Photoelectric signal automatic conversion processing method

Abstract

The invention relates to the technical field of photoelectric signal conversion, in particular to a photoelectric signal automatic conversion processing method. The method comprises the following steps: acquiring an environment temperature value and a current value of a photodiode; determining a temperature increase index of each moment based on the increase condition of the temperature value in the local range of each moment; based on the fluctuation condition of the temperature value in the local range at each moment, determining a temperature fluctuation factor at each moment; obtaining an undercurrent surge value at each moment in combination with the temperature increase index and the temperature fluctuation factor; according to the chaos condition of the current value in the local range at each moment, the undercurrent increase degree caused by illumination variation at each moment is obtained; the temperature compensation amount is determined by integrating the undercurrent surge value and the undercurrent growth degree; and determining a cut-off frequency update value by combining the mapping relation between the initial cut-off frequency and the frequency compensation value in the initial state and the temperature compensation amount, and further performing conversion processing on the photoelectric signal. The accuracy of a photoelectric signal detection result is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of photoelectric signal conversion, and in particular to a photoelectric signal automatic conversion processing method. Background Art

[0002] The photoelectric signal automatic conversion processing method is a technology that converts optical signals into electrical signals or electrical signals into optical signals, and has a wide range of applications in many fields. Photoelectric conversion is mainly used in the fields of communication, sensing and detection, and medical treatment. Among them, in the field of communication, photoelectric signal conversion is the core technology of optical fiber communication. The electrical signal is encoded and transmitted through optical signals, and then decoded into an electrical signal at the receiving end; the sensor and detection field includes photoelectric sensors, such as photoelectric switches, light curtain sensors, and laser ranging equipment. By converting optical signals into electrical signals, the existence, distance or motion state of an object is detected; and it is used to monitor product quality, measure position or control mechanical action. The application of the photoelectric signal automatic conversion processing method is extremely extensive, covering almost all fields of modern science and technology, from communication to medical treatment, from consumer electronics to industrial control. In terms of technical implementation, the photoelectric effect and electroluminescence are the core principles, and a variety of devices and methods are used to meet the needs of different scenarios.

[0003] In the field of electronic components, the main optoelectronic devices include photodiodes, etc. The basic principle is to achieve control by converting light into a certain current, such as photoelectric switch lights. In actual use, due to the complexity of the use environment of photodiodes, in some high-temperature areas, the dark current effect may cause the accuracy of photodiodes to decrease. The dark current of a photodiode refers to the small amount of current that still exists in the diode under no light conditions, and the dark current mainly comes from the thermal excitation (thermally generated carriers) effect of semiconductor materials. As the temperature rises, the number of thermally generated carriers increases, and the dark current rises significantly, which in turn affects the signal detection accuracy of the photodiode. This problem is particularly important in the field of weak light or high-precision detection. Summary of the invention

[0004] In order to solve the problem of low accuracy of detection results in the existing photodiode signal detection, the purpose of the present invention is to provide a photoelectric signal automatic conversion processing method, the technical solution adopted is as follows: The present invention provides a method for automatically converting and processing a photoelectric signal, the method comprising the following steps: Get the ambient temperature and current value of the photodiode; Based on the growth of the temperature value between two adjacent moments in the local range of each moment, the temperature growth index at each moment is determined; based on the fluctuation of the temperature value between two adjacent moments in the local range of each moment, the temperature fluctuation factor at each moment is determined; the undercurrent surge value at each moment is obtained by combining the temperature growth index and the temperature fluctuation factor; According to the disorder of the current value in the local range at each moment, the dark current growth degree caused by the light change at each moment is obtained; the temperature compensation amount at each moment is determined by combining the dark current surge value and the dark current growth degree; the cutoff frequency update value is determined by combining the mapping relationship between the initial cutoff frequency and the frequency compensation value in the initial state and the temperature compensation amount at all moments; The photoelectric signal is converted and processed using the cutoff frequency update value.

[0005] Preferably, determining the temperature growth index at each moment based on the growth of the temperature value between two adjacent moments within the local range at each moment includes: The cumulative sum of the temperature growth values ​​of all two adjacent moments in the time neighborhood of the candidate moment is taken as the temperature growth index of the candidate moment; The candidate time is any time in the current time period.

[0006] Preferably, the acquisition of the temperature growth values ​​at two adjacent moments includes: determining the difference obtained by subtracting the temperature value at the previous moment from the temperature value at the latter moment as the temperature growth value at the two adjacent moments.

[0007] Preferably, the determining of the temperature fluctuation factor at each moment based on the fluctuation of the temperature value between two adjacent moments within the local range at each moment includes: If the temperature growth value of two adjacent moments in the time neighborhood of the candidate moment is greater than 0, the eigenvalues ​​corresponding to the two adjacent moments are set to 1; if the temperature growth value of two adjacent moments in the time neighborhood of the candidate moment is equal to 0, the eigenvalues ​​corresponding to the two adjacent moments are set to 0; if the temperature growth value of two adjacent moments in the time neighborhood of the candidate moment is less than 0, the eigenvalues ​​corresponding to the two adjacent moments are set to -1; According to the overall distribution of the eigenvalues ​​corresponding to two adjacent moments in the time neighborhood of the candidate moment, the temperature fluctuation factor of the candidate moment is obtained.

[0008] Preferably, obtaining the temperature fluctuation factor of the candidate moment according to the overall distribution of the characteristic values ​​corresponding to two adjacent moments in the time neighborhood of the candidate moment includes: The sum of the eigenvalues ​​corresponding to all two adjacent moments in the time neighborhood of the candidate moment is determined as the temperature fluctuation factor of the candidate moment.

[0009] Preferably, the step of combining the temperature growth index and the temperature fluctuation factor to obtain the undercurrent surge value at each moment includes: Calculate the absolute value of the temperature fluctuation factor at the candidate time; According to the temperature growth index and the absolute value at the candidate moment, the undercurrent surge value at the candidate moment is obtained, the temperature growth index is positively correlated with the undercurrent surge value, and the absolute value is negatively correlated with the undercurrent surge value.

[0010] Preferably, the step of obtaining the dark current growth degree caused by the illumination change at each moment according to the disorder of the current value in the local range at each moment includes: Calculate the current difference between each two adjacent moments in the time neighborhood of the candidate moment, where the current difference is the difference between the current value at the latter moment and the current value at the previous moment of the two adjacent moments; The degree of disorder of the current differences corresponding to all two adjacent moments in the time neighborhood of the candidate moment is determined as the degree of dark current growth caused by the illumination variation at the candidate moment.

[0011] Preferably, the step of determining the temperature compensation amount at each moment by comprehensively considering the undercurrent surge value and the undercurrent growth degree includes: The product of the undercurrent surge value at the candidate time and the undercurrent growth degree at the candidate time is determined as the temperature compensation amount at the candidate time.

[0012] Preferably, the determining of the cutoff frequency update value by combining the mapping relationship between the initial cutoff frequency and the frequency compensation value in the initial state and the temperature compensation amount at all times includes: Calculate the average value of temperature compensation at all times in the current time period; The ratio between the initial cutoff frequency and the frequency compensation value in the initial state is recorded as a first ratio, and the product of the first ratio and the average value is determined as the cutoff frequency update value.

[0013] Preferably, obtaining the degree of confusion of the current difference corresponding to all two adjacent moments in the time neighborhood of the candidate moment includes: determining the entropy value of the current difference corresponding to all two adjacent moments in the time neighborhood of the candidate moment as the degree of confusion.

[0014] The present invention has at least the following beneficial effects: The present invention first evaluates the growth of the temperature value in the local range at each moment, and obtains the temperature growth index at each moment; then evaluates the fluctuation of the temperature value between two adjacent moments in the local range at each moment, and obtains the temperature fluctuation factor at each moment; and evaluates the dark current surge value in combination with the temperature growth index and the temperature fluctuation factor, and obtains the dark current surge value at each moment; then, the chaotic situation of the current value and the dark current surge value in the local range at each moment are combined to determine the temperature compensation amount at each moment; and then, according to the mapping relationship between the initial cutoff frequency and the frequency compensation value in the initial state, the cutoff frequency is updated using the temperature compensation amount at all moments; and then, the photoelectric signal is converted and processed using the updated cutoff frequency. The method provided by the present invention can adaptively update the cutoff frequency in the photodiode action system, achieve the purpose of real-time and high-precision interception of low-frequency dark currents, and improve the accuracy of the photoelectric signal detection results. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0016] Figure 1 A flowchart of a method for automatically converting photoelectric signals provided by an embodiment of the present invention; Figure 2 A simulation environment diagram of a filter circuit provided by an embodiment of the present invention; Figure 3 This is a structural block diagram of a photoelectric signal automatic conversion and processing system provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0017] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined purpose of the invention, the following is a detailed description of a photoelectric signal automatic conversion processing method provided by the embodiment of the present invention proposed by the present invention in combination with the accompanying drawings and preferred embodiments.

[0018] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0019] The specific scheme of the photoelectric signal automatic conversion processing method provided by the present invention is described in detail below with reference to the accompanying drawings.

[0020] An embodiment of a method for automatically converting and processing photoelectric signals: The specific scenario targeted by this embodiment is: in order to improve the accuracy of the signal detection results of the photodiode, this embodiment sets a temperature sensor around the photoelectric conversion diode to collect ambient temperature data, set the initial filtering parameter value, analyze the ambient temperature to determine the surge of dark current, and judge the temperature compensation amount based on the surge; dynamically iterate the initial filtering parameter value according to the frequency compensation amount to eliminate the influence of dark current noise on the accuracy of the photodiode, so as to achieve the purpose of automatic high-precision conversion of photoelectric signals.

[0021] This embodiment proposes a method for automatically converting photoelectric signals. Figure 1 As shown, a photoelectric signal automatic conversion processing method of this embodiment includes the following steps: Step S1, obtaining the ambient temperature value and current value of the photodiode.

[0022] First, a temperature sensor is installed near the photodiode to collect ambient temperature data. The temperature sensor uses a high-precision digital temperature sensor (such as DS18B20) with an accuracy of ±0.1°C and a temperature range that meets the expected working environment. In this embodiment, the temperature range is -40°C to 85°C. In this embodiment, the distance between the temperature sensor and the photodiode does not exceed 1 cm. The temperature sensor is directly connected to the I / O port of the microcontroller and the temperature value is read through serial communication.

[0023] Then configure the filter circuit to filter out dark current and other low-frequency noise signals while retaining the effective photoelectric signal. Use a high-pass filter to eliminate low-frequency DC components, such as dark current noise. Select an active filter circuit (a high-pass filter configured with an operational amplifier), where the high-pass cutoff frequency of the filter is adjustable to serve the function of dynamically adjusting the filter in the subsequent steps. The simulation environment of the filter circuit is as follows Figure 2 As shown, in the figure, R1, R2, R3 and R4 represent resistors, C3 and C4 represent capacitors, Ui represents input power, Uo represents output power, XSC1 represents an oscilloscope, V1 represents the voltage across R4, V2 represents a 12V power supply, V3 represents the input voltage Ui, and U1 represents an amplifier. The filter circuit is close to the output end of the photodiode to reduce line noise interference. This embodiment uses a shielded cable or a ground wire to isolate electromagnetic interference. Next, a data analysis module is configured, and the data analysis module receives the output signal of the temperature sensor and the photodiode. This embodiment will dynamically adjust the compensation value of the dark current based on the temperature data and the current data. Combined with an adaptive filtering algorithm, the residual dark current noise is removed in real time. The temperature sensor, the filtering circuit and the data analysis module are connected to a microcontroller, the analog signal is read through the ADC of the MCU, and dark current compensation and adaptive filtering are implemented through software.

[0024] Get the configured photodiode filter processing module, which includes a filter circuit module that can adjust the high-pass cutoff frequency, a sensor module that detects the real-time ambient temperature, and a module for data control and analysis. Set the initial filter cutoff frequency and the frequency compensation value in the initial state for the high-pass filter module, where the specific object to be filtered is the electrical signal after the diode photoelectric conversion. This type of electrical signal is a current, that is, it has different current signal values ​​at different times. In the photoelectric conversion process, the current signal may appear as dark current noise, so it needs to be filtered out. However, due to the complexity of the environment, the degree of dark current at different temperatures is inconsistent. Therefore, in order to ensure the conversion effect of the photoelectric signal, the cutoff frequency needs to have iterative characteristics. Therefore, first set an initial filter parameter. The dark current is essentially a DC bias current generated by the inherent properties of the device. Its signal frequency is low and can even be considered as a static signal, that is, slightly greater than 0Hz; when the dark current fluctuates, that is, temperature changes or slight interference of the light signal, a corresponding low-frequency signal will be generated, and its fluctuation frequency is usually in the low-frequency range, that is, about 5Hz. Therefore, the filter cutoff frequency in the initial filtering process is set to 5 Hz, and the frequency of the electrical signal with normal fluctuation is generally higher than 5 Hz. Further, this frequency is configured in a high-pass filter circuit with an adjustable cutoff frequency to perform real-time dark current filtering.

[0025] Collect the ambient temperature value and current value within the current time period. The current time period is a collection of all historical moments whose time interval with the current moment is less than or equal to the preset time length. In this embodiment, the preset time length is 10 minutes. The temperature value and the current value are collected once per second, that is, a temperature value and a current value are collected per second. In specific applications, the implementer can set the preset time length and data collection frequency according to the specific situation.

[0026] So far, this embodiment has collected the temperature value and current value of the photodiode at each moment in the current time period, wherein some of the collected temperature values ​​are shown in Table 1: Table 1 Step S2, based on the growth of the temperature value between two adjacent moments in the local range of each moment, determine the temperature growth index at each moment; based on the fluctuation of the temperature value between two adjacent moments in the local range of each moment, determine the temperature fluctuation factor at each moment; combine the temperature growth index and the temperature fluctuation factor to obtain the undercurrent surge value at each moment.

[0027] This embodiment analyzes the ambient temperature to determine the dark current surge, and determines the mapping of the temperature compensation amount based on the surge value; dynamically iterates the initial filter parameter value based on the frequency compensation amount to eliminate the influence of dark current noise on the accuracy of the photodiode, thereby achieving the purpose of automatic high-precision conversion.

[0028] Since fixed frequency filtering has poor filtering effect, when the light intensity in the environment fluctuates or the temperature changes unstably, the corresponding dark current fluctuation is stronger, and the dark current fluctuation frequency will increase sharply. If the initial dark current cutoff frequency is set high, some electrical signals with information will be filtered out, affecting the integrity of the signal, so the corresponding cutoff frequency needs to be updated in time to prevent the above situation from happening.

[0029] As the ambient temperature of the photodiode increases, the thermal excitation (thermally generated carriers) effect of the semiconductor material becomes more significant, the number of thermally generated carriers increases, the dark current rises significantly, the dark current energy increases accordingly, and its volatility also increases accordingly.

[0030] The ambient light intensity can also cause different fluctuations in dark currents due to noise and other factors. Combined with the temperature rise scenario, the frequency of dark currents will increase.

[0031] In order to adjust the filter parameters in real time, it is necessary to determine the relevant mapping relationship in combination with the real-time temperature change to obtain the optimized update value of the filter parameters. The more drastic the increase in ambient temperature and the stronger the fluctuation in a certain period of time, the higher the undercurrent surge effect it produces, and the higher the corresponding temperature compensation.

[0032] Next, this embodiment is described by taking any moment in the current time period as an example, and the method provided in this embodiment can be used to process other moments in the current time period.

[0033] Specifically, any moment in the current time period is recorded as a candidate moment. In the time neighborhood of the candidate moment, the difference between the temperature value of the latter moment and the temperature value of the previous moment is determined as the temperature growth value of the two adjacent moments; there is a temperature growth value for each of the two adjacent moments in the time neighborhood of the candidate moment, and the cumulative sum of the temperature growth values ​​of all the two adjacent moments in the time neighborhood of the candidate moment is used as the temperature growth index of the candidate moment. The method for obtaining the time neighborhood of the candidate moment is as follows: taking the candidate moment as the central moment, constructing a time window with a preset first duration, and using the time window as the time neighborhood of the candidate moment; in this embodiment, the preset first duration is one minute, and in specific applications, the implementer can set it according to specific circumstances.

[0034] If the temperature growth value of two adjacent moments in the time neighborhood of the candidate moment is greater than 0, the eigenvalues ​​corresponding to the two adjacent moments are set to 1; if the temperature growth value of two adjacent moments in the time neighborhood of the candidate moment is equal to 0, the eigenvalues ​​corresponding to the two adjacent moments are set to 0; if the temperature growth value of two adjacent moments in the time neighborhood of the candidate moment is less than 0, the eigenvalues ​​corresponding to the two adjacent moments are set to -1. Using the above method, the temperature growth value of every two adjacent moments in the time neighborhood of the candidate moment can be obtained, and there is a temperature growth value between every two adjacent moments in the time neighborhood of the candidate moment. The sum of the eigenvalues ​​corresponding to all two adjacent moments in the time neighborhood of the candidate moment is determined as the temperature fluctuation factor of the candidate moment. Next, the absolute value of the temperature fluctuation factor of the candidate moment is calculated; according to the temperature growth index of the candidate moment and the absolute value, the undercurrent surge value of the candidate moment is obtained, the temperature growth index is positively correlated with the undercurrent surge value, and the absolute value is negatively correlated with the undercurrent surge value.

[0035] Among them, the negative correlation relationship indicates that the dependent variable will decrease as the independent variable increases, and the dependent variable will increase as the independent variable decreases. It can be a subtraction relationship, a division relationship, etc., which is determined by actual application; the positive correlation relationship indicates that the dependent variable will increase as the independent variable increases, and the dependent variable will decrease as the independent variable decreases. It can be an addition relationship, a multiplication relationship, etc., which is determined by actual application.

[0036] In this embodiment, a specific calculation formula for the undercurrent surge value is given, and the undercurrent surge value at the nth moment can be expressed as: in, Indicates the undercurrent surge value at the nth moment, represents the temperature growth exponent at the nth moment, represents the temperature fluctuation factor at the nth moment, Indicates the preset adjustment parameters, represents the absolute value sign, and norm() represents the normalization function.

[0037] The purpose of introducing a preset adjustment parameter into the calculation formula of the undercurrent surge value in this embodiment is to prevent the denominator from being 0. The preset adjustment parameter in this embodiment is 1. In specific applications, the implementer can set it according to the specific situation.

[0038] The higher the temperature growth index at the nth moment and the smaller the absolute value of the temperature fluctuation factor at the nth moment, the higher the corresponding undercurrent surge, that is, the larger the undercurrent surge value at the nth moment.

[0039] By adopting the above method, the undercurrent surge value at each moment in the current time period can be obtained.

[0040] Step S3, according to the disorder of the current value in the local range at each moment, the degree of dark current growth caused by the light change at each moment is obtained; the temperature compensation amount at each moment is determined by combining the dark current surge value and the dark current growth degree; the cutoff frequency update value is determined by combining the mapping relationship between the initial cutoff frequency and the frequency compensation value in the initial state and the temperature compensation amount at all moments.

[0041] From the specific logic of the occurrence of dark current, it can be seen that the instability of temperature and light is the reason why the amplitude of dark current increases rapidly in the frequency domain. The stability of light intensity can be reflected by the non-dark current part, that is, the current value generated by the photoelectric effect in the photodiode element. When photons are incident on the PN junction of the photodiode, electron-hole pairs will be generated in the junction area. These carriers form photocurrent under the action of the built-in electric field.

[0042] When the light intensity changes, the photocurrent will change accordingly. When the number of photons increases, the number of electron-hole pairs generated increases, and the photocurrent increases linearly with the light intensity. When the light intensity decreases, the photocurrent decreases accordingly. When the light disappears completely, the photocurrent tends to zero, and the remaining current is the dark current. Therefore, when the current that is not dark current fluctuates nonlinearly, the ambient light changes, and the dark current generated by it will also increase accordingly.

[0043] Next, the candidate moment is still used as an example for explanation. Specifically, the current difference of all two adjacent moments in the time neighborhood of the candidate moment is calculated respectively, where the current difference is the difference obtained by subtracting the current value of the previous moment from the current value of the latter moment of the two adjacent moments; it should be noted that: there is a current difference for every two adjacent moments in the time neighborhood of the candidate moment. The degree of confusion of the current difference corresponding to all two adjacent moments in the time neighborhood of the candidate moment is determined as the degree of dark current growth caused by the illumination change at the candidate moment. The degree of confusion of the current difference can be represented by indicators such as the extreme difference of the current difference, the entropy value of the current difference, the variance of the current difference, and the standard deviation of the current difference. In this embodiment, the entropy value of the current difference corresponding to all two adjacent moments in the time neighborhood of the candidate moment is determined as the degree of confusion of the current difference corresponding to all two adjacent moments in the time neighborhood of the candidate moment; when the entropy value is larger, the more chaotic the current change is, the higher the degree of fluctuation of the ambient light intensity is, and the stronger the internal dark current effect is.

[0044] The product of the dark current surge value at the candidate time and the dark current growth degree at the candidate time is determined as the temperature compensation amount at the candidate time. The larger the value of the temperature compensation amount, the stronger the dark current effect caused by the corresponding environmental influence, and the more frequency compensation is needed, that is, the more the cutoff frequency of the high-pass filter needs to be increased.

[0045] According to the temperature compensation amount at each moment in the current time period, the average value of the temperature compensation amounts at all moments in the current time period is calculated; next, the average value is used as a mapping constant, a cutoff frequency mapping relationship is established, and a cutoff frequency update value is determined. Specifically, the ratio between the initial cutoff frequency and the frequency compensation value in the initial state is recorded as a first ratio, and the product of the first ratio and the average value is determined as the cutoff frequency update value.

[0046] So far, this embodiment has obtained the cutoff frequency update value.

[0047] Step S4, converting and processing the photoelectric signal using the cutoff frequency update value.

[0048] In this embodiment, in step S3, the cutoff frequency update value is obtained, and the cutoff frequency update value is assigned to a real-time high-pass filter circuit, and the photoelectric signal is converted and processed by the high-pass filter circuit.

[0049] This embodiment updates the filter cutoff frequency of the high-pass filter circuit in real time according to environmental parameters, which can effectively prevent the current value noise in the photodiode from causing conversion errors due to changes in dark current, thereby improving the accuracy of the photoelectric signal conversion result.

[0050] This embodiment first evaluates the growth of the temperature value in the local range at each moment, and obtains the temperature growth index at each moment, then evaluates the fluctuation of the temperature value between two adjacent moments in the local range at each moment, and obtains the temperature fluctuation factor at each moment, and evaluates the dark current surge value in combination with the temperature growth index and the temperature fluctuation factor, and obtains the dark current surge value at each moment, and then comprehensively considers the chaos of the current value and the dark current surge value in the local range at each moment, and determines the temperature compensation amount at each moment, and then according to the mapping relationship between the initial cutoff frequency and the frequency compensation value in the initial state, the cutoff frequency is updated using the temperature compensation amount at all moments, and then the photoelectric signal is converted and processed using the updated cutoff frequency. The method provided in this embodiment can adaptively update the cutoff frequency in the photodiode action system, so as to achieve the purpose of real-time and high-precision interception of low-frequency dark current, and improve the accuracy of photoelectric conversion.

[0051] An embodiment of a photoelectric signal automatic conversion and processing system: like Figure 3 As shown, the figure shows a structural block diagram of a photoelectric signal automatic conversion and processing system, which includes a data acquisition module, a processing module, a cutoff frequency updating module and a signal conversion module.

[0052] Wherein, the data acquisition module is used to obtain the ambient temperature value and current value of the photodiode; A processing module is used to determine a temperature growth index at each moment based on the growth of temperature values ​​between two adjacent moments within a local range at each moment; determine a temperature fluctuation factor at each moment based on the fluctuation of temperature values ​​between two adjacent moments within a local range at each moment; and obtain an undercurrent surge value at each moment by combining the temperature growth index and the temperature fluctuation factor; The cutoff frequency update module is used to obtain the dark current growth degree caused by the light change at each moment according to the disorder of the current value in the local range at each moment; determine the temperature compensation amount at each moment by combining the dark current surge value and the dark current growth degree; determine the cutoff frequency update value by combining the mapping relationship between the initial cutoff frequency and the frequency compensation value in the initial state and the temperature compensation amount at all moments; The signal conversion module is used to convert the photoelectric signal using the cutoff frequency update value.

[0053] It should be understood that Figure 3 The structural block diagram of a photoelectric signal automatic conversion processing system shown and its modules can be implemented in various ways. For example, in some embodiments, the system and its modules can be implemented by hardware, software, or a combination of software and hardware. Among them, the hardware part can be implemented using dedicated logic; the software part can be stored in a memory and executed by an appropriate instruction execution system, such as a microprocessor or dedicated design hardware. Those skilled in the art can understand that the above-mentioned method and system can be implemented using computer executable instructions and / or included in a processor control code, for example, such as a carrier medium such as a disk, CD or DVD-ROM, a programmable memory such as a read-only memory (firmware), or a data carrier such as an optical or electronic signal carrier. Such code is provided on the carrier medium such as a disk, CD or DVD-ROM, a programmable memory such as a read-only memory (firmware), or a data carrier such as an optical or electronic signal carrier. The system and its modules of this specification can not only be implemented by hardware circuits such as ultra-large-scale integrated circuits or gate arrays, semiconductors such as logic chips, transistors, etc., or programmable hardware devices such as field programmable gate arrays, programmable logic devices, etc., but can also be implemented by software executed by various types of processors, and can also be implemented by a combination of the above-mentioned hardware circuits and software (for example, firmware).

[0054] For more details about the above modules, please refer to other places in this manual and will not be repeated here.

[0055] In other embodiments, a device for automatic conversion and processing of photoelectric signals is also provided, comprising a memory and a processor. The memory is used to store executable program code, and the processor is used to call and run the executable program code from the memory, so that the device executes the above-mentioned method for automatic conversion and processing of photoelectric signals. The device can be specifically a chip, a component or a module, and the chip may include a connected processor and a memory; wherein the memory is used to store instructions, and when the processor calls and executes the instructions, the chip can execute the above-mentioned method for automatic conversion and processing of photoelectric signals provided in the above-mentioned embodiment.

[0056] In other embodiments, a computer program product is also provided. When the computer program product is run on a computer, the computer executes the above-mentioned related steps to implement a method for automatic conversion and processing of photoelectric signals provided in the above-mentioned embodiment.

[0057] In other embodiments, a computer-readable storage medium is also provided, in which a computer program code is stored. When the computer program code is run on a computer, the computer executes the above-mentioned related method steps to implement an automatic photoelectric signal conversion processing method provided in the above-mentioned embodiment.

[0058] Among them, the provided system, electronic device, computer program product, and computer-readable storage medium are all used to execute the corresponding methods provided above. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding methods provided above, and will not be repeated here.

[0059] It should be noted that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for automatically converting photoelectric signals, characterized in that: The method comprises the following steps: Get the ambient temperature and current value of the photodiode; Based on the growth of the temperature value between two adjacent moments in the local range of each moment, the temperature growth index at each moment is determined; based on the fluctuation of the temperature value between two adjacent moments in the local range of each moment, the temperature fluctuation factor at each moment is determined; the undercurrent surge value at each moment is obtained by combining the temperature growth index and the temperature fluctuation factor; According to the disorder of the current value in the local range at each moment, the dark current growth degree caused by the light change at each moment is obtained; the temperature compensation amount at each moment is determined by combining the dark current surge value and the dark current growth degree; the cutoff frequency update value is determined by combining the mapping relationship between the initial cutoff frequency and the frequency compensation value in the initial state and the temperature compensation amount at all moments; The photoelectric signal is converted and processed using the cutoff frequency update value.

2. The method for automatic conversion and processing of photoelectric signals according to claim 1, characterized in that: The step of determining the temperature growth index at each moment based on the growth of the temperature values ​​between two adjacent moments within the local range at each moment includes: The cumulative sum of the temperature growth values ​​of all two adjacent moments in the time neighborhood of the candidate moment is taken as the temperature growth index of the candidate moment; The candidate time is any time in the current time period.

3. The method for automatic conversion and processing of photoelectric signals according to claim 2, characterized in that: The acquisition of the temperature growth values ​​at two adjacent moments includes: determining the difference obtained by subtracting the temperature value at the previous moment from the temperature value at the latter moment as the temperature growth value at the two adjacent moments.

4. The method for automatic conversion and processing of photoelectric signals according to claim 3, characterized in that: The determining of the temperature fluctuation factor at each moment based on the fluctuation of the temperature value between two adjacent moments in the local range at each moment includes: If the temperature growth value of two adjacent moments in the time neighborhood of the candidate moment is greater than 0, the eigenvalues ​​corresponding to the two adjacent moments are set to 1; if the temperature growth value of two adjacent moments in the time neighborhood of the candidate moment is equal to 0, the eigenvalues ​​corresponding to the two adjacent moments are set to 0; if the temperature growth value of two adjacent moments in the time neighborhood of the candidate moment is less than 0, the eigenvalues ​​corresponding to the two adjacent moments are set to -1; According to the overall distribution of the eigenvalues ​​corresponding to two adjacent moments in the time neighborhood of the candidate moment, the temperature fluctuation factor of the candidate moment is obtained.

5. The method for automatic conversion and processing of photoelectric signals according to claim 4, characterized in that: The temperature fluctuation factor of the candidate moment is obtained according to the overall distribution of the characteristic values ​​corresponding to two adjacent moments in the time neighborhood of the candidate moment, including: The sum of the eigenvalues ​​corresponding to all two adjacent moments in the time neighborhood of the candidate moment is determined as the temperature fluctuation factor of the candidate moment.

6. The method for automatic conversion and processing of photoelectric signals according to claim 2, characterized in that: The combination of the temperature growth index and the temperature fluctuation factor to obtain the undercurrent surge value at each moment includes: Calculate the absolute value of the temperature fluctuation factor at the candidate time; According to the temperature growth index and the absolute value at the candidate moment, the undercurrent surge value at the candidate moment is obtained, the temperature growth index is positively correlated with the undercurrent surge value, and the absolute value is negatively correlated with the undercurrent surge value.

7. The method for automatic conversion and processing of photoelectric signals according to claim 2, characterized in that: The dark current growth degree caused by the illumination change at each moment is obtained according to the disorder of the current value in the local range at each moment, including: Calculate the current difference between each two adjacent moments in the time neighborhood of the candidate moment, where the current difference is the difference between the current value at the latter moment and the current value at the previous moment of the two adjacent moments; The degree of disorder of the current differences corresponding to all two adjacent moments in the time neighborhood of the candidate moment is determined as the degree of dark current growth caused by the illumination variation at the candidate moment.

8. The method for automatic conversion and processing of photoelectric signals according to claim 2, characterized in that: The step of determining the temperature compensation amount at each moment by combining the undercurrent surge value and the undercurrent growth degree includes: The product of the undercurrent surge value at the candidate time and the undercurrent growth degree at the candidate time is determined as the temperature compensation amount at the candidate time.

9. The method for automatic conversion and processing of photoelectric signals according to claim 1, characterized in that: The determining of the cutoff frequency update value by combining the mapping relationship between the initial cutoff frequency and the frequency compensation value in the initial state and the temperature compensation amount at all times includes: Calculate the average value of temperature compensation at all times in the current time period; The ratio between the initial cutoff frequency and the frequency compensation value in the initial state is recorded as a first ratio, and the product of the first ratio and the average value is determined as the cutoff frequency update value.

10. The method for automatic conversion and processing of photoelectric signals according to claim 7, characterized in that: Acquiring the degree of disorder of the current difference corresponding to all two adjacent moments in the time neighborhood of the candidate moment includes: determining the entropy value of the current difference corresponding to all two adjacent moments in the time neighborhood of the candidate moment as the degree of disorder.

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