Display panel test bench

一种显示面板、检测台的技术,应用在静态指示器、非线性光学、仪器等方向,能够解决控制难度大、损坏显示面板等问题,达到安全快捷控制探针组件的效果

Active Publication Date: 2018-06-08
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the problem in the related art that the operator needs to manually press the probe assembly, which is difficult to control and has the risk of damaging the display panel, an embodiment of the present invention provides a display panel testing platform

Method used

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  • Display panel test bench
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Embodiment Construction

[0046] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the present invention. Rather, they are merely examples of apparatuses and methods consistent with aspects of the invention as recited in the appended claims.

[0047] figure 1 It is a schematic structural diagram of a display panel testing platform shown in an embodiment of the present invention. The display panel inspection station may include:

[0048] The base 110, the base 120, the probe assembly 130 and the linkage assembly 140, the probe assembly 130 may include a probe.

[0049] A base moving assembly 121 is disposed on the base 120 .

[005...

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Abstract

A display panel testing bench, wherein the display panel testing bench comprises: a bench base, a chassis, a probe assembly, and a linkage assembly; a bench base moving assembly is disposed on the chassis; the bench base is movable on the chassis by the bench base moving assembly, the bench base is configured to fix a display panel; the linkage assembly is disposed on the chassis, and is configured to perform a joint movement of the probe assembly and the bench base; the probe assembly is disposed above the bench base; wherein, when the bench base is moved on the chassis by the bench base moving assembly, the bench base drives the linkage assembly, and the probe assembly is driven by the linkage assembly to move above the display panel.

Description

technical field [0001] The invention relates to the field of liquid crystal display, in particular to a display panel testing platform. Background technique [0002] During the production process of a display panel (such as a liquid crystal display panel), defects may appear in the product itself, such as damage to a thin film transistor. Therefore, it is necessary to detect the display panel. At present, the display panel is usually detected through the lighting area of ​​the display panel (through the lighting area, an electrical signal can be input to the display panel to activate the display panel). [0003] In the related art, a display panel testing station is usually used to test the display panel. The display panel testing station includes a base (for fixing the display panel) and a probe assembly (for connecting with the lighting area of ​​the display panel and inputting electrical signals to the display panel). When using the display panel detection platform, fi...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G02F1/13
CPCG09G3/36G09G3/006
Inventor杨得坡陈思徐洪亮王阔海郑亮
OwnerBOE TECH GRP CO LTD