Device and method for detecting medium-wave infrared imaging performance of high-temperature optical window

Abstract

The invention relates to the technical field of remote sensing imaging, in particular to a high-temperature optical window medium-wave infrared imaging performance detection device and detection method.The detection device comprises a target generator, a light adjusting assembly, a rapid temperature impact high-temperature experiment box, a transfer device and a photoelectric load system, and the target generator is used for generating a medium-wave infrared target; the light adjusting assembly is used for guiding light of the medium-wave infrared target to the optical window; the rapid warm-punching high-temperature experiment box is used for unilaterally heating the optical window to a target set temperature; the transfer device is used for transferring the optical window to a light path of the detection device; and the photoelectric load system is used for receiving the light penetrating through the optical window and forming a medium-wave infrared target image. Therefore, the photoelectric load imaging performance change of the optical window caused by the aerodynamic thermal effect in a high Mach number complex flight environment can be accurately simulated in a ground laboratory, and the medium-wave infrared imaging performance of the optical window at the target set temperature can be comprehensively detected.

Description

Technical Field

[0001] The invention relates to the technical field of remote sensing imaging, and specifically provides a device and a method for detecting wave infrared imaging performance in a high-temperature optical window. Background Art

[0002] With the rapid development of modern aerospace technology, the flight speed of aircraft is constantly increasing, especially in the hypersonic flight environment (Mach number greater than 5), the aerodynamic thermal effect on the outside of the aircraft has become a key issue in design and manufacturing. As the core component of the optoelectronic payload in aviation aircraft, the performance of the optical window directly affects the imaging functions of the optoelectronic payload, such as reconnaissance, surveillance, and tracking. However, when the aircraft flies at a high Mach number in the low-altitude dense atmosphere, the optical window is exposed to an extreme aerodynamic heating environment and will face a variety of complex effects, such as light transmission degradation, aerodynamic thermal radiation, and aerodynamic stress and strain, which seriously affect the imaging quality of the optoelectronic payload.

[0003] Specifically, the high-speed flow field outside the optical window will trigger a light transmission effect, causing the light passing through the optical window to flicker, jitter, deflect, and blur, resulting in degradation of the target image quality. At the same time, the violent compression and friction of the air causes the temperature of the optical window surface to rise sharply. According to the blackbody radiation theory, when the temperature of the optical window rises, it will produce strong radiation in the mid-wave infrared band and form strong thermal noise interference, significantly reducing the imaging signal-to-noise ratio, affecting the accurate identification of the target, and even causing the target's radiation signal to be annihilated. In addition, the violent interaction between the optical window and the incoming flow will produce stress and strain, further affecting the optical imaging performance.

[0004] At present, although there are many methods for studying the aerothermal effect of optical windows, most of them rely on wind tunnel experiments, which are costly and have complex experimental conditions. In addition, the temperature and aerodynamic conditions of wind tunnel experiments are difficult to control accurately, and it is impossible to fully and reliably simulate the impact of the aerothermal effect of optoelectronic loads in actual flight environments on the mid-wave infrared imaging performance of optical windows, making it difficult to repeat and quantify the experimental results. Especially for high-temperature materials such as sapphire optical windows, there is still a lack of systematic ground experimental evaluation methods for the thermal radiation effect in high-speed aerodynamic heating environments. Summary of the invention

[0005] In order to solve the above problems, the present invention provides a device and method for detecting the medium-wave infrared imaging performance in a high-temperature optical window, which can accurately simulate the changes in the imaging performance of the optoelectronic load of the optical window caused by the aerodynamic thermal effect in a high-Mach number complex flight environment in a ground laboratory, and realize comprehensive detection of the medium-wave infrared imaging performance of the optical window.

[0006] The present invention provides a device for detecting the medium-wave infrared imaging performance in a high-temperature optical window, which specifically includes a target generator, a light adjustment component, a rapid temperature shock high-temperature test box, a transfer device and a photoelectric load system. The target generator is arranged at the starting point of the optical path of the detection device, and the target generator is used to generate a medium-wave infrared target; the light adjustment component is arranged in front of the target generator, and the light adjustment component is used to guide the light of the medium-wave infrared target to the optical window; the rapid temperature shock high-temperature test box is used to heat the optical window on one side so that the surface temperature of the optical window reaches the target set temperature; the transfer device is used to transfer the optical window that has reached the target set temperature to the front of the light adjustment component, so that the optical window is located on the optical path of the detection device; the photoelectric load system is arranged at the end point of the optical path of the detection device, and the photoelectric load system is used to receive the light passing through the optical window and form a medium-wave infrared target image, thereby detecting the medium-wave infrared imaging performance of the optical window at the target set temperature.

[0007] Preferably, the medium-wave infrared imaging performance detection device in a high-temperature optical window also includes a temperature difference control component, which is electrically connected to the target generator and is used to adjust the temperature difference between the medium-wave infrared target and the background.

[0008] Preferably, the light adjustment assembly includes a collimator and a folding mirror assembly. The collimator is arranged in front of the target generator and is used to collimate the light of the medium-wave infrared target; the folding mirror assembly is arranged in front of the collimator and is used to guide the light to the optical window.

[0009] Preferably, the optical window is a sapphire optical window, a quartz glass optical window or a calcium fluoride optical window.

[0010] The present invention provides a method for detecting the performance of middle-wave infrared imaging in a high-temperature optical window, based on a device for detecting the performance of middle-wave infrared imaging in a high-temperature optical window, and specifically comprises the following steps: S102: setting different target setting temperatures for the optical window, respectively obtaining medium-wave infrared target images formed through the optical window at different target setting temperatures, and obtaining imaging performance indicators of the medium-wave infrared target images; S104: Based on the imaging performance index, evaluate the medium-wave infrared imaging performance of the optical window at the target set temperature.

[0011] Preferably, respectively acquiring medium-wave infrared target images formed through the optical window at different target setting temperatures comprises the following steps: S102-2: Generate a medium-wave infrared target and adjust the temperature difference between the medium-wave infrared target and the background; S102-4: Setting the heating time, heating the optical window on one side so that the surface temperature of the optical window reaches the target set temperature; S102-6: transporting the optical window that has reached the target set temperature to the optical path of the detection device; S102-8: Collimate the light from the mid-wave infrared target and direct it to the optical window; S102-10: Receive light passing through the optical window and form a medium-wave infrared target image.

[0012] Preferably, the imaging performance indicators include image clarity, signal-to-noise ratio and thermal radiation noise.

[0013] Compared with the prior art, the present invention can achieve the following beneficial effects: (1) The present invention provides a device and method for detecting the medium-wave infrared imaging performance of a high-temperature optical window, which can accurately simulate the changes in the imaging performance of the optoelectronic load of the optical window caused by the aerodynamic thermal effect in a high-Mach number complex flight environment in a ground laboratory, thereby comprehensively evaluating the medium-wave infrared imaging performance of the optical window at the target set temperature, reducing experimental costs, improving verification accuracy, and providing effective experimental data support for medium-wave infrared reconnaissance, surveillance and tracking technology for high-speed aircraft.

[0014] (2) The present invention provides a device and method for detecting the performance of medium-wave infrared imaging in a high-temperature optical window. By setting a temperature difference control component to accurately adjust the temperature difference between the medium-wave infrared target and the background, the temperature difference can be maintained at a stable contrast between the medium-wave infrared target and the background, thereby enhancing the imaging effect.

[0015] (3) The present invention provides a device and method for detecting the performance of mid-wave infrared imaging in a high-temperature optical window. By simplifying the detection device, the detection device is easy to build and operate. It can be used for repeated detection of optical windows of various types of materials at different target setting temperatures, and is therefore suitable for the accumulation and analysis of long-term detection experimental data. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The accompanying drawings constituting a part of the present invention are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the accompanying drawings: Figure 1 : is a structural schematic diagram of a device for detecting mid-wave infrared imaging performance in a high-temperature optical window provided by an embodiment of the present invention; Figure 2 It is a flow chart of a method for detecting mid-wave infrared imaging performance in a high-temperature optical window provided by an embodiment of the present invention; Figure 3 It is a schematic diagram of a process for obtaining a medium-wave infrared target image of an optical window at a target set temperature provided by an embodiment of the present invention.

[0017] The reference numerals include: 1 target generator, 21 collimator, 22 first folding mirror, 23 second folding mirror, 3 rapid temperature shock high temperature test box, 4 transfer device, 5 photoelectric load system, 6 optical window. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical scheme and advantages of the present invention clearer, the present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and do not constitute a limitation of the present invention. Wherein similar elements in different embodiments use associated similar element numbers. In the following embodiments, many detailed descriptions are to enable the present invention to be better understood. However, those skilled in the art can easily recognize that some of the features can be omitted in different situations, or can be replaced by other elements, materials, methods. In some cases, some operations related to the present invention are not shown or described in the specification, this is to avoid the core part of the present invention being overwhelmed by too much description, and for those skilled in the art, it is not necessary to describe these related operations in detail, and they can fully understand the related operations according to the description in the specification and the general technical knowledge in the art.

[0019] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other to form various implementation methods. At the same time, the steps or actions in the method description can also be interchanged or adjusted in a manner that is obvious to those skilled in the art. Therefore, the various sequences in the specification and the drawings are only for the purpose of clearly describing a certain embodiment and are not meant to be a necessary sequence, unless otherwise specified that a certain sequence must be followed.

[0020] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", etc. are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, the meaning of "multiple" is two or more.

[0021] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood by specific circumstances.

[0022] The present invention will be described in detail below with reference to the accompanying drawings and in conjunction with embodiments.

[0023] like Figure 1 As shown, the embodiment of the first aspect of the present invention provides a device for detecting medium-wave infrared imaging performance in a high-temperature optical window, which specifically includes a target generator 1, a light adjustment component, a fast temperature shock high-temperature test box 3, a transfer device 4, and an optoelectronic load system 5. As a result, the change in the optoelectronic load imaging performance of the optical window 6 due to the aerodynamic thermal effect under a high Mach number complex flight environment can be accurately simulated in a ground laboratory, and the medium-wave infrared imaging performance of the optical window 6 at the target set temperature can be fully evaluated, the experimental cost can be reduced, the verification accuracy can be improved, and effective experimental data support can be provided for medium-wave infrared reconnaissance, monitoring and tracking technology of high-speed aircraft.

[0024] Specifically, the target generator 1 is arranged at the starting point of the optical path of the detection device. The target generator 1 is used to generate a medium-wave infrared target with high geometric resolution and high-precision temperature contrast, so that the light of the medium-wave infrared target can pass through the optical window 6 under high temperature disturbance and be received by the photoelectric load system 5 to form a medium-wave infrared target image. Among them, the target generator 1 can adjust the temperature of the medium-wave infrared target according to the experimental requirements, so as to generate a medium-wave infrared target with a different temperature difference from the background. The light adjustment component is arranged in front of the target generator 1, and the light adjustment component is used to guide the light of the medium-wave infrared target to the optical window 6.

[0025] Specifically, the rapid temperature shock high temperature test box 3 can quickly heat the optical window 6 on one side in a short time, so that the surface temperature of the optical window 6 reaches the target set temperature, thereby simulating the aerodynamic thermal effect generated on the surface of the optical window 6 when the aircraft flies at a high Mach number. Among them, the heating power and the target set temperature range of the rapid temperature shock high temperature test box 3 are adjustable, so as to ensure that the surface of the optical window 6 can reach the target set temperature, and realize accurate control of the heating rate of the optical window 6 during the heating process. In addition, by setting different target set temperatures for the optical window 6, it is also possible to quantitatively evaluate the impact of the aerodynamic thermal effect on the imaging performance of the optical window 6.

[0026] In some possible embodiments, in order to keep the temperature of the optical path area stable, the rapid temperature shock high temperature test box 3 is set outside the optical path to avoid affecting other devices in the optical path. However, in a complex flight environment with a high Mach number, the temperature of the surface of the optical window 6 rises rapidly and unevenly, resulting in instantaneous changes in the imaging performance of the optical window 6.

[0027] Therefore, a transfer device 4 is provided to quickly transfer the optical window 6 that has reached the target set temperature to the front of the light adjustment component, so that the optical window 6 is located on the light path of the detection device, thereby ensuring that the optical window 6 is in a high temperature state during detection, avoiding the cooling of the optical window 6 affecting the detection result, and further more accurately detecting the influence of the aerodynamic thermal effect on the imaging performance of the optical window 6, especially the influence on the imaging signal-to-noise ratio.

[0028] That is to say, by providing the rapid temperature shock high temperature test box 3 and the transfer device 4, it is possible to implement economical and controllable optical window imaging performance testing under high temperature conditions under ground laboratory conditions.

[0029] Specifically, the photoelectric load system 5 is arranged at the end point of the optical path of the detection device. The photoelectric load system 5 is used to receive the light passing through the optical window 6 and form a medium-wave infrared target image. By recording and analyzing key imaging performance indicators of the medium-wave infrared target image, such as image quality, signal-to-noise ratio, thermal radiation noise, etc., the medium-wave infrared imaging performance of the optical window 6 at the target set temperature can be detected.

[0030] like Figure 1 As shown, the medium-wave infrared imaging performance detection device in the high-temperature optical window also includes a temperature difference control component, which is electrically connected to the target generator 1. The temperature difference control component is used to accurately adjust the temperature difference between the medium-wave infrared target and the background, so that the medium-wave infrared target and the background temperature maintain a stable contrast, thereby enhancing the imaging effect.

[0031] In some possible embodiments, when the temperature difference between the medium-wave infrared target and the background increases, the imaging contrast of the optical window 6 is enhanced; at this time, the temperature increase of the optical window 6 generates thermal radiation noise, which has a more obvious interference on the image clarity of the imaging. When the temperature difference between the medium-wave infrared target and the background decreases, the imaging contrast of the optical window 6 decreases.

[0032] like Figure 1As shown, the light adjustment assembly includes a collimator 21 and a folding mirror assembly. The collimator 21 is arranged in front of the target generator 1, and is used to collimate the light of the medium-wave infrared target, thereby simulating the light emitted by a distant target. The folding mirror assembly is arranged in front of the collimator 21, and is capable of changing the direction of the light path in the detection device, and directing the light to the optical window 6, thereby preventing the optical window 6 from generating heat radiation under high temperature state, and interfering with the normal operation of the target generator 1 and the temperature of the medium-wave infrared target, thereby maintaining the stability of the detection device and ensuring the accuracy of the temperature difference between the medium-wave infrared target and the background.

[0033] In some possible embodiments, the folding mirror assembly includes a first folding mirror 22 and a second folding mirror 23 , and the first folding mirror 22 and the second folding mirror 23 are capable of transmitting the light of the medium-wave infrared target passing through the collimator 21 to the optical window 6 .

[0034] like Figure 1 As shown, the high temperature optical window mid-wave infrared imaging performance detection device provided by the present invention is relatively simple, easy to build and operate, and can be applied to detect optical windows 6 of various types of materials. In some possible embodiments, the optical window 6 includes but is not limited to a sapphire optical window, a quartz glass optical window, or a calcium fluoride optical window.

[0035] That is to say, the present invention realizes the accurate setting of key experimental parameters such as the target setting temperature of the optical window 6, the heating time, and the temperature difference between the medium-wave infrared target and the background by providing a rapid temperature shock high-temperature test box 3 and a temperature difference control component. Compared with traditional wind tunnel experiments, the experimental variables are independently controllable, which facilitates repeated experiments under different environmental conditions, thereby providing effective data support for the optimization of the medium-wave infrared imaging system of high-speed aircraft.

[0036] like Figure 2 As shown, the embodiment of the second aspect of the present invention provides a method for detecting the performance of middle-wave infrared imaging in a high-temperature optical window, based on the above-mentioned device for detecting the performance of middle-wave infrared imaging in a high-temperature optical window, specifically comprising the following steps: S102: setting different target setting temperatures for the optical window 6, respectively acquiring medium-wave infrared target images formed through the optical window 6 at different target setting temperatures, and acquiring imaging performance indicators of the medium-wave infrared target images.

[0037] S104: Based on the imaging performance index, quantitatively analyze the influence of the temperature rise on the imaging performance index of the optical window 6, and then evaluate the medium-wave infrared imaging performance of the optical window 6 at the target set temperature.

[0038] As a result, the changes in the optoelectronic load imaging performance of the optical window 6 caused by the aerodynamic thermal effect in the complex flight environment of high Mach number can be accurately simulated in the ground laboratory, so as to comprehensively evaluate the medium-wave infrared imaging performance of the optical window 6 at the target set temperature, reduce the experimental cost, improve the verification accuracy, and provide effective experimental data support for the medium-wave infrared reconnaissance, surveillance and tracking technology of high-speed aircraft.

[0039] like Figure 3 As shown, obtaining medium-wave infrared target images formed through the optical window 6 at different target setting temperatures respectively includes the following steps: S102-2: Start the target generator 1 to generate a medium-wave infrared target, and adjust the temperature difference between the medium-wave infrared target and the background through the temperature difference control component, so that the medium-wave infrared target and the background temperature have a stable contrast, thereby enhancing the imaging effect.

[0040] S102-4: Set the heating time and heat the optical window 6 on one side so that the surface temperature of the optical window 6 reaches the target set temperature.

[0041] Specifically, the rapid temperature shock high temperature test box 3 is started, and the optical window 6 is brought close to the rapid temperature shock high temperature test box 3 by using the transfer device 4 for unilateral heating. By setting the heating time and the heating power, it is ensured that the unilateral surface of the optical window 6 reaches the target set temperature, thereby simulating the aerodynamic thermal effect generated on the surface of the optical window 6 when the aircraft flies at a high Mach number. When the experiment is repeated, by adjusting the rapid temperature shock high temperature test box 3, the unilateral surface of the optical window 6 can be heated to different target set temperatures, thereby detecting the medium-wave infrared imaging performance of the optical window 6 at different target set temperatures.

[0042] S102-6: The optical window 6 that has reached the target set temperature is transferred to the optical path of the detection device.

[0043] Specifically, after the optical window 6 reaches the target set temperature, the transfer device 4 is used to quickly transfer the optical window 6 between the folding mirror assembly and the photoelectric load system 5, which can ensure that the temperature of the optical window 6 remains stable and prevent the temperature of the optical window 6 from decreasing and interfering with the detection results.

[0044] S102-8: Use the collimator 21 to collimate the light of the medium-wave infrared target, and adjust the folding mirror assembly to direct the light to the optical window 6 so that the light can pass through the optical window 6 and be received by the optoelectronic payload system 5.

[0045] S102-10: Start the optoelectronic payload system 5, use the optoelectronic payload system 5 to receive the light passing through the optical window 6 and form a medium-wave infrared target image; obtain the imaging performance index of the medium-wave infrared target image.

[0046] The photoelectric payload system 5 can also collect the influence of the temperature change of the optical window 6 on the imaging performance in real time.

[0047] In some possible embodiments, the imaging performance indicators include image clarity, signal to noise ratio (SNR) and thermal radiation noise, wherein the image clarity is recorded by the photoelectric load system 5, and the signal to noise ratio and thermal radiation noise are obtained by analysis and calculation.

[0048] Specifically, by comparing the medium-wave infrared target images formed through the optical window 6 at different target setting temperatures, the influence of the temperature change of the optical window 6 on the signal-to-noise ratio can be quantitatively analyzed. Since the temperature increase of the optical window 6 generates thermal radiation noise, by quantitatively analyzing the intensity of the thermal radiation noise at different target setting temperatures of the optical window 6 and correlating the thermal radiation noise with the signal-to-noise ratio, the interference of the thermal radiation noise on the imaging performance of the optical window 6 when the temperature of the optical window 6 changes can be evaluated.

[0049] The experimental results show that when the target setting temperature of the optical window 6 exceeds 300°C, the signal-to-noise ratio decreases significantly, and as the temperature continues to rise, the imaging performance of the optical window 6 continues to deteriorate. In addition, as the target setting temperature increases, the impact of background radiation on the medium-wave infrared target will be aggravated, especially in the case of large temperature differences, the image clarity will decrease significantly. In other words, the impact of aerodynamic thermal effects on the imaging performance of the optical window 6 includes degradation phenomena such as image blur, decreased imaging signal-to-noise ratio, and thermal radiation noise interference.

[0050] The present invention provides a device and method for detecting the performance of mid-wave infrared imaging in a high-temperature optical window, which are suitable for the accumulation and analysis of long-term detection experimental data and can repeat the detection multiple times under the conditions of different target set temperatures.

[0051] Although the embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and cannot be understood as limiting the present invention. Those skilled in the art may change, modify, replace and modify the above embodiments within the scope of the present invention.

[0052] The above specific implementations of the present invention do not constitute a limitation on the protection scope of the present invention. Any other corresponding changes and modifications made based on the technical concept of the present invention should be included in the protection scope of the claims of the present invention.

Claims

1. A device for detecting the performance of middle-wave infrared imaging in a high-temperature optical window, characterized in that: include: A target generator (1), the target generator (1) being arranged at the starting point of the optical path of the detection device, and the target generator (1) being used to generate a medium-wave infrared target; A light adjustment component, the light adjustment component being arranged in front of the target generator (1), and being used for directing the light of the medium-wave infrared target to the optical window (6); A rapid temperature shock high temperature test box (3), wherein the rapid temperature shock high temperature test box (3) is used to heat the optical window (6) on one side so that the surface temperature of the optical window (6) reaches a target set temperature; A transfer device (4), the transfer device (4) being used to transfer the optical window (6) that has reached the target set temperature to the front of the light adjustment component, so that the optical window (6) is located on the light path of the detection device; A photoelectric load system (5), wherein the photoelectric load system (5) is arranged at the end point of the optical path of the detection device, and the photoelectric load system (5) is used to receive light passing through the optical window (6) and form a medium-wave infrared target image, thereby detecting the medium-wave infrared imaging performance of the optical window (6) at a target set temperature.

2. The device for detecting the performance of middle-wave infrared imaging in a high-temperature optical window according to claim 1, characterized in that: Also includes: A temperature difference control component, the temperature difference control component is electrically connected to the target generator (1), and the temperature difference control component is used to adjust the temperature difference between the medium-wave infrared target and the background.

3. The device for detecting the performance of middle-wave infrared imaging in a high-temperature optical window according to claim 1, characterized in that: The light adjustment component comprises: A collimator (21), the collimator (21) being arranged in front of the target generator (1), and the collimator (21) being used for collimating the light of the medium-wave infrared target; A folding mirror assembly, wherein the folding mirror assembly is arranged in front of the collimator (21), and the folding mirror assembly is used to guide the light to the optical window (6).

4. The device for detecting the performance of middle-wave infrared imaging in a high-temperature optical window according to claim 1, characterized in that: The optical window (6) is a sapphire optical window, a quartz glass optical window or a calcium fluoride optical window.

5. A method for detecting the performance of middle-wave infrared imaging in a high-temperature optical window, characterized in that: The device for detecting mid-wave infrared imaging performance in a high-temperature optical window according to any one of claims 1 to 4 comprises: Setting different target setting temperatures for the optical window (6), respectively acquiring medium-wave infrared target images formed through the optical window (6) at the different target setting temperatures, and acquiring imaging performance indicators of the medium-wave infrared target images; Based on the imaging performance index, the medium-wave infrared imaging performance of the optical window (6) at a target set temperature is evaluated.

6. The method for detecting the performance of middle-wave infrared imaging in a high-temperature optical window according to claim 5, characterized in that: The step of respectively acquiring medium-wave infrared target images formed through the optical window (6) at different target setting temperatures comprises: generating a medium-wave infrared target and adjusting the temperature difference between the medium-wave infrared target and the background; Setting a heating time to heat the optical window (6) on one side so that the surface temperature of the optical window (6) reaches a target set temperature; Transferring the optical window (6) that has reached the target set temperature to the optical path of the detection device; collimating the light of the medium-wave infrared target and directing the light to the optical window (6); The light passing through the optical window (6) is received and a medium-wave infrared target image is formed.

7. The method for detecting the performance of middle-wave infrared imaging in a high-temperature optical window according to claim 5, characterized in that: The imaging performance indicators include image clarity, signal-to-noise ratio and thermal radiation noise.

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