Polarizing film coiled material yield simulation method and device, storage medium and terminal

Abstract

The invention discloses a polarizing film coiled material yield simulation method and device, a storage medium and a terminal. The simulation method comprises the following steps: acquiring coiled material data and defect data of a polarizing film coiled material; based on the coiled material data and the defect data, a fragmentation parameter and a fragmentation mode are set, an edge is cut with the starting point of the polarizing film coiled material as a zero point, simulated cutting is conducted according to the fragmentation parameter and the fragmentation mode, and the simulated yield of the polarizing film coiled material is calculated and summarized into a yield data table; and uploading the yield data table to a cloud storage system. The semi-finished product reject ratio of a coating station and a reflection detection station can be accurately estimated, production data are uploaded to an MES system, information of the polarizing film coiled material at the current station is fed back in real time, the final condition of the semi-finished polarizing film coiled material is obtained, the overall condition of the polarizing film coiled material is conveniently controlled, the actual polarizing film coiled material yield is improved, and the production cost is reduced. And intelligent and automatic production of the polarizing film coiled material is promoted.

Description

Technical Field

[0001] The present invention relates to the technical field of polarizing films, and in particular to a method, device, storage medium and terminal for simulating the yield of a polarizing film roll. Background Art

[0002] Polarizing film is a key optical material, widely used in liquid crystal display screens, solar panels and other fields. Its quality directly affects the display effect and performance of the final product. In the production process of polarizing film, the efficient operation of the continuous production line and the stable control of product quality are the key to the development of the industry. However, in the continuous production operation, the polarizing film will be processed at multiple stations, and each station may introduce different types of defects due to different environments, equipment status and operating conditions.

[0003] Traditionally, quality assurance personnel take samples at the beginning and end of the roll and conduct manual inspections to evaluate the quality of the entire roll of polarizing film, and judge whether it is good or defective based on this. Although this method is simple and direct, it has significant limitations. Since the length of the polarizing film roll exceeds 1,000 meters, and the process parameters and environmental conditions may change during the production process, the quality of the polarizing film roll in the roll is significantly different from that at the beginning and end of the roll. Therefore, judging the quality of the entire roll based solely on the sample inspection results at the beginning and end of the roll is often difficult to fully and accurately reflect the overall quality level of the roll, which in turn causes the actual situation detected manually during post-process cutting to deviate from the previous judgment results, affecting production efficiency and product yield.

[0004] Patent CN113155862B proposes a polarizing film coil yield simulation system, which optimizes the cutting and flashing functions of special coils by simulating the cutting method, effectively improving the cutting efficiency and accuracy. However, this patent mainly focuses on the simulation and optimization of the cutting process, and does not go into the detection and yield calculation of the mark type (key information for identifying, tracking or distinguishing product batches) printed by the coating station by the inspection station. This invention will upload the yield data to the industrial network disk, which may lead to untimely data updates or synchronization failures, affecting the real-time grasp of the production status and the ability to respond quickly, and thus affecting the effectiveness and accuracy of production decisions.

[0005] Therefore, how to solve the deficiencies and shortcomings of existing technologies through effective polarizing film roll yield simulation methods has become an important issue that researchers in this field need to solve urgently. Summary of the invention

[0006] The purpose of the present invention is to solve the above-mentioned problems and provide a method, device, storage medium and terminal for simulating the yield of a polarizing film roll.

[0007] The technical solution of the present invention is: a simulation method for the yield of a polarizing film roll, comprising the following steps: obtaining coil data and defect data of the polarizing film roll, wherein the coil data at least includes the management number, structure and width of the polarizing film roll, and the defect data at least includes the position, size and defect type of the defect of the polarizing film roll, and the defect type at least includes bubbles, foreign matter, concave-convex, skew points and scratches; setting slice parameters and slice methods based on the coil data and defect data, taking the starting point of the polarizing film roll as the zero point cutting edge, simulating cutting according to the slice parameters and slice methods, calculating the simulated yield of the polarizing film roll and summarizing it into a yield data table, wherein the yield data table includes simulation time, management number, structure, yield, a first average defect number per square meter and a second average defect number per square meter of each defect type;

[0008] The yield data table is uploaded to a cloud storage system.

[0009] As an improvement of an embodiment of the present invention, the "obtaining the coil data and defect data of the polarizing film coil" specifically includes: controlling the automatic optical inspection system to inspect the polarizing film coil, and obtaining the coil data and defect data of the polarizing film coil from the automatic optical inspection system, and sending the defect data that exceeds the preset card control parameters to the inkjet printer; controlling the inkjet printer to inkjet mark the received defect data.

[0010] As an improvement of the embodiment of the present invention, the cloud storage system is a MES system.

[0011] As an improvement to the embodiment of the present invention, the yield data table is transmitted to the MES system upload interface, and the MES system reads the interface data to upload and displays the upload result.

[0012] To achieve one of the above-mentioned purposes of the invention, an embodiment of the present invention provides a simulation device for the yield of a polarizing film roll, comprising the following modules: an information acquisition module, used to obtain the roll data and defect data of the polarizing film roll, the roll data at least including the management number, structure and width of the polarizing film roll, the defect data at least including the position, size and defect type of the defects of the polarizing film roll, the defect type at least including bubbles, foreign matter, bumps, deflections and scratches; a yield generation module, used to set slice parameters and slice methods based on the roll data and defect data, take the starting point of the polarizing film roll as the zero point cutting edge, simulate cutting according to the slice parameters and slice methods, calculate the simulated yield of the polarizing film roll and summarize it into a yield data table, the yield data table includes simulation time, management number, structure, yield, a first average number of defects per square meter and a second average number of defects per square meter of each defect type; a data upload module, used to upload the yield data table to a cloud storage system.

[0013] As an improvement of an embodiment of the present invention, the "obtaining the coil data and defect data of the polarizing film coil" specifically includes: controlling the automatic optical inspection system to inspect the polarizing film coil, and obtaining the coil data and defect data of the polarizing film coil from the automatic optical inspection system, and sending the defect data that exceeds the preset card control parameters to the inkjet printer; controlling the inkjet printer to inkjet mark the received defect data.

[0014] As an improvement of the embodiment of the present invention, the cloud storage system is a MES system.

[0015] As an improvement to the embodiment of the present invention, the yield data table is transmitted to the MES system upload interface, and the MES system reads the interface data to upload and displays the upload result.

[0016] To achieve one of the above objects of the invention, an embodiment of the present invention provides a storage medium storing program instructions, wherein the program instructions implement the simulation method as described in any one of the above items when executed by a processor.

[0017] To achieve one of the above objects of the invention, an embodiment of the present invention provides a terminal, including a processor and a memory, wherein the memory stores program instructions, and the processor executes the program instructions to implement the simulation method as described in any one of the above items.

[0018] The simulation method, device, storage medium and terminal for the yield of polarizing film coils provided in the embodiments of the present invention have the following advantages: by comprehensively considering the overall quality data of the coil, including the detection of mark types, a more realistic and reliable yield evaluation result can be generated, which helps to reduce the deviation caused by single sampling point detection, improve the accuracy and credibility of yield evaluation, and upload the real-time generated yield data to the MES system, thereby realizing the instant sharing and centralized management of production data and promoting intelligent and automated production. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 1 is a schematic flow chart of the method for simulating the yield of the polarizing film roll of the present invention;

[0020] Figure 2 It is the source of the defect data of the polarizing film coil of the present invention and the process diagram uploaded to MES;

[0021] Figure 3 This is a schematic diagram of the distribution of defects of polarizing film coils before lamination at the coating station;

[0022] Figure 4 This is a schematic diagram of the distribution of defects of polarizing film coils after lamination at the coating station;

[0023] Figure 5This is a schematic diagram of the defects of polarizing film coils before and after lamination at the coating station;

[0024] Figure 6 This is a schematic diagram of the defect data of the polarizing film after lamination at the inspection station;

[0025] Figure 7 It is a schematic diagram of the process of uploading the yield data table to the MES system according to the present invention;

[0026] Figure 8 This is a schematic diagram of the simulation of the shortcomings of the same polarizing film roll with different slice sizes. DETAILED DESCRIPTION

[0027] The present invention will be described in detail below in conjunction with the specific embodiments shown in the accompanying drawings. However, these embodiments do not limit the present invention, and any structural, methodological, or functional changes made by a person skilled in the art based on these embodiments are all within the scope of protection of the present invention.

[0028] If the present invention involves directions (for example, up, down, left, right, front, back, outside, inside, etc.) when describing, it is necessary to define the directions involved.

[0029] The scope of the embodiments herein includes the entire scope of the claims, and all available equivalents of the claims.Herein, the terms "first", "second", etc. are only used to distinguish one element from another, without requiring or implying any actual relationship or order between these elements.In fact, the first element can also be called the second element, and vice versa.Moreover, the terms "include", "comprise" or any other variant thereof are intended to cover non-exclusive inclusion, so that the structure, device or equipment including a series of elements not only include those elements, but also include other elements not clearly listed, or also include elements inherent to such structure, device or equipment.In the absence of more restrictions, the elements limited by the statement "include one..." do not exclude the existence of other identical elements in the structure, device or equipment including the elements.Each embodiment herein is described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same similar parts between each embodiment can be referred to each other.

[0030] The terms "longitudinal", "lateral", "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc. in this document indicate the orientation or position relationship based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing this document and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In the description of this document, unless otherwise specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a mechanical connection or an electrical connection, it can also be the internal communication of two elements, it can be a direct connection, or it can be indirectly connected through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms can be understood according to specific circumstances.

[0031] Embodiment 1 of the present invention provides a method for simulating the yield of a polarizing film roll, such as Figure 1 As shown, the following steps are included:

[0032] Step 101: Acquire the coil data and defect data of the polarizing film coil, wherein the coil data at least includes the management number, structure and width of the polarizing film coil, and the defect data at least includes the position, size and defect type of the defect of the polarizing film coil, and the defect type at least includes bubbles, foreign matter, bumps, skew points and scratches;

[0033] like Figure 2 As shown, at each production site of the polarizing film roll, AOI (Automated Optical Inspection) can be used to perform real-time inspection on the polarizing film roll and obtain the roll data and defect data of the polarizing film roll from AOI.

[0034] Here, AOI is an optical imaging and image processing system composed of light source, camera, lens and computer system. In the production process of the polarizing film coil, the polarizing film coil is scanned and photographed by an optical camera at a high frequency. Each scanned and photographed picture is a pixel according to the camera's own parameters. The computer system processes the pixel generated by the picture taken by the camera to generate an actual defect image. Since the light source in AOI is at a certain angle to the camera, the light source is irradiated on the polarizing film coil, and the camera captures the polarized light passing through the film surface. AOI converts the light signal into an electrical signal, which is reflected in the computer in the form of a continuous spectrum, and a defect image is generated through a specific grayscale algorithm and camera imaging. The defect image is screened and classified by a computer logic algorithm according to the collected attributes, such as area, size, length and width, brightness threshold, etc., the numerical size and the severity and category of the standard card control defects required by the customer, and finally all the detected defects and coil data are simulated to simulate the defect simulation display diagram of the polarizing film coil.

[0035] In practice, the detected defects are classified according to the set parameters to obtain defect data, as shown in Table 1, including at least defect ID, defect name, defect coordinates, defect area, length and width, etc. For serious defects detected, AOI will send the serious defect data to the inkjet printer for marking. When a roll of polarizing film coil is produced, the polarizing film information of the coil is obtained. The coil data includes detection parameters, management number, coil width, upper / lower sheet, etc. All the above data will be saved in the host database of the automatic optical inspection system after production. Here, when the polarizing film coil is cut into sheets, the long side of the sheet is 0 degrees to the film flow direction for the upper sheet and 90 degrees to the lower sheet. The defect data of the coating station is sent to the inkjet printer after the automatic optical inspection system integrates the data before and after lamination, and the inkjet printer integrates the received data.

[0036] Here, the inkjet printer is composed of a servo axis, a nozzle and a computer system. In the production process of the polarizing film coil, AOI will detect the defect data in real time, classify the severity of the defect according to the defect card control, and send the defect data to the inkjet printer for unqualified defects. The inkjet printer processes the information sent by AOI to obtain the defect coordinates required by the inkjet printer, and controls the driving bearing to mark the defect. As shown in Table 2, the information received by the inkjet printer includes the defect name, AOI absolute X coordinate, AOI absolute Y coordinate, the absolute coordinate is the coordinate of the defect relative to both sides of the machine, and the relative coordinate is the coordinate of the defect relative to both sides of the polarizing film. Therefore, in order to ensure the accuracy of the inkjet printer marking serious defects, the inkjet printer needs to convert the absolute coordinate into a relative coordinate. During the production process of the coil, the Y direction of the machine is consistent with the Y direction of the coil, so the absolute coordinate of Y is consistent with the relative coordinate. However, in the X direction, since the two sides of the machine are larger than the two sides of the coil, and the position of the coil is not always fixed during the production process of the polarizing film, it is necessary to calculate the offset of the coil during production, and the printer sets compensation values ​​for the accuracy of each axis during debugging. Therefore, the conversion formula for the relative coordinate of X is: offset = absolute coordinate - relative coordinate, printer relative X coordinate = AOI absolute X coordinate - offset + printer axis compensation value.

[0037] Table 1 Polarizing film roll material disadvantages data table

[0038]

[0039]

[0040] Table 2 Inkjet printer receives automatic optical inspection system disadvantages data information table

[0041]

[0042] Step 102: setting slice parameters and slice methods based on the coil data and defect data, taking the starting point of the polarizing film coil as the zero-point cutting edge, performing simulated cutting according to the slice parameters and slice methods, calculating the simulated yield of the polarizing film coil and summarizing it into a yield data table, wherein the yield data table includes simulation time, management number, architecture, yield, first average defect number per square meter, and second average defect number per square meter of each defect type;

[0043] like Figure 2 As shown, the automatic yield calculation software that controls each station reads the automatic optical inspection system database and the inkjet printer database, automatically matches the corresponding parameters for calculation, and simulates the cutting of the entire roll of material according to the sheet size parameters set for the actual sheet-shaped finished product. The calculation starts from the starting point of the roll. If there is one or more defects on the simulated sheet, the sheet is judged to be a defective product.

[0044] The production of the coating station is to attach a layer of release film to the product of the extension station. When the polarizing film is produced at the coating station, the automatic optical inspection system is controlled to send unqualified defects to the inkjet printer for printing marks. When the coil is cut into sheets, the sheets with the printed marks will be judged as unqualified sheets. The coating station is equipped with two sets of automatic optical inspection systems, which are placed before and after the release film is attached, respectively, to perform surface inspection on the polarizing film. Figure 3 , Figure 4 , Figure 5 As shown in the figure, for the same defect that is detected both before and after lamination, the automatic optical inspection system will merge the detected defects according to the coordinates and retain only one; for the same defect that is detected by only one set of equipment before or after lamination, it will be classified according to the card control parameters of the inspection system to determine whether it exceeds the standard. If it exceeds the standard, it will be treated as an unqualified defect, and finally generate an information summary map containing no repeated defects of the current roll material at the current station. For all unqualified defects that need to be marked by inkjet coding, the automatic optical inspection system will send its information to the inkjet printer in real time. After a roll of material is produced, the automatic yield calculation software automatically reads the automatic optical inspection system and the inkjet printer database to obtain the coordinates and roll material data required to mark the defects, judge the marked sheet as an unqualified sheet, and calculate and simulate the yield of the current station. After the yield calculation is completed, the calculation result data is output to the table file, as shown in Table 3, for example: the calculation time of the current station, management number, inkjet rate, yield, and number of defects per square meter, etc., are all saved to the table file through the specified path.

[0045] Table 3 Output yield value table of coating station automatic simulation yield software

[0046]

[0047] The production of the inspection station is to laminate a layer of protective film on the basis of the product of the coating station. The automatic optical inspection system of the inspection station is set after the protective film is laminated to detect the defects of the protective film after lamination. The yield calculation principle of the inspection station is as follows Figure 6 As shown, when the polarizing film is produced at the inspection station, the coil passes through the automatic optical inspection equipment. The automatic optical inspection system will detect the defects on the coil and the mark printed by the coating station, classify the detected defects, send the detected unqualified defects to the inkjet printer in real time, and compile the detected defects into a defect integration map; the inkjet printer will mark the unqualified defects, and collect the unqualified defect data and integrate it into the inkjet printer database. It can be understood that the calculation of the yield of the inspection station can be closer to the actual yield of the polarizing film after processing.

[0048] The automatic optical inspection system at the inspection station can detect the mark type printed by the coating station, the defects not printed by the coating station, and the defects after the protective film is attached at the inspection station, and the unqualified defects detected after the protective film is attached at the station and the defects not marked at the coating station are marked by inkjet coding. When the automatic yield calculation software of the inspection station obtains the calculation data, it will read the mark information detected by the inspection station, count its number, and calculate the yield after summarizing it with the defect data in the inkjet printer database, and finally summarize the calculation results and related information in the data summary table, as shown in Table 4.

[0049] Table 4 Yield value table output by automatic simulation yield software of the inspection and reflection station

[0050]

[0051]

[0052] After the polarizing film roll is produced, the cutting size of the roll is different due to different customer requirements. The cutting methods for different sizes of the same roll are as follows: Figure 8 As shown, first add the slice parameters that need to be manually simulated in the system; secondly, change the software from automatic mode to manual mode; select the parameters that need to be sliced; finally, enter the coil batch number that needs to be calculated. This mode is used to correct the data when the cutting size needs to be changed or the production parameters are wrong. Since the data uploaded to MES by the yield rate is overwritten, the manually simulated data will also be uploaded to MES in real time. It is understandable that timely correction of erroneous data can ensure that the coil data information queried on MES is more accurate.

[0053] As shown in Table 5, taking the PMMA / COP structure with a width of 2500 as an example, when the automatic cutting is simulated normally, the structure is divided into 1:3 65 inches, but according to the demand, it is necessary to simulate 1:2 55 inches. Since the software has automatically simulated during the automatic calculation, manual simulation is required when changing the size.

[0054] Table 5 Comparison of simulated yield data of the same coil with different sizes

[0055] Management Number Architecture Width Upper / lower piece Average number of defects 65-inch yield 55-inch yield 101 PMMA / COP 2500 Top 0.02 96.58％ 97.34％ 102 PMMA / COP 2500 Top 0.015 96.13％ 97.42％

[0056] When a new production structure personnel fails to add the corresponding parameters in time, resulting in the production batch not finding the corresponding slice formula, but the system has calculated the change of coil mark, so the corresponding data is not uploaded to the MES system. At this time, in addition to choosing manual calculation, you can also enter the uncalculated batch number for recalculation after updating the parameters. It can be understood that this ensures that each batch of polarizing film coils can be uploaded to the MES system.

[0057] As shown in Table 6, after the data of each site is uploaded, the MES system automatically summarizes the status of a batch of polarizing film coils at different sites, including the polarizing film coils that have been dismantled due to defects. It is understandable that the quality difference between different sites of the same batch is increasing. It is convenient for the factory to grasp the overall quality status of the coils by quickly understanding the information, querying relevant conditions, and judging the quality status of the polarizing film coils.

[0058] Table 6 Comparison of the quality of the same batch of coils at different sites

[0059]

[0060]

[0061] As shown in Table 7, after the production of polarizing film is completed, the automatic simulation yield calculation system calculates the yield of each station. By setting the specified expected value, checking the previous process data, and setting the parameter standard according to the data. For example, taking PMMA / COP as an example, after the production of the inspection station is completed, the yield of the inspection station is counted, and the final quality standard of the product is set as a yield of less than 5%. The polarizing film coils with a yield of less than 5% of PMMA / COP coils are counted, and their batch numbers are corresponding to the management numbers of the coating station and extension station through the batch numbers. According to the management number, the yield status and the number of defects per square meter of the coils during the production process are obtained. It can be obtained from this that: when the final yield needs to be less than 5%, the yield at the coating station needs to be less than 4% and the number of defects per square meter needs to be around 0.05, and the yield at the extension station needs to be less than 2%, and the number of defects per square meter is 0.025.

[0062] Table 7 Comparison of yield and number of defects per square meter at different sites of polarizing film

[0063]

[0064] Since the defect size of the automatic optical inspection system is simulated by calculating the defect size through the area size of the camera pixel point, there is a difference between the detected size and the actual defect size. Due to the different light transmittance of the coil and the different optical inspection channels, some qualified defects may become unqualified defects under the calculation simulation of the system, resulting in stricter defect control and a higher yield rate of the coil. Since different customers have different yield requirements for coils, when the yield is too high, the originally compliant polarizing film coils cannot be shipped, causing certain difficulties for the material selectors in selecting polarizing film coils, and also causing large errors in the yield of the front process and the back process. This error can be reduced by adjusting the defect control parameters of the same architecture. The specific operations are as follows:

[0065] As shown in Table 8, the initial automatic optical inspection system parameters are as follows: the area of ​​foreign matter exceeds 0.15mm 2, the concave and convex area exceeds 0.3mm 2 , bubble area exceeds 0.15mm 2 , the calculated yield of the roll is 7.5%, and the actual yield of the roll is 2.5%, with an error of 5%. By loosening or tightening the parameters, the simulated yield gradually approaches the actual yield. When the error is around 2%, it can be understood that the card control parameters can provide a theoretical basis for the production material number, making the parameter card control more reasonable and the simulation mark more accurate.

[0066] Table 8 Comparison between yield change and actual yield after adjusting polarizing film parameters

[0067]

[0068] Step 103: Upload the yield data table to a cloud storage system. Preferably, the cloud storage system is MES.

[0069] like Figure 7 As shown in Table 9, after obtaining the AOI database and the inkjet printer database, and calculating the yield of each roll of polarizing film, the data to be uploaded to MES is uploaded to the MES reserved point, as shown in Table 9. MES reads the data in the point information, compiles it to the MES system, generates a polarizing film roll information form and transmits it to the MES system upload interface. The MES system reads the interface data for upload and displays the upload result.

[0070] Table 9 MES reserved data points

[0071] LOT Serial number 201 TOTAL_OK_PER Average yield 2.00 FIRST_OK_PER Slicing-yield 1.50 SECORD_OK_PER Slice 2 yield 2.00 THIRD_OK_PER Slice three yield rate 2.50 AOI_FLAT Calculate the average number of defects 0.20 B_FLAT B Average number of defects 0.10 P_FLAT Average number of defects 0.05

[0072] In this embodiment, the "obtaining the coil data and defect data of the polarizing film coil" specifically includes: controlling the automatic optical inspection system to inspect the polarizing film coil, and obtaining the coil data and defect data of the polarizing film coil from the automatic optical inspection system, and sending the defect data that exceeds the preset card control parameters to the inkjet printer; controlling the inkjet printer to inkjet mark the received defect data.

[0073] Embodiment 2 of the present invention provides a simulation device for the yield of a polarizing film roll, comprising the following modules: an information acquisition module, used to obtain roll data and defect data of the polarizing film roll, the roll data at least including the management number, structure and width of the polarizing film roll, the defect data at least including the position, size and defect type of the defects of the polarizing film roll, the defect type at least including bubbles, foreign matter, bumps, deflections and scratches; a yield generation module, used to set slice parameters and slice methods based on the roll data and defect data, take the starting point of the polarizing film roll as the zero point cutting edge, simulate cutting according to the slice parameters and slice methods, calculate the simulated yield of the polarizing film roll and summarize it into a yield data table, the yield data table includes simulation time, management number, structure, yield, a first average number of defects per square meter and a second average number of defects per square meter of each defect type; a data upload module, used to upload the yield data table to a cloud storage system.

[0074] In this embodiment, the "obtaining the coil data and defect data of the polarizing film coil" specifically includes: controlling the automatic optical inspection system to inspect the polarizing film coil, and obtaining the coil data and defect data of the polarizing film coil from the automatic optical inspection system, and sending the defect data that exceeds the preset card control parameters to the inkjet printer; controlling the inkjet printer to inkjet mark the received defect data.

[0075] Embodiment 3 of the present invention provides a storage medium storing program instructions, which, when executed by a processor, implement the simulation method as described in Embodiment 1 and Embodiment 2 of the present invention.

[0076] Embodiment 4 of the present invention provides a terminal, including a processor and a memory, wherein the memory stores program instructions, and the processor executes the program instructions to implement the simulation method as described in Embodiment 1 and Embodiment 2 of the present invention.

[0077] The storage medium may be a tangible device that holds and stores instructions used by the instruction execution device. The storage medium may include, for example, but is not limited to, an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination of the above. More specific examples of readable storage media (a non-exhaustive list) include: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a static random access memory (SRAM), a portable compact disk read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanical encoding device, such as a punch card or a raised structure in a groove on which instructions are stored, and any suitable combination of the above.

[0078] It should be understood that although this specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each implementation mode may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

[0079] The series of detailed descriptions listed above are only specific descriptions of feasible implementation methods of the present invention. They are not intended to limit the scope of protection of the present invention. Any equivalent implementation methods or changes that do not deviate from the technical spirit of the present invention should be included in the scope of protection of the present invention.

Claims

1. A method for simulating the yield of a polarizing film roll, characterized in that: The following steps are involved: Acquire the coil data and defect data of the polarizing film coil, wherein the coil data at least includes the management number, structure and width of the polarizing film coil, and the defect data at least includes the position, size and defect type of the defect of the polarizing film coil, and the defect type at least includes bubbles, foreign matter, bumps, skew points and scratches; Based on the coil data and defect data, slice parameters and slice methods are set, the starting point of the polarizing film coil is used as the zero-point cutting edge, simulated cutting is performed according to the slice parameters and slice methods, and the simulated yield of the polarizing film coil is calculated and summarized into a yield data table, wherein the yield data table includes simulation time, management number, architecture, yield, first average defect number per square meter, and second average defect number per square meter of each defect type; The yield data table is uploaded to a cloud storage system.

2. The simulation method according to claim 1, characterized in that: The "obtaining the coil data and defect data of the polarizing film coil" specifically includes: controlling the automatic optical inspection system to inspect the polarizing film coil, and obtaining the coil data and defect data of the polarizing film coil from the automatic optical inspection system, and sending the defect data exceeding the preset card control parameters to the inkjet printer; controlling the inkjet printer to inkjet mark the received defect data.

3. The simulation method according to claim 1, characterized in that: The cloud storage system is a MES system.

4. The simulation method according to claim 1, characterized in that: The yield data table is transmitted to the MES system upload interface, and the MES system reads the interface data for uploading and displays the upload result.

5. A simulation device for the yield of polarizing film rolls, characterized in that: Includes the following modules: an information acquisition module, for acquiring coil data and defect data of the polarizing film coil, wherein the coil data at least includes the management number, structure and width of the polarizing film coil, and the defect data at least includes the position, size and defect type of the defect of the polarizing film coil, and the defect type at least includes bubbles, foreign matter, bumps, deflections and scratches; A yield generation module, used to set slice parameters and slice methods based on the coil data and defect data, take the starting point of the polarizing film coil as the zero-point cutting edge, perform simulated cutting according to the slice parameters and slice methods, calculate the simulated yield of the polarizing film coil and summarize it into a yield data table, wherein the yield data table includes simulation time, management number, architecture, yield, first average number of defects per square meter, and second average number of defects per square meter of each defect type; The data uploading module is used to upload the yield data table to the cloud storage system.

6. The simulation device according to claim 5, characterized in that: The "obtaining the coil data and defect data of the polarizing film coil" specifically includes: controlling the automatic optical inspection system to inspect the polarizing film coil, and obtaining the coil data and defect data of the polarizing film coil from the automatic optical inspection system, and sending the defect data exceeding the preset card control parameters to the inkjet printer; controlling the inkjet printer to inkjet mark the received defect data.

7. The simulation device according to claim 5, characterized in that: The cloud storage system is a MES system.

8. The simulation device according to claim 5, characterized in that: The yield data table is transmitted to the MES system upload interface, and the MES system reads the interface data for upload and displays the upload result.

9. A storage medium storing program instructions, characterized in that: When the program instructions are executed by a processor, the simulation method according to any one of claims 1 to 4 is implemented.

10. A terminal, characterized in that: The method comprises a processor and a memory, wherein the memory stores program instructions, and the processor executes the program instructions to implement the simulation method according to any one of claims 1 to 4.

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