Device processing method and device, electronic equipment and computer readable storage medium

Abstract

The invention relates to a device processing method and device, electronic equipment, a storage medium and a computer program product. The method comprises the following steps: detecting a power management integrated circuit (PMIC) in the electronic equipment, and determining an abnormal working problem of the PMIC; aiming at each abnormal work problem, determining a repair scheme corresponding to the abnormal work problem; and repairing the abnormal working problem according to the repairing scheme. By adopting the method, the problem of abnormal working of the PMIC device can be self-adaptively repaired.

Description

Technical Field

[0001] The present application relates to the field of imaging technology, and in particular to a device processing method, apparatus, electronic device and computer-readable storage medium. Background Art

[0002] With the development of computer technology, electronic devices usually have power management integrated circuits (PMIC) devices to achieve real-time adjustment of power input and output, including rise time, startup time, etc.

[0003] However, the traditional method for handling PMIC devices is that when some abnormal problems occur in PMIC devices, the device can only be repaired or replaced at a repair shop, and the electronic device cannot adaptively repair the abnormal working problems. Summary of the invention

[0004] The embodiments of the present application provide a device processing method, apparatus, electronic device, computer-readable storage medium, and computer program product, which can adaptively repair the abnormal working problem of a PMIC device.

[0005] In a first aspect, the present application provides a device processing method. The method comprises:

[0006] Detecting a power management integrated circuit PMIC in an electronic device to determine an abnormal operation of the PMIC;

[0007] For each abnormal working problem, determine a repair solution corresponding to the abnormal working problem;

[0008] The abnormal working problem is repaired according to the repair plan.

[0009] In a second aspect, the present application also provides a device processing apparatus. The apparatus comprises:

[0010] A problem detection module is used to detect a power management integrated circuit PMIC in an electronic device and determine an abnormal working problem of the PMIC;

[0011] A repair solution determination module is used to determine a repair solution corresponding to each abnormal working problem;

[0012] A repair module is used to repair the abnormal working problem according to the repair plan.

[0013] In a third aspect, the present application further provides an electronic device. The electronic device includes a memory and a processor, the memory stores a computer program, and the processor implements the following steps when executing the computer program:

[0014] Detecting a power management integrated circuit PMIC in an electronic device to determine an abnormal operation of the PMIC;

[0015] For each abnormal working problem, determine a repair solution corresponding to the abnormal working problem;

[0016] The abnormal working problem is repaired according to the repair plan.

[0017] In a fourth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0018] Detecting a power management integrated circuit PMIC in an electronic device to determine an abnormal operation of the PMIC;

[0019] For each abnormal working problem, determine a repair solution corresponding to the abnormal working problem;

[0020] The abnormal working problem is repaired according to the repair plan.

[0021] In a fifth aspect, the present application further provides a computer program product. The computer program product includes a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0022] Detecting a power management integrated circuit PMIC in an electronic device to determine an abnormal operation of the PMIC;

[0023] For each abnormal working problem, determine a repair solution corresponding to the abnormal working problem;

[0024] The abnormal working problem is repaired according to the repair plan.

[0025] The device processing method, apparatus, electronic device, computer-readable storage medium and computer program product are described above. The electronic device detects the power management integrated circuit PMIC and determines the abnormal working problem of the PMIC. Then, for each abnormal working problem, a repair plan corresponding to the abnormal working problem can be determined. The abnormal working problem can be adaptively repaired according to the repair plan, thereby improving the accuracy and efficiency of repairing the abnormal working problem of the PMIC. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0027] Figure 1 is a flow chart of a device processing method in one embodiment;

[0028] Figure 2 A schematic diagram of the rise time in one embodiment;

[0029] Figure 3 is a flow chart of a device processing method in another embodiment;

[0030] Figure 4 is a flow chart of a device processing method in another embodiment;

[0031] Figure 5 is a flow chart of a device processing method in another embodiment;

[0032] Figure 6 is a structural block diagram of a device processing apparatus in one embodiment;

[0033] Figure 7 FIG. 4 is a diagram showing the internal structure of an electronic device in one embodiment. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0035] In one embodiment, Figure 1 As shown, a device processing method is provided. This embodiment uses the method applied to an electronic device as an example. The electronic device can be a terminal or a server. It can be understood that the method can also be applied to a system including a terminal and a server, and is implemented through the interaction between the terminal and the server. Among them, the terminal can be but is not limited to various personal computers, laptops, smart phones, tablets, Internet of Things devices and portable wearable devices. The Internet of Things devices can be smart speakers, smart TVs, smart air conditioners, smart car-mounted devices, smart cars, etc. Portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc. The server can be implemented as an independent server or a server cluster consisting of multiple servers.

[0036] In this embodiment, the method includes the following steps:

[0037] Step S102 , detecting a power management integrated circuit PMIC in the electronic device to determine if the PMIC has an abnormal operation.

[0038] Among them, the main function of the power management integrated circuit PMIC is to control the flow and direction of electricity to meet the needs of the main system. Among multiple power sources (for example, external true current power supply, battery, USB power supply, etc.), select and distribute power to various parts of the main system, such as providing multiple power supplies with different voltages and charging the internal battery. Because most of the systems used are powered by batteries, they often use high conversion efficiency designs to reduce power loss. Abnormal working problems are abnormal problems generated by PMIC during operation, which make PMIC unable to work normally.

[0039] Optionally, the abnormal working problem includes at least one of a first abnormal problem and a second abnormal problem, the first abnormal problem indicates an abnormal problem in the function of the PMIC, and the second abnormal problem indicates an abnormal problem in the performance of the PMIC.

[0040] Among them, the abnormal problems in PMIC function are abnormal problems in the power management function of PMIC, such as the inability of PMIC to power on or output voltage, etc.; the abnormal problems in PMIC performance are abnormal problems in the performance of PMIC during power management, such as the output current is too low, the output voltage is too high, etc.

[0041] Among them, the first abnormal problem includes at least one of the abnormal power-on and power-off problems of the PMIC, the abnormal voltage output problem and the abnormal current output problem; the second abnormal problem includes the abnormal output voltage ripple problem.

[0042] For example, the abnormal power-on and power-off problems of PMIC may be that the PMIC cannot be powered on or off; the abnormal voltage output problem may be that the voltage cannot be output, etc.; the abnormal current output problem may be leakage current, etc.; the output voltage ripple is too large or too small, etc. Among them, power-on refers to the process from the power supply being turned on to the system being stable and able to work; power-off refers to disconnecting the device from the power supply; voltage ripple refers to the industrial frequency AC component contained in the output DC voltage.

[0043] Optionally, the electronic device performs environmental detection, and when the environmental conditions of the electronic device meet the set environmental requirements, performs work abnormality detection on the PMIC of the electronic device to determine the work abnormality problem of the PMIC.

[0044] The electronic device performs environmental detection at a preset period. The preset period can be set as needed, such as one month, one day, 5 hours, etc. For example, the electronic device can perform environmental detection at 2 a.m. every month.

[0045] It is understandable that the electronic device performs environmental detection and detects the working abnormality of the PMIC when the set environmental requirements are met, which can achieve the detection effect without affecting the user's use.

[0046] Optionally, environmental detection includes the electronic device determining whether the electronic device is in a charging mode, and if so, detecting whether the standby time of the electronic device exceeds a preset time; if the standby time of the electronic device exceeds the preset time, performing a working abnormality detection on the PMIC.

[0047] Among them, the preset duration can be set as needed, such as 2 hours.

[0048] Optionally, if the electronic device is not in charging mode, determine another time to continue to perform the step of determining whether the electronic device is in charging mode. Exemplarily, if the electronic device is not in charging mode, the step of determining whether the electronic device is in charging mode can be continued on the next day.

[0049] It is understandable that the entire process of detecting and repairing the PMIC of the electronic device takes a certain amount of time, and the CPU (Central Processing Unit) will work at a high load. If the electronic device is low on power, it may cause shutdown. Therefore, continuing to detect while the electronic device is in charging mode can ensure that the electronic device does not shut down and does not affect the user's use.

[0050] In other embodiments, the electronic device may also detect the PMIC randomly, or detect the PMIC during an idle time period of the electronic device, which is not limited here.

[0051] Optionally, if the standby time of the electronic device does not exceed the preset time, determine another time to continue to perform the step of detecting the working abnormality of the PMIC. Exemplarily, if the standby time of the electronic device does not exceed the preset time, the step of detecting the working abnormality of the PMIC can be continued on the next day.

[0052] It is understandable that the electronic device detects whether the standby time of the electronic device exceeds the preset time, so as to identify whether the user is likely to use the electronic device, and avoid high-load processing of the PMIC when the user is using the electronic device.

[0053] Step S104: for each abnormal working problem, determine a repair solution corresponding to the abnormal working problem.

[0054] The repair plan is a plan for repairing abnormal working problems. The repair plan can be set according to user needs and is not limited here.

[0055] Optionally, a correspondence between abnormal working problems and repair solutions is pre-set in the electronic device; after the abnormal working problems of the PMIC are determined, for each abnormal working problem, a repair solution for the abnormal working problem is determined from the correspondence.

[0056] Optionally, the repair solution includes at least one of adjusting the driving capability of the PMIC, adjusting the rise time, and adjusting the power-on logic of different signals; the driving capability of the PMIC is positively correlated with the degree of performance quality interference, and the rise time is the time it takes to rise from a low level to a high level.

[0057] Among them, the driving capability is the output capability, and the driving capability inside the PMIC is adjustable. The driving capability of the PMIC is positively correlated with the supported load, that is, the stronger the driving capability, the larger the supported load. The driving capability of the PMIC is positively correlated with the degree of interference of performance quality, that is, the stronger the driving capability, the greater the degree of interference of performance quality. Performance quality is a measure of the stability of the PMIC output voltage, that is, the output voltage ripple. The smaller the voltage ripple, the better the performance quality.

[0058] It is understandable that the driving capability of the PMIC can be set to multiple driving gears, and different driving gears correspond to different driving capabilities.

[0059] During the power-on process, the time required for the voltage to rise from the set low level to the set high level is called the rise time. Figure 2 As shown, the set low level is 10%, and the set high level is 90%. The rise time adjustment can adjust the stability of the output power supply. After the rise time, the PMIC output voltage is adjusted to a high level.

[0060] It is understandable that there are different signals inside the PMIC, such as the reset signal (rst), I2C signal, I2C pull-up power signal, VDD power signal, etc. The power-on logic is to adjust the power-on sequence of various signals inside the PMIC, that is, to control which signal is powered on first and which is powered on later according to the requirements.

[0061] Step S106, repairing the abnormal working problem according to the repair plan.

[0062] Optionally, the repair plan may include at least one sub-plan; the electronic device determines the target sub-plan in sequence according to the arrangement order of the sub-plans; repairs the abnormal working problem according to the target sub-plan, and detects whether the abnormal working problem is solved; if the abnormal working problem is not solved, return to the step of determining the target sub-plan in sequence according to the arrangement order of the sub-plans, and continue to repair the abnormal working problem according to the target sub-plan; if the abnormal working problem has been solved, end the processing process of the PMIC device.

[0063] Optionally, if the abnormal working problem cannot be solved after being repaired according to the repair plan, a prompt message is generated to prompt the user to perform maintenance.

[0064] In the above device processing method, the electronic device detects the power management integrated circuit PMIC and determines the abnormal working problem of the PMIC. Then, for each abnormal working problem, a repair plan corresponding to the abnormal working problem can be determined, and the abnormal working problem can be adaptively repaired according to the repair plan, thereby improving the accuracy and efficiency of repairing the abnormal working problem of the PMIC, as well as the overall performance of the electronic device, extending the service life of the PMIC, and reducing the cost of the electronic device.

[0065] Furthermore, the device processing method described above is applied to products with better performance, which can greatly enhance product competitiveness.

[0066] In one embodiment, Figure 3 As shown, the electronic device starts to perform environmental detection to determine whether it is in the night charging mode. If not, it ends. If so, it performs standby confirmation, that is, determines whether the standby time exceeds 2 hours. If not, it ends. If so, it starts the device self-test mode and generates a self-test report; the self-test report includes the abnormal working problems of the PMIC, the positioning points of each abnormal working problem, and the corresponding repair plan for each abnormal working problem. The device self-test mode detects the PMIC device, including function detection, image quality detection and line detection of the image obtained by the camera module, etc.; the repair plan corresponding to each abnormal working problem may include at least one sub-plan.

[0067] Determine from the self-test report whether there is any abnormal working problem. If not, end the process. If so, use sub-solution 1 in the repair plan corresponding to the abnormal working problem, that is, use sub-solution 1 to repair the abnormal working problem. Continue to detect whether the abnormal working problem has been solved. If so, end the process. If not, upgrade the repair measures, that is, use sub-solution 2 to continue to repair the abnormal working problem until the abnormal working problem is solved.

[0068] In one embodiment, the working abnormality problem includes at least one of a first abnormality problem and a second abnormality problem, the first abnormality problem indicates a functional abnormality problem of the PMIC, and the second abnormality problem indicates a performance abnormality problem of the PMIC; detecting the power management integrated circuit PMIC in the electronic device to determine the working abnormality problem of the PMIC includes: performing a functional detection on the power management integrated circuit PMIC in the electronic device to determine the first abnormality problem of the PMIC; performing a performance detection on the PMIC based on associated devices of the PMIC to determine the second abnormality problem of the PMIC.

[0069] Among them, the associated device of PMIC is a device associated with PMIC. Optionally, the key device may be a camera module, that is, PMIC supplies power to the camera module, and the two are associated. Optionally, the associated device may also include a CPU, a screen, or a physical button.

[0070] Optionally, the electronic device uses a preset function detection algorithm to perform function detection on the power management integrated circuit PMIC in the electronic device to determine a first abnormal problem of the PMIC; and uses a preset performance detection algorithm to perform performance detection on the PMIC based on associated devices of the PMIC to determine a second abnormal problem of the PMIC.

[0071] Optionally, the electronic device obtains characteristic information of the associated components based on the associated components of the PMIC, performs performance detection on the PMIC based on the characteristic information, and determines the second abnormal problem of the PMIC.

[0072] Optionally, if the associated device is a camera module, the characteristic information may be an image captured by the camera module; the electronic device obtains the image acquired by the camera module, performs performance testing on the PMIC based on the image, and determines the second abnormal problem of the PMIC.

[0073] Optionally, based on the associated devices of the PMIC, a performance test is performed on the PMIC to determine a second abnormal problem of the PMIC, including: detecting image quality based on an image acquired by a camera module associated with the PMIC; the image quality represents the performance of the PMIC; if the image quality does not meet a preset image quality condition, determining the second abnormal problem of the PMIC.

[0074] The preset image quality condition can be set as needed. For example, the preset image quality condition can be that the number of stripes in the image is lower than a preset number, or the image noise is lower than a preset noise threshold, etc., but is not limited thereto. The preset number and the preset noise threshold can be set as needed. Stripes are high-frequency textures in the image.

[0075] It is understandable that PMIC can determine the size of the power supply output voltage ripple, and the voltage ripple size will affect the image quality obtained by the camera module. Therefore, the image quality obtained by the camera module can characterize the performance of PMIC.

[0076] Optionally, the electronic device uses a preset image quality detection algorithm to detect the image quality, wherein the image quality detection algorithm may be a noise detection algorithm or a stripe detection algorithm.

[0077] Optionally, the electronic device can manage multiple images acquired by the camera module based on the PMIC, detect the image quality of each image, and determine the average image quality based on the image quality of each image; if the average image quality does not meet the preset image quality conditions, the second abnormal problem of the PMIC is determined.

[0078] Exemplarily, the electronic device uses a noise detection algorithm to detect power noise of 5 images and calculates the average noise of the power noise of the 5 images. If the average noise is greater than a preset noise threshold of 20, it means that the average image quality does not meet the preset image quality condition.

[0079] In this embodiment, the electronic device performs a functional test on the PMIC to accurately determine the first abnormal problem of the PMIC, and performs a performance test on the PMIC to accurately determine the second abnormal problem of the PMIC. Furthermore, the electronic device detects the image quality based on the image acquired by the camera module associated with the PMIC, and the image quality represents the performance of the PMIC, so that the second abnormal problem of the PMIC can be determined more accurately.

[0080] In one embodiment, the repair scheme includes at least one of the driving capability adjustment, rise time adjustment and power-on logic adjustment of different signals of the PMIC; the driving capability of the PMIC is positively correlated with the degree of performance quality interference, and the rise time is the time it takes to rise from a low level to a high level; for each abnormal working problem, a repair scheme corresponding to the abnormal working problem is determined, including: for the abnormal power on and off problems and voltage problems of the PMIC, determining that the repair scheme corresponding to the voltage abnormality problem is at least one of the driving capability adjustment and the power-on logic adjustment of different signals; for the abnormal current output problem of the PMIC, determining that the repair scheme corresponding to the abnormal current output problem is at least one of the rise time adjustment and the power-on logic adjustment of different signals; for the abnormal output voltage ripple problem of the PMIC, determining that the repair scheme corresponding to the abnormal output voltage ripple problem is at least one of the driving capability adjustment and the rise time adjustment.

[0081] Among them, the driving capability of PMIC has multiple gears, each gear has different driving capabilities, and different driving gears can be adjusted through software to avoid performance problems of PMIC devices.

[0082] As shown in Table 1, PMIC includes 4 gears, namely the first gear, the second gear, the third gear and the fourth gear, and the driving capacity increases in sequence; the performance corresponding to each gear is also different, the first gear has the smallest driving capacity, but the performance quality interference is also the smallest; the fourth gear has the largest driving capacity, and the corresponding performance quality interference is also the largest. Therefore, electronic equipment can optimize the problems caused by the performance of the PMIC itself based on the performance differences of different gears.

[0083] Table 1:

[0084]

[0085] Among them, MBG (Master Bus Generator) is the master bus generator, LPM mode (Low Power Mode) is the low power mode, Enable Rout_small_en (Enable Routing Small Version) is to reduce the current limiting impedance, and Enable MBG buffer is to enable the MBG buffer.

[0086] The rise time can be adjusted in multiple gears, such as 31us, 90us, 160us, etc. This adjustable range can be used to solve the differences in the rise time requirements of some functional components and improve system performance.

[0087] The power-on logic of different signals is controllable and adjustable. This feature can be used to solve the problem of related devices (such as camera modules) being unable to power on due to timing variations of different signals of some PMICs. For example, a related device may mutate due to later use, and the normal power-on timing of the PMIC for the related device may cause leakage current, resulting in logic circuit judgment errors. In this case, the repair solution for the electronic device can be to change the power-on logic, adjust the power-on timing to avoid the problem, and start the power-on of the leakage current part after the logic circuit judgment is completed.

[0088] Optionally, with respect to the abnormal power-on and power-off problems and abnormal voltage problems of the PMIC, it is determined that a repair solution corresponding to the abnormal voltage problem is to increase the driving capability.

[0089] For example, the electronic device can test the PMIC device by turning it on and off (1000 times) to see if the voltage is output (whether the function is normal). If the PMIC is judged to have an abnormal voltage problem, the drive capacity is increased, that is, the first gear is the default, the drive capacity is the smallest, and it is gradually adjusted to the second gear. If the problem can be solved, there is no need to increase the drive capacity; if there is still an abnormality, it is increased to the third gear. And so on.

[0090] Optionally, for the power-on and power-off abnormalities and voltage abnormalities of the PMIC, it is determined that the repair solution corresponding to the voltage abnormality problem is to adjust the power-on logic of different signals; the power-on logic can adjust the power-on sequence of different signals.

[0091] Among them, the current output abnormality may be leakage current, etc.; optionally, for the current output abnormality problem of the PMIC, it is determined that the repair solution corresponding to the current output abnormality problem is to power on the reset signal and the VDD power supply signal in sequence.

[0092] It is understandable that the normal PMIC power-on logic is that the reset signal lags behind the VDD power supply. By adjusting the power-on of the rst reset signal to before the VDD power supply signal, the influence of leakage current on the power-on timing can be solved and the influence of leakage current on logic judgment can be avoided.

[0093] Optionally, for the abnormal current output problem of the PMIC, it is determined that a repair solution corresponding to the abnormal current output problem is to adjust the rise time, which may be to increase the rise time or decrease the rise time.

[0094] Optionally, with respect to the abnormal problem of the output voltage ripple of the PMIC, it is determined that a repair solution corresponding to the abnormal problem of the output voltage ripple is to shorten the rise time.

[0095] It is understandable that if the output voltage ripple of the PMIC is abnormal, the image captured by the camera module will have stripes, which can be dealt with by shortening the rise time from 160us to 60us and speeding up the stability of the output power supply. Optionally, the electronic device can also synchronously change the input power supply VDD of the PMIC to the PWM pulse width modulation control mode to improve the power quality.

[0096] For example, since the associated components in a device have differences in themselves and have different requirements for the rise time of the PMIC, the electronic device can adjust different rise times to match different associated components.

[0097] Optionally, for the abnormal output voltage ripple of the PMIC, it is determined that the repair solution corresponding to the abnormal output voltage ripple is to adjust the driving capability. Adjusting the driving capability may be to increase the driving capability or to reduce the driving capability.

[0098] In this embodiment, the electronic device can use corresponding repair solutions to more accurately repair the abnormal problems of power on and off and voltage, abnormal current output and abnormal output voltage ripple of the PMIC.

[0099] In one embodiment, Figure 4As shown, the electronic device confirms the problem point, that is, it determines that the abnormal working problem of the PMIC is the abnormal output voltage ripple, which causes the problem of too many stripes in the image obtained by the camera module; it can be understood that the generation of the lines is caused by abnormal power quality, which is a power performance problem; then for the abnormal output voltage ripple problem of the PMIC, the corresponding repair schemes include sub-scheme 1, sub-scheme 2 and sub-scheme 3 in sequence; the electronic device adopts sub-scheme 1 to repair the abnormal output voltage ripple, and continues to perform a performance self-test to see if it is solved; if so, it ends, if the abnormal output voltage ripple problem still exists after the sub-scheme 1 is repaired, the sub-scheme 2 is used to repair the abnormal output voltage ripple, and the performance self-test is continued to see if it is solved; if so, it ends, if the abnormal output voltage ripple problem still exists after the sub-scheme 2 is repaired, the sub-scheme 3 is used to repair the abnormal output voltage ripple, and the performance self-test is continued to see if it is solved, if so, it ends, if not, a prompt message is generated to prompt the user to repair.

[0100] Optionally, sub-scheme 1 is to increase the output voltage to improve the anti-interference ability of the sensor; sub-scheme 2 is to reduce the driving ability to improve the power quality; sub-scheme 3 is to improve the power quality of the PMIC input end and use PWM (pulse width modulation) mode to power the PMIC.

[0101] By gradually introducing different repair solutions to fix problems, you can optimize the overall performance while optimizing performance.

[0102] In one embodiment, Figure 5 As shown in the figure, this solution mainly includes two parts: abnormal working problem identification and performance optimization. Abnormal working problem identification completes the detection of device performance and outputs a diagnosis table; performance optimization is to optimize the performance through the diagnosis table and formulate a corresponding repair plan to repair the abnormal working problem.

[0103] Among them, the electronic device performs sleep charging detection on the PMIC device to be identified. If it is determined that the PMIC is in charging mode, line detection, function detection and leakage current detection are performed on the PMIC to determine the working abnormality problem; for each working abnormality problem, a corresponding repair plan is selected; the repair plan is imported to repair the working abnormality problem; the PMIC device is continued to be detected to determine whether the image noise in the image obtained by the camera module is less than the preset noise threshold; if the image noise is less than the preset noise threshold, the image is output; if the image noise is greater than or equal to the preset noise threshold, the optimization continues.

[0104] In one embodiment, another device processing method is provided, which is applied to an electronic device and includes the following steps:

[0105] Step A1, performing a functional test on a power management integrated circuit PMIC in an electronic device to determine a first abnormal problem of the PMIC; the first abnormal problem indicates a functional abnormal problem of the PMIC, and the first abnormal problem includes at least one of a power-on and power-off abnormal problem, a voltage output abnormal problem, and a current output abnormal problem of the PMIC.

[0106] Step A2, based on the image obtained by the camera module associated with the PMIC, detect the image quality; the image quality represents the performance of the PMIC; if the image quality does not meet the preset image quality conditions, determine the second abnormal problem of the PMIC; the second abnormal problem indicates an abnormal problem in the performance of the PMIC, and the second abnormal problem includes an abnormal problem in the output voltage ripple.

[0107] Step A3, for each abnormal working problem, determine the repair plan corresponding to the abnormal working problem; the abnormal working problem includes at least one of the first abnormal problem and the second abnormal problem; the repair plan includes at least one of the driving capability adjustment of the PMIC, the rise time adjustment and the power-on logic adjustment of different signals; the driving capability of the PMIC is positively correlated with the degree of performance quality interference, and the rise time is the time it takes to rise from a low level to a high level.

[0108] Step A4, for the power-on and power-off abnormalities and voltage abnormalities of the PMIC, determine that the repair solution corresponding to the voltage abnormality problem is at least one of the drive capability adjustment and the power-on logic adjustment of different signals; for the current output abnormality problem of the PMIC, determine that the repair solution corresponding to the current output abnormality problem is at least one of the rise time adjustment and the power-on logic adjustment of different signals; for the output voltage ripple abnormality problem of the PMIC, determine that the repair solution corresponding to the output voltage ripple abnormality problem is at least one of the drive capability adjustment and the rise time adjustment.

[0109] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0110] Based on the same inventive concept, the embodiment of the present application also provides a device processing apparatus for implementing the device processing method involved above. The implementation scheme for solving the problem provided by the apparatus is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more device processing apparatus embodiments provided below can refer to the limitations on the device processing method above, and will not be repeated here.

[0111] In one embodiment, Figure 6 As shown, a device processing apparatus is provided, including: a problem detection module 602, a repair solution determination module 604 and a repair module 606, wherein:

[0112] The problem detection module 602 is used to detect the power management integrated circuit PMIC in the electronic device and determine the abnormal working problem of the PMIC.

[0113] The repair solution determination module 604 is used to determine a repair solution corresponding to each abnormal working problem.

[0114] The repair module 606 is used to repair the abnormal working problem according to the repair plan.

[0115] The above-mentioned device processing apparatus and electronic device detect the power management integrated circuit PMIC and determine the abnormal working problem of the PMIC. Then, for each abnormal working problem, a repair plan corresponding to the abnormal working problem can be determined, and the abnormal working problem can be adaptively repaired according to the repair plan, thereby improving the accuracy and efficiency of repairing the abnormal working problem of the PMIC.

[0116] In one embodiment, the working abnormal problem includes at least one of a first abnormal problem and a second abnormal problem, the first abnormal problem indicates an abnormal problem in the function of the PMIC, and the second abnormal problem indicates an abnormal problem in the performance of the PMIC.

[0117] In one embodiment, the problem detection module 602 is also used to perform a functional test on a power management integrated circuit PMIC in an electronic device to determine a first abnormal problem of the PMIC; and perform a performance test on the PMIC based on associated components of the PMIC to determine a second abnormal problem of the PMIC.

[0118] In one embodiment, the problem detection module 602 is also used to detect the image quality based on the image acquired by the camera module associated with the PMIC; the image quality represents the performance of the PMIC; if the image quality does not meet the preset image quality conditions, the second abnormal problem of the PMIC is determined.

[0119] In one embodiment, the first abnormal problem includes at least one of abnormal power-on and power-off problems of the PMIC, abnormal voltage output problems, and abnormal current output problems; and the second abnormal problem includes abnormal output voltage ripple problems.

[0120] In one embodiment, the repair solution includes at least one of adjusting the driving capability of the PMIC, adjusting the rise time, and adjusting the power-on logic of different signals; the driving capability of the PMIC is positively correlated with the degree of performance quality interference, and the rise time is the time it takes to rise from a low level to a high level.

[0121] In one embodiment, the above-mentioned repair module 606 is also used to determine that the repair solution corresponding to the abnormal power-on and power-off problems and abnormal voltage problems of the PMIC is at least one of the driving capability adjustment and the power-on logic adjustment of different signals; for the abnormal current output problem of the PMIC, it is determined that the repair solution corresponding to the abnormal current output problem is at least one of the rise time adjustment and the power-on logic adjustment of different signals; for the abnormal output voltage ripple problem of the PMIC, it is determined that the repair solution corresponding to the abnormal output voltage ripple problem is at least one of the driving capability adjustment and the rise time adjustment.

[0122] Each module in the above-mentioned device processing apparatus can be implemented in whole or in part by software, hardware, or a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in an electronic device in the form of hardware, or can be stored in a memory in an electronic device in the form of software, so that the processor can call and execute operations corresponding to each of the above modules.

[0123] In one embodiment, an electronic device is provided. The electronic device may be a terminal, and its internal structure diagram may be as follows: Figure 7As shown. The electronic device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface, the display unit and the input device are connected to the system bus through the input / output interface. Among them, the processor of the electronic device is used to provide computing and control capabilities. The memory of the electronic device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the electronic device is used to exchange information between the processor and an external device. The communication interface of the electronic device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a device processing method is implemented. The display unit of the electronic device is used to form a visually visible picture, which can be a display screen, a projection device or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the electronic device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the electronic device casing, or an external keyboard, touchpad or mouse.

[0124] Those skilled in the art will understand that Figure 7 The structure shown in the figure is merely a block diagram of a partial structure related to the scheme of the present application, and does not constitute a limitation on the electronic device to which the scheme of the present application is applied. The specific electronic device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0125] The embodiment of the present application also provides a computer-readable storage medium, one or more non-volatile computer-readable storage media containing computer-executable instructions, when the computer-executable instructions are executed by one or more processors, the processors execute the steps of the device processing method.

[0126] The embodiment of the present application also provides a computer program product including instructions, which, when executed on a computer, enables the computer to execute the device processing method.

[0127] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant laws, regulations and standards of relevant countries and regions.

[0128] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0129] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0130] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A device processing method, characterized in that: include: Detecting a power management integrated circuit PMIC in an electronic device to determine an abnormal operation of the PMIC; For each abnormal working problem, determine a repair solution corresponding to the abnormal working problem; The abnormal working problem is repaired according to the repair plan.

2. The method according to claim 1, characterized in that The abnormal working problem includes at least one of a first abnormal problem and a second abnormal problem, wherein the first abnormal problem indicates an abnormal problem in the function of the PMIC, and the second abnormal problem indicates an abnormal problem in the performance of the PMIC.

3. The method according to claim 2, characterized in that The detecting of the power management integrated circuit PMIC in the electronic device to determine the abnormal working problem of the PMIC includes: Performing a function test on a power management integrated circuit PMIC in the electronic device to determine a first abnormal problem of the PMIC; Based on the associated components of the PMIC, a performance test is performed on the PMIC to determine a second abnormal problem of the PMIC.

4. The method according to claim 3, characterized in that The performing performance detection on the PMIC based on the associated device of the PMIC to determine the second abnormal problem of the PMIC includes: Based on an image acquired by a camera module associated with the PMIC, detecting the image quality of the image; the image quality represents the performance of the PMIC; If the image quality does not meet the preset image quality condition, a second abnormal problem of the PMIC is determined.

5. The method according to claim 2, characterized in that: The first abnormal problem includes at least one of an abnormal power-on and power-off problem of the PMIC, an abnormal voltage output problem, and an abnormal current output problem; the second abnormal problem includes an abnormal output voltage ripple problem.

6. The method according to claim 1, characterized in that The repair solution includes at least one of adjusting the driving capability of the PMIC, adjusting the rise time, and adjusting the power-on logic of different signals; the driving capability of the PMIC is positively correlated with the degree of performance quality interference, and the rise time is the time it takes to rise from a low level to a high level.

7. The method according to claim 6, characterized in that Determining a repair solution corresponding to each abnormal working problem includes: With respect to the power-on and power-off abnormalities and voltage abnormalities of the PMIC, determining that a repair solution corresponding to the voltage abnormality problem is at least one of a driving capability adjustment and a power-on logic adjustment of different signals; With respect to the abnormal current output problem of the PMIC, determining that a repair solution corresponding to the abnormal current output problem is at least one of a rise time adjustment and a power-on logic adjustment of different signals; With respect to the abnormal problem of the output voltage ripple of the PMIC, it is determined that a repair solution corresponding to the abnormal problem of the output voltage ripple is at least one of a driving capability adjustment and a rise time adjustment.

8. A device processing apparatus, characterized in that: include: A problem detection module is used to detect a power management integrated circuit PMIC in an electronic device and determine an abnormal working problem of the PMIC; A repair solution determination module is used to determine a repair solution corresponding to each abnormal working problem; A repair module is used to repair the abnormal working problem according to the repair plan.

9. An electronic device comprising a memory and a processor, wherein a computer program is stored in the memory, wherein: When the computer program is executed by the processor, the processor is caused to perform the steps of the device processing method according to any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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