Sample table for X-ray diffractometer

Abstract

A sample table for an X-ray diffractometer comprises a base, a sample containing groove, a sample containing table, a wedge mechanism and scales, and the base is made of transparent materials; the sample placing groove is positioned at the top of the base and is vertically arranged; the sample placing table is connected into the sample placing groove in a sliding manner; the wedge mechanism is arranged on the base and is in driving connection with the sample placing table; the scales are arranged on the base and located outside the sample placing groove, and the scales are arranged corresponding to a horizontal movement structure in the inclined wedge mechanism; due to the fact that the inclined wedge mechanism can convert horizontal movement into vertical movement, the inclined wedge mechanism can be adjusted from the side face of the base, space does not need to be reserved below the base, and compared with the prior art, the requirement for the placing place is lower, and placing is more convenient. Besides, the scales are positioned outside the sample placing groove, so that a worker can read the test thickness of the powdery sample at any time and cannot forget the test thickness easily; in general, the sample table for the X-ray diffractometer is more convenient to place, and the test thickness of a powdery sample can be observed in real time.

Description

Technical Field

[0001] The utility model relates to the technical field of experimental instruments, in particular to a sample table for an X-ray diffractometer. Background Art

[0002] X-ray diffractometer is the most effective and widely used method to study the microstructure of materials. It uses the principle of diffraction to perform phase analysis and qualitative analysis on materials. Bruker's D8-Advance series diffractometer uses three contact points on the goniometer sample holder to contact the sample stage reference plane to determine the sample test surface. The sample stage does not rotate during the test.

[0003] At present, in the process of developing innovative drugs, new food processing processes and technologies, and micro-nano functional materials, due to the constraints of experimental conditions and synthesis methods, the yield of many synthetic products is very low, and the final sample volume is only tens of milligrams or even less. The X-ray diffraction test using the sample table provided by the manufacturer is not ideal, and sometimes even the test cannot be performed due to insufficient sample volume, which seriously limits the research and development of new drugs, new processes and new materials.

[0004] The amount of different samples is different. In order to make the upper surface of different samples level with the top of the sample placement slot and quickly and accurately obtain the test thickness of the samples, the existing sample table usually has a scale and a height-adjustable sample placement table in the sample placement slot. In order to make the height of the sample placement table adjustable, a vertically set bolt is usually threaded at the bottom of the sample table, and the top of the bolt is abutted or rotated to connect the sample table. The height of the sample placement table in the sample placement slot is adjusted by turning the bolt. However, this setting method requires the bottom of the sample table to be suspended in the air to leave enough space for adjusting the bolt, which is not convenient for placement. In addition, during the test, the powdered sample in the sample placement slot will also block the scale, making it easy for staff to forget the test thickness of the powdered sample. Utility Model Content

[0005] 1. Technical issues to be solved

[0006] In order to solve the above problems, the utility model provides a sample stage for an X-ray diffractometer, which is easy to place and can observe the test thickness of the powder sample in real time.

[0007] (II) Technical solution

[0008] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0009] A sample stage for an X-ray diffractometer, comprising:

[0010] A base, wherein the base is made of a transparent material;

[0011] A sample placement groove, which is located on the top of the base and is vertically arranged to accommodate powdered samples;

[0012] A sample placing table, which is slidably connected in the sample placing groove and is used to support the powdered sample, and the distance between the top of the sample placing table and the top of the sample placing groove is the accommodating depth of the powdered sample;

[0013] An inclined wedge mechanism, which is arranged on the base and drivingly connected to the sample placement table, and can convert horizontal motion into vertical motion, and drive the sample placement table to move up and down along the direction of the sample placement groove, thereby adjusting the accommodation depth;

[0014] The scale is arranged on the base and is located outside the sample placement groove. The scale corresponds to the structural arrangement for horizontal movement in the inclined wedge mechanism. The displacement of the inclined wedge mechanism in the vertical direction can be determined by the displacement of the inclined wedge mechanism in the horizontal direction, thereby determining the accommodation depth.

[0015] Preferably, the base, the sample placement groove and the sample placement platform are all cylindrical and coaxially arranged, and the corners of the base are rounded.

[0016] Preferably, the base and the sample placement table are both made of organic glass.

[0017] Preferably, a first sliding groove arranged horizontally and a second sliding groove arranged vertically are provided at the bottom of the sample placement groove, the first sliding groove and the second sliding groove are connected to each other, and the inclined wedge mechanism includes:

[0018] An adjusting component, the adjusting component is horizontally mounted on the base and arranged corresponding to the first slide groove, and the scale is arranged corresponding to the adjusting component;

[0019] A moving component, wherein the top of the moving component is fixedly connected to the sample placement table, the bottom is drivingly connected to the adjustment component, and the side surface is slidably connected to the second slide groove.

[0020] Preferably, a threaded hole connected to the first slide groove is provided on the side of the base, the extension direction of the threaded hole is consistent with the extension direction of the first slide groove, the scale is located at the top of the base and is arranged corresponding to the threaded hole, and the scale is arranged in a linear array along the extension direction of the threaded hole, and the adjustment component includes:

[0021] A stud, the stud is engaged in the threaded hole, and the stud is a hexagonal headless stud, so that the stud can completely enter the threaded hole, so that the end of the stud located in the threaded hole can cooperate with the scale to read the value;

[0022] A first slider, wherein the first slider is slidably connected in the first slide groove, and one end of the first slider abuts against the stud, so that when the stud is screwed into the first slide groove, the first slider can move along the first slide groove;

[0023] A first inclined surface is arranged on the top of the first sliding block and is drivingly connected to the moving component, and the thickness of the first sliding block gradually becomes thinner along the direction from the threaded hole to the first sliding groove.

[0024] Preferably, the moving component comprises:

[0025] A second sliding block, the top of which is fixedly connected to the sample placement table, and the side of which is slidably connected to the second sliding groove;

[0026] The second inclined plane is arranged at the bottom of the second sliding block, the second inclined plane and the first inclined plane are opposite and parallel to each other, and the second inclined plane and the first inclined plane are slidably connected, so that when the first sliding block moves horizontally along the first sliding groove, the second sliding block can be driven to move vertically along the second sliding groove, thereby adjusting the height of the sample placing table in the sample placing groove and the accommodating depth of the powdered sample.

[0027] Preferably, it also includes:

[0028] A groove, the groove is arranged on the side of the base and connected to the first slide groove;

[0029] A baffle, the baffle being arranged on an end of the first sliding block away from the stud;

[0030] A spring, one end of which abuts against the end of the groove and the other end abuts against the baffle, so that the first slider always abuts against the stud, so that the first slider can move with the movement of the stud, and indirectly apply axial force to the stud through the first slider, thereby preventing the stud from loosening and displacement.

[0031] (III) Beneficial effects

[0032] Compared with the prior art, the beneficial effects of the utility model are:

[0033] During actual use, the base is placed at a designated position, and the test thickness of the powder sample is determined according to the amount of the powder sample to be measured. The position of the sample table in the sample slot is adjusted by the cooperation of the scale and the inclined wedge mechanism, so that the accommodating depth of the sample slot is consistent with the specified test thickness of the powder sample. Then, the powder sample is poured into the sample slot and scraped flat, and the powder sample can be tested by the X-ray diffractometer. When testing other types of powder samples, the sample slot is emptied first, and the subsequent steps are the same as above. Based on the above scheme, since the inclined wedge mechanism can convert horizontal movement into vertical movement, the inclined wedge mechanism can be adjusted from the side of the base without leaving space under the base. Compared with the prior art, the requirements for the placement location are lower and it is more convenient to place. In addition, since the scale is located outside the sample slot, the staff can read the test thickness of the powder sample at any time and will not forget it easily. In general, by using the sample table for the X-ray diffractometer, it is easier to place and the test thickness of the powder sample can be observed in real time. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0035] Figure 1 A stereogram of a sample stage for an X-ray diffractometer of the utility model is shown;

[0036] Figure 2 Shows Figure 1 A three-dimensional cross-sectional view of a sample stage for an X-ray diffractometer;

[0037] Figure 3 Shows Figure 1 A plan cross-sectional view of a sample stage for an X-ray diffractometer;

[0038] Figure 4 Shows Figure 1 Schematic diagram of the exploded structure of the sample stage used for the X-ray diffractometer;

[0039] Figure 5 Shows Figure 1 Schematic diagram of the exploded structure of the sample stage used for X-ray diffractometer from another angle;

[0040] Figure 6 Shows Figure 1 A three-dimensional cutaway view of the middle base;

[0041] Figure 7 Shows Figure 1 A plan cross-sectional view of the middle base;

[0042] Figure 8Shows Figure 1 A perspective cutaway view of the center stage and moving components.

[0043] In the figure: 1, base; 2, sample placement groove; 3, sample placement table; 4, inclined wedge mechanism; 41, adjustment component; 411, stud; 412, first slider; 413, first inclined surface; 42, moving component; 421, second slider; 422, second inclined surface; 5, scale; 6, first slide groove; 7, second slide groove; 8, threaded hole; 9, groove; 10, baffle; 11, spring. DETAILED DESCRIPTION

[0044] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0045] See attached Figure 1 -Attached Figure 3 The embodiment of the utility model discloses a sample stage for an X-ray diffractometer, comprising a base 1, a sample placement groove 2, a sample placement platform 3, an inclined wedge mechanism 4, and a scale 5. The base 1 is made of a transparent material; the sample placement groove 2 is located at the top of the base 1 and is vertically arranged to accommodate powdered samples; the sample placement platform 3 is slidably connected in the sample placement groove 2 to support the powdered samples, and the distance between the top of the sample placement platform 3 and the top of the sample placement groove 2 is the accommodating depth of the powdered samples; the inclined wedge mechanism 4 is arranged on the base 1 and is driven to connect the sample placement platform 3, the inclined wedge mechanism 4 can convert horizontal movement into vertical movement, and drive the sample placement platform 3 to move up and down along the direction of the sample placement groove 2, so as to adjust the accommodating depth; the scale 5 is arranged on the base 1 and is located outside the sample placement groove 2, the scale 5 corresponds to the structural setting of the horizontal movement in the inclined wedge mechanism 4, and the displacement of the inclined wedge mechanism 4 in the vertical direction can be determined by the displacement of the inclined wedge mechanism 4 in the horizontal direction, so as to determine the accommodating depth.

[0046] In actual use, the base 1 is placed at a designated position, and the test thickness of the powder sample is determined according to the amount of the powder sample to be measured. The position of the sample table 3 in the sample slot 2 is adjusted by the cooperation of the scale 5 and the inclined wedge mechanism 4, so that the accommodating depth of the sample slot 2 is consistent with the test thickness specified for the powder sample. Then, the powder sample is poured into the sample slot 2 and scraped flat, and the powder sample can be tested by the X-ray diffractometer. When testing other types of powder samples, the sample slot 2 is emptied first, and the subsequent steps are the same as above. Based on the above scheme, since the inclined wedge mechanism 4 can convert horizontal movement into vertical movement, the inclined wedge mechanism 4 can be adjusted from the side of the base 1, and there is no need to leave space under the base 1. Compared with the prior art, the requirements for the placement location are lower and it is more convenient to place. In addition, since the scale 5 is located outside the sample slot 2, the staff can read the test thickness of the powder sample at any time and will not forget it easily. In general, by using the sample table for the X-ray diffractometer, it is more convenient to place and the test thickness of the powder sample can be observed in real time.

[0047] It should be noted that, in the prior art of the background technology, in order to determine the test thickness of the powdered sample during actual testing, the sample slot 2 must be emptied first, and then the height of the adjusted sample table 3 can be determined through the scale 5, and the powdered sample can be poured into the sample slot 2 only after the height adjustment of the sample table 3 is completed; whereas in the present application, since the scale 5 is located outside the sample slot 2, the sample table 3 can determine the test thickness of the powdered sample through the scale 5, whether it is adjusted before or after the powdered sample is poured into the sample slot 2, and is more convenient to use; in particular, when the powdered sample is adjusted after being poured into the sample slot 2, the test thickness of the powdered sample can be flexibly determined, and it can be ensured that the upper surface of the powdered sample is flush with the top of the sample slot 2.

[0048] In order to more clearly introduce the sample stage used for the X-ray diffractometer in the present application, its shape is designed as follows in this embodiment. Specifically, the base 1, the sample placement groove 2 and the sample placement stage 3 are all cylindrical and coaxially arranged, and the corners of the base 1 are rounded.

[0049] The above-mentioned structural design is not only convenient for understanding its structure, but also convenient for taking and placing in actual use. The cylindrical structure will also prevent the staff from being cut by the edges and corners during taking and placing. Since the base 1, the sample placement groove 2 and the sample placement table 3 are all cylindrical and coaxially arranged, the overall weight distribution of the sample table for the X-ray diffractometer is more uniform. The rounded corners set at the edges and corners of the base 1 can further enhance the protection effect on the staff.

[0050] In order to make the test results of the X-ray diffraction test more accurate, the following design is carried out in this embodiment. Specifically, the base 1 and the sample placement table 3 are both made of organic glass.

[0051] By using organic glass to manufacture the base 1 and the sample placement table 3, interference peaks can be avoided, thereby avoiding the impact on the test results of the samples, and the test results are more accurate.

[0052] See attached Figure 1 , Attachment Figure 2 and attached Figure 4 In order to more clearly introduce the inclined wedge mechanism 4, its structure is designed as follows in this embodiment. Specifically, a horizontally arranged first slide groove 6 and a vertically arranged second slide groove 7 are provided at the bottom of the sample placement groove 2. The first slide groove 6 and the second slide groove 7 are connected to each other. The inclined wedge mechanism 4 includes an adjusting component 41 and a moving component 42. The adjusting component 41 is horizontally installed on the base 1 and is arranged corresponding to the first slide groove 6. The scale 5 is arranged corresponding to the adjusting component 41. The top of the moving component 42 is fixedly connected to the sample placement table 3, the bottom is driven to connect to the adjusting component 41, and the side is slidably connected to the second slide groove 7.

[0053] Through the design of the above structure, the horizontal movement of the adjusting component 41 along the first sliding groove 6 can be converted into the vertical movement of the moving component 42 along the second sliding groove 7 .

[0054] See attached Figure 2 , Attachment Figure 4 , Attachment Figure 6 and attached Figure 7 There are many structures that can realize the function of the above-mentioned adjustment component 41. One of them is introduced in this embodiment. Specifically, a threaded hole 8 connected to the first slide groove 6 is provided on the side of the base 1. The extension direction of the threaded hole 8 is consistent with the extension direction of the first slide groove 6. The scale 5 is located at the top of the base 1 and is set corresponding to the threaded hole 8. The scale 5 is arranged in a linear array along the extension direction of the threaded hole 8. The adjustment component 41 includes a stud 411, a first slider 412, and a first inclined surface 413. The stud 411 is engaged in the threaded hole 8. The stud 411 uses a hexagonal headless stud 411 so that the stud 411 can completely enter the threaded hole 8 so that the end of the stud 411 located in the threaded hole 8 can cooperate with the scale 5 for reading; the first slider 412 is slidably connected in the first slide groove 6, and one end abuts the stud 411; the first inclined surface 413 is set at the top of the first slider 412 and drives the connection moving component 42, and the thickness of the first slider 412 gradually becomes thinner along the direction from the threaded hole 8 to the first slide groove 6.

[0055] Through the design of the above structure, when the stud 411 is screwed into the first slide groove 6 , the first sliding block 412 can move along the first slide groove 6 , so that the moving component 42 is gradually raised under the action of the first inclined surface 413 .

[0056] It should be noted that when the stud 411 is rotated outward from the first slide groove 6, since the first slider 412 only contacts the stud 411, it will not move under the drive of the stud 411. At this time, the friction between the sample placement table 3 and the sample placement groove 2 and the friction between the moving component 42 and the second slide groove 7 are ignored. If the total weight of the sample placement table 3 and the moving component 42 is greater than the friction between the first slider 412 and the first slide groove 6, the total weight of the sample placement table 3 and the moving component 42 will be decomposed into a vertical force and a horizontal force under the action of the first inclined surface 413. The vertical force will drive the sample placement table 3 along The sample placement slot 2 moves vertically downward, driving the moving assembly 42 to move vertically downward along the second slide slot 7. The above-mentioned horizontal force will drive the first slider 412 to move horizontally along the first slide slot 6 until it abuts against the stud 411 again; if the total gravity of the sample placement table 3 and the moving assembly 42 is less than the friction between the first slider 412 and the first slide slot 6, an additional vertical downward force needs to be applied to the sample placement table 3 to make the sample placement table 3 and the moving assembly 42 move vertically downward, thereby driving the first slider 412 to move horizontally and abut against the stud 411, thereby ensuring that the value obtained by the inclined wedge mechanism 4 and the scale 5 is the actual accommodation depth of the powdered sample in the sample placement slot 2.

[0057] When the sum of the gravity of the sample placement table 3 and the moving assembly 42 is greater than the sum of the friction between the sample placement table 3 and the sample placement slot 2 and between the moving assembly 42 and the second slide slot 7, after the first slider 412 moves toward the threaded hole 8, the sample placement table 3 and the moving assembly 42 can automatically fall under the action of gravity.

[0058] Furthermore, the stud 411 can be rotatably connected to the first slider 412 , so that the first slider 412 can move along with the rotation of the stud 411 whether the stud 411 rotates clockwise or counterclockwise.

[0059] It should be noted that the above scheme is only one structure of the adjustment component 41. The scale 5 can also be set on the side of the base 1 and arranged in a circular array. In this case, the stud 411 is rotatably connected to the side of the base and located at the center of the scale. The stud 411 is threadedly connected to the first slider 412, and a pointer corresponding to the scale 5 is set on the stud 412. The accommodation depth of the powdered sample in the sample trough 2 can also be measured.

[0060] See attached Figure 2 , Attachment Figure 5 and attached Figure 8There are many structures that can realize the function of the above-mentioned moving component 42. Based on the above-mentioned scheme in which the scale 5 is set on the top of the base 1, one of them is introduced in this embodiment. Specifically, the moving component 42 includes a second slider 421 and a second inclined surface 422. The top of the second slider 421 is fixedly connected to the sample placement table 3, and the side is slidably connected to the second slide groove 7; the second inclined surface 422 is set at the bottom of the second slider 421, the second inclined surface 422 and the first inclined surface 413 are opposite and parallel, and the second inclined surface 422 and the first inclined surface 413 are slidably connected.

[0061] Through the design of the above structure, the first slider 412 can drive the second slider 421 to move vertically along the second slide groove 7 during the horizontal movement along the first slide groove 6, thereby adjusting the height of the sample placement table 3 in the sample placement groove 2 and the accommodating depth of the powdered sample.

[0062] When the first slider 412 only abuts against the stud 411, in order to enable the first slider 412 to move back and forth in the first slide groove 6 as the stud 411 is screwed in or out, the following design is carried out in this embodiment. Specifically, it also includes a groove 9, a baffle 10, and a spring 11. The groove 9 is arranged on the side of the base 1 and is connected to the first slide groove 6; the baffle 10 is arranged on one end of the first slider 412 away from the stud 411; one end of the spring 11 abuts against the end of the groove 9, and the other end abuts against the baffle 10.

[0063] Through the design of the above structure, under the elastic action of the spring 11, the first slider 412 can always abut against the stud 411, so that the first slider 412 can move with the movement of the stud 411, and indirectly apply axial force to the stud 411 through the first slider 412, thereby preventing the stud 411 from loosening and displacement.

[0064] In addition, the setting of the baffle 10 can limit the moving range of the first sliding block 412 and the second sliding block 421 in the horizontal direction, thereby preventing the first inclined surface 413 and the second inclined surface 422 from being separated from each other.

[0065] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0066] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of this application.

[0067] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A sample stage for an X-ray diffractometer, characterized in that: include: A base, wherein the base is made of a transparent material; A sample placement groove, which is located on the top of the base and is vertically arranged to accommodate powdered samples; A sample placing table, which is slidably connected in the sample placing groove and is used to support the powdered sample, and the distance between the top of the sample placing table and the top of the sample placing groove is the accommodating depth of the powdered sample; An inclined wedge mechanism, which is arranged on the base and drivingly connected to the sample placement table, and can convert horizontal motion into vertical motion, and drive the sample placement table to move up and down along the direction of the sample placement groove, thereby adjusting the accommodation depth; The scale is arranged on the base and is located outside the sample placement groove. The scale corresponds to the structural arrangement for horizontal movement in the inclined wedge mechanism. The displacement of the inclined wedge mechanism in the vertical direction can be determined by the displacement of the inclined wedge mechanism in the horizontal direction, thereby determining the accommodation depth.

2. A sample stage for an X-ray diffractometer according to claim 1, characterized in that: The base, the sample placement groove and the sample placement platform are all cylindrical and coaxially arranged, and the corners of the base are rounded.

3. The sample stage for an X-ray diffractometer according to claim 1, characterized in that: The base and the sample placement table are both made of organic glass.

4. The sample stage for an X-ray diffractometer according to claim 1, characterized in that: The bottom of the sample placement groove is provided with a first sliding groove arranged horizontally and a second sliding groove arranged vertically, the first sliding groove and the second sliding groove are connected to each other, and the inclined wedge mechanism includes: An adjusting component, the adjusting component is horizontally mounted on the base and arranged corresponding to the first slide groove, and the scale is arranged corresponding to the adjusting component; A moving component, wherein the top of the moving component is fixedly connected to the sample placement table, the bottom is drivingly connected to the adjustment component, and the side surface is slidably connected to the second slide groove.

5. The sample stage for an X-ray diffractometer according to claim 4, characterized in that: The side of the base is provided with a threaded hole connected to the first slide groove, the extension direction of the threaded hole is consistent with the extension direction of the first slide groove, the scale is located at the top of the base and is arranged corresponding to the threaded hole, and the scale is arranged in a linear array along the extension direction of the threaded hole, and the adjustment component includes: A stud, the stud is engaged in the threaded hole, and the stud is a hexagonal headless stud, so that the stud can completely enter the threaded hole, so that the end of the stud located in the threaded hole can cooperate with the scale to read the value; A first slider, wherein the first slider is slidably connected in the first slide groove, and one end of the first slider abuts against the stud, so that when the stud is screwed into the first slide groove, the first slider can move along the first slide groove; A first inclined surface is arranged on the top of the first sliding block and is drivingly connected to the moving component, and the thickness of the first sliding block gradually becomes thinner along the direction from the threaded hole to the first sliding groove.

6. The sample stage for an X-ray diffractometer according to claim 5, characterized in that: The mobile assembly comprises: A second sliding block, the top of which is fixedly connected to the sample placement table, and the side of which is slidably connected to the second sliding groove; The second inclined plane is arranged at the bottom of the second sliding block, the second inclined plane and the first inclined plane are opposite and parallel to each other, and the second inclined plane and the first inclined plane are slidably connected, so that when the first sliding block moves horizontally along the first sliding groove, the second sliding block can be driven to move vertically along the second sliding groove, thereby adjusting the height of the sample placing table in the sample placing groove and the accommodating depth of the powdered sample.

7. A sample stage for an X-ray diffractometer according to claim 6, characterized in that: Also includes: A groove, the groove is arranged on the side of the base and connected to the first slide groove; A baffle, the baffle being arranged on an end of the first sliding block away from the stud; A spring, one end of which abuts against the end of the groove and the other end abuts against the baffle, so that the first slider always abuts against the stud, so that the first slider can move with the movement of the stud, and indirectly apply axial force to the stud through the first slider, thereby preventing the stud from loosening and displacement.

Images