Reset circuit, drive method thereof, shifting register unit and grid scanning circuit

A technology of shift register and reset circuit, which is applied in the field of shift register unit, gate scan circuit, reset circuit and its drive, and can solve the problems of unable to output gate scan drive pulse normally, PU node leakage, etc.
CN105589604AActive Publication Date: 2016-05-18BOE TECH GRP CO LTD +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
BOE TECH GRP CO LTD
Publication Date
2016-05-18

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Abstract

The invention relates to a reset circuit, a drive method thereof, a shifting register unit and a grid scanning circuit. The reset circuit comprises a reset unit, a reset control unit and multiple access ends; the reset unit is applicable to be started so as to switch on a second access end and a first access end when the voltage of a second node is a first electric level; the reset unit is applicable for switching on the second access end and a second node when the voltage of the first access end is the first electric level; when the voltage of the second access end is a second electric level, the second anode and a third access end are switched on. In the scanning stage of the shifting register unit comprising the reset circuit provided by the invention, the first node can be reset normally; in the scanning interruption stage, the first node is maintained at the first electric level; and therefore, the shifting register unit can normally output signals after recovery scanning.
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Description

technical field

[0001] The invention relates to the field of display technology, in particular to a reset circuit, a driving method thereof, a shift register unit, and a gate scanning circuit. Background technique

[0002] In the embedded touch technology, in order to avoid affecting the display, the scanning driving process in the display process is generally performed separately from the scanning process in the touch detection process. In the process of gate driving scan, there is a touch detection process between the scans of two adjacent rows. During the touch detection process, if figure 1 As shown in , the PU node of the shift register unit that is currently shifted in the gate scanning circuit (the PU node is the node that controls the output of the scan signal, and the control terminal of the output module of the corresponding shift register unit is connected to the PU node. When the PU node is at a high level, the output scan signal) needs to be maintained at a hi...

Claims

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