Prediction method of multi-functional parameter accelerated degradation testing product life based on multivariate hybrid time sequence analysis
Patent Information
- Authority / Receiving Office
- CN ยท China
- Current Assignee / Owner
- BEIHANG UNIV
- Publication Date
- 2011-05-04
- Estimated Expiration
- Not applicable ยท inactive patent
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Abstract
Description
technical field
[0001] The invention relates to an accelerated degradation test life prediction and reliability evaluation method, belonging to the technical field of accelerated test evaluation. Background technique
[0002] The emergence of more and more long-life and high-reliability products makes product life and reliability evaluation more difficult. Predicting product life and reliability based on product performance degradation information has become an effective way. In order to evaluate the reliability of these products for which failure data is difficult to obtain but performance degradation data can be obtained, a degradation test method has emerged. In order to obtain more effective product performance degradation information in a shorter time, the method of accelerated degradation test has further emerged.
[0003] However, there are still some deficiencies in the existing accelerated degradation test product life prediction methods:
[0004] First of all, i...