Adjustable chip test tool

Abstract

The utility model discloses an adjustable chip test tool which comprises a supporting frame, a mounting frame is installed on the top of the supporting frame, a first electric telescopic rod is arranged on the mounting frame, a chip seat is installed on the top of the supporting frame, a placement cavity is formed in the chip seat, and the adjustable chip test tool further comprises an adjusting mechanism. The adjusting mechanism comprises a movable plate, a fixed plate and a driving part, the fixed plate is fixedly mounted in the placement cavity, the movable plate is movably arranged in the placement cavity, the driving part comprises a fixed seat, the fixed seat is mounted at the top of the supporting frame, and a second electric telescopic rod is mounted on the rear surface of the fixed seat. A piston rod of the second electric telescopic rod penetrates through the chip seat and is connected with a fastening sheet; the beneficial effects of the utility model are that through the designed adjusting mechanism, the gap between the movable plate and the fixed plate can be adjusted according to the size of a chip, the chip can be rapidly fixed, and the use convenience is increased.

Description

Technical Field

[0001] The utility model belongs to the technical field of chip testing, and in particular relates to an adjustable chip testing tool. Background Art

[0002] The chip production process is very complicated. Any error in the process may result in a large number of substandard products and have a significant impact on the performance of terminal application products. Therefore, chip testing is extremely important.

[0003] Test fixtures are often used for chip testing; the test fixture for integrated circuit chips with the authorization announcement number CN219695358U discloses a support frame, a mounting frame is fixedly connected to the support frame, an electric telescopic rod is installed on the mounting frame, a test bench is installed at the output end of the electric telescopic rod, and a probe is provided at the lower part of the test bench; when in use, the integrated circuit chip is placed in the chip placement cavity of the chip seat, the integrated circuit chip is fixed by a plurality of positioning columns, the electric telescopic rod drives the test bench 1 to move downward, and the probe of the test bench contacts the integrated circuit chip to complete the test.

[0004] The existing chip testing tooling has the following problems when in use:

[0005] When multiple positioning pins are used to fix a chip, they can only fix chips of a single size and cannot fix chips of different sizes. Utility Model Content

[0006] The utility model aims to provide an adjustable chip testing tool, which can fix chips of different sizes through a designed adjusting mechanism.

[0007] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: an adjustable chip testing tool, comprising a support frame, a mounting frame is installed on the top of the support frame, and a first electric telescopic rod is arranged on the mounting frame, a chip seat is installed on the top of the support frame, and a placement cavity is opened inside the chip seat, and also includes an adjustment mechanism, the adjustment mechanism includes a movable plate, a fixed plate and a driving component, the fixed plate is fixedly installed inside the placement cavity, the movable plate is movably arranged inside the placement cavity, the driving component includes a fixed seat, the fixed seat is installed on the top of the support frame, and a second electric telescopic rod is installed on the rear surface of the fixed seat, the piston rod of the second electric telescopic rod passes through the chip seat and is connected to a fastening plate, and the fastening plate is fixedly connected to the movable plate.

[0008] Preferably, a through hole for the piston rod of the second electric telescopic rod to pass through is opened on the front surface of the chip holder, and a sliding block is arranged at the bottom of the movable plate.

[0009] Preferably, a slide groove communicating with the placement cavity is provided inside the chip seat, and the slider is slidably connected to the slide groove.

[0010] Preferably, rubber pads are installed on the front surface of the fixed plate and the rear surface of the movable plate, and the rubber pads are rectangular parallelepiped structures.

[0011] Preferably, a control button is installed on the top of the support frame, and a handle is installed on the side surface of the support frame.

[0012] Preferably, the piston rod of the first electric telescopic rod is connected to a base, and a test bench is installed on the base, and a probe is provided at the bottom of the test bench.

[0013] Preferably, a threaded portion is provided at the bottom of the base, a protruding portion is provided at the top of the test bench, and an outer wall of the protruding portion is provided with an external thread connected to the threaded portion.

[0014] Compared with the prior art, the beneficial effects of the utility model are:

[0015] Through the designed adjustment mechanism, the gap between the movable plate and the fixed plate can be adjusted according to the size of the chip, and the chip can be quickly fixed, which increases the convenience of use. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram of the structure of the utility model;

[0017] Figure 2 It is a partial enlarged structural schematic diagram of the utility model;

[0018] Figure 3 This is a schematic diagram of the cross-sectional structure of the connection between the test bench and the base of the utility model;

[0019] In the figure: 1. support frame; 11. handle; 12. control button; 13. fixed seat; 2. chip seat; 21. placement cavity; 210. slide groove; 3. mounting frame; 31. first electric telescopic rod; 4. base; 41. threaded portion; 5. test bench; 51. probe; 52. protrusion; 521. external thread; 6. second electric telescopic rod; 61. fastening plate; 7. moving plate; 71. slider; 8. fixed plate; 9. rubber pad. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0021] Example 1

[0022] See also Figure 1 and Figure 2 , which is the first embodiment of the utility model, and the embodiment provides an adjustable chip testing tool, including a support frame 1, the support frame 1 plays a supporting effect, a mounting frame 3 is installed on the top of the support frame 1, and the mounting frame 3 is added, the mounting frame 3 is an inverted "L"-shaped structure, and a first electric telescopic rod 31 is arranged on the mounting frame 3, the mounting frame 3 increases the support for the first electric telescopic rod 31, the piston rod of the first electric telescopic rod 31 is connected with a base 4, when the first electric telescopic rod 31 works, it drives the base 4 to rise and fall, and a test bench 5 is installed on the base 4, when the base 4 rises and falls, it drives the test bench 5 to rise and fall, a probe 51 is arranged at the bottom of the test bench 5, when the test bench 5 rises and falls, it drives the probe 51 to rise and fall, a chip seat 2 is installed on the top of the support frame 1, and a placement cavity 21 is opened inside the chip seat 2, and the opening of the placement cavity 21 is realized, and the chip to be tested is placed in the placement cavity 21, and also includes an adjustment Mechanism, the adjustment mechanism includes a movable plate 7, a fixed plate 8 and a driving component. The fixed plate 8 is fixedly installed in the placement cavity 21 by screws, thereby realizing the stable installation of the fixed plate 8. The movable plate 7 is movably arranged in the placement cavity 21. The movable plate 7 can move in the placement cavity 21, so as to adjust the gap between the movable plate 7 and the fixed plate 8 according to the size of the chip, thereby increasing the convenience of use. The driving component includes a fixed seat 13, the fixed seat 13 is installed on the top of the support frame 1, and the rear surface of the fixed seat 13 is installed with a second electric telescopic rod 6, the fixed seat 13 increases the support for the second electric telescopic rod 6, the piston rod of the second electric telescopic rod 6 passes through the chip seat 2, and is connected with a fastening plate 61. When the second electric telescopic rod 6 works, it drives the fastening plate 61 to move forward and backward, the fastening plate 61 and the movable plate 7 are fixedly connected, and when the fastening plate 61 moves, it drives the movable plate 7 to move, thereby adjusting the gap between the movable plate 7 and the fixed plate 8.

[0023] In this embodiment, preferably, a through hole is provided on the front surface of the chip holder 2 for the piston rod of the second electric telescopic rod 6 to pass through, and a slider 71 is provided at the bottom of the movable plate 7, thereby realizing the additional installation of the slider 71.

[0024] In this embodiment, preferably, a slide groove 210 connected to the placement cavity 21 is opened inside the chip seat 2, and the slide groove 210 is opened, and the slider 71 and the slide groove 210 are slidably connected. The cooperation of the slider 71 and the slide groove 210 increases the convenience of moving the movable plate 7.

[0025] In this embodiment, preferably, rubber pads 9 are installed on the front surface of the fixed plate 8 and the rear surface of the movable plate 7, and the rubber pads 9 are rectangular structures. The rectangular rubber pads 9 reduce damage to the outer side surface when the chip is fixed.

[0026] In this embodiment, preferably, a control button 12 is installed on the top of the support frame 1. Operating the control button 12 increases the convenience of using the first electric telescopic rod 31 and the second electric telescopic rod 6. A handle 11 is installed on the side surface of the support frame 1, and it is more convenient to pick up the support frame 1 through the handle 11.

[0027] Example 2

[0028] See also Figure 1-Figure 3 , which is the second embodiment of the utility model, is based on the previous embodiment, and the difference is that:

[0029] A threaded portion 41 is provided at the bottom of the base 4 to realize the opening of the threaded portion 41, and a protrusion 52 is provided at the top of the test bench 5 to realize the addition of the protrusion 52, and the outer wall of the protrusion 52 is provided with an external thread 521 connected to the threaded portion 41. When the test bench 5 and the base 4 are spliced, the base 4 is picked up and the protrusion 52 is screwed into the base 4 to realize the installation of the test bench 5. When the probe 51 is damaged and needs to be replaced, the test bench 5 can be unscrewed for replacement.

[0030] The working principle and use process of the utility model are as follows: when in use, the chip to be tested is placed in the placement cavity 21, and the control button 12 is operated to make the second electric telescopic rod 6 work. When the second electric telescopic rod 6 works, it drives the movable plate 7 to move, and the chip is clamped between the fixed plate 8 and the movable plate 7. The control button 12 is operated to make the first electric telescopic rod 31 work. When the first electric telescopic rod 31 works, it drives the base 4 to descend. When the base 4 descends, it drives the test table 5 to descend, and makes the probe 51 contact with the chip to complete the test.

[0031] Although the embodiments of the present invention have been shown and described, as detailed above, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. An adjustable chip testing tool, comprising a support frame (1), a mounting frame (3) is installed on the top of the support frame (1), and a first electric telescopic rod (31) is arranged on the mounting frame (3), a chip holder (2) is installed on the top of the support frame (1), and a placement cavity (21) is opened inside the chip holder (2), characterized in that: The invention also comprises an adjusting mechanism, wherein the adjusting mechanism comprises a movable plate (7), a fixed plate (8) and a driving component, wherein the fixed plate (8) is fixedly mounted inside the placement cavity (21), and the movable plate (7) is movably arranged inside the placement cavity (21); the driving component comprises a fixed seat (13), wherein the fixed seat (13) is mounted on the top of the support frame (1), and a second electric telescopic rod (6) is mounted on the rear surface of the fixed seat (13); a piston rod of the second electric telescopic rod (6) passes through the chip seat (2) and is connected to a fastening plate (61); and the fastening plate (61) and the movable plate (7) are fixedly connected.

2. The adjustable chip testing tool according to claim 1, characterized in that: The front surface of the chip seat (2) is provided with a through hole for the piston rod of the second electric telescopic rod (6) to pass through, and a sliding block (71) is provided at the bottom of the movable plate (7).

3. The adjustable chip testing tool according to claim 2, characterized in that: The chip seat (2) is provided with a slide groove (210) in communication with the placement cavity (21), and the slider (71) is slidably connected to the slide groove (210).

4. The adjustable chip testing tool according to claim 1, characterized in that: The front surface of the fixed plate (8) and the rear surface of the movable plate (7) are both installed with rubber pads (9), and the rubber pads (9) are rectangular parallelepiped structures.

5. The adjustable chip testing tool according to claim 1, characterized in that: A control button (12) is installed on the top of the support frame (1), and a handle (11) is installed on the side surface of the support frame (1).

6. The adjustable chip testing tool according to claim 1, characterized in that: The piston rod of the first electric telescopic rod (31) is connected to a base (4), and a test bench (5) is installed on the base (4), and a probe (51) is arranged at the bottom of the test bench (5).

7. The adjustable chip testing tool according to claim 6, characterized in that: The bottom of the base (4) is provided with a threaded portion (41), the top of the test bench (5) is provided with a protruding portion (52), and the outer wall of the protruding portion (52) is provided with an external thread (521) connected to the threaded portion (41).

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