Multi-position sample table for X-ray diffractometer

By designing a multi-position sample table for X-ray diffractometer, using rotation method and general sample slots, combined with electric rotary tables and other equipment, the problems of low efficiency, poor universality and low automation in the existing technology are solved, and efficient and accurate sample testing is achieved.

CN119510462APending Publication Date: 2025-02-25SUZHOU LIYING TECH CO LTD
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Patent Information

Application Number
CN202411957327.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-30
Publication Date
2025-02-25

AI Technical Summary

Technical Problem

The existing X-ray diffractometers are inefficient, poor universality, and low degree of automation during testing. The multiple sample tables have poor alignment accuracy after replacing the samples.

Method used

A multi-position sample table for X-ray diffractometer was designed, and the sample table was injected in a rotary manner, combined with a universal glass powder sample tank, and equipped with a sample table base for position adjustment and alignment. The electric rotary table, Z-axis lift table, XY-axis displacement table and manual lift table are used to achieve efficient switching and alignment of sample positions.

Benefits of technology

The test efficiency of the X-ray diffractometer is improved, the universality and automation of multiple sample tables are enhanced, the precise alignment of each sample is ensured, and the testing effect is improved.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention discloses a multi-position sample table for an X-ray diffractometer, belongs to the technical field of X-rays, and aims to solve the problems of low efficiency, poor universality, low automation degree and poor alignment accuracy of the multi-position sample table after a continuous sample is replaced in the prior art. The top cover at least comprises a plurality of first sample bearing grooves which are uniformly distributed on the circumference and extend to an outer ring surface; a plurality of second sample bearing grooves extending to the outer ring surface are uniformly distributed in the circumference of one end surface, which is matched with the top cover, of the base, and the first sample bearing grooves and the second sample bearing grooves, which are matched with the top cover and the base, in one-to-one correspondence form an accommodating cavity; the plurality of supporting sheets are respectively positioned in the plurality of accommodating cavities; one ends of the plurality of sample slides respectively extend into the plurality of accommodating cavities, and the other ends of the plurality of sample slides are positioned outside the top cover and the base; the springs are located in the containing cavities, and after the top cover and the base are matched, the springs are in a compressed state.
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Description

Technical Field

[0001] The invention belongs to the technical field of X-rays, and in particular relates to a multi-position sample stage for an X-ray diffractometer. Background Art

[0002] X-ray diffraction is the most commonly used method to characterize the crystal structure of materials and has many applications. X-ray diffractometer uses X-ray diffraction to accurately measure the crystal structure, texture and stress of materials according to the principle of diffraction. It can accurately perform phase analysis, qualitative analysis and quantitative analysis. As the main means of characterizing the crystal structure of materials, it is widely used in scientific research, inspection and testing, and enterprise quality control of products.

[0003] With the introduction of the Materials Genome Project, a huge amount of sample data is waiting to be screened. However, at present, when testing, X-ray diffractometers can only test one sample at a time, and the next sample needs to be manually replaced after the test is completed. If the sample volume is relatively large and rapid testing is required for sample screening, this traditional operation method becomes cumbersome and the test efficiency is relatively low. To meet this demand, a variety of multi-position sample racks have appeared on the market, which can realize automatic testing of multiple samples by cooperating with intelligent testing software. However, the existing multi-position sample racks are customized for specific samples and are not universal. In addition, due to the limitation of the size of the goniometer, the number of positions of the existing multi-position sample racks is relatively small. In addition, there is a common problem with the existing multi-position sample racks. After a single alignment, the subsequent samples either have large deviations or need to be realigned, which is not very automated and wastes time. Summary of the invention

[0004] The purpose of the present invention is to provide a multi-position sample stage for an X-ray diffractometer to solve the problems of low efficiency, poor universality, low degree of automation and poor alignment accuracy of the multi-position sample stage after replacing subsequent samples in the prior art.

[0005] To achieve the above object, an X-ray diffractometer multi-position sample stage of the present invention comprises:

[0006] A top cover, the top cover at least comprising a plurality of first sample-carrying grooves uniformly distributed on one end surface, the first sample-carrying grooves extending to the outer annular surface of the top cover;

[0007] A base matched with one end face of the top cover provided with a first sample carrying groove, a plurality of second sample carrying grooves are evenly distributed circumferentially on one end face of the base matched with the top cover, the second sample carrying grooves extend to the outer annular surface of the base, the plurality of first sample carrying grooves and the plurality of second sample carrying grooves have the same size and are arranged one by one opposite to each other, and the first sample carrying grooves and the second sample carrying grooves of the matched top cover and the base that are opposite to each other form a receiving cavity;

[0008] A supporting sheet, wherein a plurality of the supporting sheets are respectively located in the plurality of the accommodating cavities;

[0009] A sample slide, one end of each of the sample slides extends into each of the multiple accommodating cavities, and the other end of each sample slide is located outside the top cover and the base, and the sample slide is located between the support sheet and the top cover;

[0010] And a plurality of springs are located in the plurality of accommodating cavities, wherein the springs are located between the supporting sheet and the base, and when the top cover and the base are fitted together, the springs are in a compressed state.

[0011] The multi-position sample stage further comprises a sample stage base, and the sample stage base comprises:

[0012] An electric rotating table, on which the top cover and the base are integrally fixed, and the top cover and the base are integrally driven to rotate around their own axis by the electric rotating table;

[0013] An electric Z-axis lifting platform is arranged at the lower end of the electric rotating platform, and the electric rotating platform is driven to rise and fall along the Z-axis by the electric Z-axis lifting platform;

[0014] An electric XY-axis translation table is arranged at the lower end of the electric Z-axis lifting table, and the electric rotating table and the electric Z-axis lifting table are driven by the electric XY-axis translation table to move in the X direction and the Y direction as a whole;

[0015] A manual lifting platform is arranged at the lower end of the electric XY axis translation platform, and the electric rotating platform, the electric Z axis lifting platform and the electric XY axis translation platform are driven to rise and fall as a whole by the manual lifting platform.

[0016] The top cover also includes:

[0017] A positioning groove at the center of a circle on an end surface opposite to the base;

[0018] and a plurality of axial first fixing through holes evenly distributed around the circumference;

[0019] The base also includes:

[0020] A positioning protrusion at the center of a circle on an end surface opposite to the top cover, wherein the positioning protrusion fits in a positioning groove of the top cover;

[0021] And a plurality of axial second fixing through holes evenly distributed around the circumference; the second fixing through holes correspond one to one with the first fixing through holes, and bolts pass through the first fixing through holes and the second fixing through holes in sequence to fix the top cover and the base on the table top of the sample table base.

[0022] The positioning groove and the positioning protrusion are polygonal structures.

[0023] The positioning groove and the positioning protrusion are quadrilateral structures or hexagonal structures.

[0024] The first fixing through hole is a stepped hole.

[0025] A second spring positioning groove is arranged on one end surface of the support sheet opposite to the base; a first spring positioning groove is arranged on one end surface of the base opposite to the support sheet; and two ends of the spring are respectively located in the second spring positioning groove and the first spring positioning groove.

[0026] The sample carrier 4 is a general-purpose powder sample glass carrier.

[0027] The beneficial effects of the present invention are as follows: a multi-position sample stage of an X-ray diffractometer of the present invention adopts a rotating manner to inject samples, and utilizes the space in the X-ray diffractometer as efficiently as possible; the sample stage is placed on a sample stage base, which is convenient for installation and disassembly; the sample stage uses a universal glass powder sample slot to ensure the universality of the rotating multi-position sample stage for the X-ray diffractometer. At the same time, the multi-position sample stage is equipped with a sample stage base, which is used for position adjustment during installation of the multi-position sample stage and alignment of the position of each sample. The multi-position sample stage can ensure the precise alignment of each sample to ensure the test effect, and has a high degree of automation. The present invention solves the problem of poor alignment accuracy of the multi-position sample stage after replacing the subsequent samples. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 This is a structural schematic diagram of a multi-position sample stage of an X-ray diffractometer of the present invention when it is a six-position sample stage;

[0029] Figure 2 This is a structural decomposition diagram of an X-ray diffractometer of the present invention when the multi-position sample stage is a six-position sample stage;

[0030] Figure 3 This is a schematic diagram of the top cover structure when the multi-position sample stage of an X-ray diffractometer of the present invention is a six-position sample stage;

[0031] Figure 4 This is a schematic diagram of the base structure when the multi-position sample stage of an X-ray diffractometer of the present invention is a six-position sample stage;

[0032] Figure 5 It is a schematic diagram of the structure of a sample stage base in a multi-position sample stage of an X-ray diffractometer of the present invention;

[0033] Figure 6 This is a structural schematic diagram of an X-ray diffractometer of the present invention when the multi-position sample stage is a fifteen-position sample stage;

[0034] Figure 7 This is a structural decomposition diagram of an X-ray diffractometer multi-position sample stage of the present invention when it is a fifteen-position sample stage;

[0035] Figure 8 This is a schematic diagram of the top cover structure when the multi-position sample stage of an X-ray diffractometer of the present invention is a fifteen-position sample stage;

[0036] Fig. 9 This is a schematic diagram of the base structure when the multi-position sample stage of an X-ray diffractometer of the present invention is a fifteen-position sample stage;

[0037] Wherein: 1. top cover, 101. first sample carrying groove, 102. positioning groove, 103. first fixed through hole, 2. base, 201. second sample carrying groove, 202. positioning protrusion, 203. second fixed through hole, 204. first spring positioning groove, 3. support plate, 4. sample carrier, 5. spring, 6. sample stage base, 601. electric rotating stage, 602. electric Z-axis lifting stage, 603. electric XY-axis translation stage, 604. manual lifting stage. DETAILED DESCRIPTION

[0038] The embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0039] Embodiment 1

[0040] See also Figure 1-Figure 5 This embodiment discloses a six-position sample stage of an X-ray diffractometer, comprising:

[0041] A top cover 1, wherein the top cover 1 comprises at least six first sample holding grooves 101 uniformly distributed on one end surface, and the first sample holding grooves 101 extend to the outer annular surface of the top cover 1;

[0042] A base 2 is matched with one end face of the top cover 1 provided with a first sample carrying groove 101, six second sample carrying grooves 201 are evenly distributed circumferentially on one end face of the base 2 and the top cover 1, and the second sample carrying grooves 201 extend to the outer annular surface of the base 2, the six first sample carrying grooves 101 and the six second sample carrying grooves 201 have the same size and are arranged one by one opposite to each other, and the matched first sample carrying grooves 101 and second sample carrying grooves 201 of the top cover 1 and the base 2 form a receiving cavity;

[0043] Support plates 3, six of the support plates 3 are respectively located in the six accommodating cavities;

[0044] Sample slides 4, one end of the six sample slides 4 extends into the six accommodating cavities respectively, and the other end is located outside the top cover 1 and the base 2, and the sample slides 4 are located between the support sheet 3 and the top cover 1;

[0045] And six springs 5 ​​are located in the six accommodating cavities, and the springs 5 ​​are located between the supporting sheet 3 and the base 2. After the top cover 1 and the base 2 are fitted together, the springs 5 ​​are in a compressed state.

[0046] The multi-position sample stage further comprises a sample stage base 6, and the sample stage base 6 comprises:

[0047] An electric rotating table 601, on which the top cover 1 and the base 2 are integrally fixed, and the top cover 1 and the base 2 are integrally driven to rotate around their own axis by the electric rotating table 601; the model of the electric rotating table 601 is TBR100;

[0048] An electric Z-axis lifting platform 602 is arranged at the lower end of the electric rotating platform 601, and the electric Z-axis lifting platform 602 drives the electric rotating platform 601 to rise and fall along the Z-axis; the model of the electric Z-axis lifting platform 602 is CZF20-100;

[0049] An electric XY-axis translation table 603 is arranged at the lower end of the electric Z-axis lifting table 602, and the electric rotating table 601 and the electric Z-axis lifting table 602 are driven by the electric XY-axis translation table 603 to move in the X direction and the Y direction as a whole; the electric XY-axis translation table 603 is of model PA100;

[0050] A manual lifting platform 604 is arranged at the lower end of the electric XY axis translation platform 603, and the electric rotating platform 601, the electric Z axis lifting platform 602 and the electric XY axis translation platform 603 are lifted and lowered as a whole through the manual lifting platform 604. The model of the manual lifting platform 604 is MJ120.

[0051] The top cover 1 also includes:

[0052] A positioning groove 102 at the center of the circle of an end surface opposite to the base 2;

[0053] and four axial first fixing through holes 103 evenly distributed around the circumference;

[0054] The base 2 also includes:

[0055] A positioning protrusion 202 at the center of a circle on an end surface opposite to the top cover 1, wherein the positioning protrusion 202 fits in the positioning groove 102 of the top cover 1;

[0056] And four axial second fixing holes 203 evenly distributed around the circumference; the second fixing holes 203 correspond one to one with the first fixing holes 103, and bolts pass through the first fixing holes 103 and the second fixing holes 203 in sequence to fix the top cover 1 and the base 2 on the table top 601 of the sample table base 6.

[0057] The positioning groove 102 and the positioning protrusion 202 are polygonal structures.

[0058] The positioning groove 102 and the positioning protrusion 202 are quadrilateral structures or hexagonal structures.

[0059] The first fixing through hole 103 is a stepped hole.

[0060] A second spring positioning groove is provided on one end surface of the support sheet 3 opposite to the base 2; a first spring positioning groove 204 is provided on one end surface of the base 2 opposite to the support sheet 3; and both ends of the spring 5 are respectively located in the second spring positioning groove and the first spring positioning groove 204.

[0061] The sample carrier 4 is a general-purpose powder sample glass carrier.

[0062] The top cover 1, base 2 and support sheet 3 of the present invention are formed by 3D printing; in the sample stage base 6, the electric rotating table 601 is used to drive the rotation when the sample position is switched, the electric Z-axis lifting table 602 and the manual lifting table 604 are used to drive the lifting and lowering when the sample height position is adjusted, and the electric XY-axis displacement table 603 is used to adjust the multi-position sample stage to the center position of the goniometer optical path during the first installation; the spring 5 is made of metal wire and is placed between the circular groove of the base 2 and the circular groove of the support sheet 3. It is in a compressed state when the sample carrier 4 is inserted, and plays a role in fixing the sample carrier 4; a sample groove is provided on the sample carrier 4, which is a universal powder sample glass carrier; during testing, the sample carrier 4 is inserted between the support sheet 3 and the outer ring groove of the top cover 1.

[0063] When doing specific operations:

[0064] 1. First, install the support sheet 3 and the spring 5 into the second sample supporting groove 201 of the base 2 in sequence; then assemble the positioning groove 102 of the top cover 1 and the positioning protrusion 202 of the base 2, and then fix the two parts on the sample stage base 6 through the first fixing through hole 103 of the top cover 1 and the second fixing through hole 203 of the base 2 by screws;

[0065] 2. The sample to be tested is loaded into the sample slide 4, i.e., a universal powder glass slide, and then one end of the sample slide 4 is inserted between the top cover 1 and the support sheet 3;

[0066] 3. During the test, the sample to be tested is located between the X-ray light source and the detector; after the test of one sample is completed, the electric rotating table 601 of the sample table base 6 rotates a certain angle, and then the next sample to be tested is sent to the middle position between the X-ray light source and the detector.

[0067] Embodiment 2

[0068] See also Figure 6-Figure 9This embodiment discloses a 15-position sample stage for an X-ray diffractometer, comprising:

[0069] A top cover 1, wherein the top cover 1 comprises at least fifteen first sample carrying grooves 101 uniformly distributed on one end surface, and the first sample carrying grooves 101 extend to the outer annular surface of the top cover 1;

[0070] A base 2 is matched with one end face of the top cover 1 provided with a first sample carrying groove 101, and fifteen second sample carrying grooves 201 are evenly distributed on the circumference of one end face of the base 2 and the top cover 1, and the second sample carrying grooves 201 extend to the outer annular surface of the base 2, and the fifteen first sample carrying grooves 101 and the fifteen second sample carrying grooves 201 have the same size and are arranged one by one opposite to each other, and the matched first sample carrying grooves 101 and second sample carrying grooves 201 of the top cover 1 and the base 2 form a receiving cavity;

[0071] Support plates 3, wherein fifteen support plates 3 are respectively located in the fifteen accommodating cavities;

[0072] Sample slides 4, one end of the fifteen sample slides 4 extends into the fifteen receiving cavities respectively, and the other end is located outside the top cover 1 and the base 2, and the sample slides 4 are located between the support sheet 3 and the top cover 1;

[0073] And fifteen springs 5 ​​are located in the fifteen accommodating cavities, and the springs 5 ​​are located between the supporting sheet 3 and the base 2. After the top cover 1 and the base 2 are fitted together, the springs 5 ​​are in a compressed state.

[0074] The multi-position sample stage further comprises a sample stage base 6, and the sample stage base 6 comprises:

[0075] An electric rotating table 601, on which the top cover 1 and the base 2 are integrally fixed, and the top cover 1 and the base 2 are integrally driven to rotate around their own axis by the electric rotating table 601; the model of the electric rotating table 601 is TBR100;

[0076] An electric Z-axis lifting platform 602 is arranged at the lower end of the electric rotating platform 601, and the electric Z-axis lifting platform 602 drives the electric rotating platform 601 to rise and fall along the Z-axis; the model of the electric Z-axis lifting platform 602 is CZF20-100;

[0077] An electric XY-axis translation table 603 is arranged at the lower end of the electric Z-axis lifting table 602, and the electric rotating table 601 and the electric Z-axis lifting table 602 are driven by the electric XY-axis translation table 603 to move in the X direction and the Y direction as a whole; the electric XY-axis translation table 603 is of model PA100;

[0078] A manual lifting platform 604 is arranged at the lower end of the electric XY axis translation platform 603, and the electric rotating platform 601, the electric Z axis lifting platform 602 and the electric XY axis translation platform 603 are lifted and lowered as a whole through the manual lifting platform 604. The model of the manual lifting platform 604 is MJ120.

[0079] The top cover 1 also includes:

[0080] A positioning groove 102 at the center of the circle of an end surface opposite to the base 2;

[0081] and four axial first fixing through holes 103 evenly distributed around the circumference;

[0082] The base 2 also includes:

[0083] A positioning protrusion 202 at the center of a circle on an end surface opposite to the top cover 1, wherein the positioning protrusion 202 fits in the positioning groove 102 of the top cover 1;

[0084] And four axial second fixing holes 203 evenly distributed around the circumference; the second fixing holes 203 correspond one to one with the first fixing holes 103, and bolts pass through the first fixing holes 103 and the second fixing holes 203 in sequence to fix the top cover 1 and the base 2 on the table top 601 of the sample table base 6.

[0085] The positioning groove 102 and the positioning protrusion 202 are polygonal structures.

[0086] The positioning groove 102 and the positioning protrusion 202 are quadrilateral structures or hexagonal structures.

[0087] The first fixing through hole 103 is a stepped hole.

[0088] The support sheet 3 includes a second spring positioning groove;

[0089] When the sample carrier 4 is located between the support sheet 3 and the top cover 1 and the spring 5 is located between the support sheet 3 and the base 2, the second spring positioning groove is arranged on an end surface of the support sheet 3 opposite to the base 2, and the end surface of the base 2 opposite to the support sheet 3 is provided with a first spring positioning groove 204;

[0090] When the sample carrier 4 is located between the supporting plate 3 and the base 2 and the spring 5 is located between the supporting plate 3 and the top cover 1, the second spring positioning groove is arranged on an end surface of the supporting plate 3 opposite to the top cover 1, and a third spring positioning groove is arranged on an end surface of the top cover 1 opposite to the supporting plate 3.

[0091] The sample carrier 4 is a general-purpose powder sample glass carrier.

[0092] The top cover 1, base 2 and support sheet 3 of the present invention are formed by 3D printing; in the sample stage base 6, the electric rotating table 601 is used to drive the rotation when the sample position is switched, the electric Z-axis lifting table 602 and the manual lifting table 604 are used to drive the lifting and lowering when the sample height position is adjusted, and the electric XY-axis displacement table 603 is used to adjust the multi-position sample stage to the center position of the goniometer optical path during the first installation; the spring 5 is made of metal wire and is placed between the circular groove of the base 2 and the circular groove of the support sheet 3. It is in a compressed state when the sample carrier 4 is inserted, and plays a role in fixing the sample carrier 4; a sample groove is provided on the sample carrier 4, which is a universal powder sample glass carrier; during testing, the sample carrier 4 is inserted between the support sheet 3 and the outer ring groove of the top cover 1.

[0093] When doing specific operations:

[0094] 1. First, install the support sheet 3 and the spring 5 into the second sample supporting groove 201 of the base 2 in sequence; then assemble the positioning groove 102 of the top cover 1 and the positioning protrusion 202 of the base 2, and then fix the two parts on the sample stage base 6 through the first fixing through hole 103 of the top cover 1 and the second fixing through hole 203 of the base 2 by screws;

[0095] 2. The sample to be tested is loaded into the sample slide 4, i.e., a universal powder glass slide, and then one end of the sample slide 4 is inserted between the top cover 1 and the support sheet 3;

[0096] 3. During the test, the sample to be tested is located between the X-ray light source and the detector; after the test of one sample is completed, the electric rotating table 601 of the sample table base 6 rotates a certain angle, and then the next sample to be tested is sent to the middle position between the X-ray light source and the detector.

Claims

1. A multi-position sample stage for an X-ray diffractometer, characterized in that: include: A top cover (1), the top cover (1) comprising at least a plurality of first sample carrying grooves (101) uniformly distributed on an end surface, the first sample carrying grooves (101) extending to an outer annular surface of the top cover (1); A base (2) is matched with one end face of the top cover (1) and provided with a first sample carrying groove (101); a plurality of second sample carrying grooves (201) are evenly distributed circumferentially on one end face of the base (2) and the top cover (1); the second sample carrying grooves (201) extend to the outer annular surface of the base (2); the plurality of first sample carrying grooves (101) and the plurality of second sample carrying grooves (201) are of the same size and are arranged one by one opposite to each other; the first sample carrying grooves (101) and the second sample carrying grooves (201) of the matched top cover (1) and the base (2) form a receiving cavity; A support sheet (3), wherein a plurality of the support sheets (3) are respectively located in the plurality of the accommodating cavities; A sample slide (4), wherein one end of each of the sample slides (4) extends into each of the plurality of accommodating cavities, and the other end is located outside the top cover (1) and the base (2), and the sample slide (4) is located between the support sheet (3) and the top cover (1); And a plurality of springs (5) located in the plurality of accommodating cavities, wherein the springs (5) are located between the support sheet (3) and the base (2), and when the top cover (1) and the base (2) are fitted together, the springs (5) are in a compressed state.

2. The multi-position sample stage for an X-ray diffractometer according to claim 1, characterized in that: The multi-position sample stage further comprises a sample stage base (6), wherein the sample stage base (6) comprises: An electric rotating platform (601), wherein the top cover (1) and the base (2) are integrally fixed on the electric rotating platform (601), and the top cover (1) and the base (2) are integrally driven to rotate around their own axes by the electric rotating platform (601); An electric Z-axis lifting platform (602) is arranged at the lower end of the electric rotating platform (601), and the electric Z-axis lifting platform (602) drives the electric rotating platform (601) to rise and fall along the Z axis; An electric XY-axis displacement table (603) is arranged at the lower end of the electric Z-axis lifting table (602), and the electric rotating table (601) and the electric Z-axis lifting table (602) are driven by the electric XY-axis displacement table (603) to move in the X direction and the Y direction as a whole; A manual lifting platform (604) is arranged at the lower end of the electric XY axis displacement platform (603), and the electric rotating platform (601), the electric Z axis lifting platform (602) and the electric XY axis displacement platform (603) are driven to rise and fall as a whole through the manual lifting platform (604).

3. The multi-position sample stage for an X-ray diffractometer according to claim 2, characterized in that: The top cover (1) further comprises: A positioning groove (102) at the center of a circle on an end surface opposite to the base (2); and a plurality of axial first fixing through holes (103) evenly distributed around the circumference; The base (2) also includes: A positioning protrusion (202) at the center of a circle on an end surface opposite to the top cover (1), wherein the positioning protrusion (202) fits in with the positioning groove (102) of the top cover (1); and a plurality of axial second fixing through holes (203) uniformly distributed around the circumference; the second fixing through holes (203) correspond one to one with the first fixing through holes (103), and bolts pass through the first fixing through holes (103) and the second fixing through holes (203) in sequence to fix the top cover (1) and the base (2) on the table surface (601) of the sample table base (6).

4. The multi-position sample stage for an X-ray diffractometer according to claim 3, characterized in that: The positioning groove (102) and the positioning protrusion (202) are polygonal structures.

5. The multi-position sample stage for an X-ray diffractometer according to claim 4, characterized in that: The positioning groove (102) and the positioning protrusion (202) are quadrilateral structures or hexagonal structures.

6. The multi-position sample stage for an X-ray diffractometer according to claim 3, characterized in that: The first fixing through hole (103) is a stepped hole.

7. A multi-position sample stage for an X-ray diffractometer according to any one of claims 1 to 6, characterized in that: A second spring positioning groove is provided on one end surface of the support sheet (3) opposite to the base (2); a first spring positioning groove (204) is provided on one end surface of the base (2) opposite to the support sheet (3); and two ends of the spring (5) are respectively located in the second spring positioning groove and the first spring positioning groove (204).

8. A multi-position sample stage for an X-ray diffractometer according to any one of claims 1 to 6, characterized in that: The sample carrier (4) is a universal powder sample glass carrier.