Multi-electrode ceramic terminal high-temperature testing device

Abstract

The utility model discloses a multi-electrode ceramic terminal high-temperature testing device, and relates to the technical field of electronic component testing. The multi-electrode ceramic terminal high-temperature testing device comprises a substrate which is used as a supporting base of the testing device; the stand column is fixed to one side of the top of the base plate. The two locking blocks are arranged on the stand column in a spaced mode. The L-shaped connecting block is connected with an upper probe card assembly and is connected with the two locking blocks through a first up-down adjusting mechanism; the first left-right adjusting mechanism is connected between the L-shaped connecting block and the upper probe card assembly; the lower probe card assembly is arranged above the substrate; the second up-down adjusting mechanism is arranged at the bottom of the lower probe card assembly; the second left-right adjusting mechanism is arranged at the bottom of the second up-down adjusting mechanism; the bottom plate is arranged at the bottom of the second left-right adjusting mechanism, the sliding rail assembly is arranged on the base plate, and the bottom plate is slidably connected to the sliding rail assembly through a sliding block; the microscope assembly is arranged on the top of the column. The test platform is arranged between the lower probe card assembly and the upper probe card assembly.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic component testing, in particular to a multi-electrode ceramic terminal high-temperature testing device. Background Art

[0002] When testing ordinary electronic components, under normal circumstances, a test clip is used to contact both ends of the electrode to complete the measurement. However, for high-temperature testing of small-sized, multi-electrode products, it is necessary to perform contact measurements on different electrodes on a device in an oven. Due to the small size and close arrangement of a single electrode, the test clip cannot meet the requirement of contacting only one electrode at a time, and it is impossible to switch electrodes manually in the oven. Therefore, a device is needed that can be observed under a microscope, use a probe to contact all electrodes separately and simultaneously, and switch the electrodes on and off one by one through a switch for measurement. Utility Model Content

[0003] To this end, an embodiment of the utility model provides a multi-electrode ceramic terminal high temperature testing device to solve the problems existing in the prior art.

[0004] In order to achieve the above purpose, the embodiment of the utility model provides the following technical solutions:

[0005] A multi-electrode ceramic terminal high temperature testing device, comprising:

[0006] A substrate, serving as a support base for the test device;

[0007] A column, wherein the column is fixed on one side of the top of the base plate in a vertical direction;

[0008] Two locking blocks, which are spaced apart on the column and fixedly connected to the column;

[0009] An L-shaped connecting block, the L-shaped connecting block is connected to an upper probe card assembly, and the L-shaped connecting block is connected to two locking blocks through a first up-and-down adjusting mechanism;

[0010] A first left-right adjustment mechanism, the first left-right adjustment mechanism is connected between the L-shaped connection block and the upper probe card assembly;

[0011] A probe card assembly is arranged above the substrate;

[0012] A second up-down adjustment mechanism, which is disposed at the bottom of the lower probe card assembly and connected to the lower probe card assembly;

[0013] A second left-right adjustment mechanism, which is arranged at the bottom of the second up-down adjustment mechanism and connected to the second up-down adjustment mechanism;

[0014] A bottom plate, which is arranged at the bottom of the second left-right adjustment mechanism and connected to the second left-right adjustment mechanism;

[0015] A slide rail assembly is arranged on the base plate, and the bottom plate is slidably connected to the slide rail assembly through a slider;

[0016] A microscope assembly, which is arranged on the top of the column;

[0017] The test platform is arranged between the lower probe card assembly and the upper probe card assembly, and the test platform is fixedly connected to the bottom plate.

[0018] Optionally, the first up and down adjustment mechanism is a gear rack slide.

[0019] Optionally, the second up-and-down adjustment mechanism is a Z-axis slide.

[0020] Optionally, the first left-right adjustment mechanism and the second left-right adjustment mechanism are both XY micro slides.

[0021] Optionally, the upper probe card assembly and the lower probe card assembly each include a plurality of probes, each of the plurality of probes is provided with a connector, and each connector is connected to a shielding wire.

[0022] Optionally, the upper probe card assembly is connected to the first left-right adjustment mechanism via an upper probe card bracket.

[0023] Optionally, the lower probe card assembly is connected to the second up-and-down adjustment mechanism via a lower probe card bracket.

[0024] Optionally, a groove matching the size of the product to be tested is provided on the top of the test platform, and through holes having the same number as the electrodes are provided at the bottom of the groove, and the test needles pass through the through holes to contact the electrodes.

[0025] Optionally, a control box is further included, the control box is connected to the shielding wire, and the control box leads out the instrument connection wire.

[0026] The utility model has at least the following beneficial effects:

[0027] The utility model slides the test table out sideways through the slide rail, slides back after manual loading, observes through the microscope component, adjusts the first up-and-down adjustment mechanism and the second up-and-down adjustment mechanism knob to make the probe on the probe card accurately contact with the electrode, puts the whole device into the oven, controls each probe of the different upper probe card components and the lower probe card components, respectively passes through the corresponding electrode, tests each probe until all the electrodes on the product are tested, and after the test is completed, slides out the test platform, replaces the product to be tested, and repeats, so that different electrodes can be switched in the oven for detection, and at the same time, it can meet the requirement of only contacting one electrode at a time, which is convenient for use. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly explain the prior art and the present invention, the following briefly introduces the drawings required for describing the prior art and the present invention. Obviously, the drawings described below are only exemplary, and for ordinary technicians in this field, other drawings can be derived from the provided drawings without creative work.

[0029] The structures, proportions, sizes, etc. illustrated in this specification are only used to match the contents disclosed in the specification for people familiar with this technology to understand and read, and are not used to limit the conditions under which the present invention can be implemented. Any structural modification, change in proportion or adjustment of size should still fall within the scope of the technical contents disclosed in the present invention without affecting the effects and purposes that can be achieved by the present invention.

[0030] Figure 1 This is a schematic diagram of the overall first-view structure of an embodiment of the utility model;

[0031] Figure 2 This is a schematic diagram of the column structure of an embodiment of the utility model;

[0032] Figure 3 This is a schematic diagram of the structure of a first up and down adjustment mechanism of an embodiment of the utility model;

[0033] Figure 4 This is a schematic structural diagram of an L-shaped connecting block according to an embodiment of the utility model;

[0034] Figure 5 This is a schematic structural diagram of an upper probe card bracket according to an embodiment of the utility model;

[0035] Figure 6 This is a schematic diagram of a first left-right adjustment structure of an embodiment of the utility model;

[0036] Figure 7 This is a schematic structural diagram of an upper probe card assembly / lower probe card assembly according to an embodiment of the utility model;

[0037] Figure 8 This is a schematic diagram of the test bench structure of an embodiment of the utility model;

[0038] Fig. 9 This is a structural schematic diagram of a probe card bracket according to an embodiment of the utility model;

[0039] Fig.10 This is a schematic structural diagram of a second up and down adjustment mechanism according to an embodiment of the utility model;

[0040] Fig.11 This is a schematic structural diagram of a second left-right adjustment mechanism according to an embodiment of the utility model;

[0041] Fig.12 This is a schematic diagram of the bottom plate structure of an embodiment of the utility model;

[0042] Fig.13 This is a schematic diagram of the control box structure of an embodiment of the utility model;

[0043] Fig.14 Figure 8 The enlarged structural diagram of part A in the middle;

[0044] Fig.15 This is a schematic diagram of the structure of a microscope assembly according to an embodiment of the utility model;

[0045] Fig.16 This is a structural schematic diagram of an upper probe card and its adjustment mechanism according to an embodiment of the utility model;

[0046] Fig.17 The figure is a schematic structural diagram of a probe card and its adjustment mechanism according to an embodiment of the utility model.

[0047] Description of reference numerals:

[0048] 2. Base plate; 3. Post; 4. Lock block; 5. Mounting plate; 6. Limiting column; 7. First up-down adjustment mechanism; 8. First left-right adjustment mechanism; 9. L-shaped connecting block; 10. Upper probe card assembly; 11. Upper probe card bracket; 12. Bottom plate; 13. Test bench; 14. Lower probe card assembly; 15. Lower probe card bracket; 16. Second up-down adjustment mechanism; 17. Second left-right adjustment mechanism; 18. Slide rail; 19. Control box; 20. Button; 21. Microscope assembly. DETAILED DESCRIPTION

[0049] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0050] In the description of the present invention, unless otherwise specified, "plurality" means two or more. The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present invention and the above-mentioned drawings are intended to distinguish the objects referred to. For schemes with a sequential flow, this terminology does not have to be understood as describing a specific order or sequence. For schemes with device structures, this terminology does not distinguish between importance, positional relationships, etc.

[0051] In addition, the terms "comprises", "has" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or apparatus that includes a series of steps or units is not necessarily limited to those steps or units that have been explicitly listed, but may also include other steps or units that are not explicitly listed but are inherent to these processes, methods, products or apparatuses, or steps or units that are added based on further optimization schemes conceived by the present invention.

[0052] like Figure 1 and Figure 2 As shown, a multi-electrode ceramic terminal high temperature testing device disclosed in the utility model comprises:

[0053] A substrate 2, serving as a support base for the test device;

[0054] A column 3, the column 3 is fixed on one side of the top of the base plate 2 along the vertical direction;

[0055] Two locking blocks 4, which are spaced apart on the column 3 and fixedly connected to the column 3;

[0056] An L-shaped connecting block 9, the L-shaped connecting block 9 is connected to an upper probe card assembly 10, and the L-shaped connecting block 9 is connected to two locking blocks 4 through a first up-and-down adjusting mechanism 7;

[0057] A first left-right adjustment mechanism 8, which is connected between the L-shaped connection block 9 and the upper probe card assembly 10;

[0058] A lower probe card assembly 14, the lower probe card assembly 14 is arranged above the substrate 2;

[0059] A second up-down adjustment mechanism 16, which is disposed at the bottom of the lower probe card assembly 14 and connected to the lower probe card assembly 14;

[0060] A second left-right adjustment mechanism 17, which is disposed at the bottom of the second up-down adjustment mechanism 16 and connected to the second up-down adjustment mechanism 16;

[0061] A bottom plate 12, the bottom plate 12 is disposed at the bottom of the second left-right adjustment mechanism 17 and connected to the second left-right adjustment mechanism 17;

[0062] The slide rail 18 assembly is arranged on the base plate 2, and the bottom plate 12 is slidably connected to the slide rail 18 assembly through a slider;

[0063] A microscope assembly 21, the microscope assembly 21 is arranged on the top of the column 3;

[0064] The test platform is disposed between the lower probe card assembly 14 and the upper probe card assembly 10 , and the test platform is fixedly connected to the bottom plate 12 .

[0065] The above-mentioned substrate 2 is square or circular in shape, and its size is set according to the size of the test device. The column 3 is fixed on the top of the base. The microscope assembly 21 is a stereo microscope, which is installed on the top of the column 3. In order to keep the center of gravity of the test device stable, the column 3 is set on the side of the substrate 2, and the microscope assembly 21 faces the inner side of the substrate 2; two locking blocks 4 are arranged on the column 3 at intervals, that is, the two locking blocks 4 are at different heights of the column 3, and components of different heights can be fixed by the locking blocks 4; a mounting plate 5 is installed between the two locking blocks 4, and a first up and down adjustment mechanism 7 is installed on the mounting plate 5. A limiting column 6 is arranged at the bottom of the mounting plate 5 for limiting the first adjustment mechanism;

[0066] The first up-down adjustment mechanism 7 is a gear rack slide, and the first left-right adjustment mechanism 8 is an XY micro slide, which controls the opening and closing of the upper and lower probes through a knob;

[0067] The height (vertical direction) can be adjusted by rotating the knob. The gear rack slide is connected to an L-shaped connecting block 9, one of which is fixedly connected to the gear rack slide, and the other is facing the ground and connected to the XY micro slide to accurately adjust the XY direction (horizontal direction) position, which is used to adjust the relative position of the probe and the electrode;

[0068] The upper probe card bracket 11 is fixed to the bottom of the XY micro slide, and the upper probe card assembly 10 is fixedly mounted on the upper probe card bracket 11;

[0069] The upper probe card bracket 11 and the upper probe card assembly 10 can be adjusted in any direction through the gear rack slide and the XY micro slide;

[0070] The second up-down adjustment mechanism 16 is a Z-direction slide, the top of which is connected to the lower probe card bracket 15, the top of which is fixedly mounted with the lower probe card assembly 14, and the height (vertical direction) of the lower probe card assembly 14 can be adjusted by the Z-direction slide; the second left-right adjustment mechanism 17 at the bottom of the Z-direction slide is an XY micro slide, which can adjust the lower probe card assembly 14 in the XY direction (horizontal direction), and the two cooperate to achieve the adjustment of the lower probe card assembly 14 in any direction;

[0071] The test bench 13 is arranged between the lower probe card assembly 14 and the upper probe card assembly 10. The test bench 13 is mounted on the bottom plate 12. A groove matching the shape and size of the product to be tested is arranged on the test bench 13. A through hole is arranged at the bottom of the groove. The number of the through holes is the same as the number of electrodes. The distribution of the through holes is the same as the distribution position of the electrodes. The test needle can pass through the through hole and contact the electrode.

[0072] The test bench 13 is fixed to the bottom plate 12. The bottom plate 12 and the base plate 2 are installed by two parallel slide rails 18 arranged on the base plate 2. A slider is installed at the bottom of the bottom plate 12 so that the bottom plate 12 can slide on the slide rail 18 through the slider. The sliding direction of the slide rail 18 can make the test bench 13 away from the upper probe card assembly 10, so as to facilitate loading.

[0073] The test bench 13 is an insulation test bench 13 .

[0074] The first up-and-down adjustment mechanism 7 is a gear rack slide.

[0075] The second up-and-down adjustment mechanism 16 is a Z-axis slide table.

[0076] The first left-right adjustment mechanism 8 and the second left-right adjustment mechanism 17 are both XY micro slides.

[0077] The upper probe card assembly 10 and the lower probe card assembly 14 both include a plurality of probes, each of which is provided with a connector, and each connector is connected to a shielding wire.

[0078] The upper probe card assembly 10 is connected to the first left-right adjustment mechanism 8 via an upper probe card bracket 11 .

[0079] The lower probe card assembly 14 is connected to the second up-and-down adjustment mechanism 16 via a lower probe card bracket 15 .

[0080] The top of the test platform is provided with a groove matching the size of the product to be tested, the bottom of the groove is provided with through holes having the same number as the electrodes, and the test needles pass through the through holes to contact the electrodes.

[0081] It also includes a control box 19, which is connected to the shielding wire and leads to an instrument connection wire.

[0082] The upper probe card assembly 10 has the same structure as the lower probe card assembly 14, with the same number of probes as electrodes, and each probe leads to a line through a connector.

[0083] The microscope assembly 21 and the rack and pinion slide are mounted on the locking block 4 on the column 3, the L-shaped connecting block 9 is fixed on the rack and pinion slide, the XY micro slide is fixed on the L-shaped connecting block 9, the upper probe card bracket 11 is fixed on the XY micro slide, and the upper probe card is fixed on the upper probe card bracket 11;

[0084] Fix the limit block and the slide rail 18 on the base plate 2, fix the bottom plate 12 on the slider, fix the XY micro slide and the Z-axis adjustment table on the bottom plate 12, fix the probe card bracket 15 on the Z-axis adjustment table, fix the probe card on the probe card bracket 15, and connect the test platform to the bottom plate 12 through the connecting block and fix it above the probe card.

[0085] Connect the control box 19 to the probe lead wire, and the control box 19 leads to the instrument connection wire

[0086] The utility model designs a multi-probe touch test fixture that can be observed under a microscope. The components to be tested are placed in the grooves of the test platform. The upper and lower probes are respectively touched on the electrodes by adjusting XYZ. The test device and the product are placed in an oven, and a control box 19 is introduced out of the oven. The control box 19 is used to turn different electrodes on and off to complete high-temperature testing of each electrode one by one.

[0087] 1. It can realize one-time pressure touch and separate measurement of multi-electrode products.

[0088] 2. No external damage was found during the test.

[0089] 3. The electrode position of the product can be clearly observed through a microscope and tested by touch.

[0090] 4. It can realize the electrical performance test of multi-electrode products.

[0091] 5. High temperature measurement in the oven can be realized.

[0092] Slide the test platform out sideways through the slide rail 18, slide it back after manual loading, and adjust the XY slide knob through the microscope to make the probe on the probe card contact the electrode accurately. Put the whole set of equipment into the oven, lead the control box 19 out of the box and connect the test table, and click the button 20 on the control box 19 to connect the corresponding electrodes. After completion, click the next button 20 until all the electrodes on the product are tested. After the test is completed, slide the test platform out, replace the product to be tested, and repeat.

[0093] The above specific embodiments may be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments.

[0094] The technical features of the above embodiments may be arbitrarily combined (as long as there is no contradiction in the combination of these technical features). To make the description concise, not all possible combinations of the technical features in the above embodiments are described; these embodiments that are not explicitly written should also be considered to be within the scope of this specification.

[0095] The above is a relatively specific and detailed description of the utility model through general description and specific embodiments. It should be pointed out that, without departing from the concept of the utility model, it is obvious that several variations and improvements can be made to these specific embodiments, which all belong to the protection scope of this application. Therefore, the protection scope of the patent of this application shall be based on the attached claims.

Claims

1. A multi-electrode ceramic terminal high temperature test device, characterized in that: include: A substrate, serving as a support base for the test device; A column, wherein the column is fixed on one side of the top of the base plate in a vertical direction; Two locking blocks, which are spaced apart on the column and fixedly connected to the column; An L-shaped connecting block, the L-shaped connecting block is connected to an upper probe card assembly, and the L-shaped connecting block is connected to two locking blocks through a first up-and-down adjusting mechanism; A first left-right adjustment mechanism, the first left-right adjustment mechanism is connected between the L-shaped connection block and the upper probe card assembly; A probe card assembly is arranged above the substrate; A second up-down adjustment mechanism, which is disposed at the bottom of the lower probe card assembly and connected to the lower probe card assembly; A second left-right adjustment mechanism, which is arranged at the bottom of the second up-down adjustment mechanism and connected to the second up-down adjustment mechanism; A bottom plate, which is arranged at the bottom of the second left-right adjustment mechanism and connected to the second left-right adjustment mechanism; A slide rail assembly is arranged on the base plate, and the bottom plate is slidably connected to the slide rail assembly through a slider; A microscope assembly, which is arranged on the top of the column; The test platform is arranged between the lower probe card assembly and the upper probe card assembly, and the test platform is fixedly connected to the bottom plate.

2. A multi-electrode ceramic terminal high temperature testing device according to claim 1, characterized in that: The first up-and-down adjustment mechanism is a gear rack slide.

3. A multi-electrode ceramic terminal high temperature testing device according to claim 1, characterized in that: The second up-and-down adjustment mechanism is a Z-axis slide.

4. A multi-electrode ceramic terminal high temperature testing device according to claim 1, characterized in that: The first left-right adjustment mechanism and the second left-right adjustment mechanism are both XY micro slides.

5. The multi-electrode ceramic terminal high temperature testing device according to claim 1, characterized in that: The upper probe card assembly and the lower probe card assembly both include a plurality of probes, each of which is provided with a connector, and each connector is connected with a shielding wire.

6. The multi-electrode ceramic terminal high temperature testing device according to claim 1, characterized in that: The upper probe card assembly is connected to the first left-right adjustment mechanism through an upper probe card bracket.

7. The multi-electrode ceramic terminal high temperature testing device according to claim 1, characterized in that: The lower probe card assembly is connected to the second upper and lower adjustment mechanism through a lower probe card bracket.

8. The multi-electrode ceramic terminal high temperature testing device according to claim 1, characterized in that: The top of the test platform is provided with a groove matching the size of the product to be tested, the bottom of the groove is provided with through holes having the same number as the electrodes, and the test needles pass through the through holes to contact the electrodes.

9. The multi-electrode ceramic terminal high temperature testing device according to claim 1, characterized in that: It also includes a control box, which is connected to the shielding wire and leads out instrument connecting wires.

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