Voltage transformer secondary circuit fault positioning method and system

Abstract

The invention relates to the technical field of power system fault diagnosis, and discloses a voltage transformer secondary circuit fault positioning method and system, and the method comprises the steps: applying a low voltage to a voltage transformer secondary circuit, monitoring the current of the circuit, and judging the state of the voltage transformer secondary circuit according to the current of the circuit; when the fault is judged to exist, carrying out segmentation processing on the to-be-checked secondary circuit of the voltage transformer; and repeatedly applying low voltage and monitoring current, and positioning a fault point through a segmented searching method. Through the accurate detection method, the fault of the secondary circuit of the voltage transformer can be effectively identified, misdiagnosis and missed diagnosis are reduced, the fault processing time is shortened, the power failure time is shortened, and the reliability of a power system is improved. And by detecting and positioning the fault in time, equipment damage in a larger range caused by fault expansion can be avoided, so that the cost of maintaining and replacing the equipment is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of power system fault diagnosis, and in particular to a method and system for locating a fault in a secondary circuit of a voltage transformer. Background Art

[0002] Voltage transformers play an extremely important role in the measurement and protection of power systems. They convert high voltage into low voltage, making high voltage measurement possible, and through the standard value of its secondary voltage, it is easy to manufacture standard electrical measuring instruments and measuring devices. The ideal state of a voltage transformer is a low-resistance voltage source, and the secondary circuit is prohibited from short-circuiting. Therefore, a fuse is configured on the secondary side of the voltage transformer to protect the voltage transformer.

[0003] In the application of power system, the secondary circuit of voltage transformer is usually connected with a large number of voltmeters, electric energy meters, voltage relays, insulation monitoring devices, voltage busbars, etc. Due to the short circuit or grounding fault in the secondary circuit, the secondary fuse of the voltage transformer will be blown. If the fault point cannot be eliminated, the normal operation of the voltage transformer cannot be restored. According to the existing literature, there is no clear method for locating the fault of the secondary circuit of the voltage transformer. When locating the fault, the voltage transformer is generally shut down and safety isolation measures are taken. At this time, it is difficult to locate the fault. Since there are many devices connected in the secondary circuit of the voltage transformer, through insulation testing or multimeter resistance testing, because the circuit is mostly inductive loads, its DC resistance is small, and the measured value is sometimes only a few ohms, it is impossible to distinguish the grounding short circuit fault, which brings difficulties to the location of the fault point. If the fault point is located by disassembling the device line on the secondary circuit of the voltage transformer and testing the voltage transformer for power transmission, it will have an impact on the voltage transformer and there is a problem of low search efficiency.

[0004] In view of the difficulty in locating the fault point of the secondary circuit of the existing voltage transformer, an effective and reasonable testing method is needed. Summary of the invention

[0005] In view of the above existing problems, the present invention is proposed.

[0006] Therefore, the present invention provides a method for locating a fault in a secondary circuit of a voltage transformer, which solves the problem in the prior art that the fault point is difficult to locate because the test data of the secondary circuit of the voltage transformer cannot be effectively distinguished from the data at the time of the fault, and proposes an effective test method. The problem that the fault point cannot be identified by the test data is overcome, and a low voltage (safe voltage lower than 36V) is applied and a segmented search method is used to determine the circuit state and finally locate the fault point.

[0007] To solve the above technical problems, the present invention provides the following technical solutions: a method for locating a fault in a secondary circuit of a voltage transformer, comprising: applying a low voltage to the secondary circuit of the voltage transformer, monitoring the circuit current, and judging the state of the secondary circuit of the voltage transformer according to the circuit current; when it is judged that a fault exists, segmenting the secondary circuit of the voltage transformer to be checked; repeatedly applying a low voltage and monitoring the current, and locating the fault point by a segmented search method.

[0008] As a preferred solution of the method for locating a secondary circuit fault of a voltage transformer described in the present invention, the applying of low voltage includes adopting the principle of low voltage application and using a safe voltage lower than 36V. When applied to the secondary circuit, the short-circuit current value in the circuit is reduced, thereby protecting the safety of the secondary circuit and the test instrument.

[0009] As a preferred solution of the voltage transformer secondary circuit fault locating method described in the present invention, the monitoring circuit current includes that when it is determined that there is a short circuit or grounding fault in the voltage transformer secondary circuit, the voltage generator automatically cuts off the power and issues an alarm.

[0010] As a preferred solution of the method for locating a fault in a secondary circuit of a voltage transformer described in the present invention, the state of the secondary circuit of the voltage transformer being disconnected includes: during the low voltage application process, if the circuit current is greater than 1A, it is determined that there is a short circuit or grounding fault in the secondary circuit of the voltage transformer;

[0011] If the loop current is less than 0.1A after applying low voltage, it is determined that the secondary circuit of the voltage transformer is in normal state.

[0012] As a preferred scheme of the method for locating the fault of the secondary circuit of a voltage transformer described in the present invention, the segmented processing includes: the segmented search method is a binary method, the circuit to be checked is split into two parts from the middle of the small bus, a low voltage is applied again on the voltage bus after the bisection, and the current is monitored, and the faulty part is judged according to the current size.

[0013] As a preferred solution of the method for locating a fault in a secondary circuit of a voltage transformer described in the present invention, the segmented search method for locating the fault point includes: after applying a low voltage, if the loop current is less than 0.1A, it is determined that the faulty part has been isolated.

[0014] As a preferred solution of the method for locating a voltage transformer secondary circuit fault described in the present invention, the segmented search method for locating the fault point also includes continuing to use the segmented search method for the isolated faulty part to narrow the range of the fault point, and finally accurately locating the voltage transformer secondary circuit fault point by continuously repeating the segmented search.

[0015] Another object of the present invention is to provide a voltage transformer secondary circuit fault location system, which can effectively detect and locate faults in the voltage transformer secondary circuit while maintaining the simplicity and ease of use of the system.

[0016] As a preferred solution of a voltage transformer secondary circuit fault location system described in the present invention, it includes: a low voltage generator module, a current monitoring unit, a control logic unit, and a fault indication unit;

[0017] The low voltage generator module provides a safe low voltage output for applying to the secondary circuit of the voltage transformer to detect faults without causing damage;

[0018] The current monitoring unit measures the current value after the low voltage is applied, and is used to determine whether there is a short circuit or ground fault in the circuit;

[0019] The control logic unit controls the operation of the low voltage generator according to the data of the current monitoring unit, and executes a segmented search algorithm to gradually narrow the scope of the fault point;

[0020] The fault indication unit, when a fault is detected, provides a visual or audible indication signal to inform the operator of the existence of the fault and the location of the fault point.

[0021] A computer device comprises a memory and a processor, wherein the memory stores a computer program, and is characterized in that when the processor executes the computer program, steps of a method for locating a fault in a secondary circuit of a voltage transformer are implemented.

[0022] A computer-readable storage medium stores a computer program, wherein the computer program, when executed by a processor, implements the steps of a method for locating a fault in a secondary circuit of a voltage transformer.

[0023] Beneficial effects of the present invention: The method has high safety in the testing process, adopts an AC voltage signal generator with protection function, and utilizes its short-circuit state voltage protection function to accurately judge the secondary circuit state of the voltage transformer, no longer relying on test data, and makes simple and accurate judgment on the fault state.

[0024] By combining the application of low voltage with the segmented search method, the work efficiency and the purpose of fault location can be improved, the fault range can be quickly narrowed, and finally the fault point can be accurately determined.

[0025] The operating principle is simple and has strong universality, which can improve work efficiency, especially for working conditions with complex wiring. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. Among them:

[0027] Figure 1 A schematic flow chart of a method for locating a fault in a secondary circuit of a voltage transformer provided by an embodiment of the present invention.

[0028] Figure 2 An expanded diagram of a secondary circuit of a voltage transformer is provided for a method for locating a fault in a secondary circuit of a voltage transformer according to an embodiment of the present invention.

[0029] Figure 3 An example of a voltage transformer secondary circuit fault in a voltage transformer secondary circuit fault locating method provided by an embodiment of the present invention.

[0030] Figure 4 A schematic diagram of a branch fault state determined by an AC voltage signal generator of a voltage transformer secondary circuit fault locating method provided by an embodiment of the present invention.

[0031] Figure 5 A schematic diagram of working modules of a voltage transformer secondary circuit fault locating system provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0032] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the drawings of the specification. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary persons in the art without creative work should fall within the scope of protection of the present invention.

[0033] In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention may also be implemented in other ways different from those described herein, and those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0034] Secondly, the term "one embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The term "in one embodiment" that appears in different places in this specification does not necessarily refer to the same embodiment, nor does it refer to a separate or selective embodiment that is mutually exclusive with other embodiments.

[0035] The present invention is described in detail with reference to schematic diagrams. When describing the embodiments of the present invention, for the sake of convenience, the cross-sectional diagrams showing the device structure will not be partially enlarged according to the general scale, and the schematic diagrams are only examples, which should not limit the scope of protection of the present invention. In addition, in actual production, the three-dimensional dimensions of length, width and depth should be included.

[0036] At the same time, in the description of the present invention, it should be noted that the directions or positional relationships indicated by the terms "upper, lower, inner and outer" are based on the directions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limiting the present invention. In addition, the terms "first, second or third" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0037] In the present invention, unless otherwise clearly specified and limited, the terms "install, connect, connect" should be understood in a broad sense, for example: it can be a fixed connection, a detachable connection or an integral connection; it can also be a mechanical connection, an electrical connection or a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0038] Example 1, reference Figure 1 , which is the first embodiment of the present invention, provides a method for locating a fault in a secondary circuit of a voltage transformer, comprising:

[0039] S1: Apply low voltage to the secondary circuit of the voltage transformer, monitor the circuit current, and determine the status of the secondary circuit of the voltage transformer based on the circuit current.

[0040] Furthermore, in response to the fault of the secondary circuit of the voltage transformer, the test meter cannot effectively judge the normal state and the fault state. A voltage generator with a protection function is used to provide a method of applying low voltage to the secondary circuit of the voltage transformer. The normal rated voltage of the secondary circuit of the voltage transformer is generally AC 100V. When a short circuit fault occurs in the secondary circuit of the voltage transformer, its loop resistance is extremely low. In the case of a metallic short circuit fault, the loop resistance is only the wire resistance value (less than 2Ω). If a normal 100V voltage is applied to the secondary circuit of the voltage transformer, the loop current reaches 50A and the secondary air switch of the voltage transformer will trip. The principle of low voltage application is to use a safe voltage lower than 36V, for example 10V. When applied to the secondary circuit, the short-circuit current value in the circuit is reduced to only 5A, which can protect the safety of the secondary circuit and the test instrument.

[0041] If there is a short circuit or ground fault in the secondary circuit of the voltage transformer and the circuit current is greater than 1A, the protection function of the voltage generator will be triggered. The voltage generator will automatically power off and issue an alarm, thereby solving the problem that the test meter cannot effectively determine the fault status of the secondary circuit.

[0042] If the secondary circuit of the voltage transformer is in normal condition and the insulation is normal, when low voltage is applied to the secondary circuit, the circuit current will be less than 0.1A and the voltage generator will work normally. This is the principle of judging the secondary circuit status of the voltage transformer by the low voltage application method.

[0043] S2: When it is determined that a fault exists, the secondary circuit of the voltage transformer to be checked is processed in sections.

[0044] Furthermore, when the low voltage application method is used to determine that there is a fault in the secondary circuit of the voltage transformer, for the case where there are a large number of secondary circuit devices of the voltage transformer, especially when there is a small voltage bus, a segmented search method is adopted. In this example, the binary method can be used, that is, the circuit to be checked is split into two parts from the middle of the small bus, and the low voltage application method is used again on one of the small voltage buses, and the judgment criteria are the same as in S1.

[0045] It should be noted that the voltage busbar is divided into two sections using the dichotomy method, but it is not simply split from the middle, but the split point is selected according to the following model:

[0046]

[0047] Among them, P0 is the split point, N is the total length of the small busbar, and α is an adjustment coefficient less than 1, which is used to adjust the split point according to historical data or experience to optimize the search efficiency.

[0048] Apply low voltage at the split point and monitor the current. Determine the fault segment based on the following criteria:

[0049] If the current I 阈值1 (for example 0.1A), the faulty part is isolated in another section.

[0050] If the current I 阈值2 , the faulty part is in the current test section.

[0051] The first case: the faulty part is isolated, and the voltage generator works normally (the loop current will be less than 0.1A). At this time, the segment search method can be used again on the isolated faulty part to narrow the fault point range;

[0052] For the isolated faulty part, use the recursive binary division method to continue segmenting. The segmentation points for each step are selected as follows:

[0053] ​​

[0054] Among them, P k is the current split point, N k is the length of the current fault part, and β is a dynamic adjustment coefficient, which is adjusted according to the current value of the previous step and the preset optimization strategy.

[0055] In the second case, the voltage generator protection automatically cuts off the power and issues an alarm (loop current is greater than 1A), indicating that the other part of the circuit is normal, and this part of the circuit has a short circuit or ground fault. You can continue to use the segmented search method for this part of the circuit, repeat the test, and narrow the scope of the fault point;

[0056] For the unisolated fault part, the recursive binary division method is still used, but a dynamic adjustment mechanism is introduced:

[0057]

[0058] Among them, γ is a proportional coefficient calculated based on the current deviation and preset parameters, which is used to locate the fault point more accurately. After each segmentation, the segmentation point is adjusted according to the current monitoring results to gradually narrow the range of the fault point.

[0059] By recursively calling the above segmentation formula, the fault area is continuously refined until the preset minimum segmentation distance is reached.

[0060] S3: Repeatedly apply low voltage and monitor current to locate the fault point through segmented search method.

[0061] Furthermore, by combining the voltage generator with the segmented search, the fault point of the secondary circuit of the voltage transformer can be accurately located and the fault point can be eliminated.

[0062] The voltage generator will apply voltage according to a preset sequence of stepped voltages, rather than a single low voltage. After each voltage is applied, the current change is monitored and the voltage-current pair is recorded. For each voltage step, the current response I(V k ), where V k is the voltage of the kth step, analyze the current response, and use the following model to calculate the fault probability density function P f (R k ):

[0063]

[0064] Among them, I normal (V k ) is the expected current under normal conditions, I max (V k ) is the maximum expected current.

[0065] By integral Pf (R k ) to obtain the cumulative failure probability F(R) to locate the failure point:

[0066]

[0067] Where R0 is the starting resistance value, R is the current segment resistance; when F(R) exceeds the preset fault threshold F threshold , the fault point is considered to be located in the current segment.

[0068] It should be noted that once the fault point is located, the fault point is eliminated by gradually reducing the voltage and monitoring the current. The following model is used to monitor the fault elimination process:

[0069]

[0070] Among them, Q(V k ) is the troubleshooting quality indicator, I initial (V k ) is the current at fault, I final (V k ) is the current after the fault is eliminated.

[0071] Example 2, reference Figure 2 - Figure 4 , which is an embodiment of the present invention, provides a method for locating faults in the secondary circuit of a voltage transformer. In order to verify the beneficial effects of the present invention, scientific demonstration is carried out through experiments.

[0072] 1) As attached Figure 2 This is a typical expansion diagram of the secondary connection of the voltage transformer. Based on the 6kV system voltage transformer connection method, the secondary side of the three-phase voltage transformer adopts the star connection method. The secondary side is equipped with fuses, voltage busbars YMa, YMb, YMc, YMn, voltage meter V, and voltage relays 1KV and 2KV.

[0073] 2) Figure 3 Description: A ground fault occurs in the nth branch of the voltage busbar of the secondary circuit of the voltage transformer. Since the voltage busbar carries many branches, and there are many voltage measuring meters, electric energy meters, comprehensive measuring devices and other equipment on its branches, most of these equipment are inductive loads. When using an insulation tester or a multimeter to test the ground, its DC resistance is usually very small, which can be 1~2Ω in the actual system. In this case, the normal state and the fault state of the circuit cannot be distinguished by the test resistance data of the fault-free branch and the faulty branch. After the secondary circuit of the voltage transformer fails, the fuse of the faulty phase will melt. Figure 3 It shows the status after taking safety isolation measures after a voltage transformer failure.

[0074] 3) Figure 4The AC voltage signal generator is used to distinguish the fault state. In case that the test resistance method cannot distinguish the fault, an AC voltage signal generator (in this case, it can be a microcomputer relay protection tester) with an output short-circuit protection alarm function is used. The output terminals UX and UY of the AC voltage signal generator are connected to the YMc and YMn circuits. YMn is in a grounding condition. The AC voltage signal generator is used to output a small AC voltage signal (10V, 50Hz in this case). Through the segmented search method, it can be located that there is a grounding fault in the n branch on the third section of the YMc small busbar. The voltage UXY is applied to the path such as Figure 4 The red line path in the middle is in a short-circuit state. The AC voltage signal generator will lose power and issue a secondary alarm due to output short circuit. This indicates that there is a fault on the YMc small busbar.

[0075] 4) After using the above method to determine the faulty circuit, the segmented search method can be used to gradually check the equipment connected to the circuit. After removing some branches, the method of applying a low-value voltage with the AC voltage signal generator in 3) can be cyclically applied. After the low-value voltage is applied to the fault-free branch, the circuit state will remain normal and will not trigger a power-off alarm. If a low-value voltage is applied to the faulty branch, it will still trigger a power-off alarm. In this way, the fault point can be gradually narrowed down until it is located.

[0076] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.

[0077] Embodiment 3, the third embodiment of the present invention, is different from the first two embodiments in that:

[0078] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc., which can store program codes.

[0079] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in conjunction with such instruction execution systems, devices or apparatuses. For the purposes of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in conjunction with such instruction execution systems, devices or apparatuses.

[0080] More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection with one or more wires (electronic device), a portable computer disk case (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be a paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, deciphering or, if necessary, processing in another suitable manner, and then stored in a computer memory.

[0081] It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, a plurality of steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0082] Example 4, reference Figure 5 , which is an embodiment of the present invention, provides a voltage transformer secondary circuit fault location system, characterized in that it includes a low voltage generator module 1, a current monitoring unit 2, a control logic unit 3, and a fault indication unit 4;

[0083] A low voltage generator module 1 provides a safe low voltage output for applying to the secondary circuit of the voltage transformer to detect faults without causing damage;

[0084] The current monitoring unit 2 measures the current value after the low voltage is applied, and is used to determine whether there is a short circuit or ground fault in the circuit;

[0085] The control logic unit 3 controls the operation of the low voltage generator according to the data of the current monitoring unit, and executes the segmented search algorithm to gradually narrow the scope of the fault point;

[0086] The fault indication unit 4 provides a visual or audible indication signal when a fault is detected, to inform the operator of the existence of the fault and the location of the fault point.

[0087] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.

Claims

1. A method for locating a fault in a secondary circuit of a voltage transformer, characterized in that: include, Apply low voltage to the secondary circuit of the voltage transformer, monitor the circuit current, and determine the state of the secondary circuit of the voltage transformer according to the circuit current; When it is determined that there is a fault, the secondary circuit of the voltage transformer to be checked is processed in sections; Repeatedly apply low voltage and monitor the current to locate the fault point using the segmented search method.

2. A method for locating a fault in a secondary circuit of a voltage transformer as claimed in claim 1, characterized in that: The applying of low voltage includes adopting the principle of low voltage application and using a safe voltage lower than 36V. When applied to the secondary circuit, the short-circuit current value in the circuit is reduced, thereby protecting the safety of the secondary circuit and the test instrument.

3. A method for locating a fault in a secondary circuit of a voltage transformer as claimed in claim 2, characterized in that: The monitoring loop current includes: when it is determined that there is a short circuit or grounding fault in the secondary circuit of the voltage transformer, the voltage generator automatically cuts off the power and issues an alarm.

4. A method for locating a fault in a secondary circuit of a voltage transformer as claimed in claim 3, characterized in that: The state of the secondary circuit of the voltage transformer is cut off, including: if the circuit current is greater than 1A during the low voltage application process, it is determined that there is a short circuit or ground fault in the secondary circuit of the voltage transformer; If the loop current is less than 0.1A after applying low voltage, it is determined that the secondary circuit of the voltage transformer is in normal state.

5. A method for locating a fault in a secondary circuit of a voltage transformer as claimed in claim 4, characterized in that: The segmented processing includes a segmented search method of binary division, which divides the circuit to be checked into two parts from the middle of the small busbar, applies a low voltage again on the voltage small busbar after the binary division, monitors the current, and determines the faulty part according to the current size.

6. A method for locating a fault in a secondary circuit of a voltage transformer as claimed in claim 5, characterized in that: The segmented search method for locating the fault point includes: after applying a low voltage, if the loop current is less than 0.1A, it is determined that the faulty part has been isolated.

7. A method for locating a fault in a secondary circuit of a voltage transformer as claimed in claim 6, characterized in that: The segmented search method for locating the fault point also includes continuing to use the segmented search method on the isolated faulty part to narrow the range of the fault point, and finally accurately locating the fault point of the secondary circuit of the voltage transformer by continuously repeating the segmented search.

8. A system using a voltage transformer secondary circuit fault location method as claimed in any one of claims 1 to 7, characterized in that: It includes a low voltage generator module, a current monitoring unit, a control logic unit, and a fault indication unit; The low voltage generator module provides a safe low voltage output for applying to the secondary circuit of the voltage transformer to detect faults without causing damage; The current monitoring unit measures the current value after the low voltage is applied, and is used to determine whether there is a short circuit or ground fault in the circuit; The control logic unit controls the operation of the low voltage generator according to the data of the current monitoring unit, and executes a segmented search algorithm to gradually narrow the scope of the fault point; The fault indication unit, when a fault is detected, provides a visual or audible indication signal to inform the operator of the existence of the fault and the location of the fault point.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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