Semiconductor service life testing machine convenient to take and place

Abstract

The utility model discloses a semiconductor life tester convenient to take and place, which belongs to the technical field of semiconductor life testers, and comprises a test box, the test box is provided with two groups of test cavities, the upper end of the test box is provided with a mounting groove, and the upper end of the test box is provided with a clamping groove. A protective cover adjusting mechanism is mounted on the inner side of the mounting groove, and a test feeding and discharging mechanism is mounted at the inner end of the test cavity and used for testing the service life of a semiconductor and facilitating taking and placing of the semiconductor. According to the device, the protective cover bodies can be conveniently and automatically opened and closed through the protective cover adjusting mechanism, the automation level is high, the two sets of protective cover bodies can be opened and closed at the same time, much time is saved, a semiconductor test plate can be lifted through the test feeding and discharging mechanism, and a semiconductor can be conveniently taken and placed.

Description

Technical Field

[0001] The utility model relates to the field of semiconductor life testers, in particular to a semiconductor life tester which is convenient for taking and placing. Background Art

[0002] In order to achieve the qualified rate of semiconductor chips, almost all semiconductor chips must undergo aging tests before leaving the factory. The aging test is to provide the necessary system signals to the semiconductor chip to be tested through the test board, simulate the working state of the semiconductor chip, accelerate the electrical failure of the semiconductor chip under high temperature or other conditions, and obtain the failure rate of the semiconductor chip within a period of time.

[0003] In the prior art, there is a semiconductor testing device with an application number of CN202022003578.6 that can automatically open and close the door, which belongs to the technical field of semiconductor testing equipment, and includes: a test box, which is provided with two chambers with top openings, and test boards are provided in both chambers, and upper covers are provided on the tops of the two chambers; an upper cover driving assembly, which includes a translation mechanism and a lifting mechanism for driving the two upper covers to move in the horizontal and vertical directions respectively. The semiconductor testing equipment of the present application does not need to plug and unplug the test board when performing aging tests on semiconductor chips, thereby improving the service life of the test board. At the same time, the upper cover is provided with an upper cover driving assembly to realize automatic opening and closing of the upper cover, thereby improving the efficiency of the aging test.

[0004] The applicant has studied and found that the above-mentioned scheme has certain shortcomings. When the device is used, when it is necessary to open the upper cover to take and place the semiconductor, the two sets of upper covers cannot be opened simultaneously and automatically. Each operation can only open one set of upper covers and take and place the semiconductor. After the taking and placing is completed, the other set of covers is unscrewed and opened, and the semiconductor is taken and placed. The operation is cumbersome and takes a lot of time. At the same time, when taking and placing the semiconductor, it is necessary to operate inside the test box, which is inconvenient to take and place, and may cause damage to the test board and the semiconductor connection. Utility Model Content

[0005] In order to make up for the above shortcomings, the utility model provides a semiconductor life testing machine which is easy to pick up and place, aiming to improve the use of the device. When the upper cover needs to be opened to pick up and place the semiconductor, the two sets of upper covers cannot be opened simultaneously and automatically. Each operation can only open one set of upper covers and take and place the semiconductor. After the picking and placing is completed, the other set of covers is unscrewed and opened, and the semiconductor is taken and placed. The operation is cumbersome and takes a lot of time. At the same time, when taking and placing the semiconductor, it is necessary to operate inside the test box, which is inconvenient to take and place, and may cause damage to the connection between the test board and the semiconductor.

[0006] The utility model is implemented as follows: a semiconductor life tester that is easy to take and place, including a test box, the test box is provided with a test cavity, the test cavity is provided with two groups, the upper end of the test box is provided with a mounting groove, the inner side of the mounting groove is provided with a protective cover adjustment mechanism, the inner end of the test cavity is provided with a test loading and unloading mechanism, the test loading and unloading mechanism is used to test the semiconductor life and facilitate the semiconductor taking and placing, and the protective cover adjustment mechanism is used to protect the upper end of the test cavity.

[0007] In the preferred technical solution of the utility model, the protective cover adjustment mechanism includes a screw rod, which is rotatably installed on the inner side of the installation groove, and an adjustment block is threadedly installed on the screw rod, a connecting block is installed on one side of the adjustment block, and a protective cover body is fixedly installed on one side of the connecting block. The rotation of the screw rod causes the adjustment block to drive the connecting block and the protective cover body to move, so that the protective cover body protects the test cavity or moves the protective cover body away from the test cavity after the test is completed.

[0008] In the preferred technical solution of the utility model, two groups of adjustment blocks are provided, and the threads at both ends of the screw rod are arranged in opposite directions. The two groups of adjustment blocks are threadedly installed at both ends of the screw rod, so that after the detection is completed, the adjustment block drives the connecting block and the protective cover body to move in the opposite direction.

[0009] In a preferred technical solution of the utility model, a motor is installed on one side of the test box, and the screw rod is driven by the motor.

[0010] In the preferred technical solution of the utility model, a connecting strip is fixedly installed at the bottom end of the connecting block, a connecting groove is provided at the upper end of the test box, and the connecting strip is slidably connected in the connecting groove to enhance the stability of the movement of the protective cover body.

[0011] In the preferred technical solution of the utility model, a support block is fixedly installed on one side of the protective cover body, a slide bar is fixedly installed on the bottom end of the support block, a slide groove is installed on the upper end of the test box, and the support block is slidably connected in the slide groove to further improve the stability of the protective cover body when moving.

[0012] In the preferred technical solution of the utility model, the test loading and unloading mechanism includes a linear lifting electric cylinder, which is installed at the inner end of the test cavity, and a mounting plate is installed at the output end of the linear lifting electric cylinder, a semiconductor test board is installed at the upper end of the mounting plate, and a guide block is installed on one side of the mounting plate. The inner wall of the test cavity is provided with a guide groove and the guide block is slidably connected in the guide groove. The mounting plate and the semiconductor test board are driven to rise and fall by the linear lifting electric cylinder, so that it is convenient to place the semiconductor into the semiconductor test board for measurement.

[0013] In the preferred technical solution of the utility model, a wheel body is installed at the bottom end of the test box, and the wheel body is configured as a self-locking universal wheel.

[0014] In a preferred technical solution of the present utility model, a control panel is provided on one side of the test box.

[0015] The beneficial effects of the utility model are as follows: the utility model obtains a semiconductor life test machine that is easy to pick up and put through the above design. When in use, when it is necessary to test the semiconductor, the motor drives the screw rod so that the two groups of adjustment blocks drive the connection block and the protective cover body to move in opposite directions, so that the two groups of protective cover bodies are away from the top of the test chamber. At the same time, the stability of the protective cover body during movement is enhanced by the connection bar and the slide bar. The linear lifting electric cylinder drives the installation plate and the semiconductor test board to rise and fall, so that it is convenient to put the semiconductor into the semiconductor test board for testing, and the wheel body is used to facilitate the movement of the device. The device can automatically open and close the protective cover body through the protective cover adjustment mechanism, with a high level of automation, and can open and close the two groups of protective cover bodies at the same time, saving a lot of time. The semiconductor test board can be lifted and lowered through the test loading and unloading mechanism, which is convenient for taking and putting semiconductors. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solution of the implementation mode of the utility model, the drawings required for use in the implementation mode will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the utility model and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying creative work.

[0017] Figure 1 This is a schematic diagram of the structure of a semiconductor life tester that is easy to pick up and place, provided by an embodiment of the utility model;

[0018] Figure 2 Another structural schematic diagram provided for an embodiment of the utility model;

[0019] Figure 3 for Figure 2 A magnified view of position A in the middle;

[0020] Figure 4 A schematic cross-sectional view of an embodiment of the present invention.

[0021] In the figure: 100-test box; 101-test cavity; 102-installation slot; 103-connection slot; 104-slide slot; 110-wheel body; 120-control panel; 200-protective cover adjustment mechanism; 210-motor; 220-screw rod; 230-adjustment block; 240-connection block; 241-connection bar; 250-protective cover body; 270-support block; 271-slide bar; 300-test loading and unloading mechanism; 310-linear lifting cylinder; 320-installation plate; 321-guide block; 330-semiconductor test board. DETAILED DESCRIPTION

[0022] In order to make the purpose, technical solution and advantages of the implementation of the utility model clearer, the technical solution in the implementation of the utility model will be clearly and completely described below in conjunction with the drawings in the implementation of the utility model. Obviously, the described implementation is a part of the implementation of the utility model, not all of the implementations. Based on the implementation of the utility model, all other implementations obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0023] See also Figure 1-Figure 4 The utility model provides a technical solution: a semiconductor life tester that is easy to pick up and place, including a test box 100, the test box 100 is provided with a test cavity 101, the test cavity 101 is provided with two groups, the upper end of the test box 100 is provided with a mounting groove 102, the inner side of the mounting groove 102 is installed with a protective cover adjustment mechanism 200, the inner end of the test cavity 101 is installed with a test loading and unloading mechanism 300, the test loading and unloading mechanism 300 is used to test the semiconductor life and facilitate the semiconductor picking and placing, and the protective cover adjustment mechanism 200 is used to protect the upper end of the test cavity 101.

[0024] In some specific embodiments, the protective cover adjustment mechanism 200 includes a screw rod 220, which is rotatably installed on the inner side of the installation groove 102, and an adjustment block 230 is threadedly installed on the screw rod 220. A connecting block 240 is installed on one side of the adjustment block 230, and a protective cover body 250 is fixedly installed on one side of the connecting block 240. The rotation of the screw rod 220 causes the adjustment block 230 to drive the connecting block 240 and the protective cover body 250 to move, so that the protective cover body 250 protects the test cavity 101 or moves the protective cover body 250 away from the test cavity 101 after the test is completed.

[0025] In some specific implementation schemes, two groups of adjustment blocks 230 are provided, and the threads at both ends of the screw rod 220 are arranged in opposite directions. The two groups of adjustment blocks 230 are threadedly installed at both ends of the screw rod 220, so that after the detection is completed, the adjustment block 230 drives the connecting block 240 and the protective cover body 250 to move in the opposite direction.

[0026] In some specific implementation schemes, a motor 210 is installed on one side of the test box 100 , and the lead screw 220 is driven by the motor 210 .

[0027] In some specific implementation schemes, a connecting strip 241 is fixedly installed at the bottom of the connecting block 240, and a connecting groove 103 is provided at the upper end of the test box 100. The connecting strip 241 is slidably connected in the connecting groove 103 to enhance the stability of the protective cover body 250 when moving.

[0028] In some specific implementation schemes, a support block 270 is fixedly installed on one side of the protective cover body 250, a slide bar 271 is fixedly installed on the bottom of the support block 270, a slide groove 104 is installed on the upper end of the test box 100, and the support block 270 is slidably connected in the slide groove 104 to further improve the stability of the protective cover body 250 when moving.

[0029] In some specific implementation schemes, the test loading and unloading mechanism 300 includes a linear lifting electric cylinder 310, which is installed at the inner end of the test chamber 101. A mounting plate 320 is installed at the output end of the linear lifting electric cylinder 310. A semiconductor test board 330 is installed at the upper end of the mounting plate 320. A guide block 321 is installed on one side of the mounting plate 320. A guide groove is provided on the inner wall of the test chamber 101 and the guide block 321 is slidably connected in the guide groove. The mounting plate 320 and the semiconductor test board 330 are driven to rise and fall by the linear lifting electric cylinder 310, so that it is convenient to place the semiconductor into the semiconductor test board 330 for measurement.

[0030] In some specific embodiments, a wheel body 110 is installed at the bottom of the test box 100, and the wheel body 110 is configured as a self-locking universal wheel.

[0031] In some specific implementation schemes, a control panel 120 is disposed on one side of the test box 100 .

[0032] Working principle: During use, when it is necessary to test the semiconductor, the motor 210 drives the screw rod 220, so that the two sets of adjustment blocks 230 drive the connecting block 240 and the protective cover body 250 to move in opposite directions, so that the two sets of protective cover bodies 250 are away from the top of the test chamber 101. At the same time, the connecting bar 241 and the sliding bar 271 are used to enhance the stability of the protective cover body 250 during movement. The linear lifting electric cylinder 310 drives the mounting plate 320 and the semiconductor test board 330 to rise and fall, so that it is convenient to place the semiconductor in the semiconductor test board 330 for testing, and the wheel body 110 is used to facilitate the movement of the device.

[0033] The above description is only the preferred implementation of the utility model, and is not intended to limit the utility model. For those skilled in the art, the utility model can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model shall be included in the protection scope of the utility model.

Claims

1. A semiconductor life tester that is easy to pick up and place, characterized in that: The invention comprises a test box, wherein the test box is provided with a test cavity, wherein the test cavity is provided with two groups, wherein an installation groove is provided at the upper end of the test box, a protective cover adjustment mechanism is installed inside the installation groove, a test loading and unloading mechanism is installed at the inner end of the test cavity, the test loading and unloading mechanism is used to test the semiconductor life and facilitate the semiconductor taking and placing, and the protective cover adjustment mechanism is used to protect the upper end of the test cavity.

2. A semiconductor life tester that is easy to pick up and place according to claim 1, characterized in that: The protective cover adjustment mechanism includes a screw rod, which is rotatably installed on the inner side of the installation groove, an adjustment block is threadedly installed on the screw rod, a connecting block is installed on one side of the adjustment block, and a protective cover body is fixedly installed on one side of the connecting block.

3. A semiconductor life tester that is easy to pick up and place according to claim 2, characterized in that: The adjustment blocks are provided in two groups, and the threads at the two ends of the screw rod are arranged in opposite directions, and the two groups of adjustment blocks are threadedly installed at the two ends of the screw rod.

4. The semiconductor life tester that is easy to pick up and place according to claim 2, characterized in that: A motor is installed on one side of the test box, and the lead screw is driven by the motor.

5. The semiconductor life tester that is easy to pick up and place according to claim 2, characterized in that: A connecting strip is fixedly mounted on the bottom end of the connecting block, a connecting groove is arranged on the upper end of the test box, and the connecting strip is slidably connected in the connecting groove.

6. The semiconductor life tester that is easy to pick up and place according to claim 2, characterized in that: A support block is fixedly installed on one side of the protective cover body, a slide bar is fixedly installed on the bottom end of the support block, a slide groove is installed on the upper end of the test box, and the support block is slidably connected in the slide groove.

7. The semiconductor life tester that is easy to pick up and place according to claim 1, characterized in that: The test loading and unloading mechanism includes a linear lifting electric cylinder, which is installed at the inner end of the test cavity. A mounting plate is installed at the output end of the linear lifting electric cylinder. A semiconductor test board is installed at the upper end of the mounting plate. A guide block is installed on one side of the mounting plate. A guide groove is provided on the inner wall of the test cavity and the guide block is slidably connected in the guide groove.

8. The semiconductor life tester that is easy to pick up and place according to claim 1, characterized in that: A wheel body is installed at the bottom end of the test box, and the wheel body is configured as a self-locking universal wheel.

9. The semiconductor life tester that is easy to pick up and place according to claim 1, characterized in that: A control panel is arranged on one side of the test box.

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