Chip open circuit and short circuit testing device
By designing a chip short-circuit test device including upper computer, control module and analog-to-digital conversion module, the existing test device is solved, and the problem of large size and inconvenient operation is achieved, fast and accurate test results are obtained, the process is simplified and improved Convenience and accuracy.
Patent Information
- Application Number
- CN202420539570.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-19
- Publication Date
- 2025-01-17
- Estimated Expiration
- 2034-03-19
AI Technical Summary
The existing chip open short circuit test devices are huge and inconvenient to operate, resulting in low testing efficiency.
A chip short-circuit test device including a computer, a control module and an analog-to-digital conversion module is designed. The chip data is collected through the IO sampling circuit, analog-to-digital conversion and comparison of the preset voltage threshold, and the serial port is connected to the USB to realize Fast and accurate test results are obtained without a professional testing platform.
It realizes fast and accurate chip short-circuit testing, simplifies the testing process, improves convenience and test accuracy and reliability, and is not restricted by the test site.
Smart Images
Figure CN222365062U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to a chip testing device, in particular to a chip open-short circuit testing device. Background Art
[0002] Chip OS testing refers to the OpenShort test, which is to check whether the chip pins have an open short circuit phenomenon. It is one of the important testing processes to ensure the good quality of the chip.
[0003] Existing chip open and short circuit testing devices are usually professional testing machines, which are bulky and inconvenient to operate, resulting in low chip open and short circuit testing efficiency. Utility Model Content
[0004] The utility model provides a chip open-short circuit test device to solve the technical problem that the existing chip open-short circuit test device is usually a professional test machine, which is bulky and inconvenient to operate, resulting in low chip open-short circuit test efficiency.
[0005] The utility model provides a chip open-short circuit test device, comprising:
[0006] Host computer, control module and analog-to-digital conversion module;
[0007] The host computer and the analog-to-digital conversion module are both connected to the control module, and the control module is connected to the pins of the chip to be tested through a connecting line;
[0008] The control module is provided with an IO sampling circuit, and the IO sampling circuit is used to collect IO data of the chip under test;
[0009] The analog-to-digital conversion circuit is used to perform analog-to-digital conversion on the IO data to obtain digital quantity data, and the digital quantity data is sent to the host computer.
[0010] Furthermore, the host computer is connected to the control module via a serial port.
[0011] Furthermore, the host computer is connected to the control module via USB.
[0012] Furthermore, the control module is connected to the pins of the chip to be tested via a connecting line, including:
[0013] The ADC sampling pin of the control module is connected to the IO pin of the chip to be tested through a connecting line.
[0014] Furthermore, the host computer includes a display module, and the display module is used to display chip open and short circuit test data.
[0015] The embodiment of the utility model connects the host computer and the analog-to-digital conversion module to the control module, the control module is connected to the pins of the chip to be tested through connecting lines, the control module is provided with an IO sampling circuit, the IO sampling circuit is used to collect IO data of the chip to be tested, and the digital quantity data obtained after the analog-to-digital conversion is sent to the host computer for comparison with the preset voltage threshold range, so that the chip open and short circuit test results can be accurately and quickly detected without the need for a professional test platform, which can not only effectively simplify the test process, but also the test site is not restricted, and the convenience of chip open and short circuit testing can be effectively improved.
[0016] Furthermore, the host computer of the embodiment of the utility model is connected to the control module via a serial port. Serial communication is more reliable and stable than wireless communication, and is not affected by factors such as wireless signal strength and interference. It can maintain a stable connection and transmission quality in a complex environment, thereby improving the accuracy and reliability of the chip open and short circuit test. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 It is a structural schematic diagram of a chip open-short circuit testing device provided by an embodiment of the utility model;
[0018] The accompanying drawings in the specification are marked as follows:
[0019] 10. Host computer; 20. Analog-to-digital conversion module; 30. Control module; 301. IO sampling circuit. DETAILED DESCRIPTION
[0020] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
[0021] In the description of this application, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the feature. In the description of this application, unless otherwise specified, "plurality" means two or more.
[0022] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0023] See also Figure 1 The utility model provides a chip open-short circuit test device, comprising:
[0024] Host computer 10, control module 30 and analog-to-digital conversion module 20;
[0025] In the embodiment of the utility model, the host computer 10 refers to a computer or device in a distributed control system that is responsible for high-level control, data processing and management. It usually communicates with the lower computer (such as sensors, actuators, etc.) and controls and monitors the lower computer through instructions, data transmission, etc.
[0026] In the embodiment of the utility model, the host computer 10 can be a PC computer, and the control module 30 is a control MCU. The utility model embodiment can select the test channel through the host computer 10, and input the set test current to the chip under test. The utility model embodiment can also include a channel switching module and a power module, and the channel switching module includes a relay, and one pin of the relay is connected to the power module.
[0027] The host computer 10 and the analog-to-digital conversion module 20 are both connected to the control module 30, and the control module 30 is connected to the pins of the chip to be tested through a connecting line;
[0028] In the embodiment of the utility model, the control module 30 is connected to the pins of the chip under test through a connecting line, and the control module 30 is used to collect IO data of the chip under test.
[0029] The control module is provided with an IO sampling circuit 301, and the IO sampling circuit 301 is used to collect IO data of the chip under test;
[0030] In an embodiment of the utility model, the control module collects the IO data of the chip under test through an IO sampling circuit 301 disposed inside. The IO sampling circuit 301 is connected to the pins of the chip under test, and is connected to the pins of the chip under test through a connecting line. Its input interface has good electrical characteristics to ensure good signal transmission and reception. The control module may also include a holding circuit inside, and the IO sampling circuit 301 can obtain the IO data of the pins of the chip under test through the sampling circuit. During the sampling process, the IO sampling circuit 301 can accurately capture the signal state of the pin with a preset sampling frequency and timing. After the sampling is completed, the holding circuit keeps the sampled signal in a stable state for subsequent processing and conversion.
[0031] The analog-to-digital conversion circuit is used to perform analog-to-digital conversion on the IO data to obtain digital data, and the digital data is sent to the host computer 10 .
[0032] In the embodiment of the utility model, the analog-to-digital conversion module 20 receives the analog signal collected from the control module 30, converts it into digital data through the analog-to-digital conversion circuit, and returns it to the control module 30, and sends it to the host computer 10 through the control module 30. The analog-to-digital conversion circuit in the embodiment of the utility model adopts a high-precision analog-to-digital converter, so as to provide an accurate analog signal conversion effect, and the converted digital data is then sent to the host computer 10 for further processing and analysis, so as to effectively improve the accuracy of the chip open and short circuit test.
[0033] In an embodiment of the utility model, the host computer 10 receives digital data obtained by processing the analog-to-digital conversion circuit, and the digital data may be voltage data. The voltage data is compared with a preset voltage threshold range. If the voltage data is within the preset voltage threshold range, the current chip open and short circuit test result is judged to be normal. If the voltage data is outside the preset voltage threshold range, the current chip open and short circuit test result is judged to be abnormal.
[0034] In the embodiment of the utility model, the host computer 10 and the analog-to-digital conversion module 20 are connected to the control module 30, and the control module 30 is connected to the pins of the chip to be tested through a connecting line. The control module is provided with an IO sampling circuit 301, and the IO sampling circuit 301 is used to collect IO data of the chip to be tested, and the digital quantity data obtained after the analog-to-digital conversion is sent to the host computer 10 for comparison with the preset voltage threshold range, so that the chip open and short circuit test results can be accurately and quickly detected without the need for a professional test platform. Not only can the test process be effectively simplified, but the test site is not restricted, and the convenience of the chip open and short circuit test can be effectively improved.
[0035] In one embodiment, the host computer 10 is connected to the control module 30 via a serial port.
[0036] In the embodiment of the utility model, the host computer 10 and the control module 30 communicate with each other through a serial port interface. The serial port interface usually adopts standard RS232, RS485 or USB serial port protocols, so as to improve the stability of communication and support two-way data transmission. The host computer 10 can be connected to the control module 30 through the serial port by setting the serial port parameters of the control module 30 to be consistent with the serial port parameters of the host computer 10, and realizing serial port communication based on the serial port parameters.
[0037] In the embodiment of the utility model, the host computer 10 is connected to the control module 30 through the serial port, and the host computer 10 can monitor and control the running status and operation of the module 30 in real time, and the host computer 10 can send commands, and the control module 30 performs corresponding actions or tasks to achieve remote control and operation. Serial communication is more reliable and stable than wireless communication, and is not affected by factors such as wireless signal strength and interference. It can maintain stable connection and transmission quality in a complex environment, thereby improving the accuracy and reliability of chip open and short circuit testing.
[0038] In one embodiment, the host computer 10 is connected to the control module 30 via a USB.
[0039] In one embodiment, the control module 30 is connected to the pins of the chip to be tested via a connecting wire, including:
[0040] The ADC sampling pin of the control module 30 is connected to the IO pin of the chip to be tested through a connecting line.
[0041] In one embodiment, the host computer 10 includes a display module, and the display module is used to display chip open and short circuit test data.
[0042] In the embodiment of the utility model, most host computers 10 are equipped with a display module so that users can intuitively view and operate the status and data of the system, but in some applications, the host computer 10 may only need to communicate with other devices through a network or other interfaces and does not have a display screen.
[0043] The host computer 10 of the embodiment of the utility model includes a display module, which is used to display chip open and short circuit test data. The chip open and short circuit test data includes IO data, digital quantity data obtained by analog-to-digital conversion, and test results.
[0044] The implementation of the present invention has the following beneficial effects:
[0045] In the embodiment of the utility model, the host computer 10 and the analog-to-digital conversion module 20 are connected to the control module 30, and the control module 30 is connected to the pins of the chip to be tested through a connecting line. The control module is provided with an IO sampling circuit 301, and the IO sampling circuit 301 is used to collect IO data of the chip to be tested, and the digital quantity data obtained after the analog-to-digital conversion is sent to the host computer 10 for comparison with the preset voltage threshold range, so that the chip open and short circuit test results can be accurately and quickly detected without the need for a professional test platform. Not only can the test process be effectively simplified, but the test site is not restricted, and the convenience of the chip open and short circuit test can be effectively improved.
[0046] Furthermore, the host computer 10 of the embodiment of the utility model is connected to the control module 30 via a serial port. Serial communication is more reliable and stable than wireless communication, and is not affected by factors such as wireless signal strength and interference. It can maintain a stable connection and transmission quality in a complex environment, thereby improving the accuracy and reliability of the chip open and short circuit test.
[0047] The above specific embodiments further describe the purpose, technical solutions and beneficial effects of the utility model in detail. It should be understood that the above are only specific embodiments of the utility model and are not intended to limit the protection scope of the utility model. It is particularly pointed out that for those skilled in the art, any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model should be included in the protection scope of the utility model.
Claims
1. A chip open and short circuit test device, characterized in that: include: Host computer, control module and analog-to-digital conversion module; The host computer and the analog-to-digital conversion module are both connected to the control module, and the control module is connected to the pins of the chip to be tested through a connecting line; The control module is provided with an IO sampling circuit, and the IO sampling circuit is used to collect IO data of the chip under test; The analog-to-digital conversion module is used to perform analog-to-digital conversion on the IO data to obtain digital data, and the digital data is sent to the host computer.
2. The open-short circuit test device according to claim 1, characterized in that: The host computer is connected to the control module via a serial port.
3. The open-short circuit test device according to claim 1, characterized in that: The host computer is connected to the control module via USB.
4. The open-short circuit test device according to claim 1, characterized in that: The control module is connected to the pins of the chip to be tested through a connecting line, and includes: The ADC sampling pin of the control module is connected to the IO pin of the chip to be tested through a connecting line.
5. The open-short circuit test device according to claim 1, characterized in that: The host computer comprises a display module, and the display module is used to display chip open and short circuit test data.