Periscope system

Abstract

The utility model relates to a periscope system for focusing and aiming an x-ray streak camera outside a target chamber. In a laser fusion experiment, an x-ray streak camera is crucial to observation of self-illumination of x-rays, however, diagnosis arrangements in a target chamber are various, and aiming in the target chamber is very inconvenient. In order to solve the problem, a periscope system which is formed by combining three reflectors and a semi-reflecting and semi-transmitting mirror and debugged to auto-collimation is embedded into a flight tube, images of a target ball, a pinhole and a camera slit are led to an outside point, and then focusing observation equipment is used for aiming. By means of the periscope system, aiming of the x-ray streak camera can be more convenient and simpler, the x-ray streak camera does not need to enter the target chamber, no space for containing a long-focal-length telescope in the target chamber and interference and influence on other diagnostic equipment in the aiming process do not need to be considered, experiments can be conducted smoothly, and normal work of other diagnostic equipment is guaranteed.

Description

Technical Field

[0001] The utility model relates to a periscope system, which uses a periscope system composed of an optical system to realize the aiming of an X-ray streak camera in a laser fusion experiment. Background Art

[0002] In laser inertial confinement fusion experiments, the detection of x-ray spontaneous emission is crucial. The typical duration of the core plasma of a fusion implosion is several hundred picoseconds, so a diagnostic device with a time resolution of tens of picoseconds is needed to better detect it. Ultrafast time-resolution devices such as x-ray streak cameras are often used in this field. Generally, an x-ray streak camera will be combined with a slit perpendicular to the streak camera slit at the front end to image, and obtain the one-dimensional spatial evolution of the imploding plasma over time. In order to obtain better imaging quality, the front slit is often replaced with a pinhole and then combined with the slit inside the streak camera for imaging. This can avoid the influence of image overlap caused by slit imaging, but it will also make it more difficult to aim the light. If you want to adjust the pinhole to the axis of the target ball and the slit of the x-ray streak camera, you need high-precision adjustment and observation equipment. The commonly used aiming scheme is to use an adjustable focus observation device as an imaging device and place it in the target room, placed in front of the pinhole and the target ball, and observe the three objects to be tested behind by adjusting the focal length. First, remove the pinhole of the third object to be tested, adjust the translation and swing of the adjustable focus observation device as an imaging device, let the center of its cross reference line coincide with the center of the slit of the second object to be tested streak camera and the center of the first object to be tested target ball, fix the imaging device, so that the reference line of the optical path can be determined. As long as the stability of the imaging device is guaranteed, the pinhole of the third object to be tested can be adjusted to the reference line of the optical path. Then install the pinhole of the third object to be tested, adjust the focal length of the imaging device so that its focus is placed on the pinhole of the third object to be tested, and use the differential head outside the target room to adjust the position of the pinhole of the third object to be tested so that it is located at the center of the cross reference line of the imaging device, so that the whole aiming is completed. However, in laser fusion experiments, multiple diagnostic devices work together to detect various physical parameters of plasma, so there are many diagnostic devices inside the target room and the arrangement is complicated. In this case, it is even more difficult to enter the target room to aim the x-ray streak camera, so it is very necessary to design an aiming scheme outside the target room. We have designed a periscope system that uses optical principles to reflect the images of the target ball, pinhole and slit to outside the target room for aiming. This makes the aiming of the X-ray streak camera more convenient and simpler. There is no need to enter the target room, and there is no need to worry about the lack of space in the target room to place the imaging device and the interference and impact on other diagnostic equipment during the aiming process. Summary of the invention

[0003] In order to overcome the limitations brought by the traditional aiming in the target room, the utility model provides a periscope system to realize the solution of aiming the light of the X-ray streak camera outside the target room.

[0004] A periscope system, comprising:

[0005] Imaging device;

[0006] A first reflector, with the line connecting the first object to be measured and the second object to be measured as a reference axis, the first reflector is placed at 45 degrees to the reference axis and the reflective surface of the first reflector faces the first object to be measured, and is used to reflect the images of the first object to be measured and the third object to be measured to the third reflector;

[0007] A second reflector, wherein the second reflector and the first reflector are on the same axis of the reference axis, and the second reflector and the first reflector are placed at 90 degrees, and the reflecting surface of the second reflector faces the second object to be measured, and is used to reflect the image of the second object to be measured onto the semi-reflecting and semi-transmissive mirror;

[0008] a third reflector, wherein the third reflector and the first reflector are arranged perpendicular to the reference axis, and a reflective surface of the third reflector is parallel to a reflective surface of the first reflector, so that images of the first object to be measured and the third object to be measured reflected from the first reflector are reflected and transmitted to the imaging device through the semi-reflective and semi-transparent mirror;

[0009] A half-reflecting half-mirror, wherein the half-reflecting half-mirror and the second reflector are arranged perpendicular to the reference axis, and the line connecting the half-reflecting half-mirror and the third reflector is parallel to the reference axis, the mirror surface of the half-reflecting half-mirror is parallel to the third reflector and perpendicular to the second reflecting surface, and the half-reflecting half-mirror reflects the image of the second object to be measured from the second reflector onto the imaging device to overlap with the images of the first object to be measured and the third object to be measured.

[0010] In one embodiment, the periscope system includes an adjustable optical frame connected to the half-reflecting and half-mirror, and is used to adjust the angles of the first reflector, the second reflector, the third reflector and the half-reflecting and half-mirror.

[0011] In one of the embodiments, the periscope system further includes a support rod connected to the first reflector, the second reflector, the third reflector, and the semi-reflective and semi-transparent mirror for support and fixation.

[0012] In one embodiment, in the periscope system, the first reflector is 1 inch, uncoated, has an incident angle of 45°, and a reflection wavelength of 350nm-1600nm.

[0013] In one embodiment, in the periscope system, the second reflector is 1 inch, uncoated, has an incident angle of 45°, and a reflection wavelength of 350nm-1600nm.

[0014] In one embodiment, in the periscope system, the third reflector is 1 inch, non-coated, has an incident angle of 45°, and a reflection wavelength of 350nm-1600nm.

[0015] In one of the embodiments, in the periscope system, the semi-reflective and semi-transparent lens is 1 inch and has a transmittance of 50%.

[0016] In one embodiment, in the periscope system, the support rod is made of tungsten steel, has a diameter of 6 mm and a length of 50 cm.

[0017] We embed a periscope system composed of three reflectors and a semi-reflective and semi-mirror into the flight tube outside the target room in the whole device, use two reflectors to reflect the images of the first and third objects to be tested to the outside of the target room, and then use a reflector and a semi-reflective and semi-mirror to guide the image of the second object to be tested to the same optical axis as the image reflected by the pinhole and the target ball, so that the semi-reflective and semi-mirror can reflect the image of the second object to be tested and can also pass through the images of the first and third objects to be tested, and put them on the same optical path, and then use an adjustable focus observation device as an imaging device to observe at the back, and observe the images of the first, second and third objects to be tested by adjusting the focal length. Before installation, the optical system needs to be fixed together with a support rod combination, and then two pinholes are used outside the target room and the mirrors are adjusted through the frame to make the optical system self-aligned, and then put it into the flight tube, so that the light aiming outside the target room can be well achieved.

[0018] The beneficial effect of the utility model is that it can make the aiming of the X-ray streak camera more convenient and simple, without entering the target room, and without considering that there is no space in the target room to place the focusable observation equipment and that interference and influence on other diagnostic equipment is caused during the aiming process, which is conducive to the smooth progress of the experiment and ensures the normal operation of other diagnostic equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 Schematic diagram of the periscope system aiming.

[0020] Figure 2 Oblique view of the periscope system

[0021] Figure 3 Front view of the periscope system

[0022] Figure 4 Schematic diagram of an embodiment of a periscope system.

[0023] Main component symbols

[0024] The first object to be tested 01

[0025] The third object to be tested 02

[0026] The first adjustable optical frame 03

[0027] First Reflector 04

[0028] Second adjustable optical frame 05

[0029] Second reflector 06

[0030] The third adjustable optical frame 07

[0031] The third reflector 08

[0032] Fourth adjustable optical frame 09

[0033] Half-reflective half-mirror 10

[0034] The second object to be tested 11

[0035] Imaging device 12 DETAILED DESCRIPTION

[0036] In order to make the technical means, creative features, objectives and effects of this aiming solution easy to understand, the optical diagnostic instrument is further explained below with the help of diagrams.

[0037] like Figure 1As shown, this embodiment provides a periscope aiming system, including: a first object to be tested 01, which may be a target ball; a third object to be tested 02, which may be a pinhole; a first adjustable optical frame 03, a first reflector 04, a second adjustable optical frame 05, a second reflector 06, a third adjustable optical frame 07, a third reflector 08, a fourth adjustable optical frame 09 and a half-reflecting half-mirror 10. The first object to be tested 01 is the x-ray luminous area to be observed during the experiment, and can be a target ball placed in the luminous area during the experiment during aiming. The target ball serves as a reference for the x-ray streak camera to aim at light in a non-working state, and its spatial position is adjusted by the target field. The third object to be tested 02 is an object to be tested outside the target room, and can be a slit of the x-ray streak camera, which is closed inside the x-ray streak camera and cannot be observed from outside the camera after being installed and connected to the flight tube. The first adjustable optical frame 03, the second adjustable optical frame 05, the third adjustable optical frame 07 and the fourth adjustable optical frame 09 are used to adjust the posture of the mirrors installed inside. The first reflector 04 is used to reflect the images of the first object to be tested 01 and the third object to be tested 02 to the third reflector 08, which is arranged between the second object to be tested 11 and the third object to be tested 02, and is placed at 45° to the reference axis formed by the line connecting the midpoints of the first object to be tested 01 and the second object to be tested 11, and the reflective surface faces the first object to be tested 01. The second reflector 06 is used to reflect the image of the second object to be tested to the semi-reflective and semi-transparent mirror 10, which is arranged between the first reflector 04 and the second object to be tested 11, and is placed at 90° to the first reflector 04, and the reflective surface faces the second object to be tested 11. The third reflector 08 is used to reflect the images of the first object to be measured 01 and the third object to be measured 02 reflected by the first reflector 04 to the imaging device 12. It is arranged above the first reflector 04 and the line connecting the first reflector 04 is perpendicular to the reference axis formed by the line connecting the midpoints of the first object to be measured 01 and the second object to be measured 11. The reflecting surface is parallel to the reflecting surface of the first reflector 04. The semi-reflective and semi-transparent mirror 10 is used to transmit the images of the first object to be measured 01 and the third object to be measured 02 reflected by the third reflector 08 and reflect the image of the second object to be measured 11 reflected by the second reflector 06. It is arranged above the second reflector 06, the line connecting the second reflector 06 is perpendicular to the reference axis formed by the line connecting the midpoints of the first object to be measured 01 and the second object to be measured 11, and the line connecting the second reflector 06 is parallel to the reference axis formed by the line connecting the midpoints of the first object to be measured 01 and the second object to be measured 11. The mirror surface is parallel to the third reflector 08 and perpendicular to the second reflector 06.

[0038] The oblique view of the periscope system is as follows Figure 2 As shown, the front view of the periscope system is as follows Figure 3First, the first reflector 04, the second reflector 06, the third reflector 08 and the half-reflecting half-mirror 10 are respectively installed in the first adjustable optical frame 03, the second adjustable optical frame 05, the third adjustable optical frame 07 and the fourth adjustable optical frame 09, and then the four adjustable optical frames are connected and fixed together with a support rod, two pinholes are placed on both sides, and the entire periscope aiming system is placed between the two pinholes, and observed through the adjustable focus observation device 12, and the angle adjustment knob of the adjustable optical frame is adjusted to make the entire periscope aiming system self-aligned.

[0039] The basic operating principle is to first determine the reference axis of the first object to be tested 01 and the second object to be tested 11, and then adjust the third object to be tested 02 to the reference axis. However, once the x-ray streak camera is connected and fixed to the flight tube, it cannot be observed, and the position of the second object to be tested 11, i.e., the slit, cannot be accurately determined. Moreover, once the experiment begins, it is impossible to enter the target room to aim it. In order to adjust the third object to be tested 02 to the central axis of the first object to be tested 01 and the second object to be tested 11, i.e., the slit of the x-ray streak camera, outside the target room, it is necessary to reflect the images of these three objects to the outside and then use the focusable imaging device 12 to observe and monitor, and then use the adjustment device to adjust the position of the pinhole to complete the light aiming of the x-ray streak camera.

[0040] Below Figure 4 Take as an example to illustrate the working process of the periscope system.

[0041] First, adjust the target ball of the first object to be tested to the x-ray luminous area in the experiment as the aiming reference, then put the self-collimated periscope aiming system into the flight tube of the target room opening outside the pinhole camera device coupled with the x-ray streak camera and fix it, remove the third object to be tested 02, use strong light to illuminate the target ball and the slit at the opening of the flight tube, adjust the focal length of the imaging device 12 to observe the first object to be tested 01 and the second object to be tested 11, then adjust the two-dimensional translation and swing of the imaging device 12 so that the centers of the first object to be tested 01 and the second object to be tested 11 are both located at the center of the cross reference line. At this time, the imaging device 12 will no longer move as a reference, install the third object to be tested 02 at the front end of the device, illuminate the third object to be tested 02 from the direction of the first object to be tested 01, then adjust the focal length of the imaging device 12 to focus on the third object to be tested 02 and observe the third object to be tested 02, adjust the displacement mechanical structure of the third object to be tested 02 so that the center of the third object to be tested 02 is located at the center of the cross reference line, and the entire light aiming process is completed.

Claims

1. A periscope system, comprising: Imaging device; A first reflector, with the line connecting the first object to be measured and the second object to be measured as a reference axis, the first reflector is placed at 45 degrees to the reference axis and the reflective surface of the first reflector faces the first object to be measured, and is used to reflect the images of the first object to be measured and the third object to be measured to the third reflector; A second reflector, wherein the second reflector and the first reflector are on the same axis of the reference axis, and the second reflector and the first reflector are placed at 90 degrees, and the reflecting surface of the second reflector faces the second object to be measured, and is used to reflect the image of the second object to be measured onto the semi-reflecting and semi-transmissive mirror; a third reflector, wherein the third reflector and the first reflector are arranged perpendicular to the reference axis, and a reflective surface of the third reflector is parallel to a reflective surface of the first reflector, so that images of the first object to be measured and the third object to be measured reflected from the first reflector are reflected and transmitted to the imaging device through the semi-reflective and semi-transparent mirror; A half-reflecting mirror, wherein the half-reflecting mirror and the second reflector are arranged perpendicular to the reference axis, and the line connecting the half-reflecting mirror and the third reflector is parallel to the reference axis, the reflecting surface of the half-reflecting mirror is parallel to the third reflector and perpendicular to the second reflector, and the half-reflecting mirror reflects the image of the second object to be measured from the second reflector onto the imaging device to overlap with the images of the first object to be measured and the third object to be measured.

2. The periscope system according to claim 1, characterized in that: It also includes an adjustable optical frame, which is connected to the half-reflecting and half-mirror and is used to adjust the angles of the first reflector, the second reflector, the third reflector and the half-reflecting and half-mirror.

3. The periscope system according to claim 1, characterized in that: It also includes a support rod, which is connected to the first reflector, the second reflector, the third reflector, and the semi-reflective and semi-mirror mirror for support and fixation.

4. The periscope system according to claim 1, characterized in that: The first reflector is 1 inch, non-coated, with an incident angle of 45° and a reflection wavelength of 350nm-1600nm.

5. The periscope system according to claim 1, characterized in that: The second reflector is 1 inch, non-coated, with an incident angle of 45° and a reflection wavelength of 350nm-1600nm.

6. The periscope system according to claim 1, characterized in that: The third reflector is 1 inch, non-coated, has an incident angle of 45°, and a reflection wavelength of 350nm-1600nm.

7. The periscope system according to claim 1, characterized in that: The semi-reflective and semi-mirror lens is 1 inch in size and has a transmittance of 50%.

8. The periscope system according to claim 3, characterized in that: The support rod is made of tungsten steel, with a diameter of 6 mm and a length of 50 cm.

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