Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Failure prediction method and device for cluster system

A cluster system and failure prediction technology, which is applied in the computer field, can solve the problems of low frequency of occurrence, low reliability of failure rules, and the need to improve the prediction recall rate, so as to achieve the effect of improving the recall rate

Inactive Publication Date: 2014-05-21
HUAWEI TECH CO LTD +1
View PDF2 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, because many redundant events are recorded in the cluster system log, such as failure events that occur without warning or failure events that occur infrequently, the reliability of the failure rules obtained based on this statistics is low.
Therefore, the prediction recall rate of the failure prediction method in the prior art needs to be improved.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Failure prediction method and device for cluster system
  • Failure prediction method and device for cluster system
  • Failure prediction method and device for cluster system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036]In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0037] figure 1 A flow chart of an embodiment of a failure prediction method for a cluster system provided by the present invention, such as figure 1 As shown, the failure prediction method of the cluster system provided in this embodiment includes:

[0038] S110. Perform cluster analysis on the event sequence pattern set according to the failure...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An embodiment of the invention discloses a failure prediction method and device for a cluster system. The method comprises performing cluster analysis on an event sequence pattern set according to a failure event set of the cluster system to obtain event sequence clusters; performing cause and effect correlation analysis on the event sequence clusters to obtain cause and effect correlation path clusters; performing failure analysis on the cause and effect correlation path clusters to obtain failure modes of the cluster system; performing failure prediction on the cluster system according to the failure modes. According to the failure prediction method and device, clustering is performed on the event sequence mode set to obtain the cause and effect correlation path clusters to obtain the failure modes of the cluster system, and failure prediction is performed on the cluster system according to the obtained failure modes, so that deep analysis and mining can be performed on cluster system logs to obtain reliable failure rules for failure prediction, and the failure prediction recall rate is improved.

Description

technical field [0001] Embodiments of the present invention relate to computer technology, and in particular to a failure prediction method and device for a cluster system. Background technique [0002] With the widespread application of cluster systems in large-scale productive computing platforms, failures and errors of cluster systems also occur frequently, and business interruption, data leakage or even data loss caused by cluster system failures or errors often bring heavy blows to users . Therefore, the importance of the security, reliability and availability of the cluster system has become increasingly prominent. [0003] In the existing technology, the failure events in the cluster system log are usually simply counted to obtain the failure event sequence association rules (referred to as failure rules), and then the failure prediction of the cluster system is performed according to the failure rules, thereby improving the security of the cluster system performanc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H04L12/26
Inventor 付晓毓任睿詹剑锋
Owner HUAWEI TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products