Probe pre-positioning and locking device

Abstract

The utility model discloses a probe pre-positioning locking device in the related technical field of chip testing, which comprises a main substrate and a guide rail arranged above the main substrate, the side edge of the guide rail is provided with a test probe plate main body, one side of the test probe plate main body far away from the guide rail is provided with a test probe plate positioning block, and the test probe plate positioning block is provided with a probe plate. A test needle plate base body is arranged on the side, away from the test needle plate body, of the test needle plate positioning block, and a sliding block is fixedly arranged below the test needle plate base body. According to the testing device provided by the utility model, a matching structure of the sliding rail and the sliding block is arranged between the testing needle plate substrate and the substrate main body, and the accurate boundary dimension of the sliding block is used as the pre-positioning of the testing needle positioning block, so that the testing needle plate substrate has good installation precision, and the reinstallation position is not changed after the testing needle plate substrate is disassembled, replaced and maintained; the installation precision and stability of the test needle plate substrate are effectively ensured, the positioning and calibration time is saved, and the detection efficiency is improved.

Description

Technical Field

[0001] The utility model belongs to the technical field related to chip testing, and in particular relates to a measuring needle pre-positioning locking device. Background Art

[0002] Chips usually refer to integrated circuit chips. Chips mainly integrate electronic components such as transistors, resistors, capacitors, etc. on tiny, thin silicon-based materials. It is a basic component of electronic devices. The process of manufacturing chips includes using photolithography technology to form circuit patterns on silicon wafers, and then forming electronic components through processes such as deposition, etching, and diffusion, and finally packaging them into a complete chip. Chips are used to perform specific electronic functions, such as microprocessor chips for computer central processing units, memory chips for storing data, and sensor chips for sensing the environment. Chips are widely used in electronic devices, including computers, mobile phones, televisions, automotive electronic systems, medical equipment and other fields. In the process of chip production and manufacturing, in order to ensure product quality, the chip needs to be inspected and tested. The test pin board substrate of the existing test device is fixedly installed on the main substrate by bolts. The positioning accuracy of the bolt connection is relatively low, resulting in the need for re-debugging of the test pin board after disassembly, replacement, and overhaul to ensure positioning accuracy and detection accuracy, affecting detection efficiency.

[0003] In view of this, the present utility model is proposed. Utility Model Content

[0004] The technical problem to be solved by the utility model is to overcome the deficiencies of the prior art and provide a probe pre-positioning locking device. To solve the above technical problem, the basic concept of the technical solution adopted by the utility model is:

[0005] A measuring needle pre-positioning and locking device comprises a main base plate and a guide rail arranged above the main base plate, a test needle plate body is arranged on the side of the guide rail, a test needle plate positioning block is arranged on the side of the test needle plate body away from the guide rail, a test needle plate base is arranged on the side of the test needle plate positioning block away from the test needle plate body, a slider is fixedly arranged below the test needle plate base, a slide rail is installed on the main base plate, the slider and the slide rail are slidably connected, and the test needle plate base is pre-positioned and installed on the main base plate through the cooperation of the slider and the slide rail.

[0006] As a further solution of the utility model: a plurality of fixing countersunk holes are provided on the slide rail, and bolts are installed in the fixing countersunk holes to fix the slide rail on the main base plate, and limiting screws can also be installed to limit the slider and lock the relative position.

[0007] As a further solution of the utility model: sliding matching grooves are provided on both sides of the slide rail, and a sliding block matching therewith is provided on the slider, so that the slider and the slide rail have good matching accuracy.

[0008] As a further solution of the utility model: a guide groove is provided on the guide rail, the chip is arranged in the guide groove, and a test needle body is provided on the side of the chip for testing the chip.

[0009] As a further solution of the utility model: countersunk holes and threaded holes of different specifications are processed on the main base plate to adapt to the installation of accessories of different specifications.

[0010] After adopting the above technical scheme, the utility model has the following beneficial effects compared with the prior art.

[0011] The utility model provides a test device with a matching structure of a slide rail and a slider between the test needle plate substrate and the substrate body, and uses the accurate outer dimensions of the slider itself as the pre-positioning of the test needle positioning block, so that the test needle plate substrate has good installation accuracy. After disassembly, replacement, and maintenance, the reinstallation position will not change, effectively ensuring the installation accuracy and stability of the test needle plate substrate, saving positioning and calibration time, and improving detection efficiency.

[0012] The specific implementation of the utility model is further described in detail below with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The accompanying drawings are part of this application and are used to provide a further understanding of the utility model. The schematic embodiments of the utility model and their descriptions are used to explain the utility model, but do not constitute an improper limitation on the utility model. Obviously, the drawings described below are only some embodiments. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:

[0014] Figure 1 It is a structural schematic diagram of the utility model;

[0015] Figure 2 It is a schematic diagram of the cooperation between the slide rail and the slider of the utility model.

[0016] In the figure: 1. main substrate; 2. guide rail; 3. chip; 4. test needle body; 5. test needle board body; 6. test needle board positioning block; 7. test needle board base; 8. slider; 9. slide rail; 10. sliding matching groove; 11. sliding block.

[0017] It should be noted that these drawings and textual descriptions are not intended to limit the conceptual scope of the present invention in any way, but rather to illustrate the concept of the present invention for those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical solutions and advantages of the embodiments of the utility model clearer, the technical solutions in the embodiments will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. The following embodiments are used to illustrate the utility model but are not used to limit the scope of the utility model.

[0019] like Figure 1 to Figure 2 As shown, a measuring needle pre-positioning and locking device comprises a main substrate 1 and a guide rail 2 arranged above the main substrate 1, a test needle plate body 5 is arranged on the side of the guide rail 2, a test needle plate positioning block 6 is arranged on the side of the test needle plate body 5 away from the guide rail 2, a test needle plate base 7 is arranged on the side of the test needle plate positioning block 6 away from the test needle plate body 5, a slider 8 is fixedly arranged below the test needle plate base 7, a slide rail 9 is installed on the main substrate 1, the slider 8 and the slide rail 9 are slidably connected, and the test needle plate base 7 is pre-positioned and installed on the main substrate 1 through the cooperation of the slider 8 and the slide rail 9.

[0020] Among them, a plurality of fixing countersunk holes are opened on the slide rail 9. Bolts are installed in the fixing countersunk holes to fix the slide rail 9 on the main base plate 1, and limiting screws can also be installed to limit the slider 8 and lock the relative position.

[0021] Sliding matching grooves 10 are provided on both sides of the slide rail 9 , and a sliding block 11 matching therewith is provided on the slider 8 , so that the slider 8 and the slide rail 9 have good matching accuracy.

[0022] A guide groove is provided on the guide rail 2 , and the chip 3 is arranged in the guide groove. A test needle body 4 is provided on the side of the chip 3 for testing the chip 3 .

[0023] Countersunk holes and threaded holes of different specifications are processed on the main base plate 1 to accommodate the installation of accessories of different specifications.

[0024] The working principle of the utility model is as follows: the guide rail 2 is fixedly mounted on the main substrate 1, the guide rail 2 is an I-shaped structure as a whole, a test needle board body 5 is arranged in the groove in the middle of the guide rail 2, and is used to test the chip 3, and the test needle board is mainly positioned by the test needle board positioning block 6, and the test needle board positioning block 6 is fixedly connected to the test needle board base 7;

[0025] When installing the test needle board substrate 7, first install it on the main substrate 1 through the sliding connection of the slider 8 and the slide rail 9, determine the fixed position of the test needle board substrate 7 according to the specifications of the test chip 3 and the arrangement of the test needle body 4, install screws and other limiting parts in the limiting through holes on the slide rail 9, limit the slider 8 and the test needle board substrate 7, and then use bolts to fix the test needle board substrate 7 on the main substrate 1 to achieve accurate positioning and installation of the test needle board substrate 7;

[0026] After replacing or overhauling the test components, due to the setting of the slide rail 9 and the slider 8, the test needle plate base 7 can be quickly pre-positioned when reinstalled, ensuring installation accuracy, effectively reducing debugging time, and thus improving test efficiency. The novel structure of the present invention is reasonably designed and easy to install and use. The test device of the present invention is provided with a matching structure of the slide rail 9 and the slider 8 between the test needle plate substrate and the substrate body, and the accurate outer dimensions of the slider 8 itself are used as the pre-positioning of the test needle positioning block, so that the test needle plate substrate has good installation accuracy. After disassembly, replacement, and maintenance, the reinstallation position will not change, which effectively ensures the accuracy and stability of the test needle plate substrate installation, saves positioning and calibration time, and improves detection efficiency.

[0027] The above is only a preferred embodiment of the utility model, and does not limit the utility model in any form. Although the utility model has been disclosed as a preferred embodiment as above, it is not used to limit the utility model. Any technician familiar with this patent can make some changes or modify the technical content suggested above into an equivalent embodiment with equivalent changes without departing from the scope of the technical solution of the utility model. However, any simple modification, equivalent change and modification made to the above embodiment based on the technical essence of the utility model without departing from the content of the technical solution of the utility model still falls within the scope of the solution of the utility model.

Claims

1. A probe pre-positioning and locking device, comprising a main substrate (1) and a guide rail (2) arranged above the main substrate, characterized in that: A test needle board body (5) is arranged on the side of the guide rail (2); a test needle board positioning block (6) is arranged on the side of the test needle board body (5) away from the guide rail (2); a test needle board base (7) is arranged on the side of the test needle board positioning block (6) away from the test needle board body (5); a slider (8) is fixedly arranged below the test needle board base (7); a slide rail (9) is installed on the main base plate (1); and the slider (8) and the slide rail (9) are slidably connected.

2. A measuring needle pre-positioning locking device according to claim 1, characterized in that: The slide rail (9) is provided with a plurality of fixing countersunk holes.

3. A measuring needle pre-positioning locking device according to claim 2, characterized in that: Sliding matching grooves (10) are provided on both sides of the slide rail (9), and a sliding block (11) matching the sliding block is provided on the slide block (8).

4. A measuring needle pre-positioning locking device according to claim 3, characterized in that: The guide rail (2) is provided with a guide groove, the chip (3) is arranged in the guide groove, and a test needle body (4) is arranged on the side of the chip (3).

5. A measuring needle pre-positioning locking device according to claim 4, characterized in that: The main base plate (1) is processed with countersunk holes and threaded holes of different specifications.

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