Batch testing device and electronic equipment
By designing a batch test device for PCBA with magnetic encoder board, long-term batch testing is achieved using contactless connections and magnetic field change detection, the problem of low pass rate in the prior art is solved, and the testing accuracy and factory pass rate are improved.
Patent Information
- Application Number
- CN202323456191.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-15
- Publication Date
- 2025-03-14
- Estimated Expiration
- 2033-12-15
AI Technical Summary
In the prior art, the short-term test of the magnetic encoder-connected PCBA leads to a low pass rate, which cannot guarantee the normal operation of long-term operation, and the long-term testing efficiency is low.
A batch testing device is provided, including a test module, a probe, a control module, an indicator module and a start-up module. Through contactless connection and magnetic field change detection, a long-term batch testing of the magnetic encoder connecting PCBA is realized.
Without affecting the testing efficiency, the accuracy of long-term testing of the magnetic encoder-connected PCBA is improved, the factory pass rate is improved, and the maintenance cost is reduced.
Smart Images
Figure CN222618731U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of power electronics technology, and in particular to batch testing devices and electronic equipment. Background Art
[0002] After the conventional magnetic encoder PCBA (Printed Circuit Board Assembly) is produced, each encoder is tested individually using a test fixture to test the test points, and the power supply amplitude, communication line, and feedback position are tested in a short period of time.
[0003] A short-term test may result in poor welding but the encoder may work normally. There is no guarantee that the encoder will still work normally after a long period of operation. Long-term testing will reduce the test efficiency. However, if the encoders that work abnormally for a long time are not screened out, the pass rate of the encoders leaving the factory cannot be guaranteed, resulting in failures when used on-site by customers and increasing the maintenance cost of the encoder. Utility Model Content
[0004] The main purpose of this application is to provide a batch testing device and electronic equipment, aiming to solve the problem of how to achieve long-term testing of the magnetic encoder board PCBA without affecting the test efficiency.
[0005] To achieve the above objectives, the present application provides a batch testing device, the batch testing device comprising:
[0006] A test module, one end of which is contactlessly connected to a plurality of components under test, and the test module is used to test the components under test;
[0007] A probe, one end of which is connected to the element under test, and the probe is used to transmit a signal;
[0008] A control module, wherein a first end of the control module is connected to the other end of the test module, a second end of the control module is connected to the other end of the probe, the control module is used to output a control signal to start the test module, and the control module is also used to obtain a test result through the probe and output an indication signal according to the test result;
[0009] an indication module, the indication module being connected to the third end of the control module and being used for displaying the test result according to the indication signal;
[0010] A starting module, the starting module is connected to the power supply end of the control module, and the starting module is used to start the control module.
[0011] Optionally, when the control module is started, the control module outputs an electrical signal, the measured element receives the electrical signal through the probe, and outputs an initial feedback position signal according to the electrical signal, and the control module outputs the control signal when receiving the initial feedback position signal.
[0012] Optionally, the test module comprises a plurality of motors and a plurality of code discs, and the number of the motors and the number of the code discs are equal;
[0013] The control end of the motor is connected to the control module, the rotating shaft of the motor is connected to the code disk, and the motor is used to rotate according to the control signal;
[0014] The code disk is connected to the measured element in a contactless manner, the code disk rotates following the motor, and the code disk is used to generate a magnetic field.
[0015] Optionally, when the code disk rotates, the magnetic field changes, the measured element outputs a changing feedback position signal according to the changing magnetic field, and the control module outputs the indication signal according to the changing feedback position signal.
[0016] Optionally, when the variation range of the changed feedback position signal is within a preset range, the indication module receives the indication signal and displays the test result as normal;
[0017] In the case that the variation range of the changed feedback position signal is outside the preset range, the indication module receives the indication signal and displays the test result as abnormal.
[0018] Optionally, the indication module includes indicator lights, and the number of the indicator lights corresponds to the number of the motors;
[0019] When the test result is normal, the indicator light is always on;
[0020] When the test result is abnormal, the indicator light flashes.
[0021] Optionally, the start module includes a start button and a stop button, the start button and the stop button are respectively connected to the power supply end of the control module, the start button is used to start the control module, and the stop button is used to stop the control module.
[0022] Optionally, the batch testing device further includes component slots, the number of which corresponds to the number of the motors, and the component slots are used to place the components to be tested.
[0023] Optionally, when the batch testing device is disposed in an incubator, the batch testing device is powered on and subjected to high and low temperature cycle aging in the incubator.
[0024] In addition, to achieve the above-mentioned purpose, the present application also provides an electronic device, which includes the batch testing device as described above.
[0025] The present application proposes a batch testing device and an electronic device, the batch testing device comprising: a testing module, one end of the testing module is non-contactly connected to a plurality of tested elements, the testing module is used to test the tested elements; a probe, one end of the probe is connected to the tested element, the probe is used to transmit a signal; a control module, a first end of the control module is connected to the other end of the testing module, a second end of the control module is connected to the other end of the probe, the control module is used to output a control signal to start the testing module, the control module is also used to obtain a test result through the probe, and output an indication signal according to the test result; an indication module, the indication module is connected to the third end of the control module, the indication module is used to display the test result according to the indication signal; a starting module, the starting module is connected to the power supply end of the control module, and the starting module is used to start the control module. The present application overcomes the problem of low qualified rate caused by short-term testing of conventional magnetic encoder board PCBA in the prior art, and by batch testing the magnetic encoder board PCBA, a long-term test of the magnetic encoder board PCBA is achieved without affecting the test efficiency, thereby improving the qualified rate of the encoder shipped from the factory. BRIEF DESCRIPTION OF THE DRAWINGS
[0026] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying any creative work.
[0027] Figure 1 A schematic diagram of the structure of a batch testing device provided in an embodiment of the present application;
[0028] Figure 2 A schematic diagram of the structure of a test module in a batch test device provided in an embodiment of the present application;
[0029] Figure 3 A schematic diagram of the structure of an indicator module in a batch testing device provided in an embodiment of the present application;
[0030] Figure 4 A schematic diagram of the structure of a start-up module in a batch testing device provided in an embodiment of the present application;
[0031] Figure 5A schematic diagram of the structure of an electronic device provided in an embodiment of the present application.
[0032] Description of Figure Numbers:
[0033] Label name Label name 10 Test Module 20 Probe 30 Control Module 40 Indicator module 50 Startup Module 11 Motor 12 Code disc 51 Start button 52 Stop button 01 Electronic devices 02 Batch test equipment
[0034] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION
[0035] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
[0036] It should be noted that all directional indications in the embodiments of the present application (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.
[0037] In addition, the descriptions of "first", "second", etc. in this application are only for descriptive purposes and cannot be understood as indicating or suggesting their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined. In addition, the meaning of "and / or" appearing in the full text is to include three parallel schemes. Taking "A and / or B" as an example, it includes scheme A, or scheme B, or a scheme that satisfies both A and B.
[0038] In this application, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0039] It should also be understood that the references to "one embodiment" or "some embodiments" described in the specification of the embodiments of the present application mean that one or more embodiments of the embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Thus, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.
[0040] After the conventional magnetic encoder PCBA is produced, each encoder is tested individually using a test fixture to test the test points. The power supply amplitude, communication line, and feedback position are tested in a short period of time.
[0041] A short-term test may result in poor welding but the encoder may work normally. There is no guarantee that the encoder will still work normally after a long period of operation. Long-term testing will reduce the test efficiency. However, if the encoders that work abnormally for a long time are not screened out, the pass rate of the encoders leaving the factory cannot be guaranteed, resulting in failures when used on-site by customers and increasing the maintenance cost of the encoder.
[0042] Based on this, the present application proposes a batch testing device and an electronic device, the batch testing device comprising: a testing module, one end of the testing module is non-contactly connected to a plurality of tested elements, the testing module is used to test the tested elements; a probe, one end of the probe is connected to the tested element, the probe is used to transmit a signal; a control module, a first end of the control module is connected to the other end of the testing module, a second end of the control module is connected to the other end of the probe, the control module is used to output a control signal to start the testing module, the control module is also used to obtain a test result through the probe, and output an indication signal according to the test result; an indication module, the indication module is connected to the third end of the control module, the indication module is used to display the test result according to the indication signal; a starting module, the starting module is connected to the power supply end of the control module, and the starting module is used to start the control module. The present application overcomes the problem of low qualified rate caused by short-term testing of conventional magnetic encoder board PCBA in the prior art, and by batch testing the magnetic encoder board PCBA, a long-term test of the magnetic encoder board PCBA is achieved without affecting the test efficiency, thereby improving the qualified rate of the encoder shipped from the factory.
[0043] The present application embodiment provides a batch testing device, referring to Figure 1 , Figure 1A schematic diagram of the structure of a batch testing device provided in one embodiment of the present application, the batch testing device comprising:
[0044] A test module 10, one end of which is contactlessly connected to a plurality of components under test, and the test module 10 is used to test the components under test;
[0045] A probe 20, one end of which is connected to the element under test, and the probe 20 is used to transmit a signal;
[0046] A control module 30, wherein a first end of the control module 30 is connected to the other end of the test module 10, and a second end of the control module 30 is connected to the other end of the probe 20. The control module 30 is used to output a control signal to start the test module 10, and the control module 30 is also used to obtain a test result through the probe 20, and output an indication signal according to the test result;
[0047] an indication module 40, the indication module 40 being connected to the third end of the control module 30, and the indication module 40 being used to display the test result according to the indication signal;
[0048] A starting module 50 is connected to a power supply end of the control module 30 , and is used to start the control module 30 .
[0049] In this embodiment, the component under test is a magnetic encoder board PCBA, and the batch testing device can test the performance of multiple magnetic encoder board PCBAs at the same time. During the test process, the test results of each magnetic encoder board PCBA are intuitively displayed, which is convenient for the tester to record the test results. The tester can eliminate unqualified magnetic encoders after the test.
[0050] The batch test device in this embodiment includes a test module 10, a probe 20, a control module 30, an indication module 40 and a start module 50. Among them, the test module 10 is used to test the magnetic encoder board PCBA, and the connection mode between the test module 10 and the magnetic encoder board PCBA is a contactless connection, which refers to a connection established by wireless signals or magnetic fields, rather than a connection established by entities such as signal lines or wires; the probe 20 is used to transmit signals between the control module 30 and the magnetic encoder board PCBA, such as transmitting the test results from the magnetic encoder board PCBA to the control module 30; the control module 30 is used to control the operation of other modules, such as controlling the start of the test module 10 and the indication module 40, transmitting data to the magnetic encoder board PCBA, etc.; the indication module 40 is used to display the test results of each magnetic encoder board PCBA; the start module 50 is used to power the batch test device and start the control module 30, which is equivalent to a power switch.
[0051] From the perspective of the various components of the batch testing device, the start module 50 starts the control module 30, the control module 30 controls the test module 10 to test the tested component, the test result is transmitted to the control module 30 through the probe 20, and the control module 30 controls the indication module 40 to intuitively display the test result. The batch testing device in this embodiment performs batch and long-term tests on the magnetic encoder board PCBA, which is compared with the single and short-term tests on the magnetic encoder board PCBA in the related scheme. The efficiency of this scheme and the related scheme is basically the same, and the accuracy of the test is improved by performing long-term tests on the magnetic encoder board PCBA in this scheme, so that the factory qualified rate of the magnetic encoder board PCBA is increased.
[0052] In some feasible embodiments, when the control module 30 is started, the control module 30 outputs an electrical signal, the measured element receives the electrical signal through the probe 20, and outputs an initial feedback position signal according to the electrical signal, and the control module outputs the control signal when receiving the initial feedback position signal.
[0053] In this embodiment, after the control module 30 is powered, it will first output an electrical signal to the component under test, that is, the magnetic encoder board PCBA. The electrical signal is given to the component under test through the probe 20. The function of the electrical signal can be understood as powering the magnetic encoder. After the magnetic encoder is powered, it can establish communication with the control module 30 through the probe 20. In this embodiment, the initial feedback position signal output by the magnetic encoder is mainly obtained. After obtaining the initial feedback position signal output by the magnetic encoder board PCBA, the control module 30 outputs a control signal to the test module 10 to control the test module 10 to start testing.
[0054] Reference Figure 2 In some feasible embodiments, the test module 10 includes a plurality of motors 11 and a plurality of code discs 12, and the number of the motors 11 and the number of the code discs 12 are equal;
[0055] The control end of the motor 11 is connected to the control module 30, the rotating shaft of the motor 11 is connected to the code disk 12, and the motor 11 is used to rotate according to the control signal;
[0056] The code disk 12 is contactlessly connected to the measured element, the code disk 12 rotates along with the motor 11, and the code disk 12 is used to generate a magnetic field.
[0057] In this embodiment, a code disc 12 is fixedly connected to the rotating shaft of each motor 11. The code disc 12 can generate a magnetic field, which acts on the magnetic encoder board PCBA, that is, the code disc 12 and the measured element are connected through the magnetic field. When the motor 11 receives the control signal, the motor 11 starts to rotate, driving the code disc 12 to rotate together.
[0058] In some feasible embodiments, when the code disk 12 rotates, the magnetic field changes, the measured element outputs a changing feedback position signal according to the changing magnetic field, and the control module 30 outputs the indication signal according to the changing feedback position signal.
[0059] In this embodiment, the principle of the magnetic encoder test is to use the change of the magnetic field and the Hall effect to detect the position or displacement of the magnetic mark, and convert it into a corresponding electrical signal for measurement and analysis. When the code disk 12 rotates, the magnetic field generated by the code disk 12 will also change. The magnetic encoder detects the rotation of the code disk 12 according to the changing magnetic field and outputs a corresponding electrical signal. The electrical signal is transmitted to the control module 30 through the probe 20. The control module 30 outputs an indication signal according to the received electrical signal, and the control indication module 40 displays the test result.
[0060] In some feasible embodiments, when the variation range of the changed feedback position signal is within a preset range, the indication module 40 receives the indication signal and displays the test result as normal;
[0061] In the case that the variation range of the changed feedback position signal is outside the preset range, the indication module 40 receives the indication signal and displays the test result as abnormal.
[0062] In this embodiment, the variation range of the changed feedback position signal is within the preset range, indicating that the test error of the magnetic encoder is within the allowable error range and meets the factory requirements, and the indicator module 40 displays that the magnetic encoder board PCBA is normal. The variation range of the changed feedback position signal is outside the preset range, indicating that the test error of the magnetic encoder is too large, exceeds the allowable error range, and does not meet the factory requirements, and the indicator module 40 displays that the magnetic encoder board PCBA is abnormal. The indicator module 40 can simultaneously display the test results of all magnetic encoder board PCBAs.
[0063] Combination Figure 2 and Figure 3 In some feasible embodiments, the indication module 40 includes a plurality of indicator lights, and the number of the indicator lights corresponds to the number of the motors 11;
[0064] When the test result is normal, the indicator light is always on;
[0065] When the test result is abnormal, the indicator light flashes.
[0066] In this embodiment, the indicator light of the indicator module 40 is used to indicate the test result of the magnetic encoder board PCBA. In terms of structure, an indicator light can be set next to each motor to facilitate the tester to observe which magnetic encoder board PCBA the test result displayed by the indicator light corresponds to. In this embodiment, the indicator light is always on and flashing to indicate the test result, but other methods may also be included, such as the color of the light, and the indicator light may even be replaced with other devices, as long as the test result can be indicated in different states.
[0067] Reference Figure 4 In some feasible embodiments, the start module 50 includes a start button 51 and a stop button 52, and the start button 51 and the stop button 52 are respectively connected to the power supply end of the control module 30, the start button 51 is used to start the control module 30, and the stop button 52 is used to stop the control module 30.
[0068] In this embodiment, the start button 51 and the stop button 52 act as switches for starting and stopping the control module 30. The start button 51 and the stop button 52 can be replaced by a wrench switch, a sliding switch, a knife switch, etc.
[0069] In some feasible embodiments, the batch testing device further includes component slots, the number of which corresponds to the number of the motors 11 , and the component slots are used to place the components to be tested.
[0070] In this embodiment, since there is no actual physical connection between the test module 10 and the magnetic encoder board PCBA, in order to fix the relative position between the test module and the magnetic encoder board PCBA, the batch testing device provided in this embodiment is also provided with a component slot. When the magnetic encoder board PCBA is placed in the component slot, the magnetic field emitted by the code disk can pass through the magnetic encoder board PCBA to the greatest extent.
[0071] In some feasible embodiments, when the batch testing device is disposed in an incubator, the batch testing device is powered on and subjected to high and low temperature cycle aging in the incubator.
[0072] In this embodiment, the batch testing device is easy to move, and the entire device can be conveniently placed in an incubator for high and low temperature cycle aging. The encoder board PCBA is subjected to high and low temperature cycle aging when powered on, which can better reduce the environmental stress of the encoder board PCBA and improve the consistency of the encoder board PCBA after leaving the factory.
[0073] This embodiment provides a batch testing device, which controls the start and stop of the batch testing device through a start button and a stop button; the control module obtains the initial feedback position signal of the measured component through a probe, and then controls the test module to test the measured component; the test module changes the feedback position signal of the measured component through a magnetic field; the control module analyzes the feedback position signal, obtains the test result and displays the test result through an indication module. This application improves the accuracy of the test by performing batch and long-term tests on the magnetic encoder board PCBA without affecting the test efficiency, and achieves the beneficial effect of increasing the factory qualified rate of the magnetic encoder board PCBA. Furthermore, this batch testing device is convenient to be placed in an incubator for high and low temperature aging with power, so that the consistency of the magnetic encoder board PCBA shipped from the factory is better.
[0074] In addition, the present application embodiment also provides an electronic device 01, referring to Figure 5 The electronic device 01 includes the batch testing device 02 provided in the above embodiment.
[0075] Since the electronic device proposed in this embodiment includes the batch testing device proposed in the above embodiments, it has the beneficial effects of the above embodiments. The specific working process and principle of the batch testing device are detailed in the batch testing devices provided in the above embodiments, which will not be described one by one here, and are all within the protection scope of this embodiment.
[0076] It should be noted that the technical solutions of the various embodiments of the present application can be combined with each other, but it must be based on the fact that they can be implemented by technical personnel in this field. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.
[0077] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.
Claims
1. A batch testing device, characterized in that: The batch testing device comprises: A test module, one end of which is contactlessly connected to a plurality of components under test, and the test module is used to test the components under test; A probe, one end of which is connected to the element under test, and the probe is used to transmit a signal; A control module, wherein a first end of the control module is connected to the other end of the test module, a second end of the control module is connected to the other end of the probe, the control module is used to output a control signal to start the test module, and the control module is also used to obtain a test result through the probe and output an indication signal according to the test result; an indication module, the indication module being connected to the third end of the control module and being used for displaying the test result according to the indication signal; A starting module, the starting module is connected to the power supply end of the control module, and the starting module is used to start the control module.
2. The batch testing device according to claim 1, characterized in that: When the control module is started, the control module outputs an electrical signal, the measured element receives the electrical signal through the probe, and outputs an initial feedback position signal according to the electrical signal, and the control module outputs the control signal when receiving the initial feedback position signal.
3. The batch testing device according to claim 2, characterized in that: The test module comprises a plurality of motors and a plurality of code discs, and the number of the motors and the number of the code discs are equal; The control end of the motor is connected to the control module, the rotating shaft of the motor is connected to the code disk, and the motor is used to rotate according to the control signal; The code disk is connected to the measured element in a contactless manner, the code disk rotates following the motor, and the code disk is used to generate a magnetic field.
4. The batch testing device according to claim 3, characterized in that: When the code disk rotates, the magnetic field changes, the measured element outputs a changing feedback position signal according to the changing magnetic field, and the control module outputs the indication signal according to the changing feedback position signal.
5. The batch testing device according to claim 4, characterized in that: When the variation range of the changed feedback position signal is within the preset range, the indication module receives the indication signal and displays the test result as normal; In the case that the variation range of the changed feedback position signal is outside the preset range, the indication module receives the indication signal and displays the test result as abnormal.
6. The batch testing device according to claim 5, characterized in that: The indication module includes indicator lights, and the number of the indicator lights corresponds to the number of the motors; When the test result is normal, the indicator light is always on; When the test result is abnormal, the indicator light flashes.
7. The batch testing device according to claim 1, characterized in that: The start module includes a start button and a stop button, the start button and the stop button are respectively connected to the power supply end of the control module, the start button is used to start the control module, and the stop button is used to stop the control module.
8. The batch testing device according to claim 3, characterized in that: The batch testing device further comprises component slots, the number of which corresponds to the number of the motors, and the component slots are used to place the components to be tested.
9. The batch testing device according to claim 1, characterized in that: In the case where the batch testing device is arranged in a temperature box, the batch testing device is powered on in the temperature box to perform high and low temperature cycle aging.
10. An electronic device, characterized in that: The electronic device comprises a batch testing device as claimed in any one of claims 1 to 9.