Test system and method
A test system and test method technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as unable to automatically analyze learners, important relations, loss of interest, etc.
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[0022] Fig. 1 is a schematic block diagram of the basic structure of the test system 1 of the present invention. In this embodiment, the test system 1 is applied in an electronic information processing platform (not marked) with a test learning function, which is convenient for users to carry out, for example, English For studying or practicing homework, the electronic information processing platform can be, for example, a desktop computer, a notebook computer, a personal digital assistant or an electronic dictionary, etc., but is not limited thereto.
[0023] As shown in FIG. 1 , the test system 1 of the present invention includes a database 101 , a management module 10 , a mode setting module 11 , a test paper generation module 12 , an answering module 13 , a scoring module 14 and a collection module 15 . The above modules will be described separately below.
[0024] The database 101 stores test question data and answer data corresponding to the test question data, and the t...
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