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Aphid pest investigation method and device

A technology of aphids and insects, which is applied in the field of crop disease and insect pest information survey, can solve the problems of inaccurate and large errors in the investigation results of aphids and insects, and achieve the effect of standard and accurate investigation of aphids and insects

Inactive Publication Date: 2017-11-10
ANHUI LONGCOM INTERNET OF THINGS +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The object of the present invention is to provide a method and device for investigating the aphid situation, so as to solve the problem of inaccurate and large errors in the results of the traditional visual inspection and manual inspection method.

Method used

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  • Aphid pest investigation method and device
  • Aphid pest investigation method and device

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Embodiment Construction

[0034] In order to make the object, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly described below, obviously, the described embodiments are some embodiments of the present invention, not all embodiments.

[0035] figure 1 It is the structural diagram of the aphid situation investigation device of an embodiment of the present invention, refer to figure 1 , the aphid situation investigation device of the present invention is used to solve the problem of inaccurate and large error in the aphid situation investigation caused by the visual inspection and manual inspection method. The investigative device includes:

[0036] The image acquisition device 1 is used to scan the sample of aphid infestation leaves to obtain the image information of the aphid infestation leaves; the analysis computing terminal 2 is connected to the image acquisition device 1 and is used to analyze the image information o...

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PUM

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Abstract

The present invention provides a method and device for investigating aphid infestation, which scans aphid infestation leaf samples to obtain aphid infestation leaf image information; analyzes the aphid infestation leaf image information to obtain the number of aphids in the aphid infestation leaf samples; Calculate the aphid infestation level according to the preset number of aphids in the aphid infestation leaf sample and the preset aphid infestation level standard. With the aphid infestation investigation method and device of the present invention, since the image information of the aphid infestation leaf is obtained by scanning, the image information is analyzed and calculated to obtain the aphid infestation level, thereby avoiding the aphid infestation level caused by visual inspection and manual inspection. The survey results are inaccurate and the error is large, which makes the survey of aphids accurate.

Description

technical field [0001] The invention relates to the field of informatization investigation of crop diseases and insect pests, in particular to a method and device for investigating aphids and pests. Background technique [0002] Ensuring food security is a worldwide problem. In recent years, my country has experienced severe natural disasters. Despite the joint efforts of all walks of life, the grain output in 2013 achieved a "tenth consecutive increase". However, the unavoidable problem is that it is becoming more and more difficult to increase food production, and sudden natural disasters caused by global climate change are increasing year by year. Especially represented by the outbreak of armyworm in Northeast my country and North China in 2012-2013 and the "two migration" pests of rice in the south in 2013. In order to make it easier for the national functional departments to formulate pest control strategies in a timely manner and carry out effective pest control in a ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/00G06T7/00G06M11/00
Inventor 廖同庆张东彦徐珍玉许高建赵晋陵黄林生梁栋黄文江
Owner ANHUI LONGCOM INTERNET OF THINGS
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