Universal clamp for aging and testing plate capacitor

Abstract

The utility model discloses a universal clamp for aging and testing a plate capacitor. The universal clamp is composed of a clamp probe plate and a plate capacitor loading plate. The clamp probe plate is provided with a probe array matched with a hole electrode on the plate capacitor on the loading plate and a conductive electrode on the loading plate; the bottom of the clamp probe plate is provided with an electrode array used for being connected with the probe array on the burn-in board. And the electrode array is also matched with a test probe card on a plate capacitor test machine. The clamp provided by the utility model can be used for aging and testing, the compatibility of the aging clamp and the testing clamp is realized, the cost of the clamp is reduced, the operation of replacing products is simplified, the flexible testing mode of the plate capacitors with smaller production quantity and more varieties can be met, and the production efficiency is improved. And a batch measurement mode with relatively large production quantity and relatively high test speed can be met.

Description

Technical Field

[0001] The utility model relates to a universal fixture for aging and testing of flat-plate capacitors. Background Art

[0002] Flat capacitors are mainly used in plugs, sockets or connectors with filtering functions. Flat capacitors are usually composed of multilayer ceramic capacitor plates with multiple metallized through-hole electrodes (metal ring parts formed by metallized holes and horizontal metallized flanges of the holes). The outer edge of the flat capacitor is also metallized and usually connected to the ground of the plug, socket or connector. Welding pins or elastic socket parts will be installed in the through holes of the through-hole electrodes.

[0003] Before installing the pin or jack components, the four parameters of withstand voltage, insulation resistance, capacity, and loss between adjacent hole electrodes in the flat capacitor and between the hole electrodes and the metallized parts around the outer edge defined as the ground need to be tested. The withstand voltage test and insulation resistance test need to last for a certain period of time, and the total time required for the test of multiple electrodes is relatively long. High-grade flat capacitors also need to be heated and powered on for aging. Because flat capacitors usually have a large number of types, there are hundreds or thousands of types, most of which are produced in small quantities, and a small number of them are produced in large quantities. In actual production, the testing and aging equipment is required to meet the flexible testing mode of flat capacitors with small production quantities and more varieties (the test speed does not need to be too fast at this time), and can also meet the batch measurement mode with large production quantities and faster test speeds. Since each type of flat capacitor requires a dedicated test and aging fixture, it is necessary to prepare many different fixtures, and reducing the cost of each fixture and simplifying the operation of replacing products becomes the most important goal. If the test fixture and the aging fixture cannot be used at the same time, the total cost of the fixture will also be greatly increased. Now we need to have a fixture that is both low-cost and easy to operate to meet the aging or testing of various types of flat-plate capacitors. It is best to make the aging fixture and the test fixture compatible and shared to the greatest extent. The aging machine can use the aging board inserted into it to connect the capacitor to be aged with the socket set at the end of the aging board using a specially designed connection method, which can realize the power-on heating aging with online monitoring function for as many flat-plate capacitors as possible. The test machine includes both normal temperature test machines and high temperature and low temperature test machines. The high temperature and low temperature test machines perform parameter tests in high temperature and low temperature environments.

[0004] There is no flat capacitor aging fixture that meets the above requirements. Although there are test fixtures and test equipment that meet flexible production requirements, such as the test method and device proposed in patent announcement number: CN218240168U, the test fixture cannot be used for aging fixtures, and no aging fixture solution that is both easy to operate and compatible with the test fixture has been proposed. Utility Model Content

[0005] The purpose of the utility model is to overcome the defects in the prior art and provide a universal fixture for aging and testing of flat-plate capacitors, which can be used for both aging and testing, thereby achieving compatibility between the aging fixture and the test fixture, reducing the cost of the fixture, simplifying the operation of replacing products, and meeting the flexible test mode of flat-plate capacitors with a small production quantity and a large variety, as well as the batch measurement mode with a large production quantity and a faster test speed requirement.

[0006] To achieve the above-mentioned purpose, the technical solution of the utility model is to design a universal fixture for aging and testing of flat capacitors, which is composed of a fixture probe plate and a flat capacitor loading plate; the fixture probe plate is provided with a probe array adapted to the hole electrodes on the flat capacitor on the loading plate and the conductive electrodes on the loading plate;

[0007] The bottom of the fixture probe board is provided with an electrode array for connecting with the probe array on the aging board; the aforementioned electrode array is also matched with the test probe card on the flat-plate capacitor tester.

[0008] A further technical solution is that the electrode array is also matched with the probe array set on the test needle board, the probe array on the test needle board corresponds one-to-one with the multi-channel plug on the end of the test needle board, and the multi-channel plug matches the test board socket on the high temperature test machine or the low temperature test machine.

[0009] A further technical solution is that the probe array on the aging board is connected to a multi-channel plug on the end of the aging board, and the multi-channel plug matches the aging board socket on the aging machine.

[0010] A further technical solution is that the universal fixture is used for tunnel furnace-type high-temperature testers, low-temperature testers, or tunnel furnace-type high and low-temperature testers, or only for high-temperature testers; a test probe card is used in the tunnel furnace, and a probe array matching the electrode array at the bottom of the fixture probe board is set on the test probe card. No plugs and sockets are used for normal temperature testing. The test contacts on the test probe card are directly connected to the test machine and are touched by the test machine. It is a mobile measurement (after measuring one, unloading and loading and unloading, and then measuring the next one), unlike aging or high and low temperature testing, which requires staying still in the test machine for a period of time.

[0011] A further technical solution is that a positioning groove for a flat plate capacitor is provided on the loading board, and a resilient contact for contacting the metallized frame of the flat plate capacitor is provided on the side wall of the positioning groove, and the resilient contact is connected to a conductive electrode on the loading board for external contact.

[0012] A further technical solution is that a probe array is provided on the fixture probe plate for contacting the hole electrodes on the plate capacitor in the positioning groove of the loading plate and the conductive electrodes on the loading plate for contacting the outside and connecting the elastic contacts on the edge of the positioning groove.

[0013] A further technical solution is that the positioning groove is adapted to the flat plate capacitor, the hole electrode of the flat plate capacitor runs through the flat plate capacitor, and an opening is provided on the bottom wall of the positioning groove.

[0014] A further technical solution is that one fixture probe plate is provided and is located below the loading plate; or two fixture probe plates are provided and are located above and below the loading plate respectively.

[0015] A further technical solution is that the two fixture probe plates are respectively an upper fixture probe plate and a lower fixture probe plate, the upper fixture probe plate and the lower fixture probe plate are respectively connected to the upper and lower ends of the hole electrodes of the flat plate capacitor, the upper fixture probe plate is installed on the loading plate, and the lower fixture probe plate is installed on the lower needle plate assembly;

[0016] A further technical solution is that an electrode array is provided at the bottom of the lower fixture probe board, which contacts the probe array on the aging board.

[0017] The advantages and beneficial effects of the utility model are that it can be used for both aging and testing, achieving compatibility between the aging fixture and the test fixture, reducing the cost of the fixture, simplifying the operation of replacing products, and meeting the flexible test mode of flat-plate capacitors with a small production quantity and a large variety, as well as the batch measurement mode with a large production quantity and a faster test speed. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a schematic diagram of a first embodiment of a universal fixture for aging and testing of flat capacitors of the utility model;

[0019] Figure 2 yes Figure 1 A top view of

[0020] Figure 3 yes Figure 1 An exploded schematic diagram of a front view of

[0021] Figure 4 yes Figure 3 An enlarged schematic diagram of the upper left portion of the middle;

[0022] Figure 5 yes Figure 3 An enlarged schematic diagram of the middle part of the left end;

[0023] Figure 6 yes Figure 3 Side view of

[0024] Figure 7 is as to Figure 1 A schematic diagram of a flat plate capacitor in a positioning groove;

[0025] Figure 8 It is a schematic diagram of the second embodiment of the utility model;

[0026] Fig. 9 yes Figure 8 A top view of

[0027] Fig.10 yes Figure 8 An exploded schematic diagram of a front view of

[0028] Fig.11 yes Fig.10 An enlarged schematic diagram of the upper left portion of the middle;

[0029] Fig.12 yes Fig.10 An enlarged schematic diagram of the middle part of the left end;

[0030] Fig.13 yes Fig.10 Side view of

[0031] Fig.14 yes Fig.11 Schematic diagram of the flat plate capacitor located below the probe array;

[0032] Fig.15 This is a schematic diagram of the arrangement of large-pitch flat-plate capacitor probes;

[0033] Fig.16 yes Fig.15 The main view;

[0034] Fig.17 yes Fig.15 Bottom view of the middle plate capacitor and the elastic contact portion;

[0035] Fig.18 This is a schematic diagram of the arrangement of small-pitch flat-plate capacitor probes;

[0036] Fig.19 yes Fig.18 A top view of the plate capacitor in the middle;

[0037] Fig. 20 yes Fig.18 Bottom view of the plate capacitor.

[0038] In the figure: 1. Fixture probe plate; 2. Loading plate; 3. Positioning groove; 4. Elastic contact; 5. Conductive electrode; 6. Probe array; 7. Hole electrode; 8. Aging board; 9. Electrode array; 10. Plug; 11. Lower needle board assembly. DETAILED DESCRIPTION

[0039] The following is a further description of the specific implementation of the present invention in conjunction with the accompanying drawings and embodiments. The following embodiments are only used to more clearly illustrate the technical solution of the present invention, and cannot be used to limit the protection scope of the present invention.

[0040] like Figures 1 to 20As shown ( Figure 7 The middle one is a flat plate capacitor with large spacing between hole electrodes; Fig.14 The utility model is a universal fixture for aging and testing of a flat capacitor, which adopts a flat capacitor fixture with uniform outer dimensions and is composed of a fixture probe plate 1 and a flat capacitor loading plate 2.

[0041] The loading plate 2 is provided with a flat plate capacitor positioning groove 3, and the edge of the positioning groove 3 is provided with an elastic contact 4 that contacts the metallized frame of the flat plate capacitor, and the elastic contact 4 is connected to a conductive electrode 5 on the loading plate 2 that can be contacted to the outside;

[0042] The fixture probe board is provided with a probe array 6 for contacting the hole electrode 7 on the plate capacitor in the positioning groove 3 of the loading plate and the externally contacting conductive electrode 5 on the loading plate connected to the elastic contact on the edge of the positioning groove;

[0043] The fixture can be mounted on the aging board 8, and an array of electrical connection channels realized by elastic contact is provided between the aging board 8 and the fixture.

[0044] The positioning groove on the flat capacitor carrier, the flat capacitor is in the positioning groove, its hole electrode is exposed outward, and a fixture probe plate can be used to contact the hole electrode 7 on the flat capacitor. This solution is suitable for flat capacitors with low-density hole electrodes.

[0045] The bottom of the positioning groove on the flat capacitor carrier is provided with an opening. The two sides of the electrode hole 7 of the flat capacitor are exposed to the outside in the positioning groove. The probes on the upper and lower fixture probe boards can be used to contact the hole electrodes 7 on the two surfaces of the flat capacitor in a staggered manner. The upper fixture probe board contacts the fixture probe board interconnection contact array set on the lower probe board through the fixture probe card interconnection probe array set separately. The array is connected to the electrode array 9 that can be contacted to the outside and is set at the bottom of the lower fixture probe board. The electrode array 9 that can be contacted to the outside and is set at the bottom of the lower fixture probe board can contact the probe array on the aging board 8. This scheme is suitable for flat capacitors with high-density hole electrodes.

[0046] A probe array is provided on the aging board 8, which is used to contact the electrode array 9 that is accessible to the outside and is provided at the bottom of the contact fixture probe board. The probe array on the aging board is connected to a multi-channel plug 10 on the end of the aging board, and the plug 10 can be inserted into the aging board socket on the aging machine.

[0047] The flat plate capacitor fixture can be used in a normal temperature flat plate capacitor tester, which is provided with a test probe card that can contact the external contact electric array (i.e., electrode array 9) provided at the bottom of the fixture probe plate on the flat plate capacitor fixture to complete the parameter test of the flat plate capacitor in the fixture. Normal temperature testing does not require plugging and has no terminals.

[0048] The flat capacitor fixture can be installed on a test pin board with a plug at the end. The test pin board is provided with a probe array for contacting an electrode array 9 that is contactable to the outside and is provided at the bottom of the probe board of the contact fixture. The probe array on the test pin board corresponds one-to-one to a multi-channel plug 10 on the end of the test pin board. The plug 10 can be inserted into the test board socket on a high-temperature or low-temperature test machine, or only inserted into the test board socket on a high-temperature test machine.

[0049] The flat plate capacitor fixture can be used in a tunnel furnace type high temperature test machine, a low temperature test machine, or a tunnel furnace type high and low temperature test machine, or only in a high temperature test machine. A test probe card is used in the tunnel furnace to contact the external contact electric array (i.e., electrode array 9) provided at the bottom of the fixture probe plate on the flat plate capacitor fixture to complete the parameter test of the flat plate capacitor in the fixture.

[0050] Embodiment 1:

[0051] The large-pitch flat-plate capacitor probes are arranged, and the probe array 6 is mounted on the fixture base.

[0052] Embodiment 2:

[0053] The difference from the first embodiment is that the probes of the flat capacitor with small pitch are arranged; the upper fixture probe plate is mounted on the loading plate, the lower fixture probe plate is mounted on the lower needle plate assembly 11; the lower probe array 6 is mounted on the fixture base; and the upper probe array 6 is mounted on the loading plate. The lower probe array and the upper probe array are staggered, and the whole formed by all the probes of the lower probe array and the upper probe array corresponds to all the hole electrodes on the flat capacitor.

[0054] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the technical principle of the present invention. These improvements and modifications should also be regarded as the protection scope of the present invention.

Claims

1. A universal fixture for plate capacitor aging and testing. It is characterized in that It consists of a fixture probe plate and a flat capacitor loading plate; the fixture probe plate is provided with a probe array that matches the hole electrodes on the flat capacitor on the loading plate and the conductive electrodes on the loading plate; The bottom of the fixture probe board is provided with an electrode array for connecting with the probe array on the aging board; the aforementioned electrode array is also matched with the test probe card on the flat-plate capacitor tester.

2. A universal fixture for aging and testing of flat capacitors according to claim 1, It is characterized in that The electrode array also matches the probe array arranged on the test needle board.

3. A universal fixture for aging and testing of flat capacitors according to claim 2, It is characterized in that The probe array on the test needle board corresponds one by one to the multi-channel plug on the end of the test needle board, and the multi-channel plug matches the test board socket on the high temperature test machine or the low temperature test machine.

4. A universal fixture for aging and testing of flat capacitors according to claim 2, It is characterized in that The probe array on the aging board is connected to a multi-channel plug on the end of the aging board, and the multi-channel plug matches the aging board socket on the aging machine.

5. A universal fixture for aging and testing of flat capacitors according to claim 4, It is characterized in that The universal fixture is used for a low temperature tester, or a high and low temperature tester, or only for a high temperature tester; the low temperature tester, the high and low temperature tester, or the high temperature tester uses a test probe card, on which a probe row matching the electrode array at the bottom of the fixture probe board is arranged.

6. A universal fixture for aging and testing of flat capacitors according to claim 5, It is characterized in that The loading board is provided with a positioning groove for the flat plate capacitor, and the groove sidewall of the positioning groove is provided with an elastic contact for contacting the metallized frame of the flat plate capacitor, and the elastic contact is connected to a conductive electrode on the loading board for external contact.

7. A universal fixture for aging and testing of flat capacitors according to claim 6, It is characterized in that The fixture probe board is provided with a probe array for contacting the hole electrodes on the plate capacitor in the positioning groove of the loading plate and the conductive electrodes on the loading plate that are connected to the elastic contacts on the edge of the positioning groove and contact the outside.

8. A universal fixture for aging and testing of flat capacitors according to claim 7, It is characterized in that The positioning groove is matched with the flat plate capacitor, the hole electrode of the flat plate capacitor runs through the flat plate capacitor, and an opening is arranged on the bottom wall of the positioning groove.

9. A universal fixture for aging and testing of flat plate capacitors according to claim 8, It is characterized in that The fixture probe plate is provided with one piece and is located below the loading plate; or the fixture probe plate is provided with two pieces and is located above and below the loading plate respectively.

10. A universal fixture for aging and testing of flat capacitors according to claim 9, It is characterized in that The two fixture probe plates are an upper fixture probe plate and a lower fixture probe plate. The upper fixture probe plate and the lower fixture probe plate are respectively connected to the upper and lower ends of the hole electrodes of the flat plate capacitor. The upper fixture probe plate is installed on the loading plate, and the lower fixture probe plate is installed on the lower needle plate assembly.

11. A universal fixture for aging and testing of flat capacitors according to claim 10, It is characterized in that An electrode array in contact with the probe array on the aging board is provided at the bottom of the lower fixture probe board.

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