes at least the board model and SN code, and may also include production information such as production date and manufacturer; wherein a barcode or QR code is affixed to the device under test, recording the identity information of the device under test.

[0037] The automated testing platform searches for application programs and test cases that match the board model of the device under test according to the board model in the automated testing request and sends them to the multifunctional testing platform; The multifunctional test platform burns the SN code and the application program into the device under test, and after obtaining the test result, uploads the test result and the SN code to the automated test platform; The automated testing platform generates a test report based on the test results and stores it after associating it with the SN code.

[0038] In further implementation, the multifunctional testing platform further includes a testing agent, and the multifunctional testing platform interactively communicates with the automated testing platform through the testing agent.

[0039] When the application program of the device under test needs to be upgraded, the device under test generates an upgrade request according to the version number of the application program, and uploads the upgrade request to the automated testing platform through the multifunctional testing platform; The automated testing platform searches for an upgraded version of the application program according to the version number of the application program, and burns the upgraded version of the application program into the device under test through the multifunctional testing platform.

[0040] It can be seen that the system of the present invention integrates the functions of single-board program burning, code writing and burning, circuit function testing, software upgrading, etc., which can be realized through one system, can simplify the test steps, meet the needs of automated testing, and improve test efficiency.

[0041] The automated test platform and the multi-function test platform are connected via Ethernet, which facilitates networking and enables distributed deployment. It can also support simultaneous testing of multiple different types of devices under test without interfering with each other.

[0042] Example 2 This embodiment provides a multifunctional automated testing method, which is applicable to the multifunctional testing platform in the multifunctional automated testing system described in Embodiment 1. Figure 5 As shown, the following steps are included: Obtain the identity information of the device under test and generate automated test requests; Querying the automated testing platform for applications and test cases that match the device identity information in the automated testing request; Burn the application to the device under test and execute the test script to test the device under test; The test results are obtained and uploaded to the automated testing platform.

[0043] Specifically, the multifunctional test platform is a single-board test fixture, which can power on the single board to be tested; when the multifunctional test platform detects that the single board to be tested is powered on, it obtains the identity information of the device under test by scanning the code, and generates an automated test request based on the identity information of the device under test; the identity information of the device under test includes at least the single board model and the SN code.

[0044] The automated testing platform searches for applications and test cases that match the single board model of the device under test according to the single board model in the automated testing request, and sends them to the multifunctional testing platform; the multifunctional testing platform burns the SN code together with the application program into the device under test, and after obtaining the test result, uploads the test result and the SN code to the automated testing platform; the automated testing platform generates a test report according to the test result, and stores it after associating it with the SN code.

[0045] When executing the test case to test the device under test, the test script in the test case is executed to test the device under test, the execution result of the device under test is obtained, and compared with the expected standard in the test case to obtain the test result; if the comparison result is consistent, the test result is judged to be qualified; otherwise, the test result is judged to be unqualified.

[0046] It can be understood that the multifunctional testing platform can perform inspection tests on the device under test, and the inspection tests include single-board test point voltage test, single-board function signal conversion test, communication interface connectivity test, analog input test, digital input test, digital output test, and analog output test.

[0047] In addition, the multifunctional test platform can also perform self-test on the board to be tested, and the self-test includes a board input voltage test, a board input current test, and a self-test on board internal and external devices.

[0048] Specifically, Figure 6 As shown, when executing the analog input test case, the multifunctional test platform obtains the state of the DIP switch corresponding to the analog input test interface. If it is ON, it switches to the current signal acquisition mode; otherwise, it switches to the voltage signal acquisition mode; The analog input signal of the analog input test interface is collected through an operational amplifier; the collected analog input signal is converted into a digital input signal through an analog-to-digital converter, and compared with the expected standard in the analog input test case to obtain the test result.

[0049] When executing the communication interface test case, the multifunctional test platform sends test data to the device under test; After receiving the test data, the device under test returns the test data to the multifunctional test platform, and the multifunctional test platform determines whether the communication is normal according to the consistency principle of the received and sent data; The multifunctional test platform adjusts the communication speed, sends a number of data packets to the device under test, receives data packets returned by the device under test, counts the packet loss rate and determines the communication stability according to the packet loss rate.

[0050] When an upgrade is required, the device under test generates an upgrade request according to the version number of the application program, and uploads it to the automated testing platform through the multifunctional testing platform; The automated testing platform searches for an upgraded version of the application program according to the version number of the application program, and burns the upgraded version of the application program into the device under test through the multifunctional testing platform.

[0051] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, ordinary technicians in the field should understand that the specific implementation methods of the present invention can still be modified or some technical features can be replaced by equivalents without departing from the spirit of the technical solution of the present invention, which should be included in the scope of the technical solution for protection of the present invention.

Claims

1. A multifunctional automatic testing system, the tested equipment is a PCB board of the core control unit of a fully mechanized mining face, characterized in that: include: An automated test platform, a network switching device, and a multifunctional test platform, wherein the multifunctional test platform includes different types of test interfaces; The multifunctional test platform is connected to the automated test platform via a network switching device and connected to the device under test via a test interface; The automated testing platform is used to store and manage device applications and test cases, and to collect statistics and query test results; And after receiving the automated test request sent by the multifunctional test platform, searching for the application and test case that match the device identity information in the automated test request, and packaging and sending them to the multifunctional test platform; The multifunctional testing platform is used to obtain the identity information of the device under test, and generate an automated testing request according to the identity information of the device under test and upload it to the automated testing platform; Receive the application and test cases sent by the multifunctional test platform, burn the application into the device under test, execute the test cases to test the device under test, obtain the test results and upload them to the automated test platform.

2. A multifunctional automated testing system according to claim 1, characterized in that: When the multifunctional test platform detects the device under test, it obtains the identity information of the device under test by scanning the code, and generates an automated test request according to the identity information of the device under test; the identity information of the device under test includes at least the single board model and the SN code; The automated testing platform searches for application programs and test cases that match the board model of the device under test according to the board model in the automated testing request and sends them to the multifunctional testing platform; The multifunctional test platform burns the SN code and the application program into the device under test, and after obtaining the test result, uploads the test result and the SN code to the automated test platform; The automated testing platform generates a test report based on the test results and stores it after associating it with the SN code.

3. A multifunctional automated testing system according to claim 1 or 2, characterized in that: The test cases include tested trial cases and self-test trial cases; The tested trial cases include single board test point voltage test cases, single board function signal conversion test cases, communication interface test cases, analog input test cases, digital input test cases, digital output test cases, and analog output test cases; The self-detection trial cases include single board input voltage test cases, single board input current test cases, and self-detection trial cases for on-board external devices; After receiving the automated test request sent by the multifunctional test platform, the automated test platform searches for test cases and test sequences that match the device identity information, and sends the test sequences together with the test cases to the multifunctional test platform; The multifunctional testing platform executes test cases one by one according to the test sequence.

4. A multifunctional automated testing system according to claim 3, characterized in that: The test interface includes an analog input test interface, a digital input test interface, an analog output test interface, a digital output test interface, a communication test interface, and an internal and external device interface.

5. A multifunctional automated testing system according to claim 1 or 2, characterized in that: The multifunctional testing platform also includes a testing agent, and the multifunctional testing platform interacts and communicates with the automated testing platform through the testing agent.

6. A multifunctional automated testing system according to claim 1 or 2, characterized in that: The device under test generates an upgrade request according to the version number of the application program, and uploads the upgrade request to the automated testing platform through the multifunctional testing platform; The automated testing platform searches for an upgraded version of the application program according to the version number of the application program, and burns the upgraded version of the application program into the device under test through the multifunctional testing platform.

7. A multifunctional automated testing method, applied to a multifunctional testing platform in a multifunctional automated testing system according to any one of claims 1 to 6, characterized in that: Obtain the identity information of the device under test and generate automated test requests; Querying the automated testing platform for applications and test cases that match the device identity information in the automated testing request; Burn the application to the device under test and execute the test script to test the device under test; The test results are obtained and uploaded to the automated testing platform.

8. A multifunctional automated testing method according to claim 7, characterized in that: Based on, execute the test cases to test the device under test, including: Execute the test script in the test case to test the device under test, obtain the execution result of the device under test, and compare it with the expected standard in the test case to obtain the test result; if the comparison result is consistent, the test result is judged to be qualified; otherwise, the test result is judged to be unqualified.

9. A multifunctional automated testing method according to claim 7, characterized in that: When executing the analog input test case, the multifunctional test platform obtains the state of the DIP switch corresponding to the analog input test interface, and if it is ON, switches to the current signal acquisition mode; Otherwise, switch to voltage signal acquisition mode; The analog input signal of the analog input test interface is collected through an operational amplifier; the collected analog input signal is converted into a digital input signal through an analog-to-digital converter, and compared with the expected standard in the analog input test case to obtain the test result.

10. A multifunctional automatic testing system according to claim 7, characterized in that: When executing the communication interface test case, the multifunctional test platform sends test data to the device under test; After receiving the test data, the device under test returns the test data to the multifunctional test platform, and the multifunctional test platform determines whether the communication is normal according to the consistency principle of the received and sent data; The multifunctional test platform adjusts the communication speed, sends a number of data packets to the device under test, receives data packets returned by the device under test, counts the packet loss rate and determines the communication stability according to the packet loss rate.

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