Isolation type test box for high and low temperature test of LTPS liquid crystal sample

Abstract

The utility model discloses an isolated test box for high and low temperature tests of LTPS (Low Temperature Poly Styrene) liquid crystal samples, which comprises a test box body, a plurality of sample placing grooves are formed in the test box body, and through holes are formed in the middle parts of two ends of the test box body; the number of the storage frames is two, the two storage frames are arranged at the two ends of the test box body respectively, and a plurality of circuit board placing grooves are formed in each storage frame; and a wiring channel. According to the isolation type test box for the high and low temperature test of the LTPS liquid crystal sample, the storage frames are externally arranged at the two ends of the high and low temperature test box and used for containing the driving circuit board, line connection is carried out through the switching flat cable and the external FPC flat cable, and the double-layer silica gel sealing ring is arranged, so that the sealing performance of the test box is enhanced; physical separation of the drive circuit and the liquid crystal sample is achieved, the circuit board is prevented from being damaged due to direct impact of temperature and humidity, judgment of liquid crystal sample testing results is not affected, and testing cost is reduced.

Description

Technical Field

[0001] This utility model relates to the field of high and low temperature testing equipment, and in particular to an isolated test chamber for high and low temperature testing of LTPS liquid crystal samples. Background Technology

[0002] When performing high and low temperature reliability tests on current liquid crystal display devices (e.g., -40℃ to 100℃), the driver circuit board and the liquid crystal sample must be placed in the test chamber at the same time.

[0003] When the inventors implemented this device, they discovered the following defects:

[0004] 1. Circuit boards are susceptible to condensation corrosion in high humidity environments, which can lead to short circuits;

[0005] 2. Temperature shocks can easily cause circuit components to fail;

[0006] 3. A faulty circuit board may cause a false diagnosis of non-LCD body failure.

[0007] Because the enclosure lacks a designated space for the drive circuit module, the drive circuit, along with the sample, is placed inside the enclosure for testing during high and low temperature verification of the liquid crystal sample. This increases the risk of instability in the liquid crystal sample testing experiment due to factors such as circuit board failure. Utility Model Content

[0008] Therefore, it is necessary to provide an isolated test chamber for high and low temperature testing of LTPS liquid crystal samples to address the above-mentioned technical problems. This chamber uses external storage frames at both ends to hold the driver circuit board, which is connected via an adapter cable. It is equipped with double-layer silicone sealing rings to enhance the airtightness of the test chamber, thereby achieving physical separation between the driver circuit and the liquid crystal sample. This prevents the circuit board from being damaged by direct temperature and humidity impacts, which would affect the judgment of the liquid crystal sample test results and reduce testing costs.

[0009] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:

[0010] An isolated test chamber for high and low temperature testing of LTPS liquid crystal samples, which is applied to high and low temperature testing equipment.

[0011] The isolated test chamber for high and low temperature testing of LTPS liquid crystal samples specifically includes:

[0012] The test chamber body has several sample placement slots inside, and perforations are provided at the middle of both ends of the test chamber body;

[0013] The storage frame has two compartments, which are respectively placed at both ends of the test chamber body. Each storage frame is provided with several circuit board placement slots.

[0014] The wiring channel passes through the perforation and is distributed between the test box body and the two storage frames. The wiring channel is provided with several adapter cables, and each adapter cable extends to a sample placement slot and a circuit board placement slot at both ends.

[0015] As a preferred embodiment of the isolation test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model, double-layer silicone sealing rings are provided on the inner side of both perforations.

[0016] As a preferred embodiment of the isolation test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model, the wiring channel is provided with a groove near the sample placement slot or the circuit board placement slot, and the groove is used to place the connector of the adapter cable.

[0017] As a preferred embodiment of the isolation test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model, each vertical edge of the wiring channel is chamfered, and several blocks are provided at the upper end of the side wall of the wiring channel.

[0018] As a preferred embodiment of the isolation test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model, each sample placement slot is provided with a sliding groove on its side wall, and a lifting rod is provided in the sliding groove. The lifting rod is L-shaped and its short side extends into the sample placement slot.

[0019] As a preferred embodiment of the isolation test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model, the upper end of the lifting rod extends above the sample placement slot and is connected to a handle, and a support plate is provided at the bottom of each sample placement slot.

[0020] Compared with the prior art, the present invention has the following beneficial effects:

[0021] The isolated test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model has external storage frames at both ends of the high and low temperature test chamber for placing the drive circuit board. The circuit is connected by adapter cables and external FPC cables. It is equipped with double-layer silicone sealing rings to enhance the sealing performance of the test chamber, realize the physical separation of the drive circuit and the liquid crystal sample, avoid the circuit board from being damaged by direct impact of temperature and humidity, which would affect the judgment of the liquid crystal sample test results and reduce the test cost.

[0022] Meanwhile, the two connecting ends of the adapter cable are designed as flexible spring wires, which facilitates connection while avoiding pulling on the circuit and causing a messy distribution. After placing the liquid crystal sample into the sample placement slot, the lifting rod is pulled by the handle. The lifting rod is located below the liquid crystal sample at its bottom end. When it rises, it lifts one end of the liquid crystal sample, making it easy to remove the liquid crystal sample from the sample placement slot. Attached Figure Description

[0023] To more clearly illustrate the solutions in this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0024] Figure 1 A perspective view of the isolated test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model;

[0025] Figure 2 The isolated test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model Figure 1 Enlarged view of section A in the middle;

[0026] Figure 3 The isolated test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model Figure 1 Enlarged view of section B;

[0027] Figure 4 A three-dimensional view of the double-layer silicone sealing ring of the isolation test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model;

[0028] Figure 5 A perspective view of the lifting rod of the isolation test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model.

[0029] The markings in the diagram are explained as follows:

[0030] 1. Test box body; 2. Storage frame; 3. Wiring channel; 4. Adapter cable;

[0031] 10. Sample placement slot; 11. Perforation; 12. Double-layer silicone sealing ring;

[0032] 100. Slide groove; 101. Lifting rod; 102. Handle;

[0033] 20. Circuit board placement slot;

[0034] 30. Groove; 31. Stop. Detailed Implementation

[0035] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.

[0036] As in the background technology, since the enclosure does not have a module for placing the drive circuit, when performing high and low temperature verification of liquid crystal samples, the drive circuit is placed into the enclosure along with the sample for testing. This can easily damage the circuit board and affect the test results.

[0037] To solve this technical problem, this utility model provides an isolated test chamber for high and low temperature testing of LTPS liquid crystal samples, which applies high and low temperature testing equipment.

[0038] For details, please refer to Figure 1-5 The isolated test chamber for high and low temperature testing of LTPS liquid crystal samples specifically includes:

[0039] The test chamber body 1 has several sample placement slots 10 inside, which are used to place liquid crystal samples. The size and shape of the sample placement slots 10 are designed in multiple specifications according to the actual liquid crystal samples. Perforations 11 are provided at the center of both ends of the test chamber body 1.

[0040] Storage frames 2, there are two storage frames 2, one at each end of the test chamber body 1. Each storage frame 2 has several circuit board placement slots 20. The circuit board placement slots 20 can hold the driving circuit board for the liquid crystal sample. The number of circuit board placement slots 20 in the two storage frames 2 is the same as the number of sample placement slots 10.

[0041] Wiring channels 3, passing through perforations 11, are distributed between the test chamber body 1 and the two storage frames 2. Several adapter cables 4, which are FPC adapter cables, are installed within the wiring channels 3. Each adapter cable 4 extends to a sample placement slot 10 and a circuit board placement slot 20 at both ends. The liquid crystal sample and the driving circuit board are connected using FPC cables, with the other end of the FPC cables connected to the adapter cables 4. The high-performance, temperature-resistant FPC cables and the adapter cables 4 ensure complete signal transmission.

[0042] The isolated test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model uses external storage frames 2 at both ends of the high and low temperature test chamber to place the driving circuit board. The circuit is connected by adapter cable 4 and external FPC cable, which realizes the physical separation of the driving circuit and the liquid crystal sample, avoids the circuit board from being damaged by direct impact of temperature and humidity, and avoids affecting the judgment of the liquid crystal sample test results, thus reducing the test cost.

[0043] To enable those skilled in the art to better understand the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings.

[0044] It should be noted that, unless otherwise specified, the embodiments and features and technical solutions in the present invention can be combined with each other.

[0045] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0046] Example 1

[0047] Please refer to Figure 1-4 An isolated test chamber for high and low temperature testing of LTPS liquid crystal samples, comprising:

[0048] The test chamber body 1 has several sample placement slots 10 inside, which are used to place liquid crystal samples. The size and shape of the sample placement slots 10 are designed in multiple specifications according to the actual liquid crystal samples. Perforations 11 are provided at the center of both ends of the test chamber body 1.

[0049] Storage frames 2, there are two storage frames 2, one at each end of the test chamber body 1. Each storage frame 2 has several circuit board placement slots 20. The circuit board placement slots 20 can hold the driving circuit board for the liquid crystal sample. The number of circuit board placement slots 20 in the two storage frames 2 is the same as the number of sample placement slots 10.

[0050] Wiring channels 3, passing through perforations 11, are distributed between the test chamber body 1 and the two storage frames 2. Several adapter cables 4, which are FPC adapter cables, are installed within the wiring channels 3. Each adapter cable 4 extends to a sample placement slot 10 and a circuit board placement slot 20 at both ends. The liquid crystal sample and the driving circuit board are connected using FPC cables, with the other end of the FPC cables connected to the adapter cables 4. The high-performance, temperature-resistant FPC cables and the adapter cables 4 ensure complete signal transmission.

[0051] Specifically, the inner sides of both perforations 11 are equipped with double-layer silicone sealing rings 12 to enhance the sealing of the test chamber and ensure the stability of temperature and humidity inside the chamber.

[0052] Specifically, the wiring channel 3 is provided with a groove 30 near the sample placement slot 10 or the circuit board placement slot 20. The groove 30 is used to place the connector of the adapter cable 4. This prevents the connector from entering the sample placement slot 10 or the circuit board placement slot 20, which would affect the placement and removal of the liquid crystal sample and the circuit board.

[0053] Specifically, each vertical edge of the wiring channel 3 is chamfered to prevent scratching the wiring and causing damage to exposed cables, thus affecting usability. Several blocks 31 are provided on the upper side wall of the wiring channel 3 to restrict the wiring and prevent it from running out of the wiring channel 3, thus preventing the wiring from becoming messy.

[0054] The isolated test chamber for high and low temperature testing of LTPS liquid crystal samples provided in this embodiment uses external storage frames 2 at both ends of the high and low temperature test chamber to place the driving circuit board. The circuit is connected by adapter cable 4 and external FPC cable, which realizes the physical separation of the driving circuit and the liquid crystal sample. This avoids the circuit board being damaged by direct impact of temperature and humidity, which would affect the judgment of the liquid crystal sample test results and reduce the test cost.

[0055] Example 2

[0056] The isolated test chamber for high and low temperature testing of LTPS liquid crystal samples provided in Example 1 has been further optimized, specifically, as follows: Figure 3-5 As shown, each sample placement slot 10 has a sliding groove 100 on its side wall, and a lifting rod 101 is installed inside the sliding groove 100. The lifting rod 101 has an L-shaped structure and its short side extends into the sample placement slot 10. After the liquid crystal sample is tested, its edge adheres to the sample placement slot 10, making it difficult to remove. By pulling the lifting rod 101 located on the side wall of the sample placement slot 10, the lifting rod 101 pulls the liquid crystal sample out through its bottom end, thus facilitating the removal of the liquid crystal sample.

[0057] Specifically, the upper end of the lifting rod 101 extends above the sample placement slot 10 and is connected to a handle 102. The handle 102 is semi-circular to facilitate pulling the lifting rod 101 upward. Each sample placement slot 10 has a support plate at its bottom. The support plate, together with the lifting rod 101, provides auxiliary support for the liquid crystal sample, ensuring its stability during placement.

[0058] With the above structural design, after the liquid crystal sample is placed in the sample placement slot 10, the lifting rod 101 is pulled by the handle 102. The lifting rod 101 is located below the liquid crystal sample at its bottom end. When it rises, it lifts one end of the liquid crystal sample, making it easy to take the liquid crystal sample out of the sample placement slot 10.

[0059] The usage process of the isolated test chamber for high and low temperature testing of LTPS liquid crystal samples provided by this utility model is as follows:

[0060] By placing external storage frames 2 at both ends of the high and low temperature test chamber to hold the drive circuit board, and connecting the circuits via adapter cables 4 and external FPC cables, the drive circuit and the liquid crystal sample are physically separated. This avoids damage to the circuit board caused by direct impact of temperature and humidity, which would affect the judgment of the liquid crystal sample test results and reduce test costs.

[0061] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection, an electrical connection, or a connection that allows communication between them; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0062] Obviously, the embodiments described above are only some embodiments of this utility model, not all embodiments. The accompanying drawings show preferred embodiments of this utility model, but do not limit the patent scope of this utility model. This utility model can be implemented in many different forms; rather, the purpose of providing these embodiments is to provide a more thorough and comprehensive understanding of the disclosure of this utility model. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing specific embodiments, or make equivalent substitutions for some of the technical features. Any equivalent structures made using the content of this utility model specification and drawings, directly or indirectly applied to other related technical fields, are similarly within the patent protection scope of this utility model.

Claims

1. An isolated test chamber for LTPS liquid crystal sample high and low temperature testing, characterized in that, It includes The test box body (1) has several sample placement slots (10) inside, and perforations (11) are provided at the middle of both ends of the test box body (1). Storage frame (2), there are two storage frames (2), the two storage frames (2) are respectively placed at both ends of the test box body (1), and each storage frame (2) is provided with several circuit board placement slots (20). Wiring channel (3), which passes through perforation (11) and is distributed between test box body (1) and two storage boxes (2), and a number of adapter cables (4) are provided in the wiring channel (3), with each adapter cable (4) extending to a sample placement slot (10) and a circuit board placement slot (20) at both ends.

2. The LTPS liquid crystal sample high-low temperature test isolation test chamber of claim 1, wherein, Both of the perforations (11) are provided with double-layer silicone sealing rings (12) on the inner side.

3. The LTPS liquid crystal sample high-low temperature test isolation test chamber of claim 1, wherein, The wiring channel (3) is provided with a groove (30) near the sample placement slot (10) or the circuit board placement slot (20), and the groove (30) is used to place the connector of the adapter cable (4).

4. The LTPS liquid crystal sample high-low temperature test isolation test chamber according to any one of claims 1 or 3, characterized in that, Each vertical edge of the wiring channel (3) is chamfered, and several blocks (31) are provided on the upper side wall of the wiring channel (3).

5. The LTPS liquid crystal sample high-low temperature test isolation test chamber of claim 1, wherein, Each of the sample placement slots (10) has a sliding groove (100) on its side wall, and a lifting rod (101) is provided in the sliding groove (100). The lifting rod (101) is L-shaped and its short side extends into the sample placement slot (10).

6. The LTPS liquid crystal sample high-low temperature test isolation test chamber of claim 5, wherein, The upper end of the lifting rod (101) extends above the sample placement slot (10) and is connected to a handle (102). Each sample placement slot (10) has a support plate at its bottom.

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