Screening clamp of feed-through capacitor

Abstract

The utility model relates to a screening clamp for feed-through capacitors, which is used for loading feed-through capacitors to be detected and comprises an upper-layer plate and a lower-layer plate arranged below the upper-layer plate. The upper layer plate is provided with m groups of first accommodating hole assemblies used for accommodating a to-be-tested feed-through capacitor shell, each first accommodating hole assembly comprises n first accommodating holes, m is greater than or equal to 2, and n is greater than or equal to 1; a first electrode which can be in contact with the shell is arranged in each first accommodating hole, and the bottom of each first accommodating hole allows a guide pin of the feed-through capacitor to be tested to penetrate out; the lower layer plate is provided with m groups of second accommodating hole assemblies used for jointing the guide pins, each second accommodating hole assembly comprises n second accommodating holes, the second accommodating holes are in one-to-one correspondence with the first accommodating holes, and second electrodes which can be in contact with the guide pins when the second accommodating holes are jointed with the guide pins are arranged in the second accommodating holes; and the first electrode and the second electrode are respectively used for accessing screening equipment. According to the utility model, batch aging screening test can be carried out on feed-through capacitors, and the test efficiency is effectively improved.

Description

Technical Field

[0001] The utility model relates to the technical field of through-hole capacitor detection, in particular to a screening fixture for through-hole capacitors. Background Art

[0002] In order to improve the reliability of through-hole capacitor filters and reduce the failure rate, early failure products are usually eliminated through aging screening tests. The aging screening test of through-hole capacitors refers to selecting appropriate aging conditions (such as high temperature and high voltage environment), exposing the through-hole capacitor to be tested to the aging environment according to the set aging time, and conducting accelerated aging tests. The screening process is to first clamp the through-hole capacitor into the positioning hole of the fixture in a horizontal manner, so that the shell of the through-hole capacitor contacts one electrode sheet of the fixture, and the guide pin of the through-hole capacitor contacts the other electrode sheet of the fixture, and then clamp the entire fixture into the screening device, and electrically connect it to the screening device through the two electrode sheets of the fixture. A high temperature environment is formed for the through-hole capacitor in the screening device, and the high voltage output of the through-hole capacitor is screened to determine the high temperature and high voltage load capacity of the through-hole capacitor. If the through-hole capacitor does not short-circuit or the current exceeds the set value within the specified time, it is a qualified product; otherwise, it is a defective product and needs to be eliminated. However, the traditional fixture can only install one through-hole capacitor. Not only does it need to load the through-hole capacitor into the fixture first, but the fixture also needs to be clamped into the screening equipment. When taking it out, it needs to be taken out one by one, which makes the testing efficiency extremely low. Utility Model Content

[0003] Based on this, the purpose of the utility model is to provide a screening fixture for through-hole capacitors, which can perform batch aging screening tests on through-hole capacitors and effectively improve the test efficiency.

[0004] A screening fixture for through-hole capacitors, used for loading through-hole capacitors to be tested, comprises an upper plate, and a lower plate arranged below the upper plate; the upper plate is provided with m groups of first accommodating hole assemblies for accommodating the shell of the through-hole capacitor to be tested, each first accommodating hole assembly comprises n first accommodating holes, wherein m≥2, n≥1; each first accommodating hole is provided with a first electrode that can contact the shell, the bottom of the first accommodating hole allows the guide pin of the through-hole capacitor to be tested to pass through, and the first electrode and the guide pin do not contact each other; the lower plate is provided with m groups of second accommodating hole assemblies for engaging the guide pin, each second accommodating hole assembly comprises n second accommodating holes, the second accommodating holes correspond one-to-one to the first accommodating holes, the second accommodating holes are provided with a second electrode that can contact the guide pin when engaged with the guide pin, and the second electrode and the shell do not contact each other; the first electrode and the second electrode are respectively used to connect to a screening device.

[0005] The screening fixture for through-hole capacitors disclosed in the utility model realizes simultaneous loading of a plurality of through-hole capacitors to be tested by providing an accommodating space for vertically inserting the through-hole capacitors to be tested, so as to perform batch testing on the through-hole capacitors to be tested, thereby effectively improving the testing efficiency.

[0006] Furthermore, the upper plate is provided with m first conductive wirings, the first electrodes in the same group of n first containing holes are electrically connected to the same first conductive wiring, and each first conductive wiring is electrically connected to the first electrical connection end of the screening device; the lower plate is provided with m second conductive wirings, the second electrodes in the same group of n second containing holes are electrically connected to the same second conductive wiring, and each second conductive wiring is electrically connected to the second electrical connection end of the screening device.

[0007] Furthermore, the first accommodating holes on the upper plate and the second accommodating holes on the lower plate are arranged in a matrix of a rows and b columns, respectively, wherein a*b=m*n, a≥2, b≥1, or a≥1, b≥2.

[0008] Furthermore, the first electrode in each first receiving hole is electrically connected to the first electrical connection end of the screening device, and the second electrode in each second receiving hole is electrically connected to the second electrical connection end of the screening device.

[0009] Furthermore, the side wall of each first accommodating hole is provided with at least three first electrodes equidistantly distributed in the circumferential direction, and the first electrode has a spring structure protruding radially inwardly along the first accommodating hole.

[0010] Furthermore, the second electrode includes at least two arc-shaped spring sheets, a joint channel for the guide needle to penetrate is formed between the two arc-shaped spring sheets, and the distance between the upper ends of the two arc-shaped spring sheets is greater than the distance between the lower ends thereof.

[0011] Furthermore, the screening fixture for the through-hole capacitor further comprises an insulating plate disposed between the upper plate and the lower plate, the insulating plate being provided with a third accommodating hole corresponding one-to-one to the first accommodating hole, the third accommodating hole being a through hole for accommodating a portion of the shell of the through-hole capacitor to be tested that passes through the first accommodating hole;

[0012] The area of ​​the third accommodating hole is greater than or equal to the area of ​​the minimum cross-section of the shell perpendicular to the guide needle, and is smaller than the area of ​​the maximum cross-section of the shell perpendicular to the guide needle. The depth of the third accommodating hole is greater than the axial length of the portion of the through-hole capacitor to be tested that passes through the first accommodating hole.

[0013] Furthermore, the screening fixture for the through-hole capacitor also includes an insulating plate arranged between the upper plate and the lower plate, and the insulating plate is provided with a third accommodating hole corresponding to the first accommodating hole one by one, and the third accommodating hole is a blind hole, which is used to accommodate the through-hole capacitor to be tested that partially passes through the first accommodating hole, and the bottom wall of the third accommodating hole is provided with a positioning through hole for the guide pin to pass through, and the area of ​​the positioning through hole is smaller than the area of ​​the minimum cross-section of the shell perpendicular to the guide pin.

[0014] Furthermore, the upper opening of the third accommodating hole is a bell-mouth structure.

[0015] Furthermore, the third accommodating hole, the second accommodating hole and the first accommodating hole are coaxial.

[0016] In order to better understand and implement the present invention, the present invention is described in detail below with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a structural schematic diagram of an existing feedthrough capacitor;

[0018] Figure 2 It is a structural schematic diagram of an embodiment of the screening fixture for feedthrough capacitors of the utility model;

[0019] Figure 3 It is a structural schematic diagram of the upper plate in the screening fixture of the feedthrough capacitor of the utility model;

[0020] Figure 4 It is a structural schematic diagram of the lower plate in the screening fixture of the feedthrough capacitor of the utility model;

[0021] Figure 5 It is a structural schematic diagram of a preferred implementation of the upper plate in the screening fixture of the feedthrough capacitor of the utility model;

[0022] Figure 6 It is a structural schematic diagram of the first electrode in the screening fixture of the feedthrough capacitor of the utility model;

[0023] Figure 7 It is a schematic structural diagram of the second electrode in the screening fixture of the feedthrough capacitor of the utility model;

[0024] Figure 8 It is a structural schematic diagram of another embodiment of the screening fixture for feedthrough capacitors of the utility model;

[0025] Fig. 9 It is a structural schematic diagram of the insulating plate in the screening fixture of the feedthrough capacitor of the utility model;

[0026] Fig.10 It is a structural schematic diagram of the fastening components in the screening fixture of the feedthrough capacitor of the utility model;

[0027] Reference numerals:

[0028] 1. Through-hole capacitor; 11. Shell; 111. Upper part of shell; 112. Lower part of shell; 12. Guide pin;

[0029] 10. upper plate; 100. first receiving hole assembly; 1000. first receiving hole; 1010. first electrode; 1010a. spring structure; 102. first conductive wiring; 104. first positioning through hole;

[0030] 20, lower plate; 20a, protrusion; 200, second receiving hole assembly; 2000, second receiving hole; 2020, second electrode; 2020a, arc-shaped spring; 202, second conductive wiring; 204, second positioning through hole;

[0031] 30, insulating plate; 3000, third accommodating hole; 304, third positioning through hole;

[0032] 40. Fastening assembly; 41. Screw; 42. Nut. DETAILED DESCRIPTION

[0033] It should be clear that the described embodiments are only some embodiments of the embodiments of the present application, rather than all embodiments. Based on the embodiments in the embodiments of the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the embodiments of the present application.

[0034] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0035] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be an intermediate element. When an element is considered to be "connected" or "fixedly connected" to another element, it may be directly connected to the other element or there may be an intermediate element at the same time.

[0036] Traditionally, when performing aging screening tests on through-hole capacitors, it is necessary to first place the through-hole capacitor to be tested in an aging environment (such as a high temperature and high voltage environment) to accelerate the aging process of the through-hole capacitor. The screening process is to first load the through-hole capacitor into the fixture in a horizontal manner, and then connect the entire fixture to the screening equipment, and electrically connect the first electrode sheet and the second electrode sheet on the fixture to the screening equipment. A high-temperature environment is formed for the through-hole capacitor in the screening equipment and the high voltage output of the through-hole capacitor is screened. If the through-hole capacitor does not short-circuit or the current exceeds the set value within the specified time, it is a qualified product; otherwise, it is a unqualified product and needs to be discarded. However, traditional fixtures can usually only connect to one through-hole capacitor to be tested, and they need to be installed and tested one by one. After the test is completed, they also need to be removed one by one, and the test efficiency is extremely low.

[0037] Based on this, the implementation mode of the utility model provides a screening fixture for through-hole capacitors, which can perform batch tests on through-hole capacitors to be tested, thereby effectively improving the test efficiency.

[0038] Existing feedthrough capacitors have a variety of different shapes, usually including a cylindrical or substantially cylindrical shell and a guide pin penetrating the shell. Figure 1 FIG. 2 shows the structure of an existing feedthrough capacitor. Figure 1 As shown, the through-hole capacitor 1 includes a housing 11, and a guide pin 12 located at the central axis of the housing 11 and penetrating the housing 11. The housing 11 includes a cylindrical housing upper portion 111 and a cylindrical housing lower portion 112, the housing upper portion 111 is coaxial with the housing lower portion 112, and the diameter of the housing upper portion 111 is greater than the diameter of the housing lower portion 112.

[0039] Figure 2-6 The specific structure of an embodiment of the screening fixture for feedthrough capacitors of the utility model is shown. Figure 2-4 As shown, in this embodiment, the screening fixture for the through-hole capacitor includes a rectangular upper plate 10 and a rectangular lower plate 20 located below the upper plate 10. Specifically, m groups of first receiving hole assemblies 100 are provided on the upper plate 10, and each group of receiving hole assemblies 100 includes n first receiving holes 1000. Figure 3-4As shown, in this embodiment, m=4, n=5, the first accommodating holes 1000 of the upper plate 10 and the second accommodating holes 2000 of the lower plate 20 are both distributed in a matrix of 4 rows and 5 columns. The first accommodating hole 1000 is specifically a cylindrical through hole, and its diameter is slightly greater than or equal to the diameter of the upper part 111 of the shell of the through-hole capacitor 1 to be tested. One first accommodating hole 1000 can load one through-hole capacitor 1 to be tested. The side wall of the first accommodating hole 1000 is provided with a first electrode 1010. When the through-hole capacitor 1 to be tested is installed in the first accommodating hole 1000, the shell 11 of the through-hole capacitor 1 to be tested can contact the first electrode 1010, and its guide pin 12 can pass through the bottom of the first accommodating hole 1000. Four groups of second accommodating hole assemblies 200 are also provided on the lower plate 20, and each group of second accommodating hole assemblies 200 includes five second accommodating holes 2000. The second accommodating holes 2000 correspond to the first accommodating holes 1000 one by one. The second accommodating holes 2000 are used to engage the free end of the guide pin 12 of the through-hole capacitor 1 to be tested that passes through the first accommodating holes 1000. The second accommodating holes 2000 are specifically cylindrical blind holes, and their diameter is slightly greater than or equal to the diameter of the guide pin 12. A second electrode 2020 is provided in each second accommodating hole 2000. When the guide pin 12 of the through-hole capacitor 1 to be tested is engaged with the corresponding second accommodating hole 2000, it contacts the second electrode 2020. Each second accommodating hole 2000 is coaxial with the corresponding first accommodating hole 1000. In this way, when the housing 11 of the through-hole capacitor 1 to be tested is installed in the first accommodating hole 1000, its guide pin 12 is aligned with the second accommodating hole 2000 to ensure that the guide pin 12 can be smoothly inserted into the second accommodating hole 2000.

[0040] The lower plate 20 is provided with a protrusion 20a protruding from the bottom surface of the upper plate 10 along the extension direction of its top surface, and the end of the second conductive wiring 202 extends to the protrusion 20a. In this way, the second conductive wiring 202 arranged on the top surface of the lower plate 20 can be exposed to facilitate electrical connection with a screening device (not shown).

[0041] The existing screening device (not shown) has a first electrical connection end (such as the positive pole of the power supply) that can be electrically connected to the first electrode 1010 of the above-mentioned clamp, a second electrical connection end (such as the negative pole of the power supply) that can be electrically connected to the second electrode 2020, and a detection unit, wherein the detection unit is electrically connected to each first electrical connection end and each second electrical connection end respectively.

[0042] The above screening fixture can be connected to the screening device in two ways (not shown):

[0043] The first method: the first electrodes 1010 of the same group of first accommodating hole components 100 are all electrically connected to the first electrical connection end of the screening device (not shown), and the second electrodes 2020 of the same group of second accommodating hole components 200 are all electrically connected to a second electrical connection end of the screening device (not shown), so that the through-hole capacitors 1 to be tested placed in the same group of first accommodating hole components 100 form a closed circuit loop, and the through-hole capacitors 1 to be tested in the same group are connected in parallel, which is equivalent to forming a large through-hole capacitor. The through-hole capacitors 1 to be tested in different groups are also connected in parallel.

[0044] During the test, the screening device (not shown) outputs a high voltage. If the detection unit of the screening device (not shown) detects that the circuit loop of the same group of through-hole capacitors 1 to be tested is short-circuited or the current flowing through the circuit loop exceeds the set value, it means that at least one through-hole capacitor 1 to be tested in the circuit loop is in an abnormal state (for example, the insulating material in the through-hole capacitor 1 is broken down). In order to determine which one or several through-hole capacitors 1 in the group of through-hole capacitors 1 to be tested are short-circuited due to being in an abnormal state, further manual detection with a detection instrument is required to screen out unqualified products.

[0045] The second method: The screening device (not shown) has the same number of first electrical connection ends as the first receiving holes 1000, and the same number of second electrical connection ends as the second receiving holes 2000. The first electrode 1010 of each first receiving hole 1000 is electrically connected to the first electrical connection end, and the second electrode 2020 of each second receiving hole 2000 is electrically connected to the second electrical connection end, so as to form a closed circuit loop for each through-hole capacitor 1 to be tested, and each through-hole capacitor 1 to be tested is connected in parallel.

[0046] During the test, the screening device (not shown) outputs a high voltage. If the detection unit of the screening device (not shown) detects that the circuit loop where the through-hole capacitor 1 to be tested is located is short-circuited or the current flowing through the circuit loop exceeds the set value, it means that the through-hole capacitor 1 to be tested in the circuit loop is in an abnormal state, and the through-hole capacitor 1 to be tested is a defective product.

[0047] The above two methods have their own advantages and disadvantages. The first method can be used for large-scale initial screening, which is low-cost, but requires manual testing for further confirmation. The second method does not require additional manual operations and has high detection efficiency, but it increases the number of conductive wires and the difficulty of making the fixture, and the cost is relatively high.

[0048] Figure 3-4 It is based on the specific structure of the first method mentioned above, such as Figure 3-4As shown, the upper plate 10 is provided with 4 first conductive wirings 102, and the first electrodes 1010 in the same row of first receiving holes 1000 are electrically connected to the same first conductive wiring 102. The lower plate 20 is also provided with 4 second conductive wirings 202, and the second electrodes 2020 in the same row of second receiving holes 2000 are electrically connected to the same second conductive wiring 202. When in use, each first conductive wiring 102 is electrically connected to a first electrical connection terminal of a screening device (not shown), and each second conductive wiring 202 is electrically connected to a second electrical connection terminal of a screening device (not shown), and then the test is started. After the test, the through-hole capacitors 1 to be tested that have a short circuit or the current flowing through the circuit loop exceeds the set value are screened out, which are unqualified products. Then the next batch of through-hole capacitors 1 to be tested are reloaded into the screening fixture, and the above test steps are repeated.

[0049] In this way, by vertically inserting the through-hole capacitor 1 to be tested into the screening fixture, the number of through-hole capacitors 1 to be tested that can be accommodated in a unit area of ​​the screening fixture can be increased, and multiple through-hole capacitors 1 to be tested can be loaded at the same time to perform batch testing on the through-hole capacitors to be tested, which can greatly improve the testing efficiency.

[0050] Preferably, if Figure 5 As shown, the side wall of each first receiving hole 1000 is provided with four first electrodes 1010 distributed equidistantly along the circumferential direction. Figure 6 As shown, the first electrode 1010 has a spring structure 1010a protruding radially inwardly along the first accommodating hole 1000. In this way, when the through-hole capacitor 1 to be tested is placed in the first accommodating hole 1000, the spring structure 1010a of each first electrode 1010 abuts against the upper shell 111 of the through-hole capacitor 1 to be tested, so that the through-hole capacitor 1 to be tested is always located in the middle position of the first accommodating hole 1000, avoiding the through-hole capacitor 1 to be tested from being offset and having poor contact with the first electrode 1010. Of course, the number of first electrodes 1000 can also be 3, 5 or 6, etc., which is not limited here.

[0051] like Figure 7 As shown, the second electrode 2020 includes two arc-shaped spring pieces 2020a arranged opposite to each other, and the two arc-shaped spring pieces 2020a include a joint channel 2020b formed between them for the guide pin 12 of the through-hole capacitor 1 to be tested to penetrate, and the joint channel 2020b is specifically located at the axial position of the second accommodating hole 2000. The two arc-shaped spring pieces 2020a are inclined inward from top to bottom, so that the distance between the upper ends of the two arc-shaped spring pieces 2020a is greater than the distance between the lower ends, forming a trumpet-shaped structure that is wide at the top and narrow at the bottom. In this way, even if the guide pin 12 of the through-hole capacitor 1 to be tested is not aligned with the axial position of the second accommodating hole 2000, the second electrode 2020 with a trumpet-shaped structure can also allow the guide pin 12 to be smoothly connected to the joint channel 2020b.

[0052] Furthermore, in order to prevent the lower end of the shell 11 of the through-hole capacitor 1 to be tested from contacting the second electrode 2020 and causing a short circuit, the screening fixture further includes an insulating plate 30 , which is located between the upper plate 10 and the lower plate 20 . Figure 8-9 FIG. 2 shows the specific structure of another embodiment of the screening fixture for feedthrough capacitors. Figure 8-9 As shown, in this embodiment, the insulating plate 30 is provided with a third accommodating hole 3000 corresponding to the first accommodating hole 1000. The third accommodating hole 3000 is specifically a cylindrical through hole, which is coaxial with the first accommodating hole 1000. The diameter of the third accommodating hole 3000 is larger than the diameter of the lower part 112 of the shell of the through-hole capacitor 1 to be tested, and smaller than the diameter of the upper part 111 of the shell of the through-hole capacitor 1 to be tested. When the through-hole capacitor 1 to be tested is placed in the first accommodating hole 1000, the upper part 111 of the shell of the through-hole capacitor 1 to be tested is fixed in the first accommodating hole 1000, and the lower part 112 of the shell passes through the first accommodating hole 1000 and is accommodated in the third accommodating hole 3000. The depth of the third accommodating hole 3000 is larger than the axial length of the lower part 112 of the shell of the through-hole capacitor 1 to be tested. In this way, the lower part 112 of the shell of the through-hole capacitor 1 to be tested in the third receiving hole 3000 has a certain gap space from the lower plate 20, which can prevent the lower part 112 of the shell from contacting the second electrode 2020 in the second receiving hole 2000 of the lower plate 20 and causing a short circuit. Preferably, the upper opening of the third receiving hole 3000 is a bell-mouth structure with the opening facing outward. In this way, when the through-hole capacitor 1 to be tested is installed, even if the lower part 112 of the shell of the through-hole capacitor 1 to be tested is not completely aligned with the third receiving hole 3000, the lower part 112 of the shell can be smoothly dropped into the third receiving hole 3000 through the upper opening of the bell-mouth structure.

[0053] Of course, in addition to the cylindrical through hole, the third accommodating hole 3000 can also be a cylindrical blind hole. In this embodiment, the bottom wall of the third accommodating hole 3000 is provided with a positioning through hole for the guide pin 12 of the through-hole capacitor 1 to be tested to pass through, and the diameter of the positioning through hole is smaller than the cross-sectional area of ​​the lower part 112 of the shell of the through-hole capacitor 1 to be tested. In this way, the lower part 112 of the shell can be fixed in the third accommodating hole 3000, and the bottom wall of the third accommodating hole 3000 blocks the contact between the lower part 112 of the shell and the second electrode 2020 to avoid short circuit.

[0054] Combination Figure 8 and Fig.10The upper plate 10 is provided with a first positioning through hole 104, and the lower plate 20 is provided with a second positioning through hole 204 corresponding to the first positioning through hole 104. The upper plate 10 can be detachably fixed on the lower plate 20 by a fastening assembly 40 that passes through the first positioning through hole 104 and the second positioning through hole 204. In this embodiment, the fastening assembly 40 includes a screw rod 41 and a nut 42 adapted to the screw rod 41. Specifically, the tail end of the screw rod 41 passes through the first positioning through hole 104 and the second positioning through hole 204, and the nut 42 is engaged with the tail end of the screw rod 41 to fix the upper plate 10 and the lower plate 20. Of course, when the screening fixture includes an insulating plate 30, the insulating plate 30 is provided with a third positioning through hole 304 corresponding to the first positioning through hole 104 and the second positioning through hole 204. In this embodiment, the screw 41 of the fastening assembly 40 passes through the first positioning through hole 104, the third positioning through hole 304 and the second positioning through hole 204 to detachably fix the insulating plate 30 and the upper plate 10 in turn on the lower plate 20.

[0055] Compared with the prior art, the screening fixture of the through-hole capacitor of the utility model realizes loading multiple through-hole capacitors to be tested at the same time by providing a receiving space for vertical insertion and installation of the through-hole capacitors to be tested, so as to perform batch testing on the through-hole capacitors to be tested, and effectively improve the test efficiency; in addition, the vertical insertion loading method is adopted, which increases the through-hole capacitors to be tested per unit area of ​​the screening fixture, which is further conducive to improving the test efficiency. Moreover, the screening fixture has a simple structure, is easy to assemble and disassemble, and is highly practical.

[0056] The above-mentioned embodiments only express several implementation methods of the utility model, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the utility model patent. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the utility model, and the utility model is also intended to include these modifications and modifications.

Claims

1. A screening fixture for feedthrough capacitors, used for loading the feedthrough capacitors to be tested (1), characterized in that: It comprises an upper plate (10), and a lower plate (20) arranged below the upper plate (10); The upper plate (10) is provided with m groups of first accommodating hole assemblies (100) for accommodating the shell (11) of the through-hole capacitor (1) to be tested, each first accommodating hole assembly (100) comprising n first accommodating holes (1000), wherein m≥2 and n≥1; A first electrode (1010) capable of contacting the housing (11) is disposed in each first accommodating hole (1000); the bottom of the first accommodating hole (1000) allows a guide pin (12) of the through-hole capacitor (1) to be tested to pass through, and the first electrode (1010) and the guide pin (12) do not contact each other; The lower plate (20) is provided with m groups of second accommodating hole assemblies (200) for engaging the guide needle (12), each second accommodating hole assembly (200) comprising n second accommodating holes (2000), the second accommodating holes (2000) corresponding one-to-one with the first accommodating holes (1000), the second accommodating holes (2000) being provided with second electrodes (2020) capable of contacting the guide needle (12) when engaging with the guide needle (12), and the second electrodes (2020) and the housing (11) not contacting each other; The first electrode and the second electrode are respectively used for connecting to a screening device.

2. The screening fixture for feedthrough capacitors according to claim 1, characterized in that: The upper plate (10) is provided with m first conductive wirings (102), and the first electrodes (1010) in the same group of n first receiving holes (1000) are all electrically connected to the same first conductive wiring (102), and each first conductive wiring (102) is respectively electrically connected to the first electrical connection end of the screening device; the lower plate (20) is provided with m second conductive wirings (202), and the second electrodes (2020) in the same group of n second receiving holes (2000) are electrically connected to the same second conductive wiring (202), and each second conductive wiring (202) is respectively electrically connected to the second electrical connection end of the screening device.

3. The screening fixture for feedthrough capacitors according to claim 2, characterized in that: The first accommodating holes (1000) on the upper plate (10) and the second accommodating holes (2000) on the lower plate (20) are respectively arranged in a matrix of a rows and b columns, wherein a*b=m*n, a≥2, b≥1, or a≥1, b≥2.

4. The screening fixture for feedthrough capacitors according to claim 1, characterized in that: The first electrode (1010) in each first receiving hole (1000) is respectively electrically connected to the first electrical connection end of the screening device, and the second electrode (2020) in each second receiving hole (2000) is respectively electrically connected to the second electrical connection end of the screening device.

5. The screening fixture for feedthrough capacitors according to any one of claims 1 to 4, characterized in that: The side wall of each first accommodating hole (1000) is provided with at least three first electrodes (1010) distributed equidistantly in the circumferential direction, and the first electrode (1010) has a spring structure (1010a) protruding radially inwardly along the first accommodating hole (1000).

6. The screening fixture for feedthrough capacitors according to any one of claims 1 to 4, characterized in that: The second electrode (2020) comprises at least two arc-shaped spring sheets (2020a), a joining channel (2020b) for the guide needle (12) to penetrate is formed between the two arc-shaped spring sheets (2020a), and the distance between the upper ends of the two arc-shaped spring sheets (2020a) is greater than the distance between their lower ends.

7. The screening fixture for feedthrough capacitors according to claim 1, characterized in that: It also includes an insulating plate (30) disposed between the upper plate (10) and the lower plate (20), the insulating plate (30) being provided with third accommodating holes (3000) corresponding one-to-one to the first accommodating holes (1000), the third accommodating holes (3000) being through holes for accommodating a portion of the shell (11) of the through-hole capacitor (1) to be tested that passes through the first accommodating holes (1000); The area of ​​the third accommodating hole (3000) is greater than or equal to the area of ​​the minimum cross section of the shell (11) perpendicular to the guide pin (12), and is smaller than the area of ​​the maximum cross section of the shell (11) perpendicular to the guide pin (12), and the depth of the third accommodating hole (3000) is greater than the axial length of the portion of the through-hole capacitor (1) to be tested that passes through the first accommodating hole (1000).

8. The screening fixture for feedthrough capacitors according to claim 1, characterized in that: The invention also comprises an insulating plate (30) arranged between the upper plate (10) and the lower plate (20); the insulating plate (30) is provided with a third accommodating hole (3000) corresponding to the first accommodating hole (1000) in a one-to-one manner; the third accommodating hole (3000) is a blind hole used to accommodate a portion of the through-hole capacitor (1) to be tested that passes through the first accommodating hole (1000); the bottom wall of the third accommodating hole (3000) is provided with a positioning through hole for the guide pin (12) to pass through; the area of ​​the positioning through hole is smaller than the area of ​​the minimum cross section of the housing (11) perpendicular to the guide pin (12).

9. The screening fixture for feedthrough capacitors according to claim 7 or 8, characterized in that: The upper opening of the third accommodating hole (3000) is a bell-mouth structure.

10. The screening fixture for feedthrough capacitors according to claim 7 or 8, characterized in that: The third accommodating hole (3000), the second accommodating hole (2000) and the first accommodating hole (1000) are coaxial.

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