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A Method for Analyzing Substance Content Based on Infrared Spectroscopy

A technology of infrared spectrum analysis and infrared spectrum, which is applied in the field of infrared spectrum analysis of material composition content, can solve the problem of low efficiency of remodeling, achieve accurate and simple transfer relationship, good prediction effect, and reduce the amount of calculation

Active Publication Date: 2019-09-06
东北大学秦皇岛分校
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In order to solve the problem of low efficiency of existing remodeling, the present invention proposes a method for analyzing the content of material components based on infrared spectroscopy, including the following steps:

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  • A Method for Analyzing Substance Content Based on Infrared Spectroscopy
  • A Method for Analyzing Substance Content Based on Infrared Spectroscopy
  • A Method for Analyzing Substance Content Based on Infrared Spectroscopy

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Embodiment 1

[0043] Such as figure 1 Shown, the present invention provides a kind of method based on infrared spectrum analysis substance composition content, comprises the following steps:

[0044] S101. Establish a first regression model according to the source-domain infrared spectrum data and the content of source-domain material components corresponding to the source-domain infrared spectrum data, and obtain parameters in the first regression model; the first regression model is, for example, A partial least squares regression model, performing feature extraction on the source domain infrared spectral data to obtain a first spectral feature, establishing the partial least squares regression model according to the first spectral feature and source domain material component content, and calculating the regression coefficient; specifically, the step of performing feature extraction on the source domain infrared spectral data to obtain the first spectral feature includes performing centra...

Embodiment 2

[0054] The method for analyzing the content of material components based on infrared spectroscopy in the present invention combines transfer learning and PLS algorithm to form a transfer calibration algorithm (CT_pls algorithm). Domain feature space, and then the model of the source domain can be used to process the data of the target domain. This method first uses the PLS algorithm to extract the features of the source domain samples and the target samples, then establishes a multivariate calibration model based on the source domain features and a linear transfer model between the source domain and target domain features, and finally uses the same method for the unknown After feature extraction and transfer of target domain samples, the source domain calibration model is used to predict the transferred features.

[0055] Assume that there are source domain datasets {X S ,y} and the target domain dataset {X T ,y}, where X S and x T Measured by the master spectrometer and t...

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Abstract

The invention relates to a method for analyzing the content of material components based on infrared spectroscopy, which includes establishing a first regression model based on source domain infrared spectrum data and source domain material component content corresponding to the source domain infrared spectrum data, and calculating the first Parameters in the regression model; obtain target domain infrared spectrum data, set up a transfer model between target domain infrared spectrum data and source domain infrared spectrum data, and obtain parameters in the transfer model; according to the target domain infrared spectrum data, The transfer model uses the first regression model to obtain the target domain material component content corresponding to the target domain infrared spectrum data. The analysis method of the present invention combines the feature transfer method and the partial least squares algorithm in transfer learning to realize the transformation from the target domain to the source domain spectral feature space, which can not only remove redundant information, improve the accuracy of transfer, and can be used in a large To a certain extent, the calculation amount of the transfer process is reduced.

Description

technical field [0001] The invention relates to the field of infrared spectrum analysis, in particular to a method for analyzing the content of material components based on infrared spectrum. Background technique [0002] The content of the material components can be known by infrared spectrum analysis. By measuring the infrared spectrum and analyzing it, we can know the content of the material composition, which can not only be analyzed qualitatively but also quantitatively. However, in the existing infrared spectrum measurement process, changes in measuring instruments or measurement conditions will cause the original calibration model to fail, and re-establishing the model will waste a lot of time and cost, resulting in inaccurate analysis results and low analysis efficiency. . Contents of the invention [0003] In order to solve the problem of low efficiency of existing remodeling, the present invention proposes a method for analyzing the content of material componen...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/3563
Inventor 赵煜辉单鹏张洋洋
Owner 东北大学秦皇岛分校
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