Storage device for ICT probe
By designing an ICT probe storage device with electric material withdrawal function, the problem of inconvenience in accessing and using existing storage devices and small storage space is solved, and the classification and rapid acquisition of multiple probes is realized, and the storage efficiency is improved. and ease of operation.
Patent Information
- Application Number
- CN202421186479.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-28
- Publication Date
- 2025-02-25
- Estimated Expiration
- 2034-05-28
AI Technical Summary
The existing ICT probe storage device is inconvenient for users to use and has a small storage space. It is only suitable for single probe storage, and the storage space is limited, which cannot meet the needs of multi-probe classified storage and fast acquisition.
A storage device for ICT probes is designed, including a rotating table, a motor, a probe storage table, an electric lifting table and an electric telescopic rod. The probes are quickly picked up and placed through the electric material collection function, and the probes are passed through the ring. Distributed probe storage tanks for classified storage of multiple probes.
The storage space is expanded, and it can be classified and divided according to the size or model of the probe, and the electric material collection function can be used to quickly pick up and place the probe, improving the convenience of user operation and storage efficiency.
Smart Images

Figure CN222523195U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of ICT probes, in particular to a storage device for ICT probes. Background Art
[0002] ICT test fixture is the abbreviation of integrated circuit test instrument fixture, which is an online detection and test fixture. It is a standard test equipment that tests the electrical performance and electrical connection of online components to check for manufacturing defects and component failures. ICT test fixtures can perform analog device function and digital device logic function tests with high fault coverage. A dedicated needle bed needs to be made for each single board. This needle bed is called an ICT test fixture in industrial production. The needle bed is composed of multiple probes.
[0003] When the probe is stored daily, a storage device is needed to protect it;
[0004] For example, the public document: CN203767320U, named "A nanoprobe storage device", improves the stability of the probe storage and the convenience of taking and placing the probe through the structural design of the probe container; by placing the probe container in a vacuum bag, the cleanliness of the probe container is guaranteed to avoid contamination caused by contact between the outside air and the probe. This improves the existing technology where the probe is contaminated or deformed and cannot be reused due to the influence of factors such as the external environment and poor fixing effect when the probe is stored after use, saving resources and reducing additional industry expenses.
[0005] Although the above-mentioned existing probe storage device can improve the protection of the probe storage state, it is inconvenient for users to take and use, has little storage space, is only suitable for storing a single probe, and has limited storage space; therefore, it does not meet existing needs. We have proposed a storage device for ICT probes. Utility Model Content
[0006] The purpose of the utility model is to provide a storage device for ICT probes with a multi-probe storage structure and convenient for users to take, so as to solve the problems raised in the above-mentioned background technology.
[0007] To achieve the above object, the utility model provides the following technical solution: a storage device for an ICT probe, comprising: a rotating table, wherein the rotating table is a truncated table structure, and a base is provided below the rotating table;
[0008] Also includes:
[0009] A motor is installed between the rotating platform and the base, and the motor is connected to the rotating platform through a driving shaft;
[0010] A probe storage platform is annularly arranged in the slot on the upper surface of the rotating platform, and a plurality of probe storage slots are arranged in annularly spaced distribution inside the probe storage platform;
[0011] An electric lifting platform is installed on the upper surface of the base and is located on one side of the motor. An electric telescopic rod is provided at the upper end of the electric lifting platform. A driven lifting plate is installed at the telescopic end of the electric telescopic rod. A plurality of top rods are arranged at annular intervals on the upper surface of the driven lifting plate.
[0012] Preferably, a probe body is provided inside the probe storage groove, a lower groove body is provided at the lower end of the probe storage groove, and a lower opening of the lower groove body is opened on the lower surface of the rotating table.
[0013] Preferably, slide rails are provided on both sides of the probe storage slot, sliders are provided on the outer walls of the slide rails, a probe rack is provided between the sliders, and the probe body is inserted into the slot of the probe rack and extends downward into the lower slot body.
[0014] Preferably, slide grooves are provided on both sides of the lower tank body, and limit blocks are provided at the upper and lower ends of the slide grooves.
[0015] Preferably, a driven seat is provided between the slide grooves, and a needle groove is provided on the outer wall of the driven seat.
[0016] Preferably, both sides of the opening on the upper surface of the probe storage slot are movably mounted with flip covers via hinges.
[0017] Compared with the prior art, the beneficial effects of the utility model are:
[0018] 1. The utility model provides an ICT probe storage device with an electric material retrieval function by means of a motor, a probe storage table, a probe storage slot, an electric lifting table, an electric telescopic rod, a driven lifting plate, and a push rod. Compared with the existing probe storage device, the storage device has a large storage space, and can classify and divide the probes according to size or model, and then realize the rapid retrieval and placement of the probes by means of electric material retrieval. The motor is used to drive the rotating table to rotate, and the position of the probe storage table of different models is adjusted by rotation, and the probe storage table required for retrieval and use is rotated to the top of the electric lifting table. The driven lifting plate is driven by the electric telescopic rod to move up and down at the electric lifting table. When the electric lifting table is extended upward, the push rod will be inserted into the lower slot body, and the probe body will be ejected from the slot by the upward ejection operation, so that the user can take it conveniently.
[0019] 2. The probe body is generally structured in such a way that the lower end is a sharp and thinner needle end, while the upper and middle part is larger than the needle end. Based on this feature, the upper and middle part of the probe is placed in the slot of the probe frame through the probe frame, and the slider and the slide rail are used to enable the part to be lifted and slid. During the ejection operation, the probe body can be lifted and moved smoothly.
[0020] 3. The setting of the driven seat is used to limit the needle end of the probe. At the same time, the needle groove is opened for the needle end of the probe to be embedded and placed, thereby improving the protection of the needle end. The setting of the slide groove enables the limit block to be lifted and slid in the slide groove when it is lifted up. The limit block is used to limit the moving space of the driven seat to prevent it from leaving the slide groove. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] Figure 1 It is a schematic diagram of the overall structure of the utility model;
[0022] Figure 2 This is a schematic diagram of the structure of the electric lifting platform of the utility model;
[0023] Figure 3 It is a top view of the utility model;
[0024] Figure 4 This is a schematic diagram of the internal structure of the probe storage tank of the utility model;
[0025] In the figure: 1. rotating table; 2. probe storage table; 3. probe storage slot; 4. slide rail; 5. slider; 6. probe rack; 7. probe body; 8. lower slot; 9. motor; 10. base; 11. electric lifting platform; 12. electric telescopic rod; 13. driven lifting plate; 14. push rod; 15. flip cover; 16. driven seat; 17. needle slot; 18. slide slot; 19. limit block. DETAILED DESCRIPTION
[0026] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.
[0027] See also Figure 1-4 The utility model provides an embodiment: a storage device for an ICT probe, comprising: a rotating table 1, wherein the rotating table 1 is a truncated table structure, and a base 10 is provided below the rotating table 1;
[0028] Also includes:
[0029] The motor 9 is installed between the rotating platform 1 and the base 10, and the motor 9 is connected to the rotating platform 1 through a driving shaft;
[0030] The probe storage platform 2 is annularly arranged in the slot on the upper surface of the rotating platform 1, and a plurality of probe storage slots 3 are annularly arranged and spaced apart inside the probe storage platform 2;
[0031] An electric lifting platform 11 is mounted on the upper surface of the base 10 and is located on one side of the motor 9. An electric telescopic rod 12 is provided at the upper end of the electric lifting platform 11. A driven lifting plate 13 is provided at the telescopic end of the electric telescopic rod 12. A plurality of ejector rods 14 are provided at intervals in an annular shape on the upper surface of the driven lifting plate 13.
[0032] Through the arrangement of the motor 9, the probe storage table 2, the probe storage slot 3, the electric lifting platform 11, the electric telescopic rod 12, the driven lifting plate 13, and the ejector rod 14, the ICT probe storage device has an electric material taking function. Compared with the existing probe storage device, the storage space is large, and the probes can be classified and divided according to size or model, and then the probes can be quickly taken and placed by electric material taking. Among them, the motor 9 is used to drive the rotating table 1 to rotate, and the position of the probe storage table 2 of different models is adjusted by rotation, and the probe storage table 2 required for taking and using is rotated to the top of the electric lifting platform 11. The electric lifting platform 11 drives the driven lifting plate 13 to move up and down through the electric telescopic rod 12. When it is extended upward, the ejector rod 14 will be inserted into the lower slot body 8, and the probe body 7 will be ejected from the slot through the upward ejection operation, which is convenient for users to take.
[0033] Among them, the motor 9 is a stepper motor. Every time a pulse signal is input, the rotor rotates an angle or moves forward one step. The angular displacement or linear displacement outputted by the motor 9 is proportional to the number of input pulses. The characteristics of the motor 9 facilitate rotation.
[0034] See also Figure 4 , a probe body 7 is provided inside the probe storage slot 3, a lower slot body 8 is provided at the lower end of the probe storage slot 3, and a lower opening of the lower slot body 8 is opened on the lower surface of the rotating table 1;
[0035] The lower tank 8 can be used for the push rod 14 below to perform telescopic movement.
[0036] See also Figure 4 , slide rails 4 are provided on both sides of the probe storage slot 3, sliders 5 are provided on the outer walls of the slide rails 4, probe racks 6 are provided between the sliders 5, and the probe body 7 is inserted into the slot of the probe rack 6 and extends downward into the lower slot 8;
[0037] The probe body 7 is generally structured such that the lower end is a sharp and thinner needle end, while the upper and middle parts are larger than the needle end. Based on this feature, the upper and middle parts of the probe are mounted in the slot of the probe frame 6 through the probe frame 6, and the slider 5 and the slide rail 4 are used to enable the probe body 7 to be lifted and slid. During the ejection operation, the probe body 7 can be lifted and moved smoothly.
[0038] See also Figure 4 , both sides of the lower tank body 8 are provided with slide grooves 18, and upper and lower ends of the slide grooves 18 are provided with limit blocks 19; a driven seat 16 is provided between the slide grooves 18, and a needle groove 17 is provided on the outer wall of the driven seat 16;
[0039] The setting of the driven seat 16 is used to limit the needle end of the probe. At the same time, the needle groove 17 is provided for the needle end of the probe to be embedded and placed, thereby improving the protection of the needle end. The setting of the slide groove 18 enables the limit block 19 to be lifted and slid in the slide groove 18 when it is lifted. The limit block 19 is used to limit the moving space of the driven seat 16 to prevent it from leaving the slide groove 18.
[0040] The size and structure of the needle slot 17 can be set according to the probe models to be stored, so as to store probes of different models and sizes.
[0041] See also Figure 4 , both sides of the opening on the upper surface of the probe storage slot 3 are movably mounted with flip covers 15 through hinges;
[0042] In the storage state, the flip covers 15 on both sides close the upper opening of the probe storage slot 3 to improve the sealing performance; when pushed upward, the flip covers 15 are driven to flip upward, so that the flip covers 15 are opened, which is convenient for users to take the probes;
[0043] The flip cover 15 adopts a reset hinge to achieve a closed reset operation when there is no push-out force.
[0044] Working principle: When in use, the motor 9 is turned on, and the motor 9 drives the rotating table 1 to rotate, and the probe storage table 2 on which the required type of probe is placed is rotated to the electric lifting platform 11; the electric lifting platform 11 drives the driven lifting plate 13 to extend upward through the electric telescopic rod 12, and multiple ejector rods 14 are driven to move upward to the lower tank 8 at the corresponding position; the ejector rod 14 continues to move upward, and lifts up the driven seat 16, and the driven seat 16 drives the upper probe body 7 to slide upward, and the upper opening flip cover 15 is pushed open by the ejection force, so that the user can take the probe body 7 ejected to the outside;
[0045] After taking, the electric telescopic rod 12 retracts downward, driving the top rod 14 to separate from the lower tank 8, and the driven seat 16 slides downward to the lowest limit block 19, and the remaining unused probes slide downward on the slide rail 4 through the slider 5 to close the flip cover 15.
[0046] It is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive from any point of view, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be regarded as limiting the claim to which it relates.
Claims
1. A storage device for an ICT probe, comprising a rotating table (1), wherein the rotating table (1) is a truncated table structure, and a base (10) is provided below the rotating table (1); Features: Also includes: a motor (9) installed between the rotating platform (1) and the base (10), the motor (9) being transmission-connected to the rotating platform (1) via a driving shaft; A probe storage platform (2) is arranged in an annular shape in a groove on the upper surface of the rotating platform (1), and a plurality of probe storage grooves (3) are arranged in an annular shape and spaced apart from each other inside the probe storage platform (2); An electric lifting platform (11) is mounted on the upper surface of the base (10) and is located on one side of the motor (9). An electric telescopic rod (12) is provided at the upper end of the electric lifting platform (11). A driven lifting plate (13) is provided at the telescopic end of the electric telescopic rod (12). A plurality of top rods (14) are provided at intervals in an annular shape on the upper surface of the driven lifting plate (13).
2. The storage device for an ICT probe according to claim 1, characterized in that: A probe body (7) is provided inside the probe storage groove (3), a lower groove body (8) is provided at the lower end of the probe storage groove (3), and a lower opening of the lower groove body (8) is opened on the lower surface of the rotating platform (1).
3. The storage device for an ICT probe according to claim 2, characterized in that: Slide rails (4) are provided on both sides of the probe storage slot (3), sliders (5) are provided on the outer walls of the slide rails (4), a probe rack (6) is provided between the sliders (5), and a probe body (7) is inserted into the slot of the probe rack (6) and extends downward into the lower slot body (8).
4. The storage device for an ICT probe according to claim 2, characterized in that: Slide grooves (18) are provided on both sides of the lower trough body (8), and limit blocks (19) are provided at the upper and lower ends of the slide groove (18).
5. The storage device for an ICT probe according to claim 4, characterized in that: A driven seat (16) is provided between the slide grooves (18), and a needle groove (17) is provided on the outer wall of the driven seat (16).
6. The storage device for an ICT probe according to claim 1, characterized in that: Both sides of the opening on the upper surface of the probe storage slot (3) are movably mounted with flip covers (15) via hinges.
Citation Information
Patent Citations
Nanometer probe storage apparatus
CN203767320U