A test device

Abstract

The utility model discloses a test device, include: processing module, at least one test module, test module includes the power module and switch module for the power supply of measured protection module, the first end of power module connects the input of measured protection module, the output of measured protection module connects the first end of processing module, the first end of switch module connects the second end of processing module, the second end of switch module connects the second end of power module, the control end of switch module connects the signal feedback end of measured protection module, power module is configured as adjustable voltage according to setting voltage interval output, wherein, measured protection module controls switch module to turn on or turn off under adjustable voltage, processing module is configured as the output voltage of measured protection module is monitored to determine whether measured protection module acts. The utility model has simplified the circuit structure, reduced hardware cost, improved test efficiency.

Description

Technical Field

[0001] This utility model relates to the field of electronic testing technology, and in particular to a testing device. Background Technology

[0002] In the electronics industry, verification tests are required for battery protection modules to address overvoltage and undervoltage issues.

[0003] In existing technologies, testing devices for battery protection modules typically require a separate electronic load and oscilloscope for each test channel. For example, in multi-channel testing scenarios, a separate electronic load needs to be set up for each module under test to simulate the output load state, and the oscilloscope is used to acquire voltage waveforms in real time to determine whether the protection action has been triggered. This results in the number of electronic loads and oscilloscopes inside the testing device increasing exponentially with the number of test channels. Such testing devices that rely on discrete electronic loads and oscilloscope monitoring units are not only costly in terms of hardware, but also limit testing efficiency due to poor coordination among multiple devices. Utility Model Content

[0004] This invention provides a testing device that simplifies the circuit structure, reduces hardware costs, and improves testing efficiency.

[0005] This utility model provides a testing device, including: a processing module and at least one testing module. The testing module includes a power supply module and a switch module for supplying power to the protection module under test. The first end of the power supply module is connected to the input end of the protection module under test, the output end of the protection module under test is connected to the first end of the processing module, the first end of the switch module is connected to the second end of the processing module, and the second end of the switch module is connected to the second end of the power supply module. The control end of the switch module is connected to the signal feedback end of the protection module under test.

[0006] The power supply module is configured to output an adjustable voltage according to a set voltage range. The protection module under test controls the switch module to turn on or off under the adjustable voltage. The processing module is configured to monitor the output voltage of the protection module under test to determine whether the protection module under test has activated.

[0007] Optionally, the switching module includes an undervoltage switch; the protection module under test is configured to turn off the undervoltage switch when the adjustable voltage is less than the undervoltage protection threshold.

[0008] Optionally, the switching module includes an overvoltage switch; the protection module under test is configured to shut off the overvoltage switch when the adjustable voltage exceeds the overvoltage protection threshold.

[0009] Optionally, the switching module includes an undervoltage switch and an overvoltage switch, both of which have a first terminal, a second terminal, and a control terminal; the signal feedback terminal includes an undervoltage signal feedback terminal and an overvoltage signal feedback terminal; the control terminal of the undervoltage switch is connected to the undervoltage signal feedback terminal, the first terminal of the undervoltage switch is connected to the second terminal of the power supply module, the second terminal of the undervoltage switch is connected to the second terminal of the overvoltage switch, the first terminal of the overvoltage switch is connected to the second terminal of the processing module, and the control terminal of the overvoltage switch is connected to the overvoltage signal feedback terminal; the protection module under test is configured to turn off the undervoltage switch when the adjustable voltage is less than the undervoltage protection threshold and to turn off the overvoltage switch when the adjustable voltage is greater than the overvoltage protection threshold.

[0010] Optionally, the switching module includes a first MOSFET and a second MOSFET; both the first MOSFET and the second MOSFET include a gate, a source, and a drain; the signal feedback terminal includes an undervoltage signal feedback terminal and an overvoltage signal feedback terminal; the gate of the first MOSFET is connected to the undervoltage signal feedback terminal, the source of the first MOSFET is connected to the second terminal of the power supply module, and the drain of the first MOSFET is connected to the drain of the second MOSFET; the gate of the second MOSFET is connected to the overvoltage signal feedback terminal, and the source of the second MOSFET is connected to the second terminal of the processing module.

[0011] Optionally, the processing module is also electrically connected to a power supply module, which is configured to output an adjustable voltage within a set voltage range using a binary method based on the action of the protection module under test.

[0012] Optionally, the testing device also includes a host computer, which is connected to the processing module and the power supply module. The host computer is configured to adjust the power supply module to output an adjustable voltage within a set voltage range according to the action of the protection module under test using a binary search method.

[0013] Optionally, the power module includes a programmable DC power supply.

[0014] Optionally, the processing module includes a multi-channel unit configured to connect multiple modules under test.

[0015] Optionally, the testing device also includes an alarm module connected to the processing module; the processing module is also used to monitor the voltage range of the power supply module after adjustment based on the binary method, and to determine the voltage range and the action threshold of the protection module under test; the alarm module is used to receive the judgment result of the processing module.

[0016] The testing device provided by this utility model includes a processing module and at least one testing module. The testing module includes a power supply module and a switching module for supplying power to the protection module under test (DUT). The signal feedback terminal of the DUT is directly connected to the control terminal of the switching module, forming a closed-loop control circuit, replacing the traditional discrete monitoring mechanism of electronic load and oscilloscope. The power supply module dynamically adjusts its output voltage according to a set voltage range. After triggering the DUT's action, its signal feedback terminal controls the on / off state of the switching module in real time. The processing module automatically determines whether the protection action has been effectively triggered by directly acquiring the voltage change at the output terminal of the DUT. This testing device simplifies the circuit structure, reduces hardware costs, and improves testing efficiency through the closed-loop coordination of the power supply module, switching module, and processing module.

[0017] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this utility model, nor is it intended to limit the scope of this utility model. Other features of this utility model will become readily apparent from the following description. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 This is a schematic diagram of the structure of a testing device provided in an embodiment of this utility model;

[0020] Figure 2 This is a schematic diagram of the switch module in one embodiment;

[0021] Figure 3 This is a schematic diagram of the switch module in yet another embodiment;

[0022] Figure 4 This is a schematic diagram of the switch module in yet another embodiment;

[0023] Figure 5 This is a schematic diagram of the switch module in yet another embodiment;

[0024] Figure 6 This is a schematic diagram of the structure of another testing device provided in this embodiment of the utility model;

[0025] Figure 7 This is a schematic diagram of the structure of another testing device provided in this embodiment of the utility model;

[0026] Figure 8This is a schematic diagram of the structure of another testing device provided in this embodiment of the utility model;

[0027] Figure 9 This is a schematic diagram of the structure of another testing device provided in this embodiment of the utility model. Detailed Implementation

[0028] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.

[0029] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this utility model are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this utility model described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion.

[0030] Figure 1 This is a schematic diagram of the structure of a testing device provided in an embodiment of this utility model. Figure 1 As shown, the testing device includes: a processing module 10 and at least one test module 20. The test module 20 includes a power supply module 21 and a switch module 22 for supplying power to the protection module 30 under test.

[0031] The first terminal of the power supply module 21 is connected to the input terminal of the protection module under test 30, and the output terminal of the protection module under test 30 is connected to the first terminal of the processing module 10. The first terminal of the switch module 22 is connected to the second terminal of the processing module 10, the second terminal of the switch module 22 is connected to the second terminal of the power supply module 21, and the control terminal of the switch module 22 is connected to the signal feedback terminal of the protection module under test 30.

[0032] The power module 21 is configured to output an adjustable voltage according to a set voltage range. The protection module under test 30 controls the switch module 22 to turn on or off under the adjustable voltage. The processing module 10 is configured to monitor the output voltage of the protection module under test 30 to determine whether the protection module under test 30 has been activated.

[0033] Specifically, the protection module under test 30 can be a battery protection module. The battery protection module includes a battery protection chip, and the model of the battery protection chip can be SH367309, BQ7695202, CW1051, BYD BM3451, and HTL6307, etc. The first end of the processing module 10 is a signal acquisition end.

[0034] The signal feedback terminal of the protection module under test 30 refers to the control interface connecting the protection module under test 30 and the switch module 22. It is used to transmit the electrical signal that triggers the protection action to control the on / off state of the switch module 22. Optionally, the signal feedback terminal can directly drive the switch module 22 to turn on or off by receiving the overvoltage protection control signal or undervoltage protection control signal from the protection module under test 30 in the test device, forming a closed-loop control circuit.

[0035] The processing module 10 may include a microcontroller. Optionally, the control module 10 may include a microcontroller, or a digital signal processor (DSP) or a field-programmable gate array (FPGA).

[0036] The power supply module 21 includes a programmable DC power supply (PSU) for outputting an adjustable voltage according to a set voltage range to the protection module under test 30. The protection module under test 30 operates according to the adjustable voltage.

[0037] Optionally, the power module 21 may have a built-in digital control unit (such as an FPGA) that supports receiving external control commands and can output an adjustable voltage within a set voltage range according to the external control commands.

[0038] In one embodiment, the power module 21 selects the intermediate value in the set voltage range as the adjustable voltage output according to the binary division method. The intermediate value divides the original set voltage range into two. Based on whether the protection module under test 30 is activated or not, the range in which the set activation threshold of the protection module under test 30 is located is selected. The intermediate value is further selected as the adjustable voltage output by the binary division method.

[0039] In another embodiment, a voltage value can be manually selected as an adjustable voltage output within a set voltage range. This voltage value divides the original set voltage range in two. Based on whether the protection module under test 30 is activated or not, the range in which the set activation threshold of the protection module under test 30 is located is selected, and a voltage value is further selected within this range as an adjustable voltage output.

[0040] By using the adjustable voltage output, the operation threshold of the protection module under test 30 can be determined by repeatedly testing whether it operates.

[0041] Switching module 22 refers to a switch that can be controlled to open or close via an electrical signal. Switching module 22 can be a unidirectional switch, such as a switch consisting of a bidirectional switch and a diode connected in series, capable of unidirectional conduction, or a bidirectional switch, such as a metal-oxide-semiconductor field-effect transistor (MOSFET) or an insulated-gate bipolar transistor (IGBT) with an anti-parallel freewheeling diode. It is understood that the specific type of switching module 22 can be selected and configured according to actual application scenarios, and this invention does not limit its specific type.

[0042] When the protection module under test 30 is activated, it can trigger the shutdown of the switch module 22, which can then be detected by the processing module 10.

[0043] Continue to refer to Figure 1 The working process of the testing device provided by this utility model is as follows:

[0044] The power supply module 21 outputs an adjustable voltage to the input terminal of the protection module under test 30 according to a set voltage range. When the adjustable voltage is less than the undervoltage protection threshold or greater than the overvoltage protection threshold, the protection module under test 30 sends a control signal to the switch module 22 through the signal feedback terminal. The switch module 22 turns on or off according to the control signal, thereby cutting off or maintaining the circuit connection, and its output voltage will change accordingly. The processing module 10 can determine whether the protection module under test 30 has been activated by monitoring the change in the output voltage of the protection module under test 30.

[0045] In one embodiment, in an undervoltage protection test scenario, if the output voltage of the protection module under test 30 decreases or becomes 0, it is determined that the protection module under test 30 has triggered an undervoltage protection action.

[0046] In another embodiment, in the overvoltage protection test scenario, if the output voltage of the protection module under test 30 decreases or becomes 0, it is determined that the protection module under test 30 has triggered an overvoltage protection action.

[0047] The testing device provided by this utility model includes a processing module 10 and at least one testing module 20. The testing module 20 includes a power supply module 21 for supplying power to the protection module under test (DUT) 30 and a switching module 22. The signal feedback terminal of the DUT 30 is directly connected to the control terminal of the switching module 22, forming a closed-loop control circuit, replacing the traditional discrete monitoring mechanism of electronic load and oscilloscope. The power supply module 21 dynamically adjusts its output voltage according to a set voltage range. After triggering the DUT 30, its signal feedback terminal controls the on / off state of the switching module 22 in real time. The processing module 10 directly acquires the output voltage of the DUT 30 and automatically determines whether the protection action has been effectively triggered based on the changes in the acquired output voltage. This testing device simplifies the circuit structure, reduces hardware costs, and improves testing efficiency through the closed-loop coordination of the power supply module 21, the switching module 22, and the processing module 10.

[0048] Figure 2 This is a schematic diagram of the switch module in one embodiment. For example... Figure 2 As shown, optionally, the switching module 22 includes an undervoltage switch 220. The protection module under test 30 is configured to turn off the undervoltage switch 220 when the adjustable voltage is less than the undervoltage protection threshold.

[0049] Specifically, when the adjustable voltage output by the power module 21 is lower than the preset undervoltage protection threshold, the protection module under test 30 sends a shutdown command to the undervoltage switch 220 through its signal feedback terminal, causing the undervoltage switch 220 to disconnect the circuit between the power module 21 and the second terminal of the processing module 10. The processing module 10 automatically determines whether the undervoltage protection function is triggered by monitoring the voltage change at the output terminal of the protection module under test 30 in real time (e.g., voltage decrease or zero).

[0050] Figure 3 This is a schematic diagram of the switch module in another embodiment. For example... Figure 3 As shown, optionally, the switching module 22 includes an overvoltage switch 221. The protection module under test 30 is configured to shut off the overvoltage switch 221 when the adjustable voltage is greater than the overvoltage protection threshold.

[0051] Specifically, when the adjustable voltage output by the power module 21 exceeds the overvoltage protection threshold, the protection module under test 30 sends a shutdown command to the overvoltage switch 221 through its signal feedback terminal, causing the overvoltage switch 221 to disconnect the circuit between the power module 21 and the second terminal of the processing module 10, triggering the protection module under test to enter the overvoltage protection state. The processing module 10 determines whether the protection module under test 30 has activated by monitoring the output voltage change of the protection module under test 30 in real time (e.g., voltage decrease or zero).

[0052] Figure 4 This is a schematic diagram of the switch module in another embodiment. For example... Figure 4As shown, optionally, the switch module 22 includes an undervoltage switch 220 and an overvoltage switch 221, both of which have a first terminal, a second terminal, and a control terminal; the signal feedback terminal includes an undervoltage signal feedback terminal FB1 and an overvoltage signal feedback terminal FB2.

[0053] The control terminal of the undervoltage switch 220 is connected to the undervoltage signal feedback terminal FB1. The first terminal of the undervoltage switch 220 is connected to the second terminal of the power module 21. The second terminal of the undervoltage switch 2210 is connected to the second terminal of the overvoltage switch 221. The first terminal of the overvoltage switch 221 is connected to the second terminal of the processing module 10. The control terminal of the overvoltage switch 221 is connected to the overvoltage signal feedback terminal FB2. In the undervoltage protection test scenario, the protection module under test 30 is configured to turn off the undervoltage switch 220 when the adjustable voltage is less than the undervoltage protection threshold. In the overvoltage protection test scenario, the protection module under test 30 is configured to turn off the overvoltage switch 221 when the adjustable voltage is greater than the overvoltage protection threshold.

[0054] In the above embodiments, the undervoltage switch 220 and the overvoltage switch 221 can be transistors, triodes, or thyristors. Preferably, they are MOSFETs.

[0055] When testing the undervoltage protection function, when the adjustable voltage output by the power module 21 is less than the undervoltage protection threshold, the protection module under test 30 will turn off the undervoltage switch in the switch module 22. At this time, the output voltage of the protection module under test 30 will change (e.g., from 2.9V to 0V). The processing module 10 can detect this change and determine that the protection module under test 30 has triggered the undervoltage protection action.

[0056] When testing the overvoltage protection function, when the adjustable voltage output by the power module 21 is greater than the overvoltage protection threshold, the protection module under test 30 will turn off the overvoltage switch in the switch module 22. The processing module 10 will detect the corresponding change in the output voltage (such as a sudden change from 3.9V to 3.5V) and thus determine that the protection module under test 30 has triggered the overvoltage protection action.

[0057] In one embodiment, based on the action of the protection module under test 30, a smaller range is further determined within the set voltage range, thereby re-determining whether the set action threshold of the protection module under test 30 is within this range. After multiple voltage adjustments and tests to gradually narrow the range, it is finally determined whether the action threshold meets the requirements.

[0058] In another embodiment, the accuracy of the action threshold of the protection module under test 30 is determined by adjusting the adjustable voltage, or by whether it is within the allowable error range. Determining whether the action threshold meets the standard is a crucial step in quality inspection during battery production. Precise testing allows for the selection of qualified protection modules under test, improving overall product quality and enhancing market competitiveness.

[0059] Figure 5 This is a schematic diagram of the switch module in another embodiment. For example... Figure 5 As shown, optionally, the switching module 22 includes a first MOSFET M1 and a second MOSFET M2. Both the first MOSFET M1 and the second MOSFET M2 include a gate, a source, and a drain; the signal feedback terminals include an undervoltage signal feedback terminal FB1 and an overvoltage signal feedback terminal FB2.

[0060] The gate of the first MOSFET M1 is connected to the undervoltage signal feedback terminal FB1, the source of the first MOSFET M1 is connected to the second terminal of the power supply module 21, and the drain of the first MOSFET M1 is connected to the drain of the second MOSFET M2. The gate of the second MOSFET M2 is connected to the overvoltage signal feedback terminal FB2, and the source of the second MOSFET M2 is connected to the second terminal of the processing module 10.

[0061] It should be noted that the first MOSFET M1 has a first freewheeling diode D1, and the second MOSFET M2 has a second freewheeling diode D2. The anode of the first freewheeling diode D1 is connected to the source of the first MOSFET M1, and the cathode of the first freewheeling diode D1 is connected to the drain of the first MOSFET M1. The anode of the second freewheeling diode D2 is connected to the source of the second MOSFET M2, and the cathode of the second freewheeling diode D2 is connected to the drain of the second MOSFET M2. This configuration can suppress reverse electromotive force, protect the MOSFETs, and improve the reliability and lifespan of the switching module 22.

[0062] For example, assuming the undervoltage protection threshold is 3V, when the adjustable voltage output by the power module 21 is 2.9V, the protection module under test 30 does not trigger the undervoltage protection action, and both the first MOSFET M1 and the second MOSFET M2 are turned on. At this time, the voltage read by the processing module 10 is also 2.9V. When the adjustable voltage output by the power module 21 is 3V, the protection module under test 30 triggers the undervoltage protection action, the first MOSFET M1 is turned off, and the voltage read by the processing module 10 is 0V. The processing module 10 can determine that the protection module under test 30 has triggered the undervoltage protection action by detecting the sudden change in the output voltage of the protection module under test from 2.9V to 0V.

[0063] For example, assuming the overvoltage protection threshold is 4V, when the adjustable voltage output by the power module 21 is 3.9V, the protection module under test 30 does not trigger overvoltage protection. Both the first MOSFET M1 and the second MOSFET M2 are turned on, and the voltage read by the processing module 10 is also 3.9V. When the adjustable voltage output by the power module 21 is 4V, the protection module under test 30 triggers overvoltage protection. The second MOSFET M2 is turned off. Although the second MOSFET M2 is off, current can still flow through the second freewheeling diode D2, and the voltage read by the processing module 10 is 4V - 0.5V = 3.5V. Here, 0.5V is the voltage drop across the second freewheeling diode D2. In other words, when the processing module 10 detects a sudden change in the output voltage of the protection module under test 30 from 3.9V to 3.5V, it can determine that the protection module under test 30 has triggered overvoltage protection.

[0064] In other embodiments, it is not limited to connecting the gate of the first MOSFET M1 to the undervoltage signal feedback terminal FB1 and the gate of the second MOSFET M2 to the overvoltage signal feedback terminal FB2; it is also possible that the gate of the first MOSFET M1 is connected to the overvoltage signal feedback terminal FB2 and the gate of the second MOSFET M2 is connected to the undervoltage signal feedback terminal FB1.

[0065] Of course, it's not limited to the configuration where the source of the first MOSFET M1 is connected to the second terminal of the power module 21, the drain of the first MOSFET M1 is connected to the drain of the second MOSFET M2, and the source of the second MOSFET M2 is connected to the second terminal of the processing module 10. Alternatively, the configuration could also be: the source of the first MOSFET M1 is connected to the second terminal of the power module 21, the drain of the first MOSFET M1 is connected to the source of the second MOSFET M2, and the drain of the second MOSFET M2 is connected to the second terminal of the processing module 10. Similarly, the configuration could also be: the drain of the first MOSFET M1 is connected to the second terminal of the power module 21, the source of the first MOSFET M1 is connected to the source of the second MOSFET M2, and the drain of the second MOSFET M2 is connected to the second terminal of the processing module 10. Or, the drain of the first MOSFET M1 is connected to the second terminal of the power module 21, the source of the first MOSFET M1 is connected to the drain of the second MOSFET M2, and the source of the second MOSFET M2 is connected to the second terminal of the processing module 10.

[0066] Specifically, the switching module 22 includes a first MOSFET M1 and a second MOSFET M2, both of which are either N-channel MOSFETs (NMOS) or P-channel MOSFETs (PMOS), the specific type determined by the logic level requirements. This embodiment and subsequent embodiments will use NMOS transistors as an example. The switching speed of the MOSFETs can reach nanosecond levels, enabling precise capture of the critical action point of the protection module under test 30; the series structure completely cuts off the circuit during turn-off, resulting in no static power consumption and improved energy efficiency.

[0067] When the adjustable voltage output by power module 21 is less than the undervoltage protection threshold, the protection module under test 30 sends a low level to the gate of the first MOSFET M1 through the undervoltage signal feedback terminal FB1, turning off the first MOSFET M1 and cutting off the current path from power module 21 to the second MOSFET M2, thus disconnecting the power supply circuit. When the adjustable voltage output by power module 21 is greater than the overvoltage threshold, the protection module under test 30 sends a low level to the gate of the second MOSFET M2 through the overvoltage signal feedback terminal FB2, turning off the second MOSFET M2 and similarly forcibly cutting off the circuit.

[0068] Figure 6 This is a structural schematic diagram of another testing device provided in an embodiment of this utility model. (See diagram below.) Figure 6 As shown, optionally, the processing module 10 is also electrically connected to the power supply module 21, which is configured to output an adjustable voltage in a set voltage range using a binary method according to the action of the protection module 30 under test.

[0069] Specifically, the processing module 10 outputs an initial set voltage range, such as [Vmin, Vmax], and the power supply module 21 outputs the median voltage of the current set voltage range, Vmid = (Vmin + Vmax) / 2. The processing module 10 monitors the output voltage of the protection module 30 under test and determines whether it triggers a protection action.

[0070] When testing whether the undervoltage protection threshold meets the set requirements, if the protection module under test 30 activates, it indicates that the current voltage Vmid is less than the undervoltage protection threshold, and the set voltage range is updated to [Vmid, Vmad]. If the protection module under test 30 does not activate, it indicates that the current voltage Vmid is greater than the undervoltage protection threshold, and the set voltage range is updated to [Vmin, Vmid]. When testing whether the overvoltage protection threshold meets the set requirements, if the protection module under test 30 activates, it indicates that the current voltage Vmid is greater than the overvoltage protection threshold, and the set voltage range is updated to [Vmin, Vmid]. If the protection module under test 30 does not activate, it indicates that the current voltage Vmid is less than the overvoltage protection threshold, and the set voltage range is updated to [Vmid, Vmax]. Repeating the above process can further narrow down the undervoltage protection threshold range or the overvoltage protection threshold range. Traditional solutions require high-precision DACs or multi-level power supplies to achieve voltage regulation, while the binary search method, through algorithm optimization, can achieve the same testing effect on medium-precision power supply modules, reducing hardware costs.

[0071] In one embodiment, assuming the undervoltage protection threshold is 3V and the initial set voltage range is [2V, 4V], the test process is as follows:

[0072] First test: The test is performed at 3V, the midpoint of the set voltage range [2V, 4V]. If the protection module under test 30 does not trigger undervoltage protection, the undervoltage protection threshold is between 2V and 3V; if the protection module under test 30 triggers undervoltage protection, the undervoltage protection threshold is between 3V and 4V. Since 3V is known to be the undervoltage protection threshold, the first test will trigger undervoltage protection, confirming that the undervoltage protection threshold is between 3V and 4V.

[0073] Second test: The midpoint of the set voltage range [3V, 4V], 3.5V, is used for testing. At this time, the protection module under test 30 will not trigger the undervoltage protection action, which confirms that the undervoltage protection threshold is between 3V and 3.5V.

[0074] The third test: The test was conducted at 3.25V, the midpoint of the set voltage range [3V, 3.5V]. If the protection module under test 30 triggers under-voltage protection, the under-voltage protection threshold is between 3V and 3.25V; if the protection module under test 30 does not trigger under-voltage protection, the under-voltage protection threshold is between 3.25V and 3.5V. These three tests further narrow down the under-voltage protection threshold range, but to accurately determine that 3V is the under-voltage protection threshold, further testing is needed.

[0075] In one embodiment, assuming the overvoltage protection threshold is 4V and the initial set voltage range is [3V, 5V], the test process is as follows:

[0076] Test 1: The midpoint of the interval [3V, 5V], 4V, is used for testing. If the protection module under test 30 triggers overvoltage protection, it can be known that 4V is likely the overvoltage protection threshold; if the protection module under test 30 does not trigger overvoltage protection, it can be known that the overvoltage protection threshold is between 4V and 5V, and further testing is required.

[0077] Second test: If the protection module under test 30 did not trigger overvoltage protection in the first test, take the midpoint of the interval [4V, 5V], 4.5V, for testing. If the protection module under test 30 triggers overvoltage protection, the overvoltage protection threshold is between 4V and 4.5V; if the protection module under test 30 does not trigger overvoltage protection, the overvoltage protection threshold is between 4.5V and 5V.

[0078] The third test: If the protection module 30 under test triggered the protection action in the second test, the midpoint of the interval [4V, 4.5V] (4.25V) is used for testing; if the protection module 30 under test did not trigger the protection action in the second test, the midpoint of the interval [4.5V, 5V] (4.75V) is used for testing. In this way, regardless of whether the protection module 30 under test triggers the protection action, the overvoltage protection threshold range can be further narrowed.

[0079] Figure 7This is a structural schematic diagram of another testing device provided in an embodiment of this utility model. (See diagram below.) Figure 7 As shown, optionally, the testing device also includes a host computer 40, which is connected to the processing module 10 and the power supply module 21. The host computer 40 is configured to adjust the power supply module 21 to output an adjustable voltage within a set voltage range according to the action of the protection module 30 under test using a binary search method.

[0080] The working process of the testing device is as follows:

[0081] The initial voltage range set by the host computer 40 is, for example, [Vmin, Vmax].

[0082] The power module outputs the current median voltage Vmid.

[0083] The processing module 10 collects the output voltage status (such as whether it jumps) of the protection module 30 under test in real time, and then determines whether the protection module 30 under test has triggered a protection action, and feeds back the action result to the host computer 40.

[0084] The host computer 40 updates the set voltage range based on feedback and calculates the new median voltage Vmid. By repeating the above process, the undervoltage protection threshold range or the overvoltage protection threshold range can be further narrowed.

[0085] Figure 8 This is a structural schematic diagram of another testing device provided in an embodiment of this utility model. (See diagram below.) Figure 8 As shown, optionally, the processing module 10 includes a multi-channel unit 101, which is configured to connect to multiple modules under test 20. This configuration allows the testing device to simultaneously test multiple protection modules under test 30, greatly improving testing efficiency and reducing testing time and cost. Through this multi-channel connection method, the processing module 10 can simultaneously monitor the output voltage of multiple modules under test 20, facilitating centralized processing of test data and enabling synchronous evaluation of the performance of multiple protection modules under test 30.

[0086] Figure 9 This is a structural schematic diagram of another testing device provided in an embodiment of this utility model. (See diagram below.) Figure 9 As shown, the testing device may optionally include an alarm module 50, which is connected to the processing module 10.

[0087] The processing module 10 is also used to monitor the voltage range adjusted by the power supply module 21 based on the binary search method, and to determine the voltage range and the action threshold of the protection module 30 under test. The alarm module 50 is used to receive the judgment result of the processing module 10.

[0088] Specifically, the processing module 10 compares the monitored voltage range with the pre-set operating threshold of the protection module 30 under test to determine whether the performance of the protection module 30 under test meets the standard. After the processing module 10 completes the judgment of the voltage range and operating threshold, it immediately transmits the judgment result to the alarm module 50. If the judgment result shows that the voltage range and operating threshold are abnormal, such as the actual operating threshold exceeding the allowable error range of the set protection threshold, it indicates that the protection module 30 under test may have a performance problem, and the alarm module 50 will issue an alarm in a timely manner. This alarm mechanism allows testers to quickly determine that the operating threshold of the current protection module 30 under test does not meet the requirements, improving testing efficiency.

[0089] The specific embodiments described above do not constitute a limitation on the scope of protection of this utility model. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this utility model should be included within the scope of protection of this utility model.

Claims

1. A testing device, characterized in that, include: The system includes a processing module and at least one test module, wherein the test module includes a power supply module and a switch module for supplying power to the protection module under test; The first end of the power module is connected to the input end of the protection module under test, the output end of the protection module under test is connected to the first end of the processing module, the first end of the switch module is connected to the second end of the processing module, and the second end of the switch module is connected to the second end of the power module. The control terminal of the switch module is connected to the signal feedback terminal of the protection module under test. The power module is configured to output an adjustable voltage according to a set voltage range. The protection module under test controls the switching module to turn on or off under the adjustable voltage. The processing module is configured to monitor the output voltage of the protection module under test to determine whether the protection module under test has activated.

2. The testing apparatus according to claim 1, characterized in that, The switching module includes an undervoltage switch; the protection module under test is configured to turn off the undervoltage switch when the adjustable voltage is less than the undervoltage protection threshold.

3. The testing apparatus according to claim 1, characterized in that, The switching module includes an overvoltage switch; the protection module under test is configured to turn off the overvoltage switch when the adjustable voltage is greater than the overvoltage protection threshold.

4. The testing apparatus according to claim 1, characterized in that, The switching module includes an undervoltage switch and an overvoltage switch, each having a first terminal, a second terminal, and a control terminal; the signal feedback terminal includes an undervoltage signal feedback terminal and an overvoltage signal feedback terminal. The control terminal of the undervoltage switch is connected to the undervoltage signal feedback terminal, the first terminal of the undervoltage switch is connected to the second terminal of the power module, the second terminal of the undervoltage switch is connected to the second terminal of the overvoltage switch, the first terminal of the overvoltage switch is connected to the second terminal of the processing module, and the control terminal of the overvoltage switch is connected to the overvoltage signal feedback terminal. The protection module under test is configured to turn off the undervoltage switch when the adjustable voltage is less than the undervoltage protection threshold, and to turn off the overvoltage switch when the adjustable voltage is greater than the overvoltage protection threshold.

5. The testing apparatus according to claim 1, characterized in that, The switching module includes a first MOSFET and a second MOSFET; both the first MOSFET and the second MOSFET include a gate, a source, and a drain; the signal feedback terminal includes an undervoltage signal feedback terminal and an overvoltage signal feedback terminal; The gate of the first MOSFET is connected to the undervoltage signal feedback terminal, the source of the first MOSFET is connected to the second terminal of the power module, and the drain of the first MOSFET is connected to the drain of the second MOSFET. The gate of the second MOSFET is connected to the overvoltage signal feedback terminal, and the source of the second MOSFET is connected to the second terminal of the processing module.

6. The testing apparatus according to claim 1, characterized in that, The processing module is also electrically connected to the power supply module, which is configured to output the adjustable voltage in the set voltage range using a binary search method based on the action of the protection module under test.

7. The testing apparatus according to claim 1, characterized in that, The testing device also includes a host computer, which is connected to the processing module and the power supply module. The host computer is configured to adjust the power supply module to output the adjustable voltage within the set voltage range according to the action of the protection module under test using a binary search method.

8. The testing apparatus according to claim 1, characterized in that, The power module includes a programmable DC power supply.

9. The testing apparatus according to claim 1, characterized in that, The processing module includes a multi-channel unit, which is configured to connect multiple modules under test.

10. The testing apparatus according to claim 6 or 7, characterized in that, The testing device also includes an alarm module, which is connected to the processing module. The processing module is also used to monitor the voltage range of the power module after adjustment based on the binary search method, and to determine the voltage range and the action threshold of the protection module under test. The alarm module is used to receive the judgment result from the processing module.

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