Die current aging test system

Abstract

The utility model discloses a die current aging test system, which comprises a PLC (programmable logic controller), an operational amplifier circuit, a pulse width modulation circuit, a power drive output circuit and a load sampling circuit, the output end of the PLC is electrically connected with the operational amplifier circuit, the output end of the operational amplifier circuit is electrically connected with the pulse width modulation circuit, and the output end of the power drive output circuit is electrically connected with the load sampling circuit. The output end of the pulse width modulation circuit is electrically connected with the power drive output circuit, the output end of the power drive output circuit is electrically connected with the load sampling circuit, and the output end of the load sampling circuit is electrically connected with the operational amplifier circuit and the PLC. When the utility model is used, no matter how many to-be-tested tube cores are connected with the output end, as long as the voltage drop of all the to-be-tested tube cores does not exceed 80% of the maximum output voltage, the current does not exceed 80% of the maximum output current. In other words, no matter how the external voltage and the load change, the current is always stabilized in a given range, so that the purpose of optimizing the aging screening of the tube core is achieved.

Description

Technical Field

[0001] The utility model relates to the technical field of current aging test, in particular to a tube core current aging test system. Background Art

[0002] The tube core refers to the chip used to manufacture the integrated block in the integrated circuit, that is, the circuit composed of multiple electronic components is called an integrated circuit, and the chip of this integrated component is the tube core of the integrated circuit. The tube core is a semiconductor wafer, also known as a transistor chip. It is a kind of semiconductor device with functions such as amplification, switching, and regulation. Its performance is mainly reflected in the amplification factor, power and power. The internal electric field between the PN junctions is used to control the current, and it is mostly used to control the amplification or switching of the signal.

[0003] The current aging test is a test method that evaluates the life of electronic components based on their aging characteristics under long-term current load. It mainly applies a constant current load for a certain period of time and observes the performance changes and attenuation of the electronic components at a specific temperature to determine their reliability and service life. At present, the aging test method for the die is: under the conditions of ambient temperature and normal heat dissipation, the die is passed through the current to make the junction temperature reach the limit. After a period of power-on, the reverse leakage current is quickly turned off to measure, and the die with unstable performance or failure will be found. By screening the die in this way, the failed die can be exposed, and the qualified rate of the product is never guaranteed.

[0004] However, at present, we usually use a high-power current aging station to perform current aging operations on the tube core. A forward current is passed through the tube core to make it work under the temperature limit state. When it starts to work, as the temperature of the tube core rises, the tube voltage drop decreases. However, since the power supply cannot maintain a constant current, the current will increase, and the vicious cycle will repeat itself. At this time, if there is no manual continuous adjustment, it is very easy to burn out the tube core, resulting in changes in external voltage and current. Therefore, there is an urgent need for a system that can be used for tube core current aging testing to solve the above-mentioned technical problems. Utility Model Content

[0005] The content of this utility model is used to introduce the concepts in a brief form, which will be described in detail in the following specific implementation. The content of this utility model is not intended to identify the key features or essential features of the technical solution claimed for protection, nor is it intended to limit the scope of the technical solution claimed for protection.

[0006] In view of the problems and shortcomings in the prior art, the utility model provides a tube core current aging test system, which is realized by connecting a PLC programmable controller, an operational amplifier circuit, a pulse width modulation circuit, a power drive output circuit and a load sampling circuit. The utility model can provide a high-power constant current source for the tube core aging test, and can be stable within the pre-adjusted range regardless of how the load or external voltage changes. It not only saves labor costs, but also improves the reliability of use, and meets the requirements for tube core aging screening. It is used to solve the problems raised in the above background technology.

[0007] To achieve the above-mentioned purpose, the utility model provides the following technical solution: including a PLC programmable controller, an operational amplifier circuit, a pulse width modulation circuit, a power drive output circuit and a load sampling circuit, wherein the output end of the PLC programmable controller is electrically connected to the operational amplifier circuit to output a control voltage thereto, the output end of the operational amplifier circuit is electrically connected to the pulse width modulation circuit to control its duty cycle, the output end of the pulse width modulation circuit is electrically connected to the power drive output circuit so that the output is controlled by the duty cycle, the output end of the power drive output circuit is electrically connected to the load sampling circuit to output a feedback voltage, and the output end of the load sampling circuit is electrically connected to the operational amplifier circuit and the PLC programmable controller respectively so that it is controlled by the feedback voltage.

[0008] Preferably, the PLC programmable controller is also electrically connected to a display and control circuit, and the display and control circuit includes a display screen and a control button. During use, the signal output by the PLC programmable controller is transmitted to the display screen and the control button. That is, the operation performed by the PLC programmable controller is observed in real time through the display screen, and the execution control for the PLC programmable controller is realized through the control button to achieve control of various types of mechanical equipment or production processes.

[0009] Preferably, the operational amplifier circuit includes an operational amplifier, the output end of the PLC programmable controller is connected in series with resistors R1 and R2 and then connected to the positive input end of the operational amplifier, the inverting input end of the operational amplifier is connected in series with resistor R3 and then feedback connected to the output end of the operational amplifier, and the negative power supply end of the operational amplifier is connected to the power supply end.

[0010] Preferably, the pulse width modulation circuit includes a pulse width modulation chip, the output end of the operational amplifier is connected to pin 5 of the pulse width modulation chip, pins 8 and 4 of the pulse width modulation chip are both connected to the power supply end, pins 2 and 6 of the pulse width modulation chip are connected in series with resistors R5 and R4 and then connected to the power supply end, and pin 7 of the pulse width modulation chip is connected between the resistors R4 and R5.

[0011] Preferably, the power drive output circuit includes field effect transistors Q1 and Q2, the 3-pin series resistor R6 of the pulse width modulation chip is connected to the gate of the field effect transistor Q1, the collector of the field effect transistor Q1 is connected to the gate of the field effect transistor Q2, the collector of the field effect transistor Q1 is connected to the power supply end after being connected in series with a resistor R7, the emitter of the field effect transistor Q2 is connected in series with an inductor L1 and a capacitor C2 and then grounded, and the collector of the field effect transistor Q2 is also connected to the power supply end.

[0012] Preferably, the load sampling circuit includes a load resistor and a sampling resistor, one end of the inductor L1 is connected to one end of the inductor L2, the other end of the inductor L2 is connected in series with the load resistor and the sampling resistor and then grounded, and one end of the sampling resistor is feedback connected to the inverting input terminal of the operational amplifier.

[0013] Preferably, the operational amplifier is an LM353 operational amplifier.

[0014] Preferably, the pulse width modulation chip adopts a NE555 time base integrated chip.

[0015] Preferably, the field effect transistor Q1 is an N-channel high-power IGBT field effect transistor, and the field effect transistor Q2 is a P-channel high-power IGBT field effect transistor.

[0016] Compared with the prior art, the beneficial effects provided by the utility model are:

[0017] The utility model has a simple structure, is safer and more reliable when used, and can also effectively reduce labor costs. The utility model mainly includes a PLC programmable controller, an operational amplifier circuit, a pulse width modulation circuit, a power drive output circuit and a load sampling circuit. The PLC programmable controller outputs a given control voltage, and the operational amplifier circuit is controlled by the given voltage to output a pulse width modulation voltage. The pulse width modulation circuit is controlled by the pulse width modulation voltage output by the operational amplifier circuit to control its duty cycle, and then the duty cycle output is used to control the power drive output circuit. The power drive output circuit is connected to the feedback circuit and then fed back to the operational amplifier circuit, so that the operational amplifier circuit is controlled by the current sampling feedback voltage at the same time. Therefore, no matter how many tube cores to be tested are connected to the output end of the utility model, as long as the voltage drop of all the tube cores to be tested does not exceed 80% of the maximum output voltage, and the current does not exceed 80% of the maximum output current. That is, no matter how the external voltage and load change, the current will always be stable within a given range, thereby achieving the purpose of optimizing tube core aging screening. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a connection block diagram of the current aging test device of the utility model;

[0019] Figure 2This is a principle block diagram of the current aging test device of the utility model;

[0020] Figure 3 The utility model is a circuit diagram of a current aging test device. DETAILED DESCRIPTION

[0021] Embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although certain embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be construed as being limited to the embodiments set forth herein. On the contrary, these embodiments are provided to provide a more thorough and complete understanding of the present disclosure. It should be understood that the drawings and embodiments of the present disclosure are only for exemplary purposes and are not intended to limit the scope of protection of the present disclosure.

[0022] It should also be noted that, for ease of description, only the parts related to the invention are shown in the drawings. In the absence of conflict, the embodiments and features in the embodiments of the present disclosure can be combined with each other.

[0023] Example

[0024] Reference Figures 1 to 3 As shown, this embodiment provides a tube core current aging test system, including a PLC programmable controller, an operational amplifier circuit, a pulse width modulation circuit, a power drive output circuit and a load sampling circuit, the output end of the PLC programmable controller is electrically connected to the operational amplifier circuit to output a control voltage thereto, the output end of the operational amplifier circuit is electrically connected to the pulse width modulation circuit to control its duty cycle, the output end of the pulse width modulation circuit is electrically connected to the power drive output circuit so that the output is controlled by the duty cycle, the output end of the power drive output circuit is electrically connected to the load sampling circuit to output a feedback voltage, and the output end of the load sampling circuit is electrically connected to the operational amplifier circuit and the PLC programmable controller respectively so that it is controlled by the feedback voltage.

[0025] The present embodiment also includes a display and control circuit, which is electrically connected to a PLC programmable controller. The PLC programmable controller is a digital operation controller with a microprocessor for automatic control, which can load control instructions into a memory at any time for storage and execution. During use, the signal output by the PLC programmable controller is transmitted to the display screen and the control button. The operation performed by the PLC programmable controller can be observed in real time through the display screen, and the execution control for the PLC programmable controller can be realized through the control button to achieve control of various types of mechanical equipment or production processes.

[0026] The operational amplifier circuit includes an operational amplifier IC1 and resistors R1 to R3. The output terminal of the PLC programmable controller is connected in series with resistor R1 to the positive input terminal of the operational amplifier IC1, and resistor R2 is connected in series between resistor R1 and the positive input terminal of the operational amplifier IC1 and then grounded. The inverting input terminal of the operational amplifier IC1 is connected in series with resistor R3 and then fed back to the output terminal of the operational amplifier IC1. The positive power supply terminal of the operational amplifier IC1 is grounded, and the negative power supply terminal of the operational amplifier IC1 is connected to the power supply terminal. The output terminal of the operational amplifier is connected to its inverting input terminal to form a negative feedback state because the voltage gain of the operational amplifier is very large, ranging from hundreds to tens of thousands of times. The use of negative feedback method can ensure the stable operation of the circuit.

[0027] Operational amplifier IC1 uses LM353 operational amplifier. Operational amplifier is a circuit unit with very high amplification factor, and its output signal can be the result of mathematical operations such as addition, subtraction or calculus of input signal. An ideal operational amplifier must have infinite input impedance, zero output impedance, infinite open loop gain, infinite common mode rejection ratio and infinite bandwidth. In particular, LM353 operational amplifier is a dual-channel operational amplifier circuit with low input bias current, wide gain bandwidth product, flexible power supply voltage range and wide operating temperature range.

[0028] The pulse width modulation circuit includes a pulse width modulation chip IC2, a capacitor C1 and resistors R4 to R6. The output end of the operational amplifier IC1 is connected to the 5th pin of the pulse width modulation chip IC2, and the 1st pin of the pulse width modulation chip IC2 is grounded. Resistors R4, R5 and C2 are connected in series, one end of which is grounded and the other end is connected to the power supply end, while pins 2 and 6 of the pulse width modulation chip IC2 are connected between resistor R5 and capacitor C2. Pins 8 and 4 of the pulse width modulation chip IC2 are also connected to the power supply end, and pin 7 of the pulse width modulation chip IC2 is connected between resistors R4 and R5.

[0029] The pulse width modulation chip IC2 uses the NE555 time base integrated chip, which is an 8-pin time base integrated circuit. It is small in size, light in weight, stable and reliable, and has a strong current supply capacity at the output end. At the same time, it has high timing accuracy, good temperature stability, and low price. Generally speaking, pin 1 of the NE555 time base integrated chip is the ground pin, connected to the ground end of the circuit; pin 2 is the trigger pin, which is used to trigger it to start the time cycle; pin 3 is the output pin, which outputs at the beginning of the time cycle; pin 4 is the reset pin, which is used to reset the timer to return the output to a low potential; pin 5 is the control pin, which allows external voltage to change the trigger and gate voltage, which is used to change or adjust the output frequency; pin 6 is the reset lock pin, which is used to reset the lock to make the output low; pin 7 is the discharge pin, which has the same current output capacity; pin 8 is the positive power supply voltage pin.

[0030] The power drive output circuit includes field effect tubes Q1-Q2, resistor R7, inductor L1 and capacitor C2. One end of resistor R6 is connected to pin 3 of pulse width modulation chip IC2, and the other end is connected to the gate of field effect tube Q1. The collector of field effect tube Q1 is connected in series with resistor R7 and then connected to the power supply end, and the emitter of field effect tube Q1 is grounded. The collector of field effect tube Q1 is also connected to the gate of field effect tube Q2, and the emitter of field effect tube Q2 is connected in series with inductor L1 and capacitor C2 and then grounded. The collector of field effect tube Q2 is also connected to the power supply end.

[0031] Both field effect tubes Q1 and Q2 are high-power IGBT transistors. Field effect tube Q1 uses N-channel FGL40N120AND field effect tube, and field effect tube Q2 uses P-channel FGL40N120AND field effect tube. IGBT transistor is an insulated gate bipolar transistor, which is a composite fully controlled voltage fully controlled voltage driven power semiconductor device composed of bipolar triode and insulated gate field effect tube, taking into account the advantages of high input impedance of MOSFET and low conduction voltage drop of GTR. There are two types of IGBT transistors: N-channel type and P-channel type. The conduction of N-channel requires the gate voltage to be negative and large enough, while the conduction of P-channel requires the gate voltage to be positive and large enough. FGL40N120AND transistor is a bipolar transistor, and its parameters are excellent. It is mostly used in high-power equipment such as welding machines, induction cookers, and charging piles.

[0032] The load sampling circuit includes a load resistor R L , sampling resistor R S , inductor L2, capacitor C3 and diode D. One end of inductor L1 is connected to the emitter of field effect tube Q2, and the other end of inductor L1 is connected to one end of inductor L2. The other end of inductor L2 is connected in series with load resistor R. L and sampling resistor R S And one end of the inductor L2 is connected in series with a diode D and then grounded, and the other end is connected in series with a capacitor C4 and then grounded. In addition, the sampling resistor R L One end of the resistor is also fed back to the inverting input terminal of the operational amplifier IC1.

[0033] The utility model can be realized as a 30A / 100V constant current source, and works in the current range of 0 to 30A. A given control voltage is output by the PLC programmable controller, and the pulse width modulation voltage output by the operational amplifier circuit is controlled by the given voltage. The pulse width modulation circuit is controlled by the pulse width modulation voltage output by the operational amplifier circuit, and then the duty cycle output is used to control the power drive output circuit. The power drive output circuit is connected to the feedback circuit and then fed back to the operational amplifier circuit, so that the operational amplifier circuit is controlled by the current sampling feedback voltage at the same time.

[0034] Specifically, the control voltage output by the PLC programmable controller is added to the positive input terminal of the operational amplifier IC1 after being divided by resistors R1 and R2. The output terminal of the operational amplifier IC1 outputs a voltage to the 5th pin of the pulse width modulation chip IC2 as a signal to control the pulse width modulation of the NE555 time base integrated chip. The duty ratio of the positive pulse and negative pulse width of the NE555 pulse width modulation chip changes with the trigger level of its 5th pin. The 3rd pin of the NE555 time base integrated chip is output to the gate of the N-channel field effect transistor Q1. The N-channel field effect transistor Q1 and the P-channel field effect transistor Q2 work alternately in the switching state, so that the operating frequency and duty ratio of the N-channel field effect transistor Q1 are equal to the frequency and duty ratio of the voltage signal output from the 3rd pin of the NE555 time base integrated chip.

[0035] When the P-channel field effect transistor Q2 is turned on, the diode D is in the cut-off state, and the DC voltage is applied to both ends of the diode D. At this time, its polarity is positive at the top and negative at the bottom. After being filtered by the inductor L2, the load resistor R L Power supply. When the P-channel field effect tube Q2 is turned off, the left side of the inductor L2 is the negative pole and the right side is the positive pole. Under the action of the loop inductor L1, the diode D uses the back electromotive force of the inductor to conduct to form a freewheeling loop, thus ensuring the stability of the output voltage. At the same time, the diode D can also weaken the back electromotive force generated by the inductive load when the output signal voltage jumps from a high level to a low level. The sampling resistor R S It is a current sampling resistor, connected to the negative input terminal of the operational amplifier IC1, and is superimposed with the given signal of the operational amplifier IC1 to control the output voltage of the operational amplifier. At the same time, this feedback voltage also controls the 5-pin pulse width modulation terminal of the NE555 time base integrated chip.

[0036] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0037] In addition, in the present utility model, unless otherwise clearly specified and limited, the terms "install", "connect", "connect", "fix" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can make the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present utility model can be understood according to specific circumstances.

[0038] The above are only preferred embodiments of the present invention, and the present invention may also have other embodiments. For those skilled in the art, the technical solutions described in the above embodiments may still be modified, or some of the technical features may be replaced by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A tube core current aging test system, characterized in that: It includes a PLC programmable controller, an operational amplifier circuit, a pulse width modulation circuit, a power drive output circuit and a load sampling circuit. The output end of the PLC programmable controller is electrically connected to the operational amplifier circuit to output a control voltage to the operational amplifier circuit, the output end of the operational amplifier circuit is electrically connected to the pulse width modulation circuit to control its duty cycle, the output end of the pulse width modulation circuit is electrically connected to the power drive output circuit so that the output is controlled by the duty cycle, the output end of the power drive output circuit is electrically connected to the load sampling circuit to output a feedback voltage, and the output end of the load sampling circuit is electrically connected to the operational amplifier circuit and the PLC programmable controller respectively so that they are controlled by the feedback voltage.

2. A die current aging test system according to claim 1, characterized in that: The PLC programmable controller is also electrically connected to a display and control circuit, which includes a display screen and control buttons.

3. A tube core current aging test system according to claim 1, characterized in that: The operational amplifier circuit includes an operational amplifier, the output end of the PLC programmable controller is connected in series with resistors R1 and R2 and then connected to the positive input end of the operational amplifier, the inverting input end of the operational amplifier is connected in series with resistor R3 and then feedback connected to the output end of the operational amplifier, and the negative power supply end of the operational amplifier is connected to the power supply end.

4. A die current aging test system according to claim 3, characterized in that: The pulse width modulation circuit includes a pulse width modulation chip, the output end of the operational amplifier is connected to pin 5 of the pulse width modulation chip, pins 8 and 4 of the pulse width modulation chip are both connected to the power supply end, pins 2 and 6 of the pulse width modulation chip are connected in series with resistors R5 and R4 and then connected to the power supply end, and pin 7 of the pulse width modulation chip is connected between the resistors R4 and R5.

5. A tube core current aging test system according to claim 4, characterized in that: The power drive output circuit includes field effect transistors Q1 and Q2, the 3rd pin of the pulse width modulation chip is connected in series with a resistor R6 and then connected to the gate of the field effect transistor Q1, the collector of the field effect transistor Q1 is connected to the gate of the field effect transistor Q2, the collector of the field effect transistor Q1 is connected in series with a resistor R7 and then connected to the power supply end, the emitter of the field effect transistor Q2 is connected in series with an inductor L1 and a capacitor C2 and then grounded, and the collector of the field effect transistor Q2 is also connected to the power supply end.

6. A die current aging test system according to claim 5, characterized in that: The load sampling circuit includes a load resistor and a sampling resistor. One end of the inductor L1 is connected to one end of the inductor L2. The other end of the inductor L2 is connected in series with the load resistor and the sampling resistor and then grounded. One end of the sampling resistor is feedback-connected to the inverting input end of the operational amplifier.

7. A tube core current aging test system according to claim 6, characterized in that: The operational amplifier is a LM353 operational amplifier.

8. A die current aging test system according to claim 6, characterized in that: The pulse width modulation chip adopts the NE555 time base integrated chip.

9. A die current aging test system according to claim 6, characterized in that: The field effect tube Q1 is an N-channel high-power IGBT field effect tube, and the field effect tube Q2 is a P-channel high-power IGBT field effect tube.

Images