Secondary circuit on-off simulation test device

Abstract

The invention relates to a secondary circuit on-off simulation test device, and belongs to the technical field of secondary circuit detection. The device comprises a signal generation module, a signal acquisition module, a signal processing module, a test analysis module, an intelligent diagnosis module, a control module, a display module, a data storage module, a power supply module and the like. According to the invention, the accuracy, the safety and the high efficiency of the current secondary circuit on-off simulation test work can be solved, and the on-off state of the secondary circuit can be rapidly detected. Various states of the secondary circuit in actual operation are simulated, potential problems are found in advance, and the reliability of a power system is improved. The workload of manual testing is reduced, and the testing efficiency and accuracy are improved.

Description

Technical Field

[0001] The invention belongs to the technical field of secondary circuit detection, and in particular relates to a secondary circuit on-off simulation test device. Background Art

[0002] With the advancement of smart grid construction, smart substations have emerged in large numbers. Smart substations replace the hard cable connections of conventional substations with virtual secondary circuits based on networked digital communications. The sampled values ​​(SV) and general object-oriented substation events (GOOSE) of the station control layer, bay layer, and process layer are mainly transmitted through digital communication networks. This digital and virtualized feature makes the secondary circuit relationship complex and the number of circuits large, which puts higher requirements on the on-off test of the secondary circuit. More efficient and accurate testing technology is needed to verify the correctness of the circuit connection. With the continuous development of the power system, the scale and complexity of power facilities such as substations and power plants are increasing, and the number and complexity of secondary circuits are also increasing accordingly. This makes it difficult for traditional manual testing methods to meet the testing needs of large-scale and complex power systems, and there is an urgent need to develop automated and intelligent testing technologies.

[0003] In the past, visual methods were often used to determine the on / off status of some components in the secondary circuit, such as the on / off status of the pressure plate, based on the personal experience of the tester. This method not only has low accuracy in the detection results and is prone to misjudgment, but also makes it difficult to detect some hidden faults. For example, it is difficult to accurately determine whether the pressure plate is conductive after the screws are tightened by visual inspection, which may bring hidden dangers to the safe operation of the power system. Multimeters are commonly used detection tools in power work, but they have limitations in some specific secondary circuit tests. For example, when testing the on / off status of the pressure plate of the secondary circuit, due to the working environment and circuit characteristics of the pressure plate, the resistance range and buzzer principle of the multimeter may not meet the test requirements and cannot effectively detect the on / off status of the pressure plate. Relay protection devices are important protection devices in the power system, and their correct operation depends on the reliable operation of the secondary circuit. In order to ensure that the relay protection device can operate accurately and timely, it is necessary to conduct strict tests on the on / off status of the secondary circuit. For example, when a fault occurs in the power system, the relay protection device needs to obtain fault information through the secondary circuit and determine whether it needs to trip based on this information. If there is a fault such as a circuit breaker in the secondary circuit, the relay protection device may not operate correctly, thus affecting the safe operation of the power system.

[0004] With the continuous development of power technology, new relay protection devices continue to emerge, and these devices have put forward higher requirements on the signal quality and transmission speed of the secondary circuit. Therefore, more accurate secondary circuit on-off simulation test technology is needed to meet the testing needs of new relay protection devices. Once a power system fails, it may have a serious impact on people's production and life, and even endanger personal safety. Therefore, it is necessary to ensure the reliable operation of the secondary circuit, which requires a comprehensive and accurate test of the on-off condition of the secondary circuit to promptly discover and eliminate potential fault hazards. The reliability of power equipment is directly related to the stable operation of the power system. As an important part of power equipment, the on-off condition of the secondary circuit has an important impact on the reliability of the power equipment. Through the secondary circuit on-off simulation test, faults in the secondary circuit can be discovered in advance and the reliability of power equipment can be improved.

[0005] The methods that were often used in the past are as follows:

[0006] (1) Multimeter test method:

[0007] Working principle: The resistance range of the multimeter can provide a certain current. When the circuit connected at both ends of the test leads is turned on, the current can pass through, and the multimeter will display a lower resistance value or emit a buzzer prompt sound; conversely, when the circuit is disconnected, the current cannot pass through, and the resistance value displayed by the multimeter tends to infinity or no buzzer sound is emitted.

[0008] Operation method: For short-distance loop measurement, connect the red test lead of the multimeter to the beginning of the loop and the black test lead to the end of the loop. If the buzzer of the multimeter sounds, it means the loop is connected; if not, the loop may be disconnected. For long-distance loop measurement, first short-circuit one end of the loop to the ground and connect the other end to the ground through the buzzer of the multimeter. If the on-off position is connected, a buzzer will sound, indicating that the loop is connected and is the same cable core.

[0009] Disadvantages: If the two ends of the circuit carry voltages of different polarities, using the on-off position of the multimeter to short-circuit will cause the output of the protection device to trip; when there are many cables in the secondary circuit, the staff is prone to operating too fast, measuring inaccurately or neglecting things; and the electrical measurement position and on-off position of the commonly used multimeter need to be switched manually, which poses a risk of misoperation.

[0010] (2) Short-circuit method:

[0011] Working principle: Use a well-insulated wire to short-circuit certain points in the secondary circuit where a short-circuit fault is suspected. If the circuit resumes normal operation after short-circuiting, it means that there is a short-circuit problem between the two short-circuited points.

[0012] Operation method: divided into local short-circuit method and long-short-circuit method. The local short-circuit method is to press and hold the start button and other control components, and then use wires to short-circuit each contact or line segment in the circuit in turn. When short-circuiting to a certain point, the circuit resumes normal operation, indicating that the fault point is at this location; the long-short method is to short-circuit two or more contacts or line segments at a time to check the fault, which can make up for the defect that the local short-circuit method cannot detect the fault in some cases.

[0013] Disadvantages: When performing the short-circuit operation, it is necessary to confirm that the voltage is normal, and the load cannot be short-circuited directly, otherwise it may cause other problems such as a short circuit in the secondary circuit.

[0014] (3) Voltage measurement method:

[0015] Working principle: The on-off status of the circuit is determined by measuring the voltage at certain points in the secondary circuit. If no voltage is measured at a location where voltage should normally be present, or the voltage value is abnormal, there may be a circuit break problem in the circuit before that location; conversely, if voltage is measured at a location where voltage should not be present, there may be a short circuit or misconnection problem in the circuit.

[0016] Operation method: Use a voltmeter or an instrument with voltage measurement function, correctly connect its probe to the position where the voltage needs to be measured, read the voltage value and make an analysis. For example, when testing the continuity of the secondary circuit pressure plate, you can first measure the voltage at both ends of the pressure plate. If there is voltage, you need to further check whether the circuit is abnormal; if there is no voltage, you can perform a continuity test.

[0017] Disadvantages: For some complex secondary circuits, a deep understanding of circuit principles is required to correctly select measurement points, otherwise wrong conclusions may be drawn.

[0018] Therefore, how to overcome the shortcomings of the existing technology is an urgent problem to be solved in the field of secondary circuit detection technology. Summary of the invention

[0019] The purpose of the present invention is to solve the deficiencies of the prior art and provide a secondary circuit on-off simulation test device.

[0020] To achieve the above purpose, the technical solution adopted by the present invention is as follows:

[0021] Secondary circuit on-off simulation test device, including:

[0022] Signal generation module, used to simulate various signal sources in the secondary circuit;

[0023] A signal acquisition module, used to collect electrical signals in the secondary circuit;

[0024] A signal processing module is connected to the signal acquisition module and is used to process the signal acquisition module to filter out external interference signals;

[0025] The test analysis module is connected to the signal processing module and is used to perform test analysis based on the electrical signal in the secondary circuit obtained after processing by the signal processing module, so as to obtain the on-off state of the secondary circuit to be tested;

[0026] The intelligent diagnosis module is connected to the signal processing module and the test analysis module respectively, and is used to perform intelligent diagnosis according to the electrical signal in the secondary circuit obtained after processing by the signal processing module and the on-off state of the secondary circuit to be detected obtained by the test analysis module, so as to determine whether the secondary circuit to be detected is disconnected, has poor contact, or has damaged components;

[0027] The control module is connected to the signal acquisition module, the test analysis module, and the intelligent diagnosis module respectively, and is used to control the operation of the signal acquisition module, the test analysis module, and the intelligent diagnosis module;

[0028] The display module is connected to the test analysis module and the intelligent diagnosis module respectively, and is used to display the analysis results of the test analysis module and the diagnosis results of the intelligent diagnosis module;

[0029] The data storage module is connected to the signal acquisition module, the signal processing module and the test analysis module respectively, and is used to store the data collected by the signal acquisition module, the analysis results of the test analysis module, and the diagnosis results of the intelligent diagnosis module.

[0030] The power supply module is respectively connected to the signal acquisition module, signal processing module, test and analysis module, intelligent diagnosis module, control module, display module, and data storage module, and is used to supply power to the signal acquisition module, signal processing module, test and analysis module, intelligent diagnosis module, control module, display module, and data storage module.

[0031] Furthermore, preferably, the secondary circuit includes a relay protection circuit, a control circuit and a signal circuit.

[0032] Further, preferably, the signal acquisition module includes a non-contact acquisition unit.

[0033] Furthermore, preferably, the signal acquisition module realizes remote signal input by switching the external switch of the secondary circuit on-off simulation test device through the terminal card connection, and remotely controls the conduction between the output node and the common terminal, thereby realizing non-contact simulation input.

[0034] Furthermore, preferably, the control module is used to detect whether the secondary circuit on-off simulation test device is connected normally and whether the parameters are set correctly. If the settings are correct, the acquisition module, the test analysis module and the intelligent diagnosis module can be controlled to work.

[0035] Furthermore, preferably, the intelligent diagnosis module is also used to analyze and determine the possible fault types and locations in the secondary circuit, and to give corresponding early warning prompts through the display module.

[0036] Furthermore, preferably, it also includes a circuit protection module, which is respectively connected to the power supply module and the signal acquisition module, and is used for overvoltage protection, overcurrent protection, and short circuit protection; and is also used to automatically cut off the power supply module when overvoltage or overcurrent is detected in the secondary circuit.

[0037] Furthermore, preferably, the control module adopts a programmable logic controller.

[0038] Furthermore, preferably, in the test and analysis module, when the voltage signal is lower than 70V, it is considered to be in the secondary circuit open state; otherwise, it is considered to be in the open state.

[0039] The device of the present invention is mainly composed of a control module, a signal acquisition module, a power supply module, etc. The control module is responsible for the operation control of the entire device, including setting test parameters, starting the test, etc.

[0040] The present invention realizes the conduction of remote signal input (remote signal input: a port for inputting a positive power supply used for testing the on / off of remote signals) and remote control output nodes (remote control output: a port for outputting the correctness of the closing of remote control points) with a common terminal (the common terminal refers to the positive power port of the power supply in the remote signal and remote control loops) by toggling an external switch through terminal card connection, thereby realizing contactless simulation input. At the same time, the switch supports mobile phone communication docking, and can realize a 4G network or mobile phone Bluetooth startup test short circuit, thereby avoiding personal injury accidents caused by improper operation caused by personnel contact short circuit tests, thereby improving work efficiency and safety.

[0041] The control module of the present invention is used to detect whether the secondary circuit on-off simulation test device is connected normally and whether the parameters are set correctly, wherein the parameters refer to the closing time of the tester switch. If it is set correctly, the acquisition module, test analysis module and intelligent diagnosis module can be controlled to work.

[0042] The present invention can solve the accuracy, safety and efficiency of the current secondary circuit on-off simulation test, and can quickly detect the on-off state of the secondary circuit. It can simulate various states of the secondary circuit in actual operation, discover potential problems in advance, and improve the reliability of the power system. It can reduce the workload of manual testing and improve test efficiency and accuracy. It mainly includes the following aspects:

[0043] 1. Improve testing efficiency

[0044] Fast detection: Traditional testing methods may take a lot of time to check the on-off problems in the secondary circuit one by one. The test device of the present invention can quickly detect the entire circuit, greatly shortening the test time. For example, in the secondary circuit maintenance of a large substation, the fault point can be quickly determined, the equipment downtime can be reduced, and the availability of the power system can be improved.

[0045] Automated testing: It can realize automated testing process, reducing the tediousness and uncertainty of manual operation. The device can automatically perform continuity test according to the preset program, without manual frequent switching of test tools and judgment of test results, thus improving the consistency and accuracy of the test.

[0046] 2. Improve test accuracy

[0047] Accurate measurement: It can provide more accurate measurement results and accurately determine the on / off status of the secondary circuit. Compared with traditional methods such as visual inspection or simple multimeter testing, the test device can detect tiny current and voltage changes to avoid misjudgment. For example, for some circuits where the on / off status is not obvious, the device can accurately determine its on / off status through high-precision sensors and analysis algorithms.

[0048] Eliminate interference: In a complex electromagnetic environment, traditional test methods are easily interfered with, resulting in inaccurate test results. However, the test device of the present invention usually has anti-interference capabilities, which can effectively eliminate external interference factors and ensure the reliability of the test results. For example, in an environment close to high-voltage equipment or with a strong electromagnetic field, the test device of the present invention can work stably without being affected by external interference.

[0049] 3. Enhanced security

[0050] Non-contact testing: The present invention adopts non-contact testing to determine the continuity of the circuit by sensing changes in the magnetic field or electric field, without directly contacting the circuit, thus reducing the risk of electric shock.

[0051] Preventing misoperation: In traditional testing methods, testers may cause safety accidents due to improper operation. However, the test device usually has a clear operation process and safety protection mechanism to prevent misoperation. The test device of the present invention is equipped with a safety interlock function. The test can only be performed after the correct connection and parameter setting, avoiding equipment damage or personal injury caused by misoperation.

[0052] 4. Adapt to complex secondary circuit structure

[0053] Responding to the trend of digitalization and intelligence: With the development of digitalization and intelligence of power systems, the structure of secondary circuits has become more complex. Traditional testing methods are difficult to meet the testing requirements of new secondary circuits, while the test device of the present invention can adapt to different types of secondary circuits, including virtual secondary circuits in digital communication networks. For example, for the secondary circuit of an Ethernet-based smart substation, the test device of the present invention can be tested through the network communication protocol to accurately determine the on / off status of the circuit.

[0054] Satisfy various test scenarios: Different power equipment and application scenarios have different requirements for secondary circuit on-off testing. The test device of the present invention can be customized and adjusted according to specific test requirements to meet various complex test scenarios. For example, for substations, power plants and secondary circuits in industrial control systems of different voltage levels, the test device can provide corresponding test functions and parameter settings to ensure the comprehensiveness and effectiveness of the test.

[0055] Compared with the prior art, the present invention has the following beneficial effects:

[0056] 1. Improve test accuracy

[0057] 1. Accurately determine the on / off status

[0058] Traditional testing methods such as visual inspection and empirical judgment are prone to misjudgment, while the test device of the present invention uses advanced detection technology to accurately determine the on and off state of the secondary circuit. For example, through high-precision resistance measurement, current sensing or signal transmission monitoring, the two states of on and off can be clearly distinguished to avoid misjudgment caused by subjective factors.

[0059] For some minor on-off changes, such as poor contact, virtual connection, etc., the test device of the present invention can sensitively detect and give clear indications. For example, when there is a slightly large contact resistance in the secondary circuit but it is not completely disconnected, the device can accurately measure the change in resistance value and promptly discover this potential fault hidden danger.

[0060] 2. Reduce the impact of external interference

[0061] In the actual test environment, there may be various external interference factors, such as electromagnetic interference, noise, etc., which will affect the accuracy of the test results. The secondary circuit on-off simulation test device usually has an anti-interference design, which can effectively shield external interference and ensure the reliability of the test results.

[0062] For example, using shielded cables to connect test points and using filtering circuits to remove noise can improve the stability and accuracy of the test device in complex electromagnetic environments.

[0063] 2. Improve test efficiency

[0064] 1. Rapid testing

[0065] The test device can complete the on-off detection of the secondary circuit in a short time, which greatly saves the test time. Compared with the traditional manual test method, the automated test device can quickly test multiple test points in sequence without manually switching test tools and recording test results, which improves the speed and efficiency of the test.

[0066] For example, the testing device of the present invention can complete a comprehensive test of a secondary circuit within a few seconds, while the traditional method may take several minutes or even longer.

[0067] 2. Intelligent diagnosis

[0068] The test device of the present invention has an intelligent diagnosis function, and can automatically analyze and determine the possible fault type and location in the secondary circuit according to the detected signal. This not only reduces the time and workload of manual analysis, but also improves the accuracy and efficiency of fault diagnosis.

[0069] For example, when a secondary circuit is detected to be blocked, the device can analyze the signal characteristics to determine whether the fault is caused by line disconnection, poor contact, or component damage, and give corresponding fault prompt information to facilitate maintenance personnel to quickly locate and solve the problem.

[0070] 3. Enhance test security

[0071] 1. Avoid human error

[0072] Traditional testing methods require manual operation, which is prone to the risk of misoperation, such as misconnecting the test line, accidentally touching the live parts, etc., which may cause personal injury to the tester or damage the test equipment. The secondary circuit on-off simulation test device of the present invention usually adopts an automated operation mode, which reduces human intervention and reduces the possibility of misoperation.

[0073] For example, the device can be tested automatically through a preset test program, and the tester only needs to operate and monitor from a safe distance, avoiding direct contact with high-voltage parts and dangerous areas.

[0074] 2. Safety protection function

[0075] The test device of the present invention generally has a variety of safety protection functions, such as overvoltage protection, overcurrent protection, short circuit protection, etc., which can promptly detect and handle abnormal situations during the test process to protect the safety of test equipment and personnel.

[0076] For example, when the test device detects overvoltage or overcurrent in the secondary circuit, it will automatically cut off the test power supply to prevent damage to the test device and electric shock accidents.

[0077] 4. Adapt to complex testing environment

[0078] 1. Versatility

[0079] The secondary circuit on-off simulation test device of the present invention generally has multiple test functions and can adapt to different types of secondary circuits and test requirements. For example, multiple tests such as resistance measurement, voltage measurement, and current measurement can be performed simultaneously, and different types of signals (such as AC signals, DC signals, digital signals, etc.) can also be detected and analyzed.

[0080] In addition, the device of the present invention can also be customized according to actual needs to meet specific testing requirements, such as testing of high-voltage, high-current secondary circuits, testing of secondary circuits under special environments (such as high temperature, high humidity, strong magnetic fields, etc.), etc.

[0081] 2. Portability and flexibility

[0082] In order to meet the needs of on-site testing, the test device is usually designed to be portable and flexible. It can be easily carried to different test locations for testing without being restricted by the site.

[0083] The test device of the present invention adopts a handheld design, is small in size, light in weight, and simple and convenient to operate; some devices can also perform data transmission and remote control with a host computer via wireless communication, thereby improving the flexibility and convenience of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0084] Figure 1 This is a structural diagram of a secondary circuit on-off simulation test device; the direction of the arrow indicates the direction of data or signal;

[0085] Figure 2 This is a structural diagram of a secondary circuit on-off simulation test device; the direction of the arrow indicates the direction of data or signal;

[0086] Figure 3 This is the external main view of the secondary circuit on-off simulation test device in the application example;

[0087] Figure 4 This is the internal structure diagram of the secondary circuit on-off simulation test device in the application example. DETAILED DESCRIPTION

[0088] The present invention is further described in detail below in conjunction with embodiments.

[0089] Those skilled in the art will appreciate that the following examples are only used to illustrate the present invention and should not be considered to limit the scope of the present invention. If no specific techniques or conditions are specified in the examples, the techniques or conditions described in the literature in the art or the product specifications are used. If the manufacturer of the materials or equipment used is not specified, they are all conventional products that can be purchased.

[0090] Those skilled in the art will appreciate that, unless expressly stated, the singular forms "a", "an", "said" and "the" used herein may also include plural forms. It should be further understood that the term "comprising" used in the specification of the present invention refers to the presence of the features, integers, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or groups thereof. It should be understood that when we refer to an element as being "connected" to another element, it may be directly connected to the other element, or there may be intermediate elements. In addition, the "connection" used here may include wireless connections. The term "and / or" used here includes any unit and all combinations of one or more associated listed items.

[0091] In the description of the present invention, unless otherwise specified, "plurality" means two or more than two. The terms "inside", "upper", "lower", etc., indicating positions or state relationships, are based on the positions or state relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific position, be constructed and operate in a specific position, and therefore cannot be understood as limiting the present invention.

[0092] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "provided with" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in the present invention will be understood according to specific circumstances.

[0093] It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as those generally understood by those skilled in the art in the art to which the present invention belongs. It should also be understood that terms such as those defined in common dictionaries should be understood to have meanings consistent with the meanings in the context of the prior art, and will not be interpreted with idealized or overly formal meanings unless defined as herein.

[0094] Example 1

[0095] like Figure 1As shown, the secondary circuit on-off simulation test device includes:

[0096] A signal generating module 100 is used to simulate various signal sources in the secondary circuit;

[0097] A signal acquisition module 101 is used to collect electrical signals in the secondary circuit;

[0098] The signal processing module 102 is connected to the signal acquisition module 101 and is used to process the signal acquisition module 101 to filter out external interference signals;

[0099] The test analysis module 103 is connected to the signal processing module 102 and is used to perform test analysis based on the electrical signal in the secondary circuit obtained after processing by the signal processing module 102, so as to obtain the on-off state of the secondary circuit to be tested;

[0100] The intelligent diagnosis module 104 is connected to the signal processing module 102 and the test analysis module 103 respectively, and is used to perform intelligent diagnosis according to the electrical signal in the secondary circuit obtained after processing by the signal processing module 102 and the on-off state of the secondary circuit to be detected obtained by the test analysis module 103, so as to obtain whether the secondary circuit to be detected is disconnected, has poor contact, or has damaged components;

[0101] The control module 105 is connected to the signal acquisition module 101, the test analysis module 103, and the intelligent diagnosis module 104, respectively, and is used to control the operation of the signal acquisition module 101, the test analysis module 103, and the intelligent diagnosis module 104;

[0102] The display module 106 is connected to the test analysis module 103 and the intelligent diagnosis module 104, respectively, and is used to display the analysis result of the test analysis module 103 and the diagnosis result of the intelligent diagnosis module 104;

[0103] The data storage module 107 is connected to the signal acquisition module 101 , the signal processing module 102 , and the test analysis module 103 , respectively, and is used to store the data collected by the signal acquisition module 101 , the analysis results of the test analysis module 103 , and the diagnosis results of the intelligent diagnosis module 104 .

[0104] The power supply module 108 is respectively connected to the signal acquisition module 101, the signal processing module 102, the test and analysis module 103, the intelligent diagnosis module 104, the control module 105, the display module 106, and the data storage module 107, and is used to supply power to the signal acquisition module 101, the signal processing module 102, the test and analysis module 103, the intelligent diagnosis module 104, the control module 105, the display module 106, and the data storage module 107.

[0105] Example 2

[0106] like Figure 2 As shown, the secondary circuit on-off simulation test device includes:

[0107] A signal generating module 100 is used to simulate various signal sources in the secondary circuit;

[0108] A signal acquisition module 101 is used to collect electrical signals in the secondary circuit;

[0109] The signal processing module 102 is connected to the signal acquisition module 101 and is used to process the signal acquisition module 101 to filter out external interference signals;

[0110] The test analysis module 103 is connected to the signal processing module 102 and is used to perform test analysis based on the electrical signal in the secondary circuit obtained after processing by the signal processing module 102, so as to obtain the on-off state of the secondary circuit to be tested;

[0111] The intelligent diagnosis module 104 is connected to the signal processing module 102 and the test analysis module 103 respectively, and is used to perform intelligent diagnosis according to the electrical signal in the secondary circuit obtained after processing by the signal processing module 102 and the on-off state of the secondary circuit to be detected obtained by the test analysis module 103, so as to obtain whether the secondary circuit to be detected is disconnected, has poor contact, or has damaged components;

[0112] The control module 105 is connected to the signal acquisition module 101, the test analysis module 103, and the intelligent diagnosis module 104, respectively, and is used to control the operation of the signal acquisition module 101, the test analysis module 103, and the intelligent diagnosis module 104;

[0113] The display module 106 is connected to the test analysis module 103 and the intelligent diagnosis module 104, respectively, and is used to display the analysis result of the test analysis module 103 and the diagnosis result of the intelligent diagnosis module 104;

[0114] The data storage module 107 is connected to the signal acquisition module 101 , the signal processing module 102 , and the test analysis module 103 , respectively, and is used to store the data collected by the signal acquisition module 101 , the analysis results of the test analysis module 103 , and the diagnosis results of the intelligent diagnosis module 104 .

[0115] The power supply module 108 is respectively connected to the signal acquisition module 101, the signal processing module 102, the test and analysis module 103, the intelligent diagnosis module 104, the control module 105, the display module 106, and the data storage module 107, and is used to supply power to the signal acquisition module 101, the signal processing module 102, the test and analysis module 103, the intelligent diagnosis module 104, the control module 105, the display module 106, and the data storage module 107.

[0116] The secondary circuit includes a relay protection circuit, a control circuit and a signal circuit.

[0117] The signal acquisition module 101 includes a non-contact acquisition unit.

[0118] The signal acquisition module 101 is connected through the terminal card, and the external switch of the secondary circuit on-off simulation test device is turned to realize the remote signal input, and the conduction between the remote output node and the common terminal is remotely controlled, thereby realizing non-contact simulation input.

[0119] The control module 105 is used to detect whether the secondary circuit on-off simulation test device is connected normally and whether the parameters are set correctly. If the settings are correct, the acquisition module 101, the test analysis module 103, and the intelligent diagnosis module 104 can be controlled to work.

[0120] The intelligent diagnosis module 104 is also used to analyze and determine the possible fault type and location in the secondary circuit, and give corresponding early warning prompts through the display module 106.

[0121] It also includes a circuit protection module 109, which is respectively connected to the power supply module 108 and the signal acquisition module 101 for overvoltage protection, overcurrent protection, and short circuit protection; it is also used to automatically cut off the power supply module 108 when overvoltage or overcurrent is detected in the secondary circuit.

[0122] The control module 105 adopts a programmable logic controller.

[0123] In the test analysis module 103, when the voltage signal is lower than 70V, it is considered to be in the secondary circuit open state; otherwise, it is considered to be in the open state.

[0124] The present invention is applicable to different types of secondary circuits, including but not limited to relay protection circuits, control circuits, signal circuits, etc. The device should have high reliability and stability and be able to work normally in complex electromagnetic environments.

[0125] The present invention has multiple test modes, such as manual test, automatic test, continuous test, etc., to meet different test requirements.

[0126] The present invention has data storage and analysis functions and can record test data for subsequent analysis and troubleshooting.

[0127] Considering the convenience of on-site use, the device of the present invention should be small in size, light in weight, and easy to carry.

[0128] The signal acquisition module is responsible for collecting the electrical signals in the secondary circuit. A high-precision analog-to-digital converter (ADC) can be used to digitize the signals to improve the accuracy and reliability of the test.

[0129] The signal acquisition module and signal processing module have strong anti-interference capabilities and can effectively filter out external interference signals to ensure that the collected signals are true and reliable.

[0130] The control module is responsible for controlling the operation of the entire device, including the selection of test modes and the setting of test parameters. It can be implemented using a microcontroller (MCU) or a programmable logic controller (PLC).

[0131] The display module is used to display the test results and related information. It can use a liquid crystal display (LCD) or a light-emitting diode (LED) indicator. The displayed content should be concise and clear for operators to read.

[0132] The power module provides a stable power supply for the device of the present invention. A rechargeable battery or an external power adapter can be used to ensure that the device can operate normally in different working environments. The power module should have functions such as overcharge, over discharge, and short circuit protection to improve the safety of the device.

[0133] The present invention adopts a test algorithm based on a combination of multiple methods such as resistance measurement, voltage measurement, current measurement, etc., which can quickly and accurately determine the on-off state of the secondary circuit and improve the accuracy and reliability of the test.

[0134] For complex secondary circuits, algorithms such as the stepwise approximation method and the binary search method are used for testing to improve test efficiency.

[0135] Preferably, the present invention designs a friendly human-machine interface to facilitate the operator to operate and set. A graphical user interface (GUI) can be used to operate by means of a touch screen or buttons. The human-machine interface should provide clear operation prompts and error messages to help the operator use the device correctly.

[0136] The present invention can save the test data to an internal memory or an external storage device for subsequent analysis and troubleshooting.

[0137] The test device of the present invention can analyze and process the stored test data and generate a test report and a fault diagnosis result.

[0138] Application Examples

[0139] 1. Device structure (such as Figure 3 and Figure 4 (shown)

[0140] 1. Control module: PLC is used as the core control unit, responsible for the operation control and data processing of the entire device.

[0141] 2.Signal generation module:

[0142] Capable of generating specific electrical signals to simulate various signal sources in the secondary circuit.

[0143] Signals with different frequencies, amplitudes and waveforms can be generated to meet the testing requirements of different types of secondary circuits.

[0144] 3. Power module:

[0145] Provide stable power supply for the entire device, including DC power and AC power.

[0146] It has overvoltage and overcurrent protection functions to ensure the safe operation of the device.

[0147] 2. Testing Process

[0148] 1. Connection device:

[0149] Connect the signal output port and signal input port of the test device to the corresponding nodes of the secondary circuit respectively.

[0150] Ensure that the connection is firm and reliable to avoid poor contact affecting the test results.

[0151] 2. Start the test:

[0152] Press the start button, and the control module starts the signal generating module to generate a test signal.

[0153] The signal enters the secondary loop through the switching module, and the signal detection module starts to detect the signal in the loop.

[0154] 3. End the test:

[0155] After the test is completed, press the stop button to stop signal generation and detection.

[0156] Disconnect the test device from the secondary circuit and organize the test equipment.

[0157] 3. Application Scenarios

[0158] 1. Substation secondary circuit test:

[0159] Conduct on / off tests on secondary circuits such as relay protection devices, measurement and control devices, and metering devices in substations.

[0160] It can detect the connection correctness of the secondary circuit, signal transmission quality, etc. to ensure the safe operation of the substation.

[0161] 2. Power plant secondary circuit test:

[0162] Used for testing secondary circuits such as electrical control systems and automation systems in power plants.

[0163] It can detect the secondary circuits of generators, transformers, circuit breakers and other equipment to ensure stable power generation in power plants.

[0164] 3.Industrial automation system testing:

[0165] It is suitable for testing secondary circuits such as various control systems and instrument systems in the field of industrial automation.

[0166] It can detect signal transmission between sensors, actuators, controllers and other devices to ensure the normal operation of industrial automation systems.

[0167] The above shows and describes the basic principles, main features and advantages of the present invention. It should be understood by those skilled in the art that the present invention is not limited to the above embodiments, and the above embodiments and descriptions are only for explaining the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention to be protected. The scope of protection of the present invention is defined by the attached claims and their equivalents.

Claims

1. Secondary circuit on-off simulation test device, characterized in that: include: A signal generating module (100) is used to simulate various signal sources in the secondary circuit; A signal acquisition module (101), used for acquiring electrical signals in the secondary circuit; A signal processing module (102) is connected to the signal acquisition module (101) and is used to process the signal acquisition module (101) to filter out external interference signals; A test analysis module (103) is connected to the signal processing module (102) and is used to perform test analysis based on the electrical signal in the secondary circuit obtained after processing by the signal processing module (102), thereby obtaining the on / off state of the secondary circuit to be tested; The intelligent diagnosis module (104) is connected to the signal processing module (102) and the test analysis module (103) respectively, and is used to perform intelligent diagnosis based on the electrical signal in the secondary circuit obtained after processing by the signal processing module (102) and the on / off state of the secondary circuit to be detected obtained by the test analysis module (103), so as to determine whether the secondary circuit to be detected is disconnected, has poor contact, or has a damaged component; A control module (105) connected to the signal acquisition module (101), the test analysis module (103), and the intelligent diagnosis module (104), respectively, and used to control the operation of the signal acquisition module (101), the test analysis module (103), and the intelligent diagnosis module (104); A display module (106) connected to the test analysis module (103) and the intelligent diagnosis module (104) respectively, and used to display the analysis result of the test analysis module (103) and the diagnosis result of the intelligent diagnosis module (104); a data storage module (107), connected to the signal acquisition module (101), the signal processing module (102), and the test analysis module (103), respectively, and used to store data collected by the signal acquisition module (101), analysis results of the test analysis module (103), and diagnosis results of the intelligent diagnosis module (104); The power supply module (108) is respectively connected to the signal acquisition module (101), the signal processing module (102), the test analysis module (103), the intelligent diagnosis module (104), the control module (105), the display module (106), and the data storage module (107), and is used to supply power to the signal acquisition module (101), the signal processing module (102), the test analysis module (103), the intelligent diagnosis module (104), the control module (105), the display module (106), and the data storage module (107).

2. The secondary circuit on-off simulation test device according to claim 1, characterized in that: The secondary circuit includes a relay protection circuit, a control circuit and a signal circuit.

3. The secondary circuit on-off simulation test device according to claim 1, characterized in that: The signal acquisition module (101) comprises a non-contact acquisition unit.

4. The secondary circuit on-off simulation test device according to claim 1, characterized in that: The signal acquisition module (101) is connected via a terminal clamp, and an external switch of the secondary circuit on-off simulation test device is turned to realize remote signal input, and remote control output node and the common terminal are connected, thereby realizing non-contact simulation input.

5. The secondary circuit on-off simulation test device according to claim 1, characterized in that: The control module (105) is used to detect whether the secondary circuit on-off simulation test device is connected normally and whether the parameters are set correctly. If the settings are correct, the acquisition module (101), the test analysis module (103) and the intelligent diagnosis module (104) can be controlled to work.

6. The secondary circuit on-off simulation test device according to claim 1, characterized in that: The intelligent diagnosis module (104) is also used to analyze and determine the type and location of possible faults in the secondary circuit, and to provide corresponding early warning prompts through the display module (106).

7. The secondary circuit on-off simulation test device according to claim 1, characterized in that: It also includes a circuit protection module (109), which is connected to the power module (108) and the signal acquisition module (101) respectively, and is used for overvoltage protection, overcurrent protection, and short circuit protection; and is also used for automatically cutting off the power module (108) when an overvoltage or overcurrent condition is detected in the secondary circuit.

8. The secondary circuit on-off simulation test device according to claim 1, characterized in that: The control module (105) adopts a programmable logic controller.

9. The secondary circuit on-off simulation test device according to claim 1, characterized in that: In the test analysis module (103), when the voltage signal is lower than 70V, it is considered to be in the secondary circuit open state; otherwise, it is considered to be in the open state.

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