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A Method and Device for Analyzing Migration Velocity of Variable Offset vsp Kirchhoff

A technology of migration velocity analysis and variable offset distance, applied in measurement devices, seismology, instruments, etc., can solve the problem that the ground seismic migration velocity analysis formula is not suitable for well seismic, etc., and achieve the effect of improving imaging quality

Active Publication Date: 2022-05-20
OPTICAL SCI & TECH (CHENGDU) LTD
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Problems solved by technology

[0004] However, the existing migration velocity analysis methods are mainly aimed at the observation method of surface earthquakes, and the migration velocity analysis formula of surface earthquakes is not suitable for borehole earthquakes

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  • A Method and Device for Analyzing Migration Velocity of Variable Offset vsp Kirchhoff
  • A Method and Device for Analyzing Migration Velocity of Variable Offset vsp Kirchhoff
  • A Method and Device for Analyzing Migration Velocity of Variable Offset vsp Kirchhoff

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Embodiment Construction

[0045] The technical solution of the present invention will be further described in detail below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following description.

[0046] Such as figure 2 As shown, a VSP Kirchhoff migration velocity analysis method with variable offset distance includes the following steps:

[0047] S1. Input the initial 2D depth-velocity model of variable offset VSP, the initial Kirchhoff prestack time migration common imaging gather of variable offset VSP, the initial Kirchhoff prestack time migration imaging profile of variable offset VSP, Migration velocity analysis horizon, common imaging gather residual curvature of migration velocity analysis horizon;

[0048]In the embodiment of this application, the initial 2-dimensional depth-velocity model of variable offset VSP is as follows image 3 As shown in the figure, the abscissa is the length (unit: meter); the ordinate is the d...

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Abstract

The present invention discloses a variable offset VSP Kirchhoff migration velocity analysis method and device. The method includes the following steps: S1. Input the initial 2-dimensional depth velocity model of the variable offset VSP, the initial variable offset VSP Kirchhoff prestack time migration common imaging gathers, initial Kirchhoff prestack time migration imaging sections of variable offset VSP, migration velocity analysis horizons, residual curvature of common imaging gathers of migration velocity analysis horizons; S2. Utilize the 2D depth-velocity model and migration velocity analysis tomography of VSP with variable offset distance, and use ray tracing to calculate formation dip, incident angle, and ray path; S3. Co-imaging with Kirchhoff pre-stack time migration with VSP with variable offset The linear tomographic equation is established from the residual curvature of the gather, and the least square solution is used to obtain the velocity disturbance, and the 2D depth velocity model is updated. The invention utilizes Kirchhoff pre-stack time migration co-imaging gather residual curvature to update the migration velocity, makes the co-imaging gather straight and improves the imaging quality.

Description

technical field [0001] The invention relates to seismic data velocity analysis, in particular to a VSP Kirchhoff migration velocity analysis method and device with variable offset distance. Background technique [0002] Variable offset distance VSP (Walkaway VSP) means that an array composed of multiple geophones is placed in the observation well, and a shot line composed of artificially excited multiple shot points is laid on the surface, which is a two-dimensional observation method of VSP; Under the condition of manually stimulating seismic data at points, data acquisition in VSP wells with variable offset distance is realized. The three-dimensional diagram of the acquisition system is as follows: figure 1 As shown; VSP acquisition with variable offset is actually data acquisition by the geophones at each receiver point when each shot point is excited; VSP with variable offset can observe reflected longitudinal waves and reflected converted shear waves, and use offset ima...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01V1/28G01V1/30G01V1/34
CPCG01V1/282G01V1/303G01V1/306G01V1/345G01V1/301G01V2210/512G01V2210/6222G01V2210/624G01V2210/74
Inventor 李建国
Owner OPTICAL SCI & TECH (CHENGDU) LTD