Probe device, processing equipment and battery production line
By designing a probe device with a movable support, the problem that the thin gate of the photovoltaic cell without a main gate cannot contact the probe is solved, and the uniform current distribution and good contact between the silver paste silicon wafer is achieved, and the battery quality is improved.
Patent Information
- Application Number
- CN202421218067.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-30
- Publication Date
- 2025-02-28
- Estimated Expiration
- 2034-05-30
AI Technical Summary
The thin gate of the photovoltaic cell without a main gate cannot contact the probe of the probe device, resulting in uneven current, poor contact between the silver paste and silicon wafer, affecting the battery quality.
A probe device is designed, including a first support and a second support, the probes are arranged in a specific direction and can be relatively movable to ensure effective contact between the fine gate and the probe.
Through this design, it is ensured that the fine gate can be affected by voltage, and the applied voltages in each area are consistent, which solves the poor contact problem caused by uneven current distribution and improves the quality of the photovoltaic cell.
Smart Images
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Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of battery production, in particular to a probe device, processing equipment and a battery production line. Background Art
[0002] In order to reduce the contact resistance between the metal and the semiconductor of a photovoltaic cell, it is usually necessary to use laser-enhanced contact optimization technology (LECO, Laser-enhanced Contact Optimization) to process the photovoltaic cell.
[0003] In the process of processing photovoltaic cells, the charge carriers in the photovoltaic cells are excited by laser irradiation, and a certain deflection voltage is applied by a probe device to cause local current to induce sintering, so that the silver paste and silicon diffuse with each other, thereby reducing the contact resistance.
[0004] For Zero Busbar (0bb) photovoltaic cells, due to the lack of a main grid, the probe of the probe device can only contact the fine grid of the photovoltaic cell. However, due to the error between the spacing between the probes of the probe device and the spacing between the fine grids of the photovoltaic cell, the fine grid may not contact the probe. The fine grid that is not in contact with the probe needs to transmit voltage along the border of the fine grid pressed by the probe, which makes the voltage transmission distance longer and the generated current uneven, resulting in poor contact between the silver paste and the silicon wafer in some areas, affecting the quality of the photovoltaic cell. Utility Model Content
[0005] In view of this, the utility model provides a probe device, processing equipment and a battery production line to solve or improve the problem that the fine grid cannot contact with the probe.
[0006] In a first aspect, the utility model provides a probe device, comprising:
[0007] A first support and a first probe, wherein at least two first probes are disposed on the first support, and the first probes on the first support are arranged along a first direction;
[0008] A second support and a second probe, wherein the second support and the first support are arranged along a second direction, and the second support and the first support can move relatively along the first direction, at least two second probes are provided on the second support, and the second probes on the second support are arranged along the first direction, and the heads of the second probes and the heads of the first probes are oriented in the same direction and are both used to abut against the fine grid.
[0009] Beneficial effect: By making the first support and the second support slide relative to each other in the first direction, the axis of the first probe on the first support and the axis of the second probe on the second support can be staggered with each other in a direction perpendicular to the first direction, so that the fine grid between two adjacent first probes can abut against the second probe, and the fine grid between two adjacent second probes can abut against the first probe, so that the fine grids can all be affected by voltage, thereby making the applied voltage of each area of the silicon wafer consistent, eliminating or improving the problem of poor contact between the silver paste and the silicon wafer due to uneven current distribution.
[0010] In an optional implementation, a distance between the heads of any two adjacent first probes is less than or equal to a size of the head of the second probe in the first direction.
[0011] Beneficial effect: By making the size of the head of the second probe in the first direction greater than or equal to the spacing between the heads of two adjacent first probes, under the condition that the distance between the axis of the second probe and the axis of the two adjacent first probes is equal, in the projection in the second direction, the head of the second probe can completely fill the space between the heads of the two adjacent first probes, so that the fine grid between the two adjacent first probes can abut against the head of the second probe, reducing the probability that the fine grid between the two adjacent first probes cannot abut against the second probe.
[0012] In an optional embodiment, the first support and the second support are slidably connected along the first direction.
[0013] Beneficial effects: The first support and the second support are directly connected, without increasing the number of parts, so that the structure of the probe device is simple and compact.
[0014] In an optional embodiment, a mounting seat is further included, and the first support and the second support are both slidably connected to the mounting seat along the first direction.
[0015] Beneficial effect: The position of the first support can be adjusted in the first direction, and the position of the second support can be adjusted in the first direction. With this arrangement, the position of the first support can be adjusted to abut against most of the fine grids, and the position of the second support can be adjusted to abut against the fine grids that are not abutted against the first support, so that all the fine grids can receive voltage.
[0016] In an optional embodiment, the number of the first supports is set to at least two, at least two first supports are arranged along the second direction, and each of the first supports is provided with a corresponding first probe.
[0017] Beneficial effect: By increasing the number of first supports, the coverage density of the probes of the probe device in the first direction can be improved, and the number of fine grids that are not in contact with the probes can be further reduced.
[0018] In an optional embodiment, the number of the second supports is set to at least two, at least two second supports are arranged along the second direction, and each of the second supports is provided with a corresponding second probe.
[0019] Beneficial effect: By increasing the number of second supports, the coverage density of the probes of the probe device in the first direction can be improved, and the number of fine grids that are not in contact with the probes can be further reduced.
[0020] In an optional embodiment, a driving device is further included, wherein the driving device is used to drive the first support and the second support to move relative to each other.
[0021] Beneficial effect: The first support and the second support can be driven to move relative to each other through the driving device, which is more convenient to use.
[0022] In an optional embodiment, at least one of the first probe and the second probe includes a rod body and an end head, the rod body is connected to the first support or the second support, the end head is connected to the rod body and is used to abut against the fine grid, and in a direction perpendicular to the axial direction of the rod body, a cross-sectional area of the end head is larger than a cross-sectional area of the rod body.
[0023] Beneficial effect: the head can cover a larger area and is more convenient to abut against the fine grid.
[0024] In a second aspect, the utility model further provides a processing equipment, comprising the probe device as described above.
[0025] Beneficial effects: Since the processing equipment provided by the utility model includes a probe device, it also includes all the above advantages of the probe device, so it will not be described in detail.
[0026] In a third aspect, the utility model further provides a battery production line, comprising the probe device as described above, or the battery production line comprises the processing equipment as described above.
[0027] Beneficial effects: Since the battery production line provided by the utility model includes a probe device, it also includes all the above advantages of the probe device, so it will not be described in detail. BRIEF DESCRIPTION OF THE DRAWINGS
[0028] In order to more clearly illustrate the specific implementation methods of the utility model or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0029] Figure 1 A front view of a probe device according to an embodiment of the utility model;
[0030] Figure 2 for Figure 1 A top view of the probe assembly is shown.
[0031] Description of reference numerals:
[0032] 1. First support; 2. Second support; 3. First probe; 4. Second probe. DETAILED DESCRIPTION
[0033] In order to make the purpose, technical solution and advantages of the embodiment of the utility model clearer, the technical solution in the embodiment of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiment of the utility model. Obviously, the described embodiment is a part of the embodiment of the utility model, not all the embodiments. Based on the embodiment of the utility model, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the utility model.
[0034] In the related art, for a photovoltaic cell without a main grid, due to the lack of a main grid, the probe of the probe device can only contact the fine grid of the photovoltaic cell. However, due to the error between the spacing between the probes of the probe device and the spacing between the fine grids of the photovoltaic cell, the fine grid may not contact the probe. The fine grid that is not in contact with the probe needs to rely on the fine grid pressed by the probe to transmit voltage along the frame line, which makes the voltage transmission distance longer and the generated current uneven, resulting in poor contact between the silver paste and the silicon wafer in some areas, affecting the quality of the photovoltaic cell. In order to solve or improve the problem that the fine grid cannot contact the probe, a probe device, processing equipment and battery production line are provided in the embodiment of the utility model.
[0035] Combine the following Figure 1 to Figure 2 , describing the probe device provided in an embodiment of the present utility model.
[0036] Specifically, the probe device includes a first support 1 , a second support 2 , a first probe 3 and a second probe 4 .
[0037] At least two first probes 3 are arranged on the first support 1, and the first probes 3 on the first support 1 are arranged along a first direction. Specifically, in the actual production process, the first direction is the arrangement direction of the fine grids in the battery.
[0038] The second support 2 is arranged with the first support 1 along the second direction, and the first support 1 and the second support 2 can move relative to each other along the first direction. Optionally, the second direction is perpendicular to the first direction. For example, the first direction is Figure 1 The direction indicated by the arrow pointing to the right, the second direction is Figure 1 At least two second probes 4 are arranged on the second support 2, and the second probes 4 on the second support 2 are arranged along the first direction. The heads of the second probes 4 and the heads of the first probes 3 face the same direction and are both used to abut against the fine grid.
[0039] In this embodiment, by making the first support 1 and the second support 2 slide relative to each other in the first direction, the axis of the first probe 3 on the first support 1 and the axis of the second probe 4 on the second support 2 can be staggered with each other in the second direction. Therefore, the fine grid between two adjacent first probes 3 can abut against the second probe 4, and the fine grid between two adjacent second probes 4 can abut against the first probe 3, so that the fine grids of the battery can be affected by voltage, thereby making the applied voltage of each area of the silicon wafer consistent, eliminating or improving the problem of poor contact between the silver paste and the silicon wafer due to uneven current distribution.
[0040] In some embodiments provided by the present invention, the distance between the heads of any two adjacent first probes 3 is less than or equal to the size of the head of the second probe 4 in the first direction. Similarly, the distance between any two adjacent second probes 4 is less than or equal to the size of the head of the first probe 3 in the first direction. Figure 1 As shown in the figure, a is the distance between the heads of any two adjacent first probes 3, b is the size of the head of the second probe 4 in the first direction, and a is less than or equal to b.
[0041] In this embodiment, reference Figure 1 and Figure 2 As shown, by making the size of the head of the second probe 4 in the first direction greater than or equal to the spacing between the heads of two adjacent first probes 3, under the condition that the distance between the axis of the second probe 4 and the axis of the two adjacent first probes 3 is equal, in the projection in the second direction, the head of the second probe 4 can completely fill the space between the heads of the two adjacent first probes 3, so that the fine grid between the two adjacent first probes 3 can abut against the head of the second probe 4, reducing the probability that the fine grid between the two adjacent first probes 3 cannot abut against the second probe 4.
[0042] In some embodiments provided by the utility model, the first support 1 and the second support 2 are slidably connected along the first direction, that is, the first support 1 and the second support 2 are slidably matched. For example, one of the first support 1 and the second support 2 is provided with a guide structure extending along the first direction, and the other is slidably connected to the guide structure.
[0043] In this embodiment, the first support 1 and the second support 2 are directly connected, without increasing the number of parts, so that the structure of the probe device is simple and compact.
[0044] Of course, the first support 1 and the second support 2 are not limited to the above-mentioned direct connection form. For example, in other embodiments provided by the utility model, the probe device also includes a mounting seat. The first support 1 is slidably connected to the mounting seat along the first direction, and the second support 2 is also slidably connected to the mounting seat along the first direction.
[0045] In this embodiment, the position of the first support 1 can be adjusted in the first direction, and the position of the second support 2 can be adjusted in the first direction. With this arrangement, the position of the first support 1 can be adjusted to abut against most of the fine grids, and the position of the second support 2 can be adjusted to abut against the fine grids that are not abutted against the first support 1, so that all the fine grids can receive voltage.
[0046] In some embodiments provided by the present invention, the number of the first supports 1 is set to at least two, at least two first supports 1 are arranged along the second direction, and each first support 1 is provided with a corresponding first probe 3. For example, at least two first supports 1 can be slidably connected in sequence, or at least two first supports 1 are slidably connected to the second support 2, or the second support 2 and at least two first supports 1 are slidably connected to the mounting base.
[0047] In this embodiment, by increasing the number of first supports 1 , the coverage density of the probes of the probe device in the first direction can be increased, and the number of fine grids that are not in contact with the probes can be further reduced.
[0048] In some embodiments provided by the present invention, the number of the second supports 2 is set to at least two, at least two second supports 2 are arranged along the second direction, and each second support 2 is provided with a corresponding second probe 4. For example, at least two second supports 2 can be slidably connected in sequence, or at least two second supports 2 are slidably connected to the first support 1, or the first support 1 and at least two second supports 2 are slidably connected to the mounting base.
[0049] In this embodiment, by increasing the number of the second supports 2 , the coverage density of the probes of the probe device in the first direction can be increased, and the number of fine grids that are not in contact with the probes can be further reduced.
[0050] In some embodiments provided by the utility model, the probe device may be provided with a locking assembly. The locking assembly is used to lock or unlock the first support 1 and the second support 2. During use, the first support 1 and the second support 2 may be locked by the locking assembly to reduce the problem of relative movement between the first support 1 and the second support 2. For example, the locking assembly may include a screw, which is threadedly connected to the first support 1 and abuts against the second support 2 or is threadedly connected to the second support 2.
[0051] In some embodiments provided by the present invention, the probe device further comprises a driving device, which is used to drive the first support 1 and the second support 2 to move relative to each other.
[0052] In this embodiment, the first support 1 and the second support 2 can be driven to move relative to each other by a driving device, which is more convenient to use.
[0053] Optionally, the driving device includes a screw. For the example in which the first support 1 and the second support 2 are directly connected, one of the first support 1 and the second support 2 is rotationally connected to the screw, and the other is threadedly connected to the screw. The first support 1 and the second support 2 can be driven to move relative to each other by screwing the screw. For the example in which the first support 1 and the second support 2 are both connected to the mounting base, the first support 1 and the second support 2 are both provided with corresponding screws, which are rotationally connected to the mounting base and threadedly connected to the first support 1 or the second support 2. Furthermore, the driving device also includes a motor, and the output shaft of the motor is connected to the screw. By driving the screw to rotate by the motor, the automation level of the probe device can be improved.
[0054] Of course, the driving device is not limited to the above-mentioned screw form. For example, in other embodiments provided by the present utility model, the driving device may also include a gear, a rack and a motor. For the example in which the first support 1 and the second support 2 are directly connected, one of the first support 1 and the second support 2 is provided with the rack, and the other is installed with the motor, and the gear is installed on the output shaft of the motor and meshes with the rack. For the example in which the first support 1 and the second support 2 are both connected to the mounting base, the first support 1 and the second support 2 are both provided with corresponding motors and gears, and the rack is arranged on the mounting base.
[0055] Of course, the driving device can also be a pneumatic cylinder or an oil cylinder.
[0056] In some embodiments provided by the present invention, at least one of the first probe 3 and the second probe 4 includes a rod body and an end.
[0057] The rod body is connected to the first support 1 or the second support 2, for example, the rod body is threadedly connected, clamped or welded to the first support 1 or the second support 2. The end head is connected to the rod body and is used to abut against the fine grid. In the direction perpendicular to the axial direction of the rod body, the cross-sectional area of the end head is larger than the cross-sectional area of the rod body. That is, when the rod body and the end head are both cylindrical structures, the diameter of the end head is larger than the diameter of the rod body. This arrangement allows the head to cover a larger range and is more convenient for abutting against the fine grid.
[0058] A processing device is also provided in an embodiment of the utility model.
[0059] Specifically, the processing equipment includes the probe device as described above.
[0060] It should be noted that the processing equipment includes a probe device, and also includes all the advantages of the probe device mentioned above, so it will not be repeated. It should be noted that those skilled in the art can know that the processing equipment also includes a laser emitting device and a voltage module connected to the probe device. This application does not involve improvements to the remaining parts, so it will not be repeated.
[0061] A battery production line is also provided in an embodiment of the utility model.
[0062] Specifically, the battery production line includes the probe device as described above. Alternatively, the battery production line includes the processing equipment as described above.
[0063] It should be noted that the battery production line includes a probe device, and also includes all the above advantages of the probe device, so it will not be repeated. For example, the battery production line is a photovoltaic battery production line. Although the embodiments of the utility model are described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the utility model, and such modifications and variations fall within the scope defined by the attached claims.
Claims
1. A probe device, characterized in that: include: A first support (1) and a first probe (3), wherein at least two first probes (3) are arranged on the first support (1), and the first probes (3) on the first support (1) are arranged along a first direction; A second support (2) and a second probe (4), wherein the second support (2) and the first support (1) are arranged along a second direction, and the second support (2) and the first support (1) are relatively movable along the first direction, at least two second probes (4) are arranged on the second support (2), and the second probes (4) on the second support (2) are arranged along the first direction, the heads of the second probes (4) and the heads of the first probes (3) are oriented in the same direction and are both used to abut against a fine grid.
2. The probe device according to claim 1, characterized in that The distance between the heads of any two adjacent first probes (3) is less than or equal to the size of the head of the second probe (4) in the first direction.
3. The probe device according to claim 1, characterized in that: The first support (1) and the second support (2) are slidably connected along the first direction.
4. The probe device according to claim 1, characterized in that It also comprises a mounting seat, wherein the first support (1) and the second support (2) are both slidably connected to the mounting seat along the first direction.
5. The probe device according to claim 1, characterized in that: The number of the first supports (1) is set to be at least two, at least two of the first supports (1) are arranged along the second direction, and each of the first supports (1) is provided with a corresponding first probe (3).
6. The probe device according to claim 1, characterized in that: The number of the second supports (2) is set to be at least two, at least two second supports (2) are arranged along the second direction, and each second support (2) is provided with a corresponding second probe (4).
7. The probe device according to claim 1, characterized in that: It also comprises a driving device, wherein the driving device is used to drive the first support (1) and the second support (2) to move relative to each other.
8. The probe device according to claim 1, characterized in that: At least one of the first probe (3) and the second probe (4) comprises a rod body and an end head, wherein the rod body is connected to the first support (1) or the second support (2), and the end head is connected to the rod body and is used to abut against the fine grid, and in a direction perpendicular to the axial direction of the rod body, the cross-sectional area of the end head is larger than the cross-sectional area of the rod body.
9. A processing equipment, characterized in that: The invention comprises a probe device as claimed in any one of claims 1 to 8.
10. A battery production line, characterized in that: The battery production line comprises the probe device as described in any one of claims 1 to 8, or the battery production line comprises the processing equipment as described in claim 9.