Spot measurement mechanism of light splitting machine

Abstract

The utility model relates to the field of LED light splitting machines, in particular to a light splitting machine spot measurement mechanism which comprises a rack, a conveying device, an electrical property testing device and a spectrum collecting device are arranged on the rack, the spectrum collecting device is arranged above the conveying device, the electrical property testing device is arranged below the conveying device, and the spectrum collecting device is connected with the electrical property testing device. The conveying device comprises two conveying shafts, one conveying shaft is driven by a conveying motor to rotate, conveying wheels are fixed to the two sides of each conveying shaft, the conveying wheels at the corresponding positions of the two conveying shafts are connected in a wound mode through a conveying rope, and the electrical property testing device comprises a testing air cylinder fixed to the rack. A testing sliding plate is fixed to the tail end of a piston rod of the testing air cylinder, a probe plate is arranged above the testing sliding plate, and the spectrum collecting device comprises a transverse motor fixed to the rack. According to the device, the lamp beads on the whole board are conveyed to a designated position at a time to be subjected to electrical test and spectrum collection, and the production efficiency of the lamp beads is greatly improved.

Description

[Technical field]

[0001] The invention relates to the field of LED spectrometers, and in particular to a spectrometer point measuring mechanism. [Background technology]

[0002] SMD light emitting diodes are a new type of surface-mounted semiconductor light-emitting device. They are small in size, have a large scattering angle, and have good light uniformity. They are widely used in electronic products such as display screens, LCD panel backlights, and general lighting. LED packaging needs to be color-separated and split before leaving the factory, and the LED chips are classified according to different parameters.

[0003] Patent application number: CN202120365418.8 discloses an SMD spectrometer, in which the vibration plate transports the SMD lamp beads to the front end of the track, the material picking module clamps the SMD lamp beads placed at the front end of the track onto the turntable module, the turntable module transports the SMD lamp beads to the test module for testing, and transports the tested SMD lamp beads to one side of the material picking and blanking module, the first slide and the second slide cooperate to transport the material picking seat toward the turntable module, so that the suction cup is transported to the turntable On the upper side of the module, the suction cup sucks up the SMD lamp bead. After the material is picked up, the first slide and the second slide cooperate to transport the material picking seat towards the receiving module, so that the suction cup is placed on the upper side of the preset material tube. The suction cup puts the SMD lamp bead into the material tube to complete the SMD lamp bead picking and dropping process. However, this type of spectrometer picks up one lamp bead at a time through the picking module and places it on the turntable, and tests the lamp bead through the test module. Each time a lamp bead needs to be picked up and placed, it can be tested, which is inefficient.

[0004] The present invention is proposed in view of the deficiencies in the prior art. [Summary of the invention]

[0005] The purpose of the present invention is to overcome the above-mentioned shortcomings of the prior art and provide a spectrometer point measurement mechanism.

[0006] The present invention can be implemented by the following technical solutions:

[0007] The invention discloses a spectrometer point measuring mechanism, comprising a frame, wherein a conveying device, an electrical testing device and a spectrum collecting device are respectively arranged on the frame, a spectrum collecting device is arranged above the conveying device, and an electrical testing device is arranged below the conveying device. The conveying device comprises two conveying shafts, one of which is driven to rotate by a conveying motor, conveying wheels are fixed on both sides of the conveying shaft, and the conveying wheels at corresponding positions on the two conveying shafts are connected by conveying ropes. The electrical testing device comprises a test cylinder fixed on the frame, a test slide is fixed at the end of the piston rod of the test cylinder, a probe plate is arranged above the test slide, the spectrum collecting device comprises a transverse motor fixed on the frame, a transverse screw rod is fixed at the output end of the transverse motor, a transverse slide rod threadedly connected to the transverse screw rod is arranged on the transverse screw rod, a longitudinal motor is also fixed on the transverse slide rod, a longitudinal screw rod is fixed at the output end of the longitudinal motor, a longitudinal slide rod threadedly connected to the longitudinal screw rod is arranged on the longitudinal screw rod, and a plurality of integrating spheres are fixed on the longitudinal slide rod. The finished product bracket is placed at the conveying device position, and the two ends of the finished product bracket are placed above the conveying rope. The conveying motor drives the conveying wheel to rotate. When the conveying rope rotates, the finished product bracket reaches the electrical testing device position, the test cylinder is started, the piston rod on the test cylinder is extended, and the probe plate rises. After the probe plate contacts each lamp bead on the finished product bracket, the lamp bead is electrically tested in turn, and the transverse motor drives the transverse screw to rotate. When the transverse screw rotates, the transverse slide moves in the direction of the transverse screw, and the integrating sphere moves laterally. The longitudinal motor drives the longitudinal screw to rotate. Since the longitudinal slide is threadedly connected to the longitudinal screw, when the longitudinal screw rotates, the longitudinal slide moves in the direction of the longitudinal screw, and the integrating sphere moves longitudinally, the integrating sphere can be moved arbitrarily above the finished product bracket, that is, the integrating sphere can reach above each lamp bead of the finished product bracket, and the lamp bead on the finished product bracket is energized in turn through the probe plate. Each lamp bead lights up in turn, and reaches above the corresponding lamp bead through the integrating sphere, and the spectrum of the lamp bead is collected. This device transports the lamp beads of the entire board to the designated position at one time to perform electrical testing and spectrum collection on the entire board of lamp beads, which greatly improves the production efficiency of the lamp beads.

[0008] Preferably, test limit devices are symmetrically fixed on the racks on both sides of the electrical testing device, and the test limit devices include a test limit cylinder fixed on the rack, and a test limit plate is fixed to the end of the piston rod of the test limit cylinder. After the finished bracket reaches the probe plate position, the two test limit cylinders are started, the piston rods on the test limit cylinders are extended, and the upper limit rods on the test limit plates position and fix the finished bracket, and then the probe plate is used to perform electrical tests on each lamp bead.

[0009] Preferably, a conveying limit cylinder is fixed on the frame on one side of the probe plate, and a conveying limit plate is fixed at the end of the piston rod of the conveying limit cylinder. A test positioning cylinder is fixed on the frame on the other side of the probe plate, and a test positioning plate is fixed at the end of the piston rod of the test positioning cylinder. After the finished product bracket reaches directly above the probe plate, the test positioning cylinder is started, the piston rod on the test positioning cylinder is extended, the test positioning plate is lowered, and the test positioning plate blocks the finished product bracket to prevent the finished product bracket from moving. The conveying limit cylinder is started, the piston rod on the conveying limit cylinder is extended, the conveying limit plate is raised, and the conveying limit plate blocks the next finished product bracket to prevent the next finished product bracket from reaching the position of the electrical testing device.

[0010] Preferably, a plurality of test slide bars are fixed at the bottom of the probe plate, the test slide bars pass through the test slide plate and are slidably connected to the test slide plate, and a plurality of test springs are fixed between the probe plate and the test slide plate. When the probe plate rises, the test springs push the probe plate to contact the finished product bracket to avoid the probe plate and the lamp bead from being damaged by a rigid collision.

[0011] Preferably, a test feeding device is also fixed on the frame at one end of the conveying device, and the test feeding device includes a test feeding motor fixed on the frame, a test feeding screw is fixed to the output end of the test feeding motor, a test feeding slide plate threadedly connected to the test feeding screw is provided on the test feeding slide plate, a feeding frame is fixed on the test feeding slide plate, and feeding slots are evenly arranged on the feeding frame, a feeding cylinder is fixed on the frame on one side of the feeding frame, and a feeding push plate is fixed to the end of the piston rod of the feeding cylinder. The finished brackets of the whole board of lamp beads are clamped on the loading slots of the loading frame in turn, and the test loading motor drives the test loading screw to rotate. Since the test loading screw is threadedly connected to the test loading slide plate, and the test loading slide plate is slidingly connected to the frame, when the test loading screw rotates, the test loading slide plate moves in the direction of the test loading screw. After the top layer of finished brackets in the loading frame reaches above the conveyor rope, the loading cylinder is started, the piston rod on the loading cylinder is extended, and the loading push plate pushes the top layer of finished brackets on the loading frame to move, and the finished brackets are transported to the conveyor rope position.

[0012] Preferably, a plurality of circuit boards are evenly fixed on the probe plate. The circuit board is set according to the position of the lamp beads on the finished bracket, so that the lamp beads correspond to the circuit board, the copper pillars on the circuit board are in contact with the pins on the lamp beads, so that all the pins on the lamp beads are connected to the corresponding circuit board, and each lamp bead is powered on through the circuit board in turn to achieve electrical testing of the lamp beads.

[0013] Preferably, a plurality of ceramic plates are evenly fixed on the probe plate, and a plurality of probes are fixed on the other side of the ceramic plates. The ceramic plates are arranged according to the positions of the lamp beads, the ceramic plates are in contact with the corresponding lamp beads, the pads on one side of the ceramic plates are in contact with the pins of the lamp beads, and the pads are connected to the probes through leads. By energizing the corresponding probes, electrical tests and spectrum collection of the lamp beads are performed in sequence. By switching on the ceramic plates, wear of the probes can be effectively avoided, and the practical life of the device can be extended.

[0014] Compared with the prior art, the present invention has the following advantages:

[0015] The device transports a whole board of lamp beads to a designated location at one time to perform electrical testing and spectrum collection on the whole board of lamp beads, which greatly improves the production efficiency of the lamp beads.

Brief Description of the Drawings

[0016] The specific embodiments of the present invention are further described in detail below with reference to the accompanying drawings, wherein:

[0017] Figure 1 It is a structural schematic diagram of the present invention;

[0018] Figure 2 This is a schematic diagram of the test feeding motor position structure;

[0019] Figure 3 This is a schematic diagram of the position structure of the feeding cylinder;

[0020] Figure 4 It is a schematic diagram of the structure of the conveying device of the present invention;

[0021] Figure 5 It is a schematic diagram of the structure of the electrical testing device of the present invention;

[0022] Figure 6 It is a schematic diagram of the structure of the test limit device of the present invention;

[0023] Figure 7 It is a schematic diagram of the structure of the spectrum collection device of the present invention;

[0024] Figure 8 A schematic diagram of the structure of a probe card according to an embodiment of the present invention;

[0025] Fig. 9 for Figure 8 Enlarged view of point A in the middle;

[0026] Fig.10 A schematic diagram of the structure of a probe card according to another embodiment of the present invention;

[0027] Fig.11 for Fig.10 Enlarged view of point B in the middle;

[0028] In the figure, 0, frame; 1, finished product bracket; 101, lamp beads; 2, test feeding device; 201, test feeding motor; 202, test feeding slide; 203, feeding frame; 204, feeding slot; 205, feeding cylinder; 206, feeding push plate; 3, conveying device; 301, conveying motor; 302, conveying shaft; 303, conveying wheel; 304, conveying rope; 305, conveying limit cylinder; 306, conveying limit plate; 307, test positioning cylinder; 308, test positioning plate ; 4. Electrical test device; 401. Test cylinder; 402. Test slide; 403. Probe board; 404. Test slide bar; 405. Test spring; 406. Circuit board; 407. Ceramic board; 408. Probe; 5. Spectrum acquisition device; 501. Horizontal motor; 502. Horizontal slide; 503. Longitudinal motor; 504. Longitudinal slide; 505. Integrating sphere; 6. Test limit device; 601. Test limit cylinder; 602. Test limit plate; 603. Limit rod; [Specific implementation method]

[0029] The embodiments of the present invention are described in detail below with reference to the accompanying drawings:

[0030] Embodiment 1:

[0031] like Figures 1 to 9As shown, the present embodiment discloses a spectrometer spot test mechanism, comprising a frame 0, on which a conveying device 3, an electrical test device 4 and a spectrum collection device 5 are respectively arranged, the spectrum collection device 5 is arranged above the conveying device 3, and the electrical test device 4 is arranged below the conveying device 3. The conveying device 3 comprises two conveying shafts 302, one of which is driven to rotate by a conveying motor 301, and conveying wheels 303 are fixed on both sides of the conveying shaft 302. The conveying wheels 303 at corresponding positions on the two conveying shafts 302 are connected by conveying ropes 304. The electrical test device 4 comprises a test device 304 fixed on the frame 0. Cylinder 401, a test slide 402 is fixed at the end of the piston rod of the test cylinder 401, a probe plate 403 is arranged above the test slide 402, the spectrum acquisition device 5 includes a transverse motor 501 fixed on the frame 0, a transverse screw is fixed at the output end of the transverse motor 501, a transverse slide 502 threadedly connected to the transverse screw is arranged on the transverse screw, a longitudinal motor 503 is also fixed on the transverse slide 502, a longitudinal screw is fixed at the output end of the longitudinal motor 503, a longitudinal slide 504 threadedly connected to the longitudinal screw is arranged on the longitudinal screw, and a plurality of integrating spheres 505 are fixed on the longitudinal slide 504. The finished product bracket 1 is placed on the conveying device 3, and the two ends of the finished product bracket 1 are placed above the conveying rope 304. The conveying motor 301 drives the conveying wheel 303 to rotate. When the conveying rope 304 rotates, the finished product bracket 1 reaches the electrical testing device 4, and the test cylinder 401 is started. The piston rod on the test cylinder 401 extends, and the probe plate 403 rises. After the probe plate 403 contacts each lamp bead 101 on the finished product bracket 1, the lamp bead 101 is electrically tested in turn, and the transverse motor 501 drives the transverse screw to rotate. When the transverse screw rotates, the transverse slide 502 moves in the direction of the transverse screw, and the integrating sphere 505 moves laterally. The longitudinal motor 503 drives the longitudinal screw to rotate. 4 is threadedly connected with the longitudinal screw. When the longitudinal screw rotates, the longitudinal slide plate 504 moves in the direction of the longitudinal screw, and the integrating sphere 505 moves longitudinally, that is, the integrating sphere 505 can be arbitrarily moved on the plane above the finished product bracket 1, that is, the integrating sphere 505 can reach above each lamp bead 101 of the finished product bracket 1, and the lamp bead 101 on the finished product bracket 1 is energized in turn through the probe plate 403, and each lamp bead 101 lights up in turn, and reaches above the corresponding lamp bead 101 through the integrating sphere 505, and the spectrum of the lamp bead 101 is collected. The device transports the entire plate of lamp beads 101 to the specified position at one time to perform electrical testing and spectrum collection on the entire plate of lamp beads 101, which greatly improves the production efficiency of the lamp beads 101.

[0032] Among them, the test limit devices 6 are symmetrically fixed on the racks 0 on both sides of the electrical test device 4. The test limit devices 6 include a test limit cylinder 601 fixed on the rack 0, and a test limit plate 602 is fixed at the end of the piston rod of the test limit cylinder 601. After the finished bracket 1 reaches the position of the probe plate 403, the two test limit cylinders 601 are started, the piston rods on the test limit cylinders 601 are extended, and the upper limit rod 603 on the test limit plate 602 positions and fixes the finished bracket 1, and then the probe plate 403 is used to perform electrical tests on each lamp bead 101.

[0033] Among them, a conveying limit cylinder 305 is also fixed on the rack 0 on one side of the probe plate 403, and a conveying limit plate 306 is fixed at the end of the piston rod of the conveying limit cylinder 305. A test positioning cylinder 307 is also fixed on the rack 0 on the other side of the probe plate 403, and a test positioning plate 308 is fixed at the end of the piston rod of the test positioning cylinder 307. After the finished product bracket 1 reaches directly above the probe plate 403, the test positioning cylinder 307 is started, the piston rod on the test positioning cylinder 307 is extended, and the test positioning plate 308 is lowered. The test positioning plate 308 blocks the finished product bracket 1 to prevent the finished product bracket 1 from moving, and the conveying limit cylinder 305 is started, the piston rod on the conveying limit cylinder 305 is extended, and the conveying limit plate 306 is raised. The conveying limit plate 306 blocks the next finished product bracket 1 to prevent the next finished product bracket 1 from reaching the position of the electrical testing device 4.

[0034] Among them, a plurality of test slide bars 404 are fixed at the bottom of the probe plate 403, and the test slide bars 404 pass through the test slide plate 402 and are slidably connected with the test slide plate 402, and a plurality of test springs 405 are fixed between the probe plate 403 and the test slide plate 402. When the probe plate 403 rises, the test springs 405 push the probe plate 403 to contact the finished product bracket 1, so as to avoid the probe plate 403 and the lamp bead 101 from being rigidly collided and damaged.

[0035] Among them, a plurality of circuit boards 406 are evenly fixed on the probe board 403. The circuit board 406 is set according to the position of the lamp bead 101 on the finished bracket 1, so that the lamp bead 101 corresponds to the circuit board 406, and the copper column on the circuit board 406 contacts the pin on the lamp bead 101, so that all the pins on the lamp bead 101 are connected to the corresponding circuit board 406, and each lamp bead 101 is energized through the circuit board 406 in turn to realize the electrical test of the lamp bead 101.

[0036] Embodiment 2:

[0037] like Figures 1 to 7As shown, the present embodiment discloses a spectrometer spot test mechanism, comprising a frame 0, on which a conveying device 3, an electrical test device 4 and a spectrum collection device 5 are respectively arranged, the spectrum collection device 5 is arranged above the conveying device 3, and the electrical test device 4 is arranged below the conveying device 3. The conveying device 3 comprises two conveying shafts 302, one of which is driven to rotate by a conveying motor 301, and conveying wheels 303 are fixed on both sides of the conveying shaft 302. The conveying wheels 303 at corresponding positions on the two conveying shafts 302 are connected by conveying ropes 304. The electrical test device 4 comprises a test device 304 fixed on the frame 0. Cylinder 401, a test slide 402 is fixed at the end of the piston rod of the test cylinder 401, a probe plate 403 is arranged above the test slide 402, the spectrum acquisition device 5 includes a transverse motor 501 fixed on the frame 0, a transverse screw is fixed at the output end of the transverse motor 501, a transverse slide 502 threadedly connected to the transverse screw is arranged on the transverse screw, a longitudinal motor 503 is also fixed on the transverse slide 502, a longitudinal screw is fixed at the output end of the longitudinal motor 503, a longitudinal slide 504 threadedly connected to the longitudinal screw is arranged on the longitudinal screw, and a plurality of integrating spheres 505 are fixed on the longitudinal slide 504. The finished product bracket 1 is placed on the conveying device 3, and the two ends of the finished product bracket 1 are placed above the conveying rope 304. The conveying motor 301 drives the conveying wheel 303 to rotate. When the conveying rope 304 rotates, the finished product bracket 1 reaches the electrical testing device 4, and the test cylinder 401 is started. The piston rod on the test cylinder 401 extends, and the probe plate 403 rises. After the probe plate 403 contacts each lamp bead 101 on the finished product bracket 1, the lamp bead 101 is electrically tested in turn, and the transverse motor 501 drives the transverse screw to rotate. When the transverse screw rotates, the transverse slide 502 moves in the direction of the transverse screw, and the integrating sphere 505 moves laterally. The longitudinal motor 503 drives the longitudinal screw to rotate. 4 is threadedly connected with the longitudinal screw. When the longitudinal screw rotates, the longitudinal slide plate 504 moves in the direction of the longitudinal screw, and the integrating sphere 505 moves longitudinally, that is, the integrating sphere 505 can be arbitrarily moved on the plane above the finished product bracket 1, that is, the integrating sphere 505 can reach above each lamp bead 101 of the finished product bracket 1, and the lamp bead 101 on the finished product bracket 1 is energized in turn through the probe plate 403, and each lamp bead 101 lights up in turn, and reaches above the corresponding lamp bead 101 through the integrating sphere 505, and the spectrum of the lamp bead 101 is collected. The device transports the entire plate of lamp beads 101 to the specified position at one time to perform electrical testing and spectrum collection on the entire plate of lamp beads 101, which greatly improves the production efficiency of the lamp beads 101.

[0038] Among them, the test limit devices 6 are symmetrically fixed on the racks 0 on both sides of the electrical test device 4. The test limit devices 6 include a test limit cylinder 601 fixed on the rack 0, and a test limit plate 602 is fixed at the end of the piston rod of the test limit cylinder 601. After the finished bracket 1 reaches the position of the probe plate 403, the two test limit cylinders 601 are started, the piston rods on the test limit cylinders 601 are extended, and the upper limit rod 603 on the test limit plate 602 positions and fixes the finished bracket 1, and then the probe plate 403 is used to perform electrical tests on each lamp bead 101.

[0039] Among them, a conveying limit cylinder 305 is also fixed on the rack 0 on one side of the probe plate 403, and a conveying limit plate 306 is fixed at the end of the piston rod of the conveying limit cylinder 305. A test positioning cylinder 307 is also fixed on the rack 0 on the other side of the probe plate 403, and a test positioning plate 308 is fixed at the end of the piston rod of the test positioning cylinder 307. After the finished product bracket 1 reaches directly above the probe plate 403, the test positioning cylinder 307 is started, the piston rod on the test positioning cylinder 307 is extended, and the test positioning plate 308 is lowered. The test positioning plate 308 blocks the finished product bracket 1 to prevent the finished product bracket 1 from moving, and the conveying limit cylinder 305 is started, the piston rod on the conveying limit cylinder 305 is extended, and the conveying limit plate 306 is raised. The conveying limit plate 306 blocks the next finished product bracket 1 to prevent the next finished product bracket 1 from reaching the position of the electrical testing device 4.

[0040] Among them, a plurality of test slide bars 404 are fixed at the bottom of the probe plate 403, and the test slide bars 404 pass through the test slide plate 402 and are slidably connected with the test slide plate 402, and a plurality of test springs 405 are fixed between the probe plate 403 and the test slide plate 402. When the probe plate 403 rises, the test springs 405 push the probe plate 403 to contact the finished product bracket 1, so as to avoid the probe plate 403 and the lamp bead 101 from being rigidly collided and damaged.

[0041] Among them, a plurality of ceramic plates 407 are evenly fixed on the probe plate 403, such as Fig.10 and Fig.11 As shown, multiple probes 408 are fixed on the other side of the ceramic plate 407. The ceramic plate 407 is set according to the position of the lamp bead 101, and the ceramic plate 407 contacts the corresponding lamp bead 101. The pad on one side of the ceramic plate 407 contacts the pin of the lamp bead 101, and the pad is connected to the probe 408 through a lead wire. By energizing the corresponding probe 408, the electrical test and spectrum collection of the lamp bead 101 are realized in turn. Through the ceramic plate 407 transfer, the wear of the probe 408 can be effectively avoided, and the practical life of the device can be extended.

[0042] Embodiment 3:

[0043] The present embodiment discloses a spectrometer point measuring mechanism. Based on the structure and principle of embodiment 1 or embodiment 2, a test feeding device 2 is also fixed on the frame 0 at one end of the conveying device 3 of the present embodiment. The test feeding device 2 includes a test feeding motor 201 fixed on the frame 0. A test feeding screw is fixed to the output end of the test feeding motor 201. A test feeding slide 202 threadedly connected to the test feeding screw is provided on the test feeding slide 202. A feeding frame 203 is fixed on the test feeding slide 202. Feeding slots 204 are evenly arranged on the feeding frame 203. A feeding cylinder 205 is fixed on the frame 0 on one side of the feeding frame 203. A feeding push plate 206 is fixed to the end of the piston rod of the feeding cylinder 205. The finished product bracket 1 of the whole board of lamp beads 101 is clamped on the loading slot 204 of the loading frame 203 in turn, and the test loading motor 201 drives the test loading screw to rotate. Since the test loading screw is threadedly connected with the test loading slide 202, and the test loading slide 202 is slidingly connected with the frame 0, when the test loading screw rotates, the test loading slide 202 moves in the direction of the test loading screw. After the top layer of the finished product bracket 1 in the loading frame 203 reaches above the conveying rope 304, the loading cylinder 205 is started, the piston rod on the loading cylinder 205 is extended, and the loading push plate 206 pushes the top layer of the finished product bracket 1 on the loading frame 203 to move, and the finished product bracket 1 is conveyed to the position of the conveying rope 304.

[0044] The above description is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, various changes, modifications, substitutions and variations can be made to these embodiments without departing from the technical principles of the present invention. These changes, modifications, substitutions and variations should also be regarded as the scope of protection of the present invention.

Claims

1. A spectrometer point measurement mechanism, comprising a frame, characterized in that: The frame is respectively provided with a conveying device, an electrical testing device and a spectrum collection device, a spectrum collection device is arranged above the conveying device, and an electrical testing device is arranged below the conveying device. The conveying device comprises two conveying shafts, one of which is driven to rotate by a conveying motor, conveying wheels are fixed on both sides of the conveying shaft, and the conveying wheels at corresponding positions on the two conveying shafts are connected by conveying ropes. The electrical testing device comprises a test cylinder fixed on the frame, a test slide is fixed at the end of the piston rod of the test cylinder, and a probe plate is arranged above the test slide. The spectrum collection device comprises a transverse motor fixed on the frame, a transverse screw rod is fixed at the output end of the transverse motor, a transverse slide rod threadedly connected to the transverse screw rod is arranged on the transverse screw rod, a longitudinal motor is also fixed on the transverse slide rod, a longitudinal screw rod is fixed at the output end of the longitudinal motor, a longitudinal slide rod threadedly connected to the longitudinal screw rod is arranged on the longitudinal screw rod, and a plurality of integrating spheres are fixed on the longitudinal slide rod.

2. The spectrometer point measurement mechanism according to claim 1, characterized in that: Test limit devices are symmetrically fixed on the frames on both sides of the electrical testing device. The test limit devices include a test limit cylinder fixed on the frame, and a test limit plate is fixed to the end of the piston rod of the test limit cylinder.

3. The spectrometer point measurement mechanism according to claim 1, characterized in that: A conveying limit cylinder is also fixed on the frame on one side of the probe board, and a conveying limit plate is fixed at the end of the piston rod of the conveying limit cylinder. A test positioning cylinder is also fixed on the frame on the other side of the probe board, and a test positioning plate is fixed at the end of the piston rod of the test positioning cylinder.

4. The spectrometer point measurement mechanism according to claim 1, characterized in that: A plurality of test slide bars are fixed at the bottom of the probe plate, the test slide bars pass through the test slide plate and are slidably connected to the test slide plate, and a plurality of test springs are fixed between the probe plate and the test slide plate.

5. The spectrometer point measurement mechanism according to claim 1, characterized in that: A test feeding device is also fixed on the frame at one end of the conveying device, and the test feeding device includes a test feeding motor fixed on the frame, a test feeding screw is fixed on the output end of the test feeding motor, a test feeding slide plate which is threadedly connected to the test feeding screw is provided on the test feeding slide plate, a feeding frame is fixed on the test feeding slide plate, and feeding slots are evenly arranged on the feeding frame, a feeding cylinder is fixed on the frame on one side of the feeding frame, and a feeding push plate is fixed to the end of the piston rod of the feeding cylinder.

6. The spectrometer point measurement mechanism according to claim 1, characterized in that: A plurality of circuit boards are evenly fixed on the probe board.

7. The spectrometer point measurement mechanism according to claim 1, characterized in that: A plurality of ceramic plates are evenly fixed on the probe plate, and a plurality of probes are fixed on the other side of the ceramic plates.

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