Detection system and copper foil preparation equipment

Abstract

The invention relates to the field of copper foil, and particularly discloses a detection system and copper foil preparation equipment, and the detection system comprises an image generation device, an image processing device and control equipment; the image generation device is arranged above the cathode roller, and the image generation device is used for generating a first image signal of the cathode roller; the image processing device is used for processing the first image signal to form a second image signal and transmitting the processed second image signal to the control equipment; the control equipment analyzes and processes the obtained second image signal to obtain a first parameter value; the detection system further comprises a polishing device, the polishing device is controlled to polish the surface of the cathode roller, and the first parameter value is controlled within the preset parameter value range. According to the method, the surface roughness of the cathode roller is rapidly detected and adjusted, so that the quality of the cathode roller is improved.

Description

Technical Field

[0001] The present application relates to the field of copper foil, and in particular to a detection system and copper foil preparation equipment. Background Art

[0002] In the production process of electrolytic copper foil, cathode roller online polishing plays a vital role. The polishing brush level, cleanliness of the polishing brush and setting of polishing parameters are closely related to the physical properties and quality abnormalities (such as penetration, pinholes, etc.) of the copper foil.

[0003] At present, the cathode roller online polishing mainly adjusts the polishing parameters according to the Ra (surface roughness) of the lower roll and the degree of oxidation of the cathode roller by manual judgment. It is necessary to constantly adjust the polishing parameters and then repeat sampling and confirmation. This is relatively cumbersome and wastes a lot of time.

[0004] Therefore, how to quickly detect and adjust the surface roughness of the cathode roller to improve the quality of the cathode roller has become an urgent problem to be solved in this field. Summary of the invention

[0005] The present application discloses a detection system and a copper foil preparation device, the purpose of which is to quickly detect and adjust the surface roughness of a cathode roller to improve the quality of the cathode roller.

[0006] An embodiment of the present application discloses a detection system for detecting a cathode roller; the detection system includes an image generating device, an image processing device and a control device; the image generating device is arranged above the cathode roller, and the image generating device is used to generate a first image signal of the cathode roller; the image processing device is used to process the first image signal to form a second image signal, and transmit the processed second image signal to the control device; the control device analyzes the acquired second image signal, and processes it to obtain a first parameter value; the detection system also includes a polishing device, the control device is connected to the polishing device, and controls the polishing device to polish the surface of the cathode roller, and control the first parameter value within the preset parameter value range.

[0007] Optionally, the detection system also includes a first sensor; the image processing device amplifies the first image signal to form the second image signal, and then transmits the second image signal to the first sensor; the first sensor transmits the acquired second image signal to the control device, and the control device analyzes and processes the second image signal to calculate the first parameter value.

[0008] Optionally, the control device converts the received second image signal into a three-dimensional image, and automatically measures the average value of the absolute value of the distance from each point on the contour of the three-dimensional image to the contour midline to obtain the first parameter value.

[0009] Optionally, when the cathode roller needs to be polished, the control device controls the polishing device to turn on; the polishing device automatically adjusts the polishing pressure and polishing time according to the first parameter value feedback from the control device; when the first parameter value of the cathode roller reaches within the set parameter value range, the polishing device stops polishing the cathode roller.

[0010] Optionally, when the first parameter value of the cathode roller is greater than the preset parameter value range, the control device controls the polishing device to stop polishing the surface of the cathode roller.

[0011] Optionally, the detection system also includes a monitor and an alarm device, wherein the monitor is connected to the alarm device, and the monitor is used to monitor the polishing state of the cathode roller. When the monitor detects that the polishing state of the cathode roller reaches a first state, the monitor transmits a detection signal to the alarm device.

[0012] Optionally, when the first parameter value is within the preset parameter value range, the control between the control device and the polishing device is disconnected, and only the monitor works; the first sensor transmits the second image signal to the monitor; the monitor compares and analyzes the second image signal transmitted by the first sensor with the image signal monitored by the monitor in real time to determine whether the polishing state of the cathode roller has reached the first state, and feeds back the comparison signal to the alarm device.

[0013] Optionally, after the polishing of the cathode roller is completed, the control device automatically records various parameter values ​​of the current polishing and keeps them in the control device.

[0014] Optionally, the control device calculates the first parameter value in real time according to the second image signal transmitted by the first sensor, and automatically saves the first parameter value calculated in real time in the control device.

[0015] The embodiment of the present application also discloses a copper foil preparation device, including a machine platform. The copper foil preparation device also includes the above-mentioned detection system, which is used to detect the cathode roller on the machine platform and control the polishing of the surface of the cathode roller.

[0016] The present application monitors and polishes the surface of the cathode roller in real time through a detection system, generates a first image signal of the cathode roller in real time using an image generating device, and then transmits the generated first image signal to an image processing device; when the image processing device obtains the first image signal, it processes the first image signal to form a second image signal that is convenient for the control device to analyze and process, and transmits the second image signal to the control device, the control device analyzes and processes the obtained second image signal to obtain the first parameter value of the cathode roller, and controls the polishing device according to the first parameter value of the cathode roller, so that the polishing device automatically adjusts the polishing pressure and polishing time during polishing to polish the surface of the cathode roller according to the first parameter value of the cathode roller fed back by the control device, so that the first parameter value of the cathode roller surface is kept within the preset parameter value range, ensuring that the first parameter value of the cathode roller surface meets the production standard, so that the surface of the cathode roller is quickly detected and adjusted, thereby improving the quality of the cathode roller. That is, the present application can better control the first parameter value of the cathode roller by analyzing and obtaining the first parameter value of the cathode roller surface in real time, and interlocking control with the polishing device, and can polish the cathode roller to the best state, reducing subsequent quality abnormalities caused by the cathode roller. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The included drawings are used to provide a further understanding of the embodiments of the present application, which constitute a part of the specification, are used to illustrate the implementation methods of the present application, and together with the text description, explain the principles of the present application. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:

[0018] Figure 1 This is a structural block diagram of the first embodiment of the detection system of the present application;

[0019] Figure 2 A schematic diagram of a first embodiment of the detection system of the present application;

[0020] Figure 3 This is a structural block diagram of a second embodiment of the detection system of the present application;

[0021] Figure 4 It is a schematic diagram of an embodiment of a copper foil preparation device of the present application.

[0022] Among them, 10, copper foil preparation equipment; 100, detection system; 200, machine; 300, cathode roller; 110, image generating device; 120, image processing device; 130, control device; 140, polishing device; 150, first sensor; 160, monitor; 170, alarm device. DETAILED DESCRIPTION

[0023] The present application is described in detail below with reference to the accompanying drawings and optional embodiments. It should be noted that, under the premise of no conflict, the embodiments or technical features described below can be arbitrarily combined to form new embodiments.

[0024] Figure 1 is a schematic block diagram of a first embodiment of the detection system of the present application, Figure 2 Schematic diagram of the first embodiment of the detection system of the present application, as shown in Figure 1 and Figure 2 As shown, the embodiment of the present application discloses a detection system 100 for detecting a cathode roller 300; the detection system 100 includes an image generating device 110, an image processing device 120 and a control device 130; the image generating device 110 is arranged above the cathode roller 300, and the image generating device 110 is used to generate a first image signal of the cathode roller 300; the image processing device 120 is used to process the first image signal to form a second image signal, and transmit the processed second image signal to the control device 130; the control device 130 analyzes the acquired second image signal, and processes it to obtain a first parameter value; the detection system 100 also includes a polishing device 140, the control device 130 is connected to the polishing device 140, and controls the polishing device 140 to polish the surface of the cathode roller 300, and control the first parameter value within a preset parameter value range.

[0025] The present application uses the detection system 100 to monitor and polish the surface of the cathode roller 300 in real time, uses the image generating device 110 to generate a first image signal of the cathode roller 300 in real time, and then transmits the generated first image signal to the image processing device 120; when the image processing device 120 obtains the first image signal, it processes the first image signal to form a second image signal that is convenient for the control device 130 to analyze and process, and transmits the second image signal to the control device 130, and the control device 130 analyzes and processes the obtained second image signal to obtain the first parameter value of the cathode roller 300, and controls the polishing device 140 according to the first parameter value of the cathode roller 300, so that the polishing device 140 automatically adjusts the polishing pressure and polishing time during polishing to polish the surface of the cathode roller 300 according to the first parameter value of the cathode roller 300 fed back by the control device 130, so that the first parameter value of the surface of the cathode roller 300 is maintained within the preset parameter value range, ensuring that the first parameter value of the surface of the cathode roller 300 meets the production standard, thereby realizing rapid detection and adjustment of the surface of the cathode roller 300, thereby improving the quality of the cathode roller 300. That is, the present application can better control the first parameter value of the cathode roller 300 by performing real-time analysis on the first parameter value of the surface of the cathode roller 300 and interlocking control with the polishing device 140, and can polish the cathode roller 300 to the optimal state, thereby reducing subsequent quality abnormalities caused by the cathode roller 300.

[0026] It should be noted that the first parameter value in the present application is the surface roughness value of the cathode roller 300 , and the preset parameter value range may be a standard surface roughness value range set according to actual production conditions.

[0027] The image generating device 110 in the present application may be a laser probe, the image processing device 120 may be a microscope, and the control device 130 may be a computer; a row of laser probes is installed above the cathode roller 300, and the first image signal of the cathode roller 300 is detected and generated by the laser probe, and the first image signal formed by irradiating the cathode roller 300 with the laser probe may be a microscopic morphology picture of the surface of the cathode roller 300; then the first image signal is amplified into a second image signal by the microscope, and the second image signal is transmitted to the computer, and the computer obtains the first parameter value after processing and analysis, and the computer sets a corresponding program to form a chain control with the polishing device 140. When the computer feeds back the first parameter value to the polishing device 140, the polishing device 140 automatically adjusts the polishing pressure and polishing time during polishing to polish the surface of the cathode roller 300, so that the first parameter value of the surface of the cathode roller 300 is kept within the preset parameter value range. The specific working process is as follows:

[0028] When the cathode roller 300 needs to be polished online, the preset polishing program in the computer can be clicked to enter the polishing interface. At this time, the interlocking control between the computer and the polishing device 140 is turned on; wherein, the polishing program may include parameter settings, start / end polishing buttons, emergency buttons, etc., and these parameter settings can be reasonably set according to the actual processing conditions.

[0029] Then set the initial polishing parameters (polishing pressure and time are not set for the time being) and set the required surface roughness value range; after the parameter setting is completed, click the start polishing button on the computer, the polishing brush of the polishing device 140 swings on, and then slowly starts to approach the cathode roller 300.

[0030] When the polishing brush is at a preset distance from the cathode roller 300, for example, when the polishing brush of the polishing device 140 is 1 mm away from the cathode roller 300, the polishing spray starts automatically and then slowly moves toward the cathode roller 300; as the polishing brush moves forward, the polishing pressure begins to gradually increase.

[0031] At this time, the laser probe above the cathode roller 300 detects the cathode roller 300 in real time. The laser probe can detect and obtain relatively subtle image conditions on the surface of the cathode roller 300, generate a first image signal of the cathode roller 300, and then transmit the generated first image signal to the microscope.

[0032] When the microscope acquires the first image signal, it will amplify the first image signal to form a second image signal that is easy for the computer to analyze and process, and transmit the second image signal to the computer. The computer will analyze and process the acquired second image signal to obtain the surface roughness value of the cathode roller 300, and control the polishing device 140 according to the surface roughness value of the cathode roller 300, so that the polishing device 140 automatically adjusts the polishing pressure and polishing time during polishing to polish the surface of the cathode roller 300 according to the surface roughness value of the cathode roller 300 fed back by the control device 130, so that the surface roughness value of the surface of the cathode roller 300 is maintained within the preset parameter value range, thereby ensuring that the surface roughness value of the surface of the cathode roller 300 meets the production standards.

[0033] When the surface roughness value of the cathode roller 300 reaches the set range, the polishing brush of the polishing device 140 automatically stops polishing (polishing spray and polishing brush swing automatically stop), and then slowly moves backward. When it moves to the original position, the polishing is finished.

[0034] In this way, the surface of the cathode roller 300 is quickly detected and adjusted, thereby improving the quality of the cathode roller 300. That is, the present application can better control the first parameter value of the cathode roller 300 by analyzing and acquiring the first parameter value of the surface of the cathode roller 300 in real time, and interlocking control with the polishing device 140, and can polish the cathode roller 300 to the best state, thereby reducing subsequent quality abnormalities caused by the cathode roller 300.

[0035] Furthermore, in order to ensure that the image processing device 120 can transmit the second image signal to the control device 130 in real time and stably for analysis and processing, the present application also makes improvements between the image processing device 120 and the control device 130, as follows:

[0036] The detection system 100 also includes a first sensor 150; the image processing device 120 amplifies the first image signal to form a second image signal, and then transmits the second image signal to the first sensor 150; the first sensor 150 transmits the acquired second image signal to the control device 130, and the control device 130 analyzes and processes the second image signal to calculate the first parameter value.

[0037] The first sensor 150 may be a CCD (Charge-Coupled Device) sensor, thereby improving the stability of acquiring image signals.

[0038] In actual work, when the first image signal of the surface of the cathode roller 300 irradiated by the laser probe is transmitted to the microscope, the microscope amplifies the first image signal to form a second image signal, and then transmits the amplified second image signal to the CCD sensor, and the CCD sensor transmits the amplified second image signal to the computer for analysis and processing, thereby calculating the real-time surface roughness value of the cathode roller 300. Through the setting of the first sensor 150, the accuracy of the real-time calculation of the surface roughness value of the cathode roller 300 can be effectively improved, so that the computer can more accurately control the polishing device 140 to polish the surface of the cathode roller 300 to ensure that the surface of the cathode roller 300 meets the production standards.

[0039] Furthermore, after the first sensor 150 transmits the amplified second image signal to the control device 130, the control device 130 needs to analyze and process the second image signal. In order to ensure that the control device 130 can obtain an accurate surface roughness value, the present application also optimizes the method for calculating the surface roughness value of the control device 130, as follows:

[0040] The control device 130 converts the received second image signal into a three-dimensional image, and automatically measures the average value of the absolute value of the distance from each point on the contour of the three-dimensional image to the contour center line to obtain the first parameter value.

[0041] Since the first parameter value of the present application is the surface roughness value of the cathode roller 300 , the surface roughness value can be understood as the arithmetic mean deviation of the microscopic topography profile of the cathode roller 300 .

[0042] The first image signal obtained by the laser probe irradiation can be a microscopic topography of the cathode roller 300. After the first image signal is transmitted to the microscope to amplify the second image signal, the second image signal is transmitted to the computer through the first sensor 150. The computer converts the received second image signal, that is, the microscopic topography of the cathode roller 300 after amplification, into a 3D image, and then automatically measures the average value of the absolute value of the distance from each point on the contour to the center line of the contour, thereby calculating the surface roughness value of the cathode roller 300. By optimizing the way in which the computer calculates the surface roughness value, the accuracy of obtaining the surface roughness value can be improved, so that the polishing device 140 can polish the surface of the cathode roller 300 more accurately according to the surface roughness value, so that the surface roughness value of the surface of the cathode roller 300 is kept within the preset parameter value range, ensuring that the surface roughness value of the surface of the cathode roller 300 meets the production standard.

[0043] Furthermore, since the purpose of the polishing device 140 to polish the surface of the cathode roller 300 is to control the surface roughness value of the cathode roller 300 within a preset parameter value range, if the polishing device 140 is turned on for a long time after completing the polishing work, it will directly increase the energy consumption of the equipment and increase the processing cost.

[0044] Based on the above problems, the present application improves the start and stop control of the polishing device 140 by the control device 130, and the specific improvements are as follows:

[0045] When the cathode roller 300 needs to be polished, the control device 130 controls the polishing device 140 to turn on; the polishing device 140 automatically adjusts the polishing pressure and polishing time according to the first parameter value fed back by the control device 130; when the first parameter value of the cathode roller 300 reaches within the set parameter value range, the polishing device 140 stops polishing the cathode roller 300.

[0046] In the present application, the computer controls the polishing device 140 to start only when the cathode roller 300 needs to be surface polished, and the polishing device 140 automatically adjusts the polishing pressure and polishing time according to the surface roughness value fed back by the computer, thereby polishing the cathode roller 300.

[0047] After the cathode roller 300 is polished, when the surface roughness value calculated by the computer in real time reaches a preset parameter range, the computer will control the polishing device 140 to stop polishing the cathode roller 300, thereby saving energy and reducing production costs.

[0048] In addition, when the first parameter value of the cathode roller 300 is greater than the preset parameter value range, the control device 130 controls the polishing device 140 to stop polishing the surface of the cathode roller 300 .

[0049] In the present application, since the first parameter value is calculated in real time during the polishing process, when the first parameter value of the cathode roller 300 is greater than the preset parameter value range during the polishing process, it indicates that an abnormality has occurred in the polishing. At this time, the computer controls the polishing device 140 to stop polishing the surface of the cathode roller 300, which is beneficial for the operator to judge the abnormal problem and correct it, thereby effectively improving production efficiency and product qualification rate.

[0050] Further, when the polishing of the cathode roller 300 is completed, the control device 130 automatically records various parameter values ​​of the current polishing and stores them in the control device 130. When the polishing is completed, the computer automatically records various parameter values ​​of this polishing and stores them in the computer, which is convenient for query at any time, effectively improving the reference and large-scale operation in the production preparation process and improving production efficiency.

[0051] In addition, in the present application, the control device 130 can calculate the first parameter value in real time according to the second image signal transmitted by the first sensor 150, and automatically save the first parameter value calculated in real time in the control device 130. In this way, the parameters of the computer-controlled polishing device 140 can be checked at any time, and the parameters can be adjusted to achieve rapid polishing of the cathode roller 300 by the polishing device 140, which helps to improve production efficiency.

[0052] Figure 3 is a schematic block diagram of a second embodiment of the detection system of the present application, Figure 3 The illustrated embodiment is based on Figure 1 Improvements such as Figure 3 As shown, the detection system 100 also includes a monitor 160 and an alarm device. The monitor 160 is connected to the alarm device. The monitor 160 is used to monitor the polishing state of the cathode roller 300. When the monitor 160 detects that the polishing state of the cathode roller 300 reaches a first state, the monitor 160 transmits a detection signal to the alarm device.

[0053] This embodiment is different from the previous embodiment in that a monitor 160 and an alarm device 170 are additionally provided in the detection system 100. The monitor 160 is used to monitor and acquire the surface image signal of the cathode roller 300 in real time, and the polishing state of the cathode roller 300 is judged according to the acquired surface image signal of the cathode roller 300, wherein the first state reached by the polishing state of the cathode roller 300 is a state in which the real-time surface image signal of the cathode roller 300 exceeds the preset surface image signal, which can be understood as a state in which the real-time surface roughness value of the cathode roller 300 is greater than the preset parameter value range.

[0054] In actual work, when the first image signal of the surface of the cathode roller 300 irradiated by the laser probe is transmitted to the microscope, the microscope amplifies the first image signal to form a second image signal, and then transmits the amplified second image signal to the CCD sensor. The CCD sensor transmits the amplified second image signal to the computer for analysis and processing, thereby calculating the real-time surface roughness value of the cathode roller 300; on the other hand, the amplified second image signal is transmitted to the monitor 160.

[0055] The monitor 160 compares and analyzes the acquired second image signal with the image signal of the cathode roller 300 monitored in real time, so as to determine the polishing state of the cathode roller 300 .

[0056] When it is detected that the polishing state of the cathode roller 300 reaches the first state, the monitor 160 displays the type and location of the abnormal problem, and transmits the detection signal to the alarm device 170. The alarm device 170 makes a sound, and the emergency program in the polishing program is started, thereby facilitating the operator to correct the problem.

[0057] Furthermore, when the first parameter value is within the preset parameter value range, the control between the control device 130 and the polishing device 140 is disconnected, and only the monitor 160 works; the first sensor 150 transmits the second image signal to the monitor 160; the monitor 160 compares and analyzes the second image signal transmitted by the first sensor 150 with the image signal monitored by the monitor 160 in real time to determine whether the polishing state of the cathode roller 300 has reached the first state, and feeds back the comparison signal to the alarm device 170.

[0058] In the present application, when the cathode roller 300 is in normal production, the computer disconnects the interlocking control with the polishing brush, and the monitor 160 mainly works. The monitor 160 compares and analyzes the microscopic morphology images of the cathode roller 300 transmitted by the CCD sensor in real time, thereby saving energy consumption and reducing costs.

[0059] When an abnormal situation occurs during the polishing process, the monitor 160 transmits the detection signal to the alarm device 170, the alarm device 170 makes a sound, and displays the abnormal type and abnormal location, automatically starting the emergency procedure. The emergency button can also be manually clicked, and then the polishing brush of the polishing device 140 slowly moves backwards, making it convenient for the operator to deal with it in time.

[0060] Figure 4 This is a schematic diagram of an embodiment of the copper foil preparation equipment of the present application, such as Figure 4 As shown, the embodiment of the present application also discloses a copper foil preparation device 10, including a machine platform 200, and the copper foil preparation device 10 also includes the above-mentioned detection system 100, which is used to detect the cathode roller 300 on the machine platform 200 and control the polishing of the surface of the cathode roller 300. The cathode roller 300 is installed on the machine platform 200, and the motor and transmission system on the machine platform 200 are responsible for driving the cathode roller 300 to rotate to ensure its uniform motion during the copper foil preparation process; the control system on the machine platform 200 monitors and adjusts the rotation speed, current density, temperature and other parameters of the cathode roller 300 to ensure the quality and production efficiency of the copper foil.

[0061] At present, in the process of preparing copper foil by the copper foil preparation equipment 10, the online polishing of the cathode roller 300 is mainly adjusted according to the roughness of the smooth surface of the lower roll and the degree of oxidation of the cathode roller 300 by manual judgment. The polishing parameters need to be constantly debugged and then repeatedly sampled for confirmation, which is relatively cumbersome and wastes a lot of time.

[0062] Based on the above problems, the present application improves the detection system 100 of the cathode roller 300 in the copper foil preparation equipment 10. The present application monitors and polishes the surface of the cathode roller 300 in real time through the detection system 100, and uses the image generating device 110 to generate a first image signal of the cathode roller 300 in real time, and then transmits the generated first image signal to the image processing device 120; when the image processing device 120 obtains the first image signal, it processes the first image signal to form a second image signal that is convenient for the control device 130 to analyze and process, and transmits the second image signal to the control device 130, and the control device 130 obtains the first image signal. The second image signal is analyzed and processed to obtain the first parameter value of the cathode roller 300, and the polishing device 140 is controlled according to the first parameter value of the cathode roller 300, so that the polishing device 140 automatically adjusts the polishing pressure and polishing time during polishing to polish the surface of the cathode roller 300 according to the first parameter value of the cathode roller 300 fed back by the control device 130, so that the first parameter value of the surface of the cathode roller 300 is kept within the preset parameter value range, and the first parameter value of the surface of the cathode roller 300 is ensured to meet the production standard, so that the surface of the cathode roller 300 is quickly detected and adjusted, thereby improving the quality of the cathode roller 300. That is, the present application can better control the first parameter value of the cathode roller 300 by analyzing and obtaining the first parameter value of the surface of the cathode roller 300 in real time, and interlocking control with the polishing device 140, and can polish the cathode roller 300 to the best state, reduce the subsequent quality abnormality caused by the cathode roller 300, and further improve the production efficiency of the copper foil preparation device 10.

[0063] It should be noted that the inventive concept of the present application can form a large number of embodiments, but the length of the application document is limited and it is impossible to list them one by one. Therefore, under the premise of no conflict, the embodiments or technical features described above can be arbitrarily combined to form new embodiments. After the embodiments or technical features are combined, the original technical effects will be enhanced.

[0064] The above content is a further detailed description of the present application in combination with specific optional implementation methods, and it cannot be determined that the specific implementation of the present application is limited to these descriptions. For ordinary technicians in the technical field to which the present application belongs, several simple deductions or substitutions can be made without departing from the concept of the present application, which should be deemed to fall within the scope of protection of the present application.

Claims

1. A detection system for detecting a cathode roller; characterized in that: The detection system includes an image generating device, an image processing device and a control device; The image generating device is arranged above the cathode roller, and the image generating device is used to generate a first image signal of the cathode roller; The image processing device is used to process the first image signal to form a second image signal, and transmit the processed second image signal to the control device; The control device analyzes the acquired second image signal and processes it to obtain a first parameter value; The detection system also includes a polishing device. The control device is connected to the polishing device and controls the polishing device to polish the surface of the cathode roller and controls the first parameter value within the preset parameter value range.

2. The detection system according to claim 1, characterized in that: The detection system further includes a first sensor; the image processing device amplifies the first image signal to form the second image signal, and then transmits the second image signal to the first sensor; The first sensor transmits the acquired second image signal to the control device, and the control device analyzes and processes the second image signal to calculate the first parameter value.

3. The detection system according to claim 2, characterized in that: The control device converts the received second image signal into a three-dimensional image, and automatically measures the average absolute value of the distance from each point on the contour of the three-dimensional image to the contour centerline to obtain the first parameter value.

4. The detection system according to claim 3, characterized in that: When the cathode roller needs to be polished, the control device controls the polishing device to start; The polishing device automatically adjusts the polishing pressure and polishing time according to the first parameter value fed back by the control device; When the first parameter value of the cathode roller reaches within the set parameter value range, the polishing device stops polishing the cathode roller.

5. The detection system according to claim 4, characterized in that: When the first parameter value of the cathode roller is greater than the preset parameter value range, the control device controls the polishing device to stop polishing the surface of the cathode roller.

6. The detection system according to claim 5, characterized in that: The detection system also includes a monitor and an alarm device. The monitor is connected to the alarm device. The monitor is used to monitor the polishing state of the cathode roller. When the monitor detects that the polishing state of the cathode roller reaches a first state, the monitor transmits a detection signal to the alarm device.

7. The detection system according to claim 6, characterized in that: When the first parameter value is within the preset parameter value range, the control between the control device and the polishing device is disconnected, and only the monitor works; The first sensor transmits the second image signal to the monitor; The monitor compares and analyzes the second image signal transmitted by the first sensor with the image signal monitored by the monitor in real time to determine whether the polishing state of the cathode roller reaches the first state, and feeds back the comparison signal to the alarm device.

8. The detection system according to claim 1, characterized in that: When the polishing of the cathode roller is finished, the control device automatically records various parameter values ​​of the current polishing and keeps them in the control device.

9. The detection system according to claim 1, characterized in that: The control device calculates the first parameter value in real time according to the second image signal transmitted by the first sensor, and automatically saves the first parameter value calculated in real time in the control device.

10. A copper foil preparation device, comprising a machine platform, characterized in that: The copper foil preparation equipment further comprises a detection system as claimed in any one of claims 1 to 9, wherein the detection system is used to detect the cathode roller on the machine platform and control the polishing of the surface of the cathode roller.

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