Function batch inspection method, system and equipment for voltage sag protector
Through the combination of the automated robot arm and the slump simulation module, the problem of insufficient inspection accuracy of batch voltage slump protectors is solved, and an efficient and accurate inspection process is achieved, which improves the inspection efficiency and product quality accuracy.
Patent Information
- Application Number
- CN202411791269.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-06
- Publication Date
- 2025-03-11
AI Technical Summary
The test accuracy of the batch voltage drop protector is insufficient during the inspection process, which makes it difficult to accurately describe the product's retention ability, and lacks effective intelligent system management methods, wastes a lot of manpower and material resources, and cannot accurately measure quality.
By providing the functional batch inspection methods, systems and equipment of the voltage drop protector, the batch transfer operation of the automated robot arm, the precise control of the drop simulation module and the data integration analysis of the production management module can be realized.
It improves inspection efficiency and testing accuracy, ensures that the test results of batch voltage drop protectors are accurate and reliable, reduces waste of manpower and material resources, and achieves accurate measurement of product quality.
Smart Images
Figure CN119596035A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of power systems, and in particular to a method, system and equipment for batch testing the functions of voltage sag protectors. Background Art
[0002] There are a large number of contactor control occasions in various control occasions of industrial enterprises, especially various types of motor and water pump control, most of which are controlled by AC contactors. However, the contactor control occasions will be affected by the coil. When the voltage at both ends of the coil sags or drops, the coil will not be able to maintain the continuous attraction of the contactor contacts, causing the contacts to bounce or directly lose power. This is because during the voltage sag or drop, the contact coil will cause insufficient electromagnetic attraction power and cannot maintain contact retention. For this type of problem, industrial sites often use anti-sway modules or voltage sag protectors to connect to the contactor coil control circuit. When the voltage sags or drops, the contactor coil is powered by the internal power supply circuit of the anti-sway module or voltage sag protector, thereby maintaining the attraction power of the contactor coil and ensuring that the contacts remain in normal contact.
[0003] However, due to the extremely wide range of industrial control occasions, a large number of occasions require the configuration of anti-sway modules or voltage sag protectors. Therefore, industrial enterprises that mass-produce anti-sway modules or voltage sag protectors need to test the retention capacity of such products in large quantities to complete factory inspection. If we rely solely on manual labor to manually adjust the output voltage of an adjustable transformer to simulate a voltage sag, on the one hand, there will be large errors in the speed and depth of the sag, and the number of cycles is difficult to accurately control, making it difficult to accurately describe the retention capacity of the product. On the other hand, there is a lack of effective intelligent system management methods, which wastes a lot of manpower and material resources, and the quality cannot be accurately measured. Summary of the invention
[0004] The present application provides a method, system and equipment for batch testing of the functions of voltage sag protectors, which solves the technical problem of insufficient test accuracy during batch testing of voltage sag protectors.
[0005] In view of the above problems, the present application provides a method, system and equipment for batch testing the functions of voltage sag protectors.
[0006] In a first aspect of the present application, a method for batch testing the functions of a voltage sag protector is provided, the method comprising:
[0007] After starting the first functional robotic arm to clamp and transfer the batch of equipment to be inspected to the information entry area, run the input device to scan the batch of equipment to be inspected to obtain batch equipment information, wherein the batch of equipment to be inspected is a plurality of voltage sag protectors; construct a mapping relationship between the batch equipment information and the batch of equipment to be inspected, obtain an information set of the equipment to be inspected, and store the information set of the equipment to be inspected in the production management module; run the second functional robotic arm to transfer the batch of equipment to be inspected to the peripheral wiring area, and connect it to the electrical connection unit of the peripheral wiring; perform functional testing of the batch of equipment to be inspected through the sag simulation circuit of the sag simulation module, and use the electrical connection unit to perform real-time monitoring of the test conditions to obtain real-time status data; the production management module generates a batch inspection report based on the real-time status data and the information set of the equipment to be inspected.
[0008] A second aspect of the present application provides a function batch inspection system for voltage sag protectors, the system comprising:
[0009] A production management module, the production management module includes an input device, an output device, a first communication interface and a third-party data docking interface; a temporary drop simulation module, the temporary drop simulation module includes an HMI interface, a controller, and a temporary drop simulation circuit; a peripheral wiring, the peripheral wiring includes an electrical connection unit and a second communication interface, wherein the peripheral wiring and the production management module realize data upload through the second communication interface and the first communication interface.
[0010] According to a third aspect of the present application, an electronic device is provided, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:
[0011] After starting the first functional robotic arm to clamp and transfer the batch of equipment to be inspected to the information entry area, run the input device to scan the batch of equipment to be inspected to obtain batch equipment information, wherein the batch of equipment to be inspected is a plurality of voltage sag protectors; construct a mapping relationship between the batch equipment information and the batch of equipment to be inspected, obtain an information set of the equipment to be inspected, and store the information set of the equipment to be inspected in the production management module; run the second functional robotic arm to transfer the batch of equipment to be inspected to the peripheral wiring area, and connect it to the electrical connection unit of the peripheral wiring; perform functional testing of the batch of equipment to be inspected through the sag simulation circuit of the sag simulation module, and use the electrical connection unit to perform real-time monitoring of the test conditions to obtain real-time status data; the production management module generates a batch inspection report based on the real-time status data and the information set of the equipment to be inspected.
[0012] One or more technical solutions provided in this application have at least the following technical effects or advantages:
[0013] First, after starting the first functional mechanical arm to clamp and transfer the batch of equipment to be inspected to the information input area, the input device is run to scan the batch of equipment to be inspected to obtain the batch equipment information, wherein the batch of equipment to be inspected is a plurality of voltage sag protectors; then, the mapping relationship between the batch equipment information and the batch of equipment to be inspected is constructed to obtain the information set of the equipment to be inspected, and the information set of the equipment to be inspected is stored in the production management module; further, the second functional mechanical arm is run to transfer the batch of equipment to be inspected to the peripheral wiring area, connected to the electrical connection unit of the peripheral wiring, and then the functional test of the batch of equipment to be inspected is performed through the sag simulation circuit of the sag simulation module, and the electrical connection unit is used to monitor the test conditions in real time to obtain real-time status data; finally, the production management module generates a batch inspection report based on the real-time status data and the information set of the equipment to be inspected. The technical problem of insufficient test accuracy during the inspection of batch voltage sag protectors is solved, and the technical effect of improving inspection efficiency and test accuracy is achieved through the batch transfer operation of the automated mechanical arm, the precise control of the sag simulation module and the data integration and analysis of the production management module. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0015] Figure 1 A schematic diagram of a flow chart of a method for batch testing the functions of a voltage sag protector provided in an embodiment of the present application;
[0016] Figure 2 A schematic diagram of the structure of a functional batch inspection system for voltage sag protectors provided in an embodiment of the present application.
[0017] Explanation of the reference numerals: production management module 11, temporary drop simulation module 12, peripheral wiring 13. DETAILED DESCRIPTION
[0018] The present application solves the technical problem of insufficient testing accuracy during the inspection of batch voltage sag protectors by providing a method, system and equipment for batch inspection of the functions of voltage sag protectors.
[0019] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.
[0020] It should be noted that the terms "including" and "having" are intended to cover non-exclusive inclusions. For example, a process, method, system, product or server that includes a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or modules that are not explicitly listed or are inherent to these processes, methods, products or devices.
[0021] Embodiment 1, as Figure 1 As shown, the present application provides a method for batch testing the functions of a voltage sag protector, wherein the method comprises:
[0022] After starting the first functional robot arm to clamp and transfer the batch of equipment to be inspected to the information entry area, the input device is operated to scan the batch of equipment to be inspected to obtain batch equipment information, wherein the batch of equipment to be inspected is a plurality of voltage sag protectors.
[0023] In one embodiment, after the first functional mechanical arm is activated, a batch of devices to be inspected (multiple voltage sag protectors) are clamped from the designated storage location and moved to the information entry area; in this area, the system terminal uses an input device (such as a barcode scanner or other information collection tool) to scan these devices to be inspected one by one, and automatically obtains relevant information of the device by scanning the QR code or barcode on the device. This information includes the factory number, hardware version number, software version number, manufacturer, production date and other basic data of the device, so as to prepare data for subsequent testing and management operations. In this process, the goal of batch operation is to improve the efficiency of data entry and ensure the accuracy and completeness of information entry.
[0024] Further, after the first functional robot arm is started to clamp and transfer the batch of devices to be inspected to the information input area, the input device is operated to scan the batch of devices to be inspected to obtain the batch of device information, including:
[0025] Interactively obtain a first path planning space of the first functional robot arm; locate the information entry area according to the path planning space; configure the input device of the production management module 11 in the information entry area; generate a clamping movement trajectory according to the first position of the batch of equipment to be inspected and the information entry area; control the first functional robot arm to clamp and transfer the batch of equipment to be inspected to the information entry area with the clamping movement trajectory as a constraint; run the automatic scanning program of the input device to scan the batch of equipment to be inspected to obtain the batch equipment information.
[0026] Preferably, the system terminal communicates with the control module of the first functional robot arm to obtain the path planning space parameters of the robot arm. The path planning space defines all possible positions and trajectories within the operating range of the robot arm, including the initial position, the end position, etc. These parameters are used to guide the subsequent operation of the robot arm to ensure its safe operation in a confined space; then, in combination with the path planning space parameters of the robot arm and the preset task requirements, the specific position of the information entry area is determined. This position is usually within the reachable area of the robot arm and matches the scanning range of the input device to ensure that the information entry can be completed smoothly after the device is placed; after determining the information entry area, the system terminal installs or adjusts the input device (such as a barcode scanner) of the production management module 11 to a suitable angle and position according to the position of the area. After the configuration is completed, the input device can quickly and accurately scan the equipment to be inspected placed in the information entry area; After that, the system terminal obtains the initial storage position (first position) of the batch of equipment to be inspected, and generates the clamping movement trajectory of the manipulator through the path planning algorithm in combination with the position of the information entry area. The generation of the trajectory needs to take into account the weight and shape of the equipment to ensure stable clamping during movement, while optimizing the path length and reducing the transfer time; then, the system terminal sends a control signal to the manipulator according to the generated clamping movement trajectory, so that it completes the clamping action according to the trajectory, and the manipulator accurately clamps the equipment and moves it to the information entry area along the planned path. During this process, the system terminal monitors the state of the manipulator in real time to ensure that the equipment arrives at the designated position safely; after the equipment to be inspected arrives at the information entry area, the system terminal starts the automatic scanning program of the input device, scans the QR code or other identification information on the equipment one by one, and extracts the batch information of the equipment, including the equipment number, hardware and software version number, production date, etc. This information will be transmitted to the production management module 11 for recording and processing. Through the above process, the operation accuracy of the first function manipulator and the accurate entry of equipment information can be ensured, and the efficiency of batch operation can be significantly improved.
[0027] A mapping relationship between the batch equipment information and the batch equipment to be inspected is constructed to obtain an information set of the equipment to be inspected, and the information set of the equipment to be inspected is stored in the production management module 11 .
[0028] In one embodiment, the system terminal matches the obtained batch equipment information with the corresponding batch equipment to be inspected, and constructs a unique mapping relationship between the equipment information and the equipment to ensure that each piece of information accurately corresponds to a specific equipment to be inspected; after completing the mapping relationship, the system terminal stores the generated equipment information set to be inspected in the production management module 11 to form a complete batch data record for subsequent functional testing and result analysis.
[0029] The second functional robot arm is operated to transfer the batch of devices to be inspected into the peripheral wiring 13 area, and connect them to the electrical connection unit of the peripheral wiring 13.
[0030] In one embodiment, the system terminal starts the second functional robotic arm, grabs the batch of devices to be inspected through the clamping device, and moves them from the information entry area to the peripheral wiring area 13; in the peripheral wiring area 13, the second functional robotic arm accurately places the batch of devices to be inspected at the specified position, so that it can automatically dock with the preset peripheral wiring 13 electrical connection unit, and the electrical connection unit is matched with the interface of the device to be inspected, ensuring that the device to be inspected can be stably connected to the test circuit, providing a reliable electrical connection for subsequent functional testing.
[0031] Further, operating the second functional robot arm to transfer the batch of devices to be inspected to the peripheral wiring 13 area and connect them to the electrical connection unit of the peripheral wiring 13 includes:
[0032] Interactively obtain the second path planning space of the second functional robotic arm; select the peripheral wiring area 13 with the second path planning space and the first information input area as constraints; after handing over the first functional robotic arm and the second functional robotic arm, operate the second functional robotic arm to transfer the batch of equipment to be inspected to the peripheral wiring area 13; operate the second functional robotic arm to connect the batch of equipment to be inspected with the electrical connection unit.
[0033] Optionally, the system terminal establishes a communication connection with the second functional robotic arm through the same interactive method, obtains the path planning space of the second functional robotic arm, and determines its motion range and reachable area; then, based on the second path planning space and the position constraints of the first information entry area, the specific position and size of the peripheral wiring area 13 are determined, that is, the first information entry area and other functional areas are eliminated from the second path planning space; after the first functional robotic arm completes the task of the information entry area, it accurately places the batch of equipment to be inspected in the handover area, and the system terminal coordinates the handover actions of the first functional robotic arm and the second functional robotic arm to ensure the smooth transfer of the equipment to be inspected and avoid the subsequent operation being affected by the falling or placement displacement of the equipment to be inspected; after the second functional robotic arm receives the equipment to be inspected, it clamps and moves the batch of equipment to be inspected from the handover area to the peripheral wiring area 13 according to the planned movement trajectory, ensuring that the equipment runs smoothly along the set path to avoid collision or displacement; in the peripheral wiring area 13, the second functional robotic arm accurately places the equipment at the docking position of the electrical connection unit, and automatically controls the system terminal to complete the stable connection between the equipment interface and the electrical connection unit to ensure the electrical reliability of subsequent tests.
[0034] The functional test of the batch of equipment to be inspected is carried out through the temporary sag simulation circuit of the temporary sag simulation module 12, and the electrical connection unit is used to monitor the test conditions in real time to obtain real-time status data.
[0035] In one embodiment, the system terminal starts the sag simulation module 12 and uses its internal sag simulation circuit to perform functional tests on batches of equipment to be inspected. The sag simulation circuit generates a voltage sag simulation signal according to preset parameters (such as sag drop depth, duration before sag, etc.) and applies it to the connected equipment to be inspected. During the test, the electrical connection unit monitors the working status of the equipment (such as voltage input, holding capacity, etc.) in real time and collects key operating data. The system terminal transmits these real-time status data to the production management module 11 for analyzing the performance of the equipment and determining whether it meets the functional requirements.
[0036] Furthermore, the functional test of the batch of devices to be inspected is performed by the sag simulation circuit of the sag simulation module 12, including:
[0037] Interactively obtain sag simulation parameters, wherein the sag simulation parameters include pre-sag holding time, sag falling time, low-value voltage holding time, sag drop depth, post-sag rising time, post-sag holding time and number of repeated cycles; load the sag simulation parameters to the controller of the sag simulation module 12 through the HMI interface of the sag simulation module 12; the controller calculates the output voltage instruction according to the sag simulation parameters; after calculating the error value according to the voltage instruction and the actual output voltage of the sag simulation circuit, the error value is processed by the PI adjustment unit to generate a control signal; the control signal after the limiter processing is multiplied by a unit sine wave to obtain a modulation signal; by comparing the modulation signal with a triangle wave, a plurality of PWM signals are generated; the sag simulation circuit receives and generates a plurality of sag voltage waveforms according to the plurality of PWM signals to perform cyclic testing on the batch of equipment to be inspected.
[0038] Preferably, the system terminal interacts with the sag simulation module 12 to obtain sag simulation parameters, including the pre-sag maintenance time (t0), the sag decline time (t1), the low-value voltage maintenance time (t2), the sag drop depth (Xe%), the post-sag rise time (t3), the maintenance time after the sag recovery (t4), and the number of repeated cycles, wherein the pre-sag maintenance time is the time before the voltage sag begins, the time to maintain the rated voltage state, to avoid the voltage mutation directly affecting the test equipment, the sag decline time is the time required for the voltage to drop from the rated voltage to the set low voltage, determines the rate of change of the voltage from the rated value to the minimum value, and affects the response time of the test equipment, and the low-value voltage maintenance time is the time to maintain the set voltage after the voltage sag. The time of low voltage value is used to simulate the possible impact on the equipment during the voltage sag. The sag drop depth is the percentage of the voltage drop from the rated voltage Ue, which determines the severity of the voltage sag. The rise time after the sag is the time for the voltage to recover from the low voltage to the rated voltage, which affects the rate of the voltage recovery process. The maintenance time after the sag recovery is the time for the voltage to remain in the rated voltage state after it recovers to the rated value, ensuring that the equipment can stabilize in the voltage state after recovery. The number of repetition cycles is the number of repetitions of the entire voltage sag and recovery process, that is, the number of cycles from t2 to t4, which is used to output multiple PWM signals; then, these sag simulation parameters are loaded into the controller through the HMI interface of the sag simulation module 12. After receiving the parameters, the controller parses These information are used to prepare the corresponding control signal. In this process, the system terminal will perform the calculation of the voltage command (Uref) at different stages at different times through the controller according to these temporary sag simulation parameters. After calculating Uref, the system terminal compares Uref with the real-time voltage value at both ends of the output port through the controller, and obtains the error value through the difference calculation. The error value of this command is adjusted by the PI adjustment unit and then limited. After limiting to the Limiter value, the control signal is obtained. Among them, the PI adjustment unit includes control parameters Kp and Ki, and a boundary coefficient Kset. Kp is the proportional gain, which is used to control the speed of response and determine the relationship between the controller output and the current error. When the error is large, K p generates a larger output control signal, thereby quickly reducing the error. Ki is the integral gain, which is used to eliminate long-term static errors. It can compensate for continuous small errors caused by delays or other factors, and gradually correct the voltage deviation by accumulating errors until the error is completely eliminated. Kset is used to adjust the value of Kp during voltage drop or recovery to smooth the voltage change and avoid excessive fluctuations. During the adjustment process of the PI adjustment unit, the PI adjustment unit dynamically adjusts the value of Kp according to the voltage change process. Specifically, when the voltage drops or recovers from the rated value, if it is in the stage from 0 (the starting time of voltage drop or recovery) to Kset×t (t1 is the drop stage, t3 is the recovery stage), the set Kp parameter is used for adjustment.When it is in the stage from Kset×t (t1 or t3) to t end, Kp will be adjusted to Kp×Kset. This adjustment ensures a smooth transition of the voltage change process and avoids excessive fluctuations. After that, the control signal is multiplied by the unit sine wave sin(wt) to generate a modulation signal, where t is time and w is 2*π*50, which is the power frequency angular frequency. Then, this modulation signal is compared with the triangle wave to generate multiple PWM signals, which correspond to different stages in the voltage sag and recovery process. After obtaining the PWM signal, the sag simulation circuit receives the PWM signal and converts the PWM signal into an actual sag voltage waveform through the IGBT inverter bridge and the filter (composed of inductors, capacitors and resistors). The waveform accurately simulates the sag drop, maintenance and recovery process. Finally, the sag simulation circuit repeatedly generates the sag voltage waveform according to the set number of cycles and applies it to the batch of equipment to be inspected. During the test, the electrical connection unit will monitor the working status of the equipment in real time and collect data to ensure that the equipment performance meets the requirements. ;
[0039] Furthermore, the controller calculates the output voltage instruction according to the sag simulation parameter, including:
[0040] Generate a rated instruction, wherein the rated instruction is an instruction when the voltage is the rated voltage, and the rated instruction is: Uref1=Ue; wherein Uref1 is the rated instruction, and Ue is the rated voltage; generate a voltage drop instruction, wherein the voltage drop instruction is an instruction when the voltage drops from the rated voltage to the sag drop depth, and the voltage drop instruction is: Wherein, Uref2 is the voltage drop instruction, Xe% is the sag drop depth, t1 is the sag drop time, fs is the inherent control frequency of the controller, kstep is the drop step length, kstep increases from 0 to t1×fs; generate a drop stability instruction, wherein the drop stability instruction is the instruction when the voltage drops to the sag drop depth, and the drop stability instruction is: Uref3=Ue-(Xe%×Ue); wherein Uref3 is the drop stability instruction; generate a voltage recovery instruction, wherein the voltage recovery instruction is the instruction when the voltage recovers from the low value voltage to the rated voltage, and the voltage recovery instruction is: Among them, Uref4 is the voltage recovery instruction, t3 is the rise time after the temporary sag, and kstep increases from 0 to t3×fs; the rated instruction, voltage drop instruction, drop stability instruction and voltage recovery instruction constitute the voltage instruction.
[0041] Optionally, the controller calculates the command voltage (Uref) based on the sag simulation parameters; in the rated voltage stage, that is, when t is t0, the rated command is calculated by Uref1=Ue, where Uref1 is the rated command and Ue is the rated voltage; in the sag reduction stage, that is, when t is t1, Calculate the voltage drop command. This voltage drop command is the command when the voltage drops from the rated voltage to the sag depth, where Uref2 is the voltage drop command, Xe% is the sag depth, t1 is the sag drop time, and kstep is the drop step length. It is used to describe the calculation variable of the sag or recovery stage. It defines the change of the command voltage in each time step. Its value range is 0 to t1*fs, and the step length is 1 and gradually increases. 0 represents the starting time of the drop, and fs is the inherent control frequency of the controller. In the sag maintenance stage, that is, when t is t2, the sag stabilization command will be calculated by Uref3=Ue-(Xe%×Ue). This sag stabilization command is the command when the voltage drops to the sag depth, where Uref3 is the sag stabilization command. In the recovery stage, that is, when t is t3, it will be calculated by Calculate the voltage recovery instruction, which is the instruction for the voltage to recover from the low voltage to the rated voltage, where Uref4 is the voltage recovery instruction, the value range of kstep is 0 to t3*fs, and the step size is 1 and gradually increases, 0 represents the start time of recovery, t3 is the rise time after the sag; after obtaining the rated instruction, voltage drop instruction, drop stabilization instruction and voltage recovery instruction, the system terminal adds these instructions to the voltage instruction in sequence for subsequent PI adjustment unit processing and triangle wave comparison to generate multiple PWM signals to ensure that the equipment performance meets the requirements.
[0042] Furthermore, the electrical connection unit is used to perform real-time monitoring of the test condition to obtain real-time status data, including:
[0043] During the cyclic testing process of the sag simulation circuit loading the multiple sag voltage waveforms into the first voltage sag protector, the first voltage sag protector is monitored through the electrical connection unit to obtain first physical state data; the electrical connection unit synchronizes the first physical state data to the production management module 11 through the second communication interface; and so on, the multiple voltage sag protectors in the batch of equipment to be inspected are monitored through the electrical connection unit to obtain multiple physical state data; the multiple physical state data constitute the real-time state data.
[0044] Optionally, after the sag simulation circuit generates multiple sag voltage waveforms, the system terminal loads these waveforms into the first voltage sag protector for testing, and each sag voltage waveform is simulated according to preset parameters such as sag depth, maintenance time and recovery time to test the sag holding function of the protector; during the test, the electrical connection unit monitors the working state of the first voltage sag protector in real time, including input voltage, sag holding state, recovery time and other related parameters, and these monitoring data constitute first physical state data, which is used to evaluate whether the protector meets the predetermined performance standard; then, the electrical connection unit synchronizes the first physical state data to the production management module 11 through the second communication interface, so that All test data are transmitted and recorded in real time to facilitate subsequent data processing and analysis; after the first voltage sag protector is tested, the sag simulation circuit loads the same sag waveform to the next voltage sag protector in the batch of equipment to be inspected, and continues to perform the same test process. The electrical connection unit will continue to monitor the other multiple voltage sag protectors in the batch of equipment to be inspected to obtain their physical status data. The test data of all devices constitute multiple physical status data and are finally summarized into real-time status data. This real-time status data will be stored in the production management module 11 to facilitate subsequent analysis and provide an important basis for evaluating whether the performance of the product meets the standards and generating a test report.
[0045] Furthermore, the electrical connection unit synchronizes the first physical state data to the production management module 11 through the second communication interface, including:
[0046] The multiple voltage sag protectors detect their own states and generate multiple digital input detection signals; the multiple voltage sag protectors transmit the multiple digital input detection signals to the production management module 11.
[0047] Optionally, each voltage sag protector will monitor its own working status during the test, such as input voltage, sag holding status, recovery time, etc. Based on these monitoring results, each voltage sag protector will generate corresponding open-input detection signals. These signals reflect the response of the protector in different sag scenarios and whether it maintains normal working status. The open-input detection signal is usually used to indicate the change of the device status, such as whether the device successfully keeps the circuit closed during the voltage sag process, and whether it recovers to the rated voltage normally during the recovery phase. The voltage sag protector will generate this open-input signal according to these state changes; the open-input detection signals of all voltage sag protectors will be transmitted to the production management module 11 through the communication interface. This module receives and stores these signals for subsequent status evaluation, quality analysis and report generation. The production management module 11 can compare these signals with the test requirements, evaluate the performance of the equipment to be tested in the sag scenario, and determine whether the function of each equipment to be tested is normal and meets the set standards.
[0048] The production management module 11 generates a batch inspection report according to the real-time status data and the information set of the equipment to be inspected.
[0049] In one embodiment, the production management module 11 integrates the real-time status data of all batches of equipment to be inspected with the equipment information set obtained previously, and the real-time status data of each equipment to be inspected corresponds to its related basic information to form a complete data record; then, based on the integrated data, the production management module 11 analyzes the performance of each voltage sag protector during the test, including whether the voltage is successfully maintained, whether it can return to normal after the voltage sag is restored, etc. By comparing the test requirements, the system terminal determines whether the performance of each device is qualified; finally, the production management module 11 generates a batch inspection report containing detailed information such as the status of each device, test results, and whether it is qualified or not. The report includes abnormal equipment markings and other content to help subsequent quality control, problem tracking and product improvement; the generated inspection report will be stored in the production management module 11, and can be printed or exported as an electronic document as needed, or the inspection report can be displayed in a visual manner on the screen (such as a display, monitor, etc.) for subsequent reference.
[0050] Furthermore, the production management module 11 generates a batch inspection report according to the real-time status data and the information set of the equipment to be inspected, and the method includes:
[0051] The production management module 11 generates multiple device states of the multiple voltage sag protectors by comparing and verifying the multiple binary input detection signals and the multiple physical state data; associates and stores the multiple device states and the information set of the equipment to be inspected, and generates the batch inspection report.
[0052] Optionally, after receiving the binary input detection signals and physical status data of multiple voltage sag protectors, the production management module 11 starts to compare and verify. The production management module 11 compares the binary input detection signal of each voltage sag protector with the corresponding physical status data to determine whether the device responds normally to the voltage sag test (for example, whether the circuit is kept closed during the voltage sag, and whether it is restored to normal voltage). If the binary input detection signal is consistent with the physical status data, that is, the lighting state of the bulb corresponding to the physical status data is always on, and the binary input detection signal is always open, it indicates that the device functions normally. If the binary input detection signal is inconsistent with the physical status data, that is, the lighting state of the bulb corresponding to the physical status data is flickering, and the binary input detection signal is unstable, it indicates that there may be a fault or abnormal performance. Subsequently, Based on the comparison results, the production management module 11 generates a corresponding device status for each voltage sag protector. These device statuses identify the working status of each device, including whether it has passed the functional test, whether it meets the standards, etc. The device status can be divided into categories such as qualified, unqualified or waiting for maintenance; then, the production management module 11 associates the status of each device with its corresponding device information set, and stores the associated data. In this way, it can ensure that the test results of each device match its basic information, which is convenient for subsequent tracking, query and problem solving; finally, the system terminal integrates the status information and device information sets of all devices into a batch test report, which contains the test results, status analysis and qualification status of each device. This information will help evaluate product quality, discover potential problems, and take corresponding measures.
[0053] In summary, the embodiments of the present application have at least the following technical effects:
[0054] First, after starting the first functional mechanical arm to clamp and transfer the batch of equipment to be inspected to the information input area, the input device is run to scan the batch of equipment to be inspected to obtain the batch equipment information, wherein the batch of equipment to be inspected is a plurality of voltage sag protectors; then, a mapping relationship between the batch equipment information and the batch of equipment to be inspected is constructed to obtain the equipment information set to be inspected, and the equipment information set to be inspected is stored in the production management module 11; further, the second functional mechanical arm is run to transfer the batch of equipment to be inspected to the peripheral wiring 13 area, and connected to the electrical connection unit of the peripheral wiring 13, and then the functional test of the batch of equipment to be inspected is performed through the sag simulation circuit of the sag simulation module 12, and the electrical connection unit is used to monitor the test conditions in real time to obtain real-time status data; finally, the production management module 11 generates a batch inspection report according to the real-time status data and the equipment information set to be inspected. The technical problem of insufficient test accuracy during the inspection of batch voltage sag protectors is solved, and the technical effect of improving inspection efficiency and test accuracy is achieved through the batch transfer operation of the automated mechanical arm, the precise control of the sag simulation module 12 and the data integration analysis of the production management module 11.
[0055] Embodiment 2 is based on the same inventive concept as the function batch inspection method of the voltage sag protector in the above embodiment. Figure 2 As shown, the present application provides a function batch inspection system for voltage sag protectors, wherein the system comprises:
[0056] A production management module 11, wherein the production management module 11 includes an input device, an output device, a first communication interface and a third-party data docking interface; a temporary drop simulation module 12, wherein the temporary drop simulation module 12 includes an HMI interface, a controller, and a temporary drop simulation circuit; a peripheral wiring 13, wherein the peripheral wiring 13 includes an electrical connection unit and a second communication interface, wherein the peripheral wiring 13 and the production management module 11 realize data upload through the second communication interface and the first communication interface.
[0057] In one embodiment, the production management module 11 is the core part of the entire system, responsible for managing and coordinating the work of each module. The production management module 11 includes an input device, an output device, a first communication interface and a third-party data docking interface, wherein the input device is used for users to input data and control instructions, such as a keyboard, a barcode scanner, etc., to help enter equipment information or operation instructions, and the output device is used to display data and reports, usually including a display, a printer, etc., to display test results, equipment status or other related information. The first communication interface is used to exchange data with other devices or modules, such as a sag simulation module 12, a peripheral wiring 13, etc., to achieve real-time transmission of information, and the third-party data docking interface is used to connect data with an external system, and the test results or equipment information can be uploaded to a cloud platform or other third-party system for further analysis and storage; the sag simulation module 12 is used to generate a voltage sag test signal, and is mainly composed of an HMI interface, a controller, and a sag simulation circuit, wherein the HMI interface is a human-machine interface for operators to interact with the system, set test parameters, start the test process, etc. The controller can control the entire test process according to the set parameters, including generating a voltage sag signal, controlling the simulation circuit, etc. The sag simulation circuit generates a real voltage sag waveform through the simulation circuit, applies it to the device to be tested, and simulates voltage fluctuations to test the response capability of the device; the peripheral wiring 13 refers to the part that connects the test device with other modules of the system, including an electrical connection unit and a second communication interface, wherein the electrical connection unit is responsible for connecting the voltage signal output by the sag simulation module 12 to the device to be tested to ensure stable electrical connection and reliable test process, and the second communication interface is used to connect the electrical connection unit to the production management module 11 to ensure that the data during the test process can be uploaded to the production management module 11 in real time for processing and storage; the production management module 11 and the peripheral wiring 13 realize data upload and transmission through the first communication interface and the second communication interface, which enables the data generated during the test process, such as equipment status, physical parameters, etc., to be transmitted to the production management module 11 in a timely manner for analysis, recording and report generation, and can also be connected to other systems for data for more comprehensive management.
[0058] Embodiment 3, based on the same inventive concept as the functional batch inspection method of the voltage sag protector in the aforementioned embodiment 1, the present application provides an electronic device, which may be a server, comprising a processor, a memory and a network interface connected via a system bus, wherein the processor of the electronic device is used to provide computing and control capabilities, the memory of the electronic device comprises a non-volatile storage medium and an internal memory, the non-volatile storage medium stores an operating system, a computer program and a database, the internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium, the database of the electronic device is used to store data, the network interface of the electronic device is used to communicate with an external terminal via a network connection, and the computer program is executed by the processor to implement the functional batch inspection method of the voltage sag protector.
[0059] It should be noted that the above-mentioned sequence of the embodiments of the present application is only for description and does not represent the advantages and disadvantages of the embodiments. And the above-mentioned specific embodiments of this specification are described. The processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
[0060] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application shall be included in the protection scope of the present application.
[0061] This specification and drawings are merely exemplary illustrations of the present application and are deemed to cover any and all modifications, variations, combinations or equivalents within the scope of the present application. Obviously, a person skilled in the art may make various modifications and variations to the present application without departing from the scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the present application and its equivalents, the present application intends to include these modifications and variations.
Claims
1. A method for batch testing the function of a voltage sag protector, characterized in that: The method comprises: After starting the first functional mechanical arm to clamp and transfer the batch of devices to be inspected to the information input area, the input device is operated to scan the batch of devices to be inspected to obtain batch device information, wherein the batch of devices to be inspected are multiple voltage sag protectors; Constructing a mapping relationship between the batch equipment information and the batch equipment to be inspected, obtaining an equipment information set to be inspected, and storing the equipment information set to be inspected in a production management module; Running the second functional robot arm to transfer the batch of devices to be inspected to the peripheral wiring area and connect them to the electrical connection unit of the peripheral wiring; Performing functional tests on the batch of equipment to be inspected by using the sag simulation circuit of the sag simulation module, and using the electrical connection unit to perform real-time monitoring of the test conditions to obtain real-time status data; The production management module generates a batch inspection report according to the real-time status data and the information set of the equipment to be inspected.
2. The function batch inspection method of the voltage sag protector according to claim 1 is characterized in that: After the first functional mechanical arm is started to clamp and transfer the batch of devices to be inspected to the information input area, the input device is operated to scan the batch of devices to be inspected to obtain batch device information, including: Interactively obtaining a first path planning space of the first functional robotic arm; spatially locating the information entry area according to the path planning; Configuring the input device of the production management module in the information input area; Generate a clamping movement trajectory according to the first position of the batch of devices to be inspected and the information entry area; Using the clamping movement trajectory as a constraint, controlling the first functional robot arm to clamp and transfer the batch of devices to be inspected to the information entry area; The automatic scanning program of the input device is run to scan the batch of devices to be inspected to obtain the batch device information.
3. The function batch inspection method of the voltage sag protector according to claim 1 is characterized in that: The functional test of the batch of devices to be inspected is performed by using the sag simulation circuit of the sag simulation module, including: Interactively obtain sag simulation parameters, wherein the sag simulation parameters include the pre-sag holding time, sag falling time, low-value voltage holding time, sag drop depth, post-sag rising time, sag recovery holding time, and number of repetition cycles; Loading the sag simulation parameters into the controller of the sag simulation module through the HMI interface of the sag simulation module; The controller calculates an output voltage instruction according to the sag simulation parameter; After calculating the error value according to the voltage command and the actual output voltage of the sag simulation circuit, the error value is processed by a PI adjustment unit to generate a control signal; Multiplying the control signal after the amplitude limiting process by the amplitude limiter with a unit sine wave to obtain a modulation signal; generating a plurality of PWM signals by comparing the modulation signal with a triangular wave; The sag simulation circuit receives and generates a plurality of sag voltage waveforms according to the plurality of PWM signals to perform a cyclic test on the batch of devices to be inspected.
4. The function batch inspection method of the voltage sag protector according to claim 3 is characterized in that: The controller calculates the output voltage instruction according to the sag simulation parameter, including: Generate a rated instruction, wherein the rated instruction is an instruction when the voltage is the rated voltage, and the rated instruction is: Uref1=Ue; Among them, Uref1 is the rated instruction, and Ue is the rated voltage; Generate a voltage drop instruction, wherein the voltage drop instruction is an instruction when the voltage drops from the rated voltage to the sag depth, and the voltage drop instruction is: Wherein, Uref2 is the voltage drop instruction, Xe% is the sag depth, t1 is the sag time, fs is the inherent control frequency of the controller, kstep is the drop step length, and kstep increases from 0 to t1×fs; Generate a drop stabilization instruction, wherein the drop stabilization instruction is an instruction when the voltage drops to the temporary drop depth, and the drop stabilization instruction is: Uref3 = Ue - (Xe% × Ue); Among them, Uref3 is the fall stability instruction; Generate a voltage recovery instruction, wherein the voltage recovery instruction is an instruction for recovering the voltage from the low voltage to the rated voltage, and the voltage recovery instruction is: Among them, Uref4 is the voltage recovery command, t3 is the rise time after the temporary sag, and kstep increases from 0 to t3×fs; The rated instruction, voltage drop instruction, drop stabilization instruction and voltage recovery instruction constitute the voltage instruction.
5. The function batch inspection method of the voltage sag protector according to claim 3, characterized in that: The electrical connection unit is used to perform real-time monitoring of the test conditions to obtain real-time status data, including: The sag simulation circuit loads the multiple sag voltage waveforms to the first voltage sag protector for a cyclic test, and monitors the first voltage sag protector through the electrical connection unit to obtain first physical state data; The electrical connection unit synchronizes the first physical state data to the production management module via a second communication interface; By analogy, a plurality of voltage sag protectors in the batch of equipment to be inspected are monitored through the electrical connection unit to obtain a plurality of physical status data; The plurality of physical status data constitute the real-time status data.
6. The method for batch testing the function of the voltage sag protector according to claim 5, characterized in that: The electrical connection unit synchronizes the first physical state data to the production management module through the second communication interface, including: The multiple voltage sag protectors detect their own states and generate multiple binary input detection signals; The multiple voltage sag protectors transmit the multiple digital input detection signals to the production management module.
7. The method for batch testing the function of the voltage sag protector according to claim 6, characterized in that: The production management module generates a batch inspection report according to the real-time status data and the information set of the equipment to be inspected, including: The production management module generates a plurality of device states of the plurality of voltage sag protectors by comparing and verifying the plurality of binary input detection signals and the plurality of physical state data; The multiple device states and the device information set to be inspected are stored in association to generate the batch inspection report.
8. The method for batch testing the function of voltage sag protectors according to claim 2, characterized in that: The second functional robot arm is operated to transfer the batch of devices to be inspected to the peripheral wiring area and connect them to the electrical connection unit of the peripheral wiring, including: interactively obtaining a second path planning space of the second functional robotic arm; The peripheral connection area is selected based on the second path planning space and the first information input area as constraints; After the first functional robot arm and the second functional robot arm are handed over, the second functional robot arm is operated to transfer the batch of devices to be inspected to the peripheral wiring area; The second functional robot arm is operated to connect the batch of devices to be inspected with the electrical connection unit.
9. The function batch inspection system of voltage sag protector is characterized by: The system is used to perform the function batch inspection method of the voltage sag protector according to any one of claims 1 to 8, and the system comprises: A production management module, the production management module comprising an input device, an output device, a first communication interface and a third-party data docking interface; A sag simulation module, the sag simulation module comprising an HMI interface, a controller, and a sag simulation circuit; Peripheral wiring, the peripheral wiring includes an electrical connection unit and a second communication interface, wherein the peripheral wiring and the production management module realize data upload through the second communication interface and the first communication interface.
10. An electronic device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method for batch testing the functions of the voltage sag protector according to any one of claims 1 to 8 are implemented.